Inspection unit and inspection device
By designing an elastic deformation structure in the inspection unit that allows multiple probes to move independently along the axial direction, the problem of insufficient contact reliability between the electrode terminals and the probes is solved, achieving higher contact reliability and durability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- OMRON CORP
- Filing Date
- 2025-09-25
- Publication Date
- 2026-04-17
AI Technical Summary
In existing inspection units, the contact reliability between the battery electrode terminals and the probes is insufficient, which easily leads to electric arcing and melting of the contact points.
By employing multiple probes that move independently along the axial direction, the elastic deformation of the elastic component follows the stepped or uneven parts of the electrode terminal, thereby improving contact reliability.
This enhances the contact reliability between the electrode terminals and the probe, reduces arcing, and improves the probe's durability and contact reliability.
Smart Images

Figure CN121878466A_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to an inspection unit that contacts the electrode terminals of a battery to inspect battery performance, and an inspection apparatus equipped with the inspection unit. Background Technology
[0002] In recent years, there has been a growing use of prismatic secondary batteries, such as those for electric vehicles (EVs), capable of handling high currents (e.g., 80 amps or more). Therefore, inspection units are also required to handle high currents.
[0003] Conventionally, such inspection units have been described, for example, in Patent Document 1. Patent Document 1 discloses a technique that allows for easy assembly even when the probe is composed of multiple components.
[0004] Existing technical documents
[0005] Patent documents
[0006] Patent Document 1: Japanese Patent Application Publication No. 2018-124252 Summary of the Invention
[0007] The technical problem that the invention aims to solve
[0008] In previous inspection units, there is still room for improvement from the perspective of improving the contact reliability between the battery electrode terminals and the probes.
[0009] Therefore, the purpose of this disclosure is to solve the above-mentioned technical problems and provide an inspection unit and inspection device that can improve the contact reliability between the electrode terminals of the battery and the probe.
[0010] Technical solutions for solving technical problems
[0011] The present disclosure discloses a testing unit that contacts the electrode terminals of a battery to test battery performance, characterized in that it comprises:
[0012] Multiple probes;
[0013] A socket that houses the plurality of probes in a manner that allows them to move a first distance axially.
[0014] A housing that stores the socket in a manner that allows it to move a second distance along the axial direction;
[0015] A force-applying component, disposed inside the housing, applies force to the socket in the axial direction such that a portion of the socket protrudes outward from an opening provided in the housing; an elastic component, disposed inside the socket, elastically deforms such that each probe moves independently along the axial direction.
[0016] The inspection device of this disclosure has multiple inspection units of the above-described scheme.
[0017] Invention Effects
[0018] According to this disclosure, an inspection unit and inspection device can be provided that can improve the contact reliability between the electrode terminals of a battery and a probe. Attached Figure Description
[0019] Figure 1 This is a perspective view of the inspection unit of the present disclosure embodiment viewed from an obliquely upward angle.
[0020] Figure 2 Viewed from below at an angle Figure 1 A three-dimensional view of the inspection unit.
[0021] Figure 3 yes Figure 1 An exploded three-dimensional view of the inspection unit.
[0022] Figure 4 It means to Figure 1 A three-dimensional view of the structure after some components of the inspection unit have been removed.
[0023] Figure 5 It means Figure 4 The top view of the structure is a diagram showing the probe's front end in a protruding position.
[0024] Figure 6 It means Figure 4 The top view of the structure is a diagram showing the probe's tip in the retracted position.
[0025] Figure 7 It means Figure 4 An exploded 3D diagram of the structure.
[0026] Figure 8 Represented by a partial cross-section Figure 4 An enlarged 3D view of the structure.
[0027] Figure 9 It means Figure 1 A side view showing the state in which the front ends of the multiple probes of the inspection unit are in contact with the electrode terminals of the battery.
[0028] Figure 10 This is a perspective view showing an example of an inspection apparatus equipped with the inspection unit of this embodiment.
[0029] Figure 11 yes Figure 1 A variation of the inspection unit is a perspective view showing the structure after a portion of the components have been removed.
[0030] Figure 12 This is an exploded three-dimensional view showing a modified example of multiple probes.
[0031] Figure 13 yes Figure 12 A magnified 3D image.
[0032] Figure 14 It is a top view showing a modified example of multiple probes in partial perspective.
[0033] Explanation of reference numerals in the attached figures
[0034] 1. 1A: Inspection unit;
[0035] 2, 2A: Casing;
[0036] 2a: Opening;
[0037] 2Aa: Through hole;
[0038] 2Ab: Groove section;
[0039] 3: Socket;
[0040] 3a: Opening;
[0041] 4: Cable;
[0042] 5: Force-applying components;
[0043] 6: Probe;
[0044] 6a: Front end;
[0045] 6b: Contact section;
[0046] 6c: elongated hole;
[0047] 6d: Elastic sheet;
[0048] 6e: Through hole;
[0049] 7: Elastic part;
[0050] 8: Clamping components;
[0051] 21: Shell cover;
[0052] 22: Shell substrate;
[0053] 23: Fastening components;
[0054] 31: Socket cover;
[0055] 32: Socket base;
[0056] 33: Fastening components;
[0057] 41, 42: Circular terminals;
[0058] 51: First spring component;
[0059] 52: Second spring component;
[0060] 71, 72: Elastic arm section;
[0061] 81: Nut;
[0062] 82, 83: Spacers;
[0063] 84: Spring washer;
[0064] 85: Bolt;
[0065] 100: Battery;
[0066] 101: Electrode terminal;
[0067] 101a: Step section;
[0068] 200: Inspection device;
[0069] 201: Axis;
[0070] 202: Side panel;
[0071] 203: Guide rail. Detailed Implementation
[0072] (The insights that form the basis of this disclosure)
[0073] In order to provide an inspection unit that can improve the contact reliability between the battery electrode terminals and the probe, the inventors conducted in-depth research and finally obtained the following insights.
[0074] In conventional inspection units, multiple contact points with sharp tips are formed on the probe. In these units, a helical spring is used to apply force to the probe to maintain contact between the multiple contact points and the battery's electrode terminals. Furthermore, in conventional inspection units, there is a desire to improve the contact reliability between the electrode terminals and the probe by increasing the number of contact points (e.g., several hundred).
[0075] However, the battery electrode terminals are not necessarily flat; sometimes they have steps or irregularities. Therefore, even if multiple contact points are provided on the probe, very few contact points actually make contact with the electrode terminals (e.g., 3 points). Since current flows only at the portion of the contact point that makes contact with the electrode terminal, an electric arc may occur when there are fewer contact points, causing the tip of the contact point to melt.
[0076] Therefore, the inventors conducted in-depth research and discovered a structure having an elastic portion that allows multiple probes to move independently along the axial direction and deform elastically. According to this structure, the multiple probes can move in a manner that follows the stepped or uneven portion of the electrode terminal, thereby improving the contact reliability between the electrode terminal and the probes. Based on this new insight, the inventors completed the following invention.
[0077] The embodiments of this disclosure will now be described with reference to the accompanying drawings. The following description is merely illustrative and is not intended to limit the scope of this disclosure, its application, or its uses. The drawings are schematic, and the proportions of the dimensions may not correspond to reality.
[0078] Furthermore, for ease of explanation, the following uses terms indicating direction, such as "up" and "down," assuming the state of normal use. However, these terms do not imply limitation on the use of the inspection unit or inspection device of this disclosure.
[0079] (Implementation Method)
[0080] The structure of the inspection unit according to the present disclosure will be described. Figure 1 This is a perspective view of the inspection unit of the present disclosure embodiment viewed from an obliquely upward angle. Figure 2 Viewed from below at an angle Figure 1 A three-dimensional view of the inspection unit.
[0081] like Figure 1 and Figure 2 As shown, the inspection unit 1 in this embodiment is an inspection unit that contacts the electrode terminals 101 of the battery 100 to perform performance checks on the battery 100. In this embodiment, the battery 100 is a square secondary battery. For example, the battery 100 is a lithium-ion battery for EVs. The dimensions of the battery 100 are, for example, a height of 120 mm, a width of 85 mm, and a thickness of 12.5 mm. The inspection unit 1 is configured, for example, to perform charge / discharge checks, power-on checks, and voltage checks.
[0082] The battery 100 has two electrode terminals 101. One electrode terminal 101 is the positive terminal. The other electrode terminal 101 is the negative terminal. In this embodiment, the inspection unit 1 is configured to contact either of the two electrode terminals 101. A stepped portion 101a is formed on each of the two electrode terminals 101.
[0083] The inspection unit 1 includes a housing 2, a socket 3, and a cable 4.
[0084] The housing 2 has a generally rectangular shape and includes a housing cover 21 and a housing base 22. By combining the housing cover 21 and the housing base 22, a storage space for the socket 3 and the cable 4 is formed inside the housing 2.
[0085] Figure 3 This is an exploded 3D view of inspection unit 1.
[0086] like Figure 3 As shown, the housing cover 21 and the housing base 22 are fixed by multiple fastening components 23 such as screws. The housing 2 is configured to house the socket 3 in a manner that allows it to move a distance L1 (second distance) along the axial direction X. The distance L1 is, for example, 15 mm. The housing 2 is formed such that the length of the width direction Y, which is orthogonal to the axial direction X, is longer than the length of the thickness direction Z, which is orthogonal to both the axial direction X and the width direction Y.
[0087] The socket 3 has a generally rectangular shape and includes a socket cover 31 and a socket base 32. By combining the socket cover 31 and the socket base 32, a storage space for storing one end of the cable 4 is formed inside the socket 3. The socket cover 31 and the socket base 32 are fixed together by multiple fastening components 33, such as screws. The length of the socket 3 in the width direction Y is formed to be longer than the length in the thickness direction Z, similar to the housing 2.
[0088] Cable 4 is configured to extend in the axial direction X. One end of cable 4 is held inside socket 3. Socket 3 and cable 4 are configured to be movable relative to housing 2 as an integral unit.
[0089] like Figure 1 and Figure 2 As shown, a circular terminal 41 for electrically connecting the cable 4 to an external device is connected to the other end of the cable 4. In this embodiment, the cable 4 is a cable with a cross-sectional area (e.g., 22SQ) capable of carrying high currents (e.g., 80 amperes or more).
[0090] like Figure 3 As shown, a force-applying component 5 is disposed inside the housing 2. The force-applying component 5 applies force to the socket 3 in the axial direction, so that a part of the socket 3 protrudes outward from the opening 2a provided in the housing 2.
[0091] The force-applying component 5 includes a first spring component 51 that applies force to one end of the socket 3 in the width direction Y, and a second spring component 52 that applies force to the other end of the socket 3 in the width direction Y. In this embodiment, the first spring component 51 and the second spring component 52 are composed of helical springs. The forces (spring constants) of the first spring component and the second spring component 52 are the same.
[0092] Figure 4 This is a perspective view showing the structure after the housing cover 21 and socket cover 31, which are part of the inspection unit 1, have been removed. Figure 5 It means Figure 4 The top view of the structure is a diagram showing the front end 6a of the probe 6 in the protruding position. Figure 6 It means Figure 4 The top view of the structure is a diagram showing the front end 6a of the probe 6 in the storage position. Figure 7 It means Figure 4 An exploded 3D diagram of the structure. Figure 8 Represented by a local cross section Figure 4 An enlarged 3D view of the structure.
[0093] The socket 3 is configured to accommodate multiple probes 6 that can move a distance L2 along the axial direction X (first distance: reference). Figure 5 Store it in a way that allows it to be stored. The distance from L2 is, for example, 1mm.
[0094] In this embodiment, such as Figures 4-8 As shown, a recess 32a is provided in the socket base 32, which houses three plate-shaped probes 6 stacked on top of each other in the thickness direction. Each probe 6 is configured to be able to move a distance L2 along the axial direction X within the recess 32a. The thickness of each probe 6 is, for example, 1 mm.
[0095] An elastic portion 7 is disposed inside the socket 3, which elastically deforms such that each probe 6 moves independently along the axial direction X. The elastic portion 7 is located at a protruding position at the front end 6a of each probe 6, protruding outward from the opening 3a provided in the socket 3 (see reference). Figure 5 When the probe 6 is in an inelastic deformation state, the elastic part 7 is configured such that the front end 6a of each probe 6 is recessed into the socket 3 (see reference). Figure 6 Elastic deformation occurs during movement.
[0096] like Figure 9 As shown, a pointed contact portion 6b is formed at the front end 6a of each probe 6. By moving each probe 6 independently along the axial direction X, each contact portion 6b can move along the stepped portion 101a of the electrode terminal 101 of the battery 100. In this embodiment, a plurality of contact portions 6b are formed at intervals along the length direction (width direction Y) at the front end 6a of each probe 6.
[0097] In this embodiment, the elastic portion 7 has elastic arms 71 and 72 protruding from both sides of each probe 6 in the width direction Y. The elastic arms 71 and 72 are disposed in a U-shaped recess 32b provided in the socket base 32, and are configured to elastically deform within the recess 32b in the axial direction X. When the probe 6 is in the storage position (see reference...), Figure 6 When the probe 6 contacts the sidewall of the recess 32a, its movement along the axial direction X is restricted due to the force exerted by the force-applying member 5. This reduces the load applied to the elastic arms 71 and 72, suppressing excessive elastic deformation of the elastic arms 71 and 72. In this embodiment, the elastic arms 71 and 72 are integrally formed with the probe 6.
[0098] The elastic force of the elastic part 7 is set to be smaller than the force of the force-applying member 5. That is, when a load is applied to the inspection unit 1 along the axial direction X, the elastic part 7 undergoes elastic deformation at a distance L2 before the force-applying member 5 is compressed by a distance L1. The force of the force-applying member 5 is, for example, set to be more than 15 times the elastic force of the elastic part 7.
[0099] Each probe 6 is stacked on top of the others in the thickness direction Z and held by a clamping member 8 that is elastic in the thickness direction Z. Thus, each probe 6 is tightly fitted together in the thickness direction Z. Conductive grease or conductive gel is applied between adjacent probes 6. Therefore, each probe 6 can move smoothly and independently in the axial direction X.
[0100] like Figure 7 As shown, each probe 6 has an elongated hole 6c that extends along the thickness direction Z and is longer in the axial direction X. In this embodiment, the elongated hole 6c is elliptical. The elongated hole 6c can also be rectangular. The clamping member 8 includes a nut 81, an annular spacer 82, a cylindrical spacer 83 with a flange, a spring washer 84 as an example of an elastic member that is elastic in the thickness direction Z, and a bolt 85 as an example of a pin. Furthermore, a circular terminal 42 is connected to one end of the cable 4.
[0101] Nut 81 is disposed on probe 6, which is disposed on one side of the thickness direction Z, separated by spacer 82 and circular terminal 42 of cable 4. Figure 8 (The middle is the upper side). Bolt 85 is separated from the other side of the thickness direction Z by spring washer 84 and spacer 83 (in Figure 8 The probe 6 is inserted into the elongated hole 6c of each probe 6 (with the lower side in the middle) and threaded onto the nut 81. Thus, each probe 6 is held in a tight fit in the thickness direction Z by the elastic force of the spring washer 84. Additionally, the cable 4 is connected via the circular terminal 42 to one side in the thickness direction Z (in the middle). Figure 8 The probe 6 is an electrical contact configured on the upper side (center).
[0102] Figure 10 This is a perspective view showing an example of an inspection device 200 equipped with the inspection unit 1 of this embodiment.
[0103] The inspection device 200 includes multiple inspection units 1, configured to simultaneously inspect the performance of multiple batteries 100. Figure 10 In this device, the inspection apparatus 200 includes an inspection unit 1A, which has a housing 2A formed by arranging two inspection units 1 adjacent to each other and integrating each housing 2. Furthermore, the inspection apparatus 200 has multiple inspection units 1A arranged side-by-side in the thickness direction Z. The dimensions of the housing 2A are, for example, a height of 57 mm, a width of 125 mm, and a thickness of 13.5 mm.
[0104] A through hole 2Aa is provided at the center of the housing 2A in both the axial direction X and the width direction Y, extending along the thickness direction Z. A cylindrical shaft 201 is inserted into the through hole 2Aa of each inspection unit 1A. Furthermore, the two sides of each inspection unit 1A in the width direction Y are held by a pair of side plates 202, 202. A groove 2Ab extending along the thickness direction Z is provided on the two opposite sides of the housing 2A of each inspection unit 1A in the width direction Y. A guide rail 203 extending along the thickness direction Z and inserted into the groove 2Ab is provided on each side plate 202, 202. Thus, multiple inspection units 1A are held at predetermined intervals in the thickness direction Z.
[0105] Next, an example of the operation of using the inspection device 200 to perform performance checks on multiple batteries 100 will be described.
[0106] First, such as Figure 10 As shown, an inspection device 200 is arranged at a position opposite to the electrode terminals 101, 101 of each battery 100.
[0107] Next, each inspection unit 1A is moved in the axial direction X (below the attached figure) so that the contact portion 6b of each probe 6 contacts the corresponding electrode terminals 101, 101 of the battery 100. As a result, the elastic portion 7 of each probe 6 undergoes elastic deformation, and the front end portion 6a of each probe 6 moves from its protruding position (see reference numeral 6b). Figure 5 ) To the storage location (refer to) Figure 6 ) Move. At this time, each probe 6 moves independently along the X-axis, as follows. Figure 9 As shown, each contact portion 6b moves along the stepped portion 101a of the electrode terminal 101.
[0108] Subsequently, the force-applying components 5 of each inspection unit 1A are compressed in the axial direction X. At this time, even if the positions of the multiple batteries 100 in the axial direction X are different at a distance L1 or less, by making each force-applying component 5 to its corresponding compression length, the contact portion 6b of all inspection units 1A contacts the electrode terminal 101 of the corresponding battery 100. In this state, the inspection device 200 performs various inspections on the multiple batteries 100.
[0109] The inspection units 1 and 1A according to this embodiment include an elastic portion 7 that elastically deforms to allow the plurality of probes 6 to move independently along the axial direction X. With this structure, the plurality of probes 6 can move in a manner that follows the stepped portion 101a of the electrode terminal 101. As a result, the number of contact portions 6b that contact the electrode terminal 101 can be increased, improving the contact reliability between the electrode terminal 101 and the probes 6. Furthermore, the occurrence of electric arcs can be suppressed, improving the durability of the probes 6.
[0110] Furthermore, according to the inspection units 1 and 1A of this embodiment, the distance L2 is set to be shorter than the distance L1. With this structure, the load applied to the elastic part 7 can be reduced, and the elastic part 7 can be made into a simple structure like the elastic arms 71 and 72.
[0111] Furthermore, according to the inspection units 1 and 1A of this embodiment, the elastic force of the elastic part 7 is set to be less than the force applied by the force-applying member 5. According to this structure, compared with the force-applying member 5, the elastic part 7 can be formed into a simple structure such as the elastic arm parts 71 and 72.
[0112] Furthermore, according to the inspection units 1 and 1A of this embodiment, the elastic portion 7 is configured such that when the front end portion 6a of each probe 6 is in the protruding position, it is in a non-elastic deformation state, and when the front end portion 6a of each probe 6 moves to the retracted position, the elastic portion 7 elastically deforms. With this structure, when the front end portion 6a of each probe 6 is not in contact with the electrode terminal 101, no load can be applied to the elastic portion 7, allowing the elastic portion 7 to have a simple structure like the elastic arms 71 and 72. In addition, when the front end portion 6a of each probe 6 moves to the retracted position, the elastic portion 7 elastically deforms, thereby improving the contact reliability between the probe 6 and the electrode terminal 101.
[0113] Furthermore, according to the inspection units 1 and 1A of this embodiment, each probe 6 is a plate-shaped probe, which is stacked on top of each other in the thickness direction, and the elastic part 7 has elastic arm portions 71 and 72 protruding from both sides of each probe 6 in the width direction Y. With this structure, the elastic part 7 and the probe 6 can be integrally formed, and the number of parts can be reduced.
[0114] Furthermore, according to the inspection units 1 and 1A of this embodiment, each probe 6 is a plate-shaped probe, which is stacked on top of each other in the thickness direction Z and held by a clamping member 8 that is elastic in the thickness direction Z. According to this structure, each probe 6 can be tightly attached to each other in the thickness direction Z and contact the electrode terminal 101.
[0115] Furthermore, according to the inspection units 1 and 1A of this embodiment, each probe 6 has an elongated hole 6c that extends through in the thickness direction Z and is longer in the axial direction X, and the clamping member 8 has a bolt 85 inserted into the elongated hole 6c. According to this structure, the clamping member 8 can clamp multiple probes 6 in a compact structure.
[0116] Furthermore, according to the inspection units 1 and 1A of this embodiment, the force-applying member 5 includes a first spring member 51 that applies force to one end of each probe 6 in the width direction Y, and a second spring member 52 that applies force to the other end of each probe 6 in the width direction Y. With this structure, even when the electrode terminal 101 has an inclination or step in the width direction Y, the contact reliability between each probe 6 and the electrode terminal 101 in the width direction Y can be improved.
[0117] Furthermore, the inspection apparatus 200 according to this embodiment includes multiple inspection units 1A. With this structure, multiple batteries 100 can be inspected simultaneously, thereby shortening the total inspection time.
[0118] It should be noted that this disclosure is not limited to the above-described embodiments and can be implemented in various other ways. For example, in the above description, the housing 2 is a closed structure except for the opening 2a and the hole for inserting the cable 4, but this disclosure is not limited to this. For example, a slit or hole for cooling the internal space may also be provided in the housing 2.
[0119] Furthermore, while the above description mentions that the inspection unit 1 includes a cable 4, this disclosure is not limited to this. The inspection unit 1 may also include a component capable of transmitting the current flowing through the probe 6 to an external device instead of the cable 4. For example, the inspection unit 1 may also include a conductor consisting of a metal rod and a connector that engages with the rod.
[0120] Furthermore, in the above description, the socket 3 is configured to house three plate-shaped probes 6, but this disclosure is not limited to this. For example, the socket 3 may also be configured to house two or more plate-shaped probes 6.
[0121] Furthermore, in the above description, each probe 6 has an elongated hole 6c, but this disclosure is not limited thereto. For example, one of the plurality of probes 6 may also have a circular hole corresponding to the diameter of the cylindrical spacer 83 or bolt 85. In this case, the axial X movement of the probe 6 with the circular hole is restricted, but by moving the other probes 6 with the elongated holes along the axial X, the contact reliability between the electrode terminal 101 and the probe 6 can be improved.
[0122] Furthermore, in the above description, the diagram illustrates the structure in which the elastic arms 71 and 72 of the elastic portion 7 protrude linearly from both sides of each probe 6 in the width direction Y (for example, see reference). Figure 5 However, this disclosure is not limited thereto. The elastic arms 71 and 72 are disposed in a U-shaped recess 32b provided in the socket base 32, and are configured to be elastically deformable along the axial direction X within the recess 32b. For example, as... Figure 11 As shown, the elastic arms 71 and 72 can also be formed in a meandering shape.
[0123] Furthermore, in the above description, the illustration shows a generally flat structure at the front end 6a of each probe 6 (for example, see reference). Figures 4-8 However, the present invention is not limited thereto. For example... Figure 11 As shown, the front end of each probe 6 can also be wavy.
[0124] Furthermore, the illustration above shows the case where all probes 6 are flat, plate-like components (see reference). Figure 7 However, the present invention is not limited thereto. For example... Figure 12 As shown, an elastic sheet 6d can also be provided on one side of each adjacent probe 6 to exert force on the other side of the adjacent probe 6 in the thickness direction Z. For example... Figure 12 As shown, the elastic sheet 6d is the portion surrounded by a U-shaped through hole 6e provided in a part of the probe 6. Figure 13 As shown, the elastic sheet 6d is formed by bending in a manner that protrudes from the main surface (XY plane) of the probe 6 in the thickness direction Z and extends along the X direction. Two elastic sheets 6d are provided in a probe 6 at positions symmetrical with respect to the axial direction X. Furthermore, when elastic sheets 6d are provided on both sides of adjacent probes 6, as... Figure 14 As shown, each elastic sheet 6d is positioned in a non-overlapping manner in the thickness direction. According to... Figures 12-14 The structure shown allows adjacent probes 6 to make more reliable contact with each other and allow current to flow between them.
[0125] Furthermore, in the above description, the inspection device 200 includes an inspection unit 1A, which has a housing 2A formed by arranging two inspection units 1 adjacently and integrating each housing 2. However, this disclosure is not limited to this. The inspection device 200 may also include multiple inspection units 1. Thus, for example, even batteries 100 with different distances between their two electrode terminals 101 can be inspected using the same inspection unit 1, improving versatility.
[0126] The various embodiments of this disclosure have been described in detail above with reference to the accompanying drawings. Finally, various solutions of this disclosure are described. It should be noted that, as an example, reference numerals are also added in the following description.
[0127] According to a first aspect of this disclosure, an inspection unit is provided, which contacts the electrode terminals 101 of the battery 100 to perform performance checks on the battery 101, characterized in that it comprises:
[0128] Multiple probes 6;
[0129] The socket 3 houses the plurality of probes 6 in a manner that allows them to move a first distance L2 along the axial direction X;
[0130] Housing 2, which houses the socket 3 in a manner that allows it to move a second distance L1 along the axial direction X;
[0131] A force-applying component 5 is disposed inside the housing 2 to apply force to the socket 3 in the axial direction X such that a portion of the socket 3 protrudes outward from the opening 2a provided in the housing 2;
[0132] The elastic part 7 is disposed inside the socket 3 so that each probe 6 can be elastically deformed in such a way that each probe 6 can move independently along the axial direction X.
[0133] According to the second aspect of this disclosure, based on the inspection unit described in the first aspect, an inspection unit 1 is provided in which the first distance L2 is shorter than the second distance L1.
[0134] According to the third aspect of this disclosure, based on the inspection units described in the first or second aspect, the following inspection unit 1 is provided:
[0135] The elastic force of the elastic part 7 is smaller than the force exerted by the force-applying component 5.
[0136] According to the fourth embodiment of this disclosure, based on the inspection units described in the first to third embodiments, the following inspection unit 1 is provided:
[0137] The elastic part 7 is configured such that when the front end 6a of each probe 6 is in a protruding position protruding outward from the opening 3a provided in the socket 3, it is in a non-elastic deformation state, and when the front end 6a of each probe 6 moves to a storage position located inside the socket 3, it undergoes elastic deformation.
[0138] According to the fifth aspect of this disclosure, based on the inspection units described in the fourth aspect, the following inspection unit 1 is provided:
[0139] Each probe 6 is a plate-shaped probe, stacked on top of each other in the thickness direction Z.
[0140] The elastic portion 7 has elastic arms 71, 72 that protrude from both sides of each probe 6 in the width direction Y, which is orthogonal to the axial direction X and the thickness direction Z.
[0141] According to the sixth embodiment of this disclosure, based on the inspection unit described in the fourth embodiment, the following inspection unit 1 is provided:
[0142] Each probe 6 is a plate-shaped probe, which is stacked on top of each other in the thickness direction Z and is clamped by a clamping member 8 that is elastic in the thickness direction Z.
[0143] According to the seventh aspect of this disclosure, based on the inspection units described in the sixth aspect, the following inspection unit 1 is provided:
[0144] At least one of the plurality of probes 6 has an elongated hole 6c that extends through the thickness direction Z and is elongated in the axial direction X.
[0145] The clamping component 8 has a pin 85 that is inserted into the elongated hole 6c.
[0146] According to the eighth embodiment of this disclosure, based on the inspection unit described in the fourth embodiment, the following inspection unit 1 is provided:
[0147] Each probe 6 is a plate-shaped probe, stacked on top of each other in the thickness direction.
[0148] The force-applying component 5 includes: a first spring component 51, which applies force to one end of each probe 6 in the width direction Y, which is orthogonal to the axial direction X and the thickness direction Z; and a second spring component 52, which applies force to the other end of each probe 6 in the width direction Y.
[0149] According to the ninth aspect of this disclosure, based on the inspection unit described in the first aspect, the following inspection unit 1 is provided:
[0150] Each probe 6 is a plate-shaped probe, stacked on top of each other in the thickness direction Z.
[0151] One of the adjacent probes 6 is provided with an elastic sheet 6d, which exerts a force on the other of the adjacent probes 6 in the thickness direction Z.
[0152] According to the tenth aspect of this disclosure, an inspection device 200 is provided, comprising a plurality of inspection units 1, 1A as described in any one of the first to ninth aspects.
[0153] By appropriately combining any of the above-described various embodiments or variations, the respective effects can be achieved. Furthermore, it is possible to combine embodiments with each other, or to combine different embodiments with different examples, and it is also possible to combine features from different embodiments or examples with each other.
[0154] This disclosure has been fully described with reference to the accompanying drawings and preferred embodiments, but it will be apparent to those skilled in the art that various modifications and alterations can be made. It should be understood that such modifications and alterations are included without departing from the scope of this disclosure according to the appended claims.
[0155] Industrial applicability
[0156] The inspection unit and inspection apparatus disclosed herein can improve the contact reliability between the battery electrode terminals and the probes, and are therefore particularly advantageous as an inspection unit and inspection apparatus used in the inspection of prismatic batteries for EVs.
Claims
1. An inspection unit that contacts the electrode terminals of a battery to inspect battery performance, characterized in that, have: Multiple probes; A socket that houses the plurality of probes in a manner that allows them to move a first distance axially. A housing that stores the socket in a manner that allows it to move a second distance along the axial direction; A force-applying component, disposed inside the housing, applies force to the socket in the axial direction such that a portion of the socket protrudes outward from an opening provided in the housing. An elastic portion, disposed inside the socket, is elastically deformed such that each probe moves independently along the axial direction.
2. The inspection unit according to claim 1, characterized in that, The first distance is shorter than the second distance.
3. The inspection unit according to claim 1, characterized in that, The elastic force of the elastic part is smaller than the force exerted by the force-applying component.
4. The inspection unit according to claim 1, characterized in that, The elastic part is configured such that when the front end of each probe is in a protruding position protruding outward from the opening provided in the socket, it is in a non-elastic deformation state, and when the front end of each probe moves to a storage position located inside the socket, it undergoes elastic deformation.
5. The inspection unit according to claim 4, characterized in that, Each probe is a plate-shaped probe, stacked on top of each other in the thickness direction. The elastic portion has elastic arms that protrude from both sides of each probe in a width direction orthogonal to the axial direction and the thickness direction.
6. The inspection unit according to claim 4, characterized in that, Each probe is a plate-shaped probe, stacked on top of each other in the thickness direction, and held by a clamping member that is elastic in the thickness direction.
7. The inspection unit according to claim 6, characterized in that, At least one of the plurality of probes has an elongated hole that extends through the thickness direction and is long in the axial direction. The clamping component has a pin that can be inserted into the elongated hole.
8. The inspection unit according to claim 4, characterized in that, Each probe is a plate-shaped probe, stacked on top of each other in the thickness direction. The force-applying component comprises: a first spring component that applies force to one end of each probe in the width direction orthogonal to the axial direction and the thickness direction; and a second spring component that applies force to the other end of each probe in the width direction.
9. The inspection unit according to claim 1, characterized in that, Each probe is a plate-shaped probe, stacked on top of each other in the thickness direction. One of the adjacent probes is provided with an elastic sheet that applies force to the other of the adjacent probes in the thickness direction.
10. An inspection device, characterized in that, It comprises a plurality of inspection units as described in any one of claims 1 to 9.
Citation Information
Patent Citations
Large-current probe pin
JP2018124252A