VCSEL-based object detection system and method

Abstract

The invention belongs to the technical field of object detection, and provides a VCSEL-based object detection system and method, the system comprises a laser emission area, an optical signal receiving area and a data processor, the laser emission area comprises at least one first VCSEL, the optical signal receiving area comprises at least one second VCSEL, the first VCSEL and the second VCSEL are in one-to-one correspondence, and the second VCSEL is connected with the data processor; the first VCSEL is used for emitting a laser beam to a to-be-measured object; the second VCSEL is used for receiving the first optical signal reflected by the object to be measured and converting the first optical signal into an electric signal to obtain an actually measured voltage value; the data processor is used for comparing the actually measured voltage value with a preset voltage threshold value and obtaining an object detection result according to a comparison result. According to the scheme, the photoelectric conversion characteristic of the VCSEL is utilized, the system circuit structure and the hardware layout are simplified, the detection stability is improved, the threshold comparison logic is matched, and the reliability and the convenience of detection are both considered.

Description

Technical Field

[0001] This invention relates to the field of object detection technology, and in particular to an object detection system and method based on VCSEL. Background Technology

[0002] In fields such as consumer electronics, industrial control, and intelligent sensing, object detection is one of the core requirements of many products. Its core objective is to quickly and accurately determine the presence or absence of a target object, providing a basis for subsequent equipment control and function triggering.

[0003] Currently, most mainstream object detection schemes rely on independent photoelectric detection devices, such as photodiodes, avalanche photodiodes, and single-photon avalanche diodes. The working principle of these schemes is as follows: a laser emitting module emits a light signal into the detection area, and the aforementioned independent photoelectric detection device receives the light signal reflected by the object, converts it into an electrical signal, and then uses signal processing circuitry to analyze and determine whether the object to be detected exists.

[0004] However, in products that already integrate VCSELs (Vertical Cavity Surface Emitting Lasers) as laser emission sources, such as 3D sensing modules, LiDAR, and smart terminals, the aforementioned traditional solutions have significant drawbacks. Specifically, on the one hand, it requires the additional integration of independent detection devices such as photodiodes into the product module. This not only increases the hardware cost of the module but also necessitates reserving installation space for the detection devices and designing independent optical windows and signal transmission leads, resulting in an increased overall module size and severely hindering the trend towards miniaturization and thinner designs. On the other hand, the integration of independent detection devices with the VCSEL emission source requires coordinating issues such as optical path matching and electrical interface connection, making the module structure design more complex. The increased number of leads may also introduce signal interference risks, affecting detection stability. Furthermore, the presence of independent detection devices occupies part of the optical window area, reducing the effective light energy utilization rate of the VCSEL emission and indirectly affecting the detection distance and sensitivity.

[0005] Although VCSELs, as high-performance laser emitting devices, have been widely used in various optoelectronic devices, they are only used as laser emitting units and cannot solve the core pain points of traditional solutions in terms of integration, miniaturization, and low cost. Summary of the Invention

[0006] This invention provides a VCSEL-based object detection system and method to address the shortcomings of traditional object detection schemes, such as low integration, high cost, and insufficient detection accuracy.

[0007] On one hand, the present invention provides an object detection system based on VCSEL, comprising: a laser emitting area, an optical signal receiving area, and a data processor. The laser emitting area contains at least one first VCSEL, and the optical signal receiving area contains at least one second VCSEL. The first VCSEL and the second VCSEL correspond one-to-one, and the second VCSEL is connected to the data processor. The first VCSEL is used to emit a laser beam to the object under test; the second VCSEL is used to receive the first light signal reflected back from the object under test and convert the first light signal into an electrical signal to obtain a measured voltage value; the data processor is used to compare the measured voltage value with a preset voltage threshold and obtain the object detection result based on the comparison result.

[0008] According to the VCSEL-based object detection system provided by the present invention, the preset voltage threshold includes: an upper voltage limit and a lower voltage limit; The data processor obtains object detection results based on the comparison results, including: If the comparison result shows that the measured voltage value is less than the lower voltage limit, then the object detection result is that no object was detected within the set range; If the comparison result shows that the measured voltage value is greater than the upper limit of the voltage, then the object detection result is that an object was detected within the set range.

[0009] According to the VCSEL-based object detection system provided by the present invention, the upper voltage limit is obtained through the following process: First, when the white standard test plate is obstructing the light, a laser beam is emitted to the white standard test plate through the first VCSEL, and a second light signal reflected back from the white standard test plate is received through the second VCSEL. The second light signal is then converted into an electrical signal to obtain a first voltage value. Then, based on the first voltage value, a voltage upper limit value is determined, wherein the voltage upper limit value is less than the first voltage value.

[0010] According to the VCSEL-based object detection system provided by the present invention, determining the upper voltage limit value based on the first voltage value includes: Multiply the first voltage value by the first set ratio value to obtain the anti-interference redundancy. The upper limit of the voltage is calculated by subtracting the first voltage value from the anti-interference redundancy amount.

[0011] According to the VCSEL-based object detection system provided by the present invention, the lower voltage limit is obtained through the following process: When there is no object obstructing the view, a laser beam is emitted to the object under test through the first VCSEL, and a third optical signal reflected back from the object under test is received through the second VCSEL. The third optical signal is converted into an electrical signal, and after signal amplification, a second voltage value is obtained. Based on the second voltage value, a lower voltage limit is determined, wherein the lower voltage limit is greater than the second voltage value.

[0012] According to the VCSEL-based object detection system provided by the present invention, determining a lower voltage limit value based on the second voltage value includes: Multiply the second voltage value by the second set ratio value to obtain the dynamic redundancy. The second voltage value is added to the dynamic redundancy to calculate the lower voltage limit.

[0013] According to the VCSEL-based object detection system provided by the present invention, the data processor is further configured to: When the object detection result indicates that an object has been detected within a set range, a voltage-distance reference curve is established. The theoretical distance corresponding to the measured voltage value is determined from the voltage-distance reference curve; Based on the theoretical distance, the relative distance between the object to be measured and the detection system is determined.

[0014] According to the VCSEL-based object detection system provided by the present invention, a voltage-distance reference curve is established, including: In a standard environment with no strong light interference and using a white standard test board, the relative distance between the known object and the detection system is changed in a set step size, and the corresponding stable voltage value at each relative distance is collected to generate a reference mapping table. Based on the relative distances and stable voltage values ​​of each group in the reference mapping table, multiple calibration data points are constructed; By fitting the multiple calibration data points, a voltage versus distance reference curve is obtained.

[0015] According to the VCSEL-based object detection system provided by the present invention, determining the relative distance between the object to be detected and the detection system based on the theoretical distance includes: The theoretical distance is compared with a set distance threshold. If the theoretical distance is greater than the set distance threshold, the theoretical distance is directly used as the relative distance between the object to be measured and the detection system. If the theoretical distance is less than or equal to the set distance threshold, the theoretical distance is multiplied by the preset distance correction value to obtain the relative distance between the object to be measured and the detection system.

[0016] On the other hand, the present invention also provides a VCSEL-based object detection method, based on any of the aforementioned VCSEL-based object detection systems, the method comprising: A laser beam is emitted toward the object under test through the first VCSEL; The first optical signal reflected back from the object under test is received by the second VCSEL, and the first optical signal is converted into an electrical signal to obtain the measured voltage value; The data processor compares the measured voltage value with a preset voltage threshold and obtains the object detection result based on the comparison result.

[0017] The object detection system and method based on VCSEL provided by this invention utilizes the photoelectric conversion characteristics of VCSEL itself, directly using a second VCSEL as the core component for optical signal reception and electrical signal conversion. This eliminates the need for additional independent photoelectric detection devices, significantly simplifying the system circuit structure and hardware layout. It reduces the electrical pins, leads, and installation space required for device integration, effectively shrinking the overall size of the product module and contributing to the miniaturization and thinning of products. Simultaneously, it avoids the problem of independent detection devices occupying optical window area, ensuring the effective utilization rate of the light energy emitted by the first VCSEL laser and improving detection stability. Furthermore, the one-to-one correspondence design between the first and second VCSELs ensures precise matching between the laser emission path and the reflected light reception path. Combined with the threshold comparison logic of the data processor, it achieves efficient object detection. While reducing hardware costs and integration complexity, it also ensures the reliability and convenience of detection, especially suitable for various products that have already integrated VCSELs, making it applicable to a wide range of scenarios. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the structure of the VCSEL-based object detection system provided in an embodiment of the present invention; Figure 2 This is a schematic diagram illustrating the working principle of the VCSEL-based object detection system in the case of an object to be measured in an embodiment of the present invention. Figure 3 This is a schematic diagram illustrating the working principle of the VCSEL-based object detection system in the absence of a target object in this embodiment of the invention. Figure 4This is a waveform diagram of the relevant signals when there are no objects obstructing the view in an embodiment of the present invention; Figure 5 This is a waveform diagram of the relevant signals when there is an object blocking the view in an embodiment of the present invention; Figure 6 This is a flowchart illustrating the object detection method based on VCSEL provided in an embodiment of the present invention. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0021] The following is combined Figures 1 to 6 This invention describes in detail the object detection system and method based on VCSEL provided in the embodiments of the present invention.

[0022] like Figure 1 and Figure 2 As shown, the VCSEL-based object detection system provided in this embodiment of the invention specifically includes: a laser emitting area 110, an optical signal receiving area 120, and a data processor 130. The laser emitting area 110 contains at least one first VCSEL 140, and the optical signal receiving area 120 contains at least one second VCSEL 150. The first VCSEL 140 and the second VCSEL 150 correspond one-to-one, and the second VCSEL 150 is connected to the data processor 130.

[0023] The first VCSEL 140 is used to emit a laser beam to the object under test 210; the second VCSEL 150 is used to receive the first optical signal reflected back by the object under test 210, and convert the first optical signal into an electrical signal to obtain the measured voltage value; the data processor 130 is used to compare the measured voltage value with a preset voltage threshold, and obtain the object detection result based on the comparison result.

[0024] It is understood that the core of this invention is to utilize the photoelectric conversion characteristics of VCSEL. Under certain conditions, the second VCSEL can convert the reflected light signal into an electrical signal, thereby obtaining the measured voltage value, and then using voltage comparison to realize object detection.

[0025] In this embodiment, two partitions are set up: a laser emitting area 110 and an optical signal receiving area 120. The VCSEL devices in these two partitions are set up exactly the same. The only difference is that the first VCSEL 140 in the laser emitting area 110 needs to be powered, while the second VCSEL 150 in the optical signal receiving area 120 does not need to be powered.

[0026] Understandably, the color of the object being tested must be able to reflect light to ensure the effectiveness of the detection process.

[0027] In one embodiment, the preset voltage threshold includes an upper voltage limit and a lower voltage limit.

[0028] Furthermore, the data processor obtains object detection results based on the comparison results, specifically including: If the comparison result shows that the measured voltage value is less than the lower voltage limit, then the object detection result is that no object was detected within the set range.

[0029] If the comparison result shows that the measured voltage value is greater than the upper limit of the voltage, then the object detection result is that an object was detected within the set range.

[0030] It is understandable that if there is an object blocking the light, the reflected light signal received by the second VCSEL is stronger, and the corresponding measured voltage value is higher. Conversely, if there is no object blocking the light, the reflected light signal received by the second VCSEL is weaker, and the corresponding measured voltage value is lower. This principle can be used to achieve convenient and accurate object detection.

[0031] In one embodiment, the upper voltage limit can be obtained through the following process: First, when the white standard test plate is obstructing the light, a laser beam is emitted to the white standard test plate through the first VCSEL, and a second optical signal reflected back from the white standard test plate is received through the second VCSEL. The second optical signal is then converted into an electrical signal to obtain a first voltage value.

[0032] Understandably, since white is a color with strong light-reflecting ability, this embodiment emits a laser beam to a white standard test board through a first VCSEL, and then receives the second light signal reflected back from the white standard test board through a second VCSEL. Because the second light signal is strong, the corresponding first voltage value is the theoretical maximum voltage value. Figure 3 The waveform curve of the first voltage value V1 is shown.

[0033] like Figure 3As shown, curve C1 represents the enable signal for laser emission from the first VCSEL, curve C2 represents the electrical signal before amplification acquired by the second VCSEL, and curve C3 represents the amplified electrical signal acquired by the second VCSEL. When most of the emitted laser beam is reflected back, the first voltage value V1 can be acquired at time t.

[0034] In practical applications, a test board with a reflectivity of over 90% can be selected as a white standard test board, and the white standard test board can be placed in 5 gradient positions according to the set detection distance range, such as 0 to 50cm.

[0035] Twenty sets of reflected second light signals are collected at each location. After photoelectric conversion, a first voltage value is obtained. Then, the first voltage value obtained from the 20 sets of second light signals collected at each location is averaged to obtain the average voltage value at each location. Then, the average voltage values ​​at all locations are weighted and averaged to obtain the weighted average of the first voltage value. This average is used as the theoretical voltage value for subsequent calculation of the upper limit of voltage to eliminate the influence of distance deviation.

[0036] Even better, in practical applications, a signal saturation verification mechanism can be introduced. If the first voltage value measured at a certain location exceeds 80% of the photoelectric conversion saturation threshold of the optical signal receiving area, the duty cycle of the transmitting area will be automatically reduced without changing the frequency, and the optical signal and photoelectric conversion will be re-acquired until the first voltage value is between 50% and 70% of the saturation threshold, thus taking into account both sensitivity and stability requirements.

[0037] Then, based on the first voltage value, the upper voltage value is determined, wherein the upper voltage value is less than the first voltage value.

[0038] In one specific implementation, the upper voltage limit is determined based on the first voltage value, specifically including: The first step is to multiply the first voltage value by the first set ratio value to obtain the anti-interference redundancy.

[0039] In practical applications, the first set ratio can be between 15% and 20%, and can be set reasonably according to actual needs.

[0040] The second step is to calculate the upper limit of the voltage by subtracting the first voltage value from the anti-interference redundancy.

[0041] This embodiment sets an anti-interference redundancy amount and calculates the upper voltage limit by subtraction, which ensures that the upper voltage limit is close to and slightly less than the first voltage value, thereby improving the reliability of subsequent detection.

[0042] In one embodiment, the lower voltage limit can be obtained through the following process: First, when there is no obstruction, a laser beam is emitted to the object under test through the first VCSEL, and the third optical signal reflected back by the object under test is received through the second VCSEL. The third optical signal is converted into an electrical signal, and after signal amplification, a second voltage value is obtained.

[0043] It is understandable that, such as Figure 4 As shown, when the first VCSEL 140 emits a laser beam at a certain frequency or duty cycle, the reflected light signal is relatively weak or close to zero due to the absence of any obstruction. At this time, the second VCSEL 150 receives the weak reflected light signal, converts it into an electrical signal, and after small-signal amplification, can acquire the second voltage value. Figure 5 The waveform curve of the second voltage value V2 is shown. (For example...) Figure 5 As shown, curve C1 represents the enable signal of the first VCSEL laser emission stage, curve C2 represents the electrical signal before amplification acquired by the second VCSEL, and curve C3 represents the amplified electrical signal acquired by the second VCSEL. When only a weak portion of the emitted laser beam is reflected back, the second voltage value V2 can be acquired at time t.

[0044] In some embodiments, 100 sets of second voltage values ​​can be repeatedly collected, and extreme values ​​can be removed using a sliding window filtering algorithm. Subsequently, the average value of all second voltage values ​​after removing extreme values ​​can be taken as the theoretical value of the lower voltage limit for determining the upper voltage limit, thereby improving the accuracy of the lower voltage limit.

[0045] Then, based on the second voltage value, a lower voltage limit is determined, wherein the lower voltage limit is greater than the second voltage value.

[0046] In one specific implementation, the lower voltage limit is determined based on the second voltage value, specifically including: The first step is to multiply the second voltage value by the second set ratio value to obtain the dynamic redundancy.

[0047] In practical applications, the second set ratio can be between 15% and 20%, and can be set reasonably according to actual needs.

[0048] The second step is to add the second voltage value to the dynamic redundancy amount to calculate the lower voltage limit.

[0049] In this embodiment, by setting a dynamic redundancy and calculating the lower voltage limit by summation, the lower voltage limit can be ensured to be close to and slightly greater than the second voltage value, thereby improving the reliability of subsequent detection.

[0050] In one embodiment, the data processor can also be used for: First, when the object detection result shows that an object has been detected within the set range, a voltage-distance reference curve is established.

[0051] In a specific implementation, a voltage versus distance reference curve is established, which includes: The first step is to change the relative distance between the known object and the detection system in a standard environment with no strong light interference and using a white standard test board, and collect the corresponding stable voltage value at each relative distance to generate a reference mapping table.

[0052] In practical applications, experimental calibration of VCSEL-based object detection systems can be performed in a specific standard environment—that is, under conditions of no strong light interference and the use of a white standard test board. Specifically, the distance between the white standard test board and the first and second VCSELs is changed in fixed steps, such as 1 cm. This distance can be denoted as 'd', with a value ranging from 0 to 50 cm. During the distance change, the stable voltage value V3 corresponding to each distance 'd' is collected. After organizing these distances and their corresponding stable voltage values, a reference mapping table, namely the d-V3 mapping table, can be generated.

[0053] The second step is to construct multiple calibration data points based on the relative distances and stable voltage values ​​of each group in the reference mapping table.

[0054] The third step is to fit multiple calibration data points to obtain the voltage-distance reference curve.

[0055] In practical applications, multiple two-dimensional calibration data points can be obtained from the data in the reference mapping table. By fitting each calibration data point, a nonlinear function can be obtained. This nonlinear function exhibits an exponential decay characteristic because the reflected light intensity is inversely proportional to the square of the distance. For example, when the distance d increases from 0 in 1-centimeter increments, the collected stable voltage value V3 will change exponentially with increasing distance. Recording these data in the reference mapping table and then fitting them yields a voltage versus distance reference curve.

[0056] Then, the theoretical distance corresponding to the measured voltage value is determined from the voltage-distance reference curve.

[0057] In this embodiment, by finding the data point corresponding to the current measured voltage value from the voltage-distance reference curve, the corresponding theoretical distance can be obtained, thereby enabling the rapid determination of the theoretical distance.

[0058] Finally, based on the theoretical distance, the relative distance between the object to be measured and the detection system is determined.

[0059] In a specific implementation, the relative distance between the object to be measured and the detection system is determined based on the theoretical distance, specifically including: In one scenario, the theoretical distance is compared with a set distance threshold. If the theoretical distance is greater than the set distance threshold, the theoretical distance is directly used as the relative distance between the object to be measured and the detection system.

[0060] In another scenario, if the theoretical distance is less than or equal to the set distance threshold, the theoretical distance is multiplied by the preset distance correction value to obtain the relative distance between the object to be measured and the detection system.

[0061] In this embodiment, the distance threshold can be set reasonably according to the actual detection needs. For example, the distance threshold can be set to 10 centimeters. If the theoretical distance is greater than the set distance threshold, it means that the detected object is relatively far away from the detection system. At this time, the theoretical distance can be directly used as the relative distance between the object to be measured and the detection system to ensure the feedback efficiency of the detection data.

[0062] However, if the theoretical distance is less than or equal to the set distance threshold, it means that the detected object is close to the detection system. In this case, a preset distance correction value can be multiplied by the theoretical distance. This preset distance correction value is a coefficient value between 0 and 1, which can effectively correct the theoretical error of the theoretical distance, thereby ensuring the detection reliability of the close-range detection link.

[0063] The VCSEL-based object detection system provided by this invention has the core advantage of innovatively leveraging the photoelectric conversion characteristics of VCSELs. By using VCSELs with identical configurations in at least two partitions, laser emission and optical signal reception functions are achieved separately, eliminating the need for additional independent photoelectric detection devices. This not only significantly reduces hardware costs and device redundancy, but also eliminates the need for installation space for detection devices, electrical pins, and lead wire design, effectively simplifying the circuit structure and module layout. This facilitates the miniaturization and thinning of products and avoids the problem of independent detection devices occupying optical window area, ensuring the effective utilization rate of laser emission. At the same time, based on the voltage difference formed by the difference in reflected light intensity and the dual threshold judgment logic, accurate object detection is achieved. It is compatible with various products that have integrated VCSELs, making it applicable to a wide range of scenarios. While improving the convenience and stability of detection, it reduces integration complexity and the risk of signal interference.

[0064] Based on the same general inventive concept, this invention also protects a VCSEL-based object detection method. The VCSEL-based object detection method provided by this invention will be described below. The VCSEL-based object detection method described below can be referred to in correspondence with the VCSEL-based object detection system described above.

[0065] like Figure 6As shown, the VCSEL-based object detection method provided in this embodiment of the invention can be implemented based on the VCSEL-based object detection system provided in the above embodiments. The method specifically includes the following steps: Step 310: Emit a laser beam to the object under test through the first VCSEL.

[0066] Step 320: Receive the first light signal reflected back from the object under test through the second VCSEL, and convert the first light signal into an electrical signal to obtain the measured voltage value.

[0067] Step 330: The measured voltage value is compared with the preset voltage threshold by the data processor, and the object detection result is obtained based on the comparison result.

[0068] The specific implementation of each step in the methods described in the above embodiments has been described in detail in the embodiments of the relevant systems, and will not be elaborated further here.

[0069] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A VCSEL-based object detection system, characterized in that, include: The system includes a laser emitting area, an optical signal receiving area, and a data processor. The laser emitting area contains at least one first VCSEL, and the optical signal receiving area contains at least one second VCSEL. The first VCSEL and the second VCSEL correspond one-to-one, and the second VCSEL is connected to the data processor. The first VCSEL is used to emit a laser beam toward the object under test; the second VCSEL is used to receive the first optical signal reflected back from the object under test and convert the first optical signal into an electrical signal to obtain the measured voltage value. The data processor is used to compare the measured voltage value with a preset voltage threshold and obtain the object detection result based on the comparison result.

2. The VCSEL-based object detection system of claim 1, wherein, The preset voltage threshold includes: an upper voltage limit and a lower voltage limit; The data processor obtains object detection results based on the comparison results, including: If the comparison result shows that the measured voltage value is less than the lower voltage limit, then the object detection result is that no object was detected within the set range; If the comparison result shows that the measured voltage value is greater than the upper limit of the voltage, then the object detection result is that an object was detected within the set range.

3. The VCSEL-based object detection system of claim 2, wherein, The upper voltage limit value is obtained through the following process: When the white standard test plate is blocked, a laser beam is emitted to the white standard test plate through the first VCSEL, and the second optical signal reflected back by the white standard test plate is received through the second VCSEL. The second optical signal is then converted into an electrical signal to obtain the first voltage value. Based on the first voltage value, a voltage upper limit value is determined, wherein the voltage upper limit value is less than the first voltage value.

4. The VCSEL-based object detection system of claim 3, wherein, Based on the first voltage value, determine the upper voltage limit, including: Multiply the first voltage value by the first set ratio value to obtain the anti-interference redundancy. The upper limit of the voltage is calculated by subtracting the first voltage value from the anti-interference redundancy amount.

5. The VCSEL-based object detection system of claim 2, wherein, The lower voltage limit is obtained through the following process: When there is no object obstructing the view, a laser beam is emitted to the object under test through the first VCSEL, and a third optical signal reflected back from the object under test is received through the second VCSEL. The third optical signal is converted into an electrical signal, and after signal amplification, a second voltage value is obtained. Based on the second voltage value, a lower voltage limit is determined, wherein the lower voltage limit is greater than the second voltage value.

6. The VCSEL-based object detection system of claim 5, wherein, Based on the second voltage value, determine the lower voltage limit, including: Multiply the second voltage value by the second set ratio value to obtain the dynamic redundancy. The second voltage value is added to the dynamic redundancy to calculate the lower voltage limit.

7. The VCSEL-based object detection system of claim 1, wherein, The data processor is also used for: When the object detection result indicates that an object has been detected within a set range, a voltage-distance reference curve is established. The theoretical distance corresponding to the measured voltage value is determined from the voltage-distance reference curve; Based on the theoretical distance, the relative distance between the object to be measured and the detection system is determined.

8. The VCSEL-based object detection system according to claim 7, characterized in that, Establish voltage vs. distance reference curves, including: In a standard environment with no strong light interference and using a white standard test board, the relative distance between the known object and the detection system is changed in a set step size, and the corresponding stable voltage value at each relative distance is collected to generate a reference mapping table. Based on the relative distances and stable voltage values ​​of each group in the reference mapping table, multiple calibration data points are constructed; By fitting the multiple calibration data points, a voltage versus distance reference curve is obtained.

9. The VCSEL-based object detection system of claim 7, wherein, Based on the theoretical distance, the relative distance between the object to be measured and the detection system is determined, including: The theoretical distance is compared with a set distance threshold. If the theoretical distance is greater than the set distance threshold, the theoretical distance is directly used as the relative distance between the object to be measured and the detection system. If the theoretical distance is less than or equal to the set distance threshold, the theoretical distance is multiplied by the preset distance correction value to obtain the relative distance between the object to be measured and the detection system.

10. A method of object detection based on a VCSEL, characterized in that Based on the VCSEL-based object detection system as described in any one of claims 1 to 9, the method includes: A laser beam is emitted toward the object under test through the first VCSEL; The first optical signal reflected back from the object under test is received by the second VCSEL, and the first optical signal is converted into an electrical signal to obtain the measured voltage value; The data processor compares the measured voltage value with a preset voltage threshold and obtains the object detection result based on the comparison result.

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