Test control device of test cabinet and control method thereof

Abstract

The invention relates to a test control device of a test cabinet and a control method thereof, the test control device is applied to the test cabinet, the test control device comprises a control module, an electronic lock module, a travel switch module and a relay module, and the control module is electrically connected to the electronic lock module, a contact switch module and the relay module; the test control device is provided with a cabinet installation space for accommodating a test cabinet, the travel switch module is configured to output a corresponding level signal to the control module based on the insertion condition of the test cabinet, and the control module can control the power-on or power-off of the test cabinet through the relay module; before the test cabinet is inserted in place and electrified, when the control module controls the electronic lock module to be in a closed state, the electronic lock module is locked with the test cabinet; and after the test cabinet is powered off, the control module controls the electronic lock module to be in an open state, and the electronic lock module is separated from the test cabinet. The test accuracy and safety of the test cabinet can be improved.

Description

Technical Field

[0001] This application relates to the field of test cabinet technology, and in particular to a test control device and control method for a test cabinet. Background Technology

[0002] In the mass production testing (production testing) phase of electronic products, to improve testing efficiency and optimize space utilization, multiple test units are typically integrated into standardized test chassis, and several test chassis are vertically stacked in a test cabinet to form a multi-layer test platform. This design allows for parallel testing of more products under test (DUTs) within a limited lateral footprint, thereby increasing production capacity.

[0003] The test cabinet must be precisely inserted into a fixed position to obtain more accurate test data. Furthermore, if the operator performs operations on the cabinet without shutting it down during the testing process, it may cause damage to the test equipment and the object under test. Summary of the Invention

[0004] This application provides a test control device and method for a test cabinet, which aims to solve the problem that if the operator performs operations without shutting down the cabinet during the test process, it may cause damage to the test equipment and the object under test.

[0005] In a first aspect, embodiments of this application provide a test control device for a test cabinet, applied to a test cabinet. The test control device includes: a control module, an electronic lock module, a limit switch module, and a relay module. The control module is electrically connected to the electronic lock module, the limit switch module, and the relay module. The test control device has a cabinet installation space for accommodating the test cabinet. The limit switch module is configured to output a corresponding level signal to the control module based on the insertion status of the test cabinet. The control module can control the power supply or power de-energization of the test cabinet through the relay module.

[0006] Before the test cabinet is inserted into place and powered on, the electronic lock module locks itself to the test cabinet when the control module controls the electronic lock module to be in the closed state.

[0007] After the test cabinet is powered off, the control module controls the electronic lock module to be in the open state, and the electronic lock module is separated from the test cabinet.

[0008] A further technical solution is that the electronic lock module includes an electronic lock and an electronic lock control circuit. The electronic lock control circuit includes a first MOSFET, a second MOSFET, a first connector, and an MCU control signal connection terminal. The first MOSFET is connected to the second MOSFET and the first connector. The second MOSFET is connected to the control module through the MCU control signal connection terminal. The first connector is connected to the electronic lock.

[0009] When the MCU control signal connection terminal outputs a high-level signal, the first MOSFET and the second MOSFET are in a closed state, and the electronic lock is in an open state.

[0010] When the MCU control signal connection terminal outputs a low-level signal, the first MOSFET and the second MOSFET are in a disconnected state, and the electronic lock is in a closed state.

[0011] A further technical solution is that the first MOSFET is a P-type MOSFET and the second MOSFET is an N-type MOSFET.

[0012] A further technical solution is that the limit switch module includes a contact limit switch and a limit switch control circuit. The limit switch control circuit includes a third MOSFET, a second connector, and a feedback signal connection terminal. The third MOSFET is connected between the second connector and the feedback signal connection terminal. The feedback signal connection terminal is connected to the control module. The contact limit switch is connected to the second connector.

[0013] When the test cabinet does not contact the contact limit switch, the contact limit switch and the third MOSFET are in an open state, and the feedback signal connection terminal outputs a high-level signal to the control module;

[0014] When the test cabinet comes into contact with the contact limit switch, the contact limit switch and the third MOSFET are in a closed state, and the feedback signal connection terminal outputs a low-level signal to the control module.

[0015] A further technical solution is that the contact-type limit switch has switch contacts;

[0016] When the test cabinet comes into contact with the switch contact, the contact-type limit switch is in the closed state;

[0017] When the test cabinet is not in contact with the switch contacts, the contact-type limit switch is in the open state.

[0018] A further technical solution is that the contact-type limit switch has a normally open terminal, a normally closed terminal and a common terminal, and the second connector has a first pin and a second pin, the normally open terminal is connected to the first pin, and the common terminal is connected to the second pin;

[0019] When the test cabinet does not contact the contact-type limit switch, the common terminal is connected to the normally open terminal, and the contact-type limit switch is in the open state;

[0020] When the test cabinet comes into contact with the contact-type limit switch, the common terminal is connected to the normally closed terminal, and the contact-type limit switch is in the closed state.

[0021] A further technical solution is that the relay module includes a relay and a relay control circuit, and the relay control circuit includes a fourth MOSFET, a third connector, and a control signal connection terminal;

[0022] The relay is connected to the third connector and the test cabinet, the fourth MOSFET is connected to the third connector and the control signal connection terminal, and the control signal connection terminal is connected to the control module;

[0023] When the control signal connection terminal outputs a high-level signal, the fourth MOSFET is in a closed state, the relay is closed, and the test cabinet is powered on.

[0024] When the control signal connection terminal outputs a low-level signal, the fourth MOSFET is in the off state, the relay is disconnected, and the test cabinet is in the power-off state.

[0025] Secondly, this application provides a test control method for a test cabinet, applied to the test control device for the test cabinet as described above. The control module is used to execute the test control method for the test cabinet, the method comprising:

[0026] Obtain the level feedback signal output by the limit switch module;

[0027] The test cabinet is determined to be inserted correctly based on the level feedback signal.

[0028] When the test cabinet is determined to be inserted in place, the electronic lock module and the relay module are closed in sequence to control the test cabinet to perform a power-on test.

[0029] A further technical solution is that determining whether the test cabinet is inserted correctly based on the level feedback signal includes:

[0030] If the level feedback signal is a high level signal, it is determined that the test cabinet is not inserted in place;

[0031] If the level feedback signal is a low level signal, it is determined that the test cabinet is inserted in place.

[0032] A further technical solution is that, after controlling the test cabinet to perform a power-on test, the method further includes:

[0033] Receive the test completion command from the test cabinet;

[0034] Based on the test completion command, control the relay module to disconnect;

[0035] During a preset time period when the relay module is disconnected, the electronic lock module is controlled to open so that the test cabinet can be removed.

[0036] This application provides a test control device for a test cabinet, applied to a test cabinet. The test control device includes a control module, an electronic lock module, a limit switch module, and a relay module. The control module is electrically connected to the electronic lock module, the limit switch module, and the relay module. The test control device has a cabinet installation space for accommodating the test cabinet. The limit switch module is configured to output a corresponding level signal to the control module based on the insertion status of the test cabinet. The control module can control the power supply to or from the test cabinet via the relay module. Before the test cabinet is inserted and powered on, when the control module controls the electronic lock module to be in a closed state, the electronic lock module is locked to the test cabinet. After the test cabinet is powered off, the control module controls the electronic lock module to be in an open state, and the electronic lock module is separated from the test cabinet.

[0037] This application embodiment uses a limit switch module to detect in real time whether the test cabinet is inserted into place, and combines this with the linkage control of the electronic lock module and relay module by the control module to ensure that power is only allowed after the test cabinet is fully in place and the electronic lock module is locked, and that the electronic lock module is only separated from the test cabinet after the test cabinet is powered off. This prevents operators from removing the test cabinet and the device under test when the test cabinet is not fully powered off, thereby effectively preventing equipment damage, abnormal test data, and personal safety risks caused by incorrect installation or hot-plugging of the test cabinet, and improving the accuracy and safety of the test cabinet test. Attached Figure Description

[0038] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0039] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0040] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0041] Figure 1 A schematic diagram of the structure of a test control device for a test cabinet provided in this application;

[0042] Figure 2 A schematic diagram of the electronic lock control circuit provided in this application;

[0043] Figure 3 A schematic diagram of the electronic lock provided in this application;

[0044] Figure 4 A schematic diagram of the limit switch control circuit provided in this application;

[0045] Figure 5 This is a schematic diagram of the structure of the contact-type limit switch provided in this application;

[0046] Figure 6 A schematic diagram of the relay control circuit provided in this application;

[0047] Figure 7 A flowchart illustrating the first embodiment of a test control method for a test cabinet provided in this application;

[0048] Figure 8 This is a schematic diagram of the structure of a computer device provided in an embodiment of this application.

[0049] Explanation of icon numbers:

[0050] Test cabinet 10, cabinet power supply 11, main control board 20, electronic lock 30, lock cylinder 31, lock body 32, mounting hole 33, contact limit switch 40, switch contact 41, relay 50. Detailed Implementation

[0051] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0052] The following disclosure provides numerous different embodiments or examples for implementing various structures of this application. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the scope of this application. Furthermore, reference numerals and / or letters may be repeated in different examples. Such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed.

[0053] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0054] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0055] It should also be further understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0056] As used in this specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrases "if determined" or "if [described condition or event] is detected" may be interpreted, depending on the context, as "once determined," "in response to determination," "once [described condition or event] is detected," or "in response to detection of [described condition or event]."

[0057] To address the aforementioned issues, this application provides a test control device and method for a test cabinet, which can effectively prevent equipment damage, abnormal test data, and personal safety risks caused by improper installation or hot-plugging of the test cabinet, thereby improving the accuracy and safety of the test cabinet testing.

[0058] See Figure 1 , Figure 1 This application provides a schematic diagram of the structure of a test control device for a test cabinet, applied to test cabinet 10. The test control device includes: a control module (such as...) Figure 1 The test control device includes a main control board 20), an electronic lock module, a limit switch module, and a relay module. The control module is electrically connected to the electronic lock module, the contact switch module, and the relay module. The test control device has a cabinet installation space to accommodate the test cabinet. The limit switch module is configured to output a corresponding level signal to the control module based on the insertion status of the test cabinet. The control module can control the power supply or power-off of the test cabinet through the relay module.

[0059] Before the test cabinet is inserted into place and powered on, the electronic lock module locks itself to the test cabinet when the control module controls the electronic lock module to be in the closed state.

[0060] After the test cabinet is powered off, the control module controls the electronic lock module to be in the open state, and the electronic lock module is separated from the test cabinet.

[0061] This embodiment uses a limit switch module to detect in real time whether the test cabinet is inserted correctly. Combined with the linkage control of the electronic lock module and relay module by the control module, it ensures that power is only allowed after the test cabinet is fully in place and the electronic lock module is locked, and that the electronic lock module is only separated from the test cabinet after the test cabinet is powered off. This prevents operators from removing the test cabinet and the device under test when the test cabinet is not completely powered off, thereby effectively preventing equipment damage, abnormal test data, and personal safety risks caused by incorrect installation or hot-plugging of the test cabinet, and improving the accuracy and safety of the test cabinet test.

[0062] In some possible implementations, the electronic lock module includes an electronic lock and an electronic lock control circuit. The electronic lock control circuit includes a first MOSFET, a second MOSFET, a first connector, and an MCU control signal connection terminal. The first MOSFET is connected to the second MOSFET and the first connector. The second MOSFET is connected to the control module through the MCU control signal connection terminal. The first connector is connected to the electronic lock.

[0063] When the MCU control signal connection terminal outputs a high-level signal, the first MOSFET and the second MOSFET are in a closed state, and the electronic lock is in an open state.

[0064] When the MCU control signal connection terminal outputs a low-level signal, the first MOSFET and the second MOSFET are in a disconnected state, and the electronic lock is in a closed state.

[0065] In some possible implementations, the first MOSFET is a P-type MOSFET and the second MOSFET is an N-type MOSFET.

[0066] See Figure 2 and Figure 3 The first MOSFET is Q8, the second MOSFET is Q9, the first connector is J122, and the MCU control signal connection terminal is PA4.

[0067] Among them, pin 1 of J122 is connected to the positive terminal of the electronic lock, and pin 2 is connected to the negative terminal of the electronic lock.

[0068] Specifically, when PA4 is a high-level signal, Q9 and Q8 are turned on, and the voltage level of pin 1 of J122 is equal to 12V. At this time, the electronic lock is in the open state.

[0069] Conversely, when PA4 is a low-level signal, Q9 and Q8 are disconnected, and the electronic lock is in the closed state.

[0070] In some possible implementations, the limit switch module includes a contact limit switch and a limit switch control circuit. The limit switch control circuit includes a third MOSFET, a second connector, and a feedback signal connection terminal. The third MOSFET is connected between the second connector and the feedback signal connection terminal, and the feedback signal connection terminal is connected to the control module. The contact limit switch is connected to the second connector.

[0071] When the test cabinet does not contact the contact limit switch, the contact limit switch and the third MOSFET are in an open state, and the feedback signal connection terminal outputs a high-level signal to the control module;

[0072] When the test cabinet comes into contact with the contact limit switch, the contact limit switch and the third MOSFET are in a closed state, and the feedback signal connection terminal outputs a low-level signal to the control module.

[0073] Among them, such as Figure 1 and Figure 3As shown, the electronic lock 30 includes a lock cylinder 31 and a lock body 32. When the test cabinet 10 is inserted into place, the lock cylinder 31 can be fixedly installed on the test cabinet 10 through the mounting hole 33, and the lock body 32 locks the lock cylinder 31, so the staff cannot take out the test cabinet 10. When the test cabinet 10 is powered off, the lock body 32 opens, and the lock cylinder 31 can be removed from the test cabinet 10 to take out the test cabinet 10.

[0074] See Figure 1 , Figure 4 and Figure 5 The third MOSFET is Q1, the second connector is J20, and the feedback signal connection terminal is PD3.

[0075] When a high-level signal is detected for PD3, it indicates that the test cabinet is not inserted.

[0076] When a low-level signal is detected on PD3, it indicates that the test cabinet has been inserted into place.

[0077] In some possible implementations, the contact limit switch 40 has a switch contact 41; when the test cabinet 10 contacts the switch contact 41, the contact limit switch 40 is in a closed state; when the test cabinet 10 does not contact the switch contact, the contact limit switch 40 is in an open state.

[0078] In some possible implementations, the contact limit switch 40 has a normally open terminal (NO), a normally closed terminal (NC), and a common terminal (COM), and the second connector has a first pin (J20 pin 1) and a second pin (J20 pin 2), with the normally open terminal connected to the first pin and the common terminal connected to the second pin;

[0079] When the test cabinet does not contact the contact-type limit switch, the common terminal is connected to the normally open terminal, and the contact-type limit switch is in the open state;

[0080] When the test cabinet comes into contact with the contact-type limit switch, the common terminal is connected to the normally closed terminal, and the contact-type limit switch is in the closed state.

[0081] In some possible implementations, the relay module includes a relay and a relay control circuit, the relay control circuit including a fourth MOSFET, a third connector, and a control signal connection terminal;

[0082] The relay is connected to the third connector and the test cabinet, the fourth MOSFET is connected to the third connector and the control signal connection terminal, and the control signal connection terminal is connected to the control module;

[0083] When the control signal connection terminal outputs a high-level signal, the fourth MOSFET is in a closed state, the relay is closed, and the test cabinet is powered on.

[0084] When the control signal connection terminal outputs a low-level signal, the fourth MOSFET is in the off state, the relay is disconnected, and the test cabinet is in the power-off state.

[0085] See Figure 1 and Figure 6 The fourth MOSFET is Q20, the third connector is J51, and the control signal connection terminal is MB_POWER_Relay_1.

[0086] Among them, pin 3 of J51 is 12V, which is connected to the positive and negative terminals of relay 50 through pin 4 (GND) to power relay 50. Pin 1 is connected to the control signal of relay 50. When pin 1 is pulled up to 12V in the initial state, relay 50 is triggered by a low level. At this time, relay 50 is not working, and the cabinet power supply 11 of the test cabinet is not turned on. When MB_POWER_Relay_1 is pulled up to a high level, Q20 is turned on, pin 1 of J51 is grounded, relay 50 is triggered, and the cabinet power supply 10 of test cabinet 10 is turned on.

[0087] Based on the test control device for the test cabinet provided above, this application also provides a test control method for the test cabinet. The control module is used to execute the test control method for the test cabinet. (See attached document.) Figure 7 , Figure 7 This application provides a flowchart illustrating a first embodiment of a test control method for a test cabinet, the method comprising:

[0088] Step 110: Obtain the level feedback signal output by the limit switch module.

[0089] Step 120: Determine whether the test cabinet is inserted correctly based on the level feedback signal.

[0090] Step 130: When it is determined that the test cabinet is inserted in place, the electronic lock module and the relay module are closed in sequence to control the test cabinet to perform power-on testing.

[0091] In some possible implementations, step 120, namely determining whether the test cabinet is inserted correctly based on the level feedback signal, includes:

[0092] Step 121: If the level feedback signal is a high level signal, it is determined that the test cabinet is not inserted in place.

[0093] Step 122: If the level feedback signal is a low level signal, then it is determined that the test cabinet is inserted in place.

[0094] In some possible implementations, after the test cabinet is powered on for testing, the method further includes:

[0095] Step 140: Receive the test completion instruction from the test cabinet.

[0096] Step 150: Based on the test completion command, control the relay module to disconnect.

[0097] Step 160: During the preset time period when the relay module is disconnected, control the electronic lock module to open so as to remove the test cabinet.

[0098] Based on the above embodiments, the test control method for the test cabinet provided in this application mainly includes the following:

[0099] 1) The operator pushes the test cabinet into the cabinet installation space. When the test cabinet touches the switch contact of the contact limit switch, the contact limit switch closes. The control line of the contact limit switch is connected to the main control board. The contact limit switch outputs a low-level signal to the main control board, indicating that the test cabinet has been inserted into place.

[0100] 2) The main control board controls the electronic lock in the electronic lock module to close via the I / O interface, thus locking the lock cylinder;

[0101] 3) The main control board controls the relays through the I / O interface, causing the relays to close, the live wire to be connected, and the test cabinet to start powering on;

[0102] 4) After the test cabinet is powered on, the main control board sends a test start command to the test cabinet via the serial port, and the test cabinet begins testing;

[0103] 5) After the test is completed, the test cabinet directly sends a test completion command to the main control board via the serial port. After receiving the command, the main control board controls the relay module through the I / O interface to shut off the voltage of the test cabinet.

[0104] 6) After a preset time period, the main control board controls the electronic lock module to be in the open state through the I / O interface. The electronic lock module is separated from the test cabinet so that the operator can take out the cabinet and take out the tested products.

[0105] This prevents operators from removing the test cabinet or the device under test while the test cabinet is not completely powered off, thus avoiding damage to the test cabinet and the device under test caused by live work.

[0106] Corresponding to the test control method for the test cabinet described above, this application also provides a test control device for a test cabinet. This test control device includes a unit for executing the aforementioned test control method for the test cabinet, and can be configured in a desktop computer, tablet computer, laptop computer, or other terminal.

[0107] like Figure 8 As shown in the figure, this application provides a computer device including a processor 111, a communication interface 112, a memory 113, and a communication bus 114, wherein the processor 111, the communication interface 112, and the memory 113 communicate with each other through the communication bus 114.

[0108] Memory 113 is used to store computer programs;

[0109] In one embodiment of this application, the processor 111, when executing a program stored in the memory 113, implements the test control method for the test cabinet provided in any of the foregoing method embodiments, including:

[0110] Obtain the level feedback signal output by the limit switch module;

[0111] The test cabinet is determined to be inserted correctly based on the level feedback signal.

[0112] When the test cabinet is determined to be inserted in place, the electronic lock module and the relay module are closed in sequence to control the test cabinet to perform a power-on test.

[0113] It will be understood by those skilled in the art that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program may be stored in a storage medium, which is a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the process steps of the embodiments of the above methods.

[0114] Therefore, this application embodiment also provides a computer-readable storage medium storing a computer program thereon, wherein when the computer program is executed by a processor, it implements the steps of the test control method for the test cabinet as provided in any of the foregoing method embodiments, including:

[0115] Obtain the level feedback signal output by the limit switch module;

[0116] The test cabinet is determined to be inserted correctly based on the level feedback signal.

[0117] When the test cabinet is determined to be inserted in place, the electronic lock module and the relay module are closed in sequence to control the test cabinet to perform a power-on test.

[0118] The storage medium is a physical, non-transitory storage medium, such as a USB flash drive, external hard drive, read-only memory (ROM), magnetic disk, or optical disk, or any other physical storage medium capable of storing program code. The computer-readable storage medium can be non-volatile or volatile.

[0119] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this application.

[0120] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For example, the division of each unit is merely a logical functional division, and there may be other division methods in actual implementation. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed.

[0121] The steps in the methods of this application embodiment can be adjusted, merged, or deleted according to actual needs. The units in the apparatus of this application embodiment can be merged, divided, or deleted according to actual needs. Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0122] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, a terminal, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application.

[0123] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0124] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Since these modifications and variations fall within the scope of the claims and their equivalents, this application also intends to include these modifications and variations.

[0125] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A test control device for a test cabinet, characterized in that, The test control device, applied to a test cabinet, includes a control module, an electronic lock module, a limit switch module, and a relay module. The control module is electrically connected to the electronic lock module, the limit switch module, and the relay module. The test control device has a cabinet installation space to accommodate the test cabinet. The limit switch module is configured to output a corresponding level signal to the control module based on the insertion status of the test cabinet. The control module can control the power supply to or from the test cabinet via the relay module. Before the test cabinet is inserted into place and powered on, the electronic lock module locks itself to the test cabinet when the control module controls the electronic lock module to be in the closed state. After the test cabinet is powered off, the control module controls the electronic lock module to be in the open state, and the electronic lock module is separated from the test cabinet.

2. The test control device according to claim 1, characterized in that, The electronic lock module includes an electronic lock and an electronic lock control circuit. The electronic lock control circuit includes a first MOSFET, a second MOSFET, a first connector, and an MCU control signal connection terminal. The first MOSFET is connected to the second MOSFET and the first connector. The second MOSFET is connected to the control module through the MCU control signal connection terminal. The first connector is connected to the electronic lock. When the MCU control signal connection terminal outputs a high-level signal, the first MOSFET and the second MOSFET are in a closed state, and the electronic lock is in an open state. When the MCU control signal connection terminal outputs a low-level signal, the first MOSFET and the second MOSFET are in a disconnected state, and the electronic lock is in a closed state.

3. The test control device according to claim 2, characterized in that, The first MOSFET is a P-type MOSFET, and the second MOSFET is an N-type MOSFET.

4. The test control device according to claim 1, characterized in that, The limit switch module includes a contact limit switch and a limit switch control circuit. The limit switch control circuit includes a third MOSFET, a second connector, and a feedback signal connection terminal. The third MOSFET is connected between the second connector and the feedback signal connection terminal. The feedback signal connection terminal is connected to the control module. The contact limit switch is connected to the second connector. When the test cabinet does not contact the contact limit switch, the contact limit switch and the third MOSFET are in an open state, and the feedback signal connection terminal outputs a high-level signal to the control module; When the test cabinet comes into contact with the contact limit switch, the contact limit switch and the third MOSFET are in a closed state, and the feedback signal connection terminal outputs a low-level signal to the control module.

5. The test control device according to claim 4, characterized in that, The contact-type limit switch has switch contacts; When the test cabinet comes into contact with the switch contact, the contact-type limit switch is in the closed state; When the test cabinet is not in contact with the switch contacts, the contact-type limit switch is in the open state.

6. The test control device according to claim 4, characterized in that, The contact-type limit switch has a normally open terminal, a normally closed terminal, and a common terminal. The second connector has a first pin and a second pin. The normally open terminal is connected to the first pin, and the common terminal is connected to the second pin. When the test cabinet does not contact the contact-type limit switch, the common terminal is connected to the normally open terminal, and the contact-type limit switch is in the open state; When the test cabinet comes into contact with the contact-type limit switch, the common terminal is connected to the normally closed terminal, and the contact-type limit switch is in the closed state.

7. The test control device according to claim 1, characterized in that, The relay module includes a relay and a relay control circuit, and the relay control circuit includes a fourth MOSFET, a third connector, and a control signal connection terminal. The relay is connected to the third connector and the test cabinet, the fourth MOSFET is connected to the third connector and the control signal connection terminal, and the control signal connection terminal is connected to the control module; When the control signal connection terminal outputs a high-level signal, the fourth MOSFET is in a closed state, the relay is closed, and the test cabinet is powered on. When the control signal connection terminal outputs a low-level signal, the fourth MOSFET is in the off state, the relay is disconnected, and the test cabinet is in the power-off state.

8. A test control method for a test cabinet, characterized in that, A test control device applied to a test cabinet as described in any one of claims 1-7, wherein the control module is used to execute a test control method for the test cabinet, the method comprising: Obtain the level feedback signal output by the limit switch module; The test cabinet is determined to be inserted correctly based on the level feedback signal. When the test cabinet is determined to be inserted in place, the electronic lock module and the relay module are closed in sequence to control the test cabinet to perform a power-on test.

9. The test control method according to claim 8, characterized in that, The step of determining whether the test cabinet is inserted correctly based on the level feedback signal includes: If the level feedback signal is a high level signal, it is determined that the test cabinet is not inserted in place; If the level feedback signal is a low level signal, it is determined that the test cabinet is inserted in place.

10. The method according to claim 8, characterized in that, After controlling the test cabinet to perform a power-on test, the method further includes: Receive the test completion command from the test cabinet; Based on the test completion command, control the relay module to disconnect; During a preset time period when the relay module is disconnected, the electronic lock module is controlled to open so that the test cabinet can be removed.

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