Test system

Abstract

The embodiment of the invention discloses a test system. The device comprises a cabinet, a testing machine and a carrying device. According to the embodiment of the invention, when the test begins, the multi-axis mechanical arm drives the clamping jaw to transfer the memory banks stored in a centralized manner into the accommodating groove of the bearing disc; and then the carrying device is moved to the position near the cabinet, the multi-axis mechanical arm drives the clamping jaw to enable the hook to hook the connecting ring on the testing machine, and the testing machine is pulled out of the cabinet. And then the hook is separated from the connecting ring, and the operating button is pressed by the end part of the hook to start the testing machine. The clamping jaw clamps the memory bank to be tested from the bearing disc and accurately places the memory bank in the placing groove of the tray of the testing machine. After placement is completed, the operation button is pressed through the hook again to close the testing machine, and the clamping jaw pushes the connecting ring to send the testing machine back to the cabinet. After the test is finished, the process of taking out the memory bank is similar, and only the transfer direction of the memory bank is opposite.

Description

Technical Field

[0001] This application relates to the field of semiconductor manufacturing technology, and in particular to a testing system. Background Technology

[0002] After assembly, the memory modules need to be tested on a dedicated testing machine to check their performance stability.

[0003] Currently, a testing machine includes an upper housing and a lower housing connected by a rotating shaft. The lower housing has a tray facing the upper housing, with at least two linearly arranged slots for placing memory modules. The upper housing has clearance space on the side facing the lower housing to accommodate the memory modules. The upper and lower housings are connected by a transmission structure. The testing machine contains a drive unit with a button electrically connected to it. During operation, the upper and lower housings are closed and fitted together. After testing, the operator presses the button, activating the drive unit and moving the transmission structure, automatically opening the testing machine to remove all tested memory modules.

[0004] However, in practical applications, it was found that although the testing machine can be started automatically, the process of picking up and placing memory modules still requires manual intervention. First, the memory modules that have already been tested need to be manually removed, and then the new batch of memory modules to be tested can be placed in. Furthermore, when production volumes are high and multiple testing machines need to be running simultaneously, this manual operation mode not only occupies a large area but also significantly increases the total time for picking up and placing materials, ultimately leading to a longer overall production cycle for the same batch of memory modules. Summary of the Invention

[0005] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a testing system to solve the problems of large space occupation and low material handling efficiency in existing testing machines.

[0006] This application provides a testing system, including a cabinet and a handling device; the cabinet has an opening on at least one side; at least one testing machine is slidably installed inside the cabinet, and the testing machine has a connecting ring and an operation button on the side facing the opening; the handling device includes a movable base, a support platform, a multi-axis robotic arm, and a gripper disposed at the end of the multi-axis robotic arm; the multi-axis robotic arm is disposed on the support platform, the support platform is disposed on the movable base, and at least one support plate is disposed on the support platform, the support plate having at least two linearly arranged receiving slots, and adjacent two receiving slots are... The center distance between the two is equal to the center distance of the placement slots for placing memory modules inside the testing machine; the gripper is provided with a hook adapted to the connecting ring; wherein, the end of the hook is driven by the multi-axis robotic arm to press the operation button to open or close the corresponding testing machine; the hook is used to hook the connecting ring, and under the drive of the multi-axis robotic arm, pull the corresponding testing machine out of the cabinet through the opening; the gripper is used to grab the memory module, and under the drive of the multi-axis robotic arm, transfer the memory module between the placement slot of the testing machine and the receiving slot of the carrier plate.

[0007] Based on the aforementioned testing system, at the start of the test, a multi-axis robotic arm drives the gripper to transfer the centrally stored memory modules to the receiving slot of the carrier tray. Subsequently, the transport device moves to the vicinity of the cabinet, and the multi-axis robotic arm drives the gripper to hook the hook onto the connecting ring on the test machine, pulling the test machine out of the cabinet. Afterward, the hook disengages from the connecting ring, and the operation button is pressed at the end of the hook to open the test machine. The gripper then picks up the memory module to be tested from the carrier tray and accurately places it into the placement slot of the test machine tray. After placement, the operation button is pressed again via the hook to close the test machine, and the gripper pushes the connecting ring to return the test machine to the cabinet. The process of removing the memory module after the test is completed is similar, only the direction of memory module transfer is reversed. Compared to existing technologies, this application uses a sliding installation method between the test machine and the cabinet, significantly reducing the system footprint and improving space utilization. Furthermore, by integrating a hook structure into the gripper, automatic pulling, opening, and closing of the test machine and automatic retrieval and placement of memory modules are achieved, comprehensively improving the automation level of the testing process. In addition, the center distance between the slots on the carrier plate is consistent with the center distance between the slots inside the testing machine, ensuring that the grippers can accurately pick up and place multiple memory modules at once, effectively improving the batch transfer efficiency of memory modules, and thus improving the overall production efficiency.

[0008] In one or more embodiments of the above-described testing system, the hook includes a hook body and an end, the end being located on the side of the hook body away from the gripper.

[0009] In one or more embodiments of the above-described testing system, the outer surface of the end is covered with an antistatic cap.

[0010] In one or more embodiments of the above-described testing system, the support platform includes at least two support plates spaced apart in a vertical direction, and each support plate is provided with at least one of the support disks.

[0011] In one or more embodiments of the above-described testing system, the support plates are provided on opposite sides of the robotic arm in the direction of movement of the mobile base.

[0012] In one or more embodiments of the above-described testing system, the gripper includes: a mounting frame connected to the end of the multi-axis robotic arm; a guide plate disposed on the mounting frame, and the guide plate having two parallel guide structures; two opposing clamping members, each of the clamping members being slidably connected to one of the guide structures; and a drive assembly disposed on the mounting frame and used to drive the moving end of the guide structure to move, thereby causing the two clamping members to move towards or away from each other.

[0013] In one or more embodiments of the above-described testing system, each clamping member is provided with at least two clamping slots for accommodating memory modules, and the center distance between two adjacent clamping slots is equal to the center distance of the placement slots for placing memory modules in the testing machine.

[0014] In one or more embodiments of the above-described testing system, the clamping plate includes a first plate and a second plate that are perpendicularly connected. The first plate has a first groove on the side adjacent to the first plate, and the second plate has a second groove that communicates with the first groove on the side adjacent to the second plate. The second groove and the first groove together form the clamping groove.

[0015] In one or more embodiments of the above-described testing system, one of the clamping members is slidably connected to the guide structure via a first connecting frame; the first connecting frame is provided with a sliding structure, and a stop block is provided at one end of the sliding structure near another clamping member, and the corresponding clamping member is slidably connected to the first connecting frame via the sliding structure; when the gripper initially clamps the memory module, the first connecting frame moves closer to the adjacent clamping member under the drive of the drive component and the guide structure until it is limited by the stop block.

[0016] In one or more embodiments of the above-described testing system, at least two of the testing machines are arranged vertically inside the cabinet.

[0017] The above-described one or more embodiments of this application have at least one or more of the following beneficial effects: Compared to existing technologies, the test machine and cabinet in this application adopt a sliding installation method, significantly reducing the system footprint and improving space utilization. Furthermore, by integrating a hook structure into the grippers, automatic pulling, opening, and closing of the test machine, as well as automatic loading and unloading of memory modules, are achieved, comprehensively improving the automation level of the testing process. In addition, the center distance between the slots on the carrier tray and the center distance between the slots inside the test machine are consistent, ensuring that the grippers can accurately grasp and place multiple memory modules at once, effectively improving the batch transfer efficiency of memory modules, thereby improving overall production efficiency. Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application. Attached Figure Description

[0018] The disclosure of this application will become more readily understood with reference to the accompanying drawings. It will be readily understood by those skilled in the art that these drawings are for illustrative purposes only and are not intended to limit the scope of protection of this application. Furthermore, similar numbers in the drawings are used to denote similar components, wherein: Figure 1 This is a schematic diagram illustrating the structure of a testing system provided in an embodiment of this application; Figure 2 yes Figure 1 Enlarged view of point A in the middle; Figure 3 This is a schematic diagram of a gripper structure provided in an embodiment of this application; Figure 4 yes Figure 3 Enlarged view of point B in the middle; Figure 5 This is a schematic diagram illustrating the internal structure of a gripper provided in an embodiment of this application; Figure 6 This is a structural block diagram provided in an embodiment of the present application to illustrate the connection relationship between the first connecting frame and the clamping member; Figure 7 This is a schematic diagram of a structure used to demonstrate the closed state of a testing machine, provided in an embodiment of this application. Figure 8 This is a schematic diagram of a structure used to demonstrate the open state of a testing machine, provided in an embodiment of this application. Figure 9 yes Figure 8 A magnified view of point C in the middle.

[0019] Explanation of reference numerals in the attached figures: 1. Cabinet; 11. Opening; 12. Sliding module; 121. Guide rail; 122. Connecting rail; 2. Handling device; 3. Moving base; 4. Support platform; 41. Support plate; 411. Receiving slot; 42. Support plate; 5. Multi-axis robotic arm; 6. Gripper; 61. Hook; 611. End; 612. Hook body; 613. Antistatic cap; 63. Mounting bracket; 631. Baffle; 64. Guide plate; 641. Guide Structure; 642, guide channel; 65, clamping component; 651, clamping groove; 652, first plate; 6521, first groove; 653, second plate; 6531, second groove; 66, first connecting frame; 661, sliding structure; 662, anti-slip block; 67, second connecting frame; 7, testing machine; 71, connecting ring; 72, operation button; 73, upper box; 74, lower box; 75, tray; 751, placement groove; 8, memory module. Detailed Implementation

[0020] Some embodiments of this application are described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are merely illustrative of the technical principles of this application and are not intended to limit the scope of protection of this application.

[0021] Currently, when testing chip semiconductor products such as memory modules, although the testing machine can automatically turn on and off, the process of picking up and placing memory modules still requires manual intervention. First, the memory modules that have completed testing need to be manually removed, and then a new batch of memory modules to be tested needs to be placed in. Furthermore, when production volumes are high and multiple testing machines need to be running simultaneously, this manual operation mode not only occupies a large area but also significantly increases the total time for picking up and placing materials, ultimately leading to a longer overall production cycle for the same batch of memory modules.

[0022] Therefore, this application presents an innovative testing system comprising a cabinet, a testing machine, and a handling device. At the start of the test, a multi-axis robotic arm drives grippers to transfer the centrally stored memory modules to a receiving slot on a carrier tray. Subsequently, the handling device moves to the vicinity of the cabinet, and the multi-axis robotic arm drives the grippers to hook a hook onto a connecting ring on the testing machine, pulling the testing machine out of the cabinet. Afterward, the hook disengages from the connecting ring, and an operation button is pressed at the end of the hook to open the testing machine. The grippers then pick up the memory module to be tested from the carrier tray and accurately place it in the placement slot of the testing machine tray. After placement, the operation button is pressed again via the hook to close the testing machine, and the grippers push the connecting ring to return the testing machine to the cabinet. The process for removing the memory module after the test is completed is similar, only the direction of transfer is reversed. Compared to existing technologies, this application uses a sliding installation method for the testing machine and cabinet, significantly reducing the system's footprint and improving space utilization. By integrating a hook structure into the grippers, the test machine achieves automatic pulling, opening, and closing, as well as automatic picking and placing of memory modules, comprehensively improving the automation level of the testing process. Furthermore, the center distance between the slots on the carrier tray and the center distance between the slots inside the test machine are consistent, ensuring that the grippers can accurately pick up and place multiple memory modules at once, effectively improving the batch transfer efficiency of memory modules and thus enhancing overall production efficiency.

[0023] The present application will be described in detail below through specific embodiments.

[0024] Reference Figures 1 to 9 As shown, this application embodiment creatively proposes a testing system comprising a cabinet 1, a handling device 2, and at least one testing machine 7; the cabinet 1 has an opening 11 on at least one side; the testing machine 7 is slidably installed inside the cabinet 1, and a connecting ring 71 and an operation button 72 are provided on the side of the testing machine 7 facing the opening 11; the handling device 2 includes a movable base 3, a support platform 4, a multi-axis robotic arm 5, and a gripper 6 disposed at the end of the multi-axis robotic arm 5; the multi-axis robotic arm 5 is disposed on the support platform 4, the support platform 4 is disposed on the movable base 3, and the support platform 4 is provided with at least one support plate 41, the support plate 41 having at least two linearly arranged receiving slots 411, and... The center distance between two adjacent receiving slots 411 is equal to the center distance of the placement slot 751 in the test machine 7 for placing memory modules 8; the gripper 6 is provided with a hook 61 that is adapted to the connecting ring 71; wherein, the end 611 of the hook 61 is driven by the multi-axis robotic arm 5 to press the operation button 72 to open or close the corresponding test machine 7; the hook 61 is used to hook the connecting ring 71, and under the drive of the multi-axis robotic arm 5, pull the corresponding test machine 7 out of the cabinet 1 through the opening 11; the gripper 6 is used to grab the memory module 8, and under the drive of the multi-axis robotic arm 5, transfer the memory module 8 between the placement slot 751 of the test machine 7 and the receiving slot 411 of the carrier plate 41.

[0025] The cabinet 1 can be any regular or irregular shape, as long as it can accommodate the testing machine 7. In this embodiment, to improve space utilization, the cabinet 1 is generally rectangular. Correspondingly, the opening 11 is also rectangular in shape.

[0026] In this embodiment, the testing machine 7 includes an upper housing 73 and a lower housing 74 rotatably connected by a pivot. A tray 75 is provided on the side of the lower housing 74 facing the upper housing 73, and at least two linearly arranged slots 751 for placing memory modules 8 are provided on the tray 75. The side of the upper housing 73 facing the lower housing 74 has clearance space (not shown) for accommodating the memory modules 8. The upper housing 73 and the lower housing 74 are connected by a transmission structure. The testing machine 7 contains a driving component, and its surface has an operation button 72 electrically connected to the driving component. When the testing machine 7 is working, the upper housing 73 and the lower housing 74 are closed and fitted together. After the test is completed, pressing the operation button 72 activates the driving component and drives the transmission structure, thereby automatically opening the testing machine 7 to remove all the tested memory modules 8.

[0027] In some examples, refer to Figure 1 As shown, at least two test machines 7 are arranged vertically inside the cabinet 1. By installing multiple test machines 7, the number of memory modules 8 tested in the same batch can be effectively increased, thereby saving testing time; and by vertically arranging multiple test machines 7, the horizontal area occupied by the test machines 7 can be effectively saved.

[0028] In some examples, refer to Figure 1 As shown, the test machine 7 is slidably connected to the cabinet 1 via a sliding module 12. The sliding module 12 includes guide rails 121 respectively provided on opposite sides of the cabinet 1 perpendicular to the opening 11. Connecting rails 122 that cooperate with the guide rails 121 are respectively provided on the corresponding opposite sides of the test machine 7, thereby improving the stability of the movement of the test machine 7.

[0029] Specifically, at the start of the test, the multi-axis robotic arm 5 drives the gripper 6 to transfer the centrally stored memory modules 8 into the receiving slot 411 of the carrier tray 41. Then, the transport device 2 moves to the vicinity of the cabinet 1, and the multi-axis robotic arm 5 drives the gripper 6 to hook the hook 61 onto the connecting ring 71 on the test machine 7, pulling the test machine 7 out of the cabinet 1. Afterwards, the hook 61 disengages from the connecting ring 71, and the operation button 72 is pressed at the end 611 of the hook 61 to open the test machine 7. The gripper 6 then picks up the memory module 8 to be tested from the carrier tray 41 and accurately places it into the placement slot 751 of the test machine 7's tray 75. After placement, the operation button 72 is pressed again via the hook 61 to close the test machine 7, and the gripper 6 pushes the connecting ring 71 to send the test machine 7 back to the cabinet 1. After the test, the process of removing the memory module 8 is similar, only the direction of transfer of the memory module 8 is reversed. Compared to existing technologies, in this application, the test machine 7 and the cabinet 1 adopt a sliding installation method, significantly reducing the system footprint and improving space utilization. By integrating a hook 61 structure into the gripper 6, the automatic pulling, opening, and closing of the testing machine 7 and the automatic picking and placing of memory modules 8 are realized, comprehensively improving the automation level of the testing process. In addition, the center distance of the receiving slots 411 on the carrier tray 41 is consistent with the center distance of the placement slots 751 inside the testing machine 7, ensuring that the gripper 6 can accurately grasp and place multiple memory modules 8 at one time, effectively improving the batch transfer efficiency of memory modules 8, and thus improving the overall production efficiency.

[0030] In this embodiment, the mobile base 3 is an AGV (Automated Guided Vehicle), but it can also be other transport robots or vehicles capable of autonomous driving.

[0031] Furthermore, in some examples, refer to Figure 3 and Figure 4 As shown, the hook 61 includes a hook body 612 and an end 611, with the end 611 located on the side of the hook body 612 away from the gripper 6. By providing a separate end 611 on the hook body 612, it is convenient to press the operation button 72.

[0032] In this embodiment, in order to adapt the shape of the end 611 to the commonly used operation button 72 and to avoid accidentally touching other buttons, the end 611 is cylindrical.

[0033] Furthermore, in some examples, the outer surface of the end 611 is covered with an anti-static cap 613. The anti-static cap 613 prevents the end 611 from affecting the memory module 8 and causing damage from electrostatic discharge.

[0034] In some examples, refer to Figure 1 As shown, the support platform 4 includes at least two support plates 42 arranged at intervals along the vertical direction, and each support plate 42 is provided with at least one support plate 41.

[0035] By setting multiple support plates 42 in the vertical direction, the single transfer volume of memory stick 8 of the handling device 2 can be effectively increased, while the horizontal area occupied by the handling device 2 is reduced, making the structure of the handling device 2 more compact.

[0036] In some examples, refer to Figure 1 As shown, in the moving direction of the mobile base 3, there are support plates 41 on both opposite sides of the robotic arm. This arrangement effectively increases the single-transfer capacity of the memory module 8 of the handling device 2 without increasing its width. This allows the handling device 2 to move flexibly even in confined spaces.

[0037] Furthermore, in some examples, refer to Figure 3 and Figure 5 As shown, the gripper 6 includes a mounting frame 63, a guide plate 64, a drive assembly, and two opposing gripping members 65. The mounting frame 63 is connected to the end of the multi-axis robotic arm 5. The guide plate 64 is mounted on the mounting frame 63 and has two parallel guide structures 641. Each gripping member 65 is slidably connected to one guide structure 641. The drive assembly is mounted on the mounting frame 63 and is used to drive the moving end of the guide structure 641 to move, thereby causing the two gripping members 65 to move towards or away from each other.

[0038] It is understood that the shape of the clamping member 65 can be arbitrary, as long as the surface used to clamp the memory module 8 is flat. In addition, the hook 61 is mounted on the mounting bracket 63 to keep it away from the clamping member 65, thus maintaining separate working space for the hook 61 and the clamping member 65.

[0039] In this embodiment, the guide structure 641 includes two parallel guide channels 642 disposed on the guide plate 64, and a guide rail slider module installed in the guide channels 642. The drive assembly is a bidirectional cylinder, whose two drive shafts are respectively connected to the two sliders.

[0040] In this embodiment, each clamping member 65 is provided with at least two clamping slots 651 for accommodating memory modules 8, and the center distance between two adjacent clamping slots 651 is equal to the center distance of the placement slots 751 in the testing machine 7 for placing memory modules 8. The clamping slots 651 effectively separate the memory modules 8, preventing slippage between the memory modules 8 and the clamping member 65 during clamping, which would otherwise prevent the memory modules 8 from being directly transferred between the testing machine 7 and the carrier plate 41.

[0041] Furthermore, in some examples, refer to Figure 5As shown, the clamping plate includes a first plate 652 and a second plate 653 connected perpendicularly. A first groove 6521 is provided on the side of the first plate 652 adjacent to the adjacent first plate 652. A second groove 6531 communicating with the first groove 6521 is provided on the side of the second plate 653 adjacent to the adjacent second plate 653. The second groove 6531 and the first groove 6521 together form a clamping groove 651. The arrangement of the first groove 6521 and the second groove 6531 allows the memory module 8 to be separated from its two perpendicular sides, thus more effectively separating the memory modules 8 and preventing collisions between adjacent memory modules 8.

[0042] In this embodiment, refer to Figure 3 As shown, in order to improve the sealing performance of the gripper 6 and prevent the external environment from affecting the internal structure of the gripper 6, multiple baffles 631 are provided on the mounting bracket 63 to seal the guide plate 64 and the drive assembly.

[0043] Furthermore, in some examples, refer to Figure 5 and Figure 6 As shown, one clamping member 65 is slidably connected to the guide structure 641 via a first connecting frame 66, and the other clamping member 65 is slidably connected to the guide structure 641 via a second connecting frame 67. The first clamping frame and the second clamping frame are at different distances from the guide plate 64, thereby offsetting the first connecting frame 66 and the second connecting frame 67, making the structure of the gripper 6 more compact.

[0044] The first connecting frame 66 is provided with a sliding structure 661. The end of the sliding structure 661 near another clamping member 65 is provided with a stop block 662. The corresponding clamping member 65 is slidably connected to the first connecting frame 66 through the sliding structure 661. When the gripper 6 initially clamps the memory stick 8, the corresponding connecting frame moves closer to the adjacent clamping member 65 under the drive of the drive component and the guide structure 641 until it is limited by the stop block 662.

[0045] After the two clamping members 65 initially clamp the memory module 8, the drive assembly continues to move the slider on the guide structure 641. Since the clamping members 65 are restricted by the resistance of the memory module 8 and cannot move, only the first connecting bracket 66 slides relative to the clamping members 65. This slightly increases the clamping force of the two clamping members 65 on the memory module 8, thus stabilizing its grip. Simultaneously, the stop slider 662 prevents the first connecting bracket 66 from moving beyond its limit. Crucially, the sliding of the first connecting bracket 66 also serves as a notification to the system and personnel that the grippers 6 have stably clamped the memory module 8.

[0046] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0047] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0048] Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of this application.

Claims

1. A testing system, characterized in that, The testing system includes a cabinet (1) and a handling device (2); The cabinet (1) has an opening (11) on at least one side; At least one test machine (7) is slidably installed in the cabinet (1), and the test machine (7) is provided with a connecting ring (71) and an operation button (72) on the side facing the opening (11); The conveying device (2) includes a movable base (3), a support platform (4), a multi-axis robotic arm (5), and a gripper (6) disposed at the end of the multi-axis robotic arm (5); The multi-axis robotic arm (5) is mounted on the support platform (4), which is mounted on the movable base (3). The support platform (4) is provided with at least one support plate (41), and the support plate (41) is provided with at least two linearly arranged receiving slots (411). The center distance between two adjacent receiving slots (411) is equal to the center distance of the placement slot (751) in the test machine (7) for placing memory modules (8). The gripper (6) is provided with a hook (61) that is adapted to the connecting ring (71); The end (611) of the hook (61) presses the operation button (72) under the drive of the multi-axis robotic arm (5) to open or close the corresponding test machine (7); The hook (61) is used to hook the connecting ring (71) and, driven by the multi-axis robotic arm (5), pulls the corresponding testing machine (7) out of the cabinet (1) through the opening (11); The gripper (6) is used to grasp the memory module (8) and, driven by the multi-axis robotic arm (5), transfers the memory module (8) between the placement slot (751) of the test machine (7) and the receiving slot (411) of the carrier plate (41).

2. The testing system according to claim 1, characterized in that, The hook (61) includes a hook body (612) and an end (611), the end (611) being located on the side of the hook body (612) away from the gripper (6).

3. The testing system according to claim 2, characterized in that, The outer surface of the end (611) is covered with an antistatic cap (613).

4. The testing system according to claim 1, characterized in that, The support platform (4) includes at least two support plates (42) spaced apart in the vertical direction, and each support plate (42) is provided with at least one of the support disks (41).

5. The testing system according to claim 1, characterized in that, In the direction of movement of the movable base (3), the bearing plate (41) is provided on both sides of the robotic arm.

6. The testing system according to claim 1, characterized in that, The gripper (6) includes: Mounting bracket (63) is connected to the end of the multi-axis robotic arm (5); A guide plate (64) is disposed on the mounting bracket (63), and the guide plate (64) is provided with two parallel guide structures (641); Two opposing clamping members (65), each of the clamping members (65) being slidably connected to one of the guide structures (641); A drive assembly is disposed on the mounting bracket (63) and is used to drive the moving end of the guide structure (641) to move, thereby causing the two clamping members (65) to move towards or away from each other.

7. The testing system according to claim 6, characterized in that, Each of the clamping members (65) is provided with at least two clamping slots (651) for accommodating memory modules (8), and the center distance between two adjacent clamping slots (651) is equal to the center distance of the placement slots (751) in the test machine (7) for placing memory modules (8).

8. The testing system according to claim 7, characterized in that, The clamping plate includes a first plate (652) and a second plate (653) that are perpendicularly connected. The first plate (652) has a first groove (6521) on the side near the adjacent first plate (652). The second plate (653) has a second groove (6531) that communicates with the first groove (6521) on the side near the adjacent second plate (653). The second groove (6531) and the first groove (6521) together form the clamping groove (651).

9. The testing system according to claim 8, characterized in that, One of the clamping members (65) is slidably connected to the guide structure (641) via a first connecting frame (66); The first connecting frame (66) is provided with a sliding structure (661), and the sliding structure (661) is provided with a stop block (662) at one end near the other clamping member (65). The corresponding clamping member (65) is slidably connected to the first connecting frame (66) through the sliding structure (661). When the gripper (6) initially grips the memory module (8), the first connecting frame (66) moves closer to the adjacent gripper (65) under the drive of the drive assembly and the guide structure (641) until it is limited by the stop block (662).

10. The testing system according to any one of claims 1-9, characterized in that, At least two test machines (7) are arranged vertically inside the cabinet (1).

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