Temperature frequency shift performance detection device and method

Abstract

The invention provides a temperature frequency shift performance detection device and method, and the device comprises a laser device which is used for generating laser; the adjusting module is used for adjusting the light intensity and the polarization state of the laser to obtain circularly polarized laser; the atomic gas chamber is used for providing atoms interacting with the circular polarization laser to obtain transmission light penetrating through the atomic gas chamber; the photoelectric detector is used for detecting the light intensity of transmission light penetrating through the atomic gas chamber; the frequency synthesis module is connected with the photoelectric detector, generates, detects, modulates, demodulates and locks a frequency signal based on the light intensity of the transmission light penetrating through the atomic gas chamber, and outputs a standard frequency signal; and the temperature control module is used for controlling the working temperature of the laser and the working temperature of the atomic gas chamber. The temperature frequency shift performance detection device can realize independent temperature control of a whole machine and a key device, can perform comprehensive detection of temperature frequency shift characteristics of the whole machine and the key device at the same time, and improves the precision of output frequency, i.e., a standard frequency signal.

Description

Technical Field

[0001] This invention relates to the field of precision spectral detection, and in particular to a device and method for detecting temperature frequency shift performance. Background Technology

[0002] A CPT (Compensated Parametric Transfer) atomic clock primarily consists of a quantum system and a servo circuit system. The quantum system includes a laser and an atomic gas cell, while the servo circuit system generates, detects, modulates, demodulates, and locks onto frequency signals. The most crucial component is the frequency synthesis module. When used under conditions of significant ambient temperature variation, the output frequency of the CPT atomic clock is inevitably affected by temperature, closely related to the temperature shift performance of the three components (laser, atomic gas cell, and frequency synthesis module). For example, changes in ambient temperature cause atomic energy level shifts within the atomic gas cell, thus affecting the CPT atomic clock's output frequency; similarly, changes in the laser's output wavelength with its temperature control point result in varying degrees of optical frequency shift, which in turn affects the center frequency of the transition signal.

[0003] Currently, research on the temperature-frequency characteristics of CPT atomic clocks mainly focuses on the temperature characteristics of individual components or on placing the entire clock in a temperature chamber for temperature testing. However, comprehensive testing of the entire clock and its multiple key components is not conducted, resulting in low accuracy of the output frequency of CPT atomic clocks.

[0004] Therefore, there is an urgent need for a temperature frequency shift performance testing device that can simultaneously test the temperature frequency shift characteristics of the atomic gas cell, laser, and the entire CPT atomic clock, so as to achieve comprehensive and complete testing of the temperature frequency shift performance of the CPT atomic clock and thus ensure the long-term stability of the CPT atomic clock performance. Summary of the Invention

[0005] This invention provides a temperature frequency shift performance detection device, comprising:

[0006] Laser, used to generate laser light;

[0007] The adjustment module is used to adjust the intensity and polarization state of the laser to obtain circularly polarized laser.

[0008] An atomic gas cell is used to provide atoms that interact with circularly polarized laser light, resulting in transmitted light passing through the atomic gas cell.

[0009] A photodetector is used to detect the intensity of light transmitted through an atomic gas cell.

[0010] The frequency synthesis module, connected to the photodetector, generates, detects, modulates, demodulates, and locks frequency signals based on the intensity of the transmitted light through the atomic gas cell, and outputs a standard frequency signal.

[0011] The temperature control module is used to control the operating temperature of the laser and the atomic gas chamber.

[0012] Furthermore, the laser is a VCSEL laser.

[0013] Furthermore, the adjustment module along the laser propagation direction includes:

[0014] Attenuator, used to adjust the intensity of laser light;

[0015] A quarter-wave plate is used to adjust the polarization state of the laser light passing through the attenuator to obtain circularly polarized laser light.

[0016] Furthermore, the standard frequency signal is a high-resolution, high-precision, low-noise 3.4GHz microwave signal.

[0017] Furthermore, the frequency synthesis module is also used to control the drive current of the laser.

[0018] Furthermore, the frequency synthesis module is also used to control the voltage-controlled voltage of the crystal oscillator in the laser.

[0019] Furthermore, the temperature control module includes:

[0020] The first temperature control module is used to control the operating temperature of the laser.

[0021] The second temperature control module is used to control the operating temperature of the atomic gas chamber.

[0022] Furthermore, the temperature frequency shift performance detection device also includes:

[0023] Magnetic shielding and magnetic field coils are used to shield the Earth's magnetic field and generate a uniform magnetic field that matches the atomic gas chamber.

[0024] Furthermore, the temperature frequency shift performance detection device also includes:

[0025] The third temperature control module is used to control the operating temperature of the whole machine. The whole machine includes a laser, an adjustment module, an atomic gas chamber, a photodetector, a frequency integration module, a first temperature control module, a second temperature control module, a magnetic shield, and a magnetic field coil.

[0026] The present invention also provides a method for detecting temperature frequency shift performance, comprising the following steps:

[0027] Laser is generated by using a laser.

[0028] By adjusting the laser's intensity and polarization state using an adjustment module, circularly polarized laser light can be obtained.

[0029] In an atomic gas cell, circularly polarized laser light is interacted with atoms to obtain transmitted light.

[0030] The intensity of transmitted light is detected using a photodetector.

[0031] The frequency synthesis module generates, detects, modulates, demodulates, and locks frequency signals based on the intensity of transmitted light, and outputs a standard frequency signal.

[0032] The laser's operating temperature is controlled by a first temperature control module, the atomic gas chamber's operating temperature is controlled by a second temperature control module, and the entire machine's operating temperature is controlled by a third temperature control module. The entire machine includes a laser, an adjustment module, an atomic gas chamber, a photodetector, a frequency integration module, a first temperature control module, a second temperature control module, magnetic shielding, and a magnetic field coil.

[0033] This invention provides a temperature frequency shift performance testing device. The device controls the operating temperature of a laser through a first temperature control module; the operating temperature of an atomic gas chamber through a second temperature control module; and the operating temperature of the entire device through a third temperature control module. The entire device includes a laser, an adjustment module, an atomic gas chamber, a photodetector, a frequency integration module, the first temperature control module, and the second temperature control module. This temperature frequency shift performance testing device can achieve independent temperature control of the entire device and key components (laser, atomic gas chamber, and frequency integration module). It is small in size, has low power consumption, and can simultaneously perform comprehensive testing of the temperature frequency shift characteristics of the entire device and key components, and comprehensively analyze the frequency shift performance. This improves the accuracy of the output frequency, i.e., the standard frequency signal, providing support for the optimization of atomic clock device parameters and ensuring the long-term stability of the atomic clock's performance.

[0034] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description, claims, and accompanying drawings. Attached Figure Description

[0035] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this invention, illustrate exemplary embodiments of the invention and are used to explain the invention, but do not constitute an undue limitation of the invention. In the drawings:

[0036] Figure 1 This is a schematic diagram of a temperature frequency shift performance detection device according to an embodiment of the present invention;

[0037] Figure 2This is a flowchart of a temperature frequency shift performance detection method according to an embodiment of the present invention;

[0038] Figure label:

[0039] 1: Laser, 2: Adjustment module, 21: Attenuator, 22: Quarter-wave plate, 3: Atomic gas cell, 4: Photodetector, 5: Frequency synthesis module, 6: Temperature control module, 61: First temperature control module, 62: Second temperature control module, 63: Third temperature control module. Detailed Implementation

[0040] To address the problem that existing technologies do not comprehensively test the temperature frequency shift characteristics of the entire CPT atomic clock and its multiple key components, resulting in low accuracy of the CPT atomic clock's output frequency, a temperature frequency shift performance testing device is provided.

[0041] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention. Furthermore, the embodiments and features in the embodiments of the present invention can be combined with each other without conflict.

[0042] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of the embodiments of the present invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in a sequence other than that illustrated or described herein.

[0043] Figure 1 This is a schematic diagram of a temperature frequency shift performance detection device according to an embodiment of the present invention. See also: Figure 1 The temperature frequency shift performance detection device includes:

[0044] Laser 1, used to generate laser light.

[0045] Specifically, laser 1 is a VCSEL (Vertical-Cavity Surface-Emitting Laser) laser with low threshold current, single-mode operation, ability to output circular light spots, and high modulation bandwidth.

[0046] Adjustment module 2 is used to adjust the light intensity and polarization state of the laser to obtain circularly polarized laser.

[0047] Specifically, the adjustment module 2 along the laser propagation direction includes:

[0048] Attenuator 21 is used to adjust the intensity of the laser beam.

[0049] A quarter-wave plate 22 is used to adjust the polarization state of the laser light transmitted through the attenuator 21 to obtain circularly polarized laser light.

[0050] Atomic gas cell 3 is used to provide atoms that interact with the circularly polarized laser, so that transmitted light passes through atomic gas cell 3.

[0051] Specifically, the atomic gas chamber 3 is a transparent glass chamber filled with alkali metal and a specific background gas.

[0052] Photodetector 4 is used to detect the intensity of transmitted light through atomic gas cell 3.

[0053] The frequency synthesis module 5, connected to the photodetector 4, generates, detects, modulates, demodulates, and locks frequency signals based on the intensity of the transmitted light through the atomic gas cell 3, and outputs a standard frequency signal.

[0054] Furthermore, the standard frequency signal is a high-resolution, high-precision, low-noise 3.4GHz microwave signal.

[0055] Furthermore, the frequency integration module 5 is also used to control the drive current of the laser 1 and the voltage-controlled voltage of the crystal oscillator in the laser 1.

[0056] Temperature control module 6 is used to control the operating temperature of laser 1 and atomic gas chamber 3.

[0057] Specifically, the temperature control module 6 includes:

[0058] The first temperature control module 61 is used to control the operating temperature of the laser 1.

[0059] The second temperature control module 62 is used to control the operating temperature of the atomic gas chamber 3.

[0060] Specifically, the temperature frequency shift performance detection device further includes:

[0061] The magnetic shield and magnetic field coil 7 are used to shield the Earth's magnetic field and generate a uniform magnetic field that matches the atomic gas chamber 3.

[0062] Furthermore, the temperature frequency shift performance detection device also includes:

[0063] The third temperature control module 63 is used to control the operating temperature of the whole machine. The whole machine includes a laser 1, an adjustment module 2, an atomic gas chamber 3, a photodetector 4, a frequency integration module 5, a first temperature control module 61, a second temperature control module 62, and a magnetic shield and a magnetic field coil 7.

[0064] In this embodiment, the temperature frequency shift performance detection device detects a CPT atomic clock. Those skilled in the art should know that the detection object can also be a small rubidium atomic clock or other quantum time and frequency precision measuring instrument. This application does not limit this.

[0065] In summary, the temperature frequency shift performance testing device provided in this embodiment of the invention controls the operating temperature of the laser 1 through a first temperature control module 61; controls the operating temperature of the atomic gas chamber 3 through a second temperature control module 62; and controls the operating temperature of the entire device through a third temperature control module 63. The entire device includes the laser 1, the adjustment module 2, the atomic gas chamber 3, the photodetector 4, the frequency integration module 5, the first temperature control module 61, and the second temperature control module 62. The temperature frequency shift performance testing device can achieve independent temperature control of the entire device and key components (laser 1, atomic gas chamber 3, and frequency integration module 5). It is small in size, has low power consumption, and can simultaneously perform comprehensive testing of the temperature frequency shift characteristics of the entire device and key components, and comprehensively analyze the frequency shift performance, improving the accuracy of the output frequency, i.e., the standard frequency signal. This provides support for optimizing the device parameters of the atomic clock and ensures the long-term stability of the atomic clock's performance.

[0066] The present invention also provides a method for detecting temperature frequency shift performance, comprising the following steps:

[0067] Laser is generated by laser 1;

[0068] By adjusting the laser intensity and polarization state using module 2, circularly polarized laser light can be obtained.

[0069] In atomic gas cell 3, circularly polarized laser light is interacted with atoms to obtain transmitted light;

[0070] The intensity of the transmitted light is detected by photodetector 4.

[0071] The frequency synthesis module 5 generates, detects, modulates, demodulates, and locks frequency signals based on the intensity of transmitted light, and outputs a standard frequency signal.

[0072] The operating temperature of the laser 1 is controlled by the first temperature control module 61, the operating temperature of the atomic gas chamber 3 is controlled by the second temperature control module 62, and the operating temperature of the whole machine is controlled by the third temperature control module 63. The whole machine includes the laser 1, the adjustment module 2, the atomic gas chamber 3, the photodetector 4, the frequency integration module 5, the first temperature control module 61, the second temperature control module 62, and the magnetic shielding and magnetic field coil 7.

[0073] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0074] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A temperature frequency shift performance testing device, characterized in that, include: Laser (1), used to generate laser light; The adjustment module (2) is used to adjust the light intensity and polarization state of the laser to obtain circularly polarized laser; Atom gas cell (3) is used to provide atoms that interact with the circularly polarized laser to obtain transmitted light through the atom gas cell (3); A photodetector (4) is used to detect the intensity of the transmitted light through the atomic gas cell (3); The frequency synthesis module (5) is connected to the photodetector (4) and generates, detects, modulates, demodulates and locks the frequency signal based on the intensity of the transmitted light through the atomic gas cell (3), and outputs a standard frequency signal. Temperature control module (6) is used to control the operating temperature of the laser (1) and the operating temperature of the atomic gas chamber (3).

2. The temperature frequency shift performance detection device according to claim 1, characterized in that, The laser (1) is a VCSEL laser.

3. The temperature frequency shift performance detection device according to claim 1, characterized in that, The adjustment module (2) includes the following components along the propagation direction of the laser: Attenuator (21) is used to adjust the intensity of the laser light; A quarter-wave plate (22) is used to adjust the polarization state of the laser transmitted through the attenuator (21) to obtain circularly polarized laser.

4. The temperature frequency shift performance detection device according to claim 1, characterized in that, The standard frequency signal is a high-resolution, high-precision, low-noise 3.4GHz microwave signal.

5. The temperature frequency shift performance detection device according to claim 1, characterized in that, The frequency synthesis module (5) is also used to control the drive current of the laser (1).

6. The temperature frequency shift performance detection device according to claim 5, characterized in that, The frequency synthesis module (5) is also used to control the voltage-controlled voltage of the crystal oscillator in the laser (1).

7. The temperature frequency shift performance detection device according to claim 1, characterized in that, The temperature control module (6) includes: The first temperature control module (61) is used to control the operating temperature of the laser (1); The second temperature control module (62) is used to control the operating temperature of the atomic gas chamber (3).

8. The temperature frequency shift performance detection device according to claim 7, characterized in that, Also includes: Magnetic shielding and magnetic field coils (7) are used to shield the Earth's magnetic field and generate a uniform magnetic field that matches the atomic gas chamber (3).

9. The temperature frequency shift performance detection device according to claim 8, characterized in that, Also includes: The third temperature control module (63) is used to control the working temperature of the whole machine, which includes the laser (1), adjustment module (2), atomic gas chamber (3), photodetector (4), frequency integration module (5), first temperature control module (61), second temperature control module (62) and magnetic shielding and magnetic field coil (7).

10. A method for detecting temperature frequency shift performance, characterized in that, Includes the following steps: Laser light is generated by laser (1); By adjusting the light intensity and polarization state of the laser through the adjustment module (2), a circularly polarized laser is obtained; In the atomic gas chamber (3), the circularly polarized laser interacts with atoms to obtain transmitted light; The intensity of the transmitted light is detected by a photodetector (4); Based on the light intensity of the transmitted light, the frequency synthesis module (5) generates, detects, modulates, demodulates, and locks a frequency signal, and outputs a standard frequency signal. The operating temperature of the laser (1) is controlled by the first temperature control module (61), the operating temperature of the atomic gas chamber (3) is controlled by the second temperature control module (62), and the operating temperature of the whole machine is controlled by the third temperature control module (63). The whole machine includes the laser (1), the adjustment module (2), the atomic gas chamber (3), the photodetector (4), the frequency integration module (5), the first temperature control module (61), the second temperature control module (62), and the magnetic shielding and magnetic field coil (7).

Images