Detection device and detection method

Abstract

The invention discloses a detection device, and relates to the technical field of ray detection. The detection device comprises a ray device, a base, an imaging piece and an adjusting mechanism, the ray device is used for generating ray beams; the base comprises a bearing table which is used for bearing a detection piece; the imaging piece is arranged on one side, far away from the ray device, of the detection piece, and an image can be formed on the imaging piece by an optical signal generated when the ray beam irradiates the detection piece; the adjusting mechanism is arranged on the base, the bearing table is connected with the adjusting mechanism, and the adjusting mechanism can drive the bearing table to be adjusted on at least three motion freedom degrees relative to the ray device so as to adjust the position of the detection piece relative to the ray beam. By applying the detection device disclosed by the invention, the labor and time cost can be saved, and the adjustment precision is improved.

Description

Technical Field

[0001] This application relates to the field of X-ray inspection technology, and in particular to an inspection device and inspection method. Background Technology

[0002] In fields such as petrochemicals, aerospace, and nuclear power equipment, internal defects (cracks, pores, or inclusions) in large pressure equipment (such as thick-walled pipes or pressure vessels) and welded structural components can affect equipment operation safety and industrial production stability.

[0003] The focal point of an electron linear accelerator is a core parameter affecting the quality of flaw detection imaging. In related technologies, the focal point measurement method typically involves irradiating the test specimen with the electron linear accelerator's X-ray beam to calculate the size of the beam intersection point. However, this method relies on manual placement and adjustment of the test specimen, increasing labor and time costs, as well as the expense of photographic film from multiple measurements. Furthermore, the adjustment accuracy is low and difficult to reproduce. Summary of the Invention

[0004] The detection device provided in this application can save labor and time costs and improve adjustment accuracy.

[0005] This application provides a detection device, which includes a radiation device, a base, an imaging element, and an adjustment mechanism. The radiation device generates a radiation beam. The base includes a support platform for supporting the detection element. The imaging element is disposed on the side of the detection element away from the radiation device, and the optical signal generated by the radiation beam irradiating the detection element can form an image on the imaging element. The adjustment mechanism is disposed on the base, and the support platform is connected to the adjustment mechanism. The adjustment mechanism can drive the support platform to adjust relative to the radiation device in at least three degrees of freedom of motion to adjust the position of the detection element relative to the radiation beam.

[0006] The detection apparatus provided in this application has a base that provides a mounting foundation and support for the carrier stage and the detection piece. Because the adjustment mechanism can drive the carrier stage to adjust relative to the X-ray device in at least three degrees of freedom (e.g., translation, rotation, or tilt), the position and angle of the detection piece in space can be flexibly adjusted without moving the X-ray device. Since the position and angle of the detection piece can be precisely adjusted through the multi-degree-of-freedom movement of the carrier stage, the optical signal generated by the X-ray beam irradiating the detection piece can be adjusted by adjusting the angle between the detection piece and the X-ray beam, thereby adjusting the image generated on the imaging piece. Because the adjustment process of the carrier stage acts on the spatial orientation of the detection piece, the spatial orientation of the carrier stage or the detection piece can be adjusted through the adjustment mechanism. This process reduces operator intervention and allows for rapid adjustment of the detection piece's position during multiple detections or scans, thus saving labor and time costs and improving adjustment accuracy.

[0007] In one possible implementation of this application, the adjustment mechanism includes a rotating component disposed on the base and rotatably connected to the support platform, so that the support platform can rotate relative to the base about a first axis, the first axis being parallel to the height direction of the base.

[0008] In one possible implementation of this application, the adjustment mechanism further includes a flipping component. The first side of the support platform is rotatably connected to the base, and the flipping component is connected to the second side of the support platform. The flipping component can drive the second side to rotate around the axis of the first side, and the direction of the rotation axis of the first side is different from the direction of the first axis.

[0009] In one possible implementation of this application, the adjustment mechanism further includes a lifting assembly, which is disposed on the base and connected to the support platform. The lifting assembly is used to drive the support platform to move relative to the base along the height direction of the base.

[0010] In one possible implementation of this application, the adjustment mechanism includes a translation component, which is disposed on the support platform and connected to the detection component. The translation component includes at least two driving components, and the at least two driving components are capable of driving the detection component to move in different directions on the surface of the support platform.

[0011] In one possible implementation of this application, the detection device further includes a positioning element having a positioning mark; the positioning element and the imaging element are disposed on the same side of the detection element, and the positioning element is disposed between the detection element and the imaging element, and the positioning mark is used to mark the image formed by the detection element on the imaging element.

[0012] This application provides a detection method applicable to any of the above-mentioned detection devices. The detection method includes: irradiating the detection device with a X-ray beam based on the initial position parameters of the detection device, and determining the image information formed on the imaging device by the optical signal generated by the X-ray beam passing through the detection device; determining the corrected position parameters of the detection device based on the image information and a preset image standard; adjusting the position of the detection device based on the corrected position parameters, and determining the image information formed on the imaging device by the detection device; iteratively adjusting the position of the detection device until the image information meets the preset image standard.

[0013] In one possible implementation of this application, determining the corrected position parameters of the detection element based on image information and a preset image standard includes: determining the sharpness and position offset direction of the stripes formed by the detection element on the imaging element based on image information and a preset image standard; and determining the corrected position parameters of the detection element based on the stripe sharpness and position offset direction.

[0014] In one possible implementation of this application, the position of the detector is adjusted based on the corrected position parameters, and the image information formed by the detector on the imaging element is determined. The position of the detector is iteratively adjusted until the image information meets the preset image standard. This includes: controlling the adjustment mechanism to move the support stage based on the corrected position parameters to adjust the position of the detector; irradiating the detector with an X-ray beam to determine the image information formed on the imaging element by the optical signal generated by the X-ray beam passing through the detector; determining the stripe sharpness and positional offset direction formed by the detector with the corrected position on the imaging element based on the image information and the preset image standard; determining the corrected position parameters of the detector based on the stripe sharpness and positional offset direction; and adjusting the position of the detector based on the corrected position parameters until the image information meets the preset image standard.

[0015] In one possible implementation of this application, the detection method further includes calculating the focal size of the ray beam based on image information that meets a preset image standard. Attached Figure Description

[0016] Figure 1 This is one of the structural schematic diagrams of the detection device provided in the embodiments of this application; Figure 2 This is a second schematic diagram of the detection device provided in the embodiments of this application; Figure 3 This is the third schematic diagram of the detection device provided in the embodiments of this application; Figure 4 This is one of the step diagrams of the detection method provided in the embodiments of this application; Figure 5 This is the second step diagram of the detection method provided in the embodiments of this application; Figure 6 This is the third step diagram of the detection method provided in the embodiments of this application; Figure 7 The fourth step diagram of the detection method provided in the embodiments of this application.

[0017] Figure label: 1-Base; 11-Bearing platform; 111-Anti-slip strip; 112-First side; 113-Second side; 114-Clamp; 12-Base plate; 13-Bracket; 14-Roller; 2-Detection piece; 3-Adjustment mechanism; 31-Rotating assembly; 311-Rotating button; 312-Rotating platform; 32-Tilting assembly; 321-Fixed end; 322-Drive end; 33-Lifting assembly; 331-Lifting connector; 332-Drive shaft; 333-Clearance; Z-Height direction. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the specific technical solutions of this application will be further described in detail below with reference to the accompanying drawings of the embodiments of this application. The following embodiments are used to illustrate this application, but are not intended to limit the scope of this application.

[0019] In the embodiments of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of this application, unless otherwise stated, "multiple" means two or more.

[0020] Furthermore, in the embodiments of this application, directional terms such as "upper," "lower," "left," and "right" are defined relative to the positions in which the components are schematically placed in the accompanying drawings. It should be understood that these directional terms are relative concepts, used for relative description and clarification, and can change accordingly depending on the position of the components in the accompanying drawings.

[0021] In the embodiments of this application, unless otherwise explicitly specified and limited, the term "connection" should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral part; it can be a direct connection or an indirect connection through an intermediate medium.

[0022] In embodiments of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0023] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0024] The step numbers in the following embodiments are not intended to limit the execution order of each step. The step numbers are only for ease of description. Different execution orders of steps can be combined in a logical order to solve the same technical problem.

[0025] In fields such as petrochemicals, aerospace, and nuclear power equipment, internal defects (cracks, porosity, or inclusions) in large pressure-bearing equipment (such as thick-walled pipes or pressure vessels) and welded structural components can affect equipment operation safety and industrial production stability. Among related technologies, non-destructive testing techniques (such as ultrasonic testing and X-ray testing) have limitations when dealing with workpieces with walls thicker than 80 mm and made of high-density materials (such as special steel or titanium alloys), including insufficient penetration and low defect location accuracy. Electron linear accelerators, however, can generate high-energy X-rays, typically ranging from 2 MeV to 25 MeV, offering advantages such as strong penetration and short exposure time, enabling rapid, high-definition non-destructive testing of thick and large workpieces.

[0026] The focal point of an electron linear accelerator is a core parameter affecting the quality of flaw detection imaging. In related technologies, the focal point measurement method usually adopts the "sandwich" method formulated by the national standard GB / T20129-2006 for electron linear accelerators. The "sandwich" method involves alternately arranging and pressing multiple copper or aluminum foils with a thickness of h1 and multiple plastic sheets with a thickness of h2 to form a "sandwich block". The X-ray beam of the electron linear accelerator passes through one side of the "sandwich block", and a photosensitive film is placed on the other side of the "sandwich block". The number of clear black and white stripes on the film is observed to calculate the focal point size.

[0027] In this detection method, the collimation of the X-ray beam illuminating the "sandwich block" and the amount of radiation dose both affect the clarity of the image on the film. Therefore, the position and angle of the "sandwich block" need to be constantly adjusted during the detection process. Related technologies involve manually placing and adjusting the test piece, which increases labor and time costs, as well as the cost of photographic film from multiple measurements. Furthermore, the adjustment accuracy is low and difficult to reproduce.

[0028] This application provides a detection device, referring to... Figure 1 , Figure 2 and Figure 3 The detection device includes a radiation device, a base 1, an imaging element, and an adjustment mechanism 3. The radiation device is used to generate a radiation beam. The base 1 includes a support platform 11 for supporting the detection element 2. The imaging element is located on the side of the detection element 2 away from the radiation device, and the optical signal generated by the radiation beam irradiating the detection element 2 can form an image on the imaging element. The adjustment mechanism 3 is located on the base 1, and the support platform 11 is connected to the adjustment mechanism 3. The adjustment mechanism 3 can drive the support platform 11 to adjust relative to the radiation device in at least three degrees of freedom of motion to adjust the position of the detection element 2 relative to the radiation beam.

[0029] In this embodiment of the application, the radiation device is a device for generating a radiation beam for penetrating the object being inspected. The radiation device can be an X-ray machine or an electron linear accelerator, and the radiation beam can be X-rays.

[0030] In this embodiment, the base 1 is used to provide an installation foundation and support for the adjustment mechanism 3, the detection element 2, and the imaging element. The base 1 can be designed as a floor-standing type, a gantry type, or a mobile trolley type. The base 1 may include a shock-absorbing device or a leveling device to adapt to different ground environments.

[0031] In this embodiment, the support stage 11 is used to place the detection element 2. The detection element 2 is a "sandwich block" composed of multiple copper or aluminum foils of thickness h1 and multiple plastic sheets of thickness h2 arranged alternately and pressed together. The number of detection elements 2 placed on the support stage 11 is not limited. For example, two detection elements 2 can be placed on the support stage 11. Different sides of the two detection elements 2 can be correlated with the X-ray beam to determine the images of the different sides of the detection elements 2 on the imaging element.

[0032] In this embodiment, the surface of the support stage 11 may be provided with a clamp 114, a slot, or a vacuum adsorption structure for fixing the test piece 2. For example, see... Figure 1 Multiple anti-slip strips 111 can be provided on the support platform 11. The multiple anti-slip strips 111 are evenly distributed on the surface of the support platform 11 to increase the friction between the test piece 2 and the support platform 11.

[0033] In this embodiment, the imaging element can be film, imaging plate, etc.; the imaging element can receive the X-ray signal after passing through the detection element 2 and convert it into a visible image. For example, the imaging element is photosensitive film, and the X-ray device and the imaging element are respectively disposed on opposite sides of the detection element 2. The X-ray beam passes through one side of the detection element 2, and the X-ray passing through the detection element 2 forms a black and white striped image on the photosensitive film placed on the other side of the detection element 2. The focal size of the X-ray beam can be calculated based on the number of black and white stripes on the photosensitive film.

[0034] In this embodiment, the adjustment mechanism 3 is used to drive the support platform 11 to perform multi-degree-of-freedom pose adjustment. The adjustment mechanism 3 can drive the support platform 11 to move, and the support platform 11 drives the detection element 2 to move; the adjustment mechanism 3 can also directly drive the detection element 2 to move. The adjustment mechanism 3 may include linear guides, ball screws, rotary tables, tilting tables, etc.; the driving method of the adjustment mechanism 3 can be manual or electric drive.

[0035] It should be explained that the adjustment mechanism 3 can drive the support stage 11 to adjust relative to the radiation device in at least three degrees of freedom of motion, which means that the support stage 11 can move in three or more independent directions.

[0036] At least three degrees of freedom can be horizontal translation, vertical lifting, and horizontal rotation; if there are five degrees of freedom, forward and backward tilting and left and right tilting can be added. For example, the support platform 11 or the detection piece 2 can translate relative to the X-ray device in three different directions, or rotate around in three different directions.

[0037] It should be added that the detection element 2 is composed of multiple copper or aluminum foils and multiple plastic sheets arranged and pressed alternately. If the incident angle of the X-ray beam is at an angle to the side of the detection element 2, the black and white stripe image formed on the imaging element will be unclear, and there will be a displacement of the black and white stripes. Adjusting the position of the detection element 2 relative to the X-ray beam so that the X-ray beam irradiates the side of the detection element 2 as perpendicularly as possible can form a clear black and white stripe image on the imaging element. This application, by adjusting the support stage 11 through the adjustment mechanism 3, can combine the bisection method to increase the placement speed of the detection element 2 and increase the speed of obtaining a clear black and white stripe image.

[0038] In the detection apparatus of this application embodiment, the base 1 provides a mounting foundation and support for the support platform 11 and the detection piece 2. Since the adjustment mechanism 3 can drive the support platform 11 to adjust relative to the X-ray device in at least three degrees of freedom (e.g., translation, rotation, or tilt), the position and angle of the detection piece 2 in space can be flexibly adjusted and the specific values ​​of the position and angle can be quantified without moving the X-ray device, allowing for rapid approximation of the correct position using a bisection method. Because the position and angle of the detection piece 2 can be precisely adjusted through the multi-degree-of-freedom movement of the support platform 11, the optical signal generated by the X-ray beam irradiating the detection piece 2 can be adjusted by adjusting the angle between the detection piece 2 and the X-ray beam, thereby adjusting the image generated on the imaging piece. Since the adjustment process of the support platform 11 acts on the spatial orientation of the detection piece 2, the spatial orientation of the support platform 11 or the detection piece 2 can be adjusted by the adjustment mechanism 3. This process reduces operator intervention and allows for rapid adjustment of the position of the detection piece 2 during multiple detections or scans, thus saving labor and time costs and improving adjustment accuracy.

[0039] The detection device provided in this application embodiment can be applied to industrial flaw detection, such as welding defect detection, internal porosity detection of castings, and delamination evaluation of composite materials, and can also be adapted to high-energy X-ray imaging laboratories.

[0040] In some possible embodiments of this application, reference is made to Figure 1 , Figure 2 and Figure 3 The adjustment mechanism 3 includes a rotating component 31, which is disposed on the base 1 and rotatably connects the support platform 11 to the base 1, so that the support platform 11 can rotate relative to the base 1 about a first axis, the first axis being parallel to the height direction Z of the base 1.

[0041] In this embodiment, the rotating assembly 31 enables the support platform 11 to rotate relative to the base 1 about a first axis. The rotating assembly 31 may include a turntable bearing, a worm gear pair, a slewing bearing, or a crossed roller bearing structure. The rotating assembly 31 may also be equipped with a manual rotating handle, an electric drive motor, or an encoder feedback device.

[0042] In this embodiment, the rotating component 31 can be embedded inside the base 1 or fixed to the base 1 by flanges, bolts, etc.; the base 1 can be provided with reinforcing ribs or mounting platforms at the position corresponding to the rotating component 31 to improve rotational stability.

[0043] In this embodiment of the application, the first axis is parallel to the height direction Z of the base 1, and the support platform 11 can rotate around the first axis, that is, the support platform 11 can achieve 360-degree rotation in the horizontal plane, and the rotation range can also be set as continuous rotation or limited angle rotation, etc.

[0044] For example, the rotating assembly 31 may include a slewing bearing and a drive component. The slewing bearing is mounted to the base 1 via a flange, the outer ring of the slewing bearing is fixedly connected to the base 1 via bolts, and the inner ring of the slewing bearing is fixedly connected to the support platform 11 via a connecting flange.

[0045] The driving component includes a servo motor and a reducer. The servo motor is mounted on a motor mount on the side of the base 1. The output shaft of the driving component meshes with the gear of the inner ring of the slewing bearing through the reducer, or drives the gear ring of the slewing bearing through a pinion. When the servo motor rotates, it drives the inner ring of the slewing bearing and the bearing platform 11 fixedly connected to it to rotate together around the first axis (i.e., the vertical central axis of the slewing bearing) relative to the base 1 through the reduction transmission.

[0046] The first axis is parallel to the height direction Z (i.e., the vertical direction) of the base 1, ensuring that the support platform 11 maintains a horizontal posture during rotation. The rotation angle can be fed back and controlled by the encoder built into the servo motor, achieving the positioning of the rotation angle. An angle scale ring can also be installed between the support platform 11 and the slewing bearing to assist in visually assessing the angle.

[0047] It should be added that the rotating assembly 31 may also include a first locking element, which can lock the bearing platform 11 by means of the locking mechanism of the slewing bearing itself or an additional pneumatic or mechanical locking device after the rotating assembly 31 is rotated to the required position.

[0048] In the detection device of this application embodiment, since the rotating assembly 31 rotatably connects the support platform 11 to the base 1, the support platform 11 can rotate relative to the base 1. Since the first axis is set to be parallel to the height direction Z of the base 1, the rotation axis of the support platform 11 remains vertical, so that the rotation is carried out in the horizontal plane. The detection element 2 can adjust its circumferential angle with the support platform 11 in the horizontal plane, thereby changing the incident direction of the X-ray beam penetrating the detection element 2 without moving the X-ray device.

[0049] In some possible embodiments of this application, reference is made to Figure 1 , Figure 2 and Figure 3 The adjustment mechanism 3 also includes a flipping component 32. The first side 112 of the support platform 11 is rotatably connected to the base 1. The flipping component 32 is connected to the second side 113 of the support platform 11. The flipping component 32 can drive the second side 113 to rotate around the axis of the first side 112. The direction of the rotation axis of the first side 112 is different from the direction of the first axis.

[0050] In this embodiment, the first side 112 of the support platform 11 can be rotatably connected to the base 1 through a hinge, a rotating shaft and a bearing seat, or a U-shaped bracket 13 and a pin, etc. This application does not limit this.

[0051] It should be added that the structure in which the first side 112 and the base 1 are rotatably connected can be equipped with a damping or self-locking structure to improve the stability of the bearing platform 11 relative to the base 1.

[0052] In this embodiment of the application, the fixed end 321 of the flipping component 32 is connected to the base 1, and the driving end 322 of the flipping component 32 is connected to the second side 113. The driving end 322 of the flipping component 32 can be connected to the second side 113 of the support platform 11 through a ball joint, universal joint or floating joint.

[0053] For example, the flipping assembly 32 includes a drive motor and a push rod connected to the second side 113. The motor drives the push rod to rotate the second side 113 about the rotation axis of the first side 112.

[0054] It should be added that when the drive end 322 of the flipping component 32 extends or shortens, it pushes the second side 113 to rise or fall, thereby causing the support platform 11 to tilt and flip around the rotation axis of the first side 112, and the flipping angle range can be from 0° to 90°.

[0055] In this embodiment, the flipping assembly 32 may further include a tilt sensor. The tilt sensor is mounted on the support platform 11 or a structure rigidly connected to the support platform 11, and is used to detect the flipping angle of the support platform 11 about the rotation axis of the first side 112 in real time.

[0056] In this embodiment, a control component may also be included. The control component can control the extension and retraction of the drive end 322 of the flipping component 32 according to the target angle and the actual angle fed back by the tilt sensor, thereby driving the second side 113 of the support platform 11 to rotate around the axis of the first side 112, so as to realize the pitch attitude adjustment of the support platform 11.

[0057] With this structure, since the first axis is parallel to the height direction Z of the base 1, that is, the first axis is a vertical axis (Z axis), the rotation axis of the first side 112 can be in the horizontal direction (such as the X axis or Y axis), so that the support stage 11 can achieve tilting movement in the front-back or left-right directions, which can be combined with the rotation around the first axis to form a composite degree of freedom. The driving mode of the flipping component 32 can realize the angle control of the support stage 11, thereby improving the adaptability of the detection position and imaging angle.

[0058] In some possible embodiments of this application, reference is made to Figure 1 , Figure 2 and Figure 3 The adjustment mechanism 3 also includes a lifting component 33, which is disposed on the base 1 and connected to the support platform 11. The lifting component 33 is used to drive the support platform 11 to move relative to the base 1 along the height direction Z of the base 1.

[0059] In this embodiment, the function of the lifting component 33 is to make the support platform 11 move linearly along the vertical direction (i.e., the height direction Z) defined by the base 1, so as to raise or lower the support platform 11 and drive the detection component 2 to rise or fall.

[0060] In this embodiment, the lifting assembly 33 may adopt a scissor lift, a screw lifting mechanism, a hydraulic or pneumatic cylinder, a linear motor, or a gear and rack mechanism, etc.

[0061] For example, the fixed part of the lifting assembly 33 can be fixedly connected to the bottom of the base 1 or the internal frame of the base 1 by bolts or welding; the movable upper end of the lifting assembly 33 can be connected to the bottom of the support platform 11 by a flange, ball joint or floating joint.

[0062] The lifting assembly 33 may have one or more support points with the support platform 11. When there are multiple support points between the lifting assembly 33 and the support platform 11, a synchronous mechanism (such as a synchronous shaft or synchronous belt) can be used to improve the stability of the support platform 11 during the rising or falling process.

[0063] For example, refer to Figure 1 , Figure 2 and Figure 3The base 1 may include a base plate 12 and a bracket 13; both the base plate 12 and the bracket 13 provide an installation foundation for the adjustment mechanism 3. The base plate 12 may be equipped with rollers 14 to facilitate the movement of the base 1, and the bracket 13 is disposed on the base plate 12. The rotating platform 312 of the rotating assembly 31 is disposed on the base plate 12, and the rotating platform 312 rotatably connects the bracket 13 to the base plate 12, allowing the bracket 13 to rotate relative to the base plate 12. The support platform 11 is disposed on the bracket 13, and the rotary button 311 is disposed on the base plate 12 for controlling the rotation of the rotating platform 312. The lifting assembly 33 includes a lifting connector 331, which is connected to the support platform 11. The four drive shafts 332 of the lifting assembly 33 are respectively disposed at the four corners of the lifting connector 331. The four drive shafts 332 of the lifting assembly 33 are used to drive the lifting connector 331 to rise or fall, thereby causing the support platform 11 to rise or fall. The fixed end 321 of the flipping assembly 32 is disposed on the bracket 13. The lifting connector 331 includes a clearance gap 333. The driving end 322 of the flipping assembly 32 passes through the clearance gap 333 and is connected to the second side 113 of the support platform 11. The first side 112 of the support platform 11 is hinged to the lifting connector 331. The driving end 322 of the flipping assembly 32 can drive the second side 113 of the support platform 11 to rotate around the axis of hinge between the first side 112 and the lifting connector 331. With this structure, the support platform 11 can be rotated in the horizontal direction by the rotating assembly 31, and the support platform 11 can be raised and lowered in the height direction Z by the lifting assembly 33. The support platform 11 can also be flipped in the height direction Z by the flipping assembly 32.

[0064] In some possible embodiments of this application, the adjustment mechanism 3 includes a translation component disposed on the support platform 11 and connected to the detection element 2. The translation component includes at least two driving elements, and the at least two driving elements are capable of driving the detection element 2 to move in different directions on the surface of the support platform 11.

[0065] In this embodiment, the translation component can be disposed on the base 1 or the support platform 11. The moving end of the translation component is connected to or abuts against the detection element 2 to drive the detection element 2 to move on the surface of the support platform 11.

[0066] In this embodiment, the translation component includes at least two independent driving members, each driving the detection member 2 in a different direction, thus enabling the detection member 2 to move along different directions on the support platform 11. For example, when the translation component includes two driving members, the driving directions of the two driving members are perpendicular to each other, which enables the detection member 2 to move along two perpendicular directions on the support platform 11.

[0067] It should be added that the drive unit can be a stepper motor, servo motor, linear motor or manual fine-tuning knob; each drive unit can be equipped with a lead screw, synchronous belt or gear rack as a transmission mechanism.

[0068] The detection device of this application embodiment includes at least two driving members in the translation component. Since the at least two driving members can drive the detection member 2 to move in different directions on the surface of the support platform 11, the position of the detection member 2 on the support platform 11 can be adjusted based on the position of the support platform 11. Thus, the position of the detection member 2 can be flexibly adjusted. Since the translation component can provide movement in at least two different directions, the accuracy of position adjustment can be improved.

[0069] In some possible embodiments of this application, the detection device further includes a positioning element having a positioning mark; the positioning element and the imaging element are disposed on the same side of the detection element 2, and the positioning element is disposed between the detection element 2 and the imaging element, and the positioning mark is used to mark the image formed by the detection element 2 on the imaging element.

[0070] In this embodiment, the positioning element can be a sheet-like, mesh-like, or frame-like structure, and the material can be lead, tungsten alloy, or other high-density materials to form a clear image during imaging. The positioning element can be fixed to the imaging element via a slot, magnetic attraction, or detachable bracket 13, or fixed to the detection element 2 simultaneously with the imaging element.

[0071] In this embodiment of the application, the positioning mark can also be a crosshair, grid line, ruler, number, letter code or specific geometric shape (such as circle, square, etc.).

[0072] For example, the positioning element can be a lead block with positioning markings, such as a lead block with "up," "down," "left," and "right." The positioning element is positioned between the detection element 2 and the imaging element. Because the positioning element has a strong absorption capacity for the X-ray beam, the X-ray beam will form a clear image on the imaging element after passing through the positioning element. Before irradiating the detection element 2 with the X-ray beam, the positioning element is marked on the imaging element, which can be used to mark the imaging element for observing its direction.

[0073] With this structure, the positioning element can mark the image formed on the imaging element. Since the positioning element is fixed between the detection element 2 and the imaging element, the marked image of the fixed element can provide a reference for the spatial position, direction and size of the image of the detection element 2. This helps to determine the actual position and direction of the detection element 2 in the imaging field of view, and can also help the operator understand and adjust the direction. It is suitable for situations where multiple shots need to be taken for comparison, and improves the analyzability of the detection results.

[0074] This application provides a detection method, applied to the detection device provided in the above-described embodiments of this application, with reference to... Figure 4 The detection method includes: Based on the initial position parameters of the detection element, S100 uses a ray beam to irradiate the detection element and determines the image information formed on the imaging element by the optical signal generated by the ray beam passing through the detection element.

[0075] Based on the initial placement and orientation parameters (such as coordinates and angles) of the test piece, the X-ray device is activated to irradiate the test piece. The imaging device receives the penetrating X-ray signal and forms an image, acquiring image data (such as the clarity of black and white stripes and geometric features) of the test piece at its initial placement position.

[0076] In this embodiment of the application, the image information may include the position, contrast, sharpness, center offset, etc. of the black and white stripes, which can reflect the positional relationship between the detection device and the X-ray beam.

[0077] Based on image information and preset image standards, S200 determines the correction position parameters of the detected component.

[0078] In this embodiment, the preset image standard is a pre-defined standard for image information, such as centering of stripes, clear boundaries, and contrast threshold. It can be used to compare with the obtained image information, determine the deviation between the current image information and the preset image standard, thereby calculating the direction and magnitude of adjustment required for the detection component, and generating correction position parameters, such as the translation amount and rotation angle required for the correction position of the detection component.

[0079] For example, if the preset image standard is that the clearest black and white stripes are located in the center of the image, and the stripes in the actual image information are shifted to the left, blurred, or lack contrast, then the position of the detection object needs to be adjusted.

[0080] S300 adjusts the position of the detector based on the corrected position parameters, determines the image information formed by the detector on the imaging device, and iteratively adjusts the position of the detector until the image information meets the preset image standard.

[0081] This application provides a detection method, referring to... Figure 5 Step S200, based on image information and preset image standards, determines the correction position parameters of the detected component, including: Based on image information and preset image standards, S210 determines the clarity and positional offset direction of the stripes formed by the detected component on the imaging component.

[0082] S220 determines the corrected position parameters of the test piece based on stripe sharpness and position offset direction.

[0083] In this embodiment, stripe sharpness can refer to the sharpness of the edges of black and white stripes and the quantitative or qualitative evaluation of contrast, reflecting the image quality. Position offset direction can refer to the offset direction and offset size of the black and white stripes as a whole or a feature part (such as the darkest black stripe) relative to the image center or a preset reference position in the plane.

[0084] To improve image information, i.e., the imaging quality on the imaging device, the detection device needs to be adjusted in specific values ​​in each degree of freedom of motion, such as translation distance, upward or downward distance, rotation angle or tilt angle changes, in order to adjust the angle between the detection device and the X-ray beam.

[0085] This application provides a detection method, referring to... Figure 6 Step S300 adjusts the position of the detector based on the corrected position parameters, determines the image information formed by the detector on the imaging element, and iteratively adjusts the position of the detector until the image information meets the preset image standard, including: S310 controls the adjustment mechanism to move the support platform based on the corrected position parameters, thereby adjusting the position of the test piece.

[0086] The S320 uses a beam of X-rays to irradiate the adjusted detection element and determines the image information formed on the imaging element by the optical signal generated by the X-ray beam passing through the detection element.

[0087] Based on image information and preset image standards, S330 determines the clarity and positional offset direction of the stripes formed on the imaging device by the adjusted detection component.

[0088] S340 determines the corrected position parameters of the detection element based on the stripe clarity and position offset direction; the position of the detection element is adjusted based on the corrected position parameters until the image information meets the preset image standard.

[0089] In this embodiment, in step S340, the position of the detector is adjusted based on the corrected position parameters. Step S320 can be repeated to determine the image information formed on the imaging device by the optical signal generated by the X-ray beam passing through the detector. Based on the image information and a preset image standard, if the image information does not meet the preset image standard, the determination of the stripe clarity and positional offset direction formed on the imaging device by the adjusted detector is repeated to determine the corrected position parameters of the detector. The position of the detector is adjusted based on the corrected position parameters until the image information meets the preset image standard. During this process, the position information of the detector can be recorded each time.

[0090] This application provides a detection method, referring to... Figure 7 The detection method also includes: S400 calculating the focal size of the ray beam based on image information that meets the preset image standard.

[0091] In this embodiment of the application, when the position of the detection element is iteratively adjusted until the resulting image (i.e., stripe image) meets the preset quality standard, the effective focal size of the ray beam that generates the image is calculated based on the specific feature parameters of the image using a predetermined formula or algorithm.

[0092] The sequence numbers of the embodiments in this application are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments. The above are merely preferred embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made based on the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A detection device, characterized in that, include: A radiation device used to generate a beam of radiation; The base includes a support platform for supporting the test piece; An imaging element is disposed on the side of the detection element away from the ray device, and the optical signal generated by the ray beam irradiating the detection element can form an image on the imaging element; An adjustment mechanism is disposed on the base, and the support platform is connected to the adjustment mechanism. The adjustment mechanism can drive the support platform to adjust relative to the radiation device in at least three degrees of freedom of motion to adjust the position of the detection element relative to the radiation beam.

2. The detection device according to claim 1, characterized in that, The adjustment mechanism includes a rotating component disposed on the base and rotatably connected to the support platform, so that the support platform can rotate relative to the base about a first axis, the first axis being parallel to the height direction of the base.

3. The detection device according to claim 2, characterized in that, The adjustment mechanism further includes a flipping component. The first side of the support platform is rotatably connected to the base. The flipping component is connected to the second side of the support platform. The flipping component can drive the second side to rotate around the axis of the first side. The direction of the rotation axis of the first side is different from the direction of the first axis.

4. The detection device according to any one of claims 1 to 3, characterized in that, The adjustment mechanism further includes a lifting assembly, which is disposed on the base and connected to the support platform. The lifting assembly is used to drive the support platform to move relative to the base along the height direction of the base.

5. The detection device according to any one of claims 1 to 3, characterized in that, The adjustment mechanism includes a translation component, which is disposed on the support platform and connected to the detection element. The translation component includes at least two driving elements, and the at least two driving elements are capable of driving the detection element to move in different directions on the surface of the support platform.

6. The detection device according to any one of claims 1 to 3, characterized in that, The detection device further includes a positioning element, which has a positioning mark; the positioning element and the imaging element are disposed on the same side of the detection element, and the positioning element is disposed between the detection element and the imaging element, and the positioning mark is used to mark the image formed by the detection element on the imaging element.

7. A detection method applied to the detection apparatus according to any one of claims 1 to 6, characterized in that, include: Based on the initial position parameters of the detection element, the detection element is irradiated with the X-ray beam to determine the image information formed on the imaging element by the optical signal generated by the X-ray beam passing through the detection element; Based on the image information and the preset image standard, the correction position parameters of the detection component are determined; Based on the corrected position parameters, the position of the detector is adjusted, and the image information formed by the detector on the imaging element is determined. The position of the detector is iteratively adjusted until the image information meets the preset image standard.

8. The detection method according to claim 7, characterized in that, The step of determining the correction position parameters of the detection element based on the image information and a preset image standard includes: Based on the image information and the preset image standard, the clarity and positional offset direction of the stripes formed by the detection element on the imaging element are determined; Based on the stripe clarity and position offset direction, the corrected position parameters of the detection element are determined.

9. The detection method according to claim 7, characterized in that, The step of adjusting the position of the detector based on the corrected position parameters, determining the image information formed by the detector on the imaging element, and iteratively adjusting the position of the detector until the image information meets the preset image standard includes: Based on the corrected position parameters, the adjustment mechanism is controlled to move the support platform to adjust the position of the detection piece; The X-ray beam is used to irradiate the detector, which has been positioned, to determine the image information formed on the imaging device by the optical signal generated by the X-ray beam passing through the detector. Based on the image information and the preset image standard, the clarity and positional offset direction of the stripes formed by the adjusted detection element on the imaging element are determined. Based on the stripe clarity and position offset direction, the corrected position parameters of the detection element are determined; the position of the detection element is adjusted based on the corrected position parameters until the image information meets the preset image standard.

10. The detection method according to claim 7, characterized in that, Also includes: The focal size of the ray beam is calculated based on the image information that meets the preset image standard.

Images