Miniature NIR spectrometer

Abstract

The invention relates to a spectrometer device (130) for obtaining at least one item of spectral information about at least one object (110) by means of spectral measurement, the spectrometer device (130) comprising: (1) at least one sample interface (132), the sample interface (132) being configured to define a measurement pose of the object (110), in particular during the spectral measurement, the measuring surface further defines an x-y plane and thereby defines an x-axis and a y-axis; (2) at least one light emitting element (138) wherein the light emitting element (138) is configured for emitting illumination light (140) onto the at least one object (110) in order to generate detection light (142) from the at least one object (110); (3) at least one detector (144), where the detector (144) comprises a plurality of light sensitive elements (164), where each of the light sensitive elements (164) is configured to generate at least one detector (144) signal when the detection light (142) is received from the object (110) in order to obtain the spectral information item; wherein the spectrometer device (130) is configured such that the received detection light (142) of at least two light-sensitive elements (164) of the plurality of light-sensitive elements (164) each exhibit an angular distribution over the sample interface, and wherein at least two angular distributions of the at least two light-sensitive elements (164) at least partially overlap.

Description

Technical Field

[0001] This invention relates to a spectrometer apparatus for obtaining at least one spectral information item, a mobile device, and a method for operating the spectrometer apparatus to obtain spectral information. The method and apparatus according to the invention can be specifically used, for example, in various fields such as daily life, security technology, gaming, transportation technology, production technology, photography (e.g., digital or video photography for artistic, documentation, or technical purposes), safety technology, information technology, agriculture, crop protection, maintenance, cosmetics, and medical technology, or in science. However, other applications are also possible. Background Technology

[0002] Spectrometers are typically used to obtain at least one spectral information item about an object (such as a measurement object). To obtain the spectral information item, the object is illuminated with light, causing it to generate detection light. The received detection light can then be analyzed to obtain the spectral information.

[0003] In particular, due to the interaction of surface scattering and volume scattering effects, especially those caused by diffraction and / or refraction of light within the sample, the spectral information generated by a diffuse reflectance spectrometer can exhibit a strong dependence on the angle at which the detection light is received from the object being measured. For example, when recording the spectrum of a plastic sample, the spectrum will be entirely different depending on the processing and / or manufacturing of the plastic, especially when the plastic is molded or cast. Therefore, this can lead to entanglement between the optical path describing light propagation and the wavelength of the light.

[0004] Typically, the spectral information recorded by a diffuse reflectance spectrometer is not only affected by light absorption via the material's absorption coefficient, but also by the internal and / or surface structure of the object that determines its spectral information. This effect is generally undesirable in spectroscopy, particularly in near-infrared spectroscopy, which aims to measure the light absorption of materials.

[0005] In particular, these effects may be undesirable for multi-pixel spectrometers that typically record only a few individual wavelengths. Furthermore, the placement of the wavelength selection element may further depend on the geometry of the optical path, which could alter the optical path of the detection light incident on different photosensitive elements.

[0006] WO 2023 / 161403 A1 relates to calibration methods for use in spectrometer equipment. The method includes: a) providing at least one spectrometer device, the at least one spectrometer device including at least one optical measuring element and at least one optical calibration element, the at least one optical measuring element and the at least one optical calibration element having different optical properties; b) providing at least one sample; c) performing at least two measurements using the spectrometer device, specifically at least two consecutive measurements, wherein one of these measurements is performed with the sample and the other of these measurements is performed without the sample, i. wherein performing the measurement with the sample includes illuminating the detector of the spectrometer device via an optical measurement path using the optical measuring element, the optical measurement path including at least one reflection at the at least one sample, and ii. wherein performing the measurement without the sample includes illuminating the detector via an optical calibration path independent of the optical measurement path using the optical calibration element, the optical calibration path including at least one interaction with the optical calibration element without interaction with the sample, and wherein the optical calibration path is arranged within the spectrometer device, specifically within the housing of the spectrometer device; d) The at least one detector generates at least one first detector signal Sd1 based on the measurement in the absence of the sample, and generates at least one second detector signal Sd2 based on the measurement in the presence of the sample; e) at least one calibrated optical property of the at least one sample is obtained from the first detector signal Sd1 and the second detector signal Sd2. Further, a spectrometer apparatus configured to perform an in-use calibration method and its various uses are disclosed.

[0007] The problem to be solved

[0008] Therefore, it is desirable to provide methods and devices that at least partially address the aforementioned technical challenges and at least substantially avoid the drawbacks of known methods and devices.

[0009] Specifically, an objective of this invention is to improve the detection efficiency of spectrometer equipment. Another objective of this invention is to improve the signal-to-noise ratio of the spectrometer equipment. Yet another objective of this invention is to generate detector signals from multiple photosensitive elements, which are equivalent to each other in a manner independent of the geometry of the optical paths of the different photosensitive elements. A further objective of this invention is to increase the dynamic range of the spectrometer equipment. Yet another objective of this invention is to improve spectral contrast and / or reduce stray light. Summary of the Invention

[0010] This problem is specifically addressed by the spectrometer apparatus, mobile device, and method for operating the spectrometer apparatus to obtain at least one spectral information item, as described in the features of the independent claims. Advantageous embodiments that can be implemented independently or in any arbitrary combination are set forth in the dependent claims and throughout the specification.

[0011] In a first aspect, a spectrometer apparatus is disclosed for obtaining at least one spectral information item about at least one object by means of spectral measurement. For this aspect, reference may be made to any definitions, embodiments, claims, and / or aspects as disclosed herein.

[0012] As used herein, the term "spectrometer device" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, an optical device configured to acquire at least one spectral information item with respect to at least one object. Specifically, at least one spectral information item may refer to at least one optical characteristic or optically measurable characteristic determined as a function of wavelength for one or more different wavelengths. More specifically, the optical characteristic or optically measurable characteristic and at least one spectral information item may relate to at least one characteristic characterizing at least one of transmission, absorption, reflection, and emission of at least one object itself or after exposure to external light. At least one optical characteristic may be determined for one or more wavelengths. The spectrometer device may specifically be configured to record signal strength with respect to corresponding wavelengths or partitions (e.g., wavelength intervals) of the spectrum, wherein the signal strength may specifically be provided as an electrical signal that can be used for further evaluation.

[0013] As used herein, the term "spectral information" (also referred to as "spectral information" or "spectral information item") is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, information items relating to, at least one object and / or radiation emitted by, at least one object, characterizing at least one optical property of that object, and more specifically, characterizing, for example, at least one information item qualitatively and / or quantitatively representing, at least one of the transmission, absorption, reflection, and emission of that at least one object. As an example, at least one spectral information item may include at least one intensity information, such as information regarding the intensity of at least one type of light transmitted, absorbed, reflected, or emitted by the object, the intensity being, for example, a function of wavelength or a subrange of wavelength within one or more wavelengths (e.g., within a wavelength range). Specifically, the intensity information may correspond to, or be derived from, a signal intensity (specifically an electrical signal) recorded by a spectrometer device in relation to the wavelength or wavelength range of the spectrum.

[0014] An “object” can generally be any entity selected from living and inanimate objects. Thus, as an example, at least one object can include one or more items and / or one or more parts of items, wherein at least one item or at least one part thereof can include at least one component that can provide a spectrum suitable for the study. Additionally or alternatively, an object can be or can include one or more organisms and / or one or more parts thereof, such as one or more body parts of a human (e.g., a user) and / or an animal.

[0015] An object can be placed on the measurement surface of the sample interface. Multiple photosensitive elements, specifically at least two and at least two additional photosensitive elements, receive detection light from the object placed on the measurement surface of the sample interface. The only necessary measurement condition for determining the corresponding angular distribution is the manner in which the object scatters light such that multiple photosensitive elements, specifically at least two and at least two additional photosensitive elements, receive detection light from the object. The scattering characteristics of the object can be described by a Lambertian scattering model, a Gaussian scattering model, an ABg scattering model, or other scattering models.

[0016] The spectrometer equipment includes:

[0017] (1) At least one sample interface, wherein the sample interface defines a measurement surface, wherein the measurement surface is configured to define the measurement orientation of the object, particularly during the spectral measurement, wherein the measurement surface further defines an xy plane and thereby defines the x-axis and y-axis;

[0018] (2) At least one light-emitting element, wherein the light-emitting element is configured to emit illumination light onto the at least one object in order to generate detection light from the at least one object;

[0019] (3) At least one detector, wherein the detector comprises a plurality of photosensitive elements, wherein each of the photosensitive elements is configured to generate at least one detector signal when the detection light is received from the object, so as to obtain the spectral information item;

[0020] The spectrometer is configured such that the detection light received by at least two of the plurality of photosensitive elements each exhibits an angular distribution on the sample interface. The at least two photosensitive elements are distributed at at least two angles. They overlap at least partially, where, It is an index pointing to a specific photosensitive element, particularly a specific photosensitive element among the at least two photosensitive elements, wherein, It is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the xz plane and the projection of the normal to the measurement surface onto the xz plane, where, It is the angle between the projection of the specified ray of light, described by the corresponding angular distribution, onto the yz plane and the projection of the normal on the measurement surface onto the yz plane.

[0021] As already disclosed, the spectrometer includes at least one sample interface, wherein the sample interface defines a measurement surface, wherein the measurement surface is configured to define the measurement orientation of the object, particularly during the spectral measurement, wherein the measurement surface further defines an xy plane, and thereby defines the x-axis and y-axis.

[0022] As used herein, the term "sample interface" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, any surface, such as a "measuring surface," at which an object is intended to interact with an optical measurement system (e.g., a spectrometer device). The measuring surface may be a measuring plane. To interact with the object, the spectrometer device may emit illumination light, particularly in a manner that causes the object to generate detection light. Additionally, the spectrometer may receive detection light. In particular, to allow for the intended interaction with the object, the sample interface may define the measurement posture of the object. When the object is in a measurement posture, particularly as defined by the sample interface, the object receives illumination light and thereby generates detection light in a intended manner (e.g., as intended when the object is in a measurement posture). Alternatively or additionally, when the object is in a measurement posture, particularly as defined by the sample interface, the signal-to-noise ratio of the spectrometer device is minimized.

[0023] To define the x and y axes, the sample interface can define the measurement surface, particularly the measurement surface between the object and the spectrometer equipment intended to interact. The measurement surface can define the xy plane, and thus define the x and y axes.

[0024] The sample interface can be an abstract element and may not require structural features, such as when the sample interface is a region within the environment of the spectrometer device. Alternatively, the device window of the spectrometer device, particularly the outer surface of the device window, can be used as the sample interface.

[0025] Furthermore, the spectrometer may include a spectrometer window through which detection light and illumination light are transmitted. As used herein, the term "spectrometer window" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, any optically transparent window included in the spectrometer device. The spectrometer window may be positioned in the beam path of the illumination light and / or detection light. Typically, the spectrometer window may have a transparency coefficient (also known as a transmittance coefficient) greater than 90%, preferably greater than 95%, particularly for light within a specific wavelength range. Alternatively or additionally, light outside this specific wavelength range may be suppressed due to a transmittance coefficient less than 10% or less than 5%.

[0026] A spectrometer window may be disposed within the housing of the spectrometer device. Alternatively or additionally, the spectrometer window may form a closure of the spectrometer device. In particular, the spectrometer window may include an outer surface that directly faces the exterior of the spectrometer device. The outer surface of the spectrometer window may be in contact with the surrounding environment, particularly where the surrounding environment is not contained and / or enclosed by the spectrometer device, such as not being enclosed by the housing of the spectrometer device. The spectrometer window may include an inner surface facing the interior of the spectrometer device. The outer surface may be opposite to the inner surface. The inner surface of the spectrometer window may be in contact with a closed environment within the spectrometer device, particularly where the closed environment within the spectrometer device is enclosed by the housing of the spectrometer device. The closed environment within the spectrometer device may include components of the spectrometer device and / or gases contained within the spectrometer device. These components may be selected from at least one of the following: an optical system for illuminating and / or detecting light; one or more electro-optical components, such as a dispersive element, a light source, and / or a detector. The gas may be selected from at least one of the following: ambient gases, such as atmospheric gases. The gas may be dried, particularly by using a drying cylinder, and / or the gas may be in a gel-like state. Alternatively or additionally, the gas may not be dried. Further alternatively or additionally, it may be possible to fill the spectrometer apparatus with nitrogen and / or one or more rare gases. The outer surface may be configured to contact the object during spectroscopic measurements and thereby serve as the sample interface.

[0027] As used herein, the term "measurement posture" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. Specifically, the term may refer to, but is not limited to, the relative position and / or orientation of an object relative to a sample interface, which is intended to be presented during spectroscopic measurements, particularly allowing the spectrometer apparatus and the object to interact as intended, such as as the setup and / or arrangement of the spectrometer apparatus's components are intended.

[0028] As already disclosed, the spectrometer includes at least one light-emitting element, wherein the light-emitting element is configured to emit illumination light onto at least one object in order to generate detection light from at least one object.

[0029] As used herein, the term "light" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom-defined meaning. Specifically, the term may refer to, but is not limited to, electromagnetic radiation in one or more of the infrared, visible, and ultraviolet spectral ranges. In this document, the term "ultraviolet spectral range" generally refers to electromagnetic radiation with wavelengths from 1 nm to 380 nm, preferably from 100 nm to 380 nm. Further, in part according to the effective version of standard ISO-21348 as of the date of this document, the term "visible spectral range" generally refers to the spectral range from 380 nm to 760 nm. The term "infrared spectral range" (IR) generally refers to electromagnetic radiation from 760 nm to 1000 µm, wherein the range from 760 nm to 1.5 µm is generally referred to as the "near-infrared spectral range" (NIR), the range from 1.5 µm to 15 µm is referred to as the "mid-infrared spectral range" (MidIR), and the range from 15 µm to 1000 µm is referred to as the "far-infrared spectral range" (FIR). Preferably, the light used for the typical purposes of this invention is light in the infrared (IR) spectral range, more preferably light in the near-infrared (NIR) and / or mid-infrared (MidIR) spectral range, especially light with wavelengths of 1 µm to 5 µm, preferably 1 µm to 3 µm. This is because the material properties or characteristics relating to the chemical composition of many objects can be obtained from the near-infrared spectral range. However, it should be noted that spectral analysis in other spectral ranges is also applicable and within the scope of this invention.

[0030] Therefore, as used herein, the term "light-emitting element" (also known as "illuminant") is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any device configured to generate or provide light (specifically, "illuminant" in the sense defined above in the term "light"). A light-emitting element may specifically be, or may include, at least one electric light source.

[0031] As further used herein, the term "detection light" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, light generated by an object, particularly light generated in the interaction of the illuminating light with the object (e.g., scattering, reflection, and / or transmission). Detection light may be illuminating light reflected and / or scattered back to at least one detector through a sample interface. At least a portion of the illuminating light may be transmitted and / or absorbed by the object, such that it is not detected by at least one detector.

[0032] The light-emitting element can be a thermal radiator. A thermal radiator can be selected from incandescent lamps or thermal infrared emitters. As used herein, the term "incandescent lamp" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom-defined meaning. Specifically, the term can refer to, but is not limited to, an electric lamp having a heatable element (such as a heated filament) capable of being heated to the temperature of its emitted light, particularly infrared light. Therefore, an incandescent lamp can be considered a thermal emitter in the infrared spectral range, and thus the emission power of an incandescent lamp decreases with increasing wavelength. A thermal radiator can be selected from incandescent lamps or thermal infrared emitters. As used herein, the term "thermal infrared emitter" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom-defined meaning. Specifically, the term can refer to, but is not limited to, a micromachining thermal emitting device comprising a radiative emitting surface that emits light radiation to be monitored as a light-emitting element.

[0033] Alternatively or additionally, the light-emitting element may be a microelectromechanical system (MEMS) based emitter. As used herein, the term "microelectromechanical system (MEMS) based emitter" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any device configured to generate and / or emit light, comprising at least one element, wherein the element is associated with MEMS technology. MEMS technology typically involves fabricating mechanical and / or electrical components at a microscale, typically below 1 µm or 100 µm or 1 mm or 5 mm or 50 mm. Alternatively or additionally, the light-emitting element may be a laser, specifically a vertical-cavity surface-emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region.

[0034] As used herein, the term "vertical-cavity surface-emitting laser" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. The term may specifically refer to, but is not limited to, a semiconductor laser diode configured to emit a laser beam perpendicularly to its top surface. VCSELs are generally known to those skilled in the art, for example, from WO 2017 / 222618 A.

[0035] Alternatively or additionally, the radiating element may be a light-emitting diode (LED), specifically an LED that emits light at least partially within the infrared spectral range. Alternatively or additionally, the LED emits light that illuminates a luminescent material, specifically a phosphor, for converting the light generated by the LED, wherein the luminescent material generates converted light at least partially within the near-infrared spectral range.

[0036] As used herein, the term "light-emitting diode" or simply "LED" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, optoelectronic semiconductor devices capable of emitting light when an electric current flows through them. Optoelectronic semiconductor devices can be configured to generate light due to one or more of various physical processes, including spontaneous emission, induced emission, decay of metastable excited states, etc. Thus, by way of example, a light-emitting diode may include one or more of the following: a light-emitting diode based on spontaneous emission (particularly an organic light-emitting diode), a superluminescent light-emitting diode (sLED), or a laser diode (LD). In the following, without reducing possible embodiments of a light-emitting diode to any of the foregoing physical principles or configurations, the abbreviation "LED" will be used for any type of light-emitting diode.

[0037] Specifically, an LED may comprise at least two semiconductor material layers, wherein light can be generated at at least one interface between the at least two semiconductor material layers, specifically due to the recombination of positive and negative charges (e.g., electron-hole recombination). The at least two semiconductor material layers may have different electrical properties; for example, at least one of these layers may be an n-doped semiconductor material, and at least one of these layers may be a p-doped semiconductor material. Therefore, as an example, an LED may comprise at least one pn junction and / or at least one pin structure. However, it should be noted that other device structures are also feasible. At least one semiconductor material may specifically be or may comprise at least one inorganic semiconductor material. However, it should be noted that organic semiconductor materials may be used additionally or alternatively.

[0038] Typically, an LED converts electrical current into light, specifically light that is at least partially located in the infrared spectrum. Alternatively or additionally, an LED can convert electrical current into light, specifically primary light, and more specifically, blue primary light. Therefore, an LED can specifically be a blue LED. LEDs can be configured to generate primary light, particularly for light conversion in phosphors, also known as "pump light." Therefore, an LED can also be called a "pumped LED." An LED can specifically include at least one LED chip and / or at least one LED die. Therefore, the semiconductor element of an LED can include a bare LED chip.

[0039] As used herein, the term "luminescence" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, the process by which a substance spontaneously emits light not caused by heat. Specifically, luminescence may refer to cold body radiation. More specifically, luminescence can be initiated or excited by irradiation with light, in which case it is also referred to as "photoluminescence." In the context of this invention, the property of a material capable of luminescence is referred to by the adjective "luminescent." At least one luminescent material may specifically be a photoluminescent material, i.e., a material capable of emitting light after absorbing photons or excitation light. Specifically, the luminescent material may have a positive Stokes shift, which generally refers to the fact that secondary light is redshifted relative to primary light.

[0040] Therefore, at least one luminescent material can form at least one transducer (also known as a light transducer) that converts primary light into secondary light with different spectral characteristics compared to the primary light. Specifically, the spectral width of the secondary light can be greater than that of the primary light, and / or the emission center of the secondary light can be shifted (specifically, redshifted). Specifically, at least one luminescent material can be absorbent in the ultraviolet and / or blue spectral range and emissive in the near-infrared and / or infrared spectral range. Therefore, typically, the luminescent material or transducer can form at least one component of a phosphor LED that focuses primary light or pump light, particularly in the blue spectral range, into light with a longer wavelength, for example, in the near-infrared or infrared spectral range.

[0041] Therefore, the luminescent material can specifically form at least one transducer or light converter. The luminescent material can form at least one of a conversion sheet, a light-emitting coating (specifically a phosphor coating) on ​​an LED, and a phosphor coating on an LED. As an example, the luminescent material may include one or more of the following materials: cerium-doped YAG (YAG:Ce 3+ or Y3Al5O 12 :Ce 3+); doped with rare earth Sialon; copper and aluminum co-doped with zinc sulfide (ZnS:Cu,Al).

[0042] LEDs and light-emitting materials together can form what are known as “phosphor LEDs.” Therefore, as used herein, the term “phosphor light-emitting diode” or simply “phosphor LED” is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to any particular or custom meaning. Specifically, the term can refer to, but is not limited to, a combination of at least one light-emitting diode configured to generate primary light or pump light and at least one light-emitting material (also referred to as a “phosphor”) configured to convert the primary light generated by the light-emitting diode. Phosphor LEDs can form packaged LED light sources comprising an LED die (e.g., a blue LED emitting blue pump light) and a phosphor, for example, which is wholly or partially coated on the LED and, by way of example, configured to convert primary light or blue light into light with different spectral characteristics (specifically, into near-infrared light). Typically, phosphor LEDs can be packaged in a housing or can be unpackaged. Therefore, the LED and the at least one light-emitting material for converting the primary light generated by the light-emitting diode can be specifically housed in a common housing. However, alternatively, LEDs can also be unencapsulated or bare LEDs, which can be completely or partially covered with light-emitting material, for example, by setting one or more layers of light-emitting material on the LED die. Phosphor LEDs can typically form the emitter or light source themselves.

[0043] The irradiation light may have a spectral range that is at least partially located in the near-infrared spectral range, specifically in the spectral range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0044] The light-emitting element can be configured to illuminate a defined illumination area on the sample interface. Specifically, the light-emitting element can thus define the sample interface. Optical elements and / or additional optical elements can be configured to guide the illumination light from the light-emitting element toward the sample interface. Specifically, the optical elements and / or additional optical elements can thus define the illumination area.

[0045] As already disclosed, the spectrometer includes at least one detector, wherein the detector includes a plurality of photosensitive elements, each of which is configured to generate at least one detector signal when the detection light is received from the object in order to obtain the spectral information item.

[0046] As used herein, the verb “detect” is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, the process of qualitatively and / or quantitatively determining, measuring, and monitoring at least one of at least one parameters (e.g., at least one of physical, chemical, and biological parameters). Specifically, physical parameters may be or may include electrical parameters. Therefore, as used herein, the term “photosensitive detector” or “detector” is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any device configured to qualitatively and / or quantitatively detect (i.e., determine, measure, and monitor at least one of) at least one parameter (e.g., at least one of physical, chemical, and biological parameters). At least one detector may be configured to generate at least one detector signal, more specifically at least one electrical detector signal, such as an analog and / or digital detector signal, which provides information about at least one parameter measured by the detector. The detector signal can be provided to the evaluation unit directly or indirectly by at least one detector, such that at least one detector and the evaluation unit can be directly or indirectly connected. The detector signal can be used as a "raw" detector signal and / or can be processed or preprocessed (e.g., by filtering) before further use. Therefore, at least one detector can include at least one processing device and / or at least one preprocessing device, such as at least one of an amplifier, an analog-to-digital converter, an electrical filter, and a Fourier transform.

[0047] At least one detector can be configured to detect light propagating from an object to a spectrometer device, or more specifically, to at least one detector within the spectrometer device. At least one detector can be configured to determine at least one optical parameter, such as the intensity and / or power of light irradiating at least one sensitive region of the detector. More specifically, at least one detector may include at least one photosensitive element and / or at least one optical sensor, such as at least one of a photodiode, photovoltaic cell, photoresistor, phototransistor, thermopile sensor, photoacoustic sensor, pyroelectric sensor, photomultiplier, and calorimeter. Therefore, at least one detector can be configured to generate at least one detector signal, more specifically, at least one electrical detector signal in the foregoing sense, which provides information about at least one optical parameter (e.g., the power and / or intensity of light irradiating the detector or a sensitive region of the detector). At least one detector may be a lead sulfide (PbS) detector.

[0048] The detector may include multiple photosensitive elements, each of which can be configured to generate at least one detector signal to obtain spectral information. The multiple photosensitive elements may be arranged in an array. As used herein, the term "array" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a series of optical sensors that may preferably be arranged as a one-dimensional matrix along the length of a variable-length filter in a single line, or arranged in more than one line, particularly two, three, or four parallel lines, especially in the form of a two-dimensional matrix, in order to receive as much of the intensity of the incident light as possible. Thus, the number of photosensitive elements N in one direction can be higher than the number of photosensitive elements M in another direction, such that a one-dimensional 1 x N matrix or a rectangular two-dimensional M x N matrix can be obtained, where M < 10 and N ≥ 10, preferably N ≥ 20, more preferably N ≥ 50. Alternatively, the matrix may also be arranged in a staggered arrangement.

[0049] Multiple photosensitive elements can be sensitive to different, and particularly non-overlapping, wavelength ranges. Specifically, a first photosensitive element can detect light within a first wavelength range, and a second photosensitive element can detect light within a second wavelength range, wherein the first and second wavelength ranges are different from each other, particularly in a manner that their wavelength ranges do not overlap. A third photosensitive element, etc., with another different, and particularly non-overlapping, wavelength range may also exist.

[0050] Alternatively or additionally, multiple photosensitive elements may each have a field of view, wherein optical elements and / or additional optical elements may be configured to modify the field of view of at least one photosensitive element in order to increase at least one overlap between at least two fields of view of the multiple photosensitive elements.

[0051] As used herein, the term "field of view" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, the geometric extent of the observable world that can be observed by a corresponding sensor (e.g., a photosensitive element). In particular, the field of view of a photosensitive element may correspond to a solid angle at which the corresponding sensor is sensitive to light (specifically, detection light) generated by at least one object or a portion thereof.

[0052] As used herein, the term "modify" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, altering and / or adjusting at least one characteristic or property of something by influencing at least one characteristic or property. As used herein, the term "increase at least one overlap between fields of view" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, expanding the absolute amount and / or proportion of a three-dimensional space simultaneously or in parallel covered by the fields of view of at least two photosensitive elements, particularly at the sample interface. At least one optical element may be configured to modify the field of view of each of at least two pixelated sensors to increase at least one overlap between the fields of view, particularly in the same manner.

[0053] Each photosensitive element may have a measurement spot on the sample interface, wherein increasing the overlap between at least two fields of view of the plurality of photosensitive elements can cause an increase in at least one overlapping region of the measurement spots on the sample interface, which include at least two fields of view. As used herein, the term "measurement spot" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a surface on the sample interface generated by the field of view from which a corresponding pixelated sensor can detect light.

[0054] The measurement spot can be an imaging spot encompassed by the imaging plane. Specifically, the detector can therefore be configured to have an imaging plane for receiving detection light from the sample interface. Optical elements and / or additional optical elements can be configured to guide and / or focus the detector's imaging plane onto the sample interface.

[0055] On the sample interface, the ratio between at least one overlapping region of a measurement spot including at least two fields of view and the combined region of a measurement spot including at least two fields of view can be at least 60%, 70%, 80% or 90%.

[0056] As already disclosed, the spectrometer is configured such that the detection light received by at least two of the plurality of photosensitive elements each exhibits an angular distribution on the sample interface. In which at least two photosensitive elements are distributed at at least two angles. They overlap at least partially, where, It is an index pointing to a specific photosensitive element, particularly a specific photosensitive element among at least two photosensitive elements. A corresponding angular distribution can be formed to configure the spectrometer equipment.

[0057] The spectrometer is further configured such that the detection light received by at least two of the multiple photosensitive elements each exhibits a different angular distribution at the sample interface. At least two additional photosensitive elements with at least two additional angular distributions. At least partially overlapping. It should be noted that the term "at least two additional photosensitive elements" means that the at least two additional photosensitive elements are supplementary photosensitive elements. Therefore, a spectrometer device may include at least four photosensitive elements, particularly when the spectrometer device includes at least two photosensitive elements and at least two additional photosensitive elements. This definition can be applied correspondingly to various other contexts.

[0058] It is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the xz-plane and the projection of the normal to the measurement surface onto the xz-plane, where, The angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the yz-plane and the projection of the normal to the measurement surface onto the yz-plane. The normal to the measurement surface can be the normal to the xy-plane defined by the measurement surface. The normal to the measurement surface can be parallel to the z-axis. Before projecting the corresponding ray onto the corresponding plane, a vector describing the ray can be specified such that the z-component of the vector has a length of 1. The specified ray can pass through... To describe it. Before projecting the corresponding normal on the measurement surface onto the corresponding plane, the vector describing the normal can be specified such that the z-component of the vector has a length of 1. The normal can be specified by... To describe.

[0059] The incident light can have an angular distribution at the sample interface. This angular distribution causes the angular distribution of specular Fresnel reflections on the sample interface. The detection light received by the detector has an angular distribution on the sample interface. .

[0060] It can be the angle of the irradiating light on the sample interface. The two-dimensional distribution. The angle of the reflected light could be due to specular Fresnel reflection at the sample interface. The two-dimensional distribution. It can detect the angle of light at the sample interface. The sample has a two-dimensional distribution. The sample interface can be the measurement surface.

[0061] The light described by the corresponding distribution can be any of the following:

[0062] For angle distribution The irradiation light;

[0063] For angle distribution The mirror Fresnel reflection of light;

[0064] For angle distribution Detection light

[0065] As already discussed, the x-axis and y-axis are defined by the sample interface, specifically by a surface, particularly a surface that serves as the sample interface (such as a measurement surface), at which the object is intended to interact with the spectrometer equipment.

[0066] As used herein, the term "spectral Fresnel reflection" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom-defined meaning. Specifically, the term may refer to, but is not limited to, specular reflection from a surface, particularly the surface of an object. For specular Fresnel reflection, the angle of incidence, particularly the normal to the surface, and the angle of incidence of the light ray incident on the surface, are equal to the angle of reflection, particularly the angle of reflection of the normal to the surface and the light ray reflected from the surface. Typically, specular Fresnel reflection from an object does not contain spectral information about the object.

[0067] As used herein, the term "detection light received by at least two photosensitive elements" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, detection light incident on at least two photosensitive elements that generates a detector signal from which spectral information terms can be obtained. Detection light received by at least two photosensitive elements may be incident on at least one photosensitive element of the detector. Therefore, in particular, detection light received by the detector may be generated within the field of view of at least one photosensitive element. [The text then abruptly shifts to a seemingly unrelated topic:] ...by a specific photosensitive element... The received detection light can have an angular distribution. This definition applies accordingly to the term "detection light received by the detector" or any of its grammatical variations. Detection light received by the detector can be detection light received by any of the photosensitive elements of the detector. Detection light received by the detector, and thus by any of the photosensitive elements of the detector, can have an angular distribution at the sample interface. .

[0068] As used herein, the term "overlap" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a state in which multiple structural objects and / or abstract elements share at least one common feature, such that the multiple objects and / or elements are not completely separated from each other. In this sense, the term "separation" can be considered the opposite of the term "overlap." It should be understood that by considering the measure of overlap, those skilled in the art will readily derive a corresponding measure of separation, and vice versa.

[0069] At least two angular distributions of at least two photosensitive elements The at least partial overlap can cause at least two angular distributions of at least two photosensitive elements. At least partially overlapping. At least two other photosensitive elements with at least two other angular distributions. The at least partial overlap can cause at least two additional angular distributions of at least two other photosensitive elements. The other at least part overlaps.

[0070] It is the angle between the light ray and the normal to the sample interface, described by the corresponding angular distribution. This can be achieved by considering... From the same photosensitive element Related angular distribution Obtain the angle distribution .

[0071] By considering For each angle in space The angular distribution of at least two photosensitive elements is normalized using the corresponding radiation intensity. And thus generate a normalized angular distribution. By considering For each angle in space The other corresponding radiation intensity is used to normalize the other angular distribution of at least two other photosensitive elements. This generates another normalized angular distribution. .

[0072] By considering the following function from the angular distribution Obtain the standardized angular distribution :

[0073] .

[0074] To achieve at least two angular distributions of at least two photosensitive elements At least partially overlapping, at least two normalized angular distributions The overlap is at least 70%, 80%, 90%, or 95%. This is to ensure at least two additional angular distributions of at least two additional photosensitive elements. They at least partially overlap, with at least two additional normalized angular distributions. The overlap must be at least 70%, 80%, 90%, or 95%.

[0075] With two specific photosensitive elements The two related angular distributions Overlap And / or with two specific additional photosensitive elements The two related angular distributions Overlap This can be obtained by using the following function:

[0076] .

[0077] With two specific photosensitive elements The two related angular distributions Overlap And / or with two specific additional photosensitive elements The two related angular distributions Overlap It can be obtained through at least one of the following:

[0078] At least two angular distributions are obtained. and Among them, by considering From the same photosensitive element Related angular distribution Obtain the angle distribution ;

[0079] At least two standardized angular distributions were obtained. and , where the distribution from this angle is considered by the following function. get :

[0080] ;

[0081] Overlap can be obtained by using the following function :

[0082] .

[0083] At least two photosensitive elements can be sensitive to different wavelength ranges, wherein these different wavelength ranges are assigned to at least one contrast pair in the spectral information of the object, specifically an absorbance contrast pair. At least two additional photosensitive elements can be sensitive to other different wavelength ranges, wherein these other different wavelength ranges are assigned to at least one additional contrast pair in the spectral information of the object, specifically an absorbance contrast pair.

[0084] As used herein, the term "contrast pair" (or any grammatical variation thereof) is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, a pair of features and / or characteristics, particularly features and / or characteristics exemplarily obtained from an object, included in spectral information. A feature may be at least one of the object's baseline, reference point, or spectral characteristics. A typical contrast pair including two spectral features may be lactic acid and sugar, or acetone and esters, or multiple amino acids, etc. A characteristic may be at least one of the following: the intensity of a particular feature, a reflectance value, or an absorbance value. The multiple spectral features and / or multiple spectral characteristics are identifiable in a way that makes them distinct. When evaluating a spectral information item that includes information about the multiple spectral features and / or multiple spectral characteristics to obtain at least one object information item, the multiple spectral features and / or multiple spectral characteristics may be compared to each other. To compare multiple spectral features and / or multiple spectral characteristics, a specific spectral feature and / or a specific spectral characteristic may be compared to a specific spectral feature and / or a specific spectrum. The obtained at least one “object information item” may include information about at least one of the following: the characteristics of the object, especially meta-information about the object (such as the material of the object); chemical composition, density, impurities.

[0085] The spectrometer is configured to distribute at least two angles of at least two photosensitive elements. and at least two other angular distributions of at least two other photosensitive elements. At least partially separated.

[0086] In order to configure the spectrometer device for at least two angular distributions of at least two photosensitive elements. and at least two other angular distributions of at least two other photosensitive elements. At least partially separated, distributed at two angles. At least one angular distribution in and at least two other angular distributions At least one other angular distribution The overlap is less than 70%, 60%, 50%, 40%, 30%, 20%, and 10%.

[0087] Two angular distributions At least one angular distribution in With at least two other angular distributions At least one other angular distribution Overlap It can be obtained through at least one of the following:

[0088] At least two angular distributions are obtained. and Among them, by considering From the same photosensitive element Related angular distribution Obtain the angle distribution ;

[0089] At least two standardized angular distributions were obtained. and , where the distribution from this angle is considered by the following function. get :

[0090] ;

[0091] Overlap can be obtained by using the following function :

[0092] .

[0093] As already disclosed, the incident illumination light exhibits an angular distribution on the sample interface. This angular distribution causes the angular distribution of specular Fresnel reflections on the sample interface. In this process, the detection light received by the detector, specifically by any one of the photosensitive elements, exhibits an angular distribution on the sample interface. It can make Established. Spectrometer equipment can be configured to achieve angular distribution. and angular distribution At least partially separated. A corresponding angular distribution can be formed to configure the spectrometer equipment. As already disclosed, this is achieved by specific photosensitive elements. The received detection light can have an angular distribution. Conversely, the detection light received by the detector, and thus by any of the photosensitive elements of the detector, can have an angular distribution at the sample interface. .

[0094] In order to configure the spectrometer equipment for angular distribution and angular distribution At least separate, angular distribution With angular distribution The overlap can be less than 50%, 40%, 30%, 20%, 10%, or 0%. The spectrometer equipment can be configured to achieve angular distribution. and angular distribution Completely separated.

[0095] Angular distribution and angular distribution Overlap It can be obtained through the following:

[0096] .

[0097] In particular, to configure the spectrometer device to form at least one corresponding angular distribution, the spectrometer device may include at least one optical element disposed in at least one of the following: the beam path of the illuminating light; and the beam path of the detection light. The corresponding optical element may modify at least one of the following: angular distribution. ; angular distribution ; Angular distribution of detectors ; angular distribution of at least two photosensitive elements At least one angular distribution in; angular distribution of at least two photosensitive elements At least one angular distribution in it.

[0098] As used herein, the term "optical element" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any unit that interacts with light in such a way that it modifies the direction of propagation of at least a portion of the light and / or ray and / or beam of light, such as by guiding the path of light. Alternatively or additionally, an optical element may interact with incident light by at least one of the following: reflection, scattering absorption, refraction (e.g., lens), diffraction (e.g., grating), birefringence (e.g., waveplate), dispersion (e.g., prism). In particular, thereby, an optical element may modify at least one of the following: the intensity, phase, polarization, and direction of light.

[0099] Optical elements may be or may include one or more optical mirrors. As used herein, the term "optical mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, an optical unit having a reflective surface for reflecting at least a portion of light incident on it. An optical mirror may reflect at least 5% of the radiation incident on it. Furthermore, typically, an optical mirror may preferably reflect at least 50%, or more preferably at least 90%, of the light incident on it. An optical mirror may be of a type selected from at least one of the following: a dielectric mirror, particularly a distributed Bragg mirror; or a metallized mirror, particularly metallized with gold, silver, and / or aluminum. The substrate of the mirror may include at least one inorganic material and / or at least one organic material, particularly plastic and / or glass.

[0100] One or more optical mirrors can be at least one of the following: one or more plane mirrors; one or more imaging mirrors. As used herein, the term "plane mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. The term may specifically refer to, but is not limited to, a mirror having a planar reflective surface. A plane mirror may have a flat reflective surface. A plane mirror can reflect incident light, specifically incident light rays or beams, in a manner such that the direction of the reflected light does not depend on the position of the light incident on the plane mirror. When incident radiation is reflected by a plane mirror, the width of the beam of light produced by the incident radiation can remain constant.

[0101] As used herein, the term "imaging mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a mirror having a reflective surface formed such that incident light, specifically an incident ray or beam, is focused at at least one focal point provided by the imaging mirror. The imaging mirror can reflect incident light in such a way that the direction of the reflected light depends on the position of the incident light on the plane mirror. The imaging mirror can be a concave mirror and / or a convex mirror.

[0102] One or more imaging mirrors can be at least one of the following: one or more curved mirrors; one or more freeform mirrors. As used herein, the term "curved mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, a mirror having a curved reflective surface. A curved mirror may have a reflective surface that is at least partially curved, specifically a reflective surface that is at least partially concave and / or convex. As used herein, the term "freeform mirror" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, a mirror having a surface that can be described using a polynomial function.

[0103] Alternatively or additionally, the optical elements may be or may include: one or more optical lenses; and / or one or more active optical elements, specifically one or more micromirror arrays; and / or one or more beam splitters.

[0104] As used herein, the term "optical lens" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, a transparent unit having at least one curved surface, particularly a surface curved in a spherical manner. Incident light, specifically an incident ray or beam, may be deflected at at least one surface of the optical lens, the deflection depending in particular on at least one of the following: the refractive index of the optical lens, and the wavelength of the incident radiation. The incident light (e.g., a ray) may be deflected toward the center of the beam comprising the ray. Alternatively, the incident light (e.g., a ray) may be deflected away from the center of the beam comprising the ray. The optical lens may have a convex surface for focusing the incident light and / or a concave surface for diverging the incident light.

[0105] As used herein, the term "active optical element" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, an optical element having at least two controllable optical properties. Active optical elements can be configured to make the two controllable optical properties switchable, for example, by using a switching unit included in a spectrometer device. Typical active optical elements may be micromirror arrays, liquid crystal arrays, and / or spatial light modulators (SLMs).

[0106] As used herein, the term "beam splitter" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, an optical element configured to split a light beam into at least one transmitted beam and at least one reflected beam. The transmitted beam and at least one reflected beam may be directed in different directions.

[0107] The spectrometer device may further include at least one evaluation unit, wherein the evaluation unit is configured to evaluate the detector signal to obtain spectral information items about the object.

[0108] As used herein, the term "evaluation" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, a process of processing at least one first information item to generate at least one second information item. Therefore, as used herein, the term "evaluation unit" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any device or combination of devices configured to evaluate or process at least one first information item to generate at least one second information item thereof. Therefore, specifically, an evaluation unit may be configured to process at least one input signal and generate at least one output signal thereof. As an example, at least one input signal may include at least one detector signal provided directly or indirectly by at least one photodetector.

[0109] As an example, the evaluation unit may be or may include one or more integrated circuits (such as one or more application-specific integrated circuits (ASICs)) and / or one or more data processing devices (such as one or more of a computer, digital signal processor (DSP), or field-programmable gate array (FPGA), preferably one or more microcomputers and / or microcontrollers. Additional components may be included, such as one or more preprocessing devices and / or data acquisition devices, such as one or more devices for receiving and / or preprocessing detector signals, such as one or more AD converters and / or one or more filters. Further, the evaluation unit may include one or more data storage devices. Further, the evaluation unit may include one or more interfaces, such as one or more wireless interfaces and / or one or more wired interfaces.

[0110] The evaluation unit can be further configured to obtain spectral information terms in such a way that the spectral information terms are distributed over at least one angle of the corresponding photosensitive element. The analysis process involves evaluating the detector signals of these photosensitive elements to obtain spectral information.

[0111] As used herein, the term "for at least one angular distribution" "Analysis" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any specific or custom meaning. Specifically, the term may refer to, but is not limited to, the angular distribution of spectral information items. The fact that characteristics are decomposed and / or distinguished.

[0112] For example, the spectral information item includes the angular distribution shown from the evaluation. In the case of information obtained from at least one detector signal of at least one detector, regarding the angular distribution Information items can be assigned to the spectral information items. The spectral information items include information derived from the evaluation of the angular distribution exhibited. In the case of information obtained from the signal of at least one detector of multiple detectors, regarding these angular distributions Information items can be assigned to the spectral information items, which indicate the portion of the spectral information determined by the corresponding photosensitive element.

[0113] At least one comparison pair may be considered. The evaluation unit may be further configured to obtain object information about the object by evaluating the spectral information items assigned to at least one comparison pair. Refer to the definitions of the terms "comparison pair" and "object information item" above.

[0114] The spectrometer device may further include at least one wavelength selection element. The wavelength selection element may be configured in at least one of the following:

[0115] The path of the illuminating light beam; and

[0116] Detect the beam path of light.

[0117] The wavelength selection element can be configured and / or arranged such that at least one of the following can be exposed to detection light from a separate, specifically different spectral range from the object: at least two photosensitive elements; at least two additional photosensitive elements; or a plurality of photosensitive elements.

[0118] As used herein, the term "wavelength-selective element" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any optical element that interacts with different spectral portions of incident light in various ways, for example by having at least one wavelength-dependent optical property (such as at least one wavelength-dependent optical property selected from a list consisting of reflectivity, direction of reflection, refractivity, direction of refraction, absorption, transmission, and refractive index).

[0119] Wavelength selection elements can be configured such that each of the photodetectors can be exposed to detection light within the same spectral range. Wavelength selection elements can be selected from the group consisting of tunable wavelength selection elements and wavelength selection elements with a fixed transmission spectrum. As an example, by using a tunable wavelength selection element, different wavelength ranges can be selected sequentially, while by using a wavelength selection element with a fixed transmission spectrum, the selection of the wavelength range can be fixed but can depend on, for example, the detection position, thereby allowing, for example, different detectors and / or different photodetectors of the detectors to be exposed to light within different spectral ranges simultaneously in the beam path of the detection light.

[0120] Therefore, at least one wavelength selection element may include at least one of a filter, grating, prism, plasmonic filter, diffractive optical element, and metamaterial. More specifically, the spectrometer device may include at least one wavelength selection element disposed in the beam path of light from the object (i.e., disposed in the beam path of the detection light), wherein the wavelength selection element may be specifically configured such that each of the photodetectors is exposed to light from a separate spectral range from the object. As an example, a variable wavelength selection element may be used, the transmission of which depends on the position on the wavelength selection element, such that when the variable wavelength selection element is placed on top of the photodetector array, individual photodetectors are exposed to incident light (specifically, the detection light from the object) of different spectral ranges.

[0121] Wavelength selection elements can be selected from the group consisting of tunable wavelength selection elements and wavelength selection elements with fixed transmission spectra. Wavelength selection elements can be or can include at least one of the following: variable length filters; static filters; tunable filters, especially MEMS Fabry-Perot resonators; optical lenses; diffraction elements.

[0122] As used herein, the term "variable length filter" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, an optical filter comprising a plurality of individual filter elements, preferably a plurality of interferometric filter elements, which may be arranged particularly in a continuous arrangement. In this document, each filter element may form a bandpass on the receiving surface of the variable length filter, preferably continuously along a single dimension (generally referred to by the term "length") with respect to each spatial location on the filter. The variable center wavelength may be a linear function of the spatial location of each filter element; in this case, the variable length filter is generally referred to as a "linearly variable filter" or its abbreviation "LVF". However, other kinds of functions may also be applied to the relationship between the variable center wavelength and the spatial location on these individual filter elements. In this document, these individual filter elements may be located on a transparent substrate, which in particular may comprise at least one material that exhibits high optical transparency in the infrared (IR) spectral range, especially in the near-infrared (NIR) spectral range (described in more detail below), thereby enabling spectral characteristics that vary along the length of the filter, particularly continuously. Specifically, the length-variable filter can be a wedge-shaped filter, which can be adapted to carry at least one responsive coating on a transparent substrate, wherein the responsive coating can exhibit spatially variable properties, particularly spatially variable thickness. However, it is also feasible to include other materials or other types of length-variable filters that can exhibit additional spatially variable properties. At the normal incident angle of the incident light or beam, the passband of each filter element included in the length-variable filter can be a fraction of the center wavelength of the particular filter, typically a few percent.

[0123] As used herein, the term "static filter" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, optical filters that block and / or select, specifically by reflection and / or absorption, a predetermined wavelength range of light, particularly bandpass filters. This wavelength range may be fixed. A fixed wavelength length may be unchangeable and / or static. The optical characteristics of a static filter may not be time-varying.

[0124] As used herein, the term "tunable filter" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, an optical filter that blocks and / or selects a tunable wavelength range of light. The optical characteristics of a tunable filter can be time-varying. Interferometers can be used as tunable filters, specifically Fabry-Perot interferometers, Mach-Zehnder interferometers, and / or Michelson interferometers. Alternatively, an angle-dependent wavelength shift of a static filter can be utilized. This can be achieved using at least one microelectromechanical system (MEMS) where the moving part of the interferometer is implemented using microactuators.

[0125] As used herein, the term "diffractive element" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a particular or customary meaning. Specifically, the term may refer to, but is not limited to, articles used to shape incident radiation by causing it to diffract at an optical grating.

[0126] A variable-length filter may include at least two bandpass filters, wherein each bandpass filter can be assigned to a corresponding pixelated sensor by being arranged within the field of view of the corresponding pixelated sensor, and wherein each bandpass filter can be configured to select at least one wavelength of the received incident radiation. As used herein, the term "bandpass filter" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, an optical filter that allows only incident radiation having wavelengths within a predefined range to pass through. Incident radiation having wavelengths below and / or above the predefined range may be blocked or may be significantly attenuated. The selected at least one wavelength may be within a predefined range. The selected at least one wavelength may be transmitted to the corresponding pixelated sensor. As used herein, the term "assigned to a corresponding pixelated sensor" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, transmitting received incident radiation to the corresponding pixelated sensor. Therefore, at least two bandpass filters can be arranged such that each of the at least two bandpass filters is placed within the field of view of a different pixelated sensor.

[0127] The variable length filter may include at least two bandpass filters, wherein each bandpass filter may be arranged in the field of view of a particular photosensitive element, and wherein each bandpass filter may be configured to select at least one wavelength range of the detection light.

[0128] In another aspect, a mobile device is disclosed, wherein the mobile device includes a spectrometer device as disclosed elsewhere herein. For this aspect, reference may be made to any definitions, embodiments, claims, and / or aspects disclosed herein.

[0129] As used herein, the term "mobile device" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, mobile electronic devices, and more specifically, mobile communication devices configured to provide access to at least one telecommunications network (such as a mobile phone, smartphone, or wearable device). Mobile devices may be portable devices.

[0130] As used herein, the term "portable" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customized meaning. Specifically, the term may refer to, but is not limited to, the characteristic that at least one object can be moved by human power (e.g., by a single user). Specifically, the weight of an object characterized by the term "portable" may not exceed 10 kg, specifically not more than 5 kg, more specifically not more than 1 kg, or even not more than 500 g. Additionally or alternatively, the dimensions of an object characterized by the term "portable" may allow the object to extend no more than 0.3 m in any dimension, specifically no more than 0.2 m in any dimension. Specifically, the volume of the object may not exceed 0.03 m³. 3 Specifically, not exceeding 0.01 m 3 More specifically, not exceeding 0.001 m 3 Or even no more than 500 mm³. Specifically, as an example, a portable spectrometer device can have dimensions such as 10 mm × 10 mm × 5 mm. Specifically, the portable spectrometer device can be part of or attached to a mobile device, such as a laptop computer, tablet computer, mobile phone (e.g., smartphone), smartwatch, and / or wearable computer (also known as a "wearable device," such as a wearable computer (e.g., a wristband or watch)). Specifically, the weight of the spectrometer device, specifically the portable spectrometer device, can range from 1 g to 100 g, more specifically from 1 g to 10 g.

[0131] In another aspect, a method for operating a spectrometer apparatus to obtain spectral information about at least one object is disclosed, wherein the method includes using a spectrometer apparatus for obtaining spectral information as disclosed elsewhere herein. For this aspect, reference may be made to any definitions, embodiments, claims, and / or aspects disclosed herein.

[0132] As used herein, the terms “have,” “include,” or “contain,” or any grammatical variation thereof, are used in a non-exclusive manner. Thus, these terms can refer either to a situation where no other features exist in the entity described in the context besides those introduced by these terms, or to a situation where one or more other features exist. For example, the statements “A has B,” “A includes B,” and “A contains B” can refer either to a situation where no other elements exist in A besides B (i.e., A consists solely of B), or to a situation where entity A contains one or more other elements besides B (such as element C, elements C and D, or even other elements).

[0133] Furthermore, it should be noted that the terms "at least one," "one or more," or similar expressions indicating a feature or element may appear once or more, but are typically used only once when the corresponding feature or element is introduced. In most cases, the expressions "at least one" or "one or more" are not repeated when referring to the corresponding feature or element, but in fact, the corresponding feature or element may appear once or more.

[0134] Furthermore, as used herein, the terms “preferredly,” “more preferably,” “particularly,” “more particularly,” “specifically,” “more specifically,” or similar terms are used in combination with optional features without limiting the possibility of alternatives. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As those skilled in the art will recognize, the invention can be practiced by using alternative features. Similarly, features introduced by phrases such as “in embodiments of the invention” are intended to be optional features and do not limit any alternative embodiments of the invention, the scope of the invention, or the possibility of combining features introduced in this way with other optional or non-optional features of the invention.

[0135] In one or more of the above embodiments and / or in one or more of the embodiments described in further detail below, the method for calibrating a spectrometer device, the method for operating a spectrometer device, and the spectrometer device according to the present invention offer numerous advantages over known devices and methods of similar types.

[0136] In particular, this invention improves the detection efficiency of spectrometer equipment. This invention further improves the signal-to-noise ratio of spectrometer equipment. This invention further improves the generation of detector signals from multiple photosensitive elements, which are equivalent to each other in a manner independent of the geometry of the optical paths of the different photosensitive elements. This invention further increases the dynamic range of spectrometer equipment. This invention further improves spectral contrast and / or reduces stray light.

[0137] Spectrometer equipment can be optimized for performing spectral measurements on objects with non-Lambertian emitters, especially because the photosensitive element is sensitive to the collection angle. The dependency is known and / or compensated.

[0138] One solution is to ensure that any optical path passing through different wavelength-selective elements follows a similar optical path originating from the sample. Therefore, at the sample interface, the optical paths can be identical in terms of the direction of light collected from the object, determined by the light collection angle. The distribution of light can be described by the light collection angle, which may depend on the light collection angle relative to the sample normal. The optical design of a spectrometer system can be described by... All optical channels are designed in the same way.

[0139] Therefore, the effects of volume scattering and / or surface scattering affect each light collection path to an equal degree. Furthermore, the differences in the recorded spectra can therefore depend solely on the wavelength, rather than on the geometry of the light collection path.

[0140] Therefore, differences in material processing and / or manufacturing may only cause spectral shifts but not affect spectral contrast.

[0141] In summary, and without excluding other possible embodiments, the following embodiments are conceivable:

[0142] Example 1: A spectrometer apparatus for obtaining at least one spectral information item about at least one object through spectral measurement, wherein the spectrometer apparatus includes:

[0143] (1) At least one sample interface, wherein the sample interface defines a measurement surface, wherein the measurement surface is configured to define the measurement orientation of the object, particularly during the spectral measurement, wherein the measurement surface further defines an xy plane and thereby defines the x-axis and y-axis;

[0144] (2) At least one light-emitting element, wherein the light-emitting element is configured to emit illumination light onto the at least one object in order to generate detection light from the at least one object;

[0145] (3) At least one detector, wherein the detector comprises a plurality of photosensitive elements, wherein each of the photosensitive elements is configured to generate at least one detector signal when the detection light is received from the object, so as to obtain the spectral information item;

[0146] The spectrometer is configured such that the detection light received by at least two of the plurality of photosensitive elements each exhibits an angular distribution on the sample interface. The at least two photosensitive elements are distributed at at least two angles. They overlap at least partially, where, It is an index pointing to a specific photosensitive element, particularly a specific photosensitive element among the at least two photosensitive elements, wherein, It is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the xz plane and the projection of the normal to the measurement surface onto the xz plane, where, It is the angle between the projection of the specified ray of light, described by the corresponding angular distribution, onto the yz plane and the projection of the normal on the measurement surface onto the yz plane.

[0147] Example 2: The spectrometer device according to the previous example, wherein the at least two photosensitive elements are distributed at at least two angles. The at least partial overlap of the at least two photosensitive elements results in at least two angular distributions of the at least two photosensitive elements. At least partially overlapping, wherein, It is the angle between the ray of light and the normal of the sample interface, described by the corresponding angular distribution.

[0148] Example 3: The spectrometer device according to the previous example, wherein, by considering For each angle in space The angular distribution of the at least two photosensitive elements is normalized using the corresponding radiation intensity. This generates a normalized angular distribution. .

[0149] Example 4: The spectrometer device according to the previous embodiment, wherein, in order to make the at least two photosensitive elements have at least two angular distributions The at least two normalized angular distributions overlap at least partially. The overlap is at least 70%, 80%, 90%, or 95%, of which...

[0150] Example 5: According to any of the spectrometer devices described in the foregoing embodiments, the connection between the two specific photosensitive elements is obtained in the following manner. The two related angular distributions Overlap :

[0151] At least two angular distributions are obtained. and Among them, by considering From the same photosensitive element Related angular distribution Obtain the angle distribution ;

[0152] At least two standardized angular distributions were obtained. and , where the distribution from this angle is considered by the following function. get :

[0153] ;

[0154] Overlap can be obtained by using the following function :

[0155] .

[0156] Example 6: According to any of the spectrometer devices described in the foregoing embodiments, wherein the at least two photosensitive elements are sensitive to different wavelength ranges, wherein these different wavelength ranges are assigned to at least one contrast pair of the spectral information of the object, specifically an absorbance contrast pair.

[0157] Example 7: According to any of the spectrometer devices described in the foregoing embodiments, the spectrometer device is further configured such that the detection light received by at least two other photosensitive elements among the plurality of photosensitive elements each exhibits a different angular distribution on the sample interface. The at least two additional photosensitive elements are distributed at at least two additional angles. They overlap at least partially.

[0158] Example 8: The spectrometer device according to the previous embodiment, wherein the at least two additional photosensitive elements are distributed at at least two additional angles. The at least partial overlap of the at least two additional photosensitive elements results in at least two additional angular distributions of the at least two additional photosensitive elements. The other at least part overlaps.

[0159] Example 9: The spectrometer device according to the previous embodiment, wherein, by considering For each angle in space The other corresponding radiation intensity is used to normalize the other angular distribution of the at least two other photosensitive elements. This generates another normalized angular distribution. .

[0160] Example 10: The spectrometer device according to the previous embodiment, wherein, in order to make the at least two additional photosensitive elements have at least two additional angular distributions The at least two additional normalized angular distributions at least partially overlap. The overlap must be at least 70%, 80%, 90%, or 95%.

[0161] Example 11: A spectrometer device according to any one of the first two examples, wherein the spectrometer device is configured to distribute at least two angles of the at least two photosensitive elements. and at least two other angular distributions of the at least two other photosensitive elements. At least partially separated.

[0162] Example 12: The spectrometer device according to the previous embodiment, wherein, in order to configure the spectrometer device for distributing at least two angles of the at least two photosensitive elements. and at least two other angular distributions of the at least two other photosensitive elements. The two angular distributions are at least partially separated. At least one angular distribution in With at least two other angular distributions At least one other angular distribution The overlap is less than 70%, 60%, 50%, 40%, 30%, 20%, and 10%.

[0163] Example 13: A spectrometer device according to any one of the first four examples, wherein the at least two additional photosensitive elements are sensitive to additional different wavelength ranges, wherein these additional different wavelength ranges are assigned to at least one additional contrast pair in the spectral information of the object, specifically an additional absorbance contrast pair.

[0164] Example 14: A spectrometer device according to any of the foregoing embodiments, wherein the spectrometer includes a spectrometer window through which the detection light and the illumination transmission pass.

[0165] Example 15: The spectrometer device according to the previous embodiment, wherein the spectrometer window includes an outer surface facing the outside of the spectrometer device.

[0166] Example 16: The spectrometer device according to the previous embodiment, wherein the spectrometer window includes an inner surface facing the interior of the spectrometer device, and in particular, wherein the outer surface is opposite to the inner surface.

[0167] Example 17: According to any of the first two examples, the spectrometer device wherein the outer surface is configured to contact the object during the spectral measurement and thereby serves as the sample interface.

[0168] Example 18: According to any of the spectrometer devices described in the foregoing embodiments, the incident irradiation light exhibits an angular distribution on the sample interface. This angular distribution causes the angular distribution of specular Fresnel reflections on the sample interface. The detection light received by the detector, specifically by any one of these photosensitive elements, exhibits an angular distribution on the sample interface. ,

[0169] The spectrometer is configured to achieve this angular distribution. and the angular distribution At least partially separated.

[0170] Example 19: The spectrometer device according to the previous embodiment, wherein, in order for the spectrometer device to be configured to achieve the angular distribution and the angular distribution At least separate, the angular distribution Distribution at this angle The overlap is less than 50%, 40%, 30%, 20%, 10%, or 0%.

[0171] Example 20: A spectrometer device according to any one of the first two examples, wherein the spectrometer device is configured to achieve the angular distribution. and the angular distribution Completely separated.

[0172] Example 21: According to any of the foregoing embodiments, the spectrometer device, particularly in order to configure the spectrometer device to form at least one corresponding angular distribution, includes at least one optical element, which is disposed in at least one of the following:

[0173] The path of the illuminating light beam;

[0174] Detecting the beam path of light.

[0175] Specifically, it is used to modify at least one of the following:

[0176] Angular distribution ;

[0177] Angular distribution ;

[0178] Detector angular distribution ;

[0179] The angular distribution of at least two photosensitive elements At least one angular distribution in;

[0180] The angular distribution of at least two photosensitive elements At least one angular distribution in it.

[0181] Example 22: The spectrometer device according to the previous embodiment, wherein the optical element is or includes:

[0182] One or more optical mirrors;

[0183] One or more optical lenses;

[0184] One or more active optical elements, specifically one or more micromirror arrays;

[0185] One or more beam splitters.

[0186] Example 23: The spectrometer device according to the preceding two examples, wherein the one or more optical mirrors are at least one of the following:

[0187] One or more plane mirrors;

[0188] One or more imaging mirrors.

[0189] Example 24: The spectrometer device according to the previous embodiment, wherein the one or more imaging mirrors are at least one of the following:

[0190] One or more curved mirrors;

[0191] One or more freeform surface mirrors.

[0192] Example 25: According to any of the spectrometer devices described in the foregoing embodiments, the light-emitting element is configured to irradiate a defined irradiation area on the sample interface.

[0193] Example 26: A spectrometer device according to the previous embodiment, wherein the optical element and / or additional optical elements are configured for...

[0194] The illumination light from the light-emitting element is directed toward the sample interface, thereby defining the illumination area.

[0195] Example 27: According to any of the spectrometer devices described in the foregoing embodiments, the light-emitting element is at least one of the following:

[0196] Heat radiator;

[0197] Microelectromechanical systems (MEMS) based transmitter;

[0198] A laser, specifically a vertical-cavity surface-emitting laser (VCSEL), that emits at least one wavelength in the infrared region;

[0199] Light-emitting diodes (LEDs), especially

[0200] ○ An LED that emits light that is at least partially located in the infrared spectrum, and / or

[0201] ○ An LED that irradiates a phosphor, the phosphor performing light conversion on the light generated by the LED, wherein the luminescent material generates converted light that is at least partially located in the near-infrared spectral range.

[0202] Example 28: According to any of the spectrometer devices described in the foregoing embodiments, the irradiation light has a spectral range that is at least partially located in the near-infrared spectral range, specifically in the spectral range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0203] Example 29: According to any of the spectrometer devices described in the foregoing embodiments, wherein the detector is configured to have an imaging plane for receiving detection light from the sample interface.

[0204] Example 30: A spectrometer device according to the previous embodiment, wherein the optical element and / or additional optical elements are configured for...

[0205] The imaging plane of the detector is guided and / or focused onto the sample interface.

[0206] Example 31: According to any of the spectrometer devices described in the foregoing embodiments, the plurality of photosensitive elements are arranged in an array.

[0207] Example 32: According to any of the spectrometer devices described in the foregoing embodiments, the plurality of photosensitive elements are sensitive to different wavelength ranges.

[0208] Example 33: A spectrometer device according to any of the foregoing embodiments, wherein each of the plurality of photosensitive elements has a field of view, and wherein the optical element and / or other optical elements are configured for...

[0209] Modify the field of view of at least one photosensitive element to increase at least one overlap between at least two fields of view of the plurality of photosensitive elements.

[0210] Example 34: The spectrometer apparatus according to the previous embodiment, wherein each of the photosensitive elements has a measurement spot on the sample interface, wherein increasing at least one overlap between at least two fields of view of the plurality of photosensitive elements causes at least one overlapping region of the measurement spot on the sample interface including the at least two fields of view to increase.

[0211] Example 35: According to the spectrometer device of the previous embodiment, the ratio of at least one overlapping region of the measurement spot including the at least two fields of view to the combined region of the measurement spot including the at least two fields of view on the sample interface is at least 60%, 70%, 80% or 90%.

[0212] Example 36: According to any of the foregoing embodiments, the spectrometer device further includes at least one evaluation unit, wherein the evaluation unit is configured to evaluate the detector signal to obtain spectral information about the object.

[0213] Example 37: According to any of the spectrometer devices described in the foregoing embodiments, the evaluation unit is further configured to obtain the spectral information item in such a way that the spectral information item includes an angular distribution with respect to the corresponding photosensitive element. The information item, in which the detector signals of these photosensitive elements have been evaluated in order to obtain the spectral information item.

[0214] Example 38: A spectrometer device according to any of the foregoing embodiments, wherein the spectrometer device further includes at least one wavelength selection element, wherein the wavelength selection element is disposed in at least one of the following:

[0215] The path of the illuminating light beam; and

[0216] Detect the beam path of light.

[0217] Example 39: A spectrometer device according to a previous embodiment, wherein the wavelength selection element is configured and / or arranged such that at least one of the following is each exposed to separate, specifically different spectral ranges of detection light from the object:

[0218] There should be at least two photosensitive elements;

[0219] At least two additional photosensitive elements;

[0220] These are multiple photosensitive elements.

[0221] Example 40: The spectrometer device according to any one of the first two examples, wherein the wavelength selection element is selected from the group consisting of a tunable wavelength selection element and a wavelength selection element having a fixed transmission spectrum.

[0222] Example 41: The spectrometer device according to any one of the first three examples, wherein the wavelength selection element is or includes at least one of the following:

[0223] Variable length filter;

[0224] Static filter;

[0225] Tunable filters, especially MEMS Fabry-Perot resonators;

[0226] Optical lenses;

[0227] Diffraction element.

[0228] Example 42: The spectrometer device according to the previous embodiment, wherein the variable length filter includes at least two bandpass filters, wherein each bandpass filter is arranged in the field of view of a particular photosensitive element, and wherein each bandpass filter is configured to select at least one wavelength range of incident radiation.

[0229] Example 43: A mobile device, wherein the mobile device includes a spectrometer device according to any of the foregoing embodiments.

[0230] Example 44: A method for operating a spectrometer device to obtain spectral information about at least one object, wherein the method includes using a spectrometer device according to any of the foregoing embodiments. Attached Figure Description

[0231] Further optional details and features of the invention will be apparent from the following description of preferred exemplary embodiments in conjunction with the dependent claims. In this context, specific features may be implemented individually or in combination with other features. The invention is not limited to exemplary embodiments. Exemplary embodiments are schematically illustrated in the accompanying drawings. The same reference numerals in the various drawings refer to the same elements or elements having the same function, or elements that correspond to each other in terms of their function.

[0232] In the attached diagram:

[0233] Figure 1 The contribution components of the reflected light from the object are shown;

[0234] Figure 2 An exemplary attenuation coefficient for water is shown. Wavelength dependence;

[0235] Figure 3 An exemplary record of the dependence of the reflected spectrum on the angle at which the detection light is received from the object is shown;

[0236] Figure 4 An exemplary spectrometer apparatus for obtaining at least one spectral information item is shown;

[0237] Figure 5 Another exemplary spectrometer device is shown;

[0238] Figure 6 Exemplary angular distributions on the sample interface are shown;

[0239] Figure 7 Another exemplary spectrometer device is shown;

[0240] Figure 8 Further exemplary spectrometer devices are shown; and

[0241] Figure 9 Angles are shown and Definition;

[0242] Figure 10 An exemplary standardized angular distribution is shown. ;as well as

[0243] Figure 11 Another exemplary spectrometer device is shown. Detailed Implementation

[0244] Figure 1 Three contributing components to the light reflected from object 110 are illustrated exemplaryly, particularly for objects that are and / or include biological tissue. Typically, reflected light can include diffuse Fresnel reflection (indicated by reference numeral 112). Diffuse Fresnel reflection is generated during scattering on the surface of the object, particularly on rough surfaces. Additionally, reflected light can include specular Fresnel reflection (indicated by reference numeral 114). Specular Fresnel reflection is produced by the specular-like behavior of the object's surface. It does not contain information about the object's absorption. Furthermore, reflected light can include volumetric reflection (indicated by reference numeral 116). Volumetric reflection can be Kubelka-Munk reflection, also known as subsurface reflection. Volumetric reflection can combine refractive effects (indicated by reference numeral 118) and diffraction effects (indicated by reference numeral 120). Volumetric reflection may be affected by at least one of the following: grain size; structure; shape; extinction coefficient of object 110. Typically, the ratio between specular Fresnel reflection and diffuse Fresnel reflection can be given by the surface roughness of the object relative to the wavelength of the reflected light.

[0245] Typically, the propagation of light in a medium can be expressed using the complex refractive index. To describe, among which, It is the refractive index of object 110, and This is the extinction coefficient of object 110, also known as the attenuation coefficient. Especially in absorption spectroscopy, a common goal is to determine and / or distinguish at least one component of an object, such as the material of the object, via light absorption. Light absorption can be determined by the extinction coefficient. Sure.

[0246] Fresnel reflection can occur in two media. At the interface between them, each medium has a different complex refractive index. For a normal angle of incidence perpendicular to the surface, Fresnel reflection can be determined using the following equation:

[0247] .

[0248] Refractive index and attenuation coefficient They can be coupled via the so-called Kramers-Kronig relationship. Typically, in the near-infrared region, the refractive index... It may be much larger than the attenuation coefficient. This can be seen from... Figure 2 The graph shows the attenuation coefficient of water. (Indicated by reference numeral 122 in the attached figure). The wavelength, in µm, is plotted on the horizontal axis 124. The attenuation coefficient is plotted on the vertical axis 126. At a wavelength of 1450 nm, the attenuation coefficient is... It is approximately 0.0003. For comparison, at a wavelength of 1450 nm, the refractive index of water is... It is approximately 1.37. Therefore, in the near-infrared region, Fresnel reflection may not be affected by the extinction coefficient. The influence of Fresnel reflection is significant, and Fresnel reflection may not carry information about the light absorption of the medium. In contrast, in the mid-infrared region, the extinction coefficient... With refractive index They are on the same order of magnitude. Therefore, Fresnel reflection is strongly affected by the extinction coefficient. This effect is used in mid-infrared attenuated total reflectance spectroscopy.

[0249] The reflectivity of light propagating through object 110 (e.g., in the case of volumetric reflection of light 116) can be obtained by considering the following factors:

[0250] via extinction coefficient The absorption of this substance can be described by the Lambert-Beer law, and / or

[0251] The scattering of light at the optical interface within an object, also known as Kubelka-Munk reflection or subsurface reflection, combines refraction and diffraction effects at the optical interface between components with different optical properties (e.g., the surfaces of pores, cells, and / or blood vessels in biological tissues).

[0252] Absorption and scattering can determine the amount of reflected light generated by a sample. Since absorption imprints spectral information into reflected light (as exemplified by Lambert-Beer's law), the reflectance spectrum, including volumetric reflected light, carries information about the composition of the object, such as the concentration of biomarkers in tissues.

[0253] If we can further from Figure 3The resulting recorded reflectance spectrum (denoted by reference numeral 123) exhibits a dependence on the angle at which the detection light 142 is received from the object due to the interaction of volumetric reflection, specular Fresnel reflection, and diffuse Fresnel reflection. Alternatively or additionally, the recorded reflectance spectrum may exhibit a dependence on the angle at which the incident light is incident on the object. Figure 3 (Not depicted in the text). In Figure 3 The horizontal axis 125 depicts the wavelength in nm. The vertical axis 126 depicts the absorbance. The recorded reflectance spectrum (indicated by reference numeral 123) does not include the contribution component of specular Fresnel reflection.

[0254] Figure 3 The exemplary recorded reflectance spectrum depicted is the reflectance spectrum of polycaprolactam. Figure 3 The numbers in Figure 128 refer to the angles relative to the surface normal of object 110 when the detection light 142 is received from object 110. The term "Ref" in Figure 128 indicates the measurement recorded using an integrating sphere.

[0255] Figure 4 An exemplary spectrometer device 130 is shown for obtaining at least one spectral information item about at least one object 110 by means of spectral measurement. An exemplary mobile communication device 131 includes the exemplary spectrometer device 130. The exemplary spectrometer device 130 includes:

[0256] (1) At least one sample interface 132, wherein the sample interface 132 defines a measurement surface, wherein the measurement surface is configured to define the measurement posture of the object 110, particularly during spectral measurements, wherein the measurement surface further defines an xy plane and thereby defines an x-axis 134 and a y-axis 136.

[0257] (2) At least one light-emitting element 138, wherein the light-emitting element 138 is configured to emit illumination light 140 to illuminate at least one object 110 so as to generate detection light 142 from at least one object 110;

[0258] (3) At least one detector 144, wherein the detector 144 includes a plurality of photosensitive elements 164, wherein each of the photosensitive elements 164 is configured to generate at least one detector signal when a detection light 142 is received from the object 110 in order to obtain spectral information items.

[0259] The spectrometer device 130 is configured such that the detection light 142 received by at least two of the plurality of photosensitive elements 164 each exhibits an angular distribution on the sample interface 132. In which at least two photosensitive elements 164 are distributed at at least two angles. They overlap at least partially, where, It is an index pointing to a specific photosensitive element 164, particularly a specific photosensitive element among at least two photosensitive elements 164, wherein, It is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the xz-plane and the projection of the normal to the measurement surface onto the xz-plane, where, Angle (or angle) is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the yz plane and the projection of the normal to the measurement surface onto the yz plane. And another angle Depicted in Figure 9 middle).

[0260] At least two photosensitive elements 164 can be sensitive to different wavelength ranges, wherein these different wavelength ranges can be assigned to at least one contrast pair in the spectral information of the object 110, specifically an absorbance contrast pair. The detector may include a plurality of additional photosensitive elements 164, each exhibiting a different angular distribution. At least two additional photosensitive elements may be sensitive to additional different wavelength ranges, wherein these additional different wavelength ranges are assigned to at least one additional contrast pair in the spectral information of the object, specifically an additional absorbance contrast pair.

[0261] At least two angular distributions of at least two photosensitive elements The at least partial overlap can cause at least two angular distributions of at least two photosensitive elements. At least partially overlapping. At least two other photosensitive elements with at least two other angular distributions. The at least partial overlap can cause at least two additional angular distributions of at least two other photosensitive elements. The other at least part overlaps.

[0262] It can be the angle between the light ray and the normal to the sample interface, described by the corresponding angular distribution. This can be achieved by considering... From the same photosensitive element Related angular distribution Obtain the angle distribution .

[0263] You can consider For each angle in space The corresponding radiation intensity is used to normalize the 164° angular distribution of at least two photosensitive elements. And thus generate a normalized angular distribution. It can be considered For each angle in space The other corresponding radiation intensity is used to normalize the other angular distribution of at least two other photosensitive elements 164. This generates another normalized angular distribution. .

[0264] By considering the following function from the angular distribution Obtain the standardized angular distribution :

[0265] .

[0266] To ensure that at least two photosensitive elements 164 are distributed at at least two angles At least partially overlapping, at least two normalized angular distributions The overlap is at least 70%, 80%, 90%, or 95%. This is to ensure at least two additional angular distributions of at least two additional photosensitive elements 164. They at least partially overlap, with at least two additional normalized angular distributions. The overlap must be at least 70%, 80%, 90%, or 95%.

[0267] With two specific photosensitive elements The two related angular distributions Overlap And / or with two specific additional photosensitive elements The two related angular distributions Overlap This can be obtained by using the following function:

[0268] .

[0269] With two specific photosensitive elements The two related angular distributions Overlap And / or with two specific additional photosensitive elements The two related angular distributions Overlap It can be obtained through at least one of the following:

[0270] At least two angular distributions are obtained. and Among them, by considering From the same photosensitive element Related angular distribution Obtain the angle distribution ;

[0271] At least two standardized angular distributions were obtained. and , where the following function is considered from the angular distribution get :

[0272] ;

[0273] Overlap can be obtained by using the following function :

[0274] .

[0275] The incident illumination light 140 can have an angular distribution on the sample interface 132. In particular, it causes the angular distribution of specular Fresnel reflections on sample interface 132. ,in, It is the angle between the projection of the light ray in the xy plane onto the x-axis 134, which is described by the corresponding angular distribution. This is the angle between the projection of the light ray in the xy plane and the y-axis 136, described by the corresponding angular distribution. The detection light 142 received by the detector 144 can have an angular distribution on the sample interface 132. The spectrometer device 130 can be configured to achieve angular distribution. and angular distribution At least partially separated.

[0276] In particular, in order to enable the spectrometer device 130 to be configured for angular distribution and angular distribution At least separate, angular distribution With angular distribution The overlap can be less than 50%, 40%, 30%, 20%, 10%, or 0%. The spectrometer device 130 can be configured to achieve angular distribution. and angular distribution Completely separated.

[0277] Angular distribution and angular distribution Overlap It can be obtained through the following:

[0278] .

[0279] The spectrometer device 130 may include at least one optical element 152, which is disposed in at least one of the following: the beam path of the irradiating light 140 (e.g., Figure 4 (Exemplary depiction); the beam path of the detection light 142. The corresponding optical element 152 can modify at least one of the following: angular distribution. ; angular distribution ; Angular distribution of detector 144 At least two photosensitive elements are distributed at an angle of 164 degrees. At least one angular distribution in; at least two photosensitive elements with an angular distribution of 164. At least one angular distribution in it.

[0280] The light-emitting element 138 can be configured to illuminate a defined illumination area on the sample interface 132. The optical element 152 can be configured to guide the illumination light 140 from the light-emitting element 138 toward the sample interface 132. In particular, the optical element 152 can thus define the illumination area.

[0281] The light-emitting element 138 can be at least one of the following:

[0282] Heat radiator;

[0283] Microelectromechanical systems (MEMS) based transmitter;

[0284] A laser, specifically a vertical-cavity surface-emitting laser (VCSEL), that emits at least one wavelength in the infrared region;

[0285] Light-emitting diodes (LEDs), especially

[0286] ○ An LED that emits light that is at least partially located in the infrared spectrum, and / or

[0287] ○ An LED that irradiates a phosphor, the phosphor performing light conversion on the light generated by the LED, wherein the luminescent material generates converted light that is at least partially located in the near-infrared spectral range.

[0288] The irradiation light 140 may have a spectral range that is at least partially located in the near-infrared spectral range, specifically in the spectral range of 1 µm to 3 µm, preferably 1.3 µm to 2.5 µm, more preferably 1.5 µm to 2.2 µm.

[0289] The spectrometer device 130 may include at least one optical element 152, which is arranged such that the spectrometer device 130 can provide angular distribution. and angular distribution At least partially separated. Figure 4In the illustrated exemplary spectrometer apparatus, optical element 152 is disposed in the beam path of illumination light 140. Alternatively or additionally, optical element 152 may be disposed in the beam path of detection light 142. It should be understood that the spectrometer apparatus 130 according to the invention may include a plurality of optical elements 152, such as optical element 152 and other optical elements 152. Different optical elements 152 may be used for different purposes, such as guiding and / or modifying illumination light 140 or guiding and / or modifying detection light 142.

[0290] Optical element 152 may be or may include: one or more optical mirrors 154; one or more optical lenses 156; one or more active optical elements 158, specifically one or more micromirror arrays; one or more beam splitters 160. One or more optical mirrors 154 may be at least one of the following: one or more planar mirrors; one or more imaging mirrors. One or more imaging mirrors may be at least one of the following: one or more curved mirrors; one or more freeform mirrors.

[0291] The spectrometer 130 may include a spectrometer window 146 through which detection light 142 and illumination light 140 are transmitted. The spectrometer window 146 may include an outer surface 148 facing the exterior of the spectrometer device 130. The spectrometer window 146 may also include an inner surface 150 facing the interior of the spectrometer device 130. The outer surface 148 may be opposite to the inner surface 150. The outer surface 148 may be configured to contact the object 110 during spectral measurements and thereby serve as the sample interface 132.

[0292] Detector 144 may be configured to have an imaging plane for receiving detection light from sample interface 132. Optical element 152 and / or additional optical element 152 may be configured to guide and / or focus the imaging plane of detector 144 onto sample interface 132.

[0293] The spectrometer device 130 may further include at least one evaluation unit 161, wherein the evaluation unit 161 is configured to evaluate the detector signal to obtain spectral information terms about the object 110. The evaluation unit 161 may be further configured to obtain the spectral information terms in such a way that the spectral information terms are distributed with respect to at least one angular distribution of the corresponding photosensitive element 164. The analysis process involves evaluating the detector signals of these photosensitive elements to obtain spectral information.

[0294] exist Figure 5The accompanying drawings depict another exemplary spectrometer device 130 according to the invention. Unless otherwise specified, the reference numerals discussed above denote the same corresponding parts. Figure 5 The detector 144 can therefore include multiple photosensitive elements 164 (also in...) Figure 4 (As depicted in the image), each of the photosensitive elements 164 can be configured to generate at least one detector signal to obtain spectral information. Multiple photosensitive elements 164 can be arranged in an array 166. The multiple photosensitive elements 164 can be sensitive to different wavelength ranges.

[0295] The spectrometer device 130 may further include at least one wavelength selection element 162. Figure 5 The wavelength selection element 162 of the exemplary spectrometer device 130 is disposed in the beam path of the detection light 142. Alternatively or additionally, the wavelength selection element 162 may be disposed in the beam path of the illumination light 140. Figure 5 (Not depicted in the text).

[0296] Wavelength selection element 162 may be selected from the group consisting of tunable wavelength selection elements and wavelength selection elements with a fixed transmission spectrum. Wavelength selection element 162 may be or may include at least one of the following: a variable length filter 168 (e.g., Figure 5 (as depicted in the image); static filters; tunable filters, particularly MEMS Fabry-Perot resonators; optical lenses; diffraction elements. The variable-length filter 168 may include at least two bandpass filters 170, each bandpass filter 170 being arranged within the field of view 172 of a particular photosensitive element 164, wherein each bandpass filter 170 can be configured to select at least one wavelength range of the detection light 142.

[0297] Multiple photosensitive elements 164 may each have a field of view 172, wherein an optical element 152 may be configured to modify the field of view 172 of at least one photosensitive element 164 to increase at least one overlap between at least two fields of view 172 of the multiple photosensitive elements 164. Each photosensitive element 164 may have a measurement spot 174 on the sample interface 132, wherein increasing at least one overlap between at least two fields of view 172 of the multiple photosensitive elements 164 can cause an increase in at least one overlapping region of the measurement spot 174 on the sample interface 132, comprising at least two fields of view 170. On the sample interface 132, the ratio between at least one overlapping region of the measurement spot 174 comprising at least two fields of view 172 and the combined region of the measurement spot 174 comprising at least two fields of view 172 can be at least 60%, 70%, 80%, or 90%.

[0298] The wavelength selection element 162 can be configured and / or arranged such that at least one of the following can be exposed to detection light from a separate, specifically different spectral range from the object: at least two of the plurality of photosensitive elements 164; and / or at least two additional photosensitive elements 164; and / or the plurality of photosensitive elements 164.

[0299] exist Figure 6 The image shows the angle on sample interface 132. angular distribution Several exemplary 10% contour lines are shown. Angles, in degrees, are depicted on the horizontal axis 176. Angles, in degrees, are plotted on the vertical axis 177. Angular distribution of Fresnel reflection from a mirror The corresponding contour lines are indicated by the appendix label 180. Distribution at each angle. A specific photosensitive element 164 is assigned to detector 144. The angular distribution of detector 144. It can include angular distribution Any one of them.

[0300] Several angular distributions related to photosensitive element 164 were depicted. The corresponding contour lines (indicated by reference numeral 178 in the attached figure). For clarity, not all angles are distributed. All are indicated by reference numeral 178. Therefore, it is important to emphasize that, by using... Figure 6 The numbers 3, 6, and 9 depicted in the text are used to further indicate any angular distribution. In addition, several other angular distributions related to the other photosensitive element 164 are depicted. The corresponding contour lines (indicated by reference numeral 179 in the attached figure). For clarity, not all angles are distributed. All are indicated by reference numeral 179. Therefore, it is important to emphasize that, by using… Figure 6 The numbers 2, 5, and 8 depicted in the text are used to further indicate any angular distribution. It should be noted that there may be even different angular distributions associated with, or even other photosensitive elements 164. These angular distributions are achieved through the use of Figure 6 The numbers 1, 4, and 7 are depicted to provide further indication.

[0301] The spectrometer device is configured to distribute at least two photosensitive elements 164 at at least two angles. (Indicated by reference numeral 178) and at least two additional angular distributions of at least two additional photosensitive elements 164. (Indicated by reference numeral 179) At least partially separated. This is to enable the spectrometer apparatus to be configured such that at least two photosensitive elements 164 are distributed at at least two angles. (Indicated by reference numeral 178) and at least two additional angular distributions of at least two additional photosensitive elements 164. (Indicated by reference numeral 179 in the attached figure) At least partially separated, distributed at two angles At least one angular distribution (as indicated by reference numeral 178 in the attached figure) (Indicated by reference numeral 178 in the attached figure) and at least two other angular distributions. At least one additional angular distribution (indicated by reference numeral 179) (Indicated by reference numeral 179 in the attached figure) The overlap is less than 70%, 60%, 50%, 40%, 30%, 20%, and 10%.

[0302] If possible Figure 6 The obtained angular distribution and angular distribution They can be completely separated (as depicted). When the angle is distributed... and angular distribution When they can be completely separated, the angular distribution With angular distribution The minimum distance between them can be less than 1°, 5°, or 10°. The minimum distance can be... - In the plane and / or with - Coordinates are measured.

[0303] exist Figure 7 The accompanying drawings depict another exemplary spectrometer device 130 according to the invention. Unless otherwise specified, reference numerals as discussed above denote the same corresponding parts. The optical elements 152 of the additional exemplary spectrometer device 130 are arranged in the beam path of the irradiating light 140. Unrelatedly, typically, the angle between the principal ray 184 of the field of view 172 of the detector 144 and the normal 186 of the sample interface 132 at the sample interface 132 can be less than 15°, 10°, 5°, 4°, 3°, 2°, or 1°. Alternatively, as... Figure 7 As depicted with respect to another exemplary spectrometer device 130, the principal ray 184 and the normal 186 of the sample interface 132 at the sample interface 132 may be parallel.

[0304] exist Figure 8The accompanying drawings depict another exemplary spectrometer device 130 according to the invention. Unless otherwise specified, the reference numerals discussed above denote the same corresponding parts. More typically, the angle between the central ray 188 of an incident beam of illumination light 140 on the sample interface 132 and the normal 186 of the sample interface 132 at the sample interface 132 can be less than 5°, 4°, 3°, 2°, or 1°. Alternatively, as... Figure 8 As depicted with respect to another exemplary spectrometer device 130, the central ray 188 of an incident beam of illumination light 140 on the sample interface 132 and the normal 186 of the sample interface 132 may be parallel.

[0305] exist Figure 9 In the middle, the angle is described. and For example, the angle can be obtained from the coordinate system at the bottom right. (Indicated by reference numeral 190 in the attached figure) a designated ray of light defined by the corresponding angular distribution. (Indicated by reference numeral 192) Normal to the sample interface 132 (Indicated by reference numeral 186 in the attached figure) Between. Angle It can be obtained using the following equation:

[0306] .

[0307] Angles can be obtained from the coordinate system at the bottom left. (Indicated by reference numeral 194) A designated ray of light defined in the light described by the corresponding angular distribution. (Indicated by reference numeral 192 in the attached figure) The projection on the xz axis and the normal of the sample interface 132 (Indicated by reference numeral 186 in the attached figure) Between projections on the x and z axes. Length

[0308] Indicated by reference numeral 196 in the attached figure. Angle. It can be obtained using the following equation:

[0309] .

[0310] If the angle can be obtained from the coordinate system above... (Indicated by reference numeral 198 in the attached figure) a designated ray of light defined by the corresponding angular distribution. (Indicated by reference numeral 192 in the attached figure) The projection on the yz axis and the normal of the sample interface 132 (Indicated by reference numeral 186 in the attached figure) Between projections on the y and z axes. Length Indicated by reference numeral 200 in the attached figure. Angle. It can be obtained using the following equation:

[0311] .

[0312] Further disclosed is a method (not depicted) for operating a spectrometer device 130 to obtain spectral information about at least one object, wherein the method includes using a spectrometer device 130 for obtaining spectral information as disclosed elsewhere herein.

[0313] Figure 10 Several standardized angular distributions are shown. (Indicated by reference numeral 201 in the attached figure), these angular distributions from Figure 6 The angle distribution shown Obtain and accordingly indicate with numbers between 1 and 9 (in) Figure 10 (Depicted in the middle). Angles in degrees are depicted on the horizontal axis 202. On the vertical axis 204, the normalized density and / or dimensionless nominal density are depicted.

[0314] exist Figure 11 The accompanying drawings depict another exemplary spectrometer device 130 according to the invention. Unless otherwise specified, the reference numerals discussed above denote the same corresponding parts. Figure 11 The resulting principal rays 184 of the photosensitive elements 146 included in the detector 144 are parallel, with a maximum deviation of 5°, 3°, 1°, or 0°. Multiple photosensitive elements 164 can be arranged in an array 166. Multiple photosensitive elements 164 can be sensitive to different wavelength ranges.

[0315] List of reference numerals

[0316]

[0317] .

Claims

1. A spectrometer apparatus (130) for obtaining at least one spectral information item about at least one object (110) by means of spectral measurement, wherein, The spectrometer device (130) includes: (1) At least one sample interface (132), wherein the sample interface (132) defines a measurement surface, wherein the measurement surface is configured to define the measurement orientation of the object (110), wherein the measurement surface further defines an xy plane and thereby defines the x-axis and y-axis; (2) At least one light-emitting element (138), wherein the light-emitting element (138) is configured to emit illumination light (140) onto the at least one object (110) in order to generate detection light (142) from the at least one object (110). (3) At least one detector (144), wherein the detector (144) includes a plurality of photosensitive elements (164), wherein each of the photosensitive elements (164) is configured to generate at least one detector (144) signal when the detection light (142) is received from the object (110) in order to obtain the spectral information item; The spectrometer device (130) is configured such that the detection light (142) received by at least two of the plurality of photosensitive elements (164) each exhibits an angular distribution on the sample interface (132). The at least two photosensitive elements (164) are distributed at at least two angles. They overlap at least partially, where, It is an index pointing to a specific photosensitive element (164), where, It is the angle between the projection of a specified ray of light, described by the corresponding angular distribution, onto the xz plane and the projection of the normal to the measurement surface onto the xz plane, where, It is the angle between the projection of the specified ray of light, described by the corresponding angular distribution, onto the yz plane and the projection of the normal to the measurement surface onto the yz plane. The at least two photosensitive elements (164) are distributed at at least two angles. The at least partial overlap of the at least two photosensitive elements (164) results in at least two angular distributions of the at least two photosensitive elements (164). At least partially overlapping, wherein, It is the angle between the ray of light described by the corresponding angular distribution and the normal of the sample interface (132), wherein, by considering For each angle in space The angular distribution of the at least two photosensitive elements is normalized using the corresponding radiation intensity. And thus generate a normalized angular distribution. In order to make the at least two photosensitive elements (164) have at least two angular distributions The at least two normalized angular distributions overlap at least partially. At least 70% overlap The spectrometer device (130) is further configured such that the detection light (142) received by at least two of the plurality of photosensitive elements (164) each exhibits a different angular distribution on the sample interface. The at least two additional photosensitive elements (164) are distributed at at least two additional angles. At least partially overlapping, Among them, the at least two additional photosensitive elements have at least two additional angular distributions. The at least partial overlap of the at least two additional photosensitive elements results in at least two additional angular distributions of the at least two additional photosensitive elements. The other at least partial overlap, wherein, by considering For each angle in space The other corresponding radiation intensity is used to normalize the other angular distribution of the at least two other photosensitive elements. This generates another normalized angular distribution. In order to make the at least two additional photosensitive elements have at least two additional angular distributions The at least two additional normalized angular distributions at least partially overlap. At least 70% overlap The spectrometer device (130) is configured to distribute at least two angles of the at least two photosensitive elements (164). At least two additional angular distributions with the at least two additional photosensitive elements (164) At least partially separated, wherein the spectrometer is configured to distribute the at least two photosensitive elements at at least two angles. At least two other angular distributions with the at least two other photosensitive elements The two angular distributions are at least partially separated. At least one angular distribution in With at least two other angular distributions At least one other angular distribution The overlap is less than 70%.

2. The spectrometer apparatus (130) according to the preceding claim, wherein, The following method is used to obtain the two specific photosensitive elements (164). The two related angular distributions Overlap : At least two angular distributions are obtained. and Among them, by considering From the same photosensitive element (164) Related angular distribution Obtain the angle distribution ; At least two standardized angular distributions were obtained. and , where the distribution from this angle is considered by the following function. get : ； Overlap can be obtained by using the following function : 。 3. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The at least two photosensitive elements (164) are sensitive to different wavelength ranges, wherein these different wavelength ranges are assigned to at least one contrast pair of the spectral information of the object (110).

4. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The at least two additional photosensitive elements (164) are sensitive to additional different wavelength ranges, wherein these additional different wavelength ranges are assigned to at least one additional contrast pair in the spectral information of the object (110).

5. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The incident illumination light (140) exhibits an angular distribution on the sample interface. This angular distribution causes the angular distribution of specular Fresnel reflections on the sample interface. The detection light (142) received by the detector (144), specifically by any of the photosensitive elements (164), exhibits an angular distribution on the sample interface. , The spectrometer device (130) is configured to achieve this angular distribution. and the angular distribution At least partially separated.

6. The spectrometer apparatus (130) according to the preceding claim, wherein, In order for the spectrometer device (130) to be configured to achieve this angular distribution and the angular distribution At least separate, the angular distribution Distribution at this angle The overlap is less than 50%, 40%, 30%, 20%, 10%, or 0%.

7. The spectrometer apparatus (130) according to any one of the preceding two claims, wherein, The spectrometer device (130) is configured to achieve this angular distribution. and the angular distribution Completely separated.

8. The spectrometer apparatus (130) according to any one of the preceding claims, wherein, The spectrometer device (130) further includes at least one evaluation unit (161), wherein the evaluation unit (161) is configured to evaluate the detector (144) signal to obtain spectral information items about the object (110).

9. The spectrometer apparatus (130) according to the preceding claim, wherein, The evaluation unit (161) is further configured to obtain the spectral information item in such a way that the spectral information item is oriented toward at least one angular distribution of these respective photosensitive elements (164). The analysis was performed, in which the detector (144) signals of these photosensitive elements were evaluated in order to obtain the spectral information item.

10. A mobile device, wherein, The mobile device includes a spectrometer device (130) according to any one of the preceding claims.

11. A method for operating a spectrometer device (130) to obtain spectral information about at least one object (110), wherein, The method includes using a spectrometer device (130) for obtaining spectral information about at least one object (110) according to any one of the preceding claims 1 to 9.

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