A resistance measurement method, device and medium of a resistive touch screen

Abstract

The application provides a resistance measurement method and device of a resistance touch screen and a medium thereof. The X-layer measurement unit is connected to the X-layer touch screen and the Y-layer measurement unit is connected to the Y-layer touch screen, and the X-layer rated voltage value and the Y-layer rated voltage value of the X-layer touch screen and the Y-layer touch screen in a non-touch state are measured. The X-layer resistance value is determined according to the conduction resistance of the X-layer measurement unit and the X-layer rated voltage value. The Y-layer resistance value is determined according to the conduction resistance of the Y-layer measurement unit and the Y-layer rated voltage value. The conduction of the X-layer touch screen and the X-layer measurement unit and the conduction of the Y-layer touch screen and the Y-layer measurement unit are interrupted, and the X-layer pressing voltage value and the Y-layer pressing voltage value of the X-layer touch screen and the Y-layer touch screen are measured. The total pressing resistance value of the resistance touch screen is determined according to the X-layer resistance value, the Y-layer resistance value, the X-layer pressing voltage value and the Y-layer pressing voltage value, and the adaptive resistance value measurement calibration is realized, and the detection precision of the touch coordinates is improved.

Description

Technical Field

[0001] This application relates to the field of intelligent power distribution equipment technology, and in particular to a resistance measurement method, device and medium for a resistive touch screen. Background Technology

[0002] Resistive touchscreens are human-machine interface devices widely used in industrial control, consumer electronics, and other fields. Particularly in intelligent power distribution systems, resistive touchscreens are used for operations such as setting operating parameters, monitoring power quality, querying fault records, and remotely controlling switches. Their basic principle is to determine the touch position by detecting the voltage change at the touch point using the X and Y conductive film layers. In practical applications, the resistance values ​​of the X and Y layers are crucial parameters for calculating the touch point coordinates and the pressing resistance. The pressing resistance value reflects the degree of contact between the X and Y layers; the smaller the value, the more sufficient the contact, the less mechanical vibration, and the more reliable the obtained coordinate information. Therefore, accurately obtaining the resistance values ​​of the X and Y layers is essential for ensuring touch detection accuracy.

[0003] Currently, the common practice in existing technologies is to manually measure the resistance values ​​of the X and Y layers using tools such as multimeters before touchscreen assembly, and then embed the measurement results into the controller's program code. However, this method of pre-setting parameters has significant limitations. First, touchscreens of the same size produced by different manufacturers often have different resistance values ​​for the X and Y layers due to differences in production equipment, process conditions, and environmental factors. Second, even touchscreens of the same model produced by the same manufacturer may have fluctuating resistance values ​​between different batches due to limitations in process stability. When the actual resistance value of the touchscreen used is inconsistent with the preset value embedded in the program, it will directly lead to errors in touch coordinate calculation, affecting user experience and device reliability. Therefore, a method that can adaptively obtain the resistance of the touchscreen layers is needed to overcome the adaptability problems caused by the pre-setting of parameters in existing technologies. Summary of the Invention

[0004] The purpose of this application is to at least solve one of the technical problems existing in the prior art, and to provide a resistance measurement method, device and medium for a resistive touch screen, which realizes adaptive measurement calibration, eliminates the influence of process differences and effectively improves the accuracy and reliability of touch coordinate detection.

[0005] To achieve the above objectives, a first aspect of this application provides a resistance measurement method for a resistive touchscreen, applied to a controller of a resistance measurement system. The resistance measurement system further includes an X-layer measurement unit and a Y-layer measurement unit, and the controller is communicatively connected to the X-layer measurement unit and the Y-layer measurement unit, respectively. The method includes: Control the X-layer measurement unit to connect to the X-layer touch screen, and control the Y-layer measurement unit to connect to the Y-layer touch screen, and measure the operating voltage of the X-layer touch screen and the Y-layer touch screen in the non-touch state respectively, to obtain the rated voltage value of the X-layer and the rated voltage value of the Y-layer. Determine the resistance value of the X layer touchscreen based on the on-resistance of the X layer measurement unit and the rated voltage value of the X layer. Determine the resistance value of the Y layer touch screen based on the on-resistance of the Y layer measurement unit and the rated voltage value of the Y layer. Interrupt the conduction between the X-layer touchscreen and the X-layer measurement unit, as well as the conduction between the Y-layer touchscreen and the Y-layer measurement unit, and measure the pressing voltage of the X-layer touchscreen and the Y-layer touchscreen in the touch state respectively to obtain the pressing voltage value of the X-layer and the pressing voltage value of the Y-layer. Based on the resistance values ​​of layer X, layer Y, layer X pressing voltage, and layer Y pressing voltage, determine the total pressing resistance value of the resistive touchscreen at the touch coordinates.

[0006] Furthermore, in some embodiments, the X-layer measurement unit includes a first resistor, a second resistor, a first MOSFET, and a second MOSFET; One end of the first resistor is electrically connected to the power supply terminal of the resistance measurement system, the other end of the first resistor is electrically connected to the first conducting electrode of the first MOSFET, the control electrode of the first MOSFET is communicatively connected to the controller, and the second conducting electrode of the first MOSFET is electrically connected to the positive electrode of the X-layer touch screen. One end of the second resistor is grounded, the other end of the first resistor is electrically connected to the first conducting electrode of the second MOSFET, the control electrode of the second MOSFET is communicatively connected to the controller, and the second conducting electrode of the second MOSFET is electrically connected to the negative electrode of the X-layer touch screen. Controlling the X-layer measurement unit to connect to the X-layer touchscreen includes: A first turn-on drive signal is output to the first MOSFET, and a second turn-on drive signal is output to the second MOSFET, so that the first resistor is connected to the positive side of the X-layer touch screen and the second resistor is connected to the negative side of the X-layer touch screen. The first turn-on drive signal is used to drive the first and second conduction terminals of the first MOS transistor to conduct with each other, and the second turn-on drive signal is used to drive the first and second conduction terminals of the second MOS transistor to conduct with each other.

[0007] Furthermore, in some embodiments, the rated voltage value of layer X includes the rated voltage value of the positive electrode of layer X on the positive side of the layer X touchscreen and the rated voltage value of the negative electrode of layer X on the negative side of the layer X touchscreen. Based on the on-resistance of the X-layer measuring unit and the rated voltage of the X-layer, determine the resistance value of the X-layer touchscreen, including: The difference between the rated voltage of the positive electrode of layer X and the rated voltage of the negative electrode of layer X is calculated to obtain the rated voltage difference of layer X of the touch screen. The resistance value of layer X is determined based on the rated voltage difference of layer X, the resistance value of the second resistor, and the rated voltage value of the negative electrode of layer X.

[0008] Furthermore, in some embodiments, the Y-layer measurement unit includes a third resistor, a fourth resistor, a third MOSFET, and a fourth MOSFET; One end of the third resistor is electrically connected to the power supply terminal of the resistance measurement system, the other end of the third resistor is electrically connected to the first conducting electrode of the third MOSFET, the control electrode of the third MOSFET is connected to the controller, and the second conducting electrode of the third MOSFET is electrically connected to the positive electrode of the Y-layer touch screen. One end of the fourth resistor is grounded, the other end of the third resistor is electrically connected to the first conducting electrode of the fourth MOSFET, the control electrode of the fourth MOSFET is connected to the controller, and the second conducting electrode of the fourth MOSFET is electrically connected to the negative electrode of the Y-layer touch screen. Controlling the Y-layer measurement unit to connect to the Y-layer touchscreen includes: A third turn-on drive signal is output to the third MOSFET, and a fourth turn-on drive signal is output to the fourth MOSFET, so that the third resistor is connected to the positive side of the Y-layer touch screen and the fourth resistor is connected to the negative side of the Y-layer touch screen. The third turn-on drive signal is used to drive the first and second conduction terminals of the third MOS transistor to conduct to each other, and the fourth turn-on drive signal is used to drive the first and second conduction terminals of the fourth MOS transistor to conduct to each other.

[0009] Furthermore, in some embodiments, the rated voltage value of the Y layer includes the rated voltage value of the positive electrode of the Y layer on the positive side of the Y layer touchscreen and the rated voltage value of the negative electrode of the Y layer touchscreen on the negative side. Based on the on-resistance of the Y-layer measurement unit and the rated voltage of the Y-layer, determine the Y-layer resistance value of the Y-layer touchscreen, including: The difference between the rated voltage of the positive electrode and the rated voltage of the negative electrode of the Y layer is calculated to obtain the rated voltage difference of the Y layer touch screen. The resistance value of layer Y is determined based on the rated voltage difference of layer Y, the resistance value of the fourth resistor, and the rated voltage value of the negative electrode of layer Y.

[0010] Furthermore, in some embodiments, the X-layer pressing voltage value includes the X-layer positive pressing voltage value of the positive electrode side of the X-layer touchscreen and the X-layer negative pressing voltage value of the negative electrode side of the X-layer touchscreen, and the Y-layer pressing voltage value includes the Y-layer positive pressing voltage value of the positive electrode side of the Y-layer touchscreen and the Y-layer negative pressing voltage value of the negative electrode side of the Y-layer touchscreen. Based on the resistance values ​​of layer X, layer Y, layer X pressing voltage, and layer Y pressing voltage, determine the total pressing resistance value of the resistive touchscreen at the touch coordinates, including: Based on the positive electrode pressing voltage value of layer X, the positive electrode pressing voltage value of layer Y, the negative electrode pressing voltage value of layer Y, the resistance value of layer X, and the resistance value of layer Y, determine the total pressing resistance value of the resistive touch screen at the touch coordinates.

[0011] Furthermore, in some embodiments, the operating voltages of the X-layer touchscreen and the Y-layer touchscreen in the non-touched state are measured respectively to obtain the rated voltage values ​​of the X-layer and the Y-layer, including: The operating voltages of the X-layer and Y-layer touchscreens were collected multiple times in the non-touch state to obtain multiple rated sample voltage values ​​of the X-layer and multiple rated sample voltage values ​​of the Y-layer. Remove the extreme values ​​from the multiple X-layer rated sample voltage values, and then perform an average calculation on the multiple X-layer rated sample voltage values ​​after removing the extreme values ​​to obtain the X-layer rated voltage value; The extreme values ​​are removed from the multiple Y-layer rated sample voltage values, and the average value of the multiple Y-layer rated sample voltage values ​​after removing the extreme values ​​is calculated to obtain the Y-layer rated voltage value.

[0012] Furthermore, in some embodiments, the pressing voltage of the X-layer touchscreen and the Y-layer touchscreen in the touch state is measured respectively to obtain the pressing voltage values ​​of the X-layer and the Y-layer, including: Multiple press voltages of the X-layer and Y-layer touchscreens were collected under touch conditions to obtain multiple X-layer press voltage sample values ​​and multiple Y-layer press voltage sample values. Remove the extreme values ​​from the multiple X-layer pressing sample voltage values, and then perform an average calculation on the multiple X-layer pressing sample voltage values ​​after removing the extreme values ​​to obtain the X-layer pressing voltage value; The extreme values ​​are removed from the multiple Y-layer pressing sample voltage values, and the average value of the multiple Y-layer pressing sample voltage values ​​after removing the extreme values ​​is calculated to obtain the Y-layer pressing voltage value.

[0013] To achieve the above objectives, a second aspect of the present application provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the resistance measurement method of the resistive touch screen described in the first aspect of the present application.

[0014] To achieve the above objectives, a third aspect of the present application provides a storage medium, which is a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it implements the resistance measurement method of the resistive touch screen described in the first aspect of the present application.

[0015] According to an embodiment of this application, a method, apparatus, and medium for measuring the resistance of a resistive touchscreen have at least the following advantages: By integrating an X-layer measurement unit and a Y-layer measurement unit into the resistance measurement system, the actual resistance values ​​of the X and Y layers can be automatically measured and calculated when the touchscreen is not touched. Furthermore, when a touch occurs, the pressing resistance value is calculated by combining the pressing voltage value. Compared to the prior art, which requires manual measurement and pre-fixing of resistance parameters, this application achieves dynamic acquisition and adaptive calibration of resistance values, effectively eliminating the impact of resistance value differences caused by different manufacturers, batches, and process fluctuations on touch coordinate calculation, significantly improving the accuracy and reliability of touch position detection. Simultaneously, the above measurement process eliminates the need for additional manual measurement and parameter entry during production or maintenance, simplifying the production process, reducing labor costs and risks introduced by parameter errors, and enhancing the versatility and adaptability of the resistive touchscreen.

[0016] Other features and advantages of this application will be set forth in the following description and will be apparent in part from the description. The objectives and other advantages of this application may be realized and obtained by means of the structures particularly pointed out in the description and the accompanying drawings. Attached Figure Description

[0017] The accompanying drawings are used to provide a further understanding of the technical solutions of this application and constitute a part of the specification. They are used together with the embodiments of this application to explain the technical solutions of this application and do not constitute a limitation on the technical solutions of this application.

[0018] The present application will be further described below with reference to the accompanying drawings and embodiments; Figure 1 This is an optional flowchart of a resistance measurement method for a resistive touchscreen provided in this application embodiment; Figure 2 This is an optional structural diagram of the resistive touchscreen provided in the embodiments of this application; Figure 3 This is an optional circuit schematic diagram of the resistance measurement system provided in the embodiments of this application; Figure 4 This is an optional flowchart provided in an embodiment of this application for determining the resistance value of layer X of an X-layer touchscreen; Figure 5 This is an optional flowchart provided in an embodiment of this application for determining the Y-layer resistance value of a Y-layer touchscreen; Figure 6 This is a schematic diagram of an optional equivalent circuit structure of the X-layer touch screen provided in this application embodiment under normal working conditions; Figure 7 This is a schematic diagram of an optional equivalent circuit structure of the Y-layer touch screen provided in this application under normal working conditions; Figure 8 This is a schematic diagram of another optional equivalent circuit structure of the Y-layer touch screen provided in this application embodiment under normal working conditions; Figure 9 This is an optional flowchart provided in an embodiment of this application for measuring the operating voltage of the X-layer touchscreen and the Y-layer touchscreen in a non-touch state; Figure 10 This is an optional flowchart provided in the embodiments of this application for measuring the pressing voltage of the X-layer touch screen and the Y-layer touch screen in the touch state; Figure 11 This is a schematic diagram of an optional hardware structure of the electronic device provided in an embodiment of this application; Reference numerals: Top edge of transparent conductor 10, bottom edge of transparent conductor 20, conductive strip 30, conductive silver ink 40, insulating material layer 50. Detailed Implementation

[0019] This section will describe in detail the specific embodiments of this application. Preferred embodiments of this application are shown in the accompanying drawings. The purpose of the drawings is to supplement the textual description with graphics, so that people can intuitively and vividly understand each technical feature and the overall technical solution of this application, but they should not be construed as limiting the scope of protection of this application.

[0020] In the description of this application, the use of "first" and "second" is for the purpose of distinguishing technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of indicated technical features or the order of the indicated technical features. It should be understood that such use of data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0021] In the description of this application, unless otherwise expressly defined, terms such as "setup," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this application in conjunction with the specific content of the technical solution.

[0022] In existing technologies, the common practice for obtaining the resistance values ​​of resistive touchscreens is to manually measure the resistance values ​​of the X and Y layers using tools such as multimeters before touchscreen assembly, and then embed the measurement results into the controller's program code. However, this method of pre-setting parameters has significant limitations. First, touchscreens of the same size produced by different manufacturers often have different resistance values ​​for the X and Y layers due to differences in production equipment, process conditions, and environmental factors. Second, even touchscreens of the same model produced by the same manufacturer may have fluctuating resistance values ​​between different batches due to limitations in process stability. When the actual resistance value of the touchscreen used is inconsistent with the preset value embedded in the program, it will directly lead to errors in touch coordinate calculation, affecting user experience and device reliability. Therefore, a method that can adaptively obtain the layer resistance of resistive touchscreens is needed to overcome the adaptability problems caused by parameter embedding in existing technologies.

[0023] Based on this, embodiments of this application provide a resistance measurement method, device and medium for a resistive touch screen, which can enhance the signal fidelity and control accuracy of the encoder under strong interference without increasing hardware costs.

[0024] Therefore, the embodiments of this application will be further described below with reference to the accompanying drawings.

[0025] Reference Figure 1 As shown, Figure 1 This is an optional flowchart of a resistance measurement method for a resistive touchscreen provided in this application embodiment. The method is applied to the controller of a resistance measurement system. The resistance measurement system also includes an X-layer measurement unit and a Y-layer measurement unit. The controller is communicatively connected to the X-layer measurement unit and the Y-layer measurement unit, respectively. The method may include, but is not limited to, steps S101 to S105.

[0026] Step S101: Control the X layer measurement unit to connect to the X layer touch screen, and control the Y layer measurement unit to connect to the Y layer touch screen, and measure the working voltage of the X layer touch screen and the Y layer touch screen in the non-touch state respectively, to obtain the rated voltage value of the X layer and the rated voltage value of the Y layer.

[0027] It should be noted that, referring to Figure 2 As shown, Figure 2This is an optional structural diagram of a resistive touch screen provided in the embodiments of this application. The resistive touch screen of this application includes two transparent conductive layers, namely the X layer touch screen and the Y layer touch screen. The two layers are isolated from each other when not touched. When pressed, an electrical contact is formed at the touch point. One side of the conductive layer is a transparent conductor top edge 10, and the other side of the conductive layer is a transparent conductor bottom edge 20. The transparent conductor top edge 10 and the transparent conductor bottom edge 20 are opposite sides of each other. The transparent conductor top edge 10 or the transparent conductor bottom edge 20 includes a conductive strip 30 and conductive silver ink 40. At the bottom of the two transparent conductive layers is an insulating material layer 50.

[0028] Specifically, the controller sends a control signal to the X-layer measurement unit, causing the internal switch of the X-layer measurement unit to conduct, connecting the X-layer measurement unit to the positive and negative terminals of the X-layer touchscreen, thus establishing the X-layer power supply measurement circuit. Simultaneously, the controller sends a control signal to the Y-layer measurement unit, causing the internal switch of the Y-layer measurement unit to conduct, connecting the Y-layer measurement unit to the positive and negative terminals of the Y-layer touchscreen, thus establishing the Y-layer power supply measurement circuit. When no pressure is applied to the touchscreen, the X-layer and Y-layer touchscreens are separated. The controller uses an analog-to-digital converter (ADC) circuit to collect the voltage values ​​across the X-layer touchscreen to obtain the rated voltage value of the X-layer, and the voltage values ​​across the Y-layer touchscreen to obtain the rated voltage value of the Y-layer.

[0029] Step S102: Determine the resistance value of the X layer of the touch screen based on the on-resistance of the X layer measurement unit and the rated voltage value of the X layer.

[0030] Specifically, after the controller connects the X-layer measurement unit to the X-layer touchscreen, it calculates the resistance value of the X-layer touchscreen itself based on the on-resistance of the X-layer measurement unit in the connected state and the measured rated voltage value of the X-layer at this time, combined with the known power supply voltage, through the voltage division relationship of the circuit, and records it as the X-layer resistance value.

[0031] Step S103: Determine the Y-layer resistance value of the Y-layer touch screen based on the on-resistance of the Y-layer measuring unit and the rated voltage value of the Y-layer.

[0032] Specifically, after the controller connects the Y-layer measurement unit to the Y-layer touch screen, it calculates the resistance value of the Y-layer touch screen itself based on the on-resistance of the Y-layer measurement unit in the connected state and the measured Y-layer rated voltage value at this time, combined with the known power supply voltage, through the voltage division relationship of the circuit, and records it as the Y-layer resistance value.

[0033] Step S104: Interrupt the conduction between the X-layer touchscreen and the X-layer measurement unit, and the conduction between the Y-layer touchscreen and the Y-layer measurement unit, and measure the pressing voltage of the X-layer touchscreen and the Y-layer touchscreen in the touch state respectively to obtain the pressing voltage value of the X-layer and the pressing voltage value of the Y-layer.

[0034] Specifically, when the resistive touchscreen is pressed, the controller interrupts the connection between the X-layer measurement unit and the X-layer touchscreen, and simultaneously interrupts the connection between the Y-layer measurement unit and the Y-layer touchscreen. After the connection is interrupted, the controller collects the voltage between the positive and negative terminals of the X-layer touchscreen to obtain the X-layer pressing voltage value, and collects the voltage between the positive and negative terminals of the Y-layer touchscreen to obtain the Y-layer pressing voltage value.

[0035] Step S105: Determine the total pressing resistance value of the resistive touch screen at the touch coordinates based on the resistance value of layer X, the resistance value of layer Y, the pressing voltage value of layer X, and the pressing voltage value of layer Y.

[0036] Specifically, the controller calculates the total pressing resistance value formed when the X-layer touch screen and the Y-layer touch screen come into contact at the touch point, based on the determined resistance values ​​of the X-layer and Y-layer touch screens, as well as the X-layer pressing voltage value and the Y-layer pressing voltage value measured under the touch state, according to the voltage distribution relationship of the resistive touch screen at the touch point.

[0037] In steps S101 to S105, the X-layer measurement unit and Y-layer measurement unit integrated into the resistance measurement system can automatically measure and calculate the actual resistance values ​​of the X-layer and Y-layer when the touchscreen is not touched. When a touch occurs, the pressing resistance value is calculated by combining the pressing voltage value. Compared with the prior art, which requires manual measurement and fixing of resistance parameters in advance, this application achieves dynamic acquisition and adaptive calibration of resistance values, effectively eliminating the impact of resistance value differences caused by different manufacturers, batches, and process fluctuations on touch coordinate calculation, significantly improving the accuracy and reliability of touch position detection. Simultaneously, the above measurement process eliminates the need for additional manual measurement and parameter entry during production or maintenance, simplifying the production process, reducing labor costs and risks introduced by parameter errors, and enhancing the versatility and adaptability of the resistive touchscreen.

[0038] Furthermore, refer to Figure 3 As shown, Figure 3 This is an optional circuit schematic diagram of the resistance measurement system provided in the embodiments of this application. The X-layer measurement unit includes a first resistor R1, a second resistor R3, a first MOSFET Q1, and a second MOSFET Q2.

[0039] In terms of circuit connections, one end of the first resistor R1 is electrically connected to the power supply terminal VCC of the resistance measurement system, and the other end of the first resistor R1 is electrically connected to the first conducting terminal (e.g., the source) of the first MOSFET Q1. The control terminal (gate) of the first MOSFET Q1 is communicatively connected to a general-purpose input / output port of the controller to receive the turn-on or turn-off control signal from the controller. The second conducting terminal (e.g., the drain) of the first MOSFET Q1 is electrically connected to the positive terminal X+ of the X-layer touchscreen.

[0040] Furthermore, one end of the second resistor R3 is grounded to GND, providing a zero-potential reference point for the measurement circuit. The other end of the first resistor R1 is electrically connected to the first conducting terminal (e.g., the source) of the second MOSFET Q2, and the control terminal (gate) of the second MOSFET Q2 is electrically connected to another general-purpose input / output port of the controller to receive on / off control signals from the controller. The second conducting terminal (e.g., the drain) of the second MOSFET Q2 is electrically connected to the negative edge X- of the X-layer touchscreen.

[0041] Based on the above circuit structure, the process of the controller controlling the X-layer measurement unit to connect to the X-layer touchscreen specifically includes the following steps: outputting a first conduction drive signal to the first MOSFET Q1 and a second conduction drive signal to the second MOSFET Q2, so that the first resistor R1 is connected to the positive terminal of the X-layer touchscreen and the second resistor R3 is connected to the negative terminal of the X-layer touchscreen. Specifically, the first conduction drive signal is used to drive the first and second conduction terminals of the first MOSFET Q1 to conduct with each other, and the second conduction drive signal is used to drive the first and second conduction terminals of the second MOSFET Q2 to conduct with each other.

[0042] In a preferred embodiment, when X-layer resistance measurement is required, the controller outputs a high-level first turn-on drive signal to the control electrode of the first MOSFET Q1. The first MOSFET Q1 turns on in response to this signal, forming a conductive channel between its first and second conducting electrodes, thereby connecting the first resistor R1 to the positive terminal X+ of the X-layer touchscreen. Simultaneously, the controller outputs a high-level second turn-on drive signal to the control electrode of the second MOSFET Q2. The second MOSFET Q2 turns on in response to this signal, forming a conductive channel between its first and second conducting electrodes, thereby connecting the second resistor R3 to the negative terminal X- of the X-layer touchscreen. Thus, the first resistor R1, the turned-on first MOSFET Q1, the X-layer touchscreen (path from positive terminal X+ to negative terminal X-), the turned-on first MOSFET Q1, and the second resistor R3 are connected in series, forming a complete X-layer power supply measurement loop from the power supply terminal VCC to ground GND. The establishment of this loop provides the necessary hardware path for the subsequent controller to acquire the rated voltage value of the X-layer through the analog-to-digital converter circuit.

[0043] Furthermore, refer to again Figure 3 As shown, the Y-layer measurement unit includes a third resistor R5, a fourth resistor R7, a third MOSFET Q3, and a fourth MOSFET Q4.

[0044] In terms of circuit connection, one end of the third resistor R5 is electrically connected to the power supply terminal VCC of the resistance measurement system, the other end of the third resistor R5 is electrically connected to the first conducting electrode (e.g., the source) of the third MOSFET Q3, the control electrode (gate) of the third MOSFET Q3 is connected to the controller, and the second conducting electrode (e.g., the drain) of the third MOSFET Q3 is electrically connected to the positive electrode X+ of the Y layer touch screen.

[0045] Furthermore, one end of the fourth resistor R7 is grounded to GND, providing a zero-potential reference point for the measurement circuit. The other end of the third resistor R5 is electrically connected to the first conducting electrode (e.g., the source) of the fourth MOSFET Q4, the control electrode (gate) of the fourth MOSFET Q4 is communicatively connected to another general-purpose input / output port of the controller, and the second conducting electrode (e.g., the drain) of the fourth MOSFET Q4 is electrically connected to the negative electrode side of the Y-layer touchscreen X-.

[0046] Based on the above circuit structure, the process of the controller controlling the Y-layer measurement unit to connect to the Y-layer touchscreen specifically includes the following steps: outputting a third turn-on drive signal to the third MOSFET Q3 and a fourth turn-on drive signal to the fourth MOSFET Q4, so that the third resistor R5 is connected to the positive terminal of the Y-layer touchscreen and the fourth resistor R7 is connected to the negative terminal of the Y-layer touchscreen. Specifically, the third turn-on drive signal is used to drive the first and second conduction terminals of the third MOSFET Q3 to conduct together, and the fourth turn-on drive signal is used to drive the first and second conduction terminals of the fourth MOSFET Q4 to conduct together.

[0047] In a preferred embodiment, when X-layer resistance measurement is required, the controller outputs a high-level third conduction drive signal to the control electrode of the third MOSFET Q3. The third MOSFET Q3 conducts in response to this signal, forming a conductive channel between its first and second conducting electrodes, thereby connecting the third resistor R5 to the positive terminal X+ of the Y-layer touchscreen. Simultaneously, the controller outputs a high-level fourth conduction drive signal to the control electrode of the fourth MOSFET Q4. The second MOSFET Q2 conducts in response to this signal, forming a conductive channel between its first and second conducting electrodes, thereby connecting the second resistor R3 to the negative terminal X- of the X-layer touchscreen. Thus, the third resistor R5, the conducting third MOSFET Q3, the Y-layer touchscreen (path from positive terminal X+ to negative terminal X-), the conducting fourth MOSFET Q4, and the fourth resistor R7 are connected in series, forming a complete Y-layer power supply measurement loop from the power supply terminal VCC to ground GND. The establishment of this loop provides the necessary hardware path for the subsequent controller to acquire the rated voltage value of the Y-layer through the analog-to-digital converter circuit.

[0048] Furthermore, in a specific embodiment, refer to Figure 3As shown, the rated voltage values ​​of layer X include the rated voltage value XP of the positive terminal of layer X on the positive side of the layer X touchscreen and the rated voltage value XN of the negative terminal of layer X on the negative terminal of the layer X touchscreen. (Refer to...) Figure 4 As shown, Figure 4 This is an optional flowchart for determining the resistance value of an X-layer touchscreen according to an embodiment of this application. The method may include, but is not limited to, steps S201 to S202.

[0049] Step S201: Calculate the difference between the rated voltage of the positive electrode of layer X and the rated voltage of the negative electrode of layer X to obtain the rated voltage difference of layer X of the touch screen.

[0050] Reference Figure 3 As shown, after the X-layer measurement unit is connected to the X-layer touchscreen to form a complete power supply measurement circuit, the controller starts the analog-to-digital conversion circuit to acquire the voltage across the X-layer touchscreen. The analog-to-digital conversion circuit has a first analog-to-digital conversion channel and a second analog-to-digital conversion channel. The first analog-to-digital conversion channel is electrically connected to the positive terminal of the X-layer touchscreen and is used to acquire the reference point potential of the positive terminal to obtain the rated positive voltage value XP of the X-layer. The second analog-to-digital conversion channel is electrically connected to the negative terminal of the X-layer touchscreen and is used to acquire the reference point potential of the negative terminal to obtain the rated negative voltage value XN of the X-layer.

[0051] Since the X-layer touchscreen exhibits purely resistive characteristics when not touched, the actual voltage drop across its terminals is the potential difference between the positive and negative terminals. The controller inputs the acquired rated positive voltage value XP and rated negative voltage value XN of the X-layer touchscreen into its internal processing unit, performing a difference calculation: subtracting the rated negative voltage value (XP-XN) from the rated positive voltage value. The result is the actual voltage difference between the positive and negative terminals of the X-layer touchscreen, defined as the rated voltage difference ΔU of the X-layer. X This is used for calculating the resistance value R2 of the subsequent X layer.

[0052] Step S202: Determine the resistance value of layer X based on the rated voltage difference of layer X, the resistance value of the second resistor, and the rated voltage value of the negative electrode of layer X.

[0053] Specifically, refer to Figure 3 As shown, when the X-layer measurement unit is connected, in the closed loop formed by the first resistor R1, the first MOSFET Q1, the X-layer touchscreen, the second MOSFET Q2, and the second resistor R3 connected in series, the rated negative voltage XN of the X-layer is essentially the voltage value presented by the second resistor R3 at the voltage divider point to ground. According to Ohm's law for a series circuit, the current I flowing through the loop satisfies I = XN / R3. Simultaneously, this current I is also equal to the rated voltage difference ΔU of the X-layer. X The ratio between the resistance of the X-layer touchscreen and the resistance of the X-layer itself (i.e., the resistance value R2 of the X-layer), i.e., I = ΔU X / R2. Combining the above two equations, we get R2 = (XP - XN) * R3 / XN. The controller substitutes the measured XP, XN, and the known R3 into this relationship to calculate and determine the resistance value of the X-layer touchscreen itself. In a specific embodiment, the resistance values ​​of the first resistor R1 and the second resistor R3 are both 180 ohms.

[0054] Furthermore, refer to Figure 3 As shown, the rated voltage values ​​of the Y layer include the rated voltage value YP of the positive terminal of the Y layer touchscreen and the rated voltage value YN of the negative terminal of the Y layer touchscreen. (Refer to...) Figure 5 As shown, Figure 5 This is an optional flowchart for determining the Y-layer resistance value of a Y-layer touchscreen according to an embodiment of this application. The method may include, but is not limited to, steps S301 to S302.

[0055] Step S301: Calculate the difference between the rated voltage of the positive electrode and the rated voltage of the negative electrode of the Y layer to obtain the rated voltage difference of the Y layer touch screen.

[0056] Reference Figure 3 As shown, after the Y-layer measurement unit is connected to the Y-layer touchscreen to form a complete power supply measurement circuit, the controller starts the analog-to-digital conversion circuit to collect the voltage across the Y-layer touchscreen. The analog-to-digital conversion circuit has a third analog-to-digital conversion channel and a fourth analog-to-digital conversion channel. The third analog-to-digital conversion channel is electrically connected to the positive terminal of the Y-layer touchscreen and is used to collect the reference point potential of the positive terminal to obtain the rated positive voltage value YP of the Y-layer. The fourth analog-to-digital conversion channel is electrically connected to the negative terminal of the Y-layer touchscreen and is used to collect the reference point potential of the negative terminal to obtain the rated negative voltage value YN of the Y-layer.

[0057] Since the Y-layer touchscreen exhibits pure resistive characteristics when not touched, the actual voltage drop across its terminals is the potential difference between the positive and negative terminals. The controller inputs the acquired rated positive voltage YP and rated negative voltage YN of the Y-layer into its internal processing unit, performing a difference calculation: subtracting the rated negative voltage (YP-YN) from the rated positive voltage. The result is the actual voltage difference between the positive and negative terminals of the Y-layer touchscreen, defined as the rated voltage difference ΔU. Y This is used for the subsequent calculation of the Y-layer resistance value R6.

[0058] Step S302: Determine the resistance value of the Y layer based on the rated voltage difference of the Y layer, the resistance value of the fourth resistor, and the rated voltage value of the negative electrode of the Y layer.

[0059] Specifically, refer to Figure 3As shown, with the Y-layer measurement unit connected, in the closed loop formed by the third resistor R5, the third MOSFET Q3, the Y-layer touchscreen, the fourth MOSFET Q4, and the fourth resistor R7 connected in series, the rated voltage YN of the Y-layer negative terminal is essentially the voltage value presented by the fourth resistor R7 at the voltage divider point to ground. According to Ohm's law for series circuits, the current I flowing through the loop satisfies I = YN / R7. Simultaneously, this current I is also equal to the rated voltage difference ΔU of the Y-layer. Y The ratio between the resistance of the Y-layer touchscreen and the resistance value of the Y-layer itself (i.e., the resistance value R6 of the Y-layer), i.e., I=ΔU Y / R6. Combining the above two equations, we get R6 = (YP - YN) * R7 / YN. The controller substitutes the measured YP, YN, and the known R7 into this relationship to calculate and determine the resistance value of the Y-layer touchscreen. In a specific embodiment, the resistance values ​​of the third resistor R5 and the fourth resistor R7 are both 180 ohms.

[0060] Furthermore, the X-layer pressing voltage value includes the X-layer positive pressing voltage value of the positive electrode side of the X-layer touchscreen and the X-layer negative pressing voltage value of the negative electrode side of the X-layer touchscreen, and the Y-layer pressing voltage value includes the Y-layer positive pressing voltage value of the positive electrode side of the Y-layer touchscreen and the Y-layer negative pressing voltage value of the negative electrode side of the Y-layer touchscreen.

[0061] In a preferred embodiment, the process of determining the total pressing resistance value of the resistive touch screen under the touch coordinates based on the X layer resistance value, Y layer resistance value, X layer pressing voltage value, and Y layer pressing voltage value specifically includes the following steps: determining the total pressing resistance value of the resistive touch screen under the touch coordinates based on the X layer negative electrode pressing voltage value, Y layer positive electrode pressing voltage value, Y layer negative electrode pressing voltage value, X layer resistance value, and Y layer resistance value.

[0062] Specifically, refer to Figure 6 As shown, Figure 6 This is a schematic diagram of an optional equivalent circuit structure of the X-layer touchscreen under normal operating conditions, provided in an embodiment of this application. In the X-layer touchscreen measurement mode, a voltage bias is applied to the X-layer touchscreen along the X direction. Specifically, the positive terminal X+ of the X-layer is connected to the power supply voltage, and the negative terminal X- is grounded, forming a uniform electric field in the X direction. The Y-layer touchscreen acts as a detection layer, acquiring the potential at the touch point through either the positive terminal Y+ or the negative terminal Y-. When a touch occurs, the X and Y layers conduct at the touch point. The positive terminal potential acquired by the Y-layer is the voltage division value of the touch point in the X direction (the positive terminal pressing voltage value of the Y-layer). This positive terminal pressing voltage value of the Y-layer has a linear relationship with the X-coordinate resistance value of the touch point. By acquiring this positive terminal pressing voltage value of the Y-layer through an analog-to-digital conversion circuit, the coordinate value X-Position of the touch point within the X-layer touchscreen can be determined.

[0063] Reference Figure 7 As shown, Figure 7 This is a schematic diagram of an optional equivalent circuit structure of the Y-layer touchscreen under normal operating conditions, provided in an embodiment of this application. In the Y-layer touchscreen measurement mode, the positive terminal X+ of the X-layer touchscreen is connected to the power supply voltage, while the negative terminal X- of the X-layer remains in a high-resistance state or is connected to a high-impedance input. At this time, when pressure is applied between the positive terminal Y+ and the negative terminal Y- of the Y-layer, current flows through the resistance of the positive terminal Y+, the equivalent contact resistance Touch of the touch point, and the X-layer touchscreen to ground. By measuring the voltage value of the positive terminal X+ (the negative terminal pressing voltage value), the contact coordinate value Z1-Position of the touch point between the Y-layer and X-layer touchscreens can be determined.

[0064] At the same time, refer to Figure 8 As shown, Figure 8 This is a schematic diagram of another optional equivalent circuit structure of the Y-layer touch screen provided in the embodiment of this application under normal working conditions. In the Y-layer touch screen measurement mode, when pressure is applied between the positive electrode edge Y+ and the negative electrode edge Y- of the Y layer, the negative electrode potential collected by the Y layer is the voltage division value of the touch point in the Y direction (Y layer negative electrode pressing voltage value). The Y layer negative electrode pressing voltage value is linearly related to the Y coordinate voltage value of the touch point. By collecting the Y layer positive electrode pressing voltage value through the analog-to-digital conversion circuit, the coordinate value Y-Position of the touch point in the Y-layer touch screen can be determined.

[0065] Finally, based on the X-Position, Z1, Y-Position, X-layer resistance value R2, and Y-layer resistance value R6 mentioned above, the total pressing resistance value R of the resistive touchscreen at touch coordinates (X, Y) is determined. TOUCH In a preferred embodiment, R TOUCH The formula is expressed as follows: ; in, It is the maximum coordinate value measured by the analog-to-digital conversion circuit on the X-layer or Y-layer touchscreen.

[0066] Furthermore, refer to Figure 9 As shown, Figure 9 This is an optional flowchart of an embodiment of the present application for measuring the operating voltage of an X-layer touchscreen and a Y-layer touchscreen in an untouched state. The method may include, but is not limited to, steps S401 to S403.

[0067] Step S401: Collect the operating voltage of the X-layer touch screen and Y-layer touch screen in the non-touch state multiple times to obtain multiple rated sample voltage values ​​of the X-layer and multiple rated sample voltage values ​​of the Y-layer.

[0068] Step S402: Remove the extreme values ​​from the multiple X-layer rated sample voltage values, and perform an average calculation on the multiple X-layer rated sample voltage values ​​after removing the extreme values ​​to obtain the X-layer rated voltage value.

[0069] Step S403: Remove the extreme values ​​from the multiple Y-layer rated sample voltage values, and perform an average calculation on the multiple Y-layer rated sample voltage values ​​after removing the extreme values ​​to obtain the Y-layer rated voltage value.

[0070] In a preferred embodiment of steps S401 to S403, in order to eliminate random errors that may be introduced by a single measurement and improve the accuracy and stability of voltage acquisition, the controller performs multiple acquisition processes on the operating voltage of the X-layer touch screen and the Y-layer touch screen in the non-touch state.

[0071] Specifically, within a preset time window, the controller continuously samples the voltage between the positive and negative terminals of the X-layer touchscreen multiple times using an analog-to-digital converter circuit, obtaining multiple rated sample voltage values ​​for the X-layer. Simultaneously, the controller continuously samples the voltage between the positive and negative terminals of the Y-layer touchscreen multiple times, obtaining multiple rated sample voltage values ​​for the Y-layer. The number of sampling times can be preset according to actual accuracy requirements, for example, set to 8, 16, or 32 times.

[0072] To determine the rated voltage value of layer X, the controller stores multiple sample rated voltage values ​​of layer X in an internal register and performs an extremum removal operation on this data set, that is, removing the maximum and minimum values ​​to eliminate the influence of abnormal data caused by transient interference or sampling jitter. Subsequently, the controller performs an arithmetic mean calculation on the remaining sample rated voltage values ​​of layer X after removing extrema, and uses the result as the final rated voltage value of layer X for subsequent calculations.

[0073] To determine the rated voltage value of layer Y, the controller uses the same processing method: it removes the maximum and minimum values ​​from the multiple sample voltage values ​​of layer Y, performs an arithmetic average on the remaining sample voltage values, and uses the result as the final rated voltage value of layer Y for subsequent calculations.

[0074] By employing the aforementioned processing methods of multiple sampling, removal of extreme values, and mean calculation, random noise interference in the measurement path is effectively suppressed, the measurement accuracy of the rated voltage value is improved, and a reliable data foundation is provided for the accurate calculation of the resistance values ​​of the X layer and Y layer.

[0075] Furthermore, refer to Figure 10 As shown, Figure 10 This is an optional flowchart of measuring the pressing voltage of the X-layer touch screen and the Y-layer touch screen in the touch state, provided in the embodiments of this application. The method may include, but is not limited to, steps S501 to S503.

[0076] Step S501: Collect the pressing voltage of the X-layer touch screen and Y-layer touch screen in the touch state multiple times to obtain multiple X-layer pressing sample voltage values ​​and multiple Y-layer pressing sample voltage values.

[0077] Step S502: Remove extreme values ​​from the multiple X-layer pressing sample voltage values, and perform an average calculation on the multiple X-layer pressing sample voltage values ​​after removing extreme values ​​to obtain the X-layer pressing voltage value.

[0078] Step S503: Remove extreme values ​​from the multiple Y-layer pressing sample voltage values, and perform an average calculation on the multiple Y-layer pressing sample voltage values ​​after removing extreme values ​​to obtain the Y-layer pressing voltage value.

[0079] In a preferred embodiment of steps S501 to S503, in order to eliminate errors caused by touch jitter or instantaneous noise in a single measurement and improve the stability and reliability of the press voltage acquisition, the controller performs multiple sampling processes on the X layer press voltage and Y layer press voltage under the touch state.

[0080] Specifically, when the resistive touchscreen is pressed, the controller, within a preset sampling window, continuously samples the voltage between the positive and negative terminals of the X-layer touchscreen using an analog-to-digital converter circuit, obtaining multiple X-layer press sample voltage values. Simultaneously, the controller continuously samples the voltage between the positive and negative terminals of the Y-layer touchscreen, obtaining multiple Y-layer press sample voltage values. The number of sampling times can be preset according to the actual application scenario, for example, set to 8, 16, or 32 times.

[0081] To determine the X-layer press voltage value, the controller stores multiple collected X-layer press sample voltage values ​​in an internal register and performs an extremum removal operation on this data set, that is, removing the maximum and minimum values ​​to eliminate abnormal data introduced by unstable contact at the moment of touch or external interference. Subsequently, the controller performs an arithmetic mean calculation on the remaining X-layer press sample voltage values ​​after removing extrema, and uses the result as the final X-layer press voltage value used for subsequent calculations.

[0082] To determine the Y-layer pressing voltage value, the controller uses the same processing method: it removes the maximum and minimum values ​​from the multiple Y-layer pressing sample voltage values ​​collected, performs an arithmetic average on the remaining sample voltage values, and uses the result as the final Y-layer pressing voltage value for subsequent calculations.

[0083] By employing the aforementioned processing methods of multiple sampling, removal of extreme values, and mean calculation, the interference of mechanical jitter and electrical noise that may exist during the touch process on the voltage measurement values ​​is effectively suppressed. This makes the obtained X-layer pressing voltage values ​​and Y-layer pressing voltage values ​​more accurate and stable, providing a precise data foundation for the subsequent calculation of the total pressing resistance value.

[0084] This application also provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the resistance measurement method of the resistive touchscreen described above. This electronic device can be any smart terminal, including mobile phones, tablets, and in-vehicle computers.

[0085] Please see Figure 11 , Figure 11 This is a schematic diagram of an optional hardware structure of an electronic device provided in an embodiment of this application. The electronic device includes: The processor 1101 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the resistance measurement method of the resistive touch screen provided in this application embodiment. The memory 1102 can be implemented as a read-only memory (ROM), static storage device, dynamic storage device, or random access memory (RAM). The memory 1102 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented through software or firmware, the relevant program code is stored in the memory 1102 and is called and executed by the processor 1101 to execute the resistance measurement method of the resistive touchscreen provided in the embodiments of this application. Input / output interface 1103 is used to implement information input and output; The communication interface 1104 is used to enable communication and interaction between this device and other devices. Communication can be achieved through wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.). Bus 1105 transmits information between various components of the device (e.g., processor 1101, memory 1102, input / output interface 1103, and communication interface 1104); The processor 1101, memory 1102, input / output interface 1103 and communication interface 1104 are connected to each other within the device via bus 1105.

[0086] This application also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, provides a resistance measurement method for a resistive touchscreen.

[0087] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs. Furthermore, memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, memory may optionally include memory remotely located relative to the processor, and these remote memories can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0088] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0089] Those skilled in the art will understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than shown, or combine certain steps, or different steps.

[0090] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0091] Those skilled in the art will understand that all or some of the steps in the methods disclosed above, as well as the functional modules / units in the systems and devices, can be implemented as software, firmware, hardware, or suitable combinations thereof.

[0092] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0093] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0094] In the embodiments provided in this application, it should be understood that the disclosed systems and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices, or units, and may be electrical, mechanical, or other forms.

[0095] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0096] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0097] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-accessible storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing programs, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0098] The preferred embodiments of the present application have been described above with reference to the accompanying drawings, but this does not limit the scope of the claims of the present application. Any modifications, equivalent substitutions, and improvements made by those skilled in the art without departing from the scope and substance of the embodiments of the present application shall be within the scope of the claims of the present application.

Claims

1. A method for measuring the resistance of a resistive touchscreen, characterized in that, A controller for a resistance measurement system, the resistance measurement system further comprising an X-layer measurement unit and a Y-layer measurement unit, the controller being communicatively connected to the X-layer measurement unit and the Y-layer measurement unit respectively, the method comprising: Control the X-layer measurement unit to connect to the X-layer touch screen, and control the Y-layer measurement unit to connect to the Y-layer touch screen, and measure the operating voltage of the X-layer touch screen and the Y-layer touch screen in the non-touch state respectively to obtain the rated voltage value of the X-layer and the rated voltage value of the Y-layer; The resistance value of the X layer touch screen is determined based on the on-resistance of the X layer measurement unit and the rated voltage value of the X layer. The resistance value of the Y layer touch screen is determined based on the on-resistance of the Y layer measurement unit and the rated voltage value of the Y layer. The conduction between the X-layer touchscreen and the X-layer measurement unit and the Y-layer touchscreen and the Y-layer measurement unit is interrupted, and the pressing voltage of the X-layer touchscreen and the Y-layer touchscreen in the touch state is measured respectively to obtain the pressing voltage value of the X-layer and the pressing voltage value of the Y-layer. The total pressing resistance value of the resistive touchscreen at the touch coordinates is determined based on the resistance value of layer X, the resistance value of layer Y, the pressing voltage value of layer X, and the pressing voltage value of layer Y.

2. The resistance measurement method according to claim 1, characterized in that, The X-layer measurement unit includes a first resistor, a second resistor, a first MOSFET, and a second MOSFET; One end of the first resistor is electrically connected to the power supply terminal of the resistance measurement system, the other end of the first resistor is electrically connected to the first conducting electrode of the first MOS transistor, the control electrode of the first MOS transistor is communicatively connected to the controller, and the second conducting electrode of the first MOS transistor is electrically connected to the positive electrode of the X-layer touch screen. One end of the second resistor is grounded, the other end of the first resistor is electrically connected to the first conducting electrode of the second MOS transistor, the control electrode of the second MOS transistor is communicatively connected to the controller, and the second conducting electrode of the second MOS transistor is electrically connected to the negative electrode of the X-layer touch screen. The control of the X-layer measurement unit to access the X-layer touchscreen includes: A first turn-on drive signal is output to the first MOS transistor, and a second turn-on drive signal is output to the second MOS transistor, so that the first resistor is connected to the positive side of the X-layer touch screen and the second resistor is connected to the negative side of the X-layer touch screen. Wherein, the first turn-on drive signal is used to drive the first conduction terminal and the second conduction terminal of the first MOS transistor to conduct to each other, and the second turn-on drive signal is used to drive the first conduction terminal and the second conduction terminal of the second MOS transistor to conduct to each other.

3. The resistance measurement method according to claim 2, characterized in that, The rated voltage value of layer X includes the rated voltage value of the positive electrode of layer X on the positive side of the touch screen and the rated voltage value of the negative electrode of layer X on the negative side of the touch screen. Determining the resistance value of the X-layer touchscreen based on the on-resistance of the X-layer measuring unit and the rated voltage value of the X-layer includes: The rated voltage difference of the X-layer touch screen is obtained by calculating the difference between the rated voltage value of the positive electrode of the X-layer and the rated voltage value of the negative electrode of the X-layer. The resistance value of layer X is determined based on the rated voltage difference of layer X, the resistance value of the second resistor, and the rated voltage value of the negative electrode of layer X.

4. The resistance measurement method according to claim 1, characterized in that, The Y-layer measurement unit includes a third resistor, a fourth resistor, a third MOSFET, and a fourth MOSFET; One end of the third resistor is electrically connected to the power supply terminal of the resistance measurement system, the other end of the third resistor is electrically connected to the first conducting electrode of the third MOS transistor, the control electrode of the third MOS transistor is communicatively connected to the controller, and the second conducting electrode of the third MOS transistor is electrically connected to the positive electrode of the Y-layer touch screen. One end of the fourth resistor is grounded, the other end of the third resistor is electrically connected to the first conducting electrode of the fourth MOS transistor, the control electrode of the fourth MOS transistor is communicatively connected to the controller, and the second conducting electrode of the fourth MOS transistor is electrically connected to the negative electrode of the Y-layer touch screen. The control of the Y-layer measurement unit to access the Y-layer touchscreen includes: A third turn-on drive signal is output to the third MOS transistor, and a fourth turn-on drive signal is output to the fourth MOS transistor, so that the third resistor is connected to the positive side of the Y-layer touch screen and the fourth resistor is connected to the negative side of the Y-layer touch screen. The third conduction drive signal is used to drive the first conduction terminal and the second conduction terminal of the third MOS transistor to conduct to each other, and the fourth conduction drive signal is used to drive the first conduction terminal and the second conduction terminal of the fourth MOS transistor to conduct to each other.

5. The resistance measurement method according to claim 4, characterized in that, The rated voltage value of the Y layer includes the rated voltage value of the positive electrode of the Y layer on the positive side of the Y layer touch screen and the rated voltage value of the negative electrode of the Y layer touch screen on the negative side. Determining the Y-layer resistance value of the Y-layer touchscreen based on the on-resistance of the Y-layer measuring unit and the rated voltage value of the Y-layer includes: The rated voltage difference of the Y layer touch screen is obtained by calculating the difference between the rated voltage value of the positive electrode of the Y layer and the rated voltage value of the negative electrode of the Y layer. The resistance value of the Y layer is determined based on the rated voltage difference of the Y layer, the resistance value of the fourth resistor, and the rated voltage value of the negative electrode of the Y layer.

6. The resistance measurement method according to claim 1, characterized in that, The X-layer pressing voltage value includes the X-layer positive electrode pressing voltage value of the positive electrode side of the X-layer touch screen and the X-layer negative electrode pressing voltage value of the negative electrode side of the X-layer touch screen; the Y-layer pressing voltage value includes the Y-layer positive electrode pressing voltage value of the positive electrode side of the Y-layer touch screen and the Y-layer negative electrode pressing voltage value of the negative electrode side of the Y-layer touch screen. The step of determining the total pressing resistance value of the resistive touchscreen at the touch coordinates based on the resistance value of layer X, the resistance value of layer Y, the pressing voltage value of layer X, and the pressing voltage value of layer Y includes: Based on the positive electrode pressing voltage value of layer X, the positive electrode pressing voltage value of layer Y, the negative electrode pressing voltage value of layer Y, the resistance value of layer X, and the resistance value of layer Y, the total pressing resistance value of the resistive touch screen under the touch coordinates is determined.

7. The resistance measurement method according to claim 1, characterized in that, The step of measuring the operating voltage of the X-layer touchscreen and the Y-layer touchscreen in the non-touched state to obtain the rated voltage values ​​of the X-layer and Y-layer includes: The operating voltages of the X-layer touchscreen and the Y-layer touchscreen were collected multiple times in the non-touch state to obtain multiple rated sample voltage values ​​of the X-layer and multiple rated sample voltage values ​​of the Y-layer. Remove the extreme values ​​from the plurality of X-layer rated sample voltage values, and perform an average calculation on the plurality of X-layer rated sample voltage values ​​after removing the extreme values ​​to obtain the X-layer rated voltage value; The extreme values ​​are removed from the plurality of Y-layer rated sample voltage values, and the average value of the plurality of Y-layer rated sample voltage values ​​after removing the extreme values ​​is calculated to obtain the Y-layer rated voltage value.

8. The resistance measurement method according to claim 1, characterized in that, The step of measuring the pressing voltage of the X-layer touchscreen and the Y-layer touchscreen in the touch state to obtain the pressing voltage values ​​of the X-layer and the Y-layer includes: Multiple press voltages of the X-layer touchscreen and the Y-layer touchscreen in the touch state are collected to obtain multiple X-layer press voltage sample values ​​and multiple Y-layer press voltage sample values; Remove the extreme values ​​from the plurality of X-layer pressing sample voltage values, and perform an average calculation on the plurality of X-layer pressing sample voltage values ​​after removing the extreme values ​​to obtain the X-layer pressing voltage value; The extreme values ​​are removed from the multiple Y-layer pressing sample voltage values, and the average value of the multiple Y-layer pressing sample voltage values ​​after removing the extreme values ​​is calculated to obtain the Y-layer pressing voltage value.

9. An electronic device, characterized in that, The electronic device is provided with a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements the resistance measurement method of the resistive touch screen according to any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a processor-executable program that, when executed by a processor, implements the resistance measurement method of the resistive touchscreen according to any one of claims 1 to 8.

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