A photovoltaic panel defect detection method based on an RTMDet framework
By using a photovoltaic panel defect detection method based on the RTMDet framework, and leveraging dynamic activation gating mechanism and axial long-range context modeling, combined with topology-aware feature enhancement, the problems of insufficient accuracy and poor anti-interference ability in photovoltaic panel defect detection are solved, achieving high-precision and robust defect detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SICHUAN ENERGY INVESTMENT XINGWEN ELECTRIC POWER CO LTD
- Filing Date
- 2026-02-06
- Publication Date
- 2026-05-29
AI Technical Summary
Existing photovoltaic panel defect detection technologies lack sufficient accuracy in complex outdoor environments, especially in identifying minute and extended defects. Furthermore, they fail to effectively utilize the prior knowledge of the photovoltaic panel's physical structure, resulting in poor anti-interference capabilities and limited generalization performance.
A photovoltaic panel defect detection method based on the RTMDet framework is adopted. Feature selection and enhancement are performed through dynamic activation gating mechanism. Feature enhancement is combined with axial long-range context modeling and topology awareness. Hierarchical feature fusion is then performed, and finally joint classification and regression processing are carried out.
It significantly improves the detection accuracy, robustness, and engineering practical value of multi-scale photovoltaic panel defects in complex backgrounds, while maintaining the lightweight characteristics of the model.
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