An integrated circuit end-of-life method and system based on dynamic power consumption compensation

By using a dynamic power consumption compensation method to monitor and adjust the power supply voltage in real time, the problems of misjudgment and insufficient coverage in the testing of high dynamic power consumption chips are solved, high-precision power supply control and self-optimization are achieved, and the quality and efficiency of final integrated circuit testing are improved.

CN122131127APending Publication Date: 2026-06-02SINO IC TECH CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SINO IC TECH CO LTD
Filing Date
2026-04-20
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Traditional ATE power supply solutions are difficult to match the current requirements of chips with high dynamic power consumption, resulting in test misjudgments, low yield and insufficient test coverage. In addition, the lack of accurate recording of power supply status increases the difficulty of troubleshooting and affects the efficiency and quality of final integrated circuit testing.

Method used

By acquiring power consumption prediction data of the test vector, feedforward pre-compensation and feedback fine-tuning compensation are performed, the power supply voltage is monitored and adjusted in real time, and the compensation value lookup table is iteratively updated by the self-learning optimization module to achieve precise voltage control.

Benefits of technology

It effectively improves chip testing yield, ensures power supply accuracy, increases test coverage and overall efficiency, reduces test misjudgments, and has self-optimization capabilities to improve system stability.

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Abstract

This invention belongs to the field of integrated circuit testing and semiconductor manufacturing quality control technology, and discloses an integrated circuit final testing method and system based on dynamic power consumption compensation. The method includes the following steps: acquiring power consumption prediction data for each test vector in the test program; querying a lookup table to obtain the expected voltage drop value corresponding to each test vector; performing feedforward pre-compensation on the supply voltage based on the expected voltage drop value before testing; monitoring the actual voltage at the power supply pin in real time during testing; comparing the actual voltage with the target voltage to generate an error signal; performing feedback fine-tuning compensation on the supply voltage based on the error signal; and collecting the actual voltage drop value under each test vector after testing, iteratively updating the expected voltage drop value of the corresponding test vector in the lookup table based on the deviation between the actual voltage drop value and the corresponding expected voltage drop value. This invention can solve the problems of test misjudgment, low yield, and insufficient test coverage caused by IR drop in traditional testing methods.
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