A rapid solution method for loop parameters of a high-voltage power supply and utilization experimental TRV device

Abstract

This invention relates to a rapid calculation method for loop parameters of a high-voltage power supply and utilization experimental device, belonging to the technical field of short-circuit breaking tests for large-capacity high-voltage electrical appliances. The method employs a direct method using the output of an impulse generator to establish the corresponding test loop circuit topology, simplifying it to a single-phase equivalent calculation circuit with the first open pole. Based on this circuit, a third-order circuit equation for the TRV waveform to be solved is established. For the third-order circuit equation of the waveform, engineering simplification conditions are substituted to simplify it into a series discharge solution, yielding simplified and per-unit solutions. The equations for the simplified and per-unit solutions are then dimensionless, reducing their dimensionality. Based on the dimensionless equation of the dimension-reduced waveform, the test voltage, dimensionless parameters, and peak time are substituted sequentially to calculate the initial values ​​of the device loop parameters. This invention can significantly improve the efficiency of short-circuit breaking tests in large-capacity test stations.

Description

Technical Field

[0001] This invention belongs to the technical field of short-circuit breaking test of large-capacity high-voltage electrical appliances, and relates to a method for rapid calculation of circuit parameters of a high-voltage power supply and consumption test TRV device. Background Technology

[0002] To simulate the transient recovery voltage (TRV) across the ports of a switchgear after current interruption, a TRV generator is required in the short-circuit breaking test circuit of the high-voltage switchgear in a large-capacity test station. The TRV generator uses a lumped parameter branch to simulate distributed parameters under actual operating conditions, oscillating at the instant the switchgear short-circuit breaks to generate the required transient recovery voltage waveform and standard parameters. Before the formal test, the test personnel adjust the main capacitor of the lumped parameter branch of the TRV generator based on calculated or empirical values. C s Damping resistor R s and parallel capacitors C d To meet the TRV waveform and test standard value parameters after short-circuit interruption.

[0003] Currently, domestic and international research on transient recovery voltage (TRV) mainly focuses on the numerical solution of TRV waveforms and standard test parameters after short-circuit breaking tests. Numerical calculations of TRV device circuit parameters before short-circuit breaking tests are limited, and the adjustment of TRV generator circuit parameters still relies heavily on manual experience. Furthermore, the TRV device circuit has… C s , R s , C d The three independent variable parameters, TRV waveform and test standard value parameters can be expressed as about C s , R s , C d The zero-state response of a third-order circuit under underdamped conditions suffers from problems such as numerous independent variables and nonlinearity. In practical engineering, obtaining the TRV waveform and experimental standard parameters is difficult. C s , R s , C d The individual relationships among the independent variables lead to the experimental parameters. C s , R s , C d The adjustment value cannot be calculated precisely.

[0004] Currently, the TRV generator circuit parameters C s , R s , C d The command is issued by the host computer. After each test, the parameters are determined based on the TRV waveform and test standard values ​​(e.g., peak voltage). U c 、 rate of increase dU c / dt 3. Delay t d The TRV waveform is adjusted (etc.) to gradually approximate and eventually meet all test standard parameters. For short-circuit breaking tests for which there is no prior adjustment experience, the TRV device circuit parameters need to undergo multiple short-circuit breaking tests and post-test parameter adjustments, which can take one to several hours, greatly reducing test efficiency. Furthermore, multiple adjustments can affect the normal breaking performance of the test specimen and reduce the success rate of the specimen passing the short-circuit breaking test.

[0005] Therefore, it is necessary to study a rapid calculation method for loop parameters of high-voltage power supply and utilization experimental TRV devices to improve the efficiency of short-circuit breaking tests in large-capacity test stations. Summary of the Invention

[0006] In view of this, the purpose of this invention is to provide a method for rapid calculation of loop parameters for a high-voltage power supply and utilization experimental TRV device.

[0007] To achieve the above objectives, the present invention provides the following technical solution:

[0008] A method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device is provided. The method includes: S1. The corresponding test circuit topology is established by using the direct method of the impulse generator output, which is simplified into the first-pole TRV single-phase equivalent calculation circuit. The third-order circuit equation of the TRV waveform to be solved is established based on the first-pole TRV single-phase equivalent calculation circuit. S2. For the third-order circuit equation of the TRV waveform to be solved, substitute it with the engineering simplification conditions to simplify it into RLC series discharge and solve it to obtain the simplified solution and per-unit solution of the TRV waveform. S3. The equations for the simplified and per-unit solutions of the TRV waveform are dimensionless to reduce their dimensionality. S4. Based on the dimensionless equation of the TRV waveform after dimension reduction, substitute the test voltage, dimensionless parameters, and peak time into the equation to calculate the initial values ​​of the TRV device circuit parameters. S5. Input the calculated initial value into the test circuit topology. Based on the TRV waveform parameters obtained by actual measurement of the initial value, reverse the solution to obtain the equivalent initial input value. Adjust the error based on the difference between the equivalent initial input value and the initial value. Input the adjusted TRV device circuit parameters into the test circuit topology again as the initial value. Repeat the test until the measured TRV waveform parameters meet the standard value.

[0009] Furthermore, in step S1, the three-phase outputs of the two impulse generator test power supplies 1G and 2G in the test circuit topology are respectively equipped with generator protection circuit breaker 1QFa / 1QFb, adjustable circuit impedance Z(2L+3R), phase-selective closing circuit breaker 2HK, auxiliary circuit breaker 4QF, voltage transformer U, current transformer I, and the switchgear under test. Test switch electrical appliances Grounding treatment; in each phase circuit, a corresponding TRV frequency modulation device is connected between the test circuit breaker 4QF and the voltage transformer U. The TRV frequency modulation device includes a main branch and a time delay branch. The main branch is connected in series with damping resistors. and frequency modulation capacitor A parallel capacitor is installed on the test branch. Damping resistor Frequency modulation capacitor and parallel capacitors These are the TRV loop parameters to be solved.

[0010] Furthermore, in step S1, the simplified first-open-pole TRV single-phase equivalent calculation circuit includes the single-phase power supply voltage. Inductors resistors , circuit breaker, damping resistor Frequency modulation capacitor Parallel capacitors and the tested switching electrical appliances Among them, power supply voltage The positive and negative terminals first branch out into two paths. In one branch, the inductor L, resistor R, and circuit breaker are connected in series. The damping resistor... and frequency modulation capacitor The frequency modulation capacitors are connected in series and in parallel between the two branches. and the tested switch electrical appliances Similarly, it is connected in parallel between the two branches, and the two branches are respectively connected to the TRV waveform acquisition device.

[0011] Furthermore, in step S1, the zero-state response of the third-order circuit is used to establish... The equations for the third-order circuit are:

[0012] In the formula, This refers to the power supply voltage. Frequency modulation capacitor The instantaneous voltage value on the surface; Damping resistor and frequency modulation capacitor The sum of the instantaneous voltage values ​​on the surface is also the TRV waveform to be solved; This is the resistance value. This is the inductance value. It represents electric current.

[0013] Furthermore, in step S2, the following is first given: The general solution to the third-order circuit equations:

[0014] In the formula, This is the general solution to the homogeneous system of equations. , , For constant terms, , , These are characteristic roots; For a particular solution to the equation, it equals time u s Numerical value; will Substituting into the third-order circuit equation, we obtain expression.

[0015] Furthermore, during the actual experiment in step S2, Furthermore, if the coefficients of the third-order differential term are negligible in actual value, then the characteristic roots can be ignored. The circuit is simplified to an RLC series discharge for solution:

[0016] Therefore, we can solve this. Simplified and per-unit solutions:

[0017] In the formula, The oscillation attenuation rate of the capacitive-inductive system. ; The frequency of the damped oscillation. , .

[0018] Furthermore, in step S3, dimensionless parameters are first defined. = 、 Then define dimensionless intermediate parameters respectively. 、 Then we have:

[0019]

[0020]

[0021]

[0022] Substituting the above four equations again From the simplified and per-unit solutions, we obtain the dimensionless expression: .

[0023] Furthermore, in step S4, the required TRV loop parameters are obtained based on the dimensionless expression. , , The process includes: Substituting the test voltage into the dimensionless expression At peak voltage moment , Take peak voltage Standard specified value, The derivative Based on the Newton-Raphson iteration, the partial derivative Jacobian matrix is ​​corrected. , ; Then, Substitute into the dimensionless expression, and based on the peak time corresponding At any moment Seek ; And because 3= Substitute The standard specifies the value, and the result is obtained. Take the value, and then according to The value is obtained , The value of ; Finally, the initial value is calculated. , , .

[0024] Furthermore, in step S4, the following two equations are solved simultaneously. : .

[0025] Furthermore, in step S4, by simultaneously solving the following two equations, we obtain... , Values: .

[0026] Furthermore, in step S4, according to , Solve for the value first , :

[0027] final , obtain all initial values , , .

[0028] Furthermore, in step S5, input... , , The TRV waveform and its test standard value obtained from the initial values ​​can be adjusted again based on the deviation after one test. , , The process is as follows: If the test result is not within the range specified in the standard, then substitute the peak voltage obtained from the first test. Peak voltage corresponding time Peak time rate of increase And the setting voltage related to the TRV voltage waveform. U r1 ,get:

[0029] The transcendental equation in the above formula is solved using the LM numerical algorithm to obtain... The equivalent input in the first experiment was obtained again by solving the initial value solution process. , , Values; Then, considering the parameter tuning boundary of the actual physical constraints, based on the difference between the equivalent input value and the initial value of the first experiment... , , Adjust the parameters:

[0030] according to , , Adjustment , , Then, subsequent rounds of testing are conducted; the above steps are repeated until the final peak voltage is reached. 、 Peak time 、 rate of increase It meets the requirements of the standard.

[0031] Furthermore, in step S5, the method for obtaining the TRV waveform based on the calculated TRV loop parameters is as follows: During the circuit breaker short-circuit breaking test, the impulse generators 1G and 2G output the voltage required for the test, and the reactor 2L and resistor 3R are adjusted to meet the short-circuit current required for the test. After the impulse generator enters a steady-state operating state, the test personnel issue a test start command, the generator excitation branch is shut down, and the generator enters a subtransient operating state to simulate a real short-circuit fault. Subsequently, timing commands control the tested switchgear T. o At the moment of disconnection, the short-circuit current of the switching device crosses zero, and the test power supply 1G and 2G flow to the main branch of the frequency modulation device. , and time delay branch Charging and electromagnetic oscillation generate the required TRV waveform.

[0032] The beneficial effects of this invention are as follows: This invention simplifies the short-circuit breaking test circuit into a single-phase equivalent circuit with the first pole open by thoroughly analyzing its three-phase symmetry characteristics. This simplification not only reduces the complexity of circuit analysis but also makes subsequent parameter calculations and equation establishment more direct and efficient. Furthermore, by incorporating the parallel relationship between the main branch and the time delay branch of the TRV frequency modulation device, the accuracy and practicality of the simplified circuit are further ensured, laying a solid foundation for subsequent steps.

[0033] This invention constructs a third-order circuit zero-state response equation describing the generation of TRV waveforms based on a simplified circuit. This equation accurately captures the complex relationship between TRV waveforms and loop parameters, providing theoretical support for parameter calculation. By numerically solving this equation, TRV waveform parameters that meet experimental standards can be obtained, thereby guiding actual experimental operations.

[0034] This invention introduces dimensionless parameters, simplifying complex expressions that depend on multiple dimensional parameters into forms controlled by only a few dimensionless numbers. This process not only eliminates interference from different units or orders of magnitude but also significantly improves computational efficiency and accuracy. Through dimensionless transformation, the scheme can more reliably reveal the essential laws of the system, providing a powerful tool for parameter optimization.

[0035] This invention also provides a parameter continuous adjustment mechanism based on experimental feedback. By obtaining measured data through the initial experiment and comparing it with calculated values, the scheme can accurately identify parameter deviations and make precise adjustments accordingly. This mechanism ensures the accuracy and reliability of experimental results while avoiding unnecessary adjustments that could affect the performance of the test samples, thereby improving the success rate and overall efficiency of the experiment.

[0036] Other advantages, objectives, and features of the invention will be set forth in part in the description which follows, and in part will be apparent to those skilled in the art from the following examination, or may be learned from practice of the invention. The objectives and other advantages of the invention can be realized and obtained through the following description. Attached Figure Description

[0037] To make the objectives, technical solutions, and advantages of the present invention clearer, the preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings, wherein: Figure 1 This is a schematic diagram of the overall process for a rapid calculation method of loop parameters for a high-voltage power supply and utilization experimental TRV device according to an embodiment of the present invention. Figure 2 This is a schematic diagram of the topology of the direct short-circuit breaking test circuit according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the first-opening-pole TRV single-phase equivalent calculation circuit according to an embodiment of the present invention; Figure 4 This is a diagram showing the TRV waveform and standard value measurement in an embodiment of the present invention. Detailed Implementation

[0038] The following specific examples illustrate the implementation of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various details in this specification can be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of the present invention. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0039] The accompanying drawings are for illustrative purposes only and are schematic diagrams, not actual pictures. They should not be construed as limiting the invention. To better illustrate the embodiments of the invention, some parts in the drawings may be omitted, enlarged, or reduced, and do not represent the actual product dimensions. It is understandable to those skilled in the art that some well-known structures and their descriptions may be omitted in the drawings.

[0040] In the accompanying drawings of the embodiments of the present invention, the same or similar reference numerals correspond to the same or similar components. In the description of the present invention, it should be understood that if terms such as "upper," "lower," "left," "right," "front," and "rear" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, they are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the drawings are only for illustrative purposes and should not be construed as limiting the present invention. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0041] Please see Figures 1-4 This is a method for rapid calculation of loop parameters of a high-voltage power supply experimental TRV device.

[0042] Example This embodiment provides a specific implementation process for a method of rapidly calculating loop parameters for a high-voltage power supply and utilization experimental TRV device, such as... Figure 1 As shown, it includes at least the following steps: S1. The corresponding test circuit topology is established by using the direct method of the impulse generator output, which is simplified into the first-pole TRV single-phase equivalent calculation circuit. The third-order circuit equation of the TRV waveform to be solved is established based on the first-pole TRV single-phase equivalent calculation circuit. S2. For the third-order circuit equation of the TRV waveform to be solved, substitute it with the engineering simplification conditions to simplify it into RLC series discharge and solve it to obtain the simplified solution and per-unit solution of the TRV waveform. S3. The equations for the simplified and per-unit solutions of the TRV waveform are dimensionless to reduce their dimensionality. S4. Based on the dimensionless equation of the TRV waveform after dimension reduction, substitute the test voltage, dimensionless parameters, and peak time into the equation to calculate the initial values ​​of the TRV device circuit parameters. S5. Input the calculated initial value into the test circuit topology. Based on the TRV waveform parameters obtained by actual measurement of the initial value, reverse the solution to obtain the equivalent initial input value. Adjust the error based on the difference between the equivalent initial input value and the initial value. Input the adjusted TRV device circuit parameters into the test circuit topology again as the initial value. Repeat the test until the measured TRV waveform parameters meet the standard value.

[0043] In step S1 of this embodiment, a direct method test circuit for the output of an impulse generator is used. The circuit topology is shown below. Figure 2 , Figure 2In the circuit diagram, 1G and 2G are the two-way impulse generator test power supplies, 1QFa / 1QFb are the generator protection circuit breakers, Z(2L+3R) is the adjustable circuit impedance in the test circuit, including the high-voltage regulating reactor and the high-voltage regulating resistor, 2HK is the phase-selective closing circuit breaker, 4QF is the accompanying circuit breaker, and U and I are the voltage transformer and current transformer, respectively. The test switchgear is used for testing. Specifically, the three-phase outputs of the two impulse generator test power supplies 1G and 2G are respectively equipped with generator protection circuit breakers 1QFa / 1QFb, adjustable loop impedance Z(2L+3R), phase-selective closing circuit breaker 2HK, auxiliary circuit breaker 4QF, voltage transformer U, current transformer I, and the test switchgear. Test switch electrical appliances Grounding treatment; in each phase circuit, a corresponding TRV frequency modulation device is connected between the test circuit breaker 4QF and the voltage transformer U. The TRV frequency modulation device includes a main branch and a time delay branch. The main branch is connected in series with damping resistors. and frequency modulation capacitor A parallel capacitor is installed on the test branch. Damping resistor Frequency modulation capacitor and parallel capacitors These are the TRV loop parameters to be solved.

[0044] Depend on Figure 2 The three-phase symmetry characteristics of the short-circuit breaking test circuit shown are used to establish a single-phase equivalent circuit for the first open pole without loss of generality, simplifying the calculation of TRV parameters from a three-phase circuit to a single-phase circuit. At the instant the circuit breaker opens, the capacitor on the TRV frequency modulation device is initially in a zero state ( t= 0 - Instantly charged to the equivalent single-phase power supply voltage ( This induces electromagnetic transients in the inductor and capacitor, and applies a TRV waveform across the circuit breaker terminals. The main branch damping resistor of the TRV frequency modulation device... Frequency modulation capacitor Parallel capacitor of the delay branch Parallel connection. The electromagnetic transient process of the above loop can be expressed as the zero-state response of a third-order circuit. The simplified first-open-pole TRV single-phase equivalent calculation circuit is shown in [reference needed]. Figure 3 As shown, it includes single-phase power supply voltage. Inductors resistors , circuit breaker, damping resistor Frequency modulation capacitor Parallel capacitors and the tested switching electrical appliances Among them, power supply voltage The positive and negative terminals first branch out into two paths. In one branch, the inductor L, resistor R, and circuit breaker are connected in series. The damping resistor... and frequency modulation capacitor The frequency modulation capacitors are connected in series and in parallel between the two branches. and the tested switch electrical appliances Similarly, it is connected in parallel between the two branches, and the two branches are respectively connected to the TRV waveform acquisition device.

[0045] From the zero-state response of a third-order circuit, we can establish... The equations for the third-order circuit are:

[0046] In the formula, This refers to the power supply voltage. Frequency modulation capacitor The instantaneous voltage value on the surface; Damping resistor and frequency modulation capacitor The sum of the instantaneous voltage values ​​on the surface is also the TRV waveform to be solved; This is the resistance value. This is the inductance value. It represents electric current.

[0047] In step S2 of this embodiment, the third-order circuit equation for the TRV waveform needs to be solved numerically, as there is no universal analytical root expression. The general solution form is given below:

[0048] In the formula, This is the general solution to the homogeneous system of equations. , , For constant terms, , , These are characteristic roots; For a particular solution to the equation, it equals time u s Numerical value, i.e. .Will Substituting into the third-order circuit equation, we obtain expression.

[0049] To ensure that the above characteristic equation has a numerical solution, simplified engineering conditions can be substituted. In actual experiments, Furthermore, the coefficients of the third-order differential term are actually very small in magnitude, so the characteristic roots can be ignored. The circuit is simplified to an RLC series discharge for solution:

[0050] Therefore, we can solve this. Simplified and per-unit solutions:

[0051] In the formula, The oscillation attenuation rate of the capacitive-inductive system. ; The frequency of the damped oscillation. , .

[0052] In step S3 of this embodiment, in order to find a more intuitive peak voltage 、 Peak time 、 rate of increase TRV device circuit parameters , , The representation method must be based on The simplified and per-unit solutions are dimensionality-reduced. Dimensionlessness transforms data of different units or orders of magnitude into a uniform scale, eliminating the influence of dimensions and allowing previously incomparable data to be directly compared and analyzed. Furthermore, this method has low requirements for data distribution, can alleviate the distortion of overall analysis by outliers, and more reliably reveals the essential laws of the system.

[0053] First, define the dimensionless parameter. = 、 Then define dimensionless intermediate parameters respectively. 、 Then we have:

[0054]

[0055]

[0056]

[0057] Substituting the above four equations again From the simplified and per-unit solutions, we obtain the dimensionless expression:

[0058] The dimensionless expression, after being processed by dimensionless transformation, will eliminate the original expression that depends on multiple dimensional parameters (such as...). , , , L, t ), simplified to and Express two dimensionless numbers, and dimensionless numbers Representing time, the behavior of complex systems relies on only one dimensionless number. Control. Furthermore, since all parameter combinations in the dimensionless expression are pure numbers, their dimensional consistency eliminates interference from different units, significantly improving the efficiency and accuracy of engineering calculations.

[0059] In step S4 of this embodiment, after simplification... and , Following this relationship, the required TRV loop parameters can be determined by following these steps. , , : Substituting the test voltage into the dimensionless expression At peak voltage moment , Take peak voltage Standard specified value, The derivative Therefore, the following two equations can be solved simultaneously. :

[0060] Using Newton-Raphson iterations, partial derivatives are obtained and the Jacobian matrix is ​​corrected. , .

[0061] In the dimensionless expression, substitute During peak time corresponding time (In this embodiment, Based on engineering experience, a value of 0.9 to 0.96 is generally used to obtain... .

[0062] And because 3= Substitute The standard specifies the value, and the result is obtained. Values ​​(dividing dimensionless values ​​into dimensionless values).

[0063] Furthermore, by simultaneously establishing the following two equations, we can obtain... , Values:

[0064] Depend on , The value is obtained through further calculation. R s , C s :

[0065] Finally, the initial value is obtained. , , .

[0066] In step S5 of this embodiment, due to the influence of stray capacitance in the actual test circuit, the circuit is activated. , , The TRV waveform obtained from the initial values ​​and its test standard values ​​will inevitably deviate from the calculated values. After one test, adjustments can be made based on this deviation. , , This is to eliminate inherent biases and obtain more accurate test results.

[0067] If the test results are not within the range specified in the standard, adjustments are required. , , Substitute the peak voltage obtained from the first test... Peak voltage corresponding time Peak time rate of increase And the setting voltage related to the TRV voltage waveform. U r1 ,like Figure 4 The TRV waveform and standard value measurement diagram shown above, when substituted with the actual measurement values, yield the following:

[0068] Solving the transcendental equation in the above equation using the LM numerical algorithm yields the following results. Furthermore, based on the initial value solution process, the equivalent input in the first experiment is obtained again. , , Values.

[0069] Then, considering the parameter tuning boundary of the actual physical constraints, based on the difference between the equivalent input value and the initial value of the first experiment... , , Adjust the parameters:

[0070] according to , , Adjustment , , After that, subsequent rounds of testing will be conducted.

[0071] Repeat the above steps until the final peak voltage is reached. 、 Peak time 、 rate of increase It meets the requirements of the standard.

[0072] During the circuit breaker short-circuit breaking test, the impulse generators 1G and 2G output the voltage required for the test, and the reactor 2L and resistor 3R are adjusted to meet the short-circuit current required for the test. After the impulse generator enters steady-state operation, the test personnel issue a test start command, the generator excitation branch is shut down, and the generator enters a subtransient operation state to simulate a real short-circuit fault. Subsequently, timing commands control the tested switchgear T. o At the moment of disconnection, the short-circuit current of the switching device crosses zero, and the test power supply 1G and 2G flow to the main branch of the frequency modulation device. , and time delay branch During charging, electromagnetic oscillation generates the required TRV waveform, satisfying the TRV peak value and reference time. t 3 and latency t d Requirements.

[0073] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device, characterized in that: The method includes: S1. The corresponding test circuit topology is established by using the direct method of the impulse generator output, which is simplified into the first-pole TRV single-phase equivalent calculation circuit. The third-order circuit equation of the TRV waveform to be solved is established based on the first-pole TRV single-phase equivalent calculation circuit. S2. For the third-order circuit equation of the TRV waveform to be solved, substitute it with the engineering simplification conditions to simplify it into RLC series discharge and solve it to obtain the simplified solution and per-unit solution of the TRV waveform. S3. The equations for the simplified and per-unit solutions of the TRV waveform are dimensionless to reduce their dimensionality. S4. Based on the dimensionless equation of the TRV waveform after dimension reduction, substitute the test voltage, dimensionless parameters, and peak time into the equation to calculate the initial values ​​of the TRV device circuit parameters. S5. Input the calculated initial value into the test circuit topology. Based on the TRV waveform parameters obtained by actual measurement of the initial value, reverse the solution to obtain the equivalent initial input value. Adjust the error based on the difference between the equivalent initial input value and the initial value. Input the adjusted TRV device circuit parameters into the test circuit topology again as the initial value. Repeat the test until the measured TRV waveform parameters meet the standard value.

2. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 1, characterized in that: In step S1, the three-phase outputs of the two impulse generator test power supplies 1G and 2G in the test circuit topology are respectively equipped with generator protection circuit breaker 1QFa / 1QFb, adjustable circuit impedance Z(2L+3R), phase selection closing circuit breaker 2HK, auxiliary circuit breaker 4QF, voltage transformer U, current transformer I, and the switchgear under test. Test switch electrical appliances Grounding treatment; in each phase circuit, a corresponding TRV frequency modulation device is connected between the test circuit breaker 4QF and the voltage transformer U. The TRV frequency modulation device includes a main branch and a time delay branch. The main branch is connected in series with damping resistors. and frequency modulation capacitor A parallel capacitor is installed on the test branch. Damping resistor Frequency modulation capacitor and parallel capacitors These are the TRV loop parameters to be solved.

3. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 2, characterized in that: In step S1, the simplified first-open-pole TRV single-phase equivalent calculation circuit includes the single-phase power supply voltage. Inductors resistors , circuit breaker, damping resistor Frequency modulation capacitor Parallel capacitors and the tested switching electrical appliances Among them, power supply voltage The positive and negative terminals first branch out into two paths. In one branch, the inductor L, resistor R, and circuit breaker are connected in series. The damping resistor... and frequency modulation capacitor The frequency modulation capacitors are connected in series and in parallel between the two branches. and the tested switch electrical appliances Similarly, it is connected in parallel between the two branches, and the two branches are respectively connected to the TRV waveform acquisition device.

4. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 3, characterized in that: In step S1, the zero-state response of the third-order circuit is used to establish... The equations for the third-order circuit are: In the formula, This refers to the power supply voltage. Frequency modulation capacitor The instantaneous voltage value on the surface; Damping resistor and frequency modulation capacitor The sum of the instantaneous voltage values ​​on the surface is also the TRV waveform to be solved; This is the resistance value. This is the inductance value. It represents electric current.

5. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 4, characterized in that: In step S2, firstly, the following is given: The general solution to the third-order circuit equations: In the formula, This is the general solution to the homogeneous system of equations. , , For constant terms, , , These are characteristic roots; For a particular solution to the equation, it equals time u s Numerical value; will Substituting into the third-order circuit equation, we obtain expression.

6. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 5, characterized in that: In the actual test process of step S2, Furthermore, if the coefficients of the third-order differential term are negligible in actual value, then the characteristic roots can be ignored. The circuit is simplified to an RLC series discharge for solution: Therefore, we can solve this. Simplified and per-unit solutions: In the formula, The oscillation attenuation rate of the capacitive-inductive system. ; The frequency of the damped oscillation. , .

7. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 6, characterized in that: In step S3, the dimensionless parameter is first defined. = 、 Then define dimensionless intermediate parameters respectively. 、 Then we have: Substituting the above four equations again From the simplified and per-unit solutions, we obtain the dimensionless expression: .

8. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 7, characterized in that: In step S4, the required TRV loop parameters are obtained based on the dimensionless expression. , , The process includes: Substituting the test voltage into the dimensionless expression At peak voltage moment , Take peak voltage Standard specified value, The derivative Based on the Newton-Raphson iteration, the partial derivative Jacobian matrix is ​​corrected. , ; Then, Substitute into the dimensionless expression, and based on the peak time corresponding At any moment Seek ; And because 3= Substitute The standard specifies the value, and the result is obtained. Take the value, and then according to The value is obtained , The value of ; Finally, the initial value is calculated. , , .

9. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 8, characterized in that: In step S4, solve the following two equations simultaneously. : 。 10. A method for rapid calculation of loop parameters for a high-voltage power supply and utilization experimental TRV device according to claim 9, characterized in that: In step S4, the following two equations are solved simultaneously to obtain the solution. , Values: 。 11. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 10, characterized in that: In step S4, according to , Solve for the value first , : final , obtain all initial values , , .

12. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 10, characterized in that: In step S5, input , , The TRV waveform and its test standard value obtained from the initial values ​​can be adjusted again based on the deviation after one test. , , The process is as follows: If the test result is not within the range specified in the standard, then substitute the peak voltage obtained from the first test. Peak voltage corresponding time Peak time rate of increase And the setting voltage related to the TRV voltage waveform. U r1 ,get: The transcendental equation in the above formula is solved using the LM numerical algorithm to obtain... The equivalent input in the first experiment was obtained again by solving the initial value solution process. , , Values; Then, considering the parameter tuning boundary of the actual physical constraints, based on the difference between the equivalent input value and the initial value of the first experiment... , , Adjust the parameters: according to , , Adjustment , , Then, subsequent rounds of testing are conducted; the above steps are repeated until the final peak voltage is reached. 、 Peak time 、 rate of increase It meets the requirements of the standard.

13. The method for rapid calculation of loop parameters of a high-voltage power supply and utilization experimental TRV device according to claim 12, characterized in that: In step S5, the method for obtaining the TRV waveform based on the calculated TRV loop parameters is as follows: During the circuit breaker short-circuit breaking test, the impulse generators 1G and 2G output the voltage required for the test, and the reactor 2L and resistor 3R are adjusted to meet the short-circuit current required for the test. After the impulse generator enters a steady-state operating state, the test personnel issue a test start command, the generator excitation branch is shut down, and the generator enters a subtransient operating state to simulate a real short-circuit fault. Subsequently, timing commands control the tested switchgear T. o At the moment of disconnection, the short-circuit current of the switching device crosses zero, and the test power supply 1G and 2G flow to the main branch of the frequency modulation device. , and time delay branch Charging and electromagnetic oscillation generate the required TRV waveform.

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