Gas cluster ion beam apparatus
By introducing neutralizing gas and reflective electrodes into the gas cluster ion beam equipment, combined with an insulator-free lens structure, the problems of high cost and complex structure of existing equipment are solved, and efficient and flat material substrate surface processing is achieved.
Patent Information
- Application Number
- CN202511789169.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2025-11-07
- Filing Date
- 2025-12-01
- Publication Date
- 2026-06-02
AI Technical Summary
Existing gas cluster ion beam equipment requires expensive vacuum pump systems and long deflection electrodes under high gas pressure, resulting in high equipment costs and complex structures, making it difficult to achieve extremely flat material substrate surface processing.
By introducing neutralizing gas into the beam delivery system, neutralizing gas is used to collide and dissociate with gas cluster ions to generate a neutral beam, which then reflects unneutralized ions at the reflecting electrode. Combined with an electrostatic lens structure that does not use insulators, stable neutralization and efficient processing are achieved.
This enables extremely flat processing on material substrates, reducing equipment costs and structural complexity while improving processing efficiency and surface smoothness.