Probe testing mechanism of full-automatic LED spectrometer
By combining bidirectional synchronous drive and elastic buffer layer, the problem of stable electrical contact when the probe testing mechanism contacts the LED lamp bead pins is solved, achieving high-precision testing and improved reliability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANXI CHAOHUI SEMICONDUCTOR CO LTD
- Filing Date
- 2026-04-07
- Publication Date
- 2026-06-09
AI Technical Summary
Existing probe testing mechanisms are prone to poor contact due to insufficient pressure when contacting LED chip pins, or pin deformation or detachment due to excessive pressure, affecting test yield and product reliability.
It employs bidirectional synchronous drive and positioning components to synchronously clamp the pins from both sides. Combined with an elastic buffer layer and pressure feedback closed-loop control, it achieves stable electrical contact and precise position alignment through segmented control strategy and dual-parameter cross-verification fault diagnosis.
This improves the accuracy and reliability of testing, reduces the risk of pin damage, and enhances the accuracy of fault diagnosis and the stability of equipment operation.
Smart Images
Figure CN122171854A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of LED spectral testing equipment technology, and in particular to a probe testing mechanism for a fully automatic LED spectral analyzer. Background Technology
[0002] The fully automatic LED beam sorter is a key piece of equipment on the LED production line used for photoelectric parameter testing and sorting of LED chips. The probe testing mechanism is used to form electrical contact with the pins of the LED chips during testing to transmit test signals.
[0003] Existing probe testing mechanisms typically employ a single-sided driving method, where the probe approaches and adheres to the LED chip's pin from one side, relying on the pressure between the probe and the pin to ensure electrical contact. However, this method suffers from several problems in practical applications: if the pressure between the probe and the pin is too low, poor contact can easily lead to inaccurate test data; if the pressure is too high, the probe may excessively compress the pin to the other side, causing bending or deformation, or even detachment or damage to the pin from the LED chip, severely impacting test yield and product reliability. Therefore, achieving stable electrical contact between the probe and the pin without damaging the pin has become a pressing technical problem to be solved in this field. Summary of the Invention
[0004] Based on the technical problems existing in the prior art, this invention proposes a probe testing mechanism for a fully automatic LED spectrometer.
[0005] This invention proposes a probe testing mechanism for a fully automatic LED spectrometer, comprising a probe testing component and a positioning component, the probe testing component and the positioning component being arranged opposite to each other; the probe testing component has two probes for contacting corresponding pins, one end of each probe being a terminal and the other end being a contact tip, the opposite sides of the two contact tips being beveled; the positioning component includes a base and a positioning block, the positioning block being fixed on the base, the positioning block having two positioning portions on the side facing the contact tip, and an avoidance notch being provided between the two positioning portions; the probe testing mechanism for the fully automatic LED spectrometer further includes a bidirectional synchronous drive component, the bidirectional synchronous drive component having two movable ends capable of synchronously approaching or moving away, the probe testing component and the positioning component being respectively mounted on the corresponding movable ends.
[0006] Preferably, the positioning component further includes an elastic buffer layer disposed on the surface of the positioning part in contact with the pin, the elastic buffer layer being made of conductive rubber or conductive silicone and having a preset nonlinear elastic modulus; the probe testing component further includes a pressure sensor disposed between the probe and the limiting guide sleeve, for real-time detection of the axial pressure on the probe.
[0007] Preferably, the system further includes a controller, which is electrically connected to the pressure sensor and the bidirectional synchronous drive component, respectively. The controller is configured to control the drive parameters of the bidirectional synchronous drive component using a segmented control strategy based on the pressure value fed back by the pressure sensor and the preset nonlinear elastic modulus of the elastic buffer layer. The segmented control strategy includes driving at a first speed during the initial compression phase of the elastic buffer layer, driving at a second speed during the linear compression phase, and driving in a micro-stepping mode during the saturation compression phase.
[0008] Preferably, the controller is further configured to: simultaneously acquire the pressure signal of the pressure sensor and the loop resistance signal between the probe and the positioning component; and execute corresponding fault handling actions when the combined state of the pressure signal and the loop resistance signal meets preset abnormal conditions; the abnormal conditions include at least: when the pressure value is lower than a second preset threshold and the resistance value is higher than a preset resistance threshold, it is determined to be poor contact; when the pressure value exceeds a first preset threshold and the resistance value is abnormal, it is determined to be a mechanical fault.
[0009] Preferably, the controller has a built-in pressure-time integration algorithm for calculating the dynamic dead zone range based on the nonlinear elastic modulus of the elastic buffer layer. When the feedback pressure fluctuation of the pressure sensor is within the dynamic dead zone range, the controller controls the bidirectional synchronous drive component to maintain its current position. When the pressure fluctuation exceeds the dynamic dead zone range for a set time, the controller controls the bidirectional synchronous drive component to adjust its position.
[0010] Preferably, the probe testing assembly further includes a base plate, a top plate, a limiting guide sleeve, and a spring. A pair of limiting guide sleeves for sliding installation of the probes are fixed in the groove of the base plate. The springs are fixed on opposite sides of the two probes respectively. The other end of the springs is fixed to the groove wall of the base plate. The top plate is fixed above the base plate by bolts.
[0011] Preferably, the bidirectional synchronous drive assembly is a lead screw and slider module, which includes a slide rail, sliders, a bidirectional screw, and a motor. The two sliders are slidably connected to the slide rail, the bidirectional screw is rotatably connected to the slide rail and threadedly connected to the two sliders, and the motor is fixed to the end of the slide rail and driven by the bidirectional screw.
[0012] Preferably, the contact tip surface of the probe is provided with a gold plating layer, the thickness of which is 0.5 μm to 2 μm.
[0013] Preferably, the clearance notch is used to accommodate the contact tip during testing, preventing interference between the positioning block and the contact tip.
[0014] Preferably, the side of the positioning part that contacts the pin is set as a bevel, a plane, or an outwardly convex arc surface.
[0015] Compared with the prior art, the present invention provides a probe testing mechanism for a fully automatic LED spectrometer, which has the following advantages: 1. By setting up a bidirectional synchronous drive component, the probe testing component and the positioning component are respectively installed on two movable ends that can synchronously approach or move away. During the test, the probe and the positioning component approach the pin synchronously from both sides, so that the inclined surface of the probe and the inclined surface of the positioning part jointly press the pin tightly from both sides. The pin is subjected to symmetrical clamping force during the test, avoiding deformation or damage caused by unilateral compression, while ensuring stable electrical contact between the probe and the pin, thus improving the accuracy and reliability of the test.
[0016] 2. By setting the contact tip of the probe as an inclined plane and setting a corresponding positioning part on the positioning component, the probe and the positioning part can form a gradually narrowing clamping space during synchronous approach, guiding the pin to automatically center and improving the repeatability accuracy of the test position.
[0017] 3. By setting up a collaborative mechanism between the elastic buffer layer and the pressure feedback closed-loop control system, the organic integration of physical buffering and intelligent control is achieved. The elastic buffer layer is made of conductive rubber or conductive silicone material, which has a nonlinear elastic modulus. During the clamping process, it first undergoes elastic deformation to absorb impact energy. The controller adopts a segmented control strategy based on the nonlinear characteristics of the elastic buffer layer. In the initial compression stage, it drives rapidly to shorten the idle stroke, drives smoothly in the linear compression stage to avoid impact, and drives in micro-steps in the saturation compression stage to achieve fine pressure adjustment.
[0018] 4. By simultaneously acquiring pressure signals and loop resistance signals through the controller, a fault diagnosis mechanism with dual-parameter cross-verification is established. When the combined state of the pressure signal and the loop resistance signal meets the preset abnormal conditions, the controller can accurately distinguish different abnormal types such as poor contact, mechanical failure, and component deterioration, and execute corresponding fault handling actions, thereby improving the fault diagnosis accuracy and operational reliability of the equipment.
[0019] 5. By using the pressure-time integral algorithm built into the controller and combining it with the nonlinear elastic modulus of the elastic buffer layer to set a dynamic dead zone, the elastic buffer layer is allowed to absorb the fluctuations when the pressure fluctuations are within the dynamic dead zone range. The motor is only activated to adjust when the pressure fluctuations exceed the range and continue for a set time. This avoids mechanical wear and pin fatigue caused by frequent adjustments and significantly improves the stability of the contact pressure. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 This is a schematic diagram of the internal structure of the probe testing component of the present invention; Figure 3 This is a schematic diagram of the positioning component structure of the present invention; Figure 4 This is a schematic diagram of the bidirectional synchronous drive component structure of the present invention; Figure 5 This is a schematic diagram of the state of the present invention during testing.
[0021] In the diagram: 1. Probe testing assembly; 11. Base plate; 12. Top plate; 13. Limiting guide sleeve; 14. Probe; 141. Contact tip; 142. Terminal block; 15. Spring; 2. Positioning assembly; 21. Base; 22. Positioning block; 221. Positioning part; 222. Clearance notch; 3. Bidirectional synchronous drive assembly; 31. Slide rail; 32. Slider; 33. Bidirectional screw; 34. Motor. Detailed Implementation
[0022] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.
[0023] In the description of this invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.
[0024] Reference Figures 1 to 5This invention provides a probe testing mechanism for a fully automatic LED spectrometer, comprising a probe testing component 1, a positioning component 2, and a bidirectional synchronous drive component 3. The probe testing component 1 and the positioning component 2 are arranged opposite to each other, and the bidirectional synchronous drive component 3 has two movable ends capable of synchronously approaching or moving away. The probe testing component 1 and the positioning component 2 are respectively mounted on their corresponding movable ends. This structure allows the probe testing component 1 and the positioning component 2 to synchronously approach from both sides of the LED bead pin during testing, achieving symmetrical clamping of the pin.
[0025] Specifically, the probe testing assembly 1 includes a base plate 11, a top plate 12, limiting guide sleeves 13, probes 14, and springs 15. The base plate 11 serves as the base of the probe testing assembly 1, and has a mounting groove on its top. A pair of limiting guide sleeves 13 are fixed within the mounting groove, arranged horizontally for slidingly mounting the probes 14. The probes 14 are made of conductive metal, with one end being a terminal 142 for connecting test cables, and the other end being a contact tip 141 for forming electrical contact with the pins of LED beads. The opposing sides of the contact tips 141 of the two probes 14 are beveled, forming an angle of 30° to 60° relative to the axial direction of the probes 14. Springs 15 are fixed to the opposing sides of the probes 14, with the other end of each spring fixed to the groove wall of the mounting groove in the base plate 11. The springs 15 are compression springs. The top plate 12 is fixed above the bottom plate 11 by bolts, and is used to close the mounting groove and axially limit the limiting guide sleeve 13 and the probe 14.
[0026] The probe testing assembly 1 is also equipped with a pressure sensor, which is installed between the probe 14 and the limiting guide sleeve 13 to detect the axial pressure on the probe 14 in real time. The pressure sensor can be a thin-film pressure sensor or a miniature force sensor, and its signal output terminal is electrically connected to the controller.
[0027] The positioning component 2 includes a base 21 and a positioning block 22. The base 21 is fixedly mounted on the corresponding movable end of the bidirectional synchronous drive component 3, and the positioning block 22 is fixed to the base 21 by bolts or adhesive. The positioning block 22 has two positioning portions 221 on the side facing the contact tip 141, and the positions of the two positioning portions 221 correspond to the positions of the two probes 14 respectively. An avoidance notch 222 is provided between the two positioning portions 221 to accommodate the contact tip 141 during testing and to prevent interference between the positioning block 22 and the contact tip 141. The side of the positioning portion 221 that contacts the pin can be set as a slope, a plane, or an outwardly convex arc surface. Preferably, the positioning portion 221 is set as a slope, and its tilt angle matches the slope of the contact tip 141 of the probe 14, so that the two can form a gradually narrowing clamping space when they approach synchronously.
[0028] The positioning component 2 also includes an elastic buffer layer, which is disposed on the surface of the positioning part 221 that contacts the pin. The elastic buffer layer is made of conductive rubber or conductive silicone and has a preset nonlinear elastic modulus. The resistance value of this material changes regularly with the compression amount: in the initial compression stage (compression amount <20%), the resistance value is high; in the linear compression stage (compression amount 20%-80%), the resistance value decreases linearly with the increase of compression amount; in the saturated compression stage (compression amount >80%), the resistance value tends to stabilize. The thickness of the elastic buffer layer is 0.3 mm to 1.0 mm, and its surface is provided with a micro-protrusion structure, which forms multi-point contact with the pin surface under pressure, effectively breaking through the oxide layer on the pin surface and improving the reliability of electrical contact.
[0029] The bidirectional synchronous drive assembly 3 includes, but is not limited to, the lead screw and slider module used in this embodiment. The lead screw and slider module includes a slide rail 31, sliders 32, a bidirectional screw 33, and a motor 34. The slide rail 31 is fixedly mounted on the frame of the spectrometer. Two sliders 32 are slidably connected to the slide rail 31, serving as the two movable ends of the bidirectional synchronous drive assembly 3. The bidirectional screw 33 is rotatably connected to the slide rail 31, with oppositely oriented external threads at both ends, which are threadedly connected to the internal threaded holes of the two sliders 32. The motor 34 is fixed to the end of the slide rail 31, and its output shaft is driven by a coupling to one end of the bidirectional screw 33. When the motor 34 drives the bidirectional screw 33 to rotate, the two sliders 32 move synchronously closer or further away along the slide rail 31, thereby driving the probe testing assembly 1 and the positioning assembly 2 to move synchronously.
[0030] The controller is a programmable logic controller or an embedded microcontroller, which is electrically connected to the pressure sensor, the motor 34 of the bidirectional synchronous drive assembly 3, and the test circuit. The controller has preset nonlinear elastic modulus curves of the elastic buffer layer, a first preset threshold, a second preset threshold, and drive speed parameters for each stage.
[0031] During the testing process, once the LED bead to be tested is transported to the testing station and positioned, the controller starts the motor 34, driving the bidirectional screw 33 to rotate. The two sliders 32 then move the probe testing assembly 1 and the positioning assembly 2 closer together. The controller employs a segmented control strategy to control the driving process. First, during the initial compression phase of the elastic buffer layer (when the elastic buffer layer has not yet made contact with the pin or the contact pressure is less than the first threshold), the controller controls the motor 34 to drive at a first speed (high speed), causing the probe 14 and the positioning component 2 to quickly approach the pin, shortening the idle travel time. At this time, the pressure value fed back by the pressure sensor is close to zero.
[0032] When the elastic buffer layer begins to contact the pin and enters the linear compression phase, the pressure value fed back by the pressure sensor begins to rise linearly. After the controller detects that the pressure value has entered the preset linear range, it automatically switches the drive speed of motor 34 to the second speed (medium speed) to ensure a smooth increase in contact pressure and avoid impact caused by excessive speed. During this phase, the elastic buffer layer undergoes elastic deformation, absorbing mechanical impact energy and keeping the pressure rise rate gradual.
[0033] When the pressure value fed back by the pressure sensor approaches the preset target threshold range, the controller determines that the elastic buffer layer has entered the saturation compression stage and switches the drive mode of motor 34 to micro-step drive mode. This allows for gradual adjustment of the clamping position with extremely small steps, achieving precise control of the contact pressure. The step angle of the micro-step drive is 1 / 8 to 1 / 32 of that in the conventional drive mode, which can improve the pressure control accuracy to within ±0.05N.
[0034] When the pressure value fed back by the pressure sensor reaches the preset target threshold range, the controller controls the motor 34 to stop driving, maintain the current clamping state, and the test circuit starts to perform electrical parameter testing.
[0035] During the clamping process, the controller simultaneously acquires the pressure signal from the pressure sensor and the loop resistance signal between probe 14 and positioning component 2 (forming a loop through the conductive path of the elastic buffer layer), establishing a fault diagnosis mechanism based on dual-parameter cross-verification. The controller has built-in preset abnormal condition judgment rules: When the pressure value is lower than the second preset threshold and the resistance value is higher than the preset resistance threshold, the controller determines that there is poor contact, issues an adjustment command, and controls the motor 34 to move closer in micro-step mode until the pressure value enters the target range or the resistance value drops to the normal range. When the pressure value exceeds the first preset threshold and the resistance value is abnormal (too high or open circuit), the controller determines it to be a mechanical fault (such as pin warping, foreign object jamming, etc.), immediately controls motor 34 to stop driving and reverse slightly, and at the same time issues an alarm signal; When the pressure value is normal but the resistance value is abnormally high, the controller determines that the elastic buffer layer is deteriorated or the surface is contaminated, and prompts the operator to perform maintenance or replacement. When both pressure and resistance values are normal, the controller determines that the clamping state is normal and maintains the current drive parameters.
[0036] In addition, the controller incorporates a pressure-time integration algorithm to calculate the dynamic dead zone range based on the nonlinear elastic modulus of the elastic buffer layer. The dynamic dead zone range is defined as the upper and lower limits of allowable pressure fluctuations during the linear compression and saturation compression phases of the elastic buffer layer. This dynamic dead zone range changes dynamically with the compression of the elastic buffer layer: a smaller compression results in a wider dead zone range, allowing for larger pressure fluctuations; a larger compression results in a narrower dead zone range, requiring more precise pressure control. When the pressure fluctuation reported by the pressure sensor is within the dynamic dead zone range, the controller controls motor 34 to maintain its current position, allowing the elastic buffer layer to absorb the pressure fluctuation through its own elastic deformation; when the pressure fluctuation exceeds the dynamic dead zone range and persists for more than a set time (e.g., 50ms), the controller controls motor 34 to adjust its position to restore the target pressure value.
[0037] After the test is completed, the controller controls the motor 34 to rotate in the opposite direction, and the two sliders 32 drive the probe test component 1 and the positioning component 2 to move away synchronously. The pin is released, and the LED can enter the next station.
[0038] The synergistic effect of the aforementioned segmented control strategy, dual-parameter cross-validation mechanism, and dynamic dead-zone algorithm enables the physical buffering characteristics of the elastic buffer layer and the intelligent control algorithm of the controller to form an organic whole, achieving the unity of rapid response and overshoot-free contact, effective suppression of pressure fluctuations, accurate identification of abnormal operating conditions, and a significant improvement in contact reliability.
[0039] In terms of materials and processes, the contact tip 141 of probe 14 is coated with a gold layer with a thickness of 0.5 μm to 2 μm. The gold plating has good conductivity and corrosion resistance, which can reduce contact resistance, improve the transmission quality of test signals, and extend the service life of probe 14. The base plate 11, top plate 12, base 21, positioning block 22, and other structural components are made of aluminum alloy or stainless steel, providing good rigidity and wear resistance.
[0040] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.
Claims
1. A probe testing mechanism for a fully automatic LED spectrometer, comprising a probe testing component (1) and a positioning component (2), wherein the probe testing component (1) and the positioning component (2) are arranged opposite to each other; characterized in that, The probe testing assembly (1) has two probes (14) for contacting the corresponding pins. One end of the probe (14) is a terminal (142), and the other end is a contact tip (141). The opposite sides of the two contact tips (141) are set as bevels. The positioning assembly (2) includes a base (21) and a positioning block (22). The positioning block (22) is fixed on the base (21). The positioning block (22) has two positioning parts (221) on the side facing the contact tip (141). A clearance notch (222) is provided between the two positioning parts (221). The probe testing mechanism of the fully automatic LED beam splitter also includes a bidirectional synchronous drive assembly (3). The bidirectional synchronous drive assembly (3) has two movable ends that can move closer or further away synchronously. The probe testing assembly (1) and the positioning assembly (2) are respectively installed on the corresponding movable ends.
2. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The positioning component (2) further includes an elastic buffer layer, which is disposed on the surface of the positioning part (221) in contact with the pin. The elastic buffer layer is made of conductive rubber or conductive silicone and has a preset nonlinear elastic modulus. The probe testing component (1) further includes a pressure sensor, which is disposed between the probe (14) and the limiting guide sleeve (13) for real-time detection of the axial pressure on the probe (14).
3. The probe testing mechanism for a fully automatic LED spectrometer according to claim 2, characterized in that, It also includes a controller, which is electrically connected to the pressure sensor and the bidirectional synchronous drive assembly (3) respectively; the controller is configured to control the drive parameters of the bidirectional synchronous drive assembly (3) using a segmented control strategy based on the pressure value fed back by the pressure sensor and the preset nonlinear elastic modulus of the elastic buffer layer. The segmented control strategy includes: driving at a first speed during the initial compression phase of the elastic buffer layer, driving at a second speed during the linear compression phase, and driving in a micro-stepping mode during the saturation compression phase.
4. The probe testing mechanism for a fully automatic LED spectrometer according to claim 3, characterized in that, The controller is also configured to: simultaneously acquire the pressure signal of the pressure sensor and the loop resistance signal between the probe (14) and the positioning component (2), and execute corresponding fault handling actions when the combined state of the pressure signal and the loop resistance signal meets the preset abnormal conditions; The abnormal conditions include at least the following: when the pressure value is lower than the second preset threshold and the resistance value is higher than the preset resistance threshold, it is determined to be a poor contact; when the pressure value exceeds the first preset threshold and the resistance value is abnormal, it is determined to be a mechanical failure.
5. The probe testing mechanism for a fully automatic LED spectrometer according to claim 3, characterized in that, The controller has a built-in pressure-time integration algorithm to calculate the dynamic dead zone range based on the nonlinear elastic modulus of the elastic buffer layer. When the feedback pressure fluctuation of the pressure sensor is within the dynamic dead zone range, the controller controls the bidirectional synchronous drive component (3) to maintain its current position. When the pressure fluctuation exceeds the dynamic dead zone range for a set time, the controller controls the bidirectional synchronous drive component (3) to adjust its position.
6. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The probe testing assembly (1) also includes a base plate (11), a top plate (12), a limiting guide sleeve (13), and a spring (15). A pair of limiting guide sleeves (13) for sliding installation of the probes (14) are fixed in the groove of the base plate (11). The springs (15) are fixed on opposite sides of the two probes (14). The other end of the springs (15) is fixed on the groove wall of the base plate (11). The top plate (12) is fixed above the base plate (11) by bolts.
7. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The bidirectional synchronous drive assembly (3) is a lead screw and slider module. The lead screw and slider module includes a slide rail (31), a slider (32), a bidirectional screw (33), and a motor (34). The two sliders (32) are slidably connected to the slide rail (31). The bidirectional screw (33) is rotatably connected to the slide rail (31) and threadedly connected to the two sliders (32). The motor (34) is fixed to the end of the slide rail (31) and driven by the bidirectional screw (33).
8. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The contact tip (141) of the probe (14) is provided with a gold plating layer, the thickness of which is 0.5 μm to 2 μm.
9. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The clearance notch (222) is used to accommodate the contact tip (141) during testing, preventing interference between the positioning block (22) and the contact tip (141).
10. The probe testing mechanism for a fully automatic LED spectrometer according to claim 1, characterized in that, The side of the positioning part (221) that contacts the pin is set as a slope, a plane or an outwardly convex arc surface.