Composite insulator detection method based on temperature pre-stress and related device

Abstract

The application relates to the technical field of detection, in particular to a composite insulator detection method based on temperature prestress and related devices. The method comprises the following steps: temperature control is performed on a composite insulator to be detected according to preset temperature treatment parameters, so that the composite insulator has temperature prestress; vacuum treatment is performed on the composite insulator according to preset vacuum treatment parameters, so that the composite insulator is in a negative pressure environment; a speckle image of the composite insulator in the negative pressure environment is acquired; and a detection result of the composite insulator is generated based on the speckle image. The application improves the detection precision of the composite insulator.

Description

Technical Field

[0001] This application relates to the field of testing technology, specifically to a method and related apparatus for testing composite insulators based on temperature prestress. Background Technology

[0002] Composite insulators are components used in power systems to insulate and support conductors. They mainly consist of a glass fiber epoxy resin core, surrounded by a polymer silicone rubber sheath and sheds. However, the manufacturing process of composite insulators (such as material preparation, molding, and vulcanization) is complex, and any substandard process can lead to debonding defects at the interface between the core and the sheath.

[0003] Currently, related technologies generally use laser misaligned speckle interferometry to detect composite insulators. However, due to the weakness and concealment of interface debonding, the detection accuracy of composite insulators is relatively low. Summary of the Invention

[0004] In view of the above, it is necessary to propose a composite insulator testing method and related device based on temperature prestress to solve the technical problem of low testing accuracy of composite insulators in the prior art.

[0005] In a first aspect, this application provides a method for testing composite insulators based on temperature prestress. The method includes: controlling the temperature of the composite insulator to be tested according to preset temperature processing parameters to give the composite insulator temperature prestress; performing vacuum processing on the composite insulator according to preset vacuum processing parameters to place the composite insulator in a negative pressure environment; acquiring a speckle image of the composite insulator in the negative pressure environment; and generating a test result of the composite insulator based on the speckle image.

[0006] In the above-described composite insulator testing method based on temperature prestress, optionally, the temperature processing parameters include a first temperature, a second temperature, a temperature duration, and a temperature transition rate. The first temperature is greater than the second temperature. The temperature control of the composite insulator to be tested according to the preset temperature processing parameters includes a heating operation and a cooling operation. The heating operation includes: performing a heating operation on the composite insulator according to the temperature transition rate, so that the temperature of the composite insulator rises to the first temperature; the cooling operation includes: when the duration of the composite insulator reaching the first temperature is greater than or equal to the temperature duration, performing a cooling operation on the composite insulator according to the temperature transition rate, so that the temperature of the composite insulator drops to the second temperature.

[0007] Optionally, in the above-mentioned composite insulator testing method based on temperature prestress, the temperature processing parameters may further include the total duration of temperature cycles. The step of controlling the temperature of the composite insulator to be tested according to the preset temperature processing parameters may further include: when the duration for which the temperature of the composite insulator reaches the second temperature is equal to the duration of temperature duration, repeating the temperature control of the composite insulator until the duration of temperature control of the composite insulator reaches the total duration of temperature cycles.

[0008] Optionally, in the above-mentioned composite insulator detection method based on temperature prestress, the step of acquiring the speckle image of the composite insulator in the negative pressure environment includes: in the negative pressure environment, controlling the composite insulator to rotate along its own preset axis according to a plurality of preset rotation parameters, and acquiring the speckle image of the composite insulator after each rotation.

[0009] Optionally, in the above-described method for detecting composite insulators based on temperature prestress, generating the detection result of the composite insulator based on the speckle image includes: extracting features from the speckle image to obtain a first image feature; extracting features from a preset reference image to obtain a second image feature; and generating the detection result based on the first image feature and the second image feature.

[0010] Optionally, in the above-described composite insulator testing method based on temperature prestress, the testing results may include the defect location and the corresponding defect range.

[0011] Secondly, this application provides a composite insulator testing system based on temperature prestress. The composite insulator testing system based on temperature prestress includes: a temperature control chamber for controlling the temperature of the composite insulator to be tested according to preset temperature processing parameters, so that the composite insulator has temperature prestress; a vacuum chamber for vacuum processing the composite insulator according to preset vacuum processing parameters, so that the composite insulator is in a negative pressure environment; acquiring a speckle image of the composite insulator in the negative pressure environment; and a workstation for generating the test result of the composite insulator based on the speckle image.

[0012] Optionally, the temperature-prestress-based composite insulator testing system described above may further include a conveyor belt for conveying the composite insulator to the temperature control box for temperature control, thereby giving the composite insulator temperature prestress, and for conveying the composite insulator to the vacuum box for vacuum treatment, thereby placing the composite insulator in a negative pressure environment.

[0013] Thirdly, this application provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the composite insulator detection method based on temperature prestress as described above.

[0014] Fourthly, this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for detecting composite insulators based on temperature prestress.

[0015] Based on the above, this application regulates the expansion of interface debonding in composite insulators by applying temperature prestress, enabling the treated composite insulators to detect interface debonding defects in laser speckle detection, thereby improving the detection accuracy of composite insulators. Attached Figure Description

[0016] Figure 1 This is a schematic diagram illustrating an application scenario of the composite insulator testing method based on temperature prestress provided in an embodiment of this application.

[0017] Figure 2 This is a flowchart of a composite insulator testing method based on temperature prestress provided in an embodiment of this application.

[0018] Figure 3 This is a schematic diagram of a composite insulator testing system based on temperature prestress provided in an embodiment of this application.

[0019] Figure 4 This is a schematic diagram of a temperature control box used to control the temperature of a composite insulator according to an embodiment of this application.

[0020] Figure 5 This is a schematic diagram of an electronic device provided in an embodiment of this application. Detailed Implementation

[0021] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0022] In the embodiments of this application, it should be noted that, unless otherwise expressly specified and limited, the word "for example" is used to indicate an example, illustration, or description. Any embodiment or design scheme described as "for example" in the embodiments of this application should not be construed as being better or more advantageous than other embodiments or design schemes. Specifically, the use of the word "for example" is intended to present the relevant concepts in a specific manner.

[0023] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0024] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined as "first" or "second" may explicitly or implicitly include one or more features. Furthermore, in the description of this application, "multiple" means two or more, unless otherwise expressly and specifically limited.

[0025] To better understand the above-mentioned objectives, features, and advantages of the present invention, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0026] Please see Figure 1 This is a schematic diagram illustrating an application scenario of a composite insulator testing method based on temperature prestress provided in an embodiment of this application. Figure 1 As shown, the temperature control box 10 and the vacuum box 20 transport the composite insulator 50 to be tested via a conveyor belt 40. The vacuum box 20 and the workstation 30 are connected via wired or wireless means (such as at least one of Bluetooth, Wi-Fi, RF communication, ZigBee, 4G / 5G mobile communication, NB-IoT, and LoRa). The conveyor belt 40 transports the composite insulator 50 into the temperature control box 10, where the temperature control box 10 controls the temperature of the composite insulator 50 to give it temperature prestress. Then, the conveyor belt 40 transports the temperature-prestressed composite insulator 50 into the vacuum box 20, where the vacuum box 20 provides a negative pressure environment for the composite insulator 50 and acquires speckle images of the composite insulator 50 under negative pressure. The vacuum box 20 uploads the acquired speckle images to the workstation 30, which generates the test results for the composite insulator 50 based on the speckle images.

[0027] In some embodiments of this application, the temperature control chamber 10 can be a temperature control chamber with heating, cooling and temperature holding functions, such as a programmable temperature chamber; the vacuum chamber 20 can be a vacuum chamber that can provide a stable negative pressure environment, such as a programmable vacuum chamber; and the workstation 30 can be any of the following: an electronic device with data processing capabilities, such as a mobile phone, tablet computer, laptop computer, personal computer, server, and industrial control workstation.

[0028] In some embodiments of this application, the vacuum chamber 20 includes a vacuum pump 21 and a camera 22. The vacuum pump 21 is used to adjust the vacuum level inside the vacuum chamber 20, and the camera 22 is used to acquire speckle images of the composite insulator 50. The camera 22 may include a charge-coupled device (CCD) camera, a complementary metal-oxide-semiconductor (CMOS) camera, etc.

[0029] In some embodiments of this application, the effective space dimensions inside the temperature control box 10 and the vacuum box 20 can be designed according to the dimensions of the composite insulator. For example, the effective space dimensions can be designed as 1m (length) × 0.5m (width) × 0.5m (height) to accommodate the dimensions of the composite insulator. This embodiment does not impose any limitations.

[0030] Please see Figure 2 The above is a flowchart of a composite insulator testing method based on temperature prestress provided in an embodiment of this application.

[0031] Specifically, the composite insulator testing method based on temperature prestress includes the following steps. Depending on different requirements, the order of some steps in the flowchart can be changed, and some steps can be omitted.

[0032] S201: The temperature of the composite insulator to be tested is controlled according to the preset temperature treatment parameters so that the composite insulator has temperature prestress.

[0033] In some embodiments of this application, temperature prestress can be achieved by controlling the temperature of the composite insulator (such as heating and / or cooling) and utilizing the thermal expansion and contraction characteristics of the material to generate pre-existing stress inside the composite insulator due to the constraint of deformation.

[0034] In some embodiments of this application, the temperature processing parameters include a first temperature, a second temperature, a temperature duration, and a temperature transition rate. The first temperature is greater than the second temperature. The first temperature can be the highest temperature at which the composite insulator is controlled, and the second temperature can be the lowest temperature at which the composite insulator is controlled. For example, the first temperature can be 103°C, and the second temperature can be -3°C. In some embodiments of this application, the temperature duration can be the duration for which the composite insulator is maintained at the first temperature, and / or the duration for which the composite insulator is maintained at the second temperature. For example, the temperature duration can be 10 hours, 11 hours, etc. In some embodiments of this application, the temperature transition rate can be the temperature change value per unit time, used to characterize the speed at which the temperature switches from one steady state to another. For example, 10°C / min indicates that the temperature rises / falls by 10°C per minute.

[0035] In some embodiments of this application, temperature control of the composite insulator to be tested according to preset temperature processing parameters includes heating and cooling operations. Heating operations include, but are not limited to: performing a heating operation on the composite insulator according to a temperature transition rate, causing the temperature of the composite insulator to rise to a first temperature. Cooling operations include, but are not limited to: performing a cooling operation on the composite insulator according to a temperature transition rate when the duration for which the composite insulator reaches the first temperature is greater than or equal to the duration of temperature duration, causing the temperature of the composite insulator to decrease to a second temperature.

[0036] In one example, the composite insulator is heated according to the temperature transition rate until the temperature of the composite insulator reaches 103°C and is maintained at 103°C for 10 hours. Then, the composite insulator is cooled according to the temperature transition rate until the temperature of the composite insulator reaches -3°C and is maintained at -3°C for 10 hours. Then, the composite insulator is heated again according to the temperature transition rate, and so on.

[0037] S202: Perform vacuum treatment on the composite insulator according to the preset vacuum treatment parameters, so that the composite insulator is in a negative pressure environment.

[0038] In some embodiments of this application, the vacuum parameters may include any one or more parameters such as vacuum degree and vacuum rate. When the vacuum chamber is evacuated at a vacuum rate until a preset vacuum degree is reached, the composite insulator is determined to be in a preset negative pressure environment. For example, by evacuating the vacuum chamber at a vacuum rate of 20 Pa / min until a preset vacuum degree, such as -20 kPa, is reached, the composite insulator is determined to be in a preset negative pressure environment.

[0039] In some embodiments of this application, the vacuum chamber can be evacuated using a vacuum evacuation device. The vacuum evacuation device may include any one or more of a vacuum pump, vacuum generator, vacuum unit, vacuum pumping system, etc.

[0040] S203: Acquire a speckle image of a composite insulator under negative pressure.

[0041] In some embodiments of this application, speckle images of composite insulators under negative pressure can be acquired using a CCD camera built into a vacuum chamber. For example, the resolution of the CCD camera can be 1392×1040 pixels.

[0042] In some embodiments of this application, the CCD camera can be configured with a target light source to acquire a speckle image of a composite insulator under negative pressure. The target light source is used to emit coherent laser light to irradiate the composite insulator, causing interference of scattered light from the surface of the composite insulator and forming a speckle field. The CCD camera receives this speckle field to acquire the corresponding speckle image. For example, the target light source can be configured as a laser with a wavelength of 532 nm and an output power of 400 mW. The target light source can also include any one of laser diodes, semiconductor lasers, and other light sources capable of emitting coherent light.

[0043] In some embodiments of this application, the speckle image can be formed at the receiving end by interference of wavelets reflected / scattered at each point on the surface due to random phase differences when a coherent light source illuminates an object with a surface roughness greater than or close to the wavelength of light (such as a composite insulator), resulting in a high-contrast, granular, spatially randomly distributed intensity pattern.

[0044] S204: Based on the speckle image, generate the detection results of the composite insulator.

[0045] In some embodiments of this application, the detection results include the defect location and the corresponding defect range. In other embodiments, the detection results may also include the composite insulator defect type, etc.

[0046] In some embodiments of this application, a deep learning model can be used to identify speckle images and generate detection results for composite insulators. The deep learning model can include any one of the following: Convolutional Neural Network (CNN), Residual Network (ResNet), Visual Geometry Group Network (VGG), You Only Look Once (YOLO), Faster Region-Convolutional Neural Network (Faster R-CNN), U-Net, and SegNet.

[0047] Based on the above, this application regulates the expansion of interface debonding in composite insulators by applying temperature prestress, enabling the treated composite insulators to detect interface debonding defects in laser speckle detection, thereby improving the detection accuracy of composite insulators.

[0048] In some other embodiments of this application, generating a detection result for a composite insulator based on a speckle image includes: extracting features from the speckle image to obtain a first image feature; extracting features from a preset reference image to obtain a second image feature; and generating a detection result based on the first image feature and the second image feature.

[0049] In some embodiments of this application, the temperature processing parameters further include the total duration of temperature cycles. Temperature control of the composite insulator to be tested is performed according to the preset temperature processing parameters, and further includes: when the duration for which the temperature of the composite insulator reaches the second temperature is equal to the duration of the temperature duration, the temperature control of the composite insulator is repeatedly performed until the duration of temperature control of the composite insulator reaches the total duration of temperature cycles.

[0050] In some embodiments of this application, the total temperature cycle time can be the total cycle time of multiple heating and cooling operations on the composite insulator. The cycle ends when the time for temperature control of the composite insulator reaches the total temperature cycle time.

[0051] In some embodiments of this application, the first image feature may be the interference fringe feature of a speckle image, and the second image feature may be the interference fringe feature of a reference image.

[0052] In some embodiments of this application, a first image feature can be extracted from a speckle image and a second image feature can be extracted from a reference image using any of the following methods: phase extraction (such as Fourier transform), fringe center extraction (such as extremum method), edge detection (such as Canney edge detection algorithm), and digital speckle interferometry (DSPI).

[0053] In some embodiments of this application, the first image features and the second image features can be matched, compared, or subtracted to generate feature difference information, and then a detection result can be generated based on the feature difference information. The feature difference information may include information such as the location and magnitude of the difference.

[0054] In some embodiments of this application, obtaining a speckle image of a composite insulator in a negative pressure environment includes: in a negative pressure environment, controlling the composite insulator to rotate along its own preset axis according to a plurality of preset rotation parameters, and obtaining a speckle image of the composite insulator after each rotation.

[0055] In some embodiments of this application, after acquiring a speckle image of the composite insulator under negative pressure, the insulator can be rotated along its central axis at a preset rotation angle. After each rotation, a speckle image of the composite insulator is acquired until a speckle image of the composite insulator from a full-view (360°) angle is acquired. The preset rotation angle can be 90°, 60°, etc., and is not limited in this embodiment.

[0056] Please see Figure 3 This is a schematic diagram of a composite insulator detection system based on temperature prestress provided in an embodiment of this application.

[0057] In some embodiments of this application, the composite insulator testing system includes a temperature control chamber 301, a vacuum chamber 302, and a workstation 303. The temperature control chamber 301 controls the temperature of the composite insulator to be tested according to preset temperature processing parameters, thereby giving the composite insulator temperature prestress. The vacuum chamber 302 performs vacuum processing on the composite insulator according to preset vacuum processing parameters, placing the composite insulator in a negative pressure environment; it acquires speckle images of the composite insulator in the negative pressure environment; and the workstation 303 generates the testing results of the composite insulator based on the speckle images.

[0058] In some embodiments of this application, based on the above... Figure 2The temperature-prestressed composite insulator testing method in the illustrated embodiment shares the same concept. This application provides a temperature-prestressed composite insulator testing system that can be used to perform the aforementioned temperature-prestressed composite insulator testing method. For ease of explanation, the schematic diagram of the temperature-prestressed composite insulator testing system embodiment only shows the parts relevant to the embodiments of this application. Those skilled in the art will understand that the illustrated structure does not constitute a limitation on the temperature-prestressed composite insulator testing system, and it may include more or fewer components than illustrated, or combine certain components, or have different component arrangements.

[0059] In some embodiments of this application, the composite insulator testing system based on temperature prestress further includes a conveyor belt for conveying the composite insulator to a temperature control box for temperature control, so that the composite insulator has temperature prestress, and for conveying the composite insulator to a vacuum box for vacuum treatment, so that the composite insulator is in a negative pressure environment.

[0060] In some embodiments of this application, after the conveyor belt transports the composite insulator to the vacuum box, a new composite insulator can be transported to a temperature control box for temperature control, or a new composite insulator can be transported to a temperature control box for temperature control simultaneously. This cycle is repeated to form a production line platform for testing composite insulators.

[0061] In some embodiments of this application, the composite insulator can be conveyed to a temperature control box via a conveyor belt. When the temperature control box detects the composite insulator, it opens its door, allowing the conveyor belt to transfer the composite insulator into the temperature control box. The temperature control box then closes its door to apply a temperature prestress to the composite insulator. When the total temperature cycle time is reached, the temperature control box opens its door, allowing the conveyor belt to transfer the composite insulator from the temperature control box to a vacuum box. The vacuum box performs vacuum treatment on the composite insulator according to preset vacuum treatment parameters, placing the composite insulator in a negative pressure environment. A speckle image of the composite insulator in the negative pressure environment is then acquired and uploaded to a workstation. Based on the speckle image, the workstation generates the detection result of the composite insulator.

[0062] Please see Figure 4 This is a schematic diagram of a temperature control box for temperature control of a composite insulator according to an embodiment of this application. T1 represents a first temperature, T2 represents a second temperature, t1 represents the duration of holding the first temperature, t2 represents the duration of holding the second temperature, and t3 represents the total duration of temperature cycles. t1 and t2 can be the same or different, and this embodiment does not impose any limitations.

[0063] After the composite insulator enters the temperature control box, the temperature control box heats the composite insulator to a temperature of T1, and the duration of T1 is greater than or equal to t1. Then, the temperature control box cools the composite insulator to a temperature of T2, and the duration of T1 is greater than or equal to t2. This process continues until the duration of temperature control of the composite insulator reaches t3. At this point, the temperature control of the composite insulator ends, and the conveyor belt transports the composite insulator to the vacuum box.

[0064] Please see Figure 5 This is a schematic diagram of an electronic device provided in an embodiment of this application.

[0065] This application provides a method for detecting composite insulators based on temperature prestress, which can be applied to one or more electronic devices 100. The electronic device 100 is a device that can automatically perform numerical calculations and / or information processing according to pre-set or stored instructions. Its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), digital signal processors (DSPs), embedded devices, etc. The electronic device 100 includes, but is not limited to, mobile phones, tablet computers, laptops, personal computers, and servers.

[0066] Specifically, the electronic device 100 can be used to control the temperature of the composite insulator, so that the composite insulator has temperature prestress, to perform vacuum treatment on the composite insulator, so that the composite insulator is in a negative pressure environment, to acquire a speckle image of the composite insulator in the negative pressure environment, and to generate the detection result of the composite insulator based on the speckle image, thereby improving the detection accuracy of the composite insulator.

[0067] In some embodiments of this application, the electronic device 100 can be communicatively connected to devices such as desktop computers, laptops, handheld computers, and cloud servers.

[0068] In some embodiments of this application, the electronic device 100 can interact with the user via a keyboard, mouse, remote control, touchpad, or voice control device.

[0069] Combination Figure 5As shown, in some embodiments of this application, the electronic device 100 includes, but is not limited to, a memory 101, a processor 102, and a computer program stored in the memory 101 and executable on the processor 102, such as a temperature-prestressed composite insulator detection program. When the computer program is executed by the processor, it implements the temperature-prestressed composite insulator detection method as described in the above embodiments.

[0070] Figure 5 Only an electronic device 100 with a memory 101 and a processor 102 is shown. It will be understood by those skilled in the art that... Figure 5 The structure shown does not constitute a limitation on the electronic device 100, and may include fewer or more components than shown, or combine certain components, or have different component arrangements.

[0071] The memory 101 in the electronic device 100 stores multiple computer-readable instructions to implement a composite insulator detection method based on temperature prestress. The processor 102 can execute multiple instructions to achieve: after applying temperature prestress to the composite insulator, acquiring a speckle image of the composite insulator in a vacuum environment, and acquiring the detection result of the composite insulator based on the speckle image, thereby improving the detection accuracy of the composite insulator.

[0072] Specifically, the processor 12's implementation method for the above instructions can be found in [reference needed]. Figure 2 The descriptions of the relevant steps in the corresponding embodiments are not repeated here.

[0073] Those skilled in the art will understand that the schematic diagram is merely an example of the electronic device 100 and does not constitute a limitation on the electronic device 100. The electronic device 100 may be a bus-type structure or a star-type structure. The electronic device 100 may also include more or fewer other hardware or software than shown in the diagram, or different component arrangements. For example, the electronic device 100 may also include input / output devices, network access devices, etc.

[0074] It should be noted that electronic device 100 includes, but is not limited to, mobile phones, tablets, laptops, personal computers and servers. Other existing or future electronic products that are applicable to this application should also be included within the scope of protection of this application and are incorporated herein by reference.

[0075] The memory 101 includes at least one type of computer-readable storage medium, which can be non-volatile or volatile. Computer-readable storage media include flash memory, portable hard drives, multimedia cards, card-type memories (e.g., SD memory, DX memory, etc.), magnetic memory, magnetic disks, optical disks, etc. In some embodiments, the memory 101 can be an internal storage unit of the electronic device 100, such as the portable hard drive of the electronic device 100. In other embodiments, the memory 101 can also be an external storage device of the electronic device 100, such as a plug-in portable hard drive, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electronic device 100. The memory 101 can be used not only to store application software and various types of data installed on the electronic device 100, such as the code of a composite insulator detection program based on temperature prestress, but also to temporarily store data that has been output or will be output.

[0076] In some embodiments, processor 102 may be composed of integrated circuits, such as a single packaged integrated circuit or multiple integrated circuits with the same or different functions, including combinations of one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and various control chips. Processor 102 is the control unit of electronic device 100, connecting various components of the entire electronic device 100 via various interfaces and lines. It executes programs or modules stored in memory 11 (e.g., executing a temperature-prestressed composite insulator detection program) and calls data stored in memory 101 to perform various functions and process data of electronic device 100.

[0077] Processor 102 executes the operating system of electronic device 100 and various installed applications. Processor 12 executes applications to implement the steps in each of the above embodiments of a composite insulator detection method based on temperature prestress, for example... Figure 2 The steps are shown.

[0078] For example, a computer program may be divided into one or more modules / units, one or more of which are stored in memory 101 and executed by processor 102 to complete this application. One or more modules / units may be a series of computer-readable instruction segments capable of performing a specific function, which describe the execution process of the computer program in electronic device 100.

[0079] The integrated unit implemented as a software functional module described above can be stored in a computer-readable storage medium. This software functional module, stored in a storage medium, includes several instructions to cause a computer device (which may be a personal computer, computer equipment, or network device, etc.) or processor to execute a portion of the temperature-prestressed composite insulator detection method according to various embodiments of this application.

[0080] If the modules / units integrated in the electronic device 100 are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments can also be implemented by a computer program instructing related hardware devices. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above.

[0081] Computer programs include computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. Computer-readable media can include: any entity or device capable of carrying computer program code, recording media, USB flash drives, portable hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), random access memory, and other types of memory.

[0082] Furthermore, the computer-readable storage medium may primarily include a stored program area and a stored data area, wherein the stored program area may store the operating system, an application program required for at least one function, etc.; and the stored data area may store data created based on the use of blockchain nodes, etc.

[0083] The bus can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. This bus can be divided into address bus, data bus, control bus, etc. For ease of representation, in... Figure 5 The symbol is represented by only one arrow, but this does not mean that there is only one bus or one type of bus. The bus is configured to implement communication between the memory 11 and at least one processor 102, etc.

[0084] This application also provides a computer-readable storage medium (not shown), which stores computer-readable instructions. These computer-readable instructions are executed by a processor in an electronic device to implement a temperature-prestress-based composite insulator detection method according to any of the above embodiments.

[0085] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules is only a logical functional division, and other division methods may be used in actual implementation.

[0086] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0087] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in the form of hardware plus software functional modules.

[0088] Furthermore, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices described in the specification may also be implemented by a single unit or device through software or hardware. Terms such as "first," "second," etc., are used to indicate names and do not indicate any specific order.

[0089] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application.

Claims

1. A method for testing composite insulators based on temperature prestress, characterized in that, The method includes: The composite insulator to be tested is temperature-controlled according to preset temperature processing parameters so that the composite insulator has temperature prestress. The composite insulator is subjected to vacuum treatment according to preset vacuum treatment parameters, so that the composite insulator is in a negative pressure environment; Acquire a speckle image of the composite insulator under the negative pressure environment; Based on the speckle image, the detection result of the composite insulator is generated.

2. The composite insulator testing method based on temperature prestress as described in claim 1, characterized in that, The temperature processing parameters include a first temperature, a second temperature, a temperature duration, and a temperature transition rate. The first temperature is greater than the second temperature. The temperature control of the composite insulator to be tested according to the preset temperature processing parameters includes heating and cooling operations, wherein: The heating operation includes: performing a heating operation on the composite insulator according to the temperature transition rate, so that the temperature of the composite insulator rises to the first temperature; The cooling operation includes: when the temperature of the composite insulator reaches the first temperature for a duration greater than or equal to the duration of the temperature duration, performing a cooling operation on the composite insulator according to the temperature transition rate, so that the temperature of the composite insulator is reduced to the second temperature.

3. The composite insulator testing method based on temperature prestress as described in claim 2, characterized in that, The temperature processing parameters also include the total temperature cycle time, and the temperature control of the composite insulator to be tested according to the preset temperature processing parameters also includes: When the temperature of the composite insulator reaches the second temperature for a duration equal to the duration of the temperature, the temperature control of the composite insulator is repeated until the duration of temperature control of the composite insulator reaches the total duration of the temperature cycle.

4. The method for testing composite insulators based on temperature prestress as described in claim 1, characterized in that, The process of acquiring a speckle image of the composite insulator under the negative pressure environment includes: In the negative pressure environment, the composite insulator is controlled to rotate along its own preset axis according to a number of preset rotation parameters, and a speckle image of the composite insulator is acquired after each rotation.

5. The method for testing composite insulators based on temperature prestress as described in claim 1, characterized in that, The step of generating the detection result of the composite insulator based on the speckle image includes: Feature extraction is performed on the speckle image to obtain the first image features; Feature extraction is performed on a preset reference image to obtain second image features; The detection result is generated based on the first image features and the second image features.

6. The composite insulator testing method based on temperature prestress as described in claim 5, characterized in that, The detection results include the location of the defect and the corresponding defect range.

7. A composite insulator testing system based on temperature prestress, characterized in that, The composite insulator testing system based on temperature prestress includes: The temperature control box controls the temperature of the composite insulator to be tested according to preset temperature processing parameters, so that the composite insulator has temperature prestress. A vacuum chamber is used to vacuum the composite insulator according to preset vacuum processing parameters, so that the composite insulator is in a negative pressure environment; a speckle image of the composite insulator in the negative pressure environment is acquired; The workstation generates the detection results of the composite insulator based on the speckle image.

8. The composite insulator testing system based on temperature prestress as described in claim 7, characterized in that, The composite insulator testing system based on temperature prestress also includes a conveyor belt, which is used to transport the composite insulator to the temperature control box for temperature control, so that the composite insulator has temperature prestress, and to transport the composite insulator to the vacuum box for vacuum treatment, so that the composite insulator is in a negative pressure environment.

9. An electronic device, characterized in that, The electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When executed by the processor, the computer program implements the composite insulator detection method based on temperature prestress as described in any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the composite insulator detection method based on temperature prestress as described in any one of claims 1 to 6.

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