An integrated intelligent test processing system for low voltage switch of nuclear power plant

Abstract

The application discloses an integrated intelligent test processing system for a low-voltage switch of a nuclear power plant, and relates to the field of intelligent testing.The system comprises a test management platform, which comprises a data management module, a test management module, a test collection module, an edge processing module and a fusion early warning module.The data management module is used for obtaining low-voltage switch management information and setting a switch test node.The test management module is used for constructing monitoring loop information according to the switch test node.The test collection module is used for obtaining test collection information.The edge processing module is used for performing edge processing on the monitoring loop information and obtaining corresponding edge test information.The fusion early warning module is used for performing multi-dimensional data fusion early warning analysis on the obtained edge test information and obtaining test verification information.The integrated management module is used for performing integrated state evaluation on the low-voltage switch management information according to the test verification information and obtaining test evaluation data.The application improves the accuracy and efficiency of the test processing process of the low-voltage switch of the nuclear power plant to a certain extent.

Description

Technical Field

[0001] This invention relates to the field of intelligent testing technology, and in particular to an integrated intelligent testing and processing system for low-voltage switches in nuclear power plants. Background Technology

[0002] Low-voltage switchgear is the core execution and protection unit of the power distribution system, safety-grade switchboard, and MCC motor control center in nuclear power plants. It undertakes functions such as power distribution, overload and short-circuit protection, and equipment start-up and shutdown control. Its operational reliability is directly related to the effective execution of safety functions such as reactor shutdown, emergency cooling, and containment isolation. However, existing testing equipment generally suffers from problems such as functional dispersion, serious data silos, unfriendly human-machine interaction, and poor field adaptability. It is difficult to meet the stringent requirements of nuclear power plants for high reliability, high safety, and real-time response. Furthermore, traditional methods rely on manual operation and experience-based judgment, which is prone to introducing the risk of misjudgment, and cannot achieve automatic recording, intelligent diagnosis, and remote collaborative analysis of the entire testing process.

[0003] A search revealed Chinese invention patent CN116125269A, which discloses a low-voltage intelligent switch testing system and method, comprising: a test management module, a control module, and an interface module. The test management module, control module, and interface module are connected and integrated. The test management module sends test commands to the control module and receives feedback signals through the control module, automatically acquiring data from the sample under test and automatically determining the function and performance of the sample based on the test commands and feedback signals. The control module receives test commands from the test management module, outputs electrical quantities to the interface module, and uploads the acquired test data of the sample under test to the test management module. The interface module converts and processes the electrical quantities output by the control module and transmits them to the sample under test. Through the integrated design of different functional modules and the adoption of communication-based automatic closed-loop technology, comprehensive and efficient testing of low-voltage intelligent switches is achieved.

[0004] Compared with existing technologies, the Chinese invention patent with patent number CN116125269A can integrate test management, control, and interface modules, and achieve comprehensive and efficient monitoring based on communication-based automatic closed-loop technology.

[0005] However, in actual use, the above system only sends test commands to the control module, which then obtains the corresponding test data based on the test commands. In this process, it is impossible to make dynamic adjustments according to the actual test situation, which affects the test efficiency to some extent. In addition, the test results obtained are only analyzed and processed based on the currently obtained test data, which cannot ensure their accuracy, thus affecting the test accuracy to some extent. Summary of the Invention

[0006] The purpose of this invention is to address the shortcomings of low efficiency and insufficient accuracy in existing technologies by proposing an integrated intelligent testing and processing system for low-voltage switches in nuclear power plants.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] An integrated intelligent test processing system for low-voltage switches in nuclear power plants includes a test management platform, which comprises a data management module, a test management module, a test acquisition module, an edge processing module, a fusion early warning module, and an integrated management module.

[0009] The data management module is used to acquire low-voltage switch management information, set switch test nodes according to the low-voltage switch management information, and identify and store the switch test nodes.

[0010] The test management module is used to perform overall test analysis on the obtained switch test nodes and to build monitoring loop information for each switch test node based on the test analysis results.

[0011] The test acquisition module is used to sequentially monitor and acquire multiple physical quantities at each switch test node based on the monitoring circuit information, and obtain test acquisition information.

[0012] The edge processing module is used to perform edge processing based on the test acquisition information obtained at each switch test node within the monitoring loop information, and to obtain the edge test information at each switch test node respectively.

[0013] The fusion early warning module is used to perform multi-dimensional data fusion early warning analysis on the edge test information at each switch test node according to the monitoring circuit information to which it belongs, to determine the test verification information between each switch test node, and to send the obtained test verification information to the integration management module.

[0014] The integrated management module is used to perform integrated status assessment of low-voltage switch management information based on the test verification information at each switch test node, and to obtain test assessment data.

[0015] The above technical solution further includes: the process of setting the switch test node by the data management module includes:

[0016] The data management module includes a data entry unit and an identification management unit;

[0017] The data entry unit is used to acquire low-voltage switch management information, which includes basic information of nuclear power plant equipment, circuit connection and operation information, low-voltage switch equipment parameter information, function trigger parameter information, and historical test status information.

[0018] The identification management unit is used to perform digital twin processing on the nuclear power plant equipment basic information, circuit connection operation information and low-voltage switch equipment parameter information corresponding to the obtained low-voltage switch management information, construct a nuclear power plant operation model, set switch test nodes in the constructed nuclear power plant operation model according to historical test status information, and map each switch test node to the nuclear power plant operation model according to the low-voltage switch management information involved, and identify and store the corresponding switch test nodes according to the mapping results.

[0019] Furthermore, the process by which the test management module constructs monitoring loop information for each switch test node includes:

[0020] The identification storage results of each switch test node in the nuclear power plant operation model are obtained. Test features are extracted based on the identification storage results to obtain test feature data of each switch test node. The test feature data includes test frequency features and test correlation features.

[0021] Set up a test timeline, and sequentially map the test feature data within each switch test node horizontally to the corresponding position on the test timeline. Based on the horizontal mapping result, vertically map the test-related features to the corresponding position on the test timeline to generate a vertical test-related axis.

[0022] According to the mapping order of the test time axis, the mutual exclusion switching logic between multiple test lines is sequentially sorted for each test-related axis to obtain the switching information between each test-related axis, and the monitoring loop information is constructed based on the obtained switching information.

[0023] Furthermore, the process by which the test acquisition module obtains test acquisition information includes:

[0024] The test acquisition module includes an acquisition management unit and a test acquisition unit;

[0025] The data acquisition and management unit is used to set the adjustment restriction information of the corresponding test associated axis according to the position information of each identical switch test node on the test time axis, and to reorder each test associated axis on the test time axis according to the corresponding monitoring loop information and adjustment restriction information to obtain the adjusted test time axis.

[0026] The test acquisition unit is used to sequentially acquire the switch test nodes mapped on the test time axis obtained in the acquisition management unit, and to sequentially monitor and acquire multiple physical quantities at the corresponding switch test nodes according to the monitoring circuit information corresponding to each switch monitoring node, thereby obtaining test acquisition information.

[0027] Furthermore, the process by which the edge processing module acquires edge test information at each switch test node includes:

[0028] The edge processing module includes an edge management unit and an edge analysis unit;

[0029] The edge management unit is used to obtain the test standard data of each switch test node based on the corresponding low-voltage switch equipment parameter information, function trigger parameter information and historical test status information in the low-voltage switch management information, and to mark and store the obtained test standard data according to the switch test node.

[0030] The edge analysis unit is used to acquire the test timeline adjusted by the test acquisition module and the test acquisition information acquired by each switch test node. It compares the acquired test acquisition information with the test standard data stored in the edge management unit and acquires the edge test information at each switch test node based on the comparison results.

[0031] Furthermore, the process by which the fusion early warning module sequentially performs multi-dimensional data fusion early warning analysis on the edge test information at each switch test node according to the monitoring circuit information to which it belongs includes:

[0032] The fusion early warning module includes a multi-dimensional fusion unit and a multi-dimensional verification unit;

[0033] The multi-source fusion unit is used to obtain the circuit connection operation information corresponding to the low-voltage switch management information involved at each switch test node, and to separate and mark the obtained circuit connection operation information according to each switch test node, and obtain the corresponding operation factors respectively.

[0034] The edge test information obtained at each switch test node is visualized according to the test association axis on the test time axis and the operational factors involved. The fusion priority is set according to the visualization results. The operational factors involved on the test time axis are fused in multiple dimensions according to the fusion priority to generate a multi-dimensional fusion combination. The historical test status information involved is obtained from the multi-dimensional fusion combination to generate a multi-dimensional fusion dataset.

[0035] Based on the generated multidimensional fusion dataset, correlation analysis is performed on the operational factors involved to obtain early warning information on the fusion correlation between each operational factor.

[0036] The multi-source verification unit is used to determine the test verification information between various switch test nodes.

[0037] Furthermore, the process by which the multi-dimensional verification unit determines the test verification information between each switch test node includes:

[0038] Obtain the visualization processing results of the corresponding edge test information on each test correlation axis, and then use the obtained visualization processing results to obtain the running factors on other test correlation axes according to the corresponding adjustment limit information on the test correlation axis.

[0039] The edge test information between each operational factor is tested and verified according to the corresponding fusion and correlation early warning information to obtain factor test and verification data.

[0040] Set a verification deviation threshold, and perform comprehensive verification analysis on the factor test verification data obtained from each operating factor within each switch test node according to the verification deviation threshold. Based on the comprehensive verification analysis results, obtain the test verification information between each switch test node, and send the obtained test verification information to the integration management module.

[0041] Furthermore, the process by which the integrated management module acquires test evaluation data includes:

[0042] The integration management module includes a test evaluation unit and an integration processing unit;

[0043] The test evaluation unit is used to acquire test verification information at each switch test node, set evaluation weight data for each operating factor within the switch test node based on the fusion and correlation warning information between the operating factors and other switch test nodes, perform test evaluation on the acquired edge test information based on the evaluation weight data and the test verification information acquired at the switch test node, and perform weighted calculation on the acquired test evaluation results to obtain the test evaluation data of the corresponding switch test node.

[0044] The integrated processing unit is used to integrate and manage the test evaluation data at the corresponding switch test nodes according to the corresponding functional trigger parameter information in the low-voltage switch management information, generate test processing information, and feed the test processing information back to the test management platform.

[0045] The present invention has the following beneficial effects:

[0046] 1. In this invention, by conducting a comprehensive analysis of the test electrical circuits involved in each switch test node, constructing corresponding test circuit information based on the analysis results, and setting the test sequence of each switch test node according to the test circuit information, the efficiency of the intelligent test processing of low-voltage switches in nuclear power plants can be improved to a certain extent, and the impact of repeated operations on the intelligent test processing process can be avoided.

[0047] 2. In this invention, switch test nodes are set up to manage the test processes of different test types at different low-voltage switchgear. Test acquisition information is obtained from each switch test node, and the obtained test acquisition information is edge-processed to obtain corresponding edge-processed information. The obtained edge-processed information is then fused and analyzed in a multi-dimensional manner based on the monitoring circuit information to which the switch test node belongs, to determine the accuracy of the corresponding edge-processed information between each switch test node, thereby obtaining corresponding test verification information. Based on the obtained test verification information, the low-voltage switch relationship information is integrated and evaluated, which can improve the accuracy of the switch test process to a certain extent and avoid the impact of errors on the test process. Attached Figure Description

[0048] Figure 1 This is a schematic diagram of an integrated intelligent test and processing system for low-voltage switches in nuclear power plants, as proposed in this invention. Detailed Implementation

[0049] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0050] Example 1

[0051] like Figure 1 As shown, the present invention proposes an integrated intelligent test processing system for low-voltage switches in nuclear power plants, including a test management platform. The test management platform includes a data management module, a test management module, a test acquisition module, an edge processing module, a fusion early warning module, and an integrated management module.

[0052] The data management module is used to acquire low-voltage switch management information, set switch test nodes according to the low-voltage switch management information, and identify and store the switch test nodes.

[0053] The test management module is used to perform overall test analysis on the obtained switch test nodes and to build monitoring loop information for each switch test node based on the test analysis results.

[0054] The test acquisition module is used to sequentially monitor and acquire multiple physical quantities at each switch test node based on the monitoring circuit information, and obtain test acquisition information.

[0055] The edge processing module is used to perform edge processing based on the test acquisition information obtained at each switch test node within the monitoring loop information, and to obtain the edge test information at each switch test node respectively.

[0056] The fusion early warning module is used to perform multi-dimensional data fusion early warning analysis on the edge test information at each switch test node according to the monitoring circuit information to which it belongs, to determine the test verification information between each switch test node, and to send the obtained test verification information to the integration management module.

[0057] The integrated management module is used to perform integrated status assessment of low-voltage switch management information based on the test verification information at each switch test node, and to obtain test assessment data.

[0058] As shown above, the test management platform set up in this invention performs integrated intelligent testing of low-voltage switches in nuclear power plants based on the management, data collection, processing, and early warning processes of each module, which can improve the efficiency and accuracy of the intelligent testing process of low-voltage switches to a certain extent.

[0059] In the specific implementation process, the data management module acquires low-voltage switch management information, sets switch test nodes according to the low-voltage switch management information, and identifies and stores the switch test nodes.

[0060] The data management module includes a data entry unit and an identification management unit;

[0061] The data entry unit is used to acquire low-voltage switch management information, which includes basic information of nuclear power plant equipment, circuit connection and operation information, low-voltage switch equipment parameter information, function trigger parameter information, and historical test status information, wherein:

[0062] Basic information on nuclear power plant equipment includes basic information and operational information of various equipment involved in the nuclear power plant;

[0063] The circuit connection and operation information includes the circuit connection and operation information of various nuclear power plant equipment involved in the nuclear power plant.

[0064] The low-voltage switchgear parameter information includes the equipment model, technical parameters, and setting information of the corresponding low-voltage switchgear in the nuclear power plant.

[0065] The function trigger parameter information is the preset function trigger information corresponding to each low-voltage switchgear under the corresponding parameter information;

[0066] Historical test status information refers to the historical test data corresponding to the test type of the low-voltage switchgear in the power plant within the test management platform.

[0067] The identification management unit is used to perform digital twin processing on the corresponding nuclear power plant equipment basic information, circuit connection operation information, and low-voltage switchgear parameter information within the obtained low-voltage switchgear management information to construct a nuclear power plant operation model. The process includes:

[0068] A three-dimensional physical entity model of the nuclear power plant is established based on the basic information of the equipment. The obtained three-dimensional physical entity model is then used to construct the electrical topology of the low-voltage power distribution system within the nuclear power plant based on circuit connection and operation information. The obtained low-voltage switchgear parameter information is then used for physical location mapping and electrical circuit mapping based on the electrical topology corresponding to the three-dimensional physical entity model. Based on the mapping results, mechanical and electrical characteristic models of the low-voltage switchgear are obtained, representing the response characteristics of the low-voltage switchgear under normal or test conditions, respectively. The obtained three-dimensional physical entity model, electrical topology, and the mechanical and electrical characteristic models of the low-voltage switchgear are then fused to construct a nuclear power plant operation model, which describes the operation within the corresponding nuclear power plant.

[0069] The constructed nuclear power plant operation model sets up switch test nodes based on historical test status information, and maps each switch test node to the nuclear power plant operation model based on the low-voltage switch management information involved. The corresponding switch test nodes are identified and stored according to the mapping results.

[0070] It should be further explained that, in the specific implementation process, the historical test status information is classified and processed to obtain different test types, the location of the low-voltage switchgear information in the nuclear power plant operation model is obtained, and switch test nodes are set for the different test types obtained at each location. The test process of the corresponding low-voltage switchgear is managed according to the set switch test nodes, thereby improving the efficiency of the test process.

[0071] In the specific implementation process, the test management module performs test coordination analysis on the obtained switch test nodes, and the process of constructing monitoring loop information for each switch test node based on the test coordination analysis results includes:

[0072] The identification storage results of each switch test node within the nuclear power plant operation model are obtained. Based on these identification storage results, test features are extracted to obtain test feature data for each switch test node. The test feature data includes test frequency features and test correlation features, wherein:

[0073] The test frequency characteristics are the test time characteristics that each type of switch test node needs to be spaced out.

[0074] The test association features are the electrical association features involved in the test process for the test type corresponding to the corresponding switch test node;

[0075] Set up a test timeline, and sequentially map the test feature data within each switch test node horizontally to the corresponding position on the test timeline. Based on the horizontal mapping result, vertically map the test-related features to the corresponding position on the test timeline to generate a vertical test-related axis.

[0076] It should be further explained that the relationship between the test time axis and the test association axis is as follows: the test time axis is a horizontal axis, and the corresponding unit time segment on the axis is marked. According to the test frequency characteristics in the test feature data, the test association features are mapped to the corresponding marked segments on the test time axis. At the corresponding position, a test association axis perpendicular to the test time axis is set. The electrical association features involved in the corresponding switch test node are described and stored through the test association axis. In summary, the test time axis includes multiple test association axes.

[0077] According to the mapping order of the test time axis, the mutual exclusion switching logic between multiple test lines is sorted for each test-related axis in turn to obtain the switching information between each test-related axis, and the monitoring loop information is constructed based on the obtained switching information.

[0078] It should be further explained that, in the specific implementation process, the process of sorting the various test-related axes by mutual exclusion switching logic among multiple test lines includes:

[0079] Obtain the electrical association characteristics involved in each test associated axis, obtain the corresponding test electrical circuits based on the electrical association characteristics, and sort the obtained test electrical circuits in sequence according to the electrical safety constraint principle. The electrical safety constraint principle is to execute the no-excitation and passive test items first, then the low-voltage and small-signal test items, then the high-voltage, high-current, and strong-excitation test items, and finally the continuity, timing, and logic verification test items. This avoids high-voltage signals from interfering with or damaging sensitive measurement circuits. The test electrical circuits corresponding to different test items are sorted in sequence according to the electrical safety constraint principle, and the execution order is determined based on the connection logic dependencies within the different test electrical circuits.

[0080] According to the execution order, obtain the path switching information between each test-related axis. The path switching information includes the start sequence number, connected electrical components, disconnected electrical components and mutual exclusion relationships between other test electrical circuits.

[0081] Each test electrical circuit is marked according to the circuit switching information, and the monitoring circuit information is obtained based on the marking results.

[0082] In the specific implementation process, the test acquisition module sequentially monitors and acquires multiple physical quantities at each switch test node based on the monitoring circuit information. The process of acquiring test acquisition information includes:

[0083] The test acquisition module includes an acquisition management unit and a test acquisition unit;

[0084] The data acquisition and management unit is used to set adjustment limit information for the corresponding test associated axis based on the position information of each identical switch test node on the test time axis. The adjustment limit information is the position range of the corresponding switch test node on the test time axis after adjustment.

[0085] The test timeline is reordered according to the corresponding monitoring loop information and adjustment limit information to obtain the adjusted test timeline.

[0086] The test acquisition unit is used to sequentially acquire the switch test nodes mapped on the test time axis obtained in the acquisition management unit, and to sequentially monitor and acquire multiple physical quantities at the corresponding switch test nodes according to the monitoring circuit information corresponding to each switch monitoring node, thereby obtaining test acquisition information.

[0087] In the specific implementation process, the edge processing module performs edge processing based on the test acquisition information obtained at each switch test node within the monitoring loop information. The process of obtaining the edge test information at each switch test node includes:

[0088] The edge processing module includes an edge management unit and an edge analysis unit;

[0089] The edge management unit is used to obtain the test standard data of each switch test node based on the corresponding low-voltage switch equipment parameter information, function trigger parameter information and historical test status information in the low-voltage switch management information, and to mark and store the obtained test standard data according to the switch test node.

[0090] The edge analysis unit is used to acquire the adjusted test timeline and test acquisition information acquired by each switch test node after the test acquisition module is set up. The acquired test acquisition information is compared with the test standard data stored in the edge management unit to obtain the comparison difference between the test acquisition information and the corresponding test standard data. The obtained comparison difference is marked as the corresponding comparison result. Based on the comparison result, the edge test information at each switch test node is obtained. The edge test information is the deviation data between the test acquisition information at the switch test node and the test standard data.

[0091] In the specific implementation process, the fusion early warning module performs multi-dimensional data fusion early warning analysis on the edge test information at each switch test node according to the monitoring loop information to determine the test verification information between each switch test node, and sends the obtained test verification information to the integration management module. The process includes:

[0092] The fusion early warning module includes a multi-dimensional fusion unit and a multi-dimensional verification unit;

[0093] The multi-source fusion unit is used to obtain the circuit connection operation information corresponding to the low-voltage switch management information involved at each switch test node, and to separate and mark the obtained circuit connection operation information according to each switch test node, and to obtain the corresponding operation factors. The operation factors are the electrical component factors and electrical component connection factors in the test electrical circuit involved in different test types in each low-voltage switch equipment.

[0094] The edge test information obtained at each switch test node is visualized according to the test correlation axis on the test time axis and the operational factors involved, and the fusion priority is set according to the visualization results.

[0095] It should be further explained that, in the specific implementation process, the process of setting integration priorities includes:

[0096] Obtain the operational factors involved in the test correlation axis, set a certain length of visual code for each operational factor, and connect the visual codes in segments in sequence. Perform visualization processing based on the segment connection results to obtain the visual code string of multiple operational factors involved in the test correlation axis.

[0097] The edge test information obtained at each switch test node is standardized, and the interval is classified according to the standardization results. The interval classification types include normal test interval, abnormal test interval, and test warning interval. Color marking is applied according to the different interval classification types, and the color system of the corresponding color marking is adjusted according to the position of the interval classification type to which the edge test information standardization results belong, thereby obtaining the visualization processing results corresponding to the edge test information.

[0098] Obtain the visualization processing results corresponding to the edge test information, sort the obtained visualization processing results according to the interval classification type in the order of test warning interval, test abnormal interval and test normal interval, set the fusion priority according to the sorting result, if there are duplicate fusion priorities, obtain the visualization encoding string at the corresponding switch test node, and set the fusion priority according to the visualization encoding string from shortest to longest;

[0099] Based on the fusion priority, the operational factors involved in the test timeline are fused in multiple dimensions to generate a multi-dimensional fusion combination. Based on the multi-dimensional fusion combination, the historical test status information involved is obtained to generate a multi-dimensional fusion dataset.

[0100] It should be further explained that, in the specific implementation process, the process of generating the multidimensional fusion dataset also includes:

[0101] Based on the fusion priority obtained from each switch test node, the corresponding switch test nodes are selected sequentially. The various operating factors involved in the selected switch test nodes are fused with other operating factors involved in the test timeline in multiple dimensions to generate a multi-dimensional fusion combination. The obtained multi-dimensional fusion combination is filtered to determine whether there is an electrical correlation between the test electrical circuits involved in the corresponding operating factors. If there is, the multi-dimensional fusion combination is retained; otherwise, it is not retained. Based on the retained multi-dimensional fusion combination, the historical test status information corresponding to the corresponding operating factor is obtained to generate a multi-dimensional fusion dataset.

[0102] Based on the generated multidimensional fusion dataset, correlation analysis is performed on the operational factors involved to obtain early warning information on the fusion correlation between each operational factor.

[0103] It should be further explained that, in the specific implementation process, the process of obtaining fusion-related early warning information includes:

[0104] The process involves acquiring the operational factors involved in the multidimensional fusion dataset, mapping these factors to their corresponding test electrical circuits, and performing electrical correlation analysis on the mapping results of each operational factor between the test electrical circuits based on the circuit's operating principles. This electrical correlation analysis utilizes one or more combinations of correlation coefficients, change slopes, time delay differences, fluctuation coefficients, deviations, influence weights, or mutual exclusion satisfaction to calculate the correlation strength, trend relationships, time-series relationships, stability relationships, synergistic relationships, and mutual exclusion relationships between different operational factors. For example, the correlation coefficient is used to determine the correlation strength between the operational factors corresponding to insulation and humidity, and the correlation between the corresponding operational factors of the electrical circuits is calculated. The slope of the change of factors over time or number of actions is used to obtain electrical correlation data. By calculating the time delay difference between different operating factors of electrical circuits, the time fluctuation coefficient and fluctuation correlation ratio are obtained. Stability correlation data between different operating factors are obtained. By calculating the deviation, the compliance correlation data between the test collection information and the standard is obtained. By calculating the influence weight of each operating factor, multi-factor collaborative electrical correlation data is obtained to determine the dominant factor. By calculating the mutual exclusion satisfaction degree, mutual exclusion correlation data between different test electrical circuits is obtained. The various correlation data obtained are quantified and uniformly adjusted. Based on the quantification and uniform adjustment results, the fusion correlation early warning information between the corresponding operating factors is obtained.

[0105] The multi-source verification unit is used to determine the test verification information between various switch test nodes. Its process includes:

[0106] Obtain the visualization processing results of the corresponding edge test information on each test correlation axis, and then use the obtained visualization processing results to obtain the running factors on other test correlation axes according to the corresponding adjustment limit information on the test correlation axis.

[0107] The edge test information between each operational factor is tested and verified according to the corresponding fusion and correlation early warning information to obtain factor test and verification data.

[0108] Set a verification deviation threshold, perform comprehensive verification analysis on the factor test verification data obtained from each operating factor within each switch test node according to the verification deviation threshold, determine the comparison difference between the factor test verification data and the verification deviation threshold, mark the obtained comparison difference as the corresponding comprehensive verification analysis result, obtain the test verification information between each switch test node according to the comprehensive verification analysis result, and send the obtained test verification information to the integration management module;

[0109] It should be further explained that, in the specific implementation process, during the verification and analysis of the obtained edge test information based on the fusion and correlation early warning information between various operating factors, the information is obtained based on the electrical operating relationship between corresponding electrical components within or between the test electrical circuits.

[0110] In addition, when setting the verification deviation threshold, it is set according to the test electrical circuit to which the operating factor corresponding to the fusion and association early warning information belongs. If they belong to the same test electrical circuit and the operating factors are connected, the threshold is smaller; if they do not belong to the same test electrical circuit, the threshold is larger.

[0111] In the specific implementation process, the integrated management module performs an integrated status assessment of the low-voltage switch management information based on the test verification information at each switch test node. The process of obtaining test assessment data includes:

[0112] The integration management module includes a test evaluation unit and an integration processing unit;

[0113] The test evaluation unit is used to acquire test verification information at each switch test node, set evaluation weight data for each operating factor within the switch test node based on the fusion and correlation warning information between the operating factors and other switch test nodes, perform test evaluation on the acquired edge test information based on the evaluation weight data and the test verification information acquired at the switch test node, and perform weighted calculation on the acquired test evaluation results to obtain the test evaluation data of the corresponding switch test node.

[0114] The integrated processing unit is used to integrate and manage the test evaluation data at the corresponding switch test nodes according to the corresponding functional trigger parameter information in the low-voltage switch management information, generate test processing information, and feed the test processing information back to the test management platform.

[0115] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An integrated intelligent test processing system for low-voltage switches in nuclear power plants, comprising a test management platform, characterized in that, The test management platform includes a data management module, a test management module, a test acquisition module, an edge processing module, a fusion early warning module, and an integration management module. The data management module is used to acquire low-voltage switch management information, set switch test nodes according to the low-voltage switch management information, and identify and store the switch test nodes. The test management module is used to perform overall test analysis on the obtained switch test nodes and to build monitoring loop information for each switch test node based on the test analysis results. The test acquisition module is used to sequentially monitor and acquire multiple physical quantities at each switch test node based on the monitoring circuit information, and obtain test acquisition information. The edge processing module is used to perform edge processing based on the test acquisition information obtained at each switch test node within the monitoring loop information, and to obtain the edge test information at each switch test node respectively. The fusion early warning module is used to perform multi-dimensional data fusion early warning analysis on the edge test information at each switch test node according to the monitoring circuit information to which it belongs, to determine the test verification information between each switch test node, and to send the obtained test verification information to the integration management module. The integrated management module is used to perform integrated status assessment of low-voltage switch management information based on the test verification information at each switch test node, and to obtain test assessment data.

2. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 1, characterized in that, The process of setting up the switch test node in the data management module includes: The data management module includes a data entry unit and an identification management unit; The data entry unit is used to acquire low-voltage switch management information, which includes basic information of nuclear power plant equipment, circuit connection and operation information, low-voltage switch equipment parameter information, function trigger parameter information, and historical test status information. The identification management unit is used to perform digital twin processing on the nuclear power plant equipment basic information, circuit connection operation information and low-voltage switch equipment parameter information corresponding to the obtained low-voltage switch management information, construct a nuclear power plant operation model, set switch test nodes in the constructed nuclear power plant operation model according to historical test status information, and map each switch test node to the nuclear power plant operation model according to the low-voltage switch management information involved, and identify and store the corresponding switch test nodes according to the mapping results.

3. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 2, characterized in that, The process by which the test management module constructs monitoring loop information for each switch test node includes: The identification storage results of each switch test node in the nuclear power plant operation model are obtained. Test features are extracted based on the identification storage results to obtain test feature data of each switch test node. The test feature data includes test frequency features and test correlation features. Set up a test timeline, and sequentially map the test feature data within each switch test node horizontally to the corresponding position on the test timeline. Based on the horizontal mapping result, vertically map the test-related features to the corresponding position on the test timeline to generate a vertical test-related axis. According to the mapping order of the test time axis, the mutual exclusion switching logic between multiple test lines is sequentially sorted for each test-related axis to obtain the switching information between each test-related axis, and the monitoring loop information is constructed based on the obtained switching information.

4. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 3, characterized in that, The process by which the test acquisition module obtains test acquisition information includes: The test acquisition module includes an acquisition management unit and a test acquisition unit; The data acquisition and management unit is used to set the adjustment restriction information of the corresponding test associated axis according to the position information of each identical switch test node on the test time axis, and to reorder each test associated axis on the test time axis according to the corresponding monitoring loop information and adjustment restriction information to obtain the adjusted test time axis. The test acquisition unit is used to sequentially acquire the switch test nodes mapped on the test time axis obtained in the acquisition management unit, and to sequentially monitor and acquire multiple physical quantities at the corresponding switch test nodes according to the monitoring circuit information corresponding to each switch monitoring node, thereby obtaining test acquisition information.

5. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 4, characterized in that, The process by which the edge processing module acquires edge test information at each switch test node includes: The edge processing module includes an edge management unit and an edge analysis unit; The edge management unit is used to obtain the test standard data of each switch test node based on the corresponding low-voltage switch equipment parameter information, function trigger parameter information and historical test status information in the low-voltage switch management information, and to mark and store the obtained test standard data according to the switch test node. The edge analysis unit is used to acquire the test timeline adjusted by the test acquisition module and the test acquisition information acquired by each switch test node. It compares the acquired test acquisition information with the test standard data stored in the edge management unit and acquires the edge test information at each switch test node based on the comparison results.

6. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 5, characterized in that, The process by which the fusion early warning module performs multi-dimensional data fusion and early warning analysis on the edge test information at each switch test node according to the monitoring loop information includes: The fusion early warning module includes a multi-dimensional fusion unit and a multi-dimensional verification unit; The multi-source fusion unit is used to obtain the circuit connection operation information corresponding to the low-voltage switch management information involved at each switch test node, and to separate and mark the obtained circuit connection operation information according to each switch test node, and obtain the corresponding operation factors respectively. The edge test information obtained at each switch test node is visualized according to the test association axis on the test time axis and the operational factors involved. The fusion priority is set according to the visualization results. The operational factors involved on the test time axis are fused in multiple dimensions according to the fusion priority to generate a multi-dimensional fusion combination. The historical test status information involved is obtained from the multi-dimensional fusion combination to generate a multi-dimensional fusion dataset. Based on the generated multidimensional fusion dataset, correlation analysis is performed on the operational factors involved to obtain early warning information on the fusion correlation between each operational factor. The multi-source verification unit is used to determine the test verification information between various switch test nodes.

7. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 6, characterized in that, The process by which the multi-dimensional verification unit determines the test verification information between each switch test node includes: Obtain the visualization processing results of the corresponding edge test information on each test correlation axis, and then use the obtained visualization processing results to obtain the running factors on other test correlation axes according to the corresponding adjustment limit information on the test correlation axis. The edge test information between each operational factor is tested and verified according to the corresponding fusion and correlation early warning information to obtain factor test and verification data. Set a verification deviation threshold, and perform comprehensive verification analysis on the factor test verification data obtained from each operating factor within each switch test node according to the verification deviation threshold. Based on the comprehensive verification analysis results, obtain the test verification information between each switch test node, and send the obtained test verification information to the integration management module.

8. The integrated intelligent test and processing system for low-voltage switches in nuclear power plants according to claim 7, characterized in that, The process by which the integrated management module acquires test evaluation data includes: The integration management module includes a test evaluation unit and an integration processing unit; The test evaluation unit is used to acquire test verification information at each switch test node, set evaluation weight data for each operating factor within the switch test node based on the fusion and correlation warning information between the operating factors and other switch test nodes, perform test evaluation on the acquired edge test information based on the evaluation weight data and the test verification information acquired at the switch test node, and perform weighted calculation on the acquired test evaluation results to obtain the test evaluation data of the corresponding switch test node. The integrated processing unit is used to integrate and manage the test evaluation data at the corresponding switch test nodes according to the corresponding functional trigger parameter information in the low-voltage switch management information, generate test processing information, and feed the test processing information back to the test management platform.

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