Optical autofocus system and method for short-wave infrared cameras
By employing a two-step strategy of coarse focusing with large step distance and fine focusing with small step distance, combined with a laser altimeter module and dynamic calibration, the focusing instability problem of short-wave infrared cameras under multi-layer structures and depth-of-field limitations was solved, achieving efficient and accurate automatic focusing and detection.
Patent Information
- Application Number
- CN202610547773.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-23
- Publication Date
- 2026-07-03
AI Technical Summary
Existing shortwave infrared cameras suffer from unstable focusing in chip inspection due to interference from multi-layer structures and depth-of-field limitations. Traditional methods are inefficient, and industrial cameras are prone to misjudgment or missed detection in the inspection of products with inconsistent heights. The offset between the height measurement of the laser sensor and the position of the camera's focal plane leads to inaccurate focusing.
A two-step strategy combining large-step coarse focusing with small-step fine focusing is adopted. The optimal focus point is determined by normalized cross-correlation algorithm and sharpness calculation. Combined with laser altimeter module and dynamic calibration mechanism, the camera focal plane position is adjusted in real time to achieve fast and accurate focusing.
It effectively distinguishes the target chip layer from other layers, improves focusing accuracy and efficiency, ensures detection accuracy, eliminates the influence of mechanical installation errors, and increases production line detection speed.
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Figure CN122340356A_ABST
Abstract
Citation Information
Patent Citations
Focusing method and system of infrared camera
CN121357418A