Aging device and aging system

Abstract

The application provides an aging device and an aging system, and relates to the technical field of electrical equipment. The aging device provided by the application comprises a control module, a variable voltage module and a resistive element. The control module is provided with a current sampling interface and a voltage sampling interface, and comprises a common end and a plurality of wiring terminals. The variable voltage module comprises a primary winding and a secondary winding. One end of the primary winding is connected to the common end, the other end of the primary winding is connected to a zero line of a power supply, one end of the secondary winding is connected to one end of a current sampling structure, and the other end of the secondary winding and the other end of the current sampling interface are both connected to a test station for connecting a to-be-aged component. The resistive element is connected in parallel to the secondary winding. The plurality of wiring terminals are respectively connected with switching switches, and the switching switches are used for controlling the on-off between the phase line connected to the corresponding wiring terminal and the common end. In this way, different load working conditions can be simulated by switching the voltage of the resistive element, thereby reducing the cost of the aging device.

Description

Technical Field

[0001] This application relates to the field of electrical equipment technology, and in particular to an aging device and aging system. Background Technology

[0002] Electrical equipment typically requires aging tests to simulate the operating conditions of the power grid and to expose potential faults such as equipment aging, sampling accuracy drift, and control logic disorder in advance. In actual power distribution networks, the load types are complex, including resistive, capacitive, and inductive loads, which means that electrical equipment may continuously experience different operating conditions during operation.

[0003] In related technologies, when aging tests are conducted on electrical equipment, the aging device is usually equipped with three types of loads: capacitive, resistive, and inductive. Different loads work in rotation over a certain period of time to simulate the operating environment of various loads under actual power distribution conditions and to test the working stability and durability of electrical equipment under different load characteristics.

[0004] However, this setup in the related technologies requires configuring multiple loads in the aging device, resulting in a large amount of hardware investment and high costs, as well as complex wiring and high maintenance costs. Summary of the Invention

[0005] This application provides an aging device and aging system, which can reduce the hardware investment in the aging device, simplify the circuit structure, and reduce the cost and maintenance cost of the aging device.

[0006] Firstly, this application provides an aging device for performing aging tests on components to be aged. The aging device includes a control module, a transformer module, and resistive components. The control module has a current sampling interface and a voltage sampling interface. The control module includes a common terminal and multiple terminals for connecting different phase lines of the power supply. The voltage sampling structure is used to connect any phase line and the neutral line of the power supply to acquire a reference voltage. The transformer module includes a primary winding and a secondary winding coupled together. One end of the primary winding is connected to the common terminal, and the other end of the primary winding is connected to the neutral line of the power supply. One end of the secondary winding is connected to one end of the current sampling structure. The other end of the secondary winding and the other end of the current sampling interface are both connected to a test station for the component to be aged. The resistive components are connected in parallel to the secondary winding.

[0007] Each terminal block is connected to a switch, which controls the connection between the phase wire and the common terminal block.

[0008] In this embodiment, the control module, transformer module, and resistive components can work together to simulate resistive, capacitive, and inductive load conditions, enabling the aging device to generate different power factors. This allows the components to be aged to operate based on different power factors, thereby achieving aging testing. Furthermore, this application can simulate different load conditions simply by switching the voltage of the resistive components, reducing hardware investment, simplifying the circuit structure, and lowering the cost and maintenance costs of the aging device.

[0009] Optionally, the control module has a built-in relay, and the changeover switch is a relay. Alternatively, the changeover switch is connected externally to the control module, and the changeover switch includes any one of a contactor, a compound switch, or a contactless thyristor switch.

[0010] In this application, the type of switch can be various, and can be flexibly selected according to the actual situation.

[0011] Optionally, when the changeover switch is a relay, the changeover switch includes a first contact and a second contact that cooperate with each other. The first contact is movably configured to connect with the second contact to close the changeover switch, or to separate from the second contact to open the changeover switch. The first contacts of multiple changeover switches are all connected to a common terminal, and the second contacts of multiple changeover switches are respectively connected to multiple terminal blocks.

[0012] In this way, the first contact can cooperate with the second contactor to connect or disconnect the electrical connection between the common terminal and the corresponding terminal block, so that the aging device can simulate resistive, capacitive and inductive load conditions to perform aging tests on the parts to be aged.

[0013] Optionally, the control module also includes an electrically connected control unit and a drive unit. The control unit is configured with a switching cycle and can output a timing control signal based on the switching cycle. The drive unit can drive multiple terminal switches to close in turn based on the timing control signal.

[0014] In this way, the control unit and the drive unit can work together to automatically control the switching switch, and can orderly simulate resistive, inductive and capacitive load conditions according to test requirements, thereby improving the automation level and test efficiency of the aging device for the aging test of the parts to be aged.

[0015] Optionally, the power supply includes phase lines A, B, and C. The voltage sampling interface includes a first interface and a second interface. The first interface is used to connect to phase line A, and the second interface is used to connect to the neutral wire to acquire the reference voltage. There are three terminals, which are connected to phase lines A, B, and C respectively. When the phase lines corresponding to different terminals are connected to the common terminal, the voltage phase of the secondary winding is different, and the resistive element generates analog currents with different phases based on the voltage of the secondary winding.

[0016] When the voltage sampling structure acquires the reference voltage, the analog current is in phase with the reference voltage when phase A is connected to the common terminal. When phase B is connected to the common terminal, the analog current leads the reference voltage. When phase C is connected to the common terminal, the analog current lags behind the reference voltage.

[0017] In this way, this application can simulate resistive, inductive, and capacitive load conditions based on the phase difference of three-phase AC power supply, so that the power factor of the aging device is different, which makes it easy for the parts to be aged to work under different conditions, so as to realize dynamic aging test of the parts to be aged.

[0018] Optionally, the resistive element may include any one of the following: a wire-wound resistor, a heating element, a thin-film resistor, or a metal sheet.

[0019] In this way, the voltage phase of the secondary winding of the transformer module can be kept the same as that of the primary winding, reducing the interference of reactive components on the power factor of the aging device.

[0020] Optionally, there are multiple test stations, all connected in series between the secondary winding and the current sampling interface.

[0021] In this way, the aging device can provide multiple test stations for the parts to be aged. When multiple parts need to be aged, they can be connected in series to multiple test stations to carry out aging tests on multiple parts in parallel, thereby reducing the test cycle.

[0022] Secondly, this application provides an aging system, including a component to be aged and any of the aging devices described in the first aspect. The component to be aged is disposed in a test station, with one end of the secondary winding electrically connected to one end of the current sampling interface, and the component to be aged connected between the other end of the secondary winding and the other end of the current sampling interface.

[0023] Optionally, the component to be aged has a voltage interface and a current interface. The component to be aged is connected to the other end of the secondary winding and the other end of the current sampling interface via the current interface. The voltage interface is connected to the power supply.

[0024] Optionally, the aging system also includes a voltage conversion device connected to a power supply, with a voltage interface connected to the voltage conversion device. The voltage conversion device can selectively output phase voltage or line voltage to match the rated voltage of the component to be aged.

[0025] The beneficial effects of the aging system provided in the second aspect and the various possible designs of the second aspect can be found in the first aspect and the various possible implementations of the first aspect, and will not be repeated here. Attached Figure Description

[0026] Figure 1 This is a circuit connection diagram of an aging device according to an embodiment of this application.

[0027] Explanation of reference numerals in the attached figures: 100: Aging device; 10: Control module; 11: Current sampling interface; 12: Voltage sampling interface; 13: Common terminal; 14: Wiring terminal; 20: Transformer module; 21: Primary winding; 22: Secondary winding; 30: Resistive element; 40: Test station; 50: Switch. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims and drawings of this application are intended to cover non-exclusive inclusion.

[0030] The term "embodiment" as used herein means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of the phrase "embodiment" in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0031] In this article, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can mean: A exists, A and B exist simultaneously, or B exists. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0032] The directional terms appearing in the following description refer to the directions shown in the figures and are not intended to limit the specific structure of this application. For example, in the description of this application, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the figures. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0033] Furthermore, the terms "first," "second," etc., in the specification and claims of this application or in the aforementioned drawings are used to distinguish different objects rather than to describe a specific order, and may explicitly or implicitly include one or more of the features.

[0034] In the description of this application, unless otherwise stated, "multiple" means two or more (including two), and similarly, "multiple groups" means two or more (including two groups).

[0035] In the description of this application, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linkage" should be interpreted broadly. For example, "connection" or "linkage" in mechanical structures can refer to a physical connection, such as a fixed connection, for example, a connection fixed by a partition, such as a connection fixed by screws, bolts, or other partitions; a physical connection can also be a detachable connection, such as a snap-fit ​​or interlocking connection; a physical connection can also be an integral connection, such as a connection formed by welding, bonding, or integral molding. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances. In circuit structures, "connection" or "linkage" can refer not only to a physical connection but also to an electrical connection or a signal connection. For example, it can be a direct connection, i.e., a physical connection, or an indirect connection through at least one intermediate element, as long as the circuit is connected; it can also refer to the internal connection of two elements. A signal connection can refer not only to a signal connection through a circuit but also to a signal connection through a medium, such as radio waves. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0036] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments.

[0037] Reference Figure 1 As shown, the aging device 100 provided in this application includes a control module 10, a transformer module 20, and a resistive element 30. The control module 10 has a current sampling interface 11 and a voltage sampling interface 12. The control module 10 includes a common terminal 13 and multiple terminals 14. The multiple terminals 14 are used to connect different phase lines of the power supply. The voltage sampling structure is used to connect any phase line and the neutral line in the power supply to collect a reference voltage. The transformer module 20 includes a primary winding 21 and a secondary winding 22 coupled together. One end of the primary winding 21 is connected to the common terminal 13, and the other end of the primary winding 21 is connected to the neutral line of the power supply. One end of the secondary winding 22 is connected to one end of the current sampling structure. The other end of the secondary winding 22 and the other end of the current sampling interface 11 are both connected to a test station 40 for connecting the component to be aged. The resistive element 30 is connected in parallel to the secondary winding 22.

[0038] Among them, multiple terminals 14 are connected to a switch 50, which is used to control the connection and disconnection between the phase wire connected to the corresponding terminal 14 and the common terminal 13.

[0039] In this embodiment, the aging device 100 can simulate various working conditions to match different load conditions and perform work, test the working performance of the component under various load conditions, and thus verify the working reliability and stability of the component.

[0040] The aging device 100 includes a control module 10, a transformer module 20, and a resistive element 30. The control module 10, transformer module 20, and resistive element 30 can work together to simulate different operating conditions. In this way, when the part to be aged is connected to the aging device 100, aging tests on the part to be aged can be easily performed.

[0041] Specifically, the control module 10 includes a common terminal 13 and multiple terminals 14. The multiple terminals 14 are used to connect different phase lines. In this way, when different switching switches 50 are closed, power supplies of different phases can be connected to the common terminal 13 through the terminals 14.

[0042] In this application, one end of the primary winding 21 of the transformer module 20 is connected to the common terminal 13, and the other end of the primary winding 21 is connected to the neutral line of the power supply. Therefore, when the common terminal 13, one of the terminals 14, and the corresponding phase line are connected, the primary winding 21 can be connected to the single-phase voltage circuit formed by the phase line and the neutral line, and the secondary winding 22 can output the voltage of the corresponding phase.

[0043] Thus, in this embodiment of the application, the primary winding 21 of the transformer module 20 can be connected to different phase lines of the power supply through the control module 10 and the switching switch 50, and after the transformer conversion, the secondary winding 22 can output voltages with different phases. In this way, voltages with different phases can be provided to the resistive element 30 to generate analog currents with different phases.

[0044] In addition, the control module 10 also has a current sampling interface 11 and a voltage sampling interface 12. The voltage sampling interface 12 is connected to one phase line and the neutral line of the power supply, and can acquire a reference voltage. That is, the phase of the reference voltage is the same as the phase of one of the phase lines. When the switch 50 controls the connection between different phase lines and the common terminal 13, the phase of the simulated current, relative to the phase of the reference voltage, exhibits three states: in-phase, leading, and lagging. This can simulate resistive, capacitive, and inductive load conditions respectively, resulting in different power factors for the control module 10.

[0045] A test station 40 is provided between the current sampling interface 11 and the secondary winding 22. The component to be aged can be connected to the aging device 100 through the test station 40. In this way, the component to be aged can work based on the power factor of the control module 10, so that the component to be aged can work under different operating conditions, which facilitates the realization of dynamic aging test of the component to be aged.

[0046] In summary, in this embodiment, the control module 10, transformer module 20, and resistive element 30 can work together to simulate resistive, capacitive, and inductive load conditions, enabling the aging device 100 to generate different power factors. This allows the components to be aged to operate based on different power factors, thereby achieving aging testing. Furthermore, this application can simulate different load conditions simply by switching the voltage of the resistive element 30, reducing hardware investment, simplifying the circuit structure, and lowering the cost and maintenance cost of the aging device 100.

[0047] In transformer module 20, the primary winding 21 and the secondary winding 22 have terminals with the same name. For example... Figure 1As shown, the terminals marked with "*" on the primary winding 21 and secondary winding 22 are terminals with the same name. That is, the other end of the primary winding 21 and the other end of the secondary winding 22 are terminals with the same name. In this way, the voltage phases of the primary winding 21 and the secondary winding 22 are made to be the same, reducing the possibility of the phase relationship between the analog current and the reference voltage being disordered, which could lead to abnormal operation of the component to be aged.

[0048] It should be noted that, in this application, the component to be aged can specifically be a low-voltage power distribution and control electrical device that needs to collect grid voltage and current phase signals and calculate the power factor, such as a reactive power compensation controller, intelligent power monitoring instrument, low-voltage reactive power compensation switching device, or multi-functional energy meter. The specific type of component to be aged is not specifically limited in the embodiments of this application.

[0049] In the following description, to make the description of the aging device 100 and the component to be aged clearer, a reactive power compensation controller will be used as the component to be aged for specific explanation. For other types of electrical equipment to be aged, please refer to the corresponding descriptions, which will not be repeated in this embodiment.

[0050] In some embodiments, the power supply includes phase lines A, B, and C. The voltage amplitudes of phase lines A, B, and C are equal, and the phase difference between any two phase lines is 120°. Specifically, phase A leads phase B by 120°, phase B leads phase C by 120°, and phase C leads phase A by 120°.

[0051] The voltage sampling interface 12 includes a first interface and a second interface. The first interface is used to connect to the A-phase line, and the second interface is used to connect to the neutral line to acquire the reference voltage. Figure 1 As shown, the voltage sampling interface 12 may specifically include U1 and U2, wherein U1 can be connected to the A phase line and U2 can be connected to the neutral line.

[0052] There are three terminal blocks 14, which are respectively connected to phase A, phase B, and phase C. Figure 1 As shown. When the phase lines corresponding to different terminals 14 are connected to the common terminal 13, the voltage phase of the secondary winding 22 is different. Thus, the resistive element 30 generates analog currents with different phases based on the voltage of the secondary winding 22. When the voltage sampling structure acquires the reference voltage, when phase A is connected to the common terminal 13, the analog current is in phase with the reference voltage. When phase B is connected to the common terminal 13, the analog current leads the reference voltage. When phase C is connected to the common terminal 13, the analog current lags behind the reference voltage.

[0053] Specifically, when phase A is connected to the common terminal 13, the voltage on one side of the secondary winding 22 is also phase A, the simulated current is phase A, and it is in phase with the reference voltage. The load exhibits resistive characteristics, and the power factor of the control module 10 is 1. Under these circumstances, the reactive power compensation controller, which is the component to be aged, can identify the current reactive power balance and does not output switching action.

[0054] When the C-phase line is connected to the common terminal 13, the voltage on one side of the secondary winding 22 is also C-phase, the simulated current is C-phase, and it lags behind the reference voltage, resulting in an inductive load. At this time, the power factor of the control module 10 is 0.5. In this case, the reactive power compensation controller, which is a component to be aged, determines that the system needs capacitive reactive power compensation, and puts the compensation capacitor into operation, so that the capacitor generates capacitive reactive power to offset the inductive reactive power of the load.

[0055] When phase B is connected to common terminal 13, the voltage on one side of secondary winding 22 is also phase B, the simulated current is phase B, and it leads the reference voltage, indicating a capacitive load. At this time, the power factor of control module 10 is -0.5. In this case, the reactive power compensation controller, which is a component to be aged, determines that there is excess reactive power, cuts off the already connected compensation capacitors, and reduces the capacitive reactive power output of the system.

[0056] In this way, this application can simulate resistive, inductive and capacitive load conditions based on the phase difference of three-phase AC power supply, so that the power factor of the aging device 100 is different, which makes it convenient for the parts to be aged to work under different conditions, so as to realize dynamic aging test of the parts to be aged.

[0057] In the above embodiment, the voltage sampling interface 12 is connected to phase A and the neutral line, and the reference voltage is the phase voltage of phase A. At this time, the load type can be determined based on the phase difference between the analog current and phase A, thereby changing the power factor of the control module 10.

[0058] Those skilled in the art will understand that the connection of the voltage sampling interface 12 is not limited to the above-described configuration. For example, the first interface can also be connected to the B-phase line, and the second interface can be connected to the neutral line. In this case, the reference voltage collected by the voltage sampling interface 12 is the phase voltage of the B-phase. At this time, the load type can be determined based on the phase difference between the phase of the analog current and the phase of the B-phase, thereby changing the power factor of the control module 10. The specific connection method of the voltage sampling interface 12 and the specific phase of the reference voltage are not specifically limited in the embodiments of this application.

[0059] In some embodiments, the switching switch 50 can be connected to the outside of the control module 10, including any one of a contactor, a composite switch, or a contactless thyristor switch.

[0060] Contactors, composite switches, and contactless thyristor switches are all switching devices that can control the on / off state of a circuit. Among them, contactors have a simple structure and low cost, composite switches have high switching accuracy and lifespan, and contactless thyristor switches can achieve frequent and rapid switching without electric arc.

[0061] That is, the type of changeover switch 50 in this application can be various, and the changeover switch 50 between the terminal block 14 and the common terminal 13 can be flexibly selected according to the actual situation. In this way, any of the above-mentioned switching devices can be flexibly selected according to the actual test requirements such as the power of the aging device 100, the switching frequency between multiple phase lines and the common terminal 13, and the continuous operating time. Under the premise of ensuring reliable switching of the load branch and simulating load conditions, the adaptability range of the aging device 100 is broadened and the cost of the aging device 100 is reduced.

[0062] As described above, the reactive power compensation controller can switch capacitors based on the power factor, and the process of switching the compensation capacitors is similar to controlling the on / off state of the circuit containing the compensation capacitors. Therefore, as a preferred embodiment, the control module 10 in the aging device 100 can be obtained by modifying a conventional reactive power compensation controller. In other words, a conventional reactive power compensation controller can be modified to serve as the control module 10.

[0063] Unlike ordinary reactive power compensation controllers, the control module 10 connects the common terminal 13, terminal block 14, and phase lines as needed to connect or disconnect a specific phase line. Ordinary reactive power compensation controllers switch on or off compensation capacitors based on the power factor of the circuit in which they are located.

[0064] In this way, when the control module 10 is a modified reactive power compensation controller, multiple switching switches 50 are respectively connected between the reactive power compensation controller and the three phase lines of the power supply. The working state of each switching switch 50 can be controlled so that the corresponding phase line is connected to the common terminal 13.

[0065] Understandably, currently, reactive power compensation controllers mainly include two specifications: passive output and active output. The switching logic of the two is the same, and the only difference is the internal signal output structure and the matching back-end switching devices.

[0066] For a passive output reactive power compensation controller, there are multiple built-in relays, which can output passive dry contacts. The corresponding connecting switch 50 can be a contactor.

[0067] For an active output reactive power compensation controller, the corresponding connecting switch 50 can be a composite switch or a contactless thyristor switch. In the active output reactive power compensation controller, each terminal 14 is equipped with a DC level drive circuit. One end of each DC level drive circuit is connected to the common terminal 13. The DC level drive circuit can output an active signal to drive the external composite switch or contactless thyristor switch to realize the connection between different phase lines and the common terminal 13.

[0068] It is understood that in the above setup, the switch 50 is an external device of the control module 10. At this time, the switch 50 is connected to the rear side of the terminal 14 and is located between the terminal 14 and the phase line. The connection between the corresponding phase line and the common terminal 13 can be controlled by switching the connection between the terminal 14 and the corresponding phase line.

[0069] Of course, besides the above settings, the switch 50 can be configured in other ways. For example, if the control module 10 is a passive output reactive power compensation controller, the switch 50 can also be a relay built into the reactive power compensation controller. In this case, the reactive power compensation controller can be directly connected to phase A, phase B, and phase C through different passive dry contacts.

[0070] In this configuration, the changeover switch 50 is located between each terminal 14 and the common terminal 13, allowing multiple terminals 14 to be selectively connected to the common terminal 13 via the changeover switch 50. This also enables switching between the connection states of phase A, phase B, and phase C with the common terminal, while reducing the cost increase caused by additional contactors.

[0071] The following description will be based on the case where the control module 10 is a passive output reactive power compensation controller and the switch 50 is a relay.

[0072] The changeover switch 50 includes a first contact and a second contact that cooperate with each other. The first contact is movably configured to connect with the second contact to close the changeover switch 50, or to separate from the second contact to open the changeover switch 50. The first contacts of the multiple changeover switches 50 are all connected to a common terminal 13, and the second contacts of the multiple changeover switches 50 are respectively connected to multiple terminal blocks 14.

[0073] In this way, the first contact can cooperate with the second contactor to connect or disconnect the electrical connection between the common terminal 13 and the corresponding terminal 14, so that the aging device 100 can simulate resistive, capacitive and inductive load conditions to perform aging tests on the parts to be aged.

[0074] In order to allow each terminal 14 to be independently electrically connected to the common terminal 13 to connect to one of phases A, B, and C, the multiple changeover switches 50 can be configured as follows, as detailed in the following reference. Figure 1 .

[0075] like Figure 1 As shown, a horizontally arranged busbar is provided, with one end of the busbar electrically connected to the common terminal 13. Multiple longitudinal branches are also led out from the busbar at intervals. One longitudinal branch connects to phase A, one to phase B, and one to phase C. Three changeover switches 50 are provided, each connected to one of these three longitudinal branches connecting the phase lines.

[0076] In some embodiments, the control module 10 further includes an electrically connected control unit and a drive unit. The control unit is configured with a switching cycle and can output a timing control signal based on the switching cycle. The drive unit can drive the switching switches 50 corresponding to multiple terminals 14 to close in turn based on the timing control signal.

[0077] In this embodiment, the control module 10 may also integrate a control unit and a drive unit. The control unit and drive unit can cooperate to control multiple switching switches 50, causing the multiple switching switches 50 to close in turn, so that one of the A-phase line, B-phase line, and C-phase line can be connected to the common terminal 13. In this application, the control unit and drive unit can cooperate to automatically control the switching switches 50, and can orderly simulate resistive, inductive, and capacitive load conditions according to test requirements, thereby improving the automation level and test efficiency of the aging device 100 in the aging test of the parts to be aged.

[0078] In this application, in order to flexibly respond to different aging needs, the switching cycle can be adjusted according to actual needs, for example, it can be 10 minutes, 15 minutes or 20 minutes, etc. In this respect, the embodiments of this application do not make specific limitations.

[0079] It should be noted that reactive power compensation controllers typically include a microcontroller, which serves as the main control chip, handling signal processing and logic execution. The microcontroller also has a built-in clock, which provides a time reference and works in conjunction with the microcontroller to achieve precise time-sharing and segmented compensation control.

[0080] When the control module 10 is a reactive power compensation controller, the control unit can be a microcontroller, which can output timing control signals based on a clock. The drive unit can be a component of the back-end switching device used for driving in the reactive power compensation controller. For example, for a passive output reactive power compensation controller, the drive unit can be a relay dry contact circuit; for an active output reactive power compensation controller, the drive unit can be a DC level drive circuit.

[0081] In some embodiments, the resistive element 30 includes any one of a wire-wound resistor, a heating element, a thin-film resistor, or a metal sheet. All of these elements are energy-consuming devices; after being connected to the circuit, the current and voltage phases remain synchronized, with no inductive or capacitive reactive components. Thus, the voltage phase of the secondary winding 22 of the transformer module 20 can be kept the same as the voltage phase of the primary winding 21, reducing the interference of reactive components on the power factor of the aging device 100.

[0082] In this design, the resistance of resistive element 30 is R, and the voltage of secondary winding 22 is U, satisfying the condition: 50mA≤U / R≤5A. This constrains the magnitude of the simulated current, ensuring the safe and reliable operation of the component to be aged.

[0083] It should be noted that the value of U / R in this application can be 50mA, 100mA, 1A, 2A or 5A, etc., and the embodiments of this application do not specifically limit it.

[0084] For example, if the resistive element 30 is a wire-wound resistor, the transformation ratio of the transformer module 20 can be 30, and the wire-wound resistor can be a RX21 type with a rated power of 15W and a resistance of 3Ω. In this case, the analog current can be 2A.

[0085] In some embodiments, there are multiple test stations 40, and all multiple test stations 40 are connected in series between the secondary winding 22 and the current sampling interface 11.

[0086] In this way, the aging device 100 can provide multiple test stations 40 for the parts to be aged. When multiple parts need to be aged, they can be connected in series to multiple test stations 40 to carry out aging tests on multiple parts in parallel, thereby reducing the test cycle.

[0087] It is understood that in this application, the components to be aged can be connected in series between the secondary winding 22 and the current sampling interface 11 via the test station 40. When the number of components to be aged is less than the number of test stations 40, some test stations 40 can be left unused, and testing can be performed normally as long as multiple components to be aged are connected in series.

[0088] To make the solution of this application clearer, the connection of the component to be aged in the test station 40 is described in detail below. The component to be aged has a first sampling interface and a second sampling interface, the test station 40 has a first test interface, and the test station 40 has a second test interface.

[0089] When each test station 40 is equipped with a component to be aged, multiple components to be aged are connected one-to-one in multiple test stations 40, and the first sampling interface of the component to be aged is connected to the first test interface of the corresponding test station 40, and the second sampling interface of the component to be aged is connected to the second test interface of the corresponding test station 40.

[0090] When the number of components to be aged is less than the number of test stations 40, for ease of explanation, the test stations 40 and the components to be aged are sorted based on their distribution direction. Multiple components to be aged are sequentially arranged in multiple test stations 40, with some test stations 40 remaining empty at the rear. In this case, the second sampling interface of the last component to be aged is connected to the second test interface of the last test station 40. Alternatively, multiple components to be aged can be sequentially arranged from back to front in multiple test stations 40, leaving some test stations 40 empty at the front. In this case, the first sampling interface of the first component to be aged is connected to the first test interface of the first test station 40, and so on. This embodiment does not specifically limit the specific arrangements in this application.

[0091] In this embodiment, the control module 10, transformer module 20, and resistive element 30 can work together to simulate resistive, capacitive, and inductive load conditions, enabling the aging device 100 to generate different power factors. This allows the components to be aged to operate based on different power factors, thereby achieving aging testing. Furthermore, this application can simulate different load conditions simply by switching the voltage of the resistive element 30, reducing hardware investment, simplifying the circuit structure, and lowering the cost and maintenance cost of the aging device 100.

[0092] In addition, this application also provides an aging system, including a component to be aged and the aging device 100 in the above embodiments. The component to be aged is disposed in the test station 40, one end of the secondary winding 22 is electrically connected to one end of the current sampling interface 11, and the component to be aged is connected between the other end of the secondary winding 22 and the other end of the current sampling interface 11.

[0093] Among them, such as Figure 1 As shown, the current sampling interface 11 may specifically include an S1 interface and an S2 interface. The S1 interface can be electrically connected to one end of the secondary winding 22, and the S2 interface can be electrically connected to the component to be aged.

[0094] In this way, the component to be aged can be connected in series between the secondary winding 22 and the current sampling interface 11, so that the component to be aged can operate based on the power factor of the control module 10 and continue to operate according to its own switching control logic, and complete the aging test under long-term energized operation.

[0095] In the aging system proposed in this application, the structure and circuit structure of the aging device 100 are relatively simple, which can facilitate the provision of dynamically changing working conditions for the part to be aged, so that the part to be aged can work continuously and thus fully verify the stability of the part to be aged in the long-term operation.

[0096] The component to be aged has a voltage interface and a current interface. The component to be aged is connected to the other end of the secondary winding 22 and the other end of the current sampling interface 11 via the current interface. The voltage interface is connected to the power supply.

[0097] In this way, the voltage interface of the component to be aged can be connected to a power source to provide operating power to the component. Furthermore, the current interface of the component to be aged is electrically connected between the secondary winding 22 of the transformer and the current sampling interface 11, which can collect analog current and operate based on the operating conditions of the aging device 100.

[0098] In some embodiments, the aging system further includes a voltage conversion device connected to a power supply, and a voltage interface connected to the voltage conversion device. Thus, the voltage conversion device can selectively output phase voltage or line voltage to match the rated voltage of the component to be aged.

[0099] It is understandable that the rated voltage of different specifications of components to be aged may vary, with some products adapting to phase voltage (220V) and others to line voltage (380V). The above-mentioned setting in this application allows for switching the voltage output type via a voltage conversion device. In this way, the aging device 100 can be adapted to multiple components to be aged without replacing hardware or modifying wiring, thus reducing equipment investment costs.

[0100] Specifically, the following explanation will be given using the voltage sampling interface 12 connected to phase A and the neutral line as an example.

[0101] When the rated voltage of the component to be aged is 220V, the voltage conversion device can output the voltage between phase A and the neutral line. At this time, when terminal 14 corresponding to phase A is connected to the common terminal 13, the aging device 100 exhibits resistive characteristics, and the power factor of the control module 10 is 1. When terminal 14 corresponding to phase B is connected to the common terminal 13, the simulated current is phase B, leading the reference voltage (phase A) by 120°, the aging device 100 exhibits capacitive characteristics, and the power factor of the control module 10 is -0.5. When terminal 14 corresponding to phase C is connected to the common terminal 13, the simulated current is phase C, lagging the reference voltage by 120°, the aging device 100 exhibits inductive characteristics, and the power factor of the control module 10 is 0.5.

[0102] When the rated voltage of the component to be aged is 380V, the voltage conversion device can output the voltage between phase B and phase C. At this time, when terminal 14 corresponding to phase A is connected to the common terminal 13, the aging device 100 exhibits resistive characteristics, and the power factor of the control module 10 is 1. When terminal 14 corresponding to phase B is connected to the common terminal 13, the simulated current is phase B, leading the reference voltage (phase A) by 120°, the aging device 100 exhibits capacitive characteristics, and the power factor of the control module 10 is -0.5. When terminal 14 corresponding to phase C is connected to the common terminal 13, the simulated current is phase C, lagging the reference voltage by 120°, the aging device 100 exhibits inductive characteristics, and the power factor of the control module 10 is 0.5.

[0103] Finally, it should be noted that the above embodiments are merely specific implementations of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions within the technical scope disclosed in this application should be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. An aging apparatus for performing aging tests on parts to be aged, characterized in that, The aging device includes: The control module has a current sampling interface and a voltage sampling interface. The control module includes a common terminal and multiple terminals. The multiple terminals are used to connect different phase lines of the power supply. The voltage sampling structure is used to connect any phase line and the neutral line of the power supply to collect a reference voltage. The transformer module includes a primary winding and a secondary winding coupled together. One end of the primary winding is connected to the common terminal, and the other end of the primary winding is connected to the neutral line of the power supply. One end of the secondary winding is connected to one end of the current sampling structure. The other end of the secondary winding and the other end of the current sampling interface are both connected to a test station for the device to be aged. A resistive element is connected in parallel to the secondary winding; Each of the multiple terminals is connected to a switching switch, which is used to control the connection or disconnection between the phase wire connected to the corresponding terminal and the common terminal.

2. The aging device according to claim 1, characterized in that, The control module has a built-in relay, and the switching switch is the relay; Alternatively, the switching switch is connected externally to the control module, and the switching switch includes any one of a contactor, a composite switch, and a contactless thyristor switch.

3. The aging device according to claim 2, characterized in that, When the switch is a relay, the switch includes a first contact and a second contact that cooperate with each other. The first contact is movably configured to connect with the second contact to close the switch, or to separate from the second contact to open the switch. The first contacts of the plurality of switching switches are all connected to the common terminal, and the second contacts of the plurality of switching switches are respectively connected to the plurality of wiring terminals.

4. The aging device according to claim 2, characterized in that, The control module also includes an electrically connected control unit and a drive unit. The control unit is configured with a switching cycle and can output a timing control signal based on the switching cycle. The drive unit can drive the switching switches corresponding to multiple terminals to close in turn based on the timing control signal.

5. The aging apparatus according to claim 1, characterized in that, The power supply includes phase lines A, phase line B, and phase line C. The voltage sampling interface includes a first interface and a second interface. The first interface is used to connect to phase line A, and the second interface is used to connect to the neutral line to collect the reference voltage. The number of terminals is 3, and the 3 terminals are respectively used to connect the A phase line, the B phase line and the C phase line; When the phase line corresponding to different terminals is connected to the common terminal, the voltage phase of the secondary winding is different, and the resistive element generates an analog current with a different phase based on the voltage of the secondary winding; When the voltage sampling structure acquires the reference voltage, and the A-phase line is connected to the common terminal, the analog current is in phase with the reference voltage. When the B-phase line is connected to the common terminal, the analog current leads the reference voltage. When the C-phase line is connected to the common terminal, the analog current lags behind the reference voltage.

6. The aging apparatus according to claim 1, characterized in that, The resistive element includes any one of wire-wound resistors, heating tubes, thin-film resistors, or metal sheets.

7. The aging apparatus according to claim 1, characterized in that, The number of test stations is multiple, and all of the test stations are connected in series between the secondary winding and the current sampling interface.

8. An aging system, characterized in that, The aging system includes the part to be aged and the aging device according to any one of claims 1-7; The component to be aged is placed in the test station. One end of the secondary winding is electrically connected to one end of the current sampling interface, and the component to be aged is connected between the other end of the secondary winding and the other end of the current sampling interface.

9. The aging system according to claim 8, characterized in that, The component to be aged has a voltage interface and a current interface. The component to be aged is connected to the other end of the secondary winding and the other end of the current sampling interface through the current interface. The voltage interface is connected to the power supply.

10. The aging system according to claim 9, characterized in that, The aging system also includes a voltage conversion device, which is connected to the power supply, and the voltage interface is connected to the voltage conversion device; The voltage conversion device can selectively output phase voltage or line voltage to match the rated voltage of the component to be aged.

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