Detection device for characterization parameters of stress concentration coefficient parameters of key component

Abstract

The utility model discloses a detection device and a detection method for characterization parameters related to stress concentration coefficients of key components, the detection device comprises a base, an image size measurement system, a white light interference measurement system and a rotary table, the image size measurement system comprises a CCD industrial camera I, a telecentric lens and a coaxial parallel light source; the white light interference measuring system comprises a CCD industrial camera II, a white light interference lens and a white light source, the Z-axis moving device comprises a ball screw and piezoelectric ceramics, and the rotating table comprises a rotating driving motor, a clamping rotating disc and a fixed table. The utility model belongs to the technical field of stress detection, and particularly solves the problems that in the prior art, structural stress concentration characterization parameters and surface stress concentration characterization parameters cannot be measured at the same time, so that the steps are complicated, a test bar needs to be rotated manually, and the surface topographies on different areas are not easy to measure. The device and the method are a novel device and a novel method for detecting characterization parameters related to stress concentration coefficients of key components.

Description

Technical Field

[0001] The utility model belongs to the technical field of stress detection, and specifically refers to a detection device for parameter characterization parameters related to the stress concentration factor of key components. Background Art

[0002] Key components are the core load-bearing parts of high-end equipment. When key components are subjected to cyclic loads, cracks will initiate. Due to continuous cyclic loads, the cracks will expand and eventually fatigue fracture, which will lead to serious safety accidents. The fundamental reason for crack initiation is stress concentration. The stress concentration factor is used to describe the degree of stress concentration. Therefore, improving the calculation accuracy of the stress concentration factor is the basic research work to achieve the technical upgrade of key components. The stress concentration factor can be divided into structural stress concentration factor and surface stress concentration factor. When calculating the structural stress concentration factor, it is necessary to obtain the structural characterization parameters of the notched specimen. When calculating the surface stress concentration factor, it is necessary to obtain the characterization parameters of the bottom surface morphology of the notched specimen. Therefore, being able to easily obtain these characterization parameters is the basic work for the subsequent calculation of the stress concentration factor.

[0003] At present, the measurement of key components such as notched specimens uses commercial instruments such as laser confocal microscopes, which cannot perform targeted measurements based on the characteristics of notched specimens and do not have the function of simultaneously measuring structural stress concentration characterization parameters and surface stress concentration characterization parameters, which makes the steps of measuring characterization parameters complicated. In the process of using commercial instruments, if you want to measure the surface morphology on different notch bottom areas, you need to rely on manual rotation of the test rod, which makes it difficult to measure the surface morphology on different areas. The trend removal method adopted in commercial instruments is not leveled according to the actual notch trend, which easily leads to the loss of key information during the leveling process, resulting in inaccurate measurements. Utility Model Content

[0004] The technical problems to be solved by the utility model are:

[0005] The existing technology cannot simultaneously measure the structural stress concentration characterization parameters and the surface stress concentration characterization parameters, which makes the steps of measuring the characterization parameters complicated; it is necessary to rely on manual rotation of the test rod, which makes it difficult to measure the surface morphology of different areas.

[0006] In order to solve the above technical problems, the technical solution proposed in the utility model is: a detection device for parameter characterization parameters related to the stress concentration coefficient of key components, including a base, an image size measurement system, a white light interferometry measurement system and a rotating table, the image size measurement system is fixedly installed on both sides of the base, the white light interferometry measurement system is fixedly installed on the upper side of the base through a Z-axis moving device, the rotating table is fixedly set on the base through a precise two-dimensional moving platform, and the notched sample is disassembled and fixed on the rotating table.

[0007] Furthermore, the image size measurement system includes a CCD industrial camera, a telecentric lens and a coaxial parallel light source. The CCD industrial camera is fixed on one side of the base through a mounting base, the telecentric lens is arranged on the other side of the mounting base and corresponds to the position of the CCD industrial camera, and the coaxial parallel light source is fixed on the side of the base away from the telecentric lens.

[0008] Furthermore, the white light interferometry measurement system includes a second CCD industrial camera, a white light interference lens and a white light source. The second CCD industrial camera is fixed on a Z-axis moving device through a connecting frame, the white light interference lens is installed on a side of the second CCD industrial camera close to the notched sample, and the white light source is fixed on one side of the white light interference lens.

[0009] Furthermore, the Z-axis moving device includes a ball screw and piezoelectric ceramics, the ball screw is fixed to the upper side of the base through a mounting bridge, the piezoelectric ceramics are fixedly mounted on the ball screw, and the CCD industrial camera 2 is fixed to the piezoelectric ceramics through a connecting frame.

[0010] Furthermore, the rotating table includes a rotating drive motor, a clamping turntable and a fixed table. A mounting plate is provided on the precision two-dimensional moving platform. The rotating drive motor is fixed on one side of the mounting plate and the output shaft passes through the mounting plate. The clamping turntable is fixed on the output shaft of the rotating drive motor. The fixed table is installed on one end of the mounting plate away from the clamping turntable. The notched sample is clamped between the clamping turntable and the fixed table.

[0011] Furthermore, the mounting plate is fixed on the nut of the ball screw 14 and slides relative to the ball screw 14 .

[0012] The beneficial effects achieved by the utility model using the above structure are as follows:

[0013] 1. By setting up an image size measurement system and a white light interferometry measurement system, the steps can be simplified and the structural stress concentration characterization parameters and the surface stress concentration characterization parameters can be measured simultaneously;

[0014] 2. The sample can be rotated by setting up a rotating table so as to measure the surface morphology of different areas of the sample, thus overcoming the trouble of manual rotation. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the overall structure of a detection device for parameter characterization parameters related to the stress concentration factor of key components proposed by the present invention;

[0016] Figure 2This is a schematic structural diagram from another angle of a detection device for parameter characterization parameters related to the stress concentration factor of a key component proposed by the present invention;

[0017] Figure 3 This is a schematic structural diagram of a third angle of a detection device for parameter characterization parameters related to the stress concentration factor of a key component proposed by the present invention.

[0018] Among them, 1. Base, 2. Image size measurement system, 3. White light interferometry measurement system, 4. Z-axis moving device, 5. Precision two-dimensional moving platform, 6. Rotating table, 7. Notched sample, 8. CCD industrial camera 1, 9. Telecentric lens, 10. Coaxial parallel light source, 11. CCD industrial camera 2, 12. White light interference lens, 13. White light source, 14. Ball screw, 15. Piezoelectric ceramics, 16. Rotary drive motor, 17. Clamping turntable, 18. Fixed table.

[0019] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. They are used together with the embodiments of the present invention to explain the present invention and do not constitute a limitation to the present invention. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0021] like Figure 1-3 As shown, the utility model proposes Figure 1-3 As shown, a detection device for parameter characterization parameters related to the stress concentration coefficient of key components proposed in the present invention includes a base 1, an image size measurement system 2, a white light interferometry measurement system 3 and a rotating table 6, the image size measurement system 2 is fixedly installed on both sides of the base 1, the white light interferometry measurement system 3 is fixedly erected on the upper side of the base 1 through a Z-axis moving device 4, the rotating table 6 is fixedly set on the base 1 through a precise two-dimensional moving platform 5, and the notched sample 7 is disassembled and fixed on the rotating table 6.

[0022] In order to collect the image required to calculate the structural stress concentration characterization parameters of the notched specimen, the image size measurement system 2 includes a CCD industrial camera 8, a telecentric lens 9 and a coaxial parallel light source 10. The CCD industrial camera 8 is fixed to one side of the base 1 through a mounting base, the telecentric lens 9 is arranged on the other side of the mounting base and corresponds to the position of the CCD industrial camera 8, and the coaxial parallel light source 10 is fixed on the side of the base 1 away from the telecentric lens 9.

[0023] In order to collect the bottom image of the notched sample, the white light interferometry measurement system 3 includes a CCD industrial camera 11, a white light interference lens 12 and a white light source 13. The CCD industrial camera 11 is fixed on the Z-axis moving device 4 through a connecting frame, the white light interference lens 12 is installed on the side of the CCD industrial camera 11 close to the notched sample 7, and the white light source 13 is fixed on one side of the white light interference lens 12.

[0024] In order to facilitate the adjustment of the distance between the white light interferometry system 3 and the notched sample 7, the Z-axis moving device 4 includes a ball screw 14 and a piezoelectric ceramic 15. The ball screw 14 is fixed to the upper side of the base 1 through a mounting bridge, and the piezoelectric ceramic 15 is fixedly mounted on the ball screw 14. The CCD industrial camera 11 is fixed to the piezoelectric ceramic 15 through a connecting frame. The piezoelectric ceramic 15 is used to continuously collect multiple images of the bottom of the notched sample 7, and then use the point cloud algorithm to process the image to generate a microscopic morphology point cloud of the bottom surface of the notched sample 7. In order to reduce the trouble and error caused by manual rotation, the rotating table 6 includes a rotating The rotating drive motor 16, the clamping turntable 17 and the fixed table 18, the precision two-dimensional mobile platform 5 is provided with a mounting plate, the rotating drive motor 16 is fixedly arranged on one side of the mounting plate and the output shaft passes through the mounting plate, the clamping turntable 17 is fixed on the output shaft of the rotating drive motor 16, the fixed table 18 is installed on the end of the mounting plate away from the clamping turntable 17, the notched sample 7 is clamped between the clamping turntable 17 and the fixed table 18, the precision two-dimensional mobile platform and the rotating table are used to adjust the position of the sample to collect images in different areas, the mounting plate is fixed on the nut of the ball screw 14 and slides relative to the ball screw 14.

[0025] During specific use, the device is used to collect data of the notch sample, the CCD industrial camera 1 8, telecentric lens 9 and coaxial parallel light source 10 are used to collect pictures of the notch sample, and the CCD industrial camera 2 11, white light interference lens 12, white light source 13 and ball screw 14 are used to collect the bottom surface micro-morphology point cloud of the notch sample 7. The operation of the rotary drive motor 16 can drive the notch sample 7 to rotate to reduce the trouble and error caused by manual rotation; the collected data can be used to calculate the structural stress concentration characterization parameters and the surface stress concentration characterization parameters. The above is the use process of the detection device and detection method for the parameter characterization parameters related to the stress concentration coefficient of the key components.

[0026] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0027] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

[0028] The above description of the utility model and its implementation methods is not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. A detection device for parameters characterizing stress concentration factors of key components, characterized by: The invention comprises a base (1), an image size measurement system (2), a white light interferometry system (3) and a rotating table (6), wherein the image size measurement system (2) is fixedly mounted on both sides of the base (1), the white light interferometry system (3) is fixedly arranged on the upper side of the base (1) via a Z-axis moving device (4), the rotating table (6) is fixedly arranged on the base (1) via a precise two-dimensional moving platform (5), and the notched sample (7) is disassembled and fixed on the rotating table (6).

2. The detection device for characterizing parameters of stress concentration factor parameters of key components according to claim 1, characterized in that: The image size measurement system (2) comprises a CCD industrial camera (8), a telecentric lens (9) and a coaxial parallel light source (10); the CCD industrial camera (8) is fixed to one side of a base (1) via a mounting seat; the telecentric lens (9) is arranged on the other side of the mounting seat and corresponds to the position of the CCD industrial camera (8); and the coaxial parallel light source (10) is fixed to a side of the base (1) away from the telecentric lens (9).

3. The detection device for characterizing parameters of stress concentration factor parameters of key components according to claim 2, characterized in that: The white light interferometric measurement system (3) comprises a second CCD industrial camera (11), a white light interferometric lens (12) and a white light source (13); the second CCD industrial camera (11) is fixed to a Z-axis moving device (4) via a connecting frame; the white light interferometric lens (12) is mounted on a side of the second CCD industrial camera (11) close to the notched sample (7); and the white light source (13) is fixed to one side of the white light interferometric lens (12).

4. The detection device for characterizing parameters of stress concentration factor parameters of key components according to claim 3, characterized in that: The Z-axis moving device (4) comprises a ball screw (14) and a piezoelectric ceramic (15); the ball screw (14) is fixed to the upper side of the base (1) via a mounting bridge; the piezoelectric ceramic (15) is fixedly mounted on the ball screw (14); and the CCD industrial camera 2 (11) is fixed to the piezoelectric ceramic (15) via a connecting frame.

5. The detection device for characterizing parameters of stress concentration factor parameters of key components according to claim 4, characterized in that: The rotating table (6) comprises a rotating drive motor (16), a clamping turntable (17) and a fixed table (18); a mounting plate is provided on the precision two-dimensional mobile platform (5); the rotating drive motor (16) is fixedly arranged on one side of the mounting plate and the output shaft passes through the mounting plate; the clamping turntable (17) is fixed on the output shaft of the rotating drive motor (16); the fixed table (18) is installed at one end of the mounting plate away from the clamping turntable (17); and the notched sample (7) is clamped between the clamping turntable (17) and the fixed table (18).

6. The detection device for characterizing parameters of stress concentration factor parameters of key components according to claim 5, characterized in that: The mounting plate is fixed on the nut of the ball screw (14) and slides relative to the ball screw (14).

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