Test fixture of probe type connector

Abstract

The utility model discloses a test fixture for a probe type connector, which relates to the technical field of test fixtures and comprises a base, a top plate is fixedly mounted on the top surface of a vertical column, a cylinder is fixedly mounted on the top surface of the top plate, a test top frame is fixedly mounted at the output end of the cylinder, mounting frames are fixedly mounted on the surfaces of the two sides of the base, and the mounting frames are fixedly mounted on the surfaces of the two sides of the base. A threaded rod is arranged in the mounting frame, a clamping wedge plate is movably clamped in the mounting frame, and moving wheels are fixedly mounted on the bottom surface of the clamping wedge plate. By rotating the threaded rod, a moving block can be driven to move on the top surface of the clamping wedge plate under the action of threads, so that the clamping wedge plate moves downwards in the mounting frame; and when moving wheels on the bottom faces of the clamping wedge plates make contact with the containing face and supporting protruding blocks are ejected away from the containing face, the whole device can be conveniently and rapidly moved, and therefore the purpose that the whole device can be moved without carrying the whole device is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of testing fixtures, in particular to a testing fixture for a probe type connector. Background Art

[0002] Probe test fixtures are key equipment used in the manufacturing and testing of electronic products. They are usually used to test electronic components, connectivity, electrical characteristics and functionality on circuit boards. In general, probe test fixtures play an important role in the electronic manufacturing process, helping manufacturers ensure that their products meet specifications. During the production process of connectors, probe test fixtures need to be used for testing, and subsequent operations can only be carried out after they pass the test.

[0003] However, there are still some problems in the actual use of the existing probe-type test fixture. For example, due to its own structural reasons, the existing probe-type test fixture generally has a large weight. When the fixture needs to be moved, the fixture needs to be carried, thereby increasing the labor intensity of the tester.

[0004] To this end, we propose a test fixture for probe-type connectors. Summary of the invention

[0005] The utility model provides a testing fixture for a probe type connector.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a test fixture for a probe-type connector, comprising a base, a guide rail is fixedly installed on the top surface of the base, a test base frame is movably installed on the top surface of the guide rail, a column is fixedly installed on the top surface of the base, a top plate is fixedly installed on the top surface of the column, a cylinder is fixedly installed on the top surface of the top plate, a test top frame is fixedly installed on the output end of the cylinder, mounting frames are fixedly installed on both side surfaces of the base, a clamping wedge is movably clamped inside the mounting frame, and moving wheels are fixedly installed on the bottom surface of the clamping wedge.

[0007] Preferably, a limiting plate is provided below the clamping wedge plate, one side surface of the limiting plate is fixedly mounted to one side surface of the base, and a spring 1 is fixedly connected between the limiting plate and the clamping wedge plate.

[0008] Preferably, fixed plates are fixedly mounted on both side surfaces of the base, a threaded rod is sleeved on the internal thread of the fixed plate, a moving block is rotatably connected to one end of the threaded rod, and the bottom surface of the moving block contacts the top surface of the clamping wedge plate.

[0009] Preferably, a knob is fixedly mounted on the other end of the threaded rod, and a plurality of anti-slip grooves are formed on the outer surface of the knob.

[0010] Preferably, the bottom surface of the base is provided with supporting protrusions, the number of the supporting protrusions is four, and the four supporting protrusions are respectively fixedly mounted at the four corners of the bottom surface of the base.

[0011] Preferably, a mounting block is fixedly mounted on the top surface of the base, a contact plate is provided on one side surface of the mounting block, and a second spring and an elastic column are fixedly connected between the contact plate and the mounting block.

[0012] Preferably, a second spring is fixedly mounted on one side surface of the contact plate, and the second spring is a rubber pad.

[0013] Compared with the prior art, the beneficial effects of the utility model are:

[0014] 1. By setting up a mounting frame and a clamping wedge plate, by rotating the threaded rod, the moving block can be driven to move on the top surface of the clamping wedge plate under the action of the thread, so that the clamping wedge plate moves downward inside the mounting frame until the moving wheel on the bottom surface of the clamping wedge plate contacts the placement surface and the supporting protrusion is pushed away from the placement surface, the entire device can be moved conveniently and quickly, thereby achieving the purpose of moving the entire device without carrying the entire device.

[0015] 2. By setting the contact plate and the second spring, and by pushing the test chassis to move in the direction of the mounting block, after one side surface of the test chassis contacts the contact plate and the protective pad, the second spring and the elastic column can play a good buffering role, effectively protecting the test chassis and preventing the test chassis from being damaged in the case of excessive movement. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the overall side view structure of the utility model;

[0018] Figure 3 For this utility model Figure 2 The enlarged structural diagram at B in the middle;

[0019] Figure 4 For this utility model Figure 1 Enlarged structural diagram at A in the middle.

[0020] In the figure: 1. base; 2. guide rail; 3. test base frame; 4. column; 5. top plate; 6. cylinder; 7. test top frame; 8. support protrusion; 9. mounting frame; 10. clamping wedge plate; 11. moving wheel; 12. fixing plate; 13. threaded rod; 14. moving block; 15. limit plate; 16. spring 1; 17. knob; 18. anti-skid groove; 19. mounting block; 20. contact plate; 21. spring 2; 22. elastic column; 23. protective pad. DETAILED DESCRIPTION

[0021] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model. Example

[0022] See also Figure 1-4 The figure shows a test fixture for a probe type connector, comprising a base 1, a guide rail 2 is fixedly installed on the top surface of the base 1, a test base frame 3 is movably installed on the top surface of the guide rail 2, a column 4 is fixedly installed on the top surface of the base 1, a top plate 5 is fixedly installed on the top surface of the column 4, a cylinder 6 is fixedly installed on the top surface of the top plate 5, a test top frame 7 is fixedly installed on the output end of the cylinder 6, mounting frames 9 are fixedly installed on both side surfaces of the base 1, a clamping wedge plate 10 is movably clamped inside the mounting frame 9, and a moving wheel 11 is fixedly installed on the bottom surface of the clamping wedge plate 10.

[0023] See also Figure 1-4 In the figure, a limiting plate 15 is arranged below the clamping wedge plate 10, one side surface of the limiting plate 15 is fixedly installed with one side surface of the base 1, a spring 16 is fixedly connected between the limiting plate 15 and the clamping wedge plate 10, and fixing plates 12 are fixedly installed on both side surfaces of the base 1, and a threaded rod 13 is sleeved on the internal thread of the fixing plate 12, and a moving block 14 is rotatably connected to one end of the threaded rod 13, and the bottom surface of the moving block 14 contacts the top surface of the clamping wedge plate 10.

[0024] In this embodiment: when the device as a whole needs to be moved, it is only necessary to rotate the threaded rod 13. During the rotation of the threaded rod 13, the moving block 14 can be driven to move on the top surface of the clamping wedge plate 10 under the action of the thread. During the movement of the moving block 14, the clamping wedge plate 10 can be moved downward inside the mounting frame 9 until the moving wheel 11 on the bottom surface of the clamping wedge plate 10 contacts the placement surface and pushes the supporting protrusion 8 away from the placement surface, so that the device as a whole can be moved conveniently and quickly. After moving to the appropriate position, it is only necessary to rotate the threaded rod 13 in the opposite direction to make the moving block 14 move in the opposite direction, and the clamping wedge plate 10 can move upward under the resetting action of the spring 16, so that the moving wheel 11 moves upward and away from the placement surface, and the supporting protrusion 8 contacts the placement surface again, so as to provide stable support for the device as a whole.

[0025] A knob 17 is fixedly mounted on the other end of the threaded rod 13 , and a plurality of anti-skid grooves 18 are provided on the outer surface of the knob 17 . The threaded rod 13 can be rotated better by the arrangement of the knob 17 and the anti-skid grooves 18 . Example

[0026] See also Figure 1-4 This embodiment further explains Example 1. In the figure, a mounting block 19 is fixedly mounted on the top surface of the base 1, a contact plate 20 is provided on one side surface of the mounting block 19, and a spring 21 and an elastic column 22 are fixedly connected between the contact plate 20 and the mounting block 19.

[0027] In this embodiment: during use, by pushing the test chassis 3 to move in the direction of the mounting block 19, after the surface of one side of the test chassis 3 contacts the contact plate 20 and the protective pad 23, the spring 21 and the elastic column 22 can play a good buffering role, effectively protecting the test chassis 3 and preventing the test chassis 3 from being damaged in the case of excessive movement.

[0028] See also Figure 1 The bottom surface of the base 1 is provided with supporting protrusions 8, and the number of the supporting protrusions 8 is four. The four supporting protrusions 8 are respectively fixedly installed at the four corners of the bottom surface of the base 1.

[0029] In this embodiment, the supporting protrusion 8 is provided so that the entire device can be placed stably.

[0030] See also Figure 4 In the figure, a spring 21 is fixedly mounted on one side surface of the contact plate 20, and the spring 21 is a rubber pad.

[0031] In this embodiment, the protective pad 23 can prevent the test chassis 3 from directly contacting the contact plate 20 when contacting a side surface of the test chassis 3 , thereby further improving the protective effect of the test chassis 3 .

[0032] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include"-"comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process-method-article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process-method-article or device.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test fixture for a probe type connector, comprising a base (1), a guide rail (2) being fixedly mounted on the top surface of the base (1), and a test base frame (3) being movably mounted on the top surface of the guide rail (2), characterized in that: A column (4) is fixedly mounted on the top surface of the base (1), a top plate (5) is fixedly mounted on the top surface of the column (4), a cylinder (6) is fixedly mounted on the top surface of the top plate (5), a test top frame (7) is fixedly mounted on the output end of the cylinder (6), mounting frames (9) are fixedly mounted on both side surfaces of the base (1), a clamping wedge plate (10) is movably clamped inside the mounting frame (9), and a moving wheel (11) is fixedly mounted on the bottom surface of the clamping wedge plate (10).

2. A test fixture for a probe type connector according to claim 1, characterized in that: A limiting plate (15) is provided below the clamping wedge plate (10), one side surface of the limiting plate (15) is fixedly mounted to one side surface of the base (1), and a spring 1 (16) is fixedly connected between the limiting plate (15) and the clamping wedge plate (10).

3. A test fixture for a probe type connector according to claim 2, characterized in that: Fixed plates (12) are fixedly mounted on both side surfaces of the base (1); a threaded rod (13) is sleeved on the internal thread of the fixed plate (12); one end of the threaded rod (13) is rotatably connected to a moving block (14); the bottom surface of the moving block (14) contacts the top surface of the clamping wedge plate (10).

4. A test fixture for a probe type connector according to claim 3, characterized in that: A knob (17) is fixedly mounted on the other end of the threaded rod (13), and a plurality of anti-slip grooves (18) are provided on the outer surface of the knob (17).

5. A test fixture for a probe type connector according to claim 4, characterized in that: The bottom surface of the base (1) is provided with supporting protrusions (8), the number of the supporting protrusions (8) is four, and the four supporting protrusions (8) are respectively fixedly mounted at the four corners of the bottom surface of the base (1).

6. A test fixture for a probe type connector according to claim 5, characterized in that: A mounting block (19) is fixedly mounted on the top surface of the base (1), a contact plate (20) is provided on one side surface of the mounting block (19), and a second spring (21) and an elastic column (22) are fixedly connected between the contact plate (20) and the mounting block (19).

7. A test fixture for a probe type connector according to claim 6, characterized in that: A second spring (21) is fixedly mounted on one side surface of the contact plate (20), and the second spring (21) is a rubber pad.

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