Tunnel type multi-temperature-zone high and low temperature testing device

Abstract

The utility model discloses a tunnel type multi-temperature zone high and low temperature testing device, which comprises a supporting seat and a tunnel shell, the tunnel shell is assembled on the supporting seat, the cross section of the tunnel shell is of a semi-oblong structure, the center of the tunnel shell is provided with a detection groove, a plurality of insertion grooves are arranged outside the detection groove in an annular array, and the insertion grooves are connected with the supporting seat. A plurality of heat exchange plates are inserted into the plurality of inserting grooves; the utility model relates to the technical field of high and low temperature testing devices, in particular to a tunnel type multi-temperature-zone high and low temperature testing device, a plurality of connecting plates which are arranged in an annular array are arranged on a supporting shaft arranged on a tunnel shell to form a plurality of independent cavities, and the temperature in the independent cavities is adjusted through a plurality of heat exchange plates. The interior of the tunnel shell is divided into a plurality of temperature zones, high and low temperature tests can be conducted on different workpieces respectively, meanwhile, a double-end sealing structure is adopted, and heat and cold loss can be avoided when the workpieces are replaced.

Description

Technical Field

[0001] The utility model relates to the technical field of high and low temperature testing devices, in particular to a tunnel-type multi-temperature zone high and low temperature testing device. Background Art

[0002] With the development of semiconductor technology, component testing, especially three-temperature testing (low temperature, normal temperature, high temperature, components are functionally tested at these three temperatures) has also received much attention. At present, there are two main three-temperature testing methods. One is the out-of-box testing method, that is, placing the components separately in high and low temperature test boxes, keeping them warm for a certain period of time, and then taking them out to check the test results. The other is the in-box testing method, that is, a test box has both high and low temperatures, and the components to be tested and the test board are placed in one device to complete the test. Both tests have shortcomings. In the first one, after the tested components are taken out of the box, there will be a temperature rise. In the second one, if the components are tested first, since the entire test board is placed in a low temperature environment, if the test board has other auxiliary components, there may be failure of the auxiliary components, resulting in failure of the device test. In view of this, in-depth research on the above issues has resulted in this case. Utility Model Content

[0003] In view of the deficiencies of the prior art, the utility model provides a tunnel-type multi-temperature zone high and low temperature testing device, which solves the existing background technology problems.

[0004] To achieve the above objectives, the utility model is implemented through the following technical solutions: a tunnel-type multi-temperature zone high and low temperature testing device, comprising a support seat and a tunnel shell, the tunnel shell is assembled on the support seat, the cross-section of the tunnel shell is a semi-long circular structure, a detection slot is opened in the center of the tunnel shell, a plurality of insertion slots are arranged in a ring array outside the detection slot, and a plurality of heat exchange plates are inserted in the insertion slots;

[0005] A support shaft is arranged in the tunnel shell, and the support shaft and the tunnel shell are connected and separated by a plurality of connecting plates to form a plurality of chambers corresponding to the plurality of insertion slots, a pair of sliding grooves are provided on both sides of the connecting plate, and a blocking limit plate is connected to the inner end of the test support plate;

[0006] The support shaft is provided with a plurality of sliding rails corresponding to the plurality of insertion slots, the sliding rails are equipped with a test support plate, a sealing plate is provided at the end of the test support plate, and a plurality of limiting grooves are provided at the end of the tunnel shell, and the sealing plate is closed on the limiting groove;

[0007] A plurality of temperature regulating grooves are arranged on the outside of the tunnel shell corresponding to the plurality of insertion grooves, and a temperature controller and a heat exchange plate are arranged on the temperature regulating grooves.

[0008] Preferably, the sealing plate is an arc-less annular plate, and a sealing ring is arranged outside the sealing plate.

[0009] Preferably, some of the connecting plates are plates with a rectangular structure, and the supporting shaft is a columnar structure plate with a regular polygonal cross-section.

[0010] Preferably, the heat exchange plate is a plate with a rectangular structure and a plurality of reinforced heat conducting plates are arranged in a unidirectional linear array on one side.

[0011] Preferably, the insertion slot is provided with a plurality of enhanced heat exchange slots corresponding to a plurality of enhanced heat conduction plates.

[0012] Preferably, a plurality of jacks are provided at the end of the tunnel shell corresponding to the plurality of chambers, and a plurality of temperature detectors are inserted into the plurality of jacks. Beneficial Effects

[0013] The utility model provides a tunnel-type multi-temperature zone high and low temperature testing device. It has the following beneficial effects: the tunnel-type multi-temperature zone high and low temperature testing device has a plurality of connecting plates arranged in a ring array on a support shaft arranged on a tunnel shell, forming a plurality of independent chambers, and adjusting the temperature in the independent chambers through a plurality of heat exchange plates, dividing the tunnel shell into a plurality of temperature zones, and being able to perform high and low temperature tests on different workpieces respectively, and adopting a double-end sealing structure, which can prevent heat and cold loss when replacing workpieces. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the main cross-sectional structure of a tunnel-type multi-temperature zone high and low temperature testing device described in the utility model.

[0015] Figure 2 It is a side structural schematic diagram of a tunnel-type multi-temperature zone high and low temperature testing device described in the utility model.

[0016] Figure 3 This is a schematic diagram of the main structure of a tunnel-type multi-temperature zone high and low temperature testing device described in the present utility model.

[0017] In the figure: 1. Support seat; 2. Tunnel shell; 3. Insertion slot; 4. Heat exchange plate; 5. Support shaft; 6. Connecting plate; 7. Test support plate; 8. Blocking limit plate; 9. Sliding track; 10. Sealing plate; 11. Temperature controller; 12. Sealing ring; 13. Strengthened heat conduction plate; 14. Temperature detector. Implementation

[0018] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0019] See also Figure 1-3 The utility model provides an implementation scheme: a tunnel-type multi-temperature zone high and low temperature testing device, comprising a support seat 1 and a tunnel shell 2, the tunnel shell 2 is assembled on the support seat 1, the cross section of the tunnel shell 2 is a semi-long circular structure, a detection slot is opened in the center of the tunnel shell 2, and a plurality of insertion slots 3 are arranged in a ring array outside the detection slot, and a plurality of heat exchange plates 4 are inserted in the plurality of insertion slots 3. In the specific implementation process, the support seat 1 is the bottom support of the equipment, and the tunnel shell 2 is installed on the support seat 1, which is used as an equipment installation carrier for high and low temperature testing. The detection slot is used as a space for placing the detection workpiece, and the plurality of insertion slots 3 are used as a space for installing the heat exchange plate 4. The outside of the tunnel shell 2 is provided with a plurality of temperature regulating slots corresponding to the plurality of insertion slots 3, and a temperature controller 11 is provided on the temperature regulating slot and is attached to the heat exchange plate 4. The temperature of the heat exchange plate 4 is controlled by the temperature controller 11, and the temperature in the detection slot is controlled by the heat exchange plate 4; a support shaft 5 is provided in the tunnel shell 2, and the support shaft 5 and the tunnel shell 2 are connected and separated by a plurality of connecting plates 6 to form a plurality of chambers corresponding to the plurality of insertion slots 3;

[0020] In the specific implementation process, the support shaft 5 is connected to the inner wall of the tunnel shell 2 through several connecting plates 6 on the support shaft 5 to form an independent sealed chamber, each sealed chamber corresponds to a heat exchange plate 4, and the temperature of each chamber can be independently controlled according to different detection temperature requirements. Several sliding rails 9 are provided on the support shaft 5 corresponding to the several insertion slots 3, and a test support plate 7 is installed on the sliding rail 9. The test support plate 7 can slide on the sliding rail 9, and the test support plate 7 can be limited by the sliding rail 9. A sealing plate 10 is provided at the end of the test support plate 7, and several limiting grooves are provided at the end of the tunnel shell 2. The sealing plate 10 is closed on the limiting groove, and the column limiting groove is closed by the sealing plate 10. The limiting groove corresponds to each independent chamber end, and a pair of sliding grooves are opened on both sides of the connecting plate 6. The inner end of the test support plate 7 is connected with a blocking limiting plate 8, which is used to limit the pull-out distance of the test support plate 7. At the same time, sealing is achieved after the limiting blocking plate is pulled out to maintain the internal temperature and reduce the loss of heat or cold.

[0021] As a preferred solution, further, the sealing plate 10 is an arc-less annular plate, and a sealing ring 12 is arranged outside the sealing plate 10 to further enhance the sealing effect of the sealing plate 10.

[0022] As a preferred solution, further, the plurality of connecting plates 6 are rectangular structure plates, and the supporting shaft 5 is a columnar structure plate with a regular polygonal cross section.

[0023] As a preferred solution, further, the heat exchange plate 4 is a rectangular plate and a plurality of reinforced heat conducting plates 13 are arranged in a unidirectional linear array on one side to increase the heat exchange area of ​​the heat exchange plate 4 .

[0024] As a preferred solution, further, a plurality of enhanced heat exchange grooves are provided on the insertion slot 3 corresponding to a plurality of enhanced heat conducting plates 13 , so as to improve the area and efficiency of heat exchange between the enhanced heat conducting plates 13 and the insertion slot 3 .

[0025] As a preferred solution, further, a plurality of jacks are provided at the end of the tunnel shell 2 corresponding to the plurality of chambers, and a plurality of temperature detectors 14 are installed in the plurality of jacks for detecting the temperature inside each independent chamber and providing feedback for regulation.

[0026] From the above, it can be generally known that the tunnel-type multi-temperature zone high and low temperature testing device is provided with a plurality of connecting plates 6 arranged in a circular array on the support shaft 5 provided on the tunnel shell 2, forming a plurality of independent chambers, and the temperature in the independent chambers is adjusted by a plurality of heat exchange plates 4, so that the tunnel shell 2 is divided into a plurality of temperature zones, and high and low temperature tests can be performed on different workpieces respectively. At the same time, a double-end sealing structure is adopted, which can prevent heat and cold loss when the workpiece is replaced.

[0027] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A tunnel-type multi-temperature zone high and low temperature testing device, comprising a support base (1) and a tunnel shell (2), wherein the tunnel shell (2) is mounted on the support base (1), the cross section of the tunnel shell (2) is a semi-circular structure, a detection slot is provided at the center of the tunnel shell (2), and a plurality of insertion slots (3) are arranged in a ring array outside the detection slot, characterized in that: A plurality of heat exchange plates (4) are inserted into the plurality of insertion slots (3); A support shaft (5) is arranged inside the tunnel shell (2), and the support shaft (5) and the tunnel shell (2) are connected and separated by a plurality of connecting plates (6) to form a plurality of chambers corresponding to the plurality of insertion slots (3), and a pair of sliding slots are provided on both sides of the connecting plate (6); A plurality of sliding rails (9) are provided on the support shaft (5) corresponding to the plurality of insertion slots (3); a test support plate (7) is mounted on the sliding rail (9); the inner end of the test support plate (7) is connected to a blocking limit plate (8); a sealing plate (10) is provided at the end of the test support plate (7); a plurality of limit slots are provided at the end of the tunnel shell (2); and the sealing plate (10) is sealed on the limit slots; The tunnel shell (2) is provided with a plurality of temperature regulating grooves on the outside corresponding to the plurality of insertion grooves (3), and the temperature regulating grooves are provided with temperature controllers (11) in contact with the heat exchange plates (4).

2. A tunnel-type multi-temperature zone high and low temperature testing device according to claim 1, characterized in that: The sealing plate (10) is an arc-less annular plate, and a sealing ring (12) is arranged outside the sealing plate (10).

3. A tunnel-type multi-temperature zone high and low temperature testing device according to claim 2, characterized in that: Some of the connecting plates (6) are plates with a rectangular structure, and the supporting shaft (5) is a columnar structure plate with a regular polygonal cross section.

4. The tunnel-type multi-temperature zone high and low temperature testing device according to claim 3, characterized in that: The heat exchange plate (4) is a plate with a rectangular structure and a plurality of reinforced heat conduction plates (13) are arranged in a unidirectional linear array on one side.

5. The tunnel-type multi-temperature zone high and low temperature testing device according to claim 4, characterized in that: The insertion slot (3) is provided with a plurality of enhanced heat exchange slots corresponding to a plurality of enhanced heat conduction plates (13).

6. The tunnel-type multi-temperature zone high and low temperature testing device according to claim 5, characterized in that: A plurality of insertion holes are arranged at the end of the tunnel shell (2) corresponding to the plurality of chambers, and a plurality of temperature detectors (14) are inserted into the plurality of insertion holes.

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