Automatic chip testing device

Abstract

The utility model discloses an automatic chip testing device, and relates to the technical field of chip testing. The device comprises a workbench, a control panel arranged on the upper surface of the workbench, and a test pen arranged above the workbench. A material transferring assembly is arranged on the upper surface of the workbench. A feeding assembly is horizontally arranged on one side of the material transferring assembly. The feeding assembly is provided with a first pushing assembly. A good product output mechanism and a defective product output mechanism are horizontally arranged on one side of the feeding assembly side by side. The good product output mechanism and the defective product output mechanism are arranged on the two opposite sides of the material transferring assembly correspondingly. A second material pushing assembly is arranged above the material transferring assembly; a lifting assembly is vertically arranged between the second pushing assembly and the feeding assembly. The test pen is vertically connected to the lifting assembly. The chip testing device is reasonable in structural design and convenient to use, the chip testing efficiency is effectively improved, and meanwhile qualified chips and unqualified chips can be collected in a classified mode.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and particularly relates to an automatic chip testing device. Background Art

[0002] As the main component of many intelligent devices, chips need to be tested using testing equipment after production in order to avoid problems such as intelligent device paralysis after being installed in the intelligent device.

[0003] A Chinese patent with authorization announcement number CN220438494U discloses a chip testing device, which places a chip on the top of a buffer plate, further starts motor one, so that motor one drives the screw to rotate, and at the same time the screw drives the slider to move downward, and at the same time the slider drives the lifting plate and the test pen to move downward, and after the bottom end of the test pen contacts the chip, motor one is turned off, and the test pen can test the chip. The above device has the following disadvantages: 1) manual operation is required during loading, resulting in low chip testing efficiency; 2) after the chip detection is completed, qualified chips and unqualified chips cannot be classified and collected, resulting in the inability to effectively distinguish qualified chips from unqualified chips. Therefore, it is urgent to study an automated chip testing device to solve the above problems. Utility Model Content

[0004] The utility model provides an automatic chip testing device, the purpose of which is to solve the technical problems raised in the above background technology.

[0005] In order to solve the above technical problems, the utility model is realized by the following technical solutions:

[0006] The utility model is an automatic chip testing device, comprising a horizontally arranged workbench, a control panel installed on the upper surface of the workbench and a test pen arranged above the workbench; a transfer assembly is installed on the upper surface of the workbench; a loading assembly is horizontally installed on one side of the transfer assembly; a first pushing assembly for pushing a single chip on the loading assembly to the transfer assembly is installed on the loading assembly; a good product output mechanism and a defective product output mechanism are horizontally installed side by side on one side of the loading assembly; the good product output mechanism and the defective product output mechanism are respectively arranged on opposite sides of the transfer assembly; a second pushing assembly for pushing a single chip to the good product output mechanism or the defective product output mechanism is installed above the transfer assembly; a lifting assembly for carrying the test pen is vertically installed between the second pushing assembly and the loading assembly; the test pen is vertically connected to the lifting assembly; the control panel is electrically connected to the test pen, the transfer assembly, the loading assembly, the first pushing assembly, the good product output mechanism, the defective product output mechanism, the second pushing assembly and the lifting assembly respectively.

[0007] As a preferred technical solution of the utility model, the material transfer assembly includes a rotating cylinder horizontally fixed on the upper surface of the workbench; a transfer plate is horizontally fixed at the output end of the rotating cylinder; and a plurality of chip accommodating grooves are evenly distributed on the edge of the upper surface of the transfer plate.

[0008] As a preferred technical solution of the utility model, the loading assembly includes a pair of first beams fixed horizontally side by side on the upper surface of the workbench; a pair of first rollers are rotatably connected side by side between the two first beams; one end of the roller shaft of one of the first rollers is coaxially connected to the output end of a motor module; the motor module is fixed on a first beam; the two first rollers are connected through a first conveyor belt transmission; a plurality of dividing strips parallel to the first rollers are fixed side by side along the length direction on the outer surface of the first conveyor belt; a chip conveying space is formed between two adjacent dividing strips.

[0009] As a preferred technical solution of the utility model, the first pushing assembly includes a first support plate vertically fixed on a first cross beam; the first support plate is arranged on the side of the first cross beam away from the material transfer assembly; a first cylinder is horizontally fixed on the first support plate; the telescopic direction of the output end of the first cylinder is arranged perpendicular to the conveying direction of the first conveyor belt; a first pushing plate is vertically fixed to the output end of the first cylinder.

[0010] As a preferred technical solution of the utility model, the good product output mechanism includes a pair of second beams fixed horizontally side by side on the upper surface of the workbench; a pair of second rollers are rotatably connected side by side between the two second beams; the two second rollers are connected by a second conveyor belt transmission; the conveying direction of the second conveyor belt is arranged perpendicular to the conveying direction of the first conveyor belt.

[0011] As a preferred technical solution of the utility model, the defective product output mechanism includes a pair of third beams fixed horizontally side by side on the upper surface of the workbench; a pair of third rollers are rotatably connected side by side between the two third beams; the two third rollers are connected through a third conveyor belt transmission; the conveying direction of the third conveyor belt is arranged parallel to the conveying direction of the second conveyor belt.

[0012] As a preferred technical solution of the utility model, a first bevel gear is fixedly sleeved on one end of the roller shaft of another first roller; a second bevel gear is meshed on the first bevel gear; the second bevel gear is fixedly sleeved on one end of the roller shaft of a second roller; the other end of the roller shaft of the second roller is coaxially connected with one end of the roller shaft of a third roller through a transmission shaft.

[0013] As a preferred technical solution of the utility model, an annular groove is coaxially opened on the upper surface of the transfer plate; a plurality of through grooves connected to the chip accommodating groove are evenly distributed on the outer edge of the annular groove; the second pushing assembly includes a pair of second support plates vertically fixed on a second beam and a third beam respectively; the upper edges of the two second support plates are connected by a first mounting plate; a two-way cylinder is horizontally fixed on the lower surface of the first mounting plate; the telescopic directions of the two output ends of the two-way cylinder are perpendicular to the conveying direction of the second conveyor belt; push-pull blocks are fixed on the two output ends of the two-way cylinder; the lower parts of the two push-pull blocks are fixed with second pushing plates with a "┐"-shaped structure; the vertical sections of the two second pushing plates are slidably fitted in the chip accommodating groove or the annular groove or the through groove.

[0014] As a preferred technical solution of the utility model, the lifting assembly includes a second mounting plate horizontally fixed on the first mounting plate; a second cylinder is vertically fixed on the upper surface of the second mounting plate; the output end of the second cylinder passes through the second mounting plate and is horizontally fixed with a lifting plate; the test pen is vertically fixed on the lifting plate.

[0015] The utility model has the following beneficial effects:

[0016] The utility model places a plurality of chips side by side on a loading component, uses the loading component to transport the chips to a position corresponding to a first pushing component, then pushes a single chip on the loading component to the transfer component through the first pushing component, and then drives the test pen downward through the lifting component, and starts to test the chip after the test pen contacts the test point of the chip on the transfer component, and after the test pen completes the test of the chip, the lifting component drives the test pen to reset, and at the same time the test pen transmits the test result to the control panel, and the control panel controls the transfer component to rotate according to the test result to turn the chip to a good product output mechanism or a defective product output mechanism, and then the second pushing component pushes the chip on the transfer component to the good product output mechanism or the defective product output mechanism, thereby not only effectively improving the chip testing efficiency, but also being able to classify and collect qualified chips and unqualified chips.

[0017] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for describing the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1The utility model is a structural schematic diagram of an automatic chip testing device.

[0020] Figure 2 It is a structural schematic diagram of the connection between the test pen, the material transfer assembly, the material loading assembly, the good product output mechanism and the defective product output mechanism of the utility model.

[0021] Figure 3 It is a structural schematic diagram of the material transfer component of the utility model.

[0022] Figure 4 It is a structural schematic diagram of the connection between the feeding assembly, the good product output mechanism and the defective product output mechanism of the utility model.

[0023] Figure 5 It is a structural schematic diagram of the feeding assembly of the utility model.

[0024] Figure 6 It is a structural schematic diagram of the connection between the good product output mechanism and the defective product output mechanism of the utility model.

[0025] Figure 7 It is a structural schematic diagram of the connection between the first pushing assembly, the second pushing assembly and the lifting assembly of the utility model.

[0026] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0027] 1- workbench, 2- control panel, 3- test pen, 4- material transfer assembly, 5- loading assembly, 6- first push assembly, 7- good product output mechanism, 8- defective product output mechanism, 9- second push assembly, 10- lifting assembly, 11- first bevel gear, 12- second bevel gear, 13- transmission shaft, 401- rotating cylinder, 402- transfer plate, 403- chip accommodating groove, 404- annular groove, 405- through groove, 501- first beam, 502- first roller, 503- motor module, 504- The first conveyor belt, 505-dividing bar, 601-the first supporting plate, 602-the first cylinder, 603-the first pushing plate, 701-the second beam, 702-the second roller, 703-the second conveyor belt, 801-the third beam, 802-the third roller, 803-the third conveyor belt, 901-the second supporting plate, 902-the first mounting plate, 903-the two-way cylinder, 904-the pushing and pulling block, 905-the second pushing plate, 1001-the second mounting plate, 1002-the second cylinder, 1003-the lifting plate. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0029] Embodiment 1:

[0030] See also Figure 1-2 As shown, the utility model is an automatic chip testing device, comprising a horizontally arranged workbench 1, a control panel 2 installed on the upper surface of the workbench 1, and a test pen 3 arranged above the workbench 1; the control panel 2 and the test pen 3 are both conventional components in the art; a transfer assembly 4 is installed on the upper surface of the workbench 1; a loading assembly 5 is horizontally installed on one side of the transfer assembly 4; a first pushing assembly 6 for pushing a single chip on the loading assembly 5 to the transfer assembly 4 is installed on the loading assembly 5; a good product output mechanism 7 and a defective product output mechanism 8 are horizontally installed side by side on one side of the loading assembly 5; The good product output mechanism 7 and the defective product output mechanism 8 are respectively arranged on the opposite sides of the transfer component 4; a second pushing component 9 for pushing a single chip onto the good product output mechanism 7 or the defective product output mechanism 8 is installed above the transfer component 4; a lifting component 10 for carrying the test pen 3 is vertically installed between the second pushing component 9 and the loading component 5; the test pen 3 is vertically connected to the lifting component 10; the control panel 2 is electrically connected to the test pen 3, the transfer component 4, the loading component 5, the first pushing component 6, the good product output mechanism 7, the defective product output mechanism 8, the second pushing component 9 and the lifting component 10 respectively. When in use, multiple chips are placed side by side on the loading component 5, and the loading component 5 is used to transport the chip to the position corresponding to the first pushing component 6, and then the single chip on the loading component 5 is pushed onto the transfer component 4 by the first pushing component 6, and then the test pen 3 is driven downward by the lifting component 10, and the test pen 3 starts to test the chip after contacting the test point of the chip on the transfer component 4, and after the test pen 3 completes the test of the chip, the lifting component 10 drives the test pen 3 to reset, and at the same time, the test pen 3 transmits the test result to the control panel 2, and the control panel 2 controls the transfer component 4 to rotate according to the test result to turn the chip to the good product output mechanism 7 or the defective product output mechanism 8, and then the second pushing component 9 pushes the chip on the transfer component 4 to the good product output mechanism 7 or the defective product output mechanism 8, thereby not only effectively improving the chip testing efficiency, but also being able to classify and collect qualified chips and unqualified chips.

[0031] Embodiment 2:

[0032] Based on Example 1, Figure 2-3As shown, the material transfer assembly 4 includes a rotary cylinder 401 connected to the upper surface of the workbench 1 by horizontal bolts; the rotary cylinder 401 is a conventional component in the art; the output end of the rotary cylinder 401 is connected to a transfer plate 402 by horizontal bolts; the upper surface edge of the transfer plate 402 is evenly distributed with a plurality of rectangular chip receiving grooves 403. When in use, the chip in the chip receiving groove 403 is transferred by placing the chip in the chip receiving groove 403 and driving the transfer plate 402 to rotate 90° by the rotary cylinder 401, thereby effectively ensuring the chip testing efficiency.

[0033] Among them Figure 2 , Figure 4-5 and Figure 7 As shown, the loading assembly 5 includes a pair of first beams 501 connected to the upper surface of the workbench 1 by horizontal bolts side by side; a pair of first rollers 502 are connected to the two first beams 501 in a side-by-side rotatable manner; one end of the roller shaft of a first roller 502 is coaxially connected to the output end of a motor module 503; the motor module 503 is bolted to the first beam 501; the motor module 503 is a conventional component in the art, which is composed of a speed regulator and a servo motor; the two first rollers 502 are connected to each other through a first conveyor belt 504; the outer surface of the first conveyor belt 504 is bonded with a plurality of first rollers side by side along the length direction. 502 are parallel to the dividing strips 505; a chip conveying space is formed between two adjacent dividing strips 505; the first pushing assembly 6 includes a first supporting plate 601 connected to a first beam 501 by vertical bolts; the first supporting plate 601 is arranged on the side of the first beam 501 away from the material transfer assembly 4; a conventional first cylinder 602 in the field is connected to the first supporting plate 601 with horizontal bolts; the extension direction of the output end of the first cylinder 602 is perpendicular to the conveying direction of the first conveyor belt 504; the output end of the first cylinder 602 slides through the first supporting plate 601 and is connected to the first pushing plate 603 with vertical bolts. When in use, the chip is placed in the chip conveying space between two adjacent dividing strips 505, and the motor module 503 is used to drive the first roller 502 to rotate intermittently, thereby realizing the intermittent conveying of the chip by the first conveyor belt 504. Then, when the chip on the first conveyor belt 504 corresponds to the position of the first pusher plate 603, the first cylinder 602 drives the first pusher plate 603 to move in a straight line, prompting the first pusher plate 603 to push the chip on the first conveyor belt 504 into a chip accommodating groove 403 on the transfer disk 402, and the first pusher plate 603 is reset after completing the pushing, thereby realizing the loading of the chip, effectively ensuring the chip testing efficiency.

[0034] Embodiment three:

[0035] Based on Example 2, Figure 2 , Figure 4 and Figure 6As shown, the good product output mechanism 7 includes a pair of second crossbeams 701 connected to the upper surface of the workbench 1 by horizontal bolts in parallel; a pair of second rollers 702 are connected to the two second crossbeams 701 in parallel and rotatable connection; the two second rollers 702 are connected to each other through a second conveyor belt 703; the conveying direction of the second conveyor belt 703 is perpendicular to the conveying direction of the first conveyor belt 504; the defective product output mechanism 8 includes a pair of third crossbeams 801 connected to the upper surface of the workbench 1 by horizontal bolts in parallel; a pair of third rollers 802 are connected to the two third crossbeams 801 in parallel and rotatable connection; the two third rollers 802 are connected to each other through a second conveyor belt 703. The third conveyor belt 803 is connected by transmission; the conveying direction of the third conveyor belt 803 is set parallel to the conveying direction of the second conveyor belt 703; one end of the roller shaft of the other first roller 502 is keyed with a first bevel gear 11; the first bevel gear 11 is meshed with a second bevel gear 12; the second bevel gear 12 is keyed to one end of the roller shaft of a second roller 702; the other end of the roller shaft of a second roller 702 is coaxially connected with one end of the roller shaft of a third roller 802 through a transmission shaft 13; the transmission shaft 13 is respectively connected to the second roller 702 and the third roller 802 through a conventional coupling in the art. When in use, the first roller 502 drives the first bevel gear 11 to rotate, prompting the first bevel gear 11 to drive the second roller 702 to rotate through the second bevel gear 12, and at the same time, the second roller 702 drives the third roller 802 to rotate through the transmission shaft 12, thereby realizing the synchronous and unidirectional movement of the second conveyor belt 703 and the third conveyor belt 803, effectively ensuring the output effect of the chip.

[0036] Among them Figure 2-3 and Figure 7As shown, an annular groove 404 is coaxially provided on the upper surface of the transfer plate 402; a plurality of through grooves 405 connected to the chip accommodating groove 403 are evenly distributed on the outer edge of the annular groove 404; the width of the through groove 405 is smaller than the width of the chip accommodating groove 403; the second pusher assembly 9 includes a pair of second support plates 901 respectively connected to a second cross beam 701 and a third cross beam 801 by vertical bolts; the upper edges of the two second support plates 901 are connected by a first mounting plate 902; the first mounting plate 902 and the second support plate 901 are connected by bolts; the lower surface of the first mounting plate 902 is horizontally bolted with a conventional bidirectional cylinder 903 in the field; the telescopic directions of the two output ends of the bidirectional cylinder 903 are both perpendicular to the conveying direction of the second conveyor belt 703; the bidirectional Both output ends of the cylinder 903 are bolted to push-pull blocks 904; the lower parts of the two push-pull blocks 904 are welded with second push plates 905 in a "┐"-shaped structure; the vertical sections of the two second push plates 905 are slidably fitted in the chip accommodating groove 403 or the annular groove 404 or the through groove 405; the lifting assembly 10 includes a second mounting plate 1001 horizontally bolted to the first mounting plate 902; one edge of the second mounting plate 1001 is bolted to the upper edge of the first support plate 601; the upper surface of the second mounting plate 1001 is vertically bolted to a conventional second cylinder 1002 in the field; the output end of the second cylinder 1002 slides through the second mounting plate 1001 and is horizontally bolted to the lifting plate 1003; the test pen 3 is vertically bolted to the lifting plate 1003. During use, after the first push plate 603 pushes the chip on the first conveyor belt 504 into a chip accommodating groove 403 on the transfer disc 402, the second cylinder 1002 drives the lifting plate 1003 to move downward, and the test pen 3 tests the chip. After the test pen 3 completes the test of the chip, the second cylinder 1002 drives the test pen 3 to reset, and then the control panel 2 controls the rotating cylinder 401 according to the test result, prompting the transfer disc 402 to rotate 90° counterclockwise or clockwise, and then the bidirectional cylinder 903 drives the push-pull block 904 to move, prompting the push-pull block 904 to drive the second push plate 905 to move from the annular groove 404 through the through groove 405 to the chip accommodating groove 403, so as to push the chip in the chip accommodating groove 403 onto the second conveyor belt 703 or the third conveyor belt 803, and then the bidirectional cylinder 903 drives the second push plate 905 to reset, thereby realizing the classified collection of chips.

[0037] The preferred embodiments of the utility model disclosed above are only used to help explain the utility model. The preferred embodiments do not describe all the details in detail, nor do they limit the utility model to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the utility model, so that technicians in the relevant technical field can well understand and use the utility model. The utility model is limited only by the claims and their full scope and equivalents.

Claims

1. An automated chip testing device, comprising a horizontally arranged workbench (1), a control panel (2) mounted on the upper surface of the workbench (1), and a test pen (3) arranged above the workbench (1); characterized in that: The upper surface of the workbench (1) is provided with a transfer assembly (4); a loading assembly (5) is horizontally provided on one side of the transfer assembly (4); a first pushing assembly (6) is provided on the loading assembly (5) for pushing a single chip on the loading assembly (5) onto the transfer assembly (4); a good product output mechanism (7) and a defective product output mechanism (8) are horizontally provided side by side on one side of the loading assembly (5); the good product output mechanism (7) and the defective product output mechanism (8) are respectively arranged on opposite sides of the transfer assembly (4); a first pushing assembly (6) is provided on the loading assembly (5) for pushing a single chip on the loading assembly (5) onto the transfer assembly (4); a good product output mechanism (7) and a defective product output mechanism (8) are horizontally provided on one side of the loading assembly (5); the good product output mechanism (7) and the defective product output mechanism (8) are respectively arranged on opposite sides of the transfer assembly (4); A single chip is pushed to a second pushing assembly (9) on a good product output mechanism (7) or a defective product output mechanism (8); a lifting assembly (10) for carrying a test pen (3) is vertically installed between the second pushing assembly (9) and the loading assembly (5); the test pen (3) is vertically connected to the lifting assembly (10); the control panel (2) is respectively electrically connected to the test pen (3), the transfer assembly (4), the loading assembly (5), the first pushing assembly (6), the good product output mechanism (7), the defective product output mechanism (8), the second pushing assembly (9) and the lifting assembly (10).

2. The automatic chip testing device according to claim 1, characterized in that: The material transfer assembly (4) comprises a rotary cylinder (401) fixed horizontally on the upper surface of the workbench (1); a transfer plate (402) is fixed horizontally at the output end of the rotary cylinder (401); and a plurality of chip accommodating grooves (403) are evenly distributed on the edge of the upper surface of the transfer plate (402).

3. The automatic chip testing device according to claim 2, characterized in that: The loading assembly (5) comprises a pair of first beams (501) fixed horizontally side by side on the upper surface of the workbench (1); a pair of first rollers (502) are rotatably connected side by side between the two first beams (501); one end of the roller shaft of one of the first rollers (502) is coaxially connected to the output end of a motor module (503); the motor module (503) is fixed on a first beam (501); the two first rollers (502) are connected by a first conveyor belt (504); a plurality of dividing strips (505) parallel to the first rollers (502) are fixed side by side along the length direction on the outer surface of the first conveyor belt (504); a chip conveying space is formed between two adjacent dividing strips (505).

4. The automatic chip testing device according to claim 3, characterized in that: The first pusher assembly (6) comprises a first support plate (601) vertically fixed on a first crossbeam (501); the first support plate (601) is arranged on a side of the first crossbeam (501) away from the material transfer assembly (4); a first cylinder (602) is horizontally fixed on the first support plate (601); the extension direction of the output end of the first cylinder (602) is arranged perpendicular to the conveying direction of the first conveyor belt (504); and a first pusher plate (603) is vertically fixed to the output end of the first cylinder (602).

5. An automated chip testing device according to claim 3 or 4, characterized in that: The good product output mechanism (7) comprises a pair of second beams (701) fixed side by side horizontally on the upper surface of the workbench (1); a pair of second rollers (702) are rotatably connected side by side between the two second beams (701); the two second rollers (702) are connected by a second conveyor belt (703); the conveying direction of the second conveyor belt (703) is arranged perpendicular to the conveying direction of the first conveyor belt (504).

6. The automatic chip testing device according to claim 5, characterized in that: The defective product output mechanism (8) comprises a pair of third beams (801) fixed side by side horizontally on the upper surface of the workbench (1); a pair of third rollers (802) are rotatably connected side by side between the two third beams (801); the two third rollers (802) are connected by a third conveyor belt (803); the conveying direction of the third conveyor belt (803) is arranged parallel to the conveying direction of the second conveyor belt (703).

7. The automatic chip testing device according to claim 6, characterized in that: A first bevel gear (11) is fixedly sleeved on one end of the roller shaft of another first roller (502); a second bevel gear (12) is meshed on the first bevel gear (11); the second bevel gear (12) is fixedly sleeved on one end of the roller shaft of a second roller (702); the other end of the roller shaft of the second roller (702) is coaxially connected to one end of the roller shaft of a third roller (802) via a transmission shaft (13).

8. An automated chip testing device according to claim 6 or 7, characterized in that: The upper surface of the transfer plate (402) is coaxially provided with an annular groove (404); the outer edge of the annular groove (404) is evenly provided with a plurality of through grooves (405) connected to the chip accommodating groove (403); the second pusher assembly (9) comprises a pair of second support plates (901) respectively vertically fixed on a second cross beam (701) and a third cross beam (801); the upper edges of the two second support plates (901) are connected via a first mounting plate (902); the first mounting plate (902) A bidirectional cylinder (903) is fixed horizontally on the lower surface; the telescopic directions of the two output ends of the bidirectional cylinder (903) are both arranged perpendicular to the conveying direction of the second conveyor belt (703); push-pull blocks (904) are fixed on the two output ends of the bidirectional cylinder (903); the lower parts of the two push-pull blocks (904) are fixed with second push plates (905) in a "┐"-shaped structure; the vertical sections of the two second push plates (905) are slidably matched in the chip accommodating groove (403) or the annular groove (404) or the through groove (405).

9. The automatic chip testing device according to claim 8, characterized in that: The lifting assembly (10) comprises a second mounting plate (1001) horizontally fixed on the first mounting plate (902); a second cylinder (1002) is vertically fixed on the upper surface of the second mounting plate (1001); the output end of the second cylinder (1002) passes through the second mounting plate (1001) and is horizontally fixed with a lifting plate (1003); the test pen (3) is vertically fixed on the lifting plate (1003).

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