Bottom test module of full-automatic LED light splitting machine
Through the bottom test module of the fully automatic LED spectrometer, the LED is lit by using the contact of the automatic movement and Tokyo weld probe, and observation through the prism, the problems of low accuracy and inability to detect the bottom pins are solved, achieving high efficiency LED electrical and optical performance detection.
Patent Information
- Application Number
- CN202420111515.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-01-17
- Publication Date
- 2025-01-14
- Estimated Expiration
- 2034-01-17
AI Technical Summary
The testing mechanism of traditional LED spectrometers has problems of low accuracy and slow speed, and cannot effectively detect the LED material on the bottom.
A bottom test module of a fully automatic LED spectrometer is designed to automatically move the LED material to make the Tokyo weld probe come into contact with the electrode, and the pin detection is achieved in combination with prism observation.
Automatic detection of LED electrical properties and optical performance is realized, detection accuracy and speed are improved, and LED materials can be effectively detected at the bottom pins.
Smart Images
Figure CN222354040U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to a bottom test module of a spectrometer, in particular to a bottom test module of a full-automatic LED spectrometer, and belongs to the technical field of manufacturing LED spectrometers. Background Art
[0002] LED packages need to be color-separated and spectroscopically processed before leaving the factory. The LEDs are sorted according to different parameters (electrical properties, brightness, color, etc.), and a spectrometer is a device for sorting LEDs. The spectrometer is equipped with a test module, which is used to light up the LED under test. Only the illuminated LED can have its electrical and optical properties tested. In traditional designs, a cylinder structure is used as the power source for the driving test mechanism. The use of a cylinder structure has problems such as low precision and slow speed. As the accuracy of LED spectrometers becomes higher and higher, the existing test structure has become a bottleneck that restricts the performance of LED spectrometers. In addition, the current test mechanism is mainly a mechanism that tests horizontally, and materials with pins at the bottom cannot be tested.
[0003] Therefore, an improved bottom test module of a fully automatic LED spectrometer is proposed to solve the above problems. Utility Model Content
[0004] The purpose of the utility model is to provide a bottom test module of a fully automatic LED spectrometer, which makes the LED material to be tested automatically move downward at the detection port. When one end of a plurality of Tokyo welding probes contacts the electrode of the LED material, the LED material to be tested is illuminated, thereby achieving the effect of detecting the electrical and optical properties of the LED. At the same time, the other two surfaces of the LED material to be tested can be observed through two prisms, thereby achieving the purpose of detecting the LED material with the pins at the bottom.
[0005] In order to achieve the above-mentioned purpose, the main technical solutions adopted by the utility model include:
[0006] A bottom test module of a fully automatic LED spectrometer comprises a bottom measuring probe guide main seat, one side of the bottom measuring probe guide main seat is fixedly connected with a test main adjustment plate, the side of the test main adjustment plate close to the bottom measuring probe guide main seat is fixedly connected with a probe guide fixing block B, one end of the test main adjustment plate away from the probe guide fixing block B is fixedly connected with a probe guide fixing block, a four-core probe fixing plate is fixedly installed on the test main adjustment plate, a plurality of Tokyo welding probes are connected inside the four-core probe fixing plate, prisms are clamped in the grooves on the left and right sides of the probe guide fixing block, and a detection port is provided above the prism.
[0007] Preferably, a guide seat is fixedly mounted on the four-core probe fixing plate, and the guide seat and the Tokyo welding probe are in conflict with each other.
[0008] Preferably, a prism fixing block is fixedly mounted on one side of the probe guiding fixing block close to the prism, and one side of the prism fixing block and one side of the prism are in conflict with each other.
[0009] Preferably, a ceramic insert is fixedly connected to the probe guide fixing block, and the ceramic insert is fixedly connected to one end of the plurality of Tokyo welding probes.
[0010] Preferably, a mirror is fixedly connected to a side of the ceramic insert close to the prism, and a ceramic insert pressing block is fixedly connected to an upper surface of the ceramic insert.
[0011] Preferably, an elongated hole is provided on one side of the bottom measuring probe guide main seat, and the test main adjustment plate is slidably connected to the elongated hole.
[0012] The utility model has at least the following beneficial effects:
[0013] 1. After the LED material to be tested automatically moves downward at the detection port, when one end of the multiple Tokyo welding probes contacts the electrode of the LED material, the LED material to be tested is lit, thereby achieving the effect of detecting the electrical and optical properties of the LED. At the same time, the other two surfaces of the LED material to be tested can be observed through two prisms, achieving the effect of detecting the LED material with the pins at the bottom. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:
[0015] Figure 1 A three-dimensional schematic diagram provided for the utility model;
[0016] Figure 2 This is a schematic diagram of the exploded structure provided by the utility model.
[0017] In the figure, 1. bottom measuring probe guide main seat; 2. test main adjustment plate; 3. probe guide fixing block B; 4. probe guide fixing block; 5. four-core probe fixing plate; 6. Tokyo welding probe; 7. prism; 8. detection port; 9. guide seat; 10. prism fixing block; 11. ceramic insert; 12. mirror; 13. elongated hole; 14. ceramic insert pressing block. DETAILED DESCRIPTION
[0018] The following will describe the implementation methods of the present application in detail with the help of accompanying drawings and examples, so that the implementation process of how the present application uses technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.
[0019] like Figure 1-Figure 2 As shown, the present embodiment provides a bottom test module of a fully automatic LED spectrometer, including a bottom measuring probe guide main seat 1, one side of the bottom measuring probe guide main seat 1 is fixedly connected with a test main adjustment plate 2, the test main adjustment plate 2 is supported by the bottom measuring probe guide main seat 1, an elongated hole 13 is provided on one side of the bottom measuring probe guide main seat 1, the test main adjustment plate 2 is slidably connected to the elongated hole 13, and the upper and lower positions of the test main adjustment plate 2 can be fine-tuned through the elongated hole 13.
[0020] Further, such as Figure 1-Figure 2 As shown, a probe guide fixing block B3 is fixedly connected to one side of the test main adjustment plate 2 close to the bottom measuring probe guide main seat 1, and a probe guide fixing block 4 is fixedly connected to one side of the end of the test main adjustment plate 2 away from the probe guide fixing block B3. A four-core probe fixing plate 5 is fixedly installed on the test main adjustment plate 2, and a plurality of Tokyo welding probes 6 are connected inside the four-core probe fixing plate 5. The material of the Tokyo welding probe 6 is realized by a tungsten steel probe. There are four Tokyo welding probes 6. The Tokyo welding probes 6 correspond one by one to the holes on the four-core probe fixing plate 5. When the upper ends of the four Tokyo welding probes 6 contact the electrodes of the LED material, the LED material under test is lit, thereby achieving the purpose of detecting the electrical and optical properties of the LED.
[0021] Furthermore, if Figure 1-Figure 2 As shown, the grooves on the left and right sides of the probe guide fixing block 4 are both clamped with prisms 7, and the other two surfaces of the LED material can be reflected by the prism 7. A detection port 8 is provided above the prism 7. The LED material moves downward. When one end of the LED material moves to the detection port 8, so that one end of the LED material and one end of the Tokyo welding probe 6 contact the electrode of the LED material, detection can be achieved.
[0022] Among them, Figure 1-Figure 2 As shown, a guide seat 9 is fixedly installed on the four-core probe fixing plate 5, and the guide seat 9 and the Tokyo welding probe 6 are in conflict with each other. The guide seat 9 prevents the Tokyo welding probe 6 from rotating and will not affect the test parameters.
[0023] Among them, Figure 1-Figure 2 As shown, a prism fixing block 10 is fixedly installed on one side of the probe guide fixing block 4 close to the prism 7. There are two prisms 7 in the future. One side of the prism fixing block 10 is in conflict with one side of the prism 7. The prism 7 is fixed by the prism fixing block 10.
[0024] Further, such as Figure 1-Figure 2 As shown, a ceramic insert 11 is fixedly connected to the probe guide fixing block 4, and the ceramic insert 11 is fixedly connected to one end of multiple Tokyo welding probes 6, so that one end of the multiple Tokyo welding probes 6 can accurately light up the LED material.
[0025] Among them, Figure 1-Figure 2 As shown, a mirror 12 is fixedly connected to one side close to the prism 7 , and the mirror 12 can reflect the inner surface of the LED material. A ceramic insert pressing block 14 is fixedly connected to the upper surface of the ceramic insert 11 , and the ceramic insert pressing block 14 is used to fix the ceramic insert 11 .
[0026] like Figure 1-Figure 2 As shown, the principle of the bottom test module of the fully automatic LED spectrometer provided in this embodiment is as follows: by making the LED material to be tested automatically move downward at the detection port 8, one end of a plurality of Tokyo welding probes 6 is brought into contact with the electrode of the LED material, and at the same time, the other three surfaces of the LED material to be tested can be observed through two prisms 7 and lenses, thereby realizing the detection of the LED material with the pins at the bottom.
[0027] For example, certain words are used in the specification and claims to refer to specific components. Those skilled in the art should understand that hardware manufacturers may use different terms to refer to the same component. This specification and claims do not use differences in names as a way to distinguish components, but use differences in the functions of components as the criteria for distinction. For example, "including" mentioned throughout the specification and claims is an open term, so it should be interpreted as "including but not limited to". "Approximately" means that within an acceptable error range, those skilled in the art can solve technical problems within a certain error range and basically achieve technical effects.
[0028] It should be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a product or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such product or system. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the product or system including the elements.
[0029] The above description shows and describes several preferred embodiments of the utility model, but as mentioned above, it should be understood that the utility model is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the utility model concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art do not deviate from the spirit and scope of the utility model, and should be within the scope of protection of the claims attached to the utility model.
Claims
1. A bottom test module of a fully automatic LED spectrometer, comprising a bottom test probe guide main seat (1), characterized in that: A test main adjustment plate (2) is fixedly connected to one side of the bottom measuring probe guide main seat (1); a probe guide fixing block B (3) is fixedly connected to the side of the test main adjustment plate (2) close to the bottom measuring probe guide main seat (1); a probe guide fixing block (4) is fixedly connected to one side of the end of the test main adjustment plate (2) away from the probe guide fixing block B (3); a four-core probe fixing plate (5) is fixedly installed on the test main adjustment plate (2); a plurality of Tokyo welding probes (6) are connected to the inside of the four-core probe fixing plate (5); prisms (7) are clamped in the grooves on the left and right sides of the probe guide fixing block (4); a detection port (8) is provided above the prism (7).
2. The bottom test module of the fully automatic LED spectrometer according to claim 1, characterized in that: A guide seat (9) is fixedly mounted on the four-core probe fixing plate (5), and the guide seat (9) and the Tokyo welding probe (6) are in conflict with each other.
3. The bottom test module of the fully automatic LED spectrometer according to claim 1, characterized in that: A prism fixing block (10) is fixedly mounted on one side of the probe guiding fixing block (4) close to the prism (7), and one side of the prism fixing block (10) is in contact with one side of the prism (7).
4. The bottom test module of the fully automatic LED spectrometer according to claim 1, characterized in that: A ceramic insert (11) is fixedly connected to the probe guide fixing block (4), and the ceramic insert (11) is fixedly connected to one end of a plurality of Tokyo welding probes (6).
5. The bottom test module of the fully automatic LED spectrometer according to claim 4, characterized in that: A mirror (12) is fixedly connected to a side of the ceramic insert (11) close to the prism (7), and a ceramic insert pressing block (14) is fixedly connected to the upper surface of the ceramic insert (11).
6. The bottom test module of the fully automatic LED spectrometer according to claim 1, characterized in that: An elongated hole (13) is provided on one side of the bottom measuring probe guide main seat (1), and the test main adjustment plate (2) is slidably connected to the elongated hole (13).