Test cabinet
By designing a test cabinet that contains multiple placement cabinets and switches, the problem of frequent replacement of memory chip test equipment of different specifications is solved, efficient testing of multiple interface products is achieved, and testing efficiency is improved.
Patent Information
- Application Number
- CN202420874484.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-25
- Publication Date
- 2025-01-14
- Estimated Expiration
- 2034-04-25
AI Technical Summary
Due to different specifications of memory chips, existing memory chips require frequent replacement of test cabinets, resulting in inefficient testing.
Design a test cabinet, including a first placement cabinet and a second placement cabinet, to implement testing of multiple interfaces through equipment placement components and switches to improve testing efficiency.
It achieves efficient testing of different types of memory chips, reduces testing time and cost, and improves testing efficiency.
Smart Images
Figure CN222354740U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of storage devices, and in particular to a test cabinet. Background Art
[0002] With the development of the domestic storage industry and the increase in the use of storage chips, customers have higher and higher requirements for the stability of storage chips. This requires domestic storage chip manufacturers to strictly control the quality of storage chips during the laboratory verification stage before production or during the mass production stage in the production workshop. In order to ensure that the products meet the test standards and intercept abnormal products before leaving the factory, it is often necessary to perform a large number of test items on the storage chips in order to screen out qualified storage chips.
[0003] At present, due to the differences in specifications of different memory chips, the test equipment used by most domestic memory chip manufacturers has the problem of different specifications. When different types of products need to be tested, multiple test cabinets are required to test them separately, which leads to the need to frequently replace cabinets, which wastes time and costs and reduces test efficiency. Utility Model Content
[0004] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application proposes a test cabinet that can test different types of products with high test efficiency.
[0005] According to the first aspect of the present application, the test cabinet includes a first placement cabinet, in which a device placement component is installed, and the first placement cabinet has a front opening and a back opening;
[0006] A second placement cabinet, the second placement cabinet is located below the first placement cabinet, and the second placement cabinet is used to place power supplies and products;
[0007] A test integrated device, the test integrated device is detachably fixed in the first placement cabinet through the device placement component, and the test integrated device includes a mainboard, a mainboard integrated jig, and a plurality of interface test boards;
[0008] A switch, the switch is placed in the first placement cabinet, the switch is connected to a plurality of the test integrated devices, and is used for switching different test integrated devices.
[0009] The test cabinet according to the embodiment of the present application has at least the following beneficial effects: by setting up a first placement cabinet and a second placement cabinet, the present application can better realize the classification management of the test cabinet, and by setting up test boards with different interfaces and controlling them with a switch, the test cabinet of the present application can test a large number of products with multiple interfaces at the same time, thereby improving the test efficiency.
[0010] According to some embodiments of the present application, the equipment placement assembly includes a support member, which is fixed inside the first placement cabinet along the height direction of the first placement cabinet, and the support member and the first placement cabinet jointly define a first equipment placement area and a second equipment placement area.
[0011] According to some embodiments of the present application, the equipment placement assembly also includes a first fixing member and a second fixing member, a plurality of the first fixing members are detachably fixed to the support member, a plurality of the second fixing members are detachably fixed to the inner wall of the first placement cabinet, and each of the first fixing members is arranged in a one-to-one correspondence with the second fixing member.
[0012] According to some embodiments of the present application, two support members are provided, and the two support members respectively define the first placement area and the second placement area with the inner wall of the first placement cabinet, and the two support members jointly define a third equipment placement area, and the switch is fixed in the third equipment placement area.
[0013] According to some embodiments of the present application, a door curtain is further included, which is a pull-down door curtain. A first limiting structure is provided on the front of the first placement cabinet, and the door curtain is installed on the first limiting structure. The door curtain can cover the front opening of the first placement cabinet.
[0014] According to some embodiments of the present application, a leather-covered cabinet door is further included, a second limiting structure is provided on the back of the first placement frame, the leather-covered cabinet door is installed on the second limiting structure, and the leather-covered cabinet door can cover the back opening of the first placement cabinet.
[0015] According to some embodiments of the present application, the second placement cabinet includes a power supply placement cabinet and a product placement cabinet, the opening direction of the product placement cabinet is toward the front direction of the first placement cabinet, and the opening direction of the power supply placement cabinet is opposite to the opening direction of the product placement cabinet.
[0016] According to some embodiments of the present application, a heat dissipation device is also included, and a heat dissipation hole is opened on the leather cabinet door, and the heat dissipation device is installed on the heat dissipation hole.
[0017] According to some embodiments of the present application, an emergency switch is also included, which is fixed to the outer surface of the first placement cabinet and is used to connect to the main power control.
[0018] According to some embodiments of the present application, a display is further included, wherein the display is fixed to the outer surface of the first placement cabinet, and the display is electrically connected to the switch.
[0019] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] The present application is further described below with reference to the accompanying drawings and embodiments, wherein:
[0021] Figure 1 This is a front view of the test cabinet of the embodiment of the present application;
[0022] Figure 2 This is a rear view of the test cabinet of the embodiment of the present application;
[0023] Figure 3 An overall structural diagram of a test cabinet according to an embodiment of the present application;
[0024] Figure 4 Another overall structural diagram of the test cabinet according to an embodiment of the present application.
[0025] Reference numerals:
[0026] Test cabinet 100, test integrated equipment 200, emergency switch 300, display 400, door curtain 500, leather cabinet door 600, heat dissipation device 700, casters 800,
[0027] The first storage cabinet 110, the second storage cabinet 120,
[0028] Support member 111, first fixing member 112, second fixing member 113,
[0029] A power supply cabinet 121 and a product cabinet 122 are provided. DETAILED DESCRIPTION
[0030] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.
[0031] In the description of the present application, it should be understood that descriptions involving orientation, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0032] In the description of this application, "several" means more than one, "more" means more than two, "greater than", "less than", "exceed", etc. are understood to exclude the number itself, and "above", "below", "within", etc. are understood to include the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.
[0033] In the description of this application, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in this application based on the specific content of the technical solution.
[0034] In the description of the present application, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0035] Combination Figure 1 As shown, a main view of an embodiment of the present application is shown. The present application provides a test cabinet 100, the cabinet body mainly includes a first placement cabinet 110 and a second placement cabinet 120, the second placement cabinet 120 is located below the first placement cabinet 110, generally speaking, the first placement cabinet 110 and the second placement cabinet 120 are integrated, the first placement cabinet 110 is used to place equipment and tools for testing, and the second placement cabinet 120 is used to place power supplies and products. The test cabinet 100 is divided into the first placement cabinet 110 and the second placement cabinet 120, and the first placement cabinet 110 and the second placement cabinet 120 are placed in a classified manner, so that the space of the test cabinet 100 can be reasonably planned.
[0036] In some embodiments, the first placement cabinet 110 has a front opening and a back opening, and the first placement cabinet 110 further has opposite left inner walls and right inner walls, and opposite upper inner walls and lower inner walls.
[0037] In some embodiments, in combination Figure 3As shown, a device placement component is installed in the first placement cabinet 110, and the test cabinet 100 also includes a test integrated device 200. The test integrated device 200 is detachably fixed in the first placement cabinet 110 through the device placement component. Usually, multiple test integrated devices 200 are installed at the same time to test multiple products at the same time. The detachable installation method is used to facilitate the installation or removal of any test integrated device 200 at any time.
[0038] In some embodiments, in combination Figure 1 and Figure 3 As shown, the device placement assembly includes a support member 111, and the support member 111 is fixed inside the first placement cabinet 110 along the height direction of the first placement cabinet 110. Specifically, one end of the support member 111 is fixed to the upper inner wall of the first placement cabinet 110, and the other end of the support member 111 is fixed to the lower inner wall of the first placement cabinet 110. The support member 111 and the first placement cabinet 110 together define a first placement area and a second placement area. Specifically, the support member 111 and the left inner wall of the first placement cabinet 110 define the first placement area, and the support member 111 and the right inner wall of the first placement cabinet 110 together define the second placement area. Both the first placement area and the second placement area are used to place the test integrated device 200.
[0039] In some embodiments, the equipment placement component also includes a first fixing member 112 and a second fixing member 113, both of which are L-shaped aluminum blocks, and multiple first fixing members 112 are detachably fixed to the support member 111, and multiple second fixing members 113 are detachably fixed to the inner wall of the first placement cabinet 110, each first fixing member 112 and the second fixing member 113 are arranged one-to-one, the number of first fixing members 112 and second fixing members 113 is the same, and each first fixing member 112 corresponds one-to-one to each second fixing member 113, and the left and right ends of the test integrated device 200 are respectively placed on the first fixing member 112 and the second fixing member 113, and the test integrated device 200 is moved from one end of the equipment placement component to the other end by pushing and pulling, so that the test integrated device 200 is completely placed on the first fixing member 112 and the second fixing member 113, so that the test integrated device 200 can be firmly placed in the first equipment placement area or the second equipment placement area.
[0040] In some embodiments, two support members 111 are provided, and the two support members 111 respectively define a first placement area and a second placement area with the inner wall of the first placement cabinet 110 , and the two support members 111 together define a third equipment placement area.
[0041] Specifically, the support member 111 is an elongated aluminum block, one support member 111 and the left inner wall of the first placement cabinet 110 define a first placement area, the other support member 111 and the right inner wall of the first placement cabinet 110 define a second placement area, both support members 111 are equipped with a first fixing member 112, and both the left inner wall and the right inner wall of the first placement cabinet 110 are equipped with a second fixing member 113, wherein the first fixing member 112 on one support member 111 corresponds to the second fixing member 113 on the left inner wall, and the first fixing member 112 on the other support member 111 corresponds to the second fixing member 113 on the right inner wall, so that the test integrated device 200 can be installed in both the first placement area and the second placement area.
[0042] A plurality of positioning holes are provided on the left inner wall, the right inner wall and the support member 111 of the first placement cabinet 110. Both ends of the first fixing member 112 and the second fixing member 113 can be fixed to the positioning holes using screws. This connection method can adjust the placement capacity and placement position of the test integrated device 200 in the first placement cabinet 110, thereby increasing the flexibility of equipment placement.
[0043] In some embodiments, the first fixture 112 and the second fixture 113 are both L-shaped aluminum blocks, each of which is provided with holes arranged in an array, and is compatible with test integrated devices 200 of different specifications. In the present application, the aluminum block is used as a grounding conductor, and the test integrated device 200 is in contact with the first fixture 112 and the second fixture 113, so that the test integrated device 200, the aluminum block and the ground can form a complete electrical circuit, thereby ensuring the safety of the device.
[0044] In some embodiments, the test integrated device 200 includes a mainboard, a mainboard integrated jig and multiple interface test boards. The mainboard, the mainboard integrated jig and multiple interface test boards are interconnected. The interface test boards include at least NVME and SATA interface test boards. The test integrated device 200 can test both NVME protocol products and SATA protocol products. Compared with the prior art that only products of the same interface type can be tested on the same cabinet, the test integrated device 200 of the present application can test various interface type products at the same time; the mainboard integrated jig and the interface test board can be installed and disassembled separately to facilitate equipment maintenance; a mainboard power button is installed on the mainboard integrated jig to facilitate control of the mainboard's power on and off status.
[0045] In the embodiment of the present application, the first placement cabinet 110 can accommodate 14 test integrated devices 200, and can connect 140 products for testing at the same time. Each interface test board can connect 10 products for testing. It can test more products at the same time and save testing space.
[0046] In some embodiments, the test cabinet 100 also includes a switch, which is placed in the first placement cabinet 110. Specifically, a plurality of positioning holes are provided on the surface of the support member 111 facing the third placement area. The switch can be fixed in the third device placement area. The switch is a KVM video switch, which is connected to a plurality of test integrated devices 200 and is used to switch between different test integrated devices 200.
[0047] In some embodiments, in combination Figure 1 and Figure 3 As shown, the test cabinet 100 also includes a door curtain 500, which is a pull-down door curtain 500 and can be pulled from the top to the bottom of the first placement cabinet 110. A first limiting structure is provided on the front of the first placement cabinet 110, and the door curtain 500 is installed on the first limiting structure. The door curtain 500 can cover the front opening of the first placement cabinet 110. The first limiting structure is provided as a limiting frame on the front of the first placement cabinet 110, and the door curtain 500 is installed on the limiting frame.
[0048] In some current test cabinets 100, most of the front and back door opening methods of the test cabinets 100 in laboratories and production lines are flat doors. Once multiple test cabinets 100 are placed against a wall or back to back, a large space is required when the door is opened. The present application uses a pull-down door curtain 500. Compared with a flat door, the door curtain 500 does not occupy space when it is opened, which can save a lot of space and play a dust-proof role. When the test cabinet 100 is not in use, it can be pulled down to isolate dust, thereby preventing the test integrated equipment 200 from generating dust, thereby shortening the life of the equipment.
[0049] In some embodiments, Figure 2 As shown, the test cabinet 100 further includes a leather cabinet door 600, and a second limiting structure is provided on the back of the first placement cabinet 110. The leather cabinet door 600 is installed on the second limiting structure, and the leather cabinet door 600 can cover the back opening of the first placement cabinet 110. Specifically, the second limiting structure is provided as a limiting frame on the back of the first placement cabinet 110, and the leather cabinet door 600 is matched with the limiting frame through a magnetic attraction device, and the magnetic attraction device generally adopts a magnet. Because the leather cabinet door 600 and the test integrated device 200 are not of an integrated design, the leather cabinet door 600 and the test integrated device 200 can be taken out separately.
[0050] In some embodiments, heat dissipation holes are opened on the leather cabinet door 600, and the test cabinet 100 also includes a heat dissipation device 700, which is installed on the heat dissipation holes. The heat dissipation device 700 usually uses a heat dissipation fan. Multiple heat dissipation fans are installed on the leather cabinet door 600 to cool down the equipment and parts in the test integrated device 200, which can delay the aging of the equipment and ensure the stability of the test integrated device 200 during long-term operation.
[0051] In some embodiments, Figure 3 and Figure 4 As shown, the second placement cabinet 120 includes a power placement cabinet 121 and a product placement cabinet 122. The opening direction of the product placement cabinet 122 faces the front direction of the first placement cabinet 110, and the opening direction of the power placement cabinet 121 is opposite to the opening direction of the product placement cabinet 122. The product placement cabinet 122 is used to place memory chip test samples, and the power placement cabinet 121 is used to place all power controllers to power the devices in the entire test cabinet 100. The power controller is generally provided with a power master control, and the power wire of the test integrated device 200 is connected from the wire group in the power placement cabinet 121.
[0052] In some embodiments, the cabinet door of the power cabinet 121 is a leather-covered cabinet door 600 , and its configuration is consistent with the leather-covered cabinet door 600 on the back of the first cabinet 110 .
[0053] In some embodiments, the product placement cabinet 122 can be divided into multiple storage compartments, and different storage compartments can be used to place qualified products or unqualified products, which is convenient for classifying and collecting various good and defective products of the products during the test process, and is convenient for R&D personnel to directly analyze the corresponding defective products, reducing the time for R&D personnel to classify defective products, and at the same time can reduce the risk of mixing. The test cabinet 100 of the present application is composed of a first placement cabinet 110, a power supply placement cabinet 121 and a product placement cabinet 122, which are combined into two rectangular parallelepiped cabinets, and the cabinets are stacked up and down, which improves the R&D efficiency and realizes the classification management of samples.
[0054] In some embodiments, the test cabinet 100 also includes an emergency switch 300, which is fixed to the outer surface of the first placement cabinet 110. The emergency switch 300 is used to connect to the main power control and can cut off the power to each device in the test cabinet 100 when a leakage or fire occurs, thereby effectively reducing losses.
[0055] In some embodiments, the test cabinet 100 also includes a display 400, which is fixed to the outer surface of the first placement cabinet 110. The display 400 is electrically connected to the switch, and the switch is electrically connected to multiple test integrated devices 200. In addition, it also includes a keyboard, which is connected to the test integrated device 200. Each test integrated device 200 can be controlled by the keyboard, and the status of each test integrated device 200 can be displayed on the display 400 through the switch, for example, whether the test program of the test integrated device 200 has passed.
[0056] In some embodiments, casters 800 are installed at the bottom of the test cabinet 100 to facilitate the movement of the test cabinet 100 .
[0057] The application can better realize the classification management of the test cabinets by setting up the first placement cabinet and the second placement cabinet, and by setting up test boards with different interfaces and controlling them with the switch, the test cabinet of the present application can test a large number of products with multiple interfaces at the same time, thereby improving the test efficiency.
[0058] The embodiments of the present application are described in detail above in conjunction with the accompanying drawings, but the present application is not limited to the above embodiments. Various changes can be made within the knowledge of ordinary technicians in the relevant technical field without departing from the purpose of the present application. In addition, the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.
Claims
1. A test cabinet, characterized in that: include: A first placement cabinet, wherein a device placement component is installed in the first placement cabinet, and the first placement cabinet has a front opening and a back opening; A second placement cabinet, the second placement cabinet is located below the first placement cabinet, and the second placement cabinet is used to place power supplies and products; A test integrated device, the test integrated device is detachably fixed in the first placement cabinet through the device placement component, and the test integrated device includes a mainboard, a mainboard integrated jig, and a plurality of interface test boards; A switch, the switch is placed in the first placement cabinet, the switch is connected to a plurality of the test integrated devices, and is used for switching different test integrated devices.
2. The test cabinet according to claim 1, characterized in that: The equipment placement assembly includes a support member, which is fixed inside the first placement cabinet along the height direction of the first placement cabinet. The support member and the first placement cabinet together define a first equipment placement area and a second equipment placement area.
3. The test cabinet according to claim 2, characterized in that: The equipment placement assembly also includes a first fixing member and a second fixing member, a plurality of the first fixing members are detachably fixed to the support member, a plurality of the second fixing members are detachably fixed to the inner wall of the first placement cabinet, and each of the first fixing members is arranged in a one-to-one correspondence with the second fixing member.
4. The test cabinet according to claim 2, characterized in that: The two supports are provided with two, and the two supports respectively define the first placement area and the second placement area with the inner wall of the first placement cabinet, and the two supports jointly define a third equipment placement area, and the switch is fixed in the third equipment placement area.
5. The test cabinet according to claim 1, characterized in that: It also includes a door curtain, which is a pull-down door curtain. A first limiting structure is provided on the front of the first storage cabinet. The door curtain is installed on the first limiting structure. The door curtain can cover the front opening of the first storage cabinet.
6. The test cabinet according to claim 1, characterized in that: It also includes a leather-covered cabinet door. A second limiting structure is provided on the back of the first storage cabinet. The leather-covered cabinet door is installed on the second limiting structure. The leather-covered cabinet door can cover the back opening of the first storage cabinet.
7. The test cabinet according to claim 1, characterized in that: The second placement cabinet includes a power placement cabinet and a product placement cabinet. The opening direction of the product placement cabinet faces the front direction of the first placement cabinet, and the opening direction of the power placement cabinet is opposite to the opening direction of the product placement cabinet.
8. The test cabinet according to claim 6, characterized in that: It also includes a heat dissipation device. The leather cabinet door is provided with heat dissipation holes, and the heat dissipation device is installed on the heat dissipation holes.
9. The test cabinet according to claim 1, characterized in that: It also includes an emergency switch, which is fixed to the outer surface of the first storage cabinet and is used to connect to the main power control.
10. The test cabinet according to any one of claims 1 to 9, characterized in that: It also includes a display, which is fixed to the outer surface of the first placement cabinet and is electrically connected to the switch.