Inductor withstand voltage test fixture

Abstract

The utility model relates to the technical field of component electrical performance testing. The utility model relates to an inductor withstand voltage test fixture, which comprises a base, a fixed bracket, a guide rail, a carrier, a test part and a driving device, the carrier is fixed on the base and is used for placing a product to be tested; the guide rail is arranged in the vertical direction; the testing part is mounted on the guide rail through a testing seat, and a probe group is arranged on the testing part; the position of the detection part of the probe group corresponds to a test point on a product on the carrier; and the driving device is fixed on the fixed bracket, is connected with the testing part, and is used for driving the testing part to move along the guide rail. By using the product provided by the utility model, the position of a to-be-tested point contacted by the probe and the magnitude of contact force can be accurately controlled, the test result is accurate, time and labor are saved, the element and the probe detection part can be protected from being damaged by external force, two tests can be carried out by one set of equipment, the equipment does not need to be replaced, and the labor is further saved.

Description

Technical Field

[0001] The utility model relates to the technical field of component electrical performance testing. Background Art

[0002] Withstand voltage test and inductance test are important performance index tests for components. Withstand voltage test, also known as high voltage test, is a test that applies a voltage higher than its rated value to the device and maintains it for a certain period of time to determine whether the insulation material and space distance of the device meet the requirements. Inductance is divided into self-inductance and mutual inductance, which can be obtained by measuring and calculating the ratio of the induced electromotive force (voltage) in the conductor to the rate of change of the current that generates this electromotive force.

[0003] In the relevant technology, inductance test and voltage withstand test need more manual operation. Different instruments are needed for inductance test and voltage withstand test. Workers need to rewire when switching tests, which wastes time. In addition, the consistency of manual operation is poor, which is prone to problems such as missed tests and damage caused by uneven force on components.

[0004] Chinese utility model patent document CN203164218U discloses a power module withstand voltage test fixture, which relates to the field of test fixture technology, including a support base plate for supporting a power supply, and four power module buckles are arranged on the support base plate, and the four power module buckles are arranged in a rectangular shape, and the four power module buckles are grouped in two, and the two power module buckles in each group are connected by a PCB strip to fix the power module buckles. In the above-mentioned related technologies, there are problems such as complex manual operation, poor operation consistency, and inaccurate test results. Summary of the invention

[0005] The utility model aims to solve the problems in the related art that manual operation consumes time, the operation consistency is poor, and the test results are inaccurate.

[0006] In view of the above-mentioned limitations, the utility model proposes an inductor withstand voltage test fixture.

[0007] An inductor withstand voltage test fixture comprises: a base, a fixing bracket, a guide rail, a carrier, a test part, and a driving device;

[0008] The carrier is fixed on the base and is used to place the product to be tested;

[0009] The fixing bracket is arranged in the vertical direction, and the bottom of the fixing bracket is fixed on the base;

[0010] One end of the guide rail is fixed to the fixing bracket, and the other end is fixed to the base, and is arranged in the vertical direction;

[0011] The test section is slidably mounted on the guide rail via a test seat, and a probe group is provided on the test section; the position of the detection part of the probe group corresponds to the test point on the product on the carrier;

[0012] The driving device is fixed on the fixing bracket, the driving device is connected to the testing part, and the driving device is used to drive the testing part to move along the guide rail.

[0013] Further: the fixed bracket includes a back plate and a side bracket;

[0014] There are two side brackets, which are respectively arranged on both sides of the back plate. The side brackets are respectively perpendicular to the base and the back plate; the back plate is fixedly connected to the side brackets.

[0015] Furthermore: the driving device is connected to the fixing bracket via a fixing seat, the fixing bracket is provided with a waist hole with a length direction along the vertical direction; the fixing seat is installed on the waist hole via bolts.

[0016] Further: the driving device is a cylinder, a motor or a manual driving device;

[0017] When the driving device is a cylinder or a motor, a control device for controlling the driving device is provided, and the control device is used to control the operation of the driving device and drive the testing part to move along the guide rail.

[0018] Furthermore: the manual drive device is an elbow clamp, and the elbow clamp is arranged in such a way that when the handle of the elbow clamp is rotated from the standby position to a first angle, the test part is driven to move downward along the guide rail and locked, so that the detection part of the probe group contacts the test point on the product; the first angle is 90 degrees to 180 degrees.

[0019] Further: the test section includes a probe cover and a probe group, the probe cover is used to accommodate the probe group and the wires connecting the probes of the probe group; the probe cover is provided with a detachable cover plate;

[0020] The probe group is configured such that the probes of the probe group pass through the test seat and extend downward.

[0021] Further: the probe group includes a first probe group and a second probe group;

[0022] Performing an inductance test by a first probe set;

[0023] The withstand voltage test is performed by the first probe group and the second probe group.

[0024] Furthermore: the probe group is connected to the control device through a wire. When the detection part of the probe group contacts the test point on the product, the control device performs one or more inductance tests and / or withstand voltage tests according to a preset program, and the control device returns the test data.

[0025] Furthermore: the carrier is provided with a fixing groove matching the shape of the product.

[0026] Further: the test seat is mounted on the guide rail via a linear bearing, and a spring is provided between the linear bearing and the base on the guide rail;

[0027] The test seat is provided with a hole, the linear bearing is passed through the hole, the guide rail is passed through the linear bearing, and a ball is provided in the linear bearing.

[0028] Compared with the related art, the utility model has the following advantages: by setting a driving device and a guide rail, it is possible to achieve precise control of the position of the test point of the probe contacting the product and the size of the contact force, the test result is accurate, time and labor are saved, and the components and the probe detection part can be protected from damage by external forces. By setting up a probe group, some probes are used for inductance testing and some probes are used for withstand voltage testing, so that one set of equipment can perform two tests without the need to replace equipment in the middle, which further saves labor. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 A three-dimensional diagram of an inductor withstand voltage test fixture according to an embodiment of the utility model;

[0030] Figure 2 A side view of an inductor withstand voltage test fixture according to an embodiment of the utility model;

[0031] Figure 3 A three-dimensional diagram of an inductor withstand voltage test fixture according to an embodiment of the utility model;

[0032] Figure 4 A structural diagram of a linear bearing of an inductive withstand voltage test fixture according to an embodiment of the utility model;

[0033] Figure 5 FIG. 1 is a structural diagram of a carrier of an inductor withstand voltage test fixture according to an embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the utility model more clear, the utility model is further described in detail below. However, it should be understood that the description here is only used to explain the utility model and is not used to limit the scope of the utility model.

[0035] Unless otherwise defined, all technical terms and scientific terms used herein have the same meanings as those generally understood by technicians in the technical field of the present invention. The terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The characterization means involved in this article can refer to the relevant descriptions in the prior art and will not be repeated in this article.

[0036] In order to further understand the present invention, the present invention will be described in further detail below in conjunction with the best embodiment.

[0037] Example 1

[0038] like Figure 1-5 As shown, an inductor withstand voltage test fixture includes: a base 11, a fixing bracket 12, a guide rail 13, a carrier 21, a test part 30, and a driving device 40;

[0039] The carrier 21 is fixed on the base 11 to place the product 51 to be tested, and the fixing includes but is not limited to bonding, mortise and tenon structure fixing, bolt fixing, etc.;

[0040] The fixing bracket 12 is arranged in the vertical direction, and its bottom is fixed on the base 11, and the fixing includes but is not limited to bonding, mortise and tenon structure fixing, bolt fixing, etc.;

[0041] One end of the guide rail 13 is fixed to the fixing bracket 12, and the other end is fixed to the base 11, and is arranged in the vertical direction; the fixing bracket 12 is provided with an arc-shaped boss extending in the horizontal direction, and the boss is provided with a hole for passing one end of the guide rail 13, and threads can be set at both ends of the guide rail 13, and nuts can be used to fix the guide rail 13 to the above-mentioned hole and the base 11, or it can be fixed by bonding, welding, etc., but is not limited to the above-mentioned methods.

[0042] The test section 30 is slidably mounted on the guide rail 13 via a test seat 33 , and a probe group 32 is disposed on the test section 30 ; the position of the detection part of the probe group 32 corresponds to the test point on the product 51 on the carrier 21 ;

[0043] The driving device 40 is fixed on the fixing bracket 12, and is connected to the testing unit 30, and is used to drive the testing unit 30 to move along the guide rail 13. The movement includes but is not limited to moving upwards, moving downwards, and hovering at any desired position along the guide rail 13.

[0044] Preferably, there are 1-4 guide rails 13. When there is one guide rail 13, it can be set in the middle position (on the center line of the test part 30). When there are two guide rails 13, they can be symmetrically arranged on both sides of the center line of the test part 30. When there are more than three guide rails 13, they can be arranged along a straight line. Since too many guide rails 13 will increase the cost, it is more preferably set to 1-2. However, the setting of the guide rails 13 is not limited to the above examples.

[0045] Example 2

[0046] like Figure 1-5 As shown, on the basis of embodiment 1, further: the fixing bracket 12 includes a back plate 121 and a side bracket 122;

[0047] There are two side brackets 122 , which are respectively disposed on both sides of the back plate 121 . The side brackets 122 are respectively perpendicular to the base 11 and the back plate 121 ; the back plate 121 is fixedly connected to the side brackets 122 .

[0048] Preferably, the fixed connection method can be bonding, mortise and tenon joints, clamping, bolt fixing, etc.

[0049] Furthermore, the driving device 40 is connected to the fixing bracket 12 via a fixing seat 41, and a waist hole is provided on the fixing bracket 12 with a length direction along the vertical direction; the fixing seat 41 is installed on the waist hole via bolts. The bolts can move up and down in the waist hole, thereby adjusting the height of the fixing seat 41.

[0050] Preferably, the waist hole is opened on the back plate 121.

[0051] Further: the driving device 40 is a cylinder, a motor or a manual driving device;

[0052] When the driving device 40 is a cylinder or a motor, a control device for controlling the driving device 40 is provided, and the control device is used to control the operation of the driving device 40 , thereby driving the testing part 30 to move along the guide rail 13 .

[0053] Preferably, the control device may be a wired controller, a wireless controller, a control chip, etc.

[0054] Preferably, when the driving device 40 is a cylinder or a motor, a transmission structure is provided to connect the driving device 40 and the testing unit 30. The transmission structure may be a conventional structure such as a gear or a belt, which will not be described in detail here.

[0055] Furthermore: the manual drive device is an elbow clamp, and the elbow clamp is arranged in such a way that when the handle 411 of the elbow clamp is rotated from the standby position to a first angle, the test part 30 is driven to move downward along the guide rail 13 and locked, so that the detection part of the probe group 32 contacts the test point on the product 51; the first angle is 90 degrees to 180 degrees, including but not limited to 90 degrees, 120 degrees, 150 degrees, and 180 degrees.

[0056] When the handle 411 of the toggle clamp is turned back to the standby position, the testing part 30 is lifted up and returned to the initial position.

[0057] Preferably, the standby position is set horizontally forward (toward the test part) or horizontally backward (away from the test part), or vertically upward. The standby position can be set as needed and is not limited to the above manner.

[0058] The manual drive device may also be a hand-cranked push rod, etc., but the elbow clamp can accurately control the stroke of the test part 30, the size of the contact force between the probe and the point to be tested, and is simple and convenient to use, and is the most preferred manual drive device.

[0059] Further: the test section 30 includes a probe cover 31 and a probe group 32, the probe cover 31 is used to accommodate the probe group 32 and the wires connecting the probes of the probe group 32; the probe cover 31 is provided with a detachable cover plate;

[0060] Preferably, the cover plate can be arranged on the upper part and the side of the probe cover 31, and can be provided with a detachable manner such as a snap, mortise and tenon, screw fixation, etc. The setting of the cover plate is to facilitate the later maintenance and replacement of the probe.

[0061] Preferably, the probe is composed of two parts, namely a probe sleeve 324 and a probe head 323. A small raised step is also provided on the probe sleeve 324, which serves as a limiter to limit the length of the probe sleeve 324 protruding from the mounting surface. At the same time, the probe sleeve 324 and the hole on the plate on which the probe is mounted are interference fit, thereby ensuring that the probe sleeve 324 and the probe are firmly fixed.

[0062] The probe head 323 and the probe sleeve 324 are also installed by a snap-fit ​​structure, which facilitates the replacement of the probe head 323 and ensures that the replaced probe head 323 is firmly installed.

[0063] The probe group 32 is configured such that the probes of the probe group 32 pass through the test seat 33 and extend downward.

[0064] Preferably, a pad 332 fixed to the bottom of the test seat 33 is provided to accommodate the probe, so as to adjust the extension length of the probe to adapt to the positions of the test points at different heights on the product.

[0065] Further: the probe group 32 includes a first probe group 321 and a second probe group 322;

[0066] The first probe group 321 performs an inductance test;

[0067] The withstand voltage test is performed by the first probe group 321 and the second probe group 322 .

[0068] Preferably, the first probe group 321 includes 2 probes; the second probe group 322 includes 3 probes.

[0069] Preferably, the grouping and positions of the probes may be set according to the test point height and test point distribution of a specific product, and are not limited to the above settings.

[0070] Furthermore: the probe group 32 is connected to the control device through a wire. When the detection part of the probe group 32 contacts the test point on the product, the control device performs one or more inductance tests and / or one or more withstand voltage tests according to a preset program, and the control device returns the test data.

[0071] Preferably, a test NG number threshold is preset, and when the threshold is exceeded, the control device system software determines that the product is unqualified and returns the NG number and test data.

[0072] Preferably, when the driving device 40 is a motor, the control device can realize the automatic operation of the entire test process by connecting to the control device (controller) of the motor.

[0073] Furthermore, the carrier 21 is provided with a fixing groove 211 matching the shape of the product 51, such as Figure 5 shown.

[0074] Preferably, the carrier 21 is fixed to the base 11 by bolts, and when in use, the carrier 21 with different fixing grooves 211 can be installed as needed to adapt to different products.

[0075] Further: the test seat 33 is installed on the guide rail 13 through a linear bearing 331, and a spring is provided between the linear bearing 331 and the base 11 on the guide rail 13;

[0076] Preferably, the test seat 33 can also be provided with a slider or the like instead of a linear bearing to achieve sliding along the guide rail 13;

[0077] Preferably, the spring material is selected from carbon steel, low manganese spring steel, silicon manganese spring steel, chrome vanadium steel, etc., but is not limited to the above materials;

[0078] Preferably, one end of the spring is fixed to the bottom of the linear bearing 331, and the other end is fixed to the base 11. The spring height-to-diameter ratio (mid-diameter) is less than or equal to 5.3. If the height-to-diameter ratio is too large, it is easy to become unstable after compression.

[0079] The test seat 33 is provided with a hole, and the linear bearing 331 is inserted into the hole. The linear bearing 331 is provided with a screw hole and is fixed to the test seat 33 by bolts. The guide rail 13 is inserted into the linear bearing 331, and a ball is provided in the linear bearing 331, so that the movement of the bearing 331 on the guide rail 13 is smoother.

[0080] The linear bearing 331 is used to provide stable linear motion within a limited stroke, with small friction and high precision. The four holes are its mounting holes, which are fixed to the test seat 33 by bolts. The structure of the linear bearing is as follows: Figure 4 shown.

[0081] In the embodiments of the present invention, the inductor voltage withstand test fixture of the present invention can be used for inductance testing and voltage withstand testing. It can be understood that the inductor voltage withstand test fixture is not limited to the above applications, for example, it can also be used in other electrical performance tests.

[0082] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modification, equivalent substitution or improvement made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An inductor withstand voltage test fixture, characterized in that: include: A base (11), a fixing bracket (12), a guide rail (13), a carrier (21), a testing unit (30), and a driving device (40); The carrier (21) is fixed on the base (11) and is used to place the product (51) to be tested; The fixing bracket (12) is arranged in a vertical direction, and its bottom is fixed on the base (11); One end of the guide rail (13) is fixed on the fixed bracket (12), and the other end is fixed on the base (11), and is arranged in a vertical direction; The test section (30) is slidably mounted on the guide rail (13) via a test seat (33); a probe group (32) is provided on the test section (30); the position of the detection section of the probe group (32) corresponds to a test point on the product (51) on the carrier (21); The driving device (40) is fixed on the fixed bracket (12), the driving device (40) is connected to the testing part (30), and the driving device (40) is used to drive the testing part (30) to move along the guide rail (13).

2. The inductor withstand voltage test fixture according to claim 1, characterized in that: The fixed bracket (12) comprises a back plate (121) and a side bracket (122); There are two side brackets (122), which are respectively arranged on both sides of the back plate (121); the side brackets (122) are respectively perpendicular to the base (11) and the back plate (121); and the back plate (121) is fixedly connected to the side brackets (122).

3. The inductor withstand voltage test fixture according to claim 1, characterized in that: The driving device (40) is connected to the fixing bracket (12) via a fixing seat (41); the fixing bracket (12) is provided with a waist hole whose length direction is along the vertical direction; the fixing seat (41) is mounted on the waist hole via bolts.

4. The inductor withstand voltage test fixture according to claim 1, characterized in that: The driving device (40) is a cylinder, a motor or a manual driving device; When the driving device (40) is a cylinder or a motor, a control device for controlling the driving device (40) is provided, and the control device is used to control the operation of the driving device (40), thereby driving the testing part (30) to move along the guide rail (13).

5. The inductor withstand voltage test fixture according to claim 4, characterized in that: The manual drive device is a toggle clamp, and the toggle clamp is arranged in such a manner that when the handle (411) of the toggle clamp is rotated from a standby position to a first angle, the test part (30) is driven to move downward along the guide rail (13) and locked, so that the detection part of the probe group (32) contacts the test point on the product (51); the first angle is 90 degrees to 180 degrees.

6. The inductor withstand voltage test fixture according to claim 1, characterized in that: The testing section (30) comprises a probe cover (31) and a probe group (32). The probe cover (31) is used to accommodate the probe group (32) and the wires connecting the probes of the probe group (32); a detachable cover plate is provided on the probe cover (31); The probe group (32) is configured such that the probes of the probe group (32) pass through the test seat (33) and extend downward.

7. The inductor withstand voltage test fixture according to claim 1, characterized in that: The probe group (32) includes a first probe group (321) and a second probe group (322); Performing an inductance test by a first probe group (321); A withstand voltage test is performed by the first probe group (321) and the second probe group (322).

8. The inductor withstand voltage test fixture according to claim 1, characterized in that: The probe group (32) is connected to the control device via a wire. When the detection part of the probe group (32) contacts the test point on the product, the control device performs one or more sets of inductance tests and / or one or more sets of withstand voltage tests according to a preset program, and the control device returns the test data.

9. The inductor withstand voltage test fixture according to claim 1, characterized in that: The carrier (21) is provided with a fixing groove (211) matching the shape of the product (51).

10. The inductor withstand voltage test fixture according to claim 1, characterized in that: The test seat (33) is mounted on the guide rail (13) via a linear bearing (331), and a spring is provided between the linear bearing (331) and the base (11) on the guide rail (13); The test seat (33) is provided with a hole, the linear bearing (331) is inserted into the hole, the guide rail (13) is inserted into the linear bearing (331), and a ball bearing is arranged in the linear bearing (331).

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