Vehicle-mounted Ethernet cable diagnostic performance testing device and IOP testing device

Abstract

The utility model relates to a vehicle-mounted Ethernet cable diagnostic performance testing device and an IOP testing device. Comprising a control module, a vehicle-mounted Ethernet transceiver, a switching circuit, a cable and a line fault simulation circuit. The switching circuit is used for switching connection relations among the vehicle-mounted Ethernet transceiver, the cable, the line fault simulation circuit and the vehicle-mounted Ethernet interface, wherein the connection relations comprise a non-fault simulation connection relation and a fault simulation connection relation. The line fault simulation circuit is used for simulating the fault type of a link between the vehicle-mounted Ethernet transceiver and the vehicle-mounted Ethernet interface. Various fault simulation connection relations and various fault types can be simulated for a tested piece on the physical level, and therefore operation needed by cable diagnosis performance testing is achieved.

Description

Technical Field

[0001] The present application relates to the technical field of Ethernet testing, and in particular to a vehicle-mounted Ethernet cable diagnostic performance testing device and an IOP testing device. Background Art

[0002] With the development of the automobile industry, automotive electrical systems have become increasingly complex. In order to meet the communication and data transmission requirements of infotainment systems, assisted driving systems, and vehicle networks, the requirements for automotive bus technology are becoming increasingly higher. The automotive bus is developing towards high bandwidth. Therefore, automotive Ethernet technology is gradually emerging.

[0003] In order to verify the reliability of automotive Ethernet, it is necessary to conduct interoperability (IOP) testing on automotive Ethernet. One of the important test indicators is the diagnostic capability of the automotive Ethernet system for the fault conditions of the automotive Ethernet link. Therefore, how to test the diagnostic capability of the automotive Ethernet system for the fault conditions of the link is a problem that needs to be solved at present. Summary of the invention

[0004] Based on this, it is necessary to provide a vehicle Ethernet cable diagnostic performance test device and an IOP test device that can test the vehicle Ethernet system's diagnostic capability for link faults in order to address the above technical issues.

[0005] A test device for the diagnostic performance of an in-vehicle Ethernet cable, comprising: a control module, an in-vehicle Ethernet transceiver, a switch circuit, a cable, and a line fault simulation circuit, wherein the control module is connected to the in-vehicle Ethernet transceiver, and the switch circuit is respectively connected to the in-vehicle Ethernet transceiver, the line fault simulation circuit, two ends of the cable, and an in-vehicle Ethernet interface for connecting a device under test; wherein:

[0006] The switch circuit is used to switch the connection relationship between the vehicle-mounted Ethernet transceiver, the cable, the line fault simulation circuit, and the vehicle-mounted Ethernet interface, wherein the connection relationship includes a non-fault simulation connection relationship and a fault simulation connection relationship, and different fault simulation connection relationships are used to simulate different occurrence locations of the fault; wherein the fault simulation connection relationship includes at least a first connection relationship and a second connection relationship, wherein the first connection relationship is that the vehicle-mounted Ethernet transceiver, the cable, the line fault simulation circuit, and the vehicle-mounted Ethernet interface are connected in series in sequence, and the second connection relationship is that the vehicle-mounted Ethernet transceiver, the line fault simulation circuit, the cable, and the vehicle-mounted Ethernet interface are connected in series in sequence;

[0007] The line fault simulation circuit is used to simulate at least one type of fault of the link between the vehicle-mounted Ethernet transceiver and the device under test, wherein the at least one type of fault includes at least one of the following: a short circuit fault to ground, an open circuit fault to ground, a short circuit fault to the power supply end, and an open circuit fault to the power supply end.

[0008] In one embodiment, the vehicle Ethernet transceiver includes a first positive interface and a first negative interface, the vehicle Ethernet interface includes a second positive interface and a second negative interface, and the cable includes a positive line and a negative line;

[0009] The switching circuit is respectively connected to the positive line, the negative line, the first positive interface, the first negative interface, the second positive interface, and the second negative interface. The switching circuit is used to switch the connection relationship between the positive line, the first positive interface, the second positive interface, and the line fault simulation circuit, and / or switch the connection relationship between the negative line, the first negative interface, the second negative interface, and the line fault simulation circuit.

[0010] In one embodiment, the switch circuit includes a first switch unit and a second switch unit, and the line fault simulation circuit includes a third positive electrode interface, a third negative electrode interface, a fourth positive electrode interface, and a fourth negative electrode interface. The first switch unit is respectively connected to the first positive electrode interface, the first negative electrode interface, the first end of the positive line, the first end of the negative line, the second switch unit, the third positive electrode interface of the line fault simulation circuit, and the third negative electrode interface of the line fault simulation circuit, and the second switch unit is respectively connected to the second positive electrode interface, the second negative electrode interface, the second end of the positive line, the second end of the negative line, the fourth positive electrode interface of the line fault simulation circuit, and the fourth negative electrode interface of the line fault simulation circuit; wherein,

[0011] The first switch unit is used to selectively conduct a path between any two of the first positive electrode interface, the first end of the positive electrode line, the second switch unit, and the third positive electrode interface, and a path between any two of the first negative electrode interface, the first end of the negative electrode line, the second switch unit, and the third negative electrode interface;

[0012] The second switch unit is used to selectively conduct the path between any two of the second positive electrode interface, the second end of the positive electrode line, the first switch unit, and the fourth positive electrode interface, and the path between any two of the second negative electrode interface, the second end of the negative electrode line, the first switch unit, and the fourth negative electrode interface.

[0013] In one embodiment, the first switch unit includes a first switch component and a second switch component, the second switch unit includes a third switch component and a fourth switch component, the first switch component, the second switch component, the third switch component, and the fourth switch component each include four ports, wherein:

[0014] The four ports of the first switch component are respectively connected to the first positive electrode interface, the first end of the positive electrode line, a port of the third switch component, and the third positive electrode interface, and the first switch component is used to conduct a path between any two ports of its four ports;

[0015] The four ports of the second switch component are respectively connected to the first negative electrode interface, the first end of the negative electrode line, a port of the fourth switch component, and the third negative electrode interface, and the second switch component is used to conduct a path between any two of its four ports;

[0016] The four ports of the third switch component are respectively connected to the second positive electrode interface, the second end of the positive electrode line, a port of the first switch component, and the fourth positive electrode interface, and the third switch component is used to conduct the path between any two ports of its four ports;

[0017] The four ports of the fourth switch component are respectively connected to the second negative electrode interface, the second end of the negative electrode line, a port of the second switch component, and the fourth negative electrode interface. The fourth switch component is used to conduct the path between any two of its four ports.

[0018] In one embodiment, a controllable switch is connected between any two of the four ports of each of the first switch component, the second switch component, the third switch component, and the fourth switch component.

[0019] In one embodiment, the line fault simulation circuit includes a third positive electrode interface, a third negative electrode interface, a fourth positive electrode interface, and a fourth negative electrode interface;

[0020] The line fault simulation circuit is used to simulate corresponding faults through the following operations: the third positive electrode interface is short-circuited to the power supply end, the third positive electrode interface is short-circuited to the ground, the third positive electrode interface is open-circuited, the third positive electrode interface and the third negative electrode interface are short-circuited, the fourth positive electrode interface is short-circuited to the power supply end, the fourth positive electrode interface is short-circuited to the ground, the fourth positive electrode interface is open-circuited, the fourth positive electrode interface and the fourth negative electrode interface are short-circuited, the third negative electrode interface is short-circuited to the power supply end, the third negative electrode interface is short-circuited to the ground, the third negative electrode interface is open-circuited, the fourth negative electrode interface is short-circuited to the power supply end, the fourth negative electrode interface is short-circuited to the ground, and the fourth negative electrode interface is open-circuited.

[0021] In one embodiment, the line fault simulation circuit includes a first switch, a second switch, a third switch, a fourth switch, a fifth switch, a sixth switch, and a seventh switch. The first end of the first switch is connected to the third positive electrode interface, the second end of the first switch is connected to the power supply end, the first end of the second switch is connected to the third positive electrode interface, the second end of the second switch is grounded, the first end of the third switch is connected to the third negative electrode interface, the second end of the third switch is connected to the power supply end, the first end of the fourth switch is connected to the third negative electrode interface, the second end of the fourth switch is grounded, the first end of the fifth switch is connected to the third positive electrode interface, the second end of the fifth switch is connected to the third negative electrode interface, the first end of the sixth switch is connected to the first end of the fifth switch, the second end of the sixth switch is connected to the fourth positive electrode interface, the first end of the seventh switch is connected to the second end of the fifth switch, and the second end of the seventh switch is connected to the fourth negative electrode interface.

[0022] In one embodiment, the length of the cable is 15 meters.

[0023] In one of the embodiments, the test device for the diagnostic performance of the vehicle-mounted Ethernet cable also includes a message transceiver chip, which is connected to the control module and the device under test respectively, and is used to transmit the fault type of the link between the vehicle-mounted Ethernet transceiver and the device under test fed back by the device under test to the control module.

[0024] An IOP testing device includes the above-mentioned vehicle-mounted Ethernet cable diagnostic performance testing device.

[0025] The above-mentioned vehicle Ethernet cable diagnostic performance test device and IOP test device. By setting a switch circuit, the connection relationship between the vehicle Ethernet transceiver, the cable, the line fault simulation circuit, and the vehicle Ethernet interface can be switched, thereby realizing the simulation of multiple fault simulation connection relationships, which is convenient for verifying the fault diagnosis performance of the device under test under different fault simulation connection relationships, and the test is more comprehensive and reliable. By setting a line fault simulation circuit, the fault type of the link between the vehicle Ethernet transceiver and the vehicle Ethernet interface can be simulated, thereby simulating various possible fault types for the device under test, so as to verify the fault diagnosis performance of the device under test for various fault types. In summary, by using the test device of the present application, various fault simulation connection relationships and various fault types can be simulated for the device under test at the physical level, and various environments can be simulated for the fault diagnosis performance of the device under test, which is convenient for realizing the operations required for comprehensive fault diagnosis performance testing of the device under test, and the connection relationship can be switched through the switch circuit, and the fault type can be switched through the line fault simulation circuit, which improves the test efficiency and is more convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0027] FIG1 is a schematic diagram of the structure of a testing device for diagnostic performance of an in-vehicle Ethernet cable in one embodiment;

[0028] Figure 2 A schematic diagram of a partial structure of a testing device for diagnostic performance of an in-vehicle Ethernet cable in one embodiment;

[0029] FIG3 is a second partial structural diagram of a testing device for diagnostic performance of an in-vehicle Ethernet cable according to an embodiment;

[0030] FIG4 is a third partial structural diagram of a testing device for diagnostic performance of an in-vehicle Ethernet cable according to an embodiment;

[0031] FIG5 is a fourth partial structural diagram of a testing device for diagnostic performance of an in-vehicle Ethernet cable according to an embodiment;

[0032] FIG. 6 is a second schematic diagram of the structure of a testing device for the diagnostic performance of an in-vehicle Ethernet cable according to an embodiment.

[0033] Description of reference numerals:

[0034] 10-control module, 20-vehicle Ethernet transceiver, 30-switch circuit, 40-cable, 50-line fault simulation circuit, 60-test device, 70-vehicle Ethernet interface, 11-first positive interface, 12-first negative interface, 13-second positive interface, 14-second negative interface, 41-positive line, 42-negative line, 31-first switch unit, 32-second switch unit, 15-third positive interface, 16-third negative interface, 17-fourth positive interface, 18-fourth negative interface, 33-first switch assembly, 34-second switch assembly, 35-third switch assembly, 36-fourth switch assembly, 80-message transceiver chip. DETAILED DESCRIPTION

[0035] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0037] It can be understood that the terms "first", "second", etc. used in the present application can be used in this article to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from another element.

[0038] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element, or connected to the other element through an intermediate element. In addition, the "connection" in the following embodiments should be understood as "electrical connection", "communication connection", etc. if there is transmission of electrical signals or data between the connected objects.

[0039] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof.

[0040] In one embodiment, as shown in FIG1 , a device for testing the diagnostic performance of an in-vehicle Ethernet cable 40 is provided, comprising: a control module 10, an in-vehicle Ethernet transceiver 20, a switch circuit 30, a cable 40, and a line fault simulation circuit 50. The control module 10 is connected to the in-vehicle Ethernet transceiver 20, and the switch circuit 30 is respectively connected to the in-vehicle Ethernet transceiver 20, the line fault simulation circuit 50, both ends of the cable 40, and an in-vehicle Ethernet interface 70 for connecting a device under test 60.

[0041] The switch circuit 30 is used to switch the connection relationship among the vehicle Ethernet transceiver 20 , the cable 40 , the line fault simulation circuit 50 , and the vehicle Ethernet interface 70 .

[0042] Among them, the connection relationship includes a non-fault simulation connection relationship and a fault simulation connection relationship, and different fault simulation connection relationships are used to simulate different locations where the fault occurs. By switching the cable 40, the location where the fault occurs can be switched to be the near end or the far end. The non-fault simulation connection relationship is that the vehicle Ethernet transceiver 20 is directly connected to the vehicle Ethernet interface 70 through the switch circuit 30, so that the control module 10 can directly exchange data with the device under test 60 through the vehicle Ethernet transceiver 20 without passing through the cable 40 and the line fault simulation circuit 50.

[0043] Exemplarily, the cable 40 may be a 15 m long cable, which is used to simulate the physical distance between the near end and the far end. If the cable 40 is connected between the location where the fault occurs and the port (e.g., the vehicle Ethernet interface of the device under test 60 or the port of the vehicle Ethernet transceiver chip), it means that the fault is a far-end fault for the port. If the cable 40 is not connected between the location where the fault occurs and the port (e.g., the vehicle Ethernet interface of the device under test 60 or the port of the vehicle Ethernet transceiver chip), it means that the fault is a near-end fault for the port.

[0044] Among them, the fault simulation connection relationship includes at least a first connection relationship and a second connection relationship. The first connection relationship is that the vehicle Ethernet transceiver 20, the cable 40, the line fault simulation circuit 50, and the vehicle Ethernet interface 70 are connected in series in sequence. In this case, the line fault simulation circuit 50 is far-end relative to the vehicle Ethernet transceiver 20, and the line fault simulation circuit 50 is near-end relative to the vehicle Ethernet interface 70. The second connection relationship is that the vehicle Ethernet transceiver 20, the line fault simulation circuit 50, the cable 40, and the vehicle Ethernet interface 70 are connected in series in sequence. In this case, the line fault simulation circuit 50 is near-end relative to the vehicle Ethernet transceiver 20, and the line fault simulation circuit 50 is far-end relative to the vehicle Ethernet interface 70. Therefore, the switch circuit 30 can adjust the relative distance between the line fault simulation circuit 50 and the vehicle Ethernet transceiver 20 and the vehicle Ethernet interface 70 to achieve different occurrence locations of simulated faults.

[0045] Among them, a switch circuit 30 is used to switch the first connection relationship and the second connection relationship, and only one line fault simulation circuit 50 can be designed to realize near-end and far-end testing. Only by switching the connection relationship, the relative position between the line fault simulation circuit 50 and the vehicle Ethernet transceiver 20 and the vehicle Ethernet interface 70 can be adjusted, thereby realizing the reuse of the line fault simulation circuit 50 and saving costs.

[0046] The device under test 60 may be a vehicle-mounted controller. The vehicle-mounted Ethernet transceiver 20 may be a physical layer chip of the vehicle-mounted Ethernet, and may be connected to the vehicle-mounted controller to realize data interaction.

[0047] The line fault simulation circuit 50 is used to simulate at least one type of fault of the link between the vehicle-mounted Ethernet transceiver 20 and the device under test 60 .

[0048] The fault type includes at least one of the following: a short circuit fault to ground, an open circuit fault to ground, a short circuit fault to the power supply end, and an open circuit fault to the power supply end.

[0049] In this embodiment, by setting the switch circuit 30, the connection relationship between the vehicle Ethernet transceiver 20, the cable 40, the line fault simulation circuit 50, and the vehicle Ethernet interface 70 can be switched, thereby realizing the simulation of multiple fault simulation connection relationships, facilitating the verification of the fault diagnosis performance of the device under test 60 under different fault simulation connection relationships, and the test is more comprehensive and reliable. By setting the line fault simulation circuit 50, the fault type of the link between the vehicle Ethernet transceiver 20 and the vehicle Ethernet interface 70 can be simulated, thereby simulating various possible fault types for the device under test 60, so as to verify the fault diagnosis performance of the device under test 60 for various fault types. In summary, the test device of this embodiment can simulate various fault simulation connection relationships and various fault types for the device under test 60 at the physical level, and can simulate various environments for the fault diagnosis performance of the device under test 60, so as to facilitate the operation required for the comprehensive fault diagnosis performance test of the device under test 60, and the connection relationship can be switched through the switch circuit 30, and the fault type can be switched through the line fault simulation circuit 50, which improves the test efficiency and is more convenient.

[0050] In one embodiment, Figure 2 As shown, the vehicle Ethernet transceiver 20 includes a first positive electrode interface 11 and a first negative electrode interface 12 , the vehicle Ethernet interface 70 includes a second positive electrode interface 13 and a second negative electrode interface 14 , and the cable 40 includes a positive electrode line 41 and a negative electrode line 42 .

[0051] The vehicle Ethernet transceiver 20 and the vehicle Ethernet interface 70 both include P and N interfaces, that is, positive and negative interfaces, to achieve signal transmission and reception. Similarly, the cable is also in the form of a twisted pair, including a positive line 41 and a negative line 42.

[0052] The switching circuit 30 is respectively connected to the positive line 41, the negative line 42, the first positive interface 11, the first negative interface 12, the second positive interface 13, and the second negative interface 14. The switching circuit 30 is used to switch the connection relationship between the positive line 41, the first positive interface 11, the second positive interface 13, and the line fault simulation circuit 50, and / or switch the connection relationship between the negative line 42, the first negative interface 12, the second negative interface 14, and the line fault simulation circuit 50.

[0053] Among them, the switch circuit 30 switches the connection relationship between the positive line 41, the first positive interface 11, the second positive interface 13, and the line fault simulation circuit 50, so as to realize the above-mentioned first connection relationship and the second connection relationship. In this case, the connection relationship between the negative line 42, the first negative interface 12, the second negative interface 14, and the line fault simulation circuit 50 can be fixed, for example, the first negative interface 12 is connected to the second negative interface 14, and the negative line 42 is connected to the line fault simulation circuit 50. At this time, the switch circuit 30 switches so that the first positive interface 11, the positive line 41, the line fault simulation circuit 50, and the second positive interface 13 are connected in series in sequence, so as to realize the above-mentioned first connection relationship. The switch circuit 30 switches so that the first positive interface 11, the line fault simulation circuit 50, the positive line 41, and the second positive interface 13 are connected in series in sequence, so as to realize the above-mentioned second connection relationship. In this case, the short circuit and open circuit faults of the first positive interface 11 and the second positive interface 13 can be simulated. Similarly, the switch circuit 30 switches the connection relationship between the negative line 42, the first negative interface 12, the second negative interface 14, and the line fault simulation circuit 50, and can also realize the above-mentioned first connection relationship and the second connection relationship. In this case, the short circuit and open circuit faults of the first negative interface 12 and the second negative interface 14 can be simulated. Alternatively, the switch circuit 30 can also simultaneously switch the connection relationship between the positive line 41, the first positive interface 11, the second positive interface 13, and the line fault simulation circuit 50, and switch the connection relationship between the negative line 42, the first negative interface 12, the second negative interface 14, and the line fault simulation circuit 50. In this case, the short circuit and open circuit faults of the first positive interface 11, the second positive interface 13, the first negative interface 12, and the second negative interface 14 can be simulated.

[0054] In this embodiment, by setting a switching circuit 30, it is possible to switch the connection relationship between the positive line 41, the first positive interface 11, the second positive interface 13, and the line fault simulation circuit 50, and / or switch the connection relationship between the negative line 42, the first negative interface 12, the second negative interface 14, and the line fault simulation circuit 50, thereby realizing the first connection relationship and the second connection relationship, which is convenient for verifying the cable 40 diagnostic performance of the device under test 60 under different fault simulation connection relationships, and making the test more comprehensive and reliable.

[0055] In one embodiment, as shown in FIG. 3 , the switch circuit includes a first switch unit 31 and a second switch unit 32 , and the line fault simulation circuit 50 includes a third positive electrode interface 15 , a third negative electrode interface 16 , a fourth positive electrode interface 17 , and a fourth negative electrode interface 18 .

[0056] The first switch unit 31 is respectively connected to the first positive electrode interface 11, the first negative electrode interface 12, the first end of the positive line 41, the first end of the negative line 42, the second switch unit 32, the third positive electrode interface 15 of the line fault simulation circuit 50, and the third negative electrode interface 16 of the line fault simulation circuit 50.

[0057] The second switch unit 32 is respectively connected to the second positive electrode interface 13, the second negative electrode interface 14, the second end of the positive line 41, the second end of the negative line 42, the fourth positive electrode interface 17 of the line fault simulation circuit 50, and the fourth negative electrode interface 18 of the line fault simulation circuit 50.

[0058] Among them, the first switch unit 31 is used to selectively conduct the path between any two of the first positive electrode interface 11, the first end of the positive line 41, the second switch unit 32, and the third positive electrode interface 15, and the path between any two of the first negative electrode interface 12, the first end of the negative line 42, the second switch unit 32, and the third negative electrode interface 16.

[0059] The second switch unit 32 is used to selectively conduct a path between any two of the second positive electrode interface 13, the second end of the positive electrode line 41, the first switch unit 31, and the fourth positive electrode interface 17, and a path between any two of the second negative electrode interface 14, the second end of the negative electrode line 42, the first switch unit 31, and the fourth negative electrode interface 18.

[0060] In this embodiment, by setting the switch circuit 30 to include the first switch unit 31 and the second switch unit 32, it is possible to realize the selective conduction of the path between any two of the first positive electrode interface 11, the first end of the positive line 41, the second switch unit 32, and the third positive electrode interface 15, and the selective conduction of the path between any two of the first negative electrode interface 12, the first end of the negative line 42, the second switch unit 32, and the third negative electrode interface 16, the selective conduction of the path between any two of the second positive electrode interface 13, the second end of the positive line 41, the first switch unit 31, and the fourth positive electrode interface 17, and the selective conduction of the path between any two of the second negative electrode interface 14, the second end of the negative line 42, the first switch unit 31, and the fourth negative electrode interface 18. Thus, the first connection relationship and the second connection relationship can be flexibly switched.

[0061] In one embodiment, as shown in FIG4 , the first switch unit 31 includes a first switch component 33 and a second switch component 34, and the second switch unit 32 includes a third switch component 35 and a fourth switch component 36. The first switch component 33, the second switch component 34, the third switch component 35, and the fourth switch component 36 each include four ports, wherein:

[0062] The four ports of the first switch component 33 are respectively connected to the first positive electrode interface 11, the first end of the positive line 41, a port of the third switch component 35, and the third positive electrode interface 15. The first switch component 33 is used to conduct the path between any two of its four ports.

[0063] The four ports of the first switch component 33 are ports a1, b1, c1, and d1 respectively.

[0064] The four ports of the second switch component 34 are respectively connected to the first negative electrode interface 12, the first end of the negative electrode line 42, a port of the fourth switch component 36, and the third negative electrode interface 16. The second switch component 34 is used to conduct the path between any two of its four ports.

[0065] The four ports of the second switch component 34 are ports a2, b2, c2, and d2 respectively.

[0066] The four ports of the third switch component 35 are respectively connected to the second positive electrode interface 13, the second end of the positive line 41, a port of the first switch component 33, and the fourth positive electrode interface 17. The third switch component 35 is used to conduct the path between any two of its four ports.

[0067] The four ports of the third switch component 35 are ports a3, b3, c3, and d3 respectively.

[0068] The four ports of the fourth switch component 36 are respectively connected to the second negative electrode interface 14, the second end of the negative line 42, a port of the second switch component 34, and the fourth negative electrode interface 18. The fourth switch component 36 is used to conduct the path between any two of its four ports.

[0069] The four ports of the fourth switch component 36 are ports a4, b4, c4, and d4 respectively.

[0070] Exemplarily, among the four ports of each of the first switch component 33, the second switch component 34, the third switch component 35, and the fourth switch component 36, a controllable switch is connected between any two ports, so that the passage between any two ports can be freely turned on or off.

[0071] In this embodiment, the first switch component 33, the second switch component 34, the third switch component 35, and the fourth switch component 36 are designed to include four ports, so that each positive electrode interface and each negative electrode interface and the cable 40, etc. can be connected, thereby realizing the switching of the first connection relationship and the second connection relationship.

[0072] In one embodiment, please continue to refer to FIG. 3 or 4 , the line fault simulation circuit 50 includes a third positive electrode interface 15 , a third negative electrode interface 16 , a fourth positive electrode interface 17 , and a fourth negative electrode interface 18 .

[0073] The line fault simulation circuit 50 is used to simulate the corresponding fault by the following operations:

[0074] The third positive electrode interface 15 is short-circuited to the power supply end, the third positive electrode interface 15 is short-circuited to the ground, the third positive electrode interface 15 is open-circuited, the third positive electrode interface 15 and the third negative electrode interface 16 are short-circuited, the fourth positive electrode interface 17 is short-circuited to the power supply end, the fourth positive electrode interface 17 is short-circuited to the ground, the fourth positive electrode interface 17 is open-circuited, the fourth positive electrode interface 17 and the fourth negative electrode interface 18 are short-circuited, the third negative electrode interface 16 is short-circuited to the power supply end, the third negative electrode interface 16 is short-circuited to the ground, the third negative electrode interface 16 is open-circuited, the fourth negative electrode interface 18 is short-circuited to the power supply end, the fourth negative electrode interface 18 is short-circuited to the ground, and the fourth negative electrode interface 18 is open-circuited.

[0075] Among them, since the fault type includes at least one of the following: short circuit fault to ground, open circuit fault to ground, short circuit fault to power supply end, open circuit fault to power supply end. The line fault simulation circuit 50 can simulate the above-mentioned various fault types, wherein the third positive electrode interface 15, the third negative electrode interface 16, the fourth positive electrode interface 17, and the fourth negative electrode interface 18 can all be short-circuited to the power supply end, short-circuited to ground, open-circuited, and short-circuited to the positive and negative electrodes. Therefore, the simulation of various fault types can be achieved through appropriate combinations. For example, as shown in Table 1 below, the fault types specifically include those shown in Table 1.

[0076] Table 1. Fault type table

[0077]

[0078] Among them, since the line fault simulation circuit 50 can simulate the short circuit and open circuit faults of each interface, and the switch circuit 30 can freely switch the connection relationship between the line fault simulation circuit 50 and the cable 40, so as to switch whether each interface is near-end or far-end. Together, the simulation of all fault types in Table 1 above can be realized.

[0079] In this embodiment, the line fault simulation circuit 50 can simulate short circuit and open circuit faults of each interface, so as to verify the diagnostic performance of the device under test 60 for cables 40 of various fault types.

[0080] In one embodiment, as shown in FIG5 , the line fault simulation circuit 50 includes a first switch K1 , a second switch K2 , a third switch K3 , a fourth switch K4 , a fifth switch K5 , a sixth switch K6 , and a seventh switch K7 .

[0081] A first end of the first switch K1 is connected to the third positive electrode interface 15, and a second end of the first switch K1 is connected to the power supply end VCC. A first end of the second switch K2 is connected to the third positive electrode interface 15, and a second end of the second switch K2 is connected to the ground GND. A first end of the third switch K3 is connected to the third negative electrode interface 16, and a second end of the third switch K3 is connected to the power supply end VCC. A first end of the fourth switch K4 is connected to the third negative electrode interface 16, and a second end of the fourth switch K4 is connected to the ground GND. A first end of the fifth switch K5 is connected to the third positive electrode interface 15, and a second end of the fifth switch K5 is connected to the third negative electrode interface 16. A first end of the sixth switch K6 is connected to a first end of the fifth switch K5, and a second end of the sixth switch K6 is connected to a fourth positive electrode interface 17. A first end of the seventh switch K7 is connected to a second end of the fifth switch K5, and a second end of the seventh switch K7 is connected to a fourth negative electrode interface 18.

[0082] The first switch K1 , the second switch K2 , the third switch K3 , the fourth switch K4 , the fifth switch K5 , the sixth switch K6 , and the seventh switch K7 can all be controlled to be closed and opened, so as to realize the switching between the short circuit and the open circuit of each interface.

[0083] Exemplarily, the first connection relationship and the second connection relationship are illustrated in conjunction with FIG5: when the a1 port is connected to the b1 port, the c1 port is connected to the d1 port, the b3 port is connected to the c3 port, and the a3 port is connected to the d3 port. The link is the first positive electrode interface 11 of the vehicle Ethernet transceiver 20 → a1 port → b1 port → c3 port → b3 port → positive line 41 of the cable → c1 port → d1 port → third positive electrode interface 15 → fourth positive electrode interface 17 → a3 port → d3 port → second positive electrode interface 13 → device under test 60, thereby realizing the first connection relationship. When the a1 port is connected to the b1 port, the c1 port is connected to the d1 port, the b3 port is connected to the d3 port, and the a3 port is connected to the c3 port. The link is the first positive electrode interface 11 of the vehicle Ethernet transceiver 20→a1 port→b1 port→c3 port→a3 port→fourth positive electrode interface 17→third positive electrode interface 15→d1 port→c1 port→positive line 41 of the cable→b3 port→d3 port→second positive electrode interface 13, thereby realizing the second connection relationship. Similarly, the above-mentioned line fault simulation circuit 50 and switch circuit 30 can also realize the simulation of multiple connection relationships and multiple fault types through the combination of other switches and the switching of connections.

[0084] In this embodiment, by designing the line fault simulation circuit 50 to include the first switch K1, the second switch K2, the third switch K3, the fourth switch K4, the fifth switch K5, the sixth switch K6, and the seventh switch K7, simulation of various fault conditions for each interface can be achieved.

[0085] In one embodiment, the vehicle Ethernet transceiver is configured to send a fault type of a link between the vehicle Ethernet transceiver and the vehicle Ethernet interface to the control module.

[0086] The control module is used to obtain the fault type of the link between the vehicle Ethernet transceiver and the vehicle Ethernet interface fed back by the device under test.

[0087] In this embodiment, the vehicle Ethernet transceiver can transmit the fault type detected by itself to the control module, so that the control module can obtain the fault detection result of the vehicle Ethernet transceiver. At the same time, the control module can also obtain the fault type detected by the device under test from the device under test, so that the control module can obtain the fault detection result of the device under test. The subsequent control module can compare the obtained detection result with the actual fault condition to verify the vehicle Ethernet cable diagnostic performance of the device under test.

[0088] In one embodiment, as shown in FIG6 , the test device for the diagnostic performance of the vehicle Ethernet cable 40 further includes a message transceiver chip 80. The message transceiver chip 80 is connected to the control module 10 and the device under test 60 respectively, and is used to transmit the fault type of the link between the vehicle Ethernet transceiver 20 and the device under test 60 fed back by the device under test 60 to the control module 10.

[0089] In this embodiment, the fault type detected by the device under test 60 itself is transmitted through the message transceiver chip 80, so that the control module 10 can obtain the fault detection result of the device under test 60. The control module 10 can then compare the obtained detection result with the actual fault condition to verify the diagnostic performance of the vehicle Ethernet cable 40 of the device under test 60.

[0090] Based on the same inventive concept, an embodiment of the present invention further provides an IOP test device. The IOP test device includes any one of the vehicle Ethernet cable diagnostic performance test devices provided in the above embodiments. Therefore, the IOP test device also has the beneficial effects of the vehicle Ethernet cable diagnostic performance test device in the above embodiments. The similarities can be understood by referring to the explanation of the vehicle Ethernet cable diagnostic performance test device above, and will not be repeated below.

[0091] In the description of this specification, the description with reference to the terms "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0092] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0093] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A test device for the diagnostic performance of an in-vehicle Ethernet cable, characterized in that: include: A control module, an on-board Ethernet transceiver, a switch circuit, a cable, and a line fault simulation circuit, wherein the control module is connected to the on-board Ethernet transceiver, and the switch circuit is respectively connected to the on-board Ethernet transceiver, the line fault simulation circuit, both ends of the cable, and an on-board Ethernet interface for connecting a device under test; wherein, The switch circuit is used to switch the connection relationship between the vehicle-mounted Ethernet transceiver, the cable, the line fault simulation circuit, and the vehicle-mounted Ethernet interface, wherein the connection relationship includes a non-fault simulation connection relationship and a fault simulation connection relationship, and different fault simulation connection relationships are used to simulate different occurrence locations of the fault; wherein the fault simulation connection relationship includes at least a first connection relationship and a second connection relationship, wherein the first connection relationship is that the vehicle-mounted Ethernet transceiver, the cable, the line fault simulation circuit, and the vehicle-mounted Ethernet interface are connected in series in sequence, and the second connection relationship is that the vehicle-mounted Ethernet transceiver, the line fault simulation circuit, the cable, and the vehicle-mounted Ethernet interface are connected in series in sequence; The line fault simulation circuit is used to simulate at least one type of fault of the link between the vehicle-mounted Ethernet transceiver and the device under test, wherein the at least one type of fault includes at least one of the following: a short circuit fault to ground, an open circuit fault to ground, a short circuit fault to the power supply end, and an open circuit fault to the power supply end.

2. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 1, characterized in that: The vehicle Ethernet transceiver includes a first positive interface and a first negative interface, the vehicle Ethernet interface includes a second positive interface and a second negative interface, and the cable includes a positive line and a negative line; The switching circuit is respectively connected to the positive line, the negative line, the first positive interface, the first negative interface, the second positive interface, and the second negative interface. The switching circuit is used to switch the connection relationship between the positive line, the first positive interface, the second positive interface, and the line fault simulation circuit, and / or switch the connection relationship between the negative line, the first negative interface, the second negative interface, and the line fault simulation circuit.

3. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 2, characterized in that: The switch circuit includes a first switch unit and a second switch unit, and the line fault simulation circuit includes a third positive electrode interface, a third negative electrode interface, a fourth positive electrode interface, and a fourth negative electrode interface. The first switch unit is respectively connected to the first positive electrode interface, the first negative electrode interface, the first end of the positive line, the first end of the negative line, the second switch unit, the third positive electrode interface of the line fault simulation circuit, and the third negative electrode interface of the line fault simulation circuit, and the second switch unit is respectively connected to the second positive electrode interface, the second negative electrode interface, the second end of the positive line, the second end of the negative line, the fourth positive electrode interface of the line fault simulation circuit, and the fourth negative electrode interface of the line fault simulation circuit; wherein, The first switch unit is used to selectively conduct a path between any two of the first positive electrode interface, the first end of the positive electrode line, the second switch unit, and the third positive electrode interface, and a path between any two of the first negative electrode interface, the first end of the negative electrode line, the second switch unit, and the third negative electrode interface; The second switch unit is used to selectively conduct the path between any two of the second positive electrode interface, the second end of the positive electrode line, the first switch unit, and the fourth positive electrode interface, and the path between any two of the second negative electrode interface, the second end of the negative electrode line, the first switch unit, and the fourth negative electrode interface.

4. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 3, characterized in that: The first switch unit includes a first switch component and a second switch component, the second switch unit includes a third switch component and a fourth switch component, the first switch component, the second switch component, the third switch component and the fourth switch component each include four ports, wherein: The four ports of the first switch component are respectively connected to the first positive electrode interface, the first end of the positive electrode line, a port of the third switch component, and the third positive electrode interface, and the first switch component is used to conduct a path between any two ports of its four ports; The four ports of the second switch component are respectively connected to the first negative electrode interface, the first end of the negative electrode line, a port of the fourth switch component, and the third negative electrode interface, and the second switch component is used to conduct a path between any two of its four ports; The four ports of the third switch component are respectively connected to the second positive electrode interface, the second end of the positive electrode line, a port of the first switch component, and the fourth positive electrode interface, and the third switch component is used to conduct the path between any two ports of its four ports; The four ports of the fourth switch component are respectively connected to the second negative electrode interface, the second end of the negative electrode line, a port of the second switch component, and the fourth negative electrode interface. The fourth switch component is used to conduct the path between any two of its four ports.

5. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 4, characterized in that: A controllable switch is connected between any two of the four ports of each of the first switch component, the second switch component, the third switch component and the fourth switch component.

6. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 1, characterized in that: The line fault simulation circuit includes a third positive electrode interface, a third negative electrode interface, a fourth positive electrode interface, and a fourth negative electrode interface; The line fault simulation circuit is used to simulate the corresponding fault by the following operations: The third positive electrode interface is short-circuited to the power supply end, the third positive electrode interface is short-circuited to the ground, the third positive electrode interface is open-circuited, the third positive electrode interface and the third negative electrode interface are short-circuited, the fourth positive electrode interface is short-circuited to the power supply end, the fourth positive electrode interface is short-circuited to the ground, the fourth positive electrode interface is open-circuited, the fourth positive electrode interface and the fourth negative electrode interface are short-circuited, the third negative electrode interface is short-circuited to the power supply end, the third negative electrode interface is short-circuited to the ground, the third negative electrode interface is open-circuited, the fourth negative electrode interface is short-circuited to the power supply end, the fourth negative electrode interface is short-circuited to the ground, and the fourth negative electrode interface is open.

7. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 6, characterized in that: The line fault simulation circuit includes a first switch, a second switch, a third switch, a fourth switch, a fifth switch, a sixth switch, and a seventh switch. The first end of the first switch is connected to the third positive electrode interface, the second end of the first switch is connected to the power supply end, the first end of the second switch is connected to the third positive electrode interface, the second end of the second switch is grounded, the first end of the third switch is connected to the third negative electrode interface, the second end of the third switch is connected to the power supply end, the first end of the fourth switch is connected to the third negative electrode interface, the second end of the fourth switch is grounded, the first end of the fifth switch is connected to the third positive electrode interface, the second end of the fifth switch is connected to the third negative electrode interface, the first end of the sixth switch is connected to the first end of the fifth switch, the second end of the sixth switch is connected to the fourth positive electrode interface, the first end of the seventh switch is connected to the second end of the fifth switch, and the second end of the seventh switch is connected to the fourth negative electrode interface.

8. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 1, characterized in that: The length of the cable is 15 meters.

9. The vehicle-mounted Ethernet cable diagnostic performance testing device according to claim 1, characterized in that: The testing device for the diagnostic performance of the vehicle-mounted Ethernet cable also includes a message transceiver chip, which is connected to the control module and the device under test respectively, and is used to transmit the fault type of the link between the vehicle-mounted Ethernet transceiver and the device under test fed back by the device under test to the control module.

10. An IOP testing device, characterized in that: A testing device for the diagnostic performance of an in-vehicle Ethernet cable comprising the device as claimed in any one of claims 1 to 9.

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