Probe device and numerical control machining equipment

Abstract

The utility model discloses a probe device, which is used for numerical control processing equipment and comprises a shell, a light source assembly, a probe assembly and a circuit board, the light source assembly, the probe assembly and the circuit board are assembled in the shell, and the circuit board is connected with the light source assembly and the probe assembly. The light source assembly is arranged at one end of the probe assembly, and the light source assembly is configured to indicate a probe point of the probe assembly; the probe assembly is provided with an optical channel, and the optical channel is used for light emitted by the light source assembly to pass so as to indicate a probe point of the probe assembly. The beneficial effects of the embodiment of the utility model lie in that the light source assembly in the probe device indicates the probe point of the probe assembly, so that an operator can quickly position the drop point of the probe assembly on the object to be processed, the operation steps are simplified, and the detection efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the field of numerical control processing, in particular to a probe device and numerical control processing equipment. Background Art

[0002] Currently, the probes used in CNC machining only have a height detection function, but no detection point projection indication capability. In order to achieve accurate detection of different machining positions and avoid collisions, the probe needs to be moved multiple times in the longitudinal and transverse directions, which results in low efficiency. Utility Model Content

[0003] The embodiment of the utility model provides a probe device, which is used to solve at least one of the above-mentioned technical problems.

[0004] The present invention provides a probe device for numerical control processing equipment, which is characterized by comprising: a housing 10, a light source assembly 20, a probe assembly 30 and a circuit board 40 assembled in the housing 10, wherein:

[0005] The circuit board 40 is connected to the light source assembly 20 and the probe assembly 30;

[0006] The light source assembly 20 is disposed at one end of the probe assembly 30 , and the light source assembly 20 is configured to indicate the probe point of the probe assembly 30 ;

[0007] The probe assembly 30 is provided with an optical channel, and the optical channel is used for the light emitted by the light source assembly 20 to pass through so as to indicate the probe point of the probe assembly 30 .

[0008] In some embodiments, the light source assembly 20 includes a light source 21 and a light source mounting seat 22 for mounting the light source 21 . The light source 21 is at least partially embedded in the light source mounting seat 22 and is electrically connected to the circuit board 40 .

[0009] In some embodiments, the light source assembly 20 further includes a convex lens 23 and a lens mounting seat 24 . The convex lens 23 is disposed between the light source 21 and the probe assembly 30 through the lens mounting seat 24 to guide the light of the light source 21 to the light channel.

[0010] In some embodiments, the light source assembly 20 further includes a focus limiting component 25 disposed between the light source 21 and the convex lens 23 .

[0011] In some embodiments, the probe assembly 30 includes a stationary contact assembly 31 and a movable contact assembly 32 , and the stationary contact assembly 31 and the movable contact assembly 32 are connected to the circuit board 40 .

[0012] In some embodiments, the stationary contact assembly 31 includes a stationary contact portion 311 and a stationary contact insulating portion 312 , the stationary contact portion 311 is embedded in the stationary contact insulating portion 312 , and the stationary contact portion 311 is connected to the circuit board 40 .

[0013] In some embodiments, the moving contact assembly 32 includes a probe 321, a probe mounting seat 322 and a probe reset spring 323. The main body of the probe 321 is provided with a probe clamping portion 3211. The probe mounting seat 322 is provided with a through hole for assembling the probe 321. A probe limiting portion matching the probe clamping portion 3211 is provided in the through hole. The first side surface of the probe clamping portion 3211 cooperates with the probe limiting portion, and the second side surface of the probe clamping portion 3211 cooperates with the probe reset spring 323. The first side surface and the second side surface are opposite to each other.

[0014] In some embodiments, a general assembly tube 50 for assembling the light source assembly 20 and the probe assembly 30 is also included. The general assembly tube 50 is provided with a general assembly through hole along the light channel direction, and the probe mounting seat 322 is at least partially embedded in the general assembly tube 50 .

[0015] In some embodiments, the static contact insulating part 312 is provided with an insulating through hole for installing the static contact part 311 and the probe 321, and an isolation part is provided in the insulating through hole. The static contact part 311 abuts against one side of the isolation part, and the probe reset spring 323 abuts against the other side of the isolation part. A contact through hole is formed on the isolation part for the probe 321 to pass through and contact the static contact part 311.

[0016] In some embodiments, the probe 321 includes a probe through hole arranged along the extension direction of the optical channel, the static contact portion 311 includes a static contact through hole arranged along the extension direction of the optical channel, and the optical channel includes the probe through hole and the static contact through hole.

[0017] An embodiment of the utility model provides a numerical control processing equipment, characterized in that it is equipped with a probe device according to any embodiment of the present application.

[0018] The beneficial effect of the embodiment of the utility model is that the light source component 20 in the probe device indicates the detection point of the probe component 30, which is convenient for the operator to quickly locate the landing point of the probe component 30 on the object to be processed, simplifies the operation steps, and improves the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1a It is a schematic diagram of the structure of the probe device of the utility model;

[0021] Figure 1bIt is a structural schematic diagram of the probe device of the utility model from another perspective;

[0022] Figure 2a A schematic diagram of the structure of the probe assembly of the utility model;

[0023] Figure 2b It is a structural schematic diagram of the probe assembly of the utility model from another perspective;

[0024] Figure 3 is a cross-sectional view of the probe device of the utility model;

[0025] Figure 4 It is a structural schematic diagram of the numerical control processing equipment of the utility model;

[0026] Figure 5 This is another structural schematic diagram of the numerical control processing equipment of the present utility model.

[0027] Explanation of the reference numerals: 10 - shell, 20 - light source assembly, 30 - probe assembly, 40 - circuit board, 50 - general assembly cylinder, 60 - clamping component, 21 - light source, 22 - light source mounting seat, 23 - convex lens, 24 - lens mounting seat, 25 - focal length limiting component, 31 - static contact assembly, 32 - moving contact assembly, 311 - static contact part, 312 - static contact insulating part, 321 - probe, 322 - probe mounting seat, 323 - probe return spring, 3211 - probe clamping part, 3111 - first probe electrode, 3112 - second probe electrode. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical scheme and advantages of the embodiment of the utility model clearer, the technical scheme in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model. It should be noted that the embodiments in this application and the features in the embodiments can be combined with each other without conflict.

[0029] It should also be noted that, in this article, the terms "include" and "comprise" include not only those elements, but also other elements not explicitly listed, or elements inherent to such processes, methods, articles or equipment. In the absence of further restrictions, the elements defined by the sentence "include..." do not exclude the existence of other identical elements in the process, method, article or equipment that includes the elements.

[0030] In the prior art, before the operator operates the CNC processing equipment (for example, 3D engraving machine) to process the parts, it is necessary to detect the material to be processed, so as to determine the boundary and other information of the material to be processed, so as to facilitate automatic processing according to the processing target. In the process of realizing the present application, the inventor found that when the operator detects the material to be processed through the probe, it is necessary to manually control the movement of the probe in the three-dimensional space to detect the target point on the material to be processed. For example, for a smaller groove on the processing material, the groove needs to be enlarged or deepened. The operator needs to manually adjust the movement of the probe in the front and back and left and right directions, and then tentatively adjust the height of the probe to align the probe with the groove. The whole process is time-consuming and laborious, and requires a high level of operator proficiency. The present application provides a probe device to solve the above problems to a certain extent.

[0031] like Figure 1a , Figure 1b and Figure 3 As shown, the embodiment of the utility model provides a probe device for numerical control processing equipment, the probe device comprises: a housing 10, a light source assembly 20, a probe assembly 30 and a circuit board 40 assembled in the housing 10, wherein:

[0032] The circuit board 40 is connected to the light source assembly 20 and the probe assembly 30;

[0033] The light source assembly 20 is disposed at one end of the probe assembly 30 , and the light source assembly 20 is configured to indicate the probe point of the probe assembly 30 ;

[0034] The probe assembly 30 is provided with an optical channel, and the optical channel is used for the light emitted by the light source assembly 20 to pass through so as to indicate the probe point of the probe assembly 30 .

[0035] Exemplarily, the light source assembly 20 is disposed at the upper end of the probe assembly 30, and the light emitted by the light source assembly 20 can be projected onto the surface of the material to be processed through the light channel disposed in the probe assembly 30 to indicate the probe point of the probe assembly 30 on the material to be processed.

[0036] The embodiment of the present application indicates the detection point of the probe assembly 30 through the light source assembly 20 in the probe device, which facilitates the operator to quickly locate the landing point of the probe assembly 30 on the object to be processed, simplifies the operation steps, and improves the detection efficiency.

[0037] In some embodiments, the light source assembly 20 includes a light source 21 and a light source mounting seat 22 for mounting the light source 21, the light source 21 is at least partially embedded in the light source mounting seat 22, and is electrically connected to the circuit board 40. Exemplarily, the light source 21 may be an infrared light source, and two electrodes are provided on the light source 21, the two electrodes are used to connect to the circuit board 40, and the power on and off control of the light source 21 is realized through the circuit board 40, thereby realizing the switch of the light source 21. Exemplarily, a controller is provided on the circuit board 40 for controlling the switch of the light source 21.

[0038] In some embodiments, the light source assembly 20 further includes a convex lens 23 and a lens mounting seat 24. The convex lens 23 is disposed between the light source 21 and the probe assembly 30 through the lens mounting seat 24 to guide the light of the light source 21 to the light channel. Exemplarily, the convex lens 23 is embedded in the lens mounting seat 24. The convex lens is circular. The lens mounting seat 24 is correspondingly a circular mounting seat. The lens mounting seat 24 is provided with a through hole to allow the light of the convex lens to pass through. The setting of the convex lens 23 in the light source assembly 20 can realize the convergence of the light emitted by the light source 21, so that the light can be better directed to the probe assembly 30, and the probe point of the probe assembly 30 on the material to be processed can be indicated more stably and clearly.

[0039] In some embodiments, the light source assembly 20 further includes a focus stopper 25, which is disposed between the light source 21 and the convex lens 23. Exemplarily, the focus stopper 25 is cylindrical, for example, the focus stopper 25 is a lens focal length cylinder. The length of the focus stopper 25 can be set according to the focal length of the convex lens, so that the light emitted by the light source 21 can be accurately projected to the light channel in the probe assembly 30 after passing through the convex lens 23.

[0040] Exemplarily, the shape of the light source mounting seat 24 matches the light source 21. For example, the light source 21 is at least partially cylindrical, and the outer contour of the corresponding light source mounting seat 24 is cylindrical, and a through hole is provided inside, and the through hole is used to install the light source 21. Further, in order to facilitate the installation of the electrodes on the light source 21, a notch is provided on the side wall of the light source mounting seat 24, and the notch is used for the two electrodes of the light source 21 to be connected to the outside (for example, to be connected to the circuit board 40 through a wire).

[0041] In some embodiments, the lower half of the light source 21 is embedded in the focus limiting component 25, and the upper half of the light source 21 is embedded in the light source mounting seat 24. The focus limiting component 25 is tubular, and the axis of the focus limiting component 25 is colinear with the axis of the light source mounting seat 24.

[0042] Exemplarily, the light source 21, the focus stop component 25, the convex lens 23 and the convex lens mounting seat 24 are assembled together from top to bottom in sequence, and are assembled with each other by means of embedded connection, threaded connection or bonding, etc., which is not limited in this application. The axes of the light source 21, the focus stop component 25, the convex lens 23 and the convex lens mounting seat 24 are collinear.

[0043] like Figure 2a , Figure 2b and Figure 3 As shown, in the probe device provided by the present application, the probe assembly 30 includes a static contact assembly 31 and a movable contact assembly 32 , and the static contact assembly 31 and the movable contact assembly 32 are connected to a circuit board 40 .

[0044] In the present application, the static contact assembly 31 and the moving contact assembly 32 are connected to the circuit board 40 to detect the detection action of the probe assembly. For example, when the moving contact assembly 32 contacts the material to be processed, it is displaced, so that the moving contact assembly 32 contacts the static contact assembly 31, thereby forming a closed loop, and a detection signal is generated in the circuit board 40, indicating that the detection is in place.

[0045] In some embodiments, the stationary contact assembly 31 includes a stationary contact portion 311 and a stationary contact insulating portion 312, the stationary contact portion 311 is embedded in the stationary contact insulating portion 312, and the stationary contact portion 311 is connected to the circuit board 40. Exemplarily, the centers of the stationary contact assembly 31 and the movable contact assembly 32 are both provided with through holes to form an optical channel. Figure 2b As shown, in the embodiment of the present application, the stationary contact assembly 31 further includes a first probe electrode 3111 , wherein one end of the first probe electrode 3111 contacts the stationary contact portion 311 , and the other end of the first probe electrode 3111 is connected to the circuit board 40 .

[0046] In some embodiments, the moving contact assembly 32 includes a probe 321, a probe mounting seat 322 and a probe reset spring 323. The main body of the probe 321 is provided with a probe clamping portion 3211. The probe mounting seat 322 is provided with a through hole for assembling the probe 321. The through hole is provided with a probe limiting portion that cooperates with the probe clamping portion 3211 (for example, the probe limiting portion can be a boss provided in the through hole, or it can be realized as a gradually decreasing diameter of the lower end of the probe mounting seat to achieve clamping of the probe). The first side surface of the probe clamping portion 3211 cooperates with the probe limiting portion, and the second side surface of the probe clamping portion 3211 cooperates with the probe reset spring 323. The first side surface and the second side surface are opposite to each other.

[0047] Exemplarily, the probe clamping portion 3211 is disposed near the middle of the probe 321 . The probe clamping portion 3211 may be an integral component surrounding the probe 321 circumferentially, or may be a plurality of subcomponents spaced apart around the probe 321 circumferentially, which is not limited in the present application.

[0048] The movable contact assembly 32 further includes a second probe electrode 3112 , wherein one end of the second probe electrode 3112 contacts the probe 321 , and the other end of the second probe electrode 3112 is connected to the circuit board 40 .

[0049] In some embodiments, a general assembly tube 50 for assembling the light source assembly 20 and the probe assembly 30 is also included. The general assembly tube 50 is provided with a general assembly through hole along the light channel direction, and the probe mounting seat 322 is at least partially embedded in the general assembly tube 50 .

[0050] In this embodiment, the light source assembly 20 and the probe assembly 30 are coaxially assembled through the general assembly tube 50, thereby ensuring the reliability of the assembly and avoiding the problem that the light cannot pass smoothly due to the mutual misalignment between the components.

[0051] In some embodiments, the static contact insulating part 312 is provided with an insulating through hole for installing the static contact part 311 and the probe 321, and an isolation part is provided in the insulating through hole. The static contact part 311 abuts against one side of the isolation part, and the probe reset spring 323 abuts against the other side of the isolation part. A contact through hole is formed on the isolation part for the probe 321 to pass through and contact the static contact part 311.

[0052] In this embodiment, an isolation portion is provided on the static contact insulating portion 312 to achieve insulation isolation and matching installation of the static contact portion 311 and the probe 321. When the probe 321 contacts an object, the spring is compressed, so that the upper end of the probe 321 contacts the static contact portion 311 located above through the contact through hole formed on the isolation portion, thereby forming a closed loop and generating a signal in the circuit board.

[0053] In some embodiments, the probe 321 includes a probe through hole arranged along the extension direction of the optical channel, the static contact portion 311 includes a static contact through hole arranged along the extension direction of the optical channel, and the optical channel includes the probe through hole and the static contact through hole.

[0054] In some embodiments, the probe device further comprises a clamping portion 60, for example, the clamping portion 60 is a clamping handle for mounting the probe device on a numerical control machining device. In some embodiments, the clamping portion 60 is connected to the housing 10 by a thread.

[0055] In some embodiments, the probe device further includes a power supply disposed in the housing 10, for supplying power to at least the circuit board 40, and the housing 10 seals the light source assembly 20, the probe assembly 30, the circuit board 40 and the power supply in a space. To charge the power supply, a wireless charging circuit is also disposed on the circuit board 40.

[0056] like Figure 4 and 5 As shown, an embodiment of the utility model provides a CNC machining device. For example, the CNC machining device is a 3D engraving machine. The CNC machining device is configured with a probe device according to any embodiment of the present application.

[0057] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A probe device for numerical control processing equipment, characterized in that: include: A housing (10), a light source assembly (20), a probe assembly (30) and a circuit board (40) assembled in the housing (10), wherein: The circuit board (40) is connected to the light source assembly (20) and the probe assembly (30); The light source assembly (20) is arranged at one end of the probe assembly (30), and the light source assembly (20) is configured to indicate a detection point of the probe assembly (30); The probe assembly (30) is provided with a light channel, and the light channel is used for the light emitted by the light source assembly (20) to pass through so as to indicate the detection point of the probe assembly (30).

2. The probe device according to claim 1, characterized in that The light source assembly (20) comprises a light source (21) and a light source mounting seat (22) for mounting the light source (21); the light source (21) is at least partially embedded in the light source mounting seat (22) and is electrically connected to the circuit board (40).

3. The probe device according to claim 2, characterized in that: The light source assembly (20) further comprises a convex lens (23) and a lens mounting seat (24); the convex lens (23) is arranged between the light source (21) and the probe assembly (30) via the lens mounting seat (24) to guide the light of the light source (21) to the light channel.

4. The probe device according to claim 3, characterized in that: The light source assembly (20) further comprises a focus limiting component (25) which is arranged between the light source (21) and the convex lens (23).

5. The probe device according to any one of claims 1 to 4, characterized in that: The probe assembly (30) comprises a stationary contact assembly (31) and a movable contact assembly (32), and the stationary contact assembly (31) and the movable contact assembly (32) are connected to the circuit board (40).

6. The probe device according to claim 5, characterized in that: The stationary contact assembly (31) comprises a stationary contact portion (311) and a stationary contact insulating portion (312), the stationary contact portion (311) being embedded in the stationary contact insulating portion (312), and the stationary contact portion (311) being connected to the circuit board (40).

7. The probe device according to claim 6, characterized in that: The movable contact assembly (32) comprises a probe (321), a probe mounting seat (322) and a probe reset spring (323); a probe clamping portion (3211) is provided on the main body of the probe (321); the probe mounting seat (322) is provided with a through hole for assembling the probe (321); a probe limiting portion matching the probe clamping portion (3211) is provided in the through hole; a first side surface of the probe clamping portion (3211) matches with the probe limiting portion; a second side surface of the probe clamping portion (3211) matches with the probe reset spring (323); and the first side surface and the second side surface are opposite to each other.

8. The probe device according to claim 7, characterized in that: It also includes a general assembly cylinder (50) for assembling the light source assembly (20) and the probe assembly (30), wherein the general assembly cylinder (50) is provided with a general assembly through hole along the direction of the light channel, and the probe mounting seat (322) is at least partially embedded in the general assembly cylinder (50).

9. The probe device according to claim 7, characterized in that: The static contact insulating part (312) is provided with an insulating through hole for installing the static contact part (311) and the probe (321), and an isolation part is provided in the insulating through hole. The static contact part (311) abuts against one side of the isolation part, and the probe reset spring (323) abuts against the other side of the isolation part. A contact through hole is formed on the isolation part for the probe (321) to pass through and contact the static contact part (311).

10. The probe device according to claim 7, characterized in that: The probe (321) comprises a probe through hole arranged along the extension direction of the optical channel, the static contact portion (311) comprises a static contact through hole arranged along the extension direction of the optical channel, and the optical channel comprises the probe through hole and the static contact through hole.

11. A numerical control processing equipment, characterized in that: A probe device according to any one of claims 1 to 10 is provided.

Images