Easily-maintained female seat structure for testing burn-in board

Abstract

The utility model discloses an easy-to-maintain test burn-in board female seat structure, which structurally comprises a board to be tested and a burn-in test plugboard, a pin is fixedly arranged at the upper part of the board to be tested, a jack is arranged at the lower part of the burn-in test plugboard, the pin and the jack are in sliding embedded connection, and the easy-to-maintain test burn-in board female seat structure further comprises a clamping fixing mechanism and a stable supporting mechanism, the clamping and fixing mechanism is fixedly connected with the aging test plugboard, the clamping and fixing mechanism is movably connected with a to-be-tested plate, the clamping and fixing mechanism comprises a bottom plate, a guide column, a connecting block and a top plate, the lower end of the guide column is fixedly connected with the bottom plate, and the upper end of the guide column is slidably connected with the connecting block and penetrates through the connecting block; the top plate is rotatably connected with the connecting block through a hinge, the aging test plugboard is fixedly connected with the middle part of the top plate, the stable supporting mechanism is arranged at the upper part of the bottom plate, and the top plate is movably connected with the upper part of the stable supporting mechanism. The utility model belongs to the field of burn-in test boards, and particularly relates to an easy-to-maintain female seat structure for testing a burn-in board.

Description

Technical Field

[0001] The utility model belongs to the field of aging test boards, and specifically refers to a mother seat structure of an aging test board that is easy to maintain. Background Art

[0002] In the semiconductor manufacturing process, chip manufacturing has very high process requirements. The entire process needs to go through many tests to ensure the quality of the final product. Among them, the produced chips need to undergo product reliability testing to determine the performance of the chip. The product aging life experiment is a very important part of the product reliability test. Usually, the aging test includes simulating the chip working in a high temperature or high pressure environment to accelerate its aging process, forcing failures to occur in a shorter time, and then testing the chip failure rate to obtain product reliability information.

[0003] The existing test aging board is directly connected to the board to be tested by plugging and unplugging. When the downward pressure is large, it is easy to cause fracturing at the connection between the board to be tested and the aging test plug board, and the maintenance cost is high. Utility Model Content

[0004] The technical problem to be solved by the utility model is that fracturing is easily caused when the downward pressure is large.

[0005] To solve the above problems, the technical solution adopted by the utility model is as follows: the easy-to-maintain test aging board mother seat structure proposed by the utility model includes a board to be tested and an aging test plug board, the upper part of the board to be tested is fixed with a pin, the lower part of the aging test plug board is opened with a hole, the pin and the hole are slidably engaged and connected, and also include a clamping and fixing mechanism and a stable support mechanism, the clamping and fixing mechanism is fixed to the aging test plug board, the clamping and fixing mechanism is movably connected to the board to be tested, the clamping and fixing mechanism includes a bottom plate, a guide column, a connecting block and a top plate, the lower end of the guide column is fixed to the bottom plate, the upper end of the guide column is slidably connected to the connecting block and passes through the connecting block, the top plate and the connecting block are rotatably connected by a hinge, the aging test plug board is fixed to the middle part of the top plate, the stable support mechanism is arranged on the upper part of the bottom plate, and the top plate and the upper part of the stable support mechanism are movably connected.

[0006] Furthermore, a baffle is fixedly provided on the upper portion of the guide column.

[0007] Furthermore, the clamping and fixing mechanism also includes a limiting nut and a stud, and connecting holes are opened on the top plate and the bottom plate. The stud and the connecting hole are slidably connected and pass through the connecting hole. The upper end of the stud is set as a threaded structure, and the middle and lower end of the stud are set as a smooth columnar structure. The limiting nut and the upper end of the stud are threadedly connected.

[0008] Furthermore, the stable support mechanism includes a damper, a spring and a support plate, the lower parts of the damper and the spring are fixedly connected to the bottom plate, the upper parts of the damper and the spring are fixedly connected to the support plate, and the support plate is in contact with the lower surface of the top plate.

[0009] The beneficial effects achieved by the utility model using the above structure are as follows:

[0010] The easy-to-maintain test aging board mother seat structure proposed in this scheme, by fixing the aging test plug board and the top plate, and arranging a stable support mechanism at the connection between the top plate and the bottom plate for stable support, can play a certain buffering role on the top plate and the aging test plug board when the aging test plug board is pressed down to connect the board to be tested, thereby avoiding the connection between the board to be tested and the aging test plug board from being fractured due to large downward pressure. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 It is a first overall structural schematic diagram of the utility model;

[0012] Figure 2 It is a second overall structural schematic diagram of the utility model;

[0013] Figure 3 This is a third overall structural schematic diagram of the utility model.

[0014] Among them, 1. Aging board, 101. Pins, 2. Test board, 201. Sockets, 3. Clamping and fixing mechanism, 301. Bottom plate, 302. Guide column, 303. Baffle, 304. Connecting block, 305. Top plate, 306. Limit nut, 307. Stud, 308. Connecting hole, 4. Stable support mechanism, 401. Damping, 402. Spring, 403. Support plate.

[0015] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. They are used together with the embodiments of the present invention to explain the present invention and do not constitute a limitation to the present invention. DETAILED DESCRIPTION

[0016] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0017] like Figure 1 and Figure 2As shown, the utility model proposes an easy-to-maintain test aging board mother seat structure, including a board to be tested 1 and an aging test plug board 2, the board to be tested 1 is fixed with a pin 101 on the upper part, and the aging test plug board 2 is provided with a socket 201 at the lower part, the pin 101 and the socket 201 are connected in a sliding manner, and also includes a clamping and fixing mechanism 3 and a stable support mechanism 4, the clamping and fixing mechanism 3 is fixedly connected to the aging test plug board 2, the clamping and fixing mechanism 3 is movably connected to the board to be tested 1, and the clamping and fixing mechanism The structure 3 includes a bottom plate 301, a guide column 302, a connecting block 304 and a top plate 305. The lower end of the guide column 302 is fixedly connected to the bottom plate 301, the upper end of the guide column 302 is slidably connected to the connecting block 304 and penetrates the connecting block 304, the top plate 305 is rotatably connected to the connecting block 304 through a hinge, the aging test plug board 2 is fixedly connected to the middle of the top plate 305, the stable support mechanism 4 is arranged on the upper part of the bottom plate 301, and the top plate 305 is movably connected to the upper part of the stable support mechanism 4.

[0018] like Figure 1 , Figure 2 and Figure 3 As shown, a baffle 303 is fixedly provided on the upper part of the guide column 302 for limiting the sliding position of the connecting block 304, the clamping and fixing mechanism 3 also includes a limiting nut 306 and a stud 307, the top plate 305 and the bottom plate 301 are both provided with connecting holes 308, the stud 307 is slidably connected to the connecting hole 308 and passes through the connecting hole 308, the upper end of the stud 307 is set as a threaded structure, the middle and lower ends of the stud 307 are set as a smooth columnar structure, the limiting nut 306 and the upper ends of the stud 307 are threadedly connected, and are used to fix the aging test plug board 2 on the upper part of the board to be tested 1, the stable support mechanism 4 includes a damping 401, a spring 402 and a support plate 403, the lower parts of the damping 401 and the spring 402 are fixedly connected to the bottom plate 301, the upper parts of the damping 401 and the spring 402 are fixedly connected to the support plate 403, and the support plate 403 is in contact with the lower surface of the top plate 305.

[0019] When in use, place the board to be tested 1 on the bottom plate 301, rotate the top plate 305, align the socket 201 at the bottom of the aging test plug board 2 with the pin 101 on the board to be tested 1, and drive the top plate 305 and the aging test plug board 2 along the guide column 302 with the connecting block 304 until the pin 101 is inserted into the socket 201 to complete the connection between the aging test plug board 2 and the board to be tested 1. During the pressing process, the support plate 403 supports the top plate 305, and the spring 402 The damping 401 also plays a certain role in buffering and shock absorption, so as to prevent the aging test plug board 2 from fracturing the board 1 under test due to the large downward pressure. The stud 307 is aligned with the connection hole 308 and penetrates the bottom plate 301 and the top plate 305 in sequence, and the limit nut 306 is connected to the end of the stud 307 by threading, so as to complete the connection limitation of the top plate 305 and the bottom plate 301, which is convenient for the fixed connection and subsequent detection of the aging test plug board 2 and the board 1 under test, and avoids the unstable connection between the aging test plug board 2 and the board 1 under test during the detection process.

[0020] The above description of the utility model and its implementation methods is not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. An easy-to-maintain test aging board mother seat structure, comprising a board to be tested and an aging test plug board, wherein the board to be tested is provided with a pin on the upper part, and a plug hole is provided on the lower part of the aging test plug board, wherein the pin and the plug hole are connected in a sliding engagement, and characterized in that: The clamping and fixing mechanism also includes a stable support mechanism, wherein the clamping and fixing mechanism is fixedly connected to the aging test plug plate, and the clamping and fixing mechanism is movably connected to the board to be tested. The clamping and fixing mechanism includes a bottom plate, a guide column, a connecting block and a top plate, wherein the lower end of the guide column is fixedly connected to the bottom plate, the upper end of the guide column is slidably connected to the connecting block and passes through the connecting block, the top plate and the connecting block are rotatably connected by a hinge, the aging test plug plate is fixedly connected to the middle part of the top plate, and the stable support mechanism is arranged on the upper part of the bottom plate, and the top plate and the upper part of the stable support mechanism are movably connected.

2. The easy-to-maintain test aging board mother base structure according to claim 1 is characterized by: A baffle is fixedly arranged on the upper part of the guide column.

3. The easy-to-maintain test aging board mother base structure according to claim 2 is characterized by: The clamping and fixing mechanism also includes a limiting nut and a stud. The top plate and the bottom plate are both provided with connecting holes. The stud is slidably connected to the connecting hole and passes through the connecting hole. The upper end of the stud is set as a threaded structure, the middle part and the lower end of the stud are set as a smooth columnar structure, and the limiting nut and the upper end of the stud are threadedly connected.

4. The easy-to-maintain test aging board mother base structure according to claim 3 is characterized by: The stable support mechanism includes a damper, a spring and a support plate. The lower parts of the damper and the spring are fixedly connected to the bottom plate, the upper parts of the damper and the spring are fixedly connected to the support plate, and the support plate is in contact with the lower surface of the top plate.

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