Universal test seat for uncapped chip

By designing a universal test socket for open-cap chips, and utilizing structures such as an adapter board, a pressing part, and a limiting frame, the problem of difficult soldering of small packaged chips on large circuit boards is solved, achieving convenient chip installation and protection.

CN222506493UActive Publication Date: 2025-02-18BEIJING HUAIMEI TECH CO LTD
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Patent Information

Application Number
CN202420635495.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-03-29
Publication Date
2025-02-18
Estimated Expiration
2034-03-29

AI Technical Summary

Technical Problem

Existing technologies make it difficult to perform the cap-opening process for small packaged chips on circuit boards larger than 30mm*30mm, resulting in high soldering difficulty.

Method used

A universal test socket for open-cap chips was designed, including an adapter plate, a pressing part, a limiting frame and a needle loading plate. It connects to the chip under test through a dual-headed probe and uses a base, top cover and connecting rod to enhance fixation and convenience.

Benefits of technology

This reduces the difficulty of soldering open-cap chips, improves the ease of installation and replacement, and enhances the protection effect of the chips.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a universal test seat for an uncapping chip, and the test seat comprises an adapter plate which is used for bearing the uncapping chip and is provided with a plurality of first pin holes; the pressing part comprises a top cover and a top cover pressing block which are detachably connected, the top cover is provided with a first groove for containing the top cover pressing block, the side, facing the adapter plate, of the top cover pressing block is provided with a first protrusion, the middle of the first groove is provided with a first opening, the middle of the top cover pressing block is provided with a second opening, and the first opening and the second opening are oppositely arranged; the side, facing the adapter plate, of the limiting frame is provided with a second groove for containing the adapter plate, the adapter plate is detachably connected with the limiting frame, and the limiting frame is provided with a plurality of second needle mounting holes; the needle mounting plate is provided with a plurality of third needle mounting holes, and the double-end probes penetrate through the first needle mounting holes, the second needle mounting holes and the third needle mounting holes and are connected with the uncapping chip to be tested; the to-be-tested uncapping chip and the adapter plate are connected and jointly placed in the second groove of the limiting frame, the limiting frame and the pin mounting plate are pressed by the pressing part, and the use is more convenient.
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Description

Technical Field

[0001] The present application relates to the field of chip detection, and in particular to a universal test socket for an open-cap chip. Background Art

[0002] With the development of aerospace industry, all kinds of chips need to meet the requirements of radiation resistance, and relevant ground radiation tests need to be carried out. The chip needs to be uncapped before irradiation, and functional radiation tests need to be carried out after uncapping. For the convenience and timeliness of the test, the radiation-resistant chip needs to be placed on the test seat for verification.

[0003] For some small packaged chips, the appearance size of these packaged chips is small and the wafer is large. After the cap is opened, the top plastic seal of the chip is removed or the size of the top plastic seal is only 1-2 mm. At present, due to the process limitations of the cap opening, this process is not supported on circuit boards larger than 30mm*30mm.

[0004] Therefore, currently, the open-cap chip is mainly installed on the circuit board, which is difficult to weld. To solve this problem, a universal test socket for an open-cap chip is proposed. Utility Model Content

[0005] The purpose of the embodiments of the present application is to provide a universal test socket for an open-cap chip, so as to achieve the technical effect of reducing the difficulty of welding an open-cap chip.

[0006] The embodiment of the present application provides a universal test socket for an open-cap chip, comprising: an adapter plate for carrying an open-cap chip, the adapter plate being provided with a plurality of first pin-loading holes; a pressing portion, comprising a detachably connected top cover and a top cover pressing block, the top cover being provided with a first groove for accommodating the top cover pressing block, the top cover pressing block being provided with a first protrusion on a side facing the adapter plate, a first opening being provided in the middle of the first groove, a second opening being provided in the middle of the top cover pressing block, and the first opening being arranged opposite to the second opening; a limiting frame being provided with a second groove for accommodating the adapter plate on a side facing the adapter plate, the adapter plate being detachably connected to the limiting frame, the limiting frame being provided with a plurality of second pin-loading holes; a pin-loading plate being provided with a plurality of third pin-loading holes, the first pin-loading hole, the second pin-loading hole, and the third pin-loading hole being arranged opposite to each other, the double-headed probe passing through the first pin-loading hole, the second pin-loading hole, and the third pin-loading hole, and being connected to the open-cap chip to be tested; the open-cap chip to be tested is connected to the adapter plate and placed together in the second groove of the limiting frame, and the pressing portion presses the limiting frame and the pin-loading plate together.

[0007] In the above implementation process, the universal test socket for open-cap chips includes: an adapter board for carrying open-cap chips and used for connecting the open-cap chips to be tested with double-headed probes. The adapter board is provided with multiple first-installation pinholes, which can be 25mm*25mm*2mm in size. The middle area of ​​20mm*20mm is the connection area of ​​the open-cap chip to be tested. The 5mm around the middle area of ​​the adapter board is the position where the top cover pressing block is pressed. The bottom of the adapter board is designed as a pad, which can be 104, and 26 pads around each side, which can be connected with the double-headed probe. The top is designed as a package of different sizes for open-cap chip electrical installation. The pressing part includes a detachably connected top cover and a top cover pressing block. The top cover is provided with a first groove for accommodating the top cover pressing block. The top cover pressing block is provided with a first protrusion on the side facing the adapter plate. A first opening is provided in the middle of the first groove. A second opening is provided in the middle of the top cover pressing block. The first opening and the second opening are arranged oppositely, and the size can be 20mm*20mm. The limiting frame is provided with a second groove for accommodating the adapter plate on the side facing the adapter plate. The adapter plate and the limiting frame are detachably connected. The limiting frame is provided with a plurality of second pin-loading holes. The limiting frame can prevent the double-headed probe and the bottom pad of the adapter plate from being misaligned. The pin-loading plate is provided with a plurality of third pin-loading holes. The first pin-loading hole, the second pin-loading hole, and the third pin-loading hole are arranged oppositely. The double-headed probe passes through the first pin-loading hole, the second pin-loading hole, and the third pin-loading hole, and is connected to the uncapped chip to be tested. The double-headed probe is used to connect the adapter plate to the circuit board. The uncapped chip to be tested is connected to the adapter plate and placed together in the second groove of the limiting frame. The pressing part presses the limiting frame and the pin-loading plate. During use, first remove the adapter board and install the uncapped chip to be tested, then uncap the uncapped chip on the adapter board, and finally install the adapter board with the uncapped chip into the limit frame, press down the pressing part, so that the pins of the uncapped chip to be tested are connected to the double-headed probe through the adapter board. Compared with the existing installation method of uncapped chips to be tested, it is more convenient to use.

[0008] In a possible implementation, the device further includes: a base, used to accommodate the limiting frame, and a third groove is provided on a side of the base facing the limiting frame, used to accommodate the limiting frame.

[0009] In the above implementation process, the universal test socket for uncapped chips also includes a base for accommodating the limit frame, and a third groove is provided on the side of the base facing the limit frame for accommodating the limit frame. By adding the base and mounting the base on the circuit board, the protection of the uncapped chip to be tested is enhanced, and replacement is convenient.

[0010] In a possible implementation, a second protrusion is provided on a side of the base facing the top cover, a fourth groove is provided on a side of the top cover facing the base, and the second protrusion is embedded in the fourth groove.

[0011] In the above implementation process, a second protrusion is provided on the side of the base facing the top cover, a fourth groove is provided on the side of the top cover facing the base, and the second protrusion is embedded in the fourth groove. By embedding, the base and the top cover are embedded and fixed more firmly.

[0012] In a possible implementation, the method further includes: a connecting rod passing through the second protrusion and the fourth groove, and the top cover reciprocates through the connecting rod.

[0013] In the above implementation process, the connecting rod passes through the second protrusion and the fourth groove, and the top cover reciprocates through the connecting rod. By adding the connecting rod, the rotation mode of the top cover is fixed, and the top cover is always in a connected state with the base, avoiding the top cover from being lost.

[0014] In a possible implementation, the base, the needle mounting plate, and the limiting frame are all provided with fixing holes, and fixing bolts pass through the fixing holes of the three to fix the three together.

[0015] In the above implementation process, the base, the needle plate, and the limit frame are all provided with fixing holes, and the fixing bolts pass through the fixing holes of the three to fix the three. The fixing method of the fixing bolts makes the base, the needle plate, and the limit frame more firmly fixed and easy to disassemble.

[0016] In a possible implementation, the top cover is provided with a buckle, the base is provided with a slot, and the top cover is reciprocated by the connecting rod so that the buckle is engaged with the slot.

[0017] In the above implementation process, the top cover is provided with a buckle, the base is provided with a slot, and the top cover is reciprocated by the connecting rod so that the buckle is engaged with the slot, which is more convenient to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A structural diagram of a universal test socket for an open-cap chip provided in an embodiment of the present application;

[0020] Icons: 1. Top cover; 2. Top cover pressure block; 3. Adapter plate; 4. Double-head probe; 5. Limit frame; 6. Needle plate; 7. Fixing bolt; 8. Base; 9. Connecting rod. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0022] Please refer to Figure 1 The embodiment of the present application provides a universal test socket for an open-cap chip, comprising: an adapter plate 3 for carrying an open-cap chip, the adapter plate 3 being provided with a plurality of first pinholes; a pressing portion, comprising a detachably connected top cover 1 and a top cover pressing block 2, the top cover 1 being provided with a first groove for accommodating the top cover pressing block 2, the top cover pressing block 2 being provided with a first protrusion on a side facing the adapter plate 3, a first opening being provided in the middle of the first groove, a second opening being provided in the middle of the top cover pressing block 2, the first opening being arranged opposite to the second opening; a limiting frame 5 facing the adapter plate A second groove for accommodating the adapter plate 3 is provided on one side of 3, and the adapter plate 3 is detachably connected to the limit frame 5, and the limit frame 5 is provided with a plurality of second pin-loading holes; the pin-loading plate 6 is provided with a plurality of third pin-loading holes, and the first pin-loading hole, the second pin-loading hole, and the third pin-loading hole are arranged relatively, and the double-headed probe 4 passes through the first pin-loading hole, the second pin-loading hole and the third pin-loading hole, and is connected to the uncapped chip to be tested; the uncapped chip to be tested is connected to the adapter plate 3, and is placed together in the second groove of the limit frame 5, and the pressing part presses the limit frame 5 and the pin-loading plate 6.

[0023] In the above implementation process, the universal test socket for open-cap chips includes: an adapter plate 3, which is used to carry the open-cap chip and is used to connect the open-cap chip to be tested with the double-headed probe 4. The adapter plate 3 is provided with a plurality of first pinholes, which can be 25mm*25mm*2mm in size, and the position of the middle area of ​​20mm*20mm is the connection area of ​​the open-cap chip to be tested. The 5mm around the middle area of ​​the adapter plate 3 is the position where the top cover pressing block 2 is pressed. The bottom of the adapter plate 3 is designed as a pad, which can be 104 holes, and 26 holes around each of the four sides, which can be connected with the double-headed probe 4. The top is designed as a package of different sizes for the electrical installation of the open-cap chip. The pressing part includes a detachably connected top cover 1 and a top cover pressing block 2, the top cover 1 is provided with a first groove for accommodating the top cover pressing block 2, the top cover pressing block 2 is provided with a first protrusion on the side facing the adapter plate 3, a first opening is provided in the middle of the first groove, a second opening is provided in the middle of the top cover pressing block 2, the first opening and the second opening are arranged opposite to each other, and the size can be 20mm*20mm; a limiting frame 5 is provided with a second groove for accommodating the adapter plate 3 on the side facing the adapter plate 3, the adapter plate 3 and the limiting frame 5 are detachably connected, the limiting frame 5 is provided with a plurality of second pinholes, and the limiting frame 5 can prevent the double-headed probe 4 and the bottom solder pad of the adapter plate 3 from being misaligned. The needle mounting plate 6 is provided with a plurality of third needle mounting holes, wherein the first needle mounting hole, the second needle mounting hole and the third needle mounting hole are arranged opposite to each other, and the double-headed probe 4 passes through the first needle mounting hole, the second needle mounting hole and the third needle mounting hole, and is connected with the uncapped chip to be tested, and the double-headed probe 4 is used to connect the adapter plate 3 with the circuit board; the uncapped chip to be tested is connected with the adapter plate 3, and is placed together in the second groove of the limit frame 5, and the pressing part presses the limit frame 5 with the needle mounting plate 6. During use, the adapter plate 3 is first removed and electrically assembled with the uncapped chip to be tested, and then the uncapped chip to be tested on the adapter plate 3 is uncapped, and finally, the adapter plate 3 with the uncapped chip is installed in the limit frame 5, and the pressing part is pressed down, so that the pins of the uncapped chip to be tested are connected to the double-headed probe 4 through the adapter plate 3.

[0024] In a possible implementation, it further includes: a base 8 for accommodating the limiting frame 5 , and a third groove is provided on a side of the base 8 facing the limiting frame 5 for accommodating the limiting frame 5 .

[0025] In the above implementation process, the universal test socket for uncapped chips further includes a base 8 for accommodating the limit frame 5, and a third groove is provided on the side of the base 8 facing the limit frame 5 for accommodating the limit frame 5. By adding the base 8 and mounting the base 8 on the circuit board, the protection of the uncapped chip to be tested is enhanced, and replacement is convenient.

[0026] In a possible implementation, a second protrusion is provided on a side of the base 8 facing the top cover 1 , a fourth groove is provided on a side of the top cover 1 facing the base 8 , and the second protrusion is embedded in the fourth groove.

[0027] In the above implementation process, the base 8 is provided with a second protrusion on the side facing the top cover 1, and the top cover 1 is provided with a fourth groove on the side facing the base 8, and the second protrusion is embedded in the fourth groove. By embedding, the base 8 and the top cover 1 are embedded and fixed more firmly.

[0028] In a possible implementation, the device further includes: a connecting rod 9 passing through the second protrusion and the fourth groove, and the top cover 1 reciprocates through the connecting rod 9 .

[0029] In the above implementation process, the connecting rod 9 passes through the second protrusion and the fourth groove, and the top cover 1 reciprocates through the connecting rod 9. By adding the connecting rod 9, the rotation mode of the top cover 1 is fixed, and the top cover 1 is always in a connected state with the base 8, avoiding the top cover 1 from being lost.

[0030] In a possible implementation, the base 8, the needle mounting plate 6, and the limiting frame 5 are all provided with fixing holes, and the fixing bolts 7 pass through the fixing holes of the three to fix the three together.

[0031] In the above implementation process, the base 8, the needle plate 6, and the limit frame 5 are all provided with fixing holes, and the fixing bolts 7 pass through the fixing holes of the three to fix the three. The fixing method of the fixing bolts 7 makes the base 8, the needle plate 6, and the limit frame 5 more firmly fixed and easy to disassemble.

[0032] In a possible implementation, the top cover 1 is provided with a buckle, the base 8 is provided with a slot, and the top cover 1 is reciprocated by the connecting rod 9 so that the buckle is engaged with the slot.

[0033] In the above implementation process, the top cover 1 is provided with a buckle, the base 8 is provided with a slot, and the top cover 1 reciprocates through the connecting rod 9 so that the buckle is engaged with the slot, which is more convenient to use.

Claims

1. A universal test socket for open-cap chips, characterized in that: include: An adapter plate, used for carrying an open-cap chip, the adapter plate being provided with a plurality of first mounting pinholes; The pressing part comprises a detachably connected top cover and a top cover pressing block, the top cover is provided with a first groove for accommodating the top cover pressing block, the top cover pressing block is provided with a first protrusion on a side facing the adapter plate, a first opening is provided in the middle of the first groove, a second opening is provided in the middle of the top cover pressing block, and the first opening is arranged opposite to the second opening; A limiting frame, wherein a second groove for accommodating the adapter plate is provided on one side facing the adapter plate, the adapter plate is detachably connected to the limiting frame, and the limiting frame is provided with a plurality of second pinholes; The needle loading plate is provided with a plurality of third needle loading holes, wherein the first needle loading hole, the second needle loading hole and the third needle loading hole are arranged opposite to each other, and the double-headed probe passes through the first needle loading hole, the second needle loading hole and the third needle loading hole and is connected with the open-cap chip to be tested; The uncapped chip to be tested is connected to the adapter plate and placed together in the second groove of the limit frame, and the pressing part presses the limit frame and the needle mounting plate.

2. The open-cap chip universal test socket according to claim 1, characterized in that: Also includes: A base is provided with a third groove on a side of the base facing the limiting frame, for accommodating the limiting frame.

3. The open-cap chip universal test socket according to claim 2, characterized in that: A second protrusion is provided on a side of the base facing the top cover, a fourth groove is provided on a side of the top cover facing the base, and the second protrusion is embedded in the fourth groove.

4. The open-cap chip universal test socket according to claim 3, characterized in that: Also includes: A connecting rod passes through the second protrusion and the fourth groove, and the top cover reciprocates through the connecting rod.

5. The open-cap chip universal test socket according to claim 4, characterized in that: The base, the needle mounting plate and the limiting frame are all provided with fixing holes, and fixing bolts pass through the fixing holes of the three to fix the three together.

6. The open-cap chip universal test socket according to claim 5, characterized in that: The top cover is provided with a buckle, and the base is provided with a slot, and the buckle and the slot can be connected by snap connection.