Clamping processing device convenient for fixing probe

Abstract

The utility model discloses a clamping processing device convenient to fix probes, which comprises a mounting plate, a clamping processing mechanism is arranged on the top surface of the mounting plate and used for fixing the positions of the probes, and the clamping processing mechanism comprises an adjusting assembly which is arranged on the top surface of the mounting plate and used for conveniently adjusting the distance between the probes and conveniently carrying out a conductive test, the utility model relates to the technical field of probe processing and testing. According to the clamping machining device convenient to fix the probes, the distance between the probes can be conveniently adjusted through the arranged driving plate and the arranged connecting plate, when adjustment needs to be carried out, the driving plate can be driven to move left and right by rotating an adjusting screw rod, and at the moment, the driving plate drives a connecting rod to enable an upper clamping plate to move left and right through the connecting plate at the same time; at the moment, the upper clamping plate drives the fixing frame to enable the lower clamping block to move synchronously through the fixing rod, so that the distance between the multiple probes is adjusted to facilitate the subsequent conductive test, the accurate contact between the probes and test points is improved, and the practicability is good.

Description

Technical Field

[0001] The utility model relates to the technical field of probe processing and testing, in particular to a clamping processing device which is convenient for fixing the probe. Background Art

[0002] The test probe is a key component used in the field of electronic testing. It plays an important role in ensuring the yield of electronic products and accurately measuring circuit faults. The quality of the test probe is mainly reflected in the material, coating, spring, diameter accuracy of the sleeve and the manufacturing process.

[0003] The existing clamping and processing devices for fixing probes still have the following problems. The existing devices generally fix the probes before processing. Referring to the patent application with reference to publication number CN217543191U, a clamping and processing device for fixing probes is disclosed. The utility model saves the time required for docking and clamping the probes, facilitates the staff to make adjustments, facilitates the transfer and replacement of probes, improves the portability of the staff when adjusting the opening and closing of the clamping assembly, and effectively ensures the accuracy of docking. It is also convenient to control the alignment of the ends of several probes to improve the accuracy of probe processing work.

[0004] However, the above-mentioned technology saves the time of fixing the probe and improves the convenience of clamping, and then the probe is electroplated. After the electroplating, the probe needs to be tested for conductivity to ensure that the electroplated probe can meet the use requirements. The electroplating process may cause slight changes in the size of the probes in probes of different sizes. At this time, the spacing between the probes needs to be adjusted to perform a conductive test. However, the existing device is not convenient for adjusting the spacing between the probes for adjustment, and may not be able to ensure precise contact between the probes and the test points, and its practicality is general. Utility Model Content

[0005] In view of the deficiencies in the prior art, the utility model provides a clamping processing device for fixing probes, which solves the problem that the prior clamping processing device for fixing probes is inconvenient to adjust the spacing between the probes, may not ensure precise contact between the probes and the test points, and has general practicality.

[0006] To achieve the above objectives, the utility model is implemented through the following technical solutions: a clamping processing device for fixing a probe, comprising a mounting plate, a top surface of which is provided with a clamping processing mechanism for fixing the position of the probe, and the clamping processing mechanism comprises:

[0007] An adjustment component is arranged on the top surface of the mounting plate to facilitate the adjustment of the spacing of the probes for conducting a conductive test. The adjustment component comprises a slot plate fixedly mounted on the top surface of the mounting plate, a plurality of sliders are movably mounted inside the slot plate, a plurality of lower clamping blocks are fixedly mounted on the top surfaces of the sliders, an upper frame is movably mounted above the slot plate, a driving plate and a plurality of upper clamping plates are movably mounted inside the upper frame, and a linkage component is arranged inside the upper frame to simultaneously adjust the spacing of a plurality of probes;

[0008] The clamping assembly is arranged on the top surface of the mounting plate and is used for clamping and fixing the probe.

[0009] Preferably, the linkage assembly includes a connecting plate movably hinged at the middle part of the top surfaces of several upper clamps, the rear ends of several upper clamps are fixedly installed with a fixing frame, an adjusting screw and two limit rods are movably installed inside the upper frame, two connecting rods are fixedly installed on the top surface of the driving plate, and a fixing rod is fixedly installed on the rear end of the top surface of the lower clamping block.

[0010] Preferably, the top end of the fixing rod movably passes through the bottom surface of the fixing frame and extends to the top surface of the fixing frame.

[0011] Preferably, the opposite ends of the connecting plates are movably hinged together, and the right ends of the bottom surfaces of the two connecting rods are fixedly mounted on the top surface of the left upper clamping plate.

[0012] Preferably, the right ends of the two limit rods are movably penetrated through the left sides of the driving plate and several upper clamps and are fixedly installed on the right side of the inner cavity of the upper frame, and several upper clamps are movably installed on the outside of the adjusting screw. The left end thread of the adjusting screw penetrates the right side of the driving plate and is movably installed on the left side of the inner cavity of the upper frame. The right end of the adjusting screw movably penetrates the interior of the upper frame and extends to the right side of the upper frame.

[0013] Preferably, the clamping assembly includes side panels fixedly mounted on the left and right sides of the top surface of the mounting plate, movable grooves are provided on opposite sides of the side panels, movable screws are movably installed inside the movable grooves, movable plates are fixedly mounted on the left and right sides of the upper frame, upper notches are provided on the bottom surfaces of several of the upper clamping plates, a lower notch is provided on the front side of the lower clamping block, and a connecting groove is provided on the top surface of the lower clamping block.

[0014] Preferably, the rear end of the upper notch passes through the front side of the fixing frame and extends to the interior of the fixing frame.

[0015] Preferably, the top end of the movable screw rod movably penetrates the interior of the movable groove and extends to the top surface of the side plate, one side of the movable plate is slidably installed in the interior of the movable groove, and the bottom end thread of the movable screw rod penetrates the top surface of the movable plate and is movably installed on the bottom surface of the inner cavity of the movable groove. Beneficial Effects

[0016] The utility model provides a clamping processing device that is convenient for fixing a probe. Compared with the prior art, it has the following beneficial effects:

[0017] (1) The clamping processing device for fixing the probes can adjust the spacing of the probes by setting a driving plate and a connecting plate. When adjustment is required, the driving plate can be driven to move left and right by rotating the adjusting screw. At this time, the driving plate drives the connecting rod through the connecting plate to move the upper clamp plate left and right at the same time. At this time, the upper clamp plate will drive the fixing frame through the fixing rod to move the lower clamp block synchronously, so as to adjust the spacing of multiple probes to facilitate subsequent conductive testing, improve the precise contact between the probes and the test points, and have good practicality.

[0018] (2) The clamping and processing device for fixing the probe can conveniently clamp and fix the probe by means of a movable screw. When in use, the probe is placed inside the lower notch so that the rear end of the probe is tightly attached to the rear side of the lower notch. Then the movable screw is rotated to drive the upper frame to descend through the movable plate. At this time, the movable plate will drive the connecting groove to descend so that the upper notch is attached to the top surface of the probe to clamp and fix the probe. Then, the probe can be electroplated. At the same time, the fixed frame will be stuck on the top surface of the lower clamping block, which is convenient for fixation and has good practicality. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a three-dimensional appearance schematic diagram of the utility model;

[0020] Figure 2 This is a schematic diagram of the explosion appearance of the utility model;

[0021] Figure 3 This is a three-dimensional appearance diagram of the adjustment component of the utility model;

[0022] Figure 4 It is a partial cross-sectional three-dimensional appearance schematic diagram of the adjustment component of the utility model;

[0023] Figure 5 It is a partial three-dimensional appearance schematic diagram of the adjustment component of the utility model;

[0024] Figure 6 It is a schematic diagram of the three-dimensional appearance of the clamping assembly of the utility model;

[0025] Figure 7 It is a schematic diagram of the three-dimensional appearance of the clamping assembly of the utility model.

[0026] In the figure: 1-mounting plate, 2-clamping processing mechanism, 21-adjusting component, 211-upper frame, 212-driving plate, 213-connecting rod, 214-upper clamping plate, 215-limiting rod, 216-connecting plate, 217-adjusting screw, 218-fixed frame, 219-slot plate, 2110-fixed rod, 2111-slider, 2112-lower clamping block, 22-clamping component, 221-movable plate, 222-upper notch, 223-lower notch, 224-connecting slot, 225-movable screw, 226-side plate, 227-movable slot. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0028] The utility model provides two technical solutions:

[0029] Figure 1-Figure 6 The first embodiment is shown: a clamping processing device for fixing a probe, comprising a mounting plate 1, a clamping processing mechanism 2 is provided on the top surface of the mounting plate 1 for fixing the position of the probe, and the clamping processing mechanism 2 comprises:

[0030] An adjustment component 21 is arranged on the top surface of the mounting plate 1 to facilitate the adjustment of the spacing between the probes for conducting a conductive test. The adjustment component 21 includes a slot plate 219 fixedly mounted on the top surface of the mounting plate 1, a plurality of sliders 2111 are movably mounted inside the slot plate 219, a plurality of sliders 2111 are fixedly mounted on the top surfaces of the plurality of sliders 2111, an upper frame 211 is movably mounted above the slot plate 219, a driving plate 212 and a plurality of upper clamping plates 214 are movably mounted inside the upper frame 211, and a linkage component is arranged inside the upper frame 211 to simultaneously adjust the spacing between a plurality of probes;

[0031] The clamping assembly 22 is arranged on the top surface of the mounting plate 1 and is used to clamp and fix the probe. The linkage assembly includes a connecting plate 216 movably hinged at the middle of the top surface of several upper clamping plates 214. The rear ends of the several upper clamping plates 214 are fixedly installed with a fixing frame 218. The upper frame 211 is internally movably installed with an adjusting screw 217 and two limit rods 215. The top surface of the driving plate 212 is fixedly installed with two connecting rods 213. The rear end of the top surface of the lower clamping block 2112 is fixedly installed with a fixing rod 2110. The top end of the fixing rod 2110 movably passes through the bottom surface of the fixing frame 218 and extends to the top surface of the fixing frame 218. When the fixing frame 218 moves, the lower clamping block 2112 can be driven to move through the fixing rod 2110. The opposite ends of the connecting plate 216 are movably hinged together. The right ends of the bottom surfaces of the two connecting rods 213 are fixedly installed. On the top surface of the left upper clamping plate 214, the right ends of the two limit rods 215 are movably penetrated through the left sides of the driving plate 212 and several upper clamping plates 214 and are fixedly installed on the right side of the inner cavity of the upper frame 211, and the two limit rods 215 can limit the running trajectories of several upper clamping plates 214 and the driving plate 212, and several upper clamping plates 214 are movably installed on the outside of the adjusting screw 217, and the left end thread of the adjusting screw 217 penetrates the right side of the driving plate 212 and is movably installed on the left side of the inner cavity of the upper frame 211, and the right end of the adjusting screw 217 movably penetrates the interior of the upper frame 211 and extends to the right side of the upper frame 211, and rotating the adjusting screw 217 can drive the driving plate 212 to move left and right. At this time, the driving plate 212 drives the two connecting rods 213 to move left and right at the same time through the connecting plate 216.

[0032] The drive plate 212 and the connecting plate 216 are provided to facilitate adjustment of the spacing of the probes. When adjustment is needed, the rotating adjustment screw 217 can drive the drive plate 212 to move left and right. At this time, the drive plate 212 drives the connecting rod 213 through the connecting plate 216 to move the upper clamping plate 214 left and right at the same time. At this time, the upper clamping plate 214 will drive the fixed frame 218 through the fixed rod 2110 to make the lower clamping block 2112 move synchronously, so as to adjust the spacing of multiple probes for subsequent conductive testing, improve the precise contact between the probes and the test points, and have good practicality.

[0033] Figure 1 and Figure 3-Figure 7The second embodiment is shown, which is mainly different from the first embodiment in that: the clamping assembly 22 includes side plates 226 fixedly mounted on the left and right sides of the top surface of the mounting plate 1, and movable grooves 227 are provided on the opposite sides of the side plates 226, and movable screws 225 are movably installed inside the movable grooves 227, and movable plates 221 are fixedly mounted on the left and right sides of the upper frame 211, and upper notches 222 are provided on the bottom surfaces of the upper clamping plates 214, and lower notches 223 are provided on the front side of the lower clamping block 2112, and the size specifications of the upper notches 222 and the lower notches 223 are adapted. A connecting groove 224 is provided on the top surface of the lower clamping block 2112, and the rear end of the upper groove 222 passes through the front side of the fixed frame 218 and extends to the interior of the fixed frame 218. The top end of the movable screw 225 movably passes through the interior of the movable groove 227 and extends to the top surface of the side plate 226. One side of the movable plate 221 is slidably installed in the interior of the movable groove 227. The bottom end thread of the movable screw 225 passes through the top surface of the movable plate 221 and is movably installed on the bottom surface of the inner cavity of the movable groove 227. The rotating movable screw 225 can drive the upper frame 211 to descend through the movable plate 221.

[0034] The movable screw 225 is provided to facilitate clamping and fixing the probe. When in use, the probe is placed inside the lower notch 223 so that the rear end of the probe is tightly attached to the rear side of the lower notch 223. Then the movable screw 225 is rotated to drive the upper frame 211 to descend through the movable plate 221. At this time, the movable plate 221 will drive the connecting groove 224 to descend so that the upper notch 222 is attached to the top surface of the probe to clamp and fix the probe. Then the probe can be electroplated. At the same time, the fixed frame 218 will be stuck on the top surface of the lower clamping block 2112, which is easy to fix and has good practicality.

[0035] Meanwhile, the contents not described in detail in this specification belong to the prior art known to those skilled in the art, and the model parameters of each electrical appliance are not specifically limited, and conventional equipment can be used.

[0036] When in use, the user installs the mounting plate 1 in a suitable position, then places the probe inside the lower notch 223 so that the rear end of the probe is tightly attached to the rear side of the lower notch 223, then rotates the movable screw 225 to drive the upper frame 211 to descend through the movable plate 221, at this time the movable plate 221 will drive the connecting slot 224 to descend, the upper notch 222 will be attached to the top surface of the probe to clamp and fix the probe, and at the same time the fixed frame 218 will be stuck on the top surface of the lower clamping block 2112, and then the probe can be electroplated. When it is necessary to perform a conductive test on the probe, the rotating adjusting screw 217 can drive the driving plate 212 to move left and right, at this time the driving plate 212 drives the connecting rod 213 to move the upper clamping plate 214 left and right at the same time through the connecting plate 216, and at this time the upper clamping plate 214 will drive the fixing frame 218 to move the lower clamping block 2112 synchronously through the fixing rod 2110, so as to adjust the spacing between the multiple probes so that the probes are adapted to the test points.

[0037] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include"-"comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process-method-article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process-method-article or device.

[0038] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A clamping processing device for fixing a probe, comprising a mounting plate (1), characterized in that: The top surface of the mounting plate (1) is provided with a clamping processing mechanism (2) for fixing the position of the probe, and the clamping processing mechanism (2) comprises: An adjustment component (21) is arranged on the top surface of the mounting plate (1) for facilitating the adjustment of the spacing between probes for conducting a conductive test, the adjustment component (21) comprising a slot plate (219) fixedly mounted on the top surface of the mounting plate (1), a plurality of sliders (2111) being movably mounted inside the slot plate (219), a plurality of lower clamping blocks (2112) being fixedly mounted on the top surfaces of the sliders (2111), an upper frame (211) being movably mounted above the slot plate (219), a driving plate (212) and a plurality of upper clamping plates (214) being movably mounted inside the upper frame (211), and a linkage component being arranged inside the upper frame (211) for simultaneously adjusting the spacing between a plurality of probes; A clamping assembly (22) is arranged on the top surface of the mounting plate (1) and is used to clamp and fix the probe.

2. A clamping processing device for fixing a probe according to claim 1, characterized in that: The linkage assembly comprises a connecting plate (216) movably hinged at the middle of the top surfaces of a plurality of upper clamping plates (214); a fixing frame (218) is fixedly installed at the rear ends of the plurality of upper clamping plates (214); an adjusting screw (217) and two limit rods (215) are movably installed inside the upper frame (211); two connecting rods (213) are fixedly installed on the top surface of the driving plate (212); and a fixing rod (2110) is fixedly installed at the rear end of the top surface of the lower clamping block (2112).

3. A clamping processing device for fixing a probe according to claim 2, characterized in that: The top end of the fixing rod (2110) movably passes through the bottom surface of the fixing frame (218) and extends to the top surface of the fixing frame (218).

4. A clamping processing device for fixing a probe according to claim 2, characterized in that: The opposite ends of the connecting plate (216) are movably hinged together, and the right ends of the bottom surfaces of the two connecting rods (213) are fixedly mounted on the top surface of the left upper clamping plate (214).

5. A clamping processing device for fixing a probe according to claim 2, characterized in that: The right ends of the two limit rods (215) are movably penetrated through the left sides of the driving plate (212) and the plurality of upper clamping plates (214) and are fixedly mounted on the right side of the inner cavity of the upper frame (211); the plurality of upper clamping plates (214) are movably mounted on the outside of the adjusting screw (217); the left end thread of the adjusting screw (217) penetrates through the right side of the driving plate (212) and is movably mounted on the left side of the inner cavity of the upper frame (211); the right end of the adjusting screw (217) is movably penetrated through the interior of the upper frame (211) and extends to the right side of the upper frame (211).

6. A clamping processing device for fixing a probe according to claim 1, characterized in that: The clamping assembly (22) comprises side plates (226) fixedly mounted on the left and right sides of the top surface of the mounting plate (1); movable grooves (227) are provided on opposite sides of the side plates (226); movable screws (225) are movably mounted inside the movable grooves (227); movable plates (221) are fixedly mounted on the left and right sides of the upper frame (211); upper notches (222) are provided on the bottom surfaces of a plurality of the upper clamping plates (214); a lower notch (223) is provided on the front side of the lower clamping block (2112); and a connecting groove (224) is provided on the top surface of the lower clamping block (2112).

7. A clamping processing device for fixing a probe according to claim 6, characterized in that: The rear end of the upper notch (222) passes through the front side of the fixing frame (218) and extends to the interior of the fixing frame (218).

8. The clamping processing device for fixing a probe according to claim 6, characterized in that: The top end of the movable screw rod (225) movably penetrates the interior of the movable groove (227) and extends to the top surface of the side plate (226); one side of the movable plate (221) is slidably mounted inside the movable groove (227); the bottom end of the movable screw rod (225) has a thread that penetrates the top surface of the movable plate (221) and is movably mounted on the bottom surface of the inner cavity of the movable groove (227).

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