Testing device of semiconductor laser

Abstract

The utility model belongs to the technical field of semiconductor lasers, and particularly relates to a semiconductor laser testing device which comprises a supporting assembly, the supporting assembly comprises a base station, the bottom of the base station is fixedly connected with supporting legs, the top of the base station is provided with a positioning assembly, the side of the positioning assembly is provided with a testing assembly in a matched mode, and the testing assembly is connected with the supporting legs. The testing assembly comprises a supporting table fixedly connected to the top of the base table, a light-transmitting component is movably connected to the top of the supporting table in an inserted mode, an optical fiber is fixedly connected to the side face of the light-transmitting component, a display unit is movably connected to the bottom of the optical fiber in an inserted mode, and the outer surface of the display unit is fixedly connected with the bottom of the base table. The elastic connection of the metal plate seat and the telescopic spring can absorb the instantaneous centrifugal force of the straight shaft during rotation, so that the straight shaft does not shake left and right during rotation, the movable clamping connection of the wedge-shaped metal plate and the abutting block can help the straight shaft to be flexibly locked, and different test requirements of the test rod are facilitated.

Description

Technical Field

[0001] The utility model belongs to the technical field of semiconductor lasers, and in particular relates to a testing device for semiconductor lasers. Background Art

[0002] High-power semiconductor lasers have the advantages of small size and high efficiency. They have been studied and put into use as solid-state laser pump light sources. In many fields, the laser medium needs to be side-pumped, so semicircular ring semiconductor laser modules have appeared. Currently, related tests can only be completed through packaged fixed lasers.

[0003] During testing, a fixed laser will cause the light beam area obtained by the light-transmitting component to be fixed, which will result in incomplete test data collection and the packaging performance of the laser cannot be fully evaluated. Therefore, it is necessary to adjust the position of the laser to complete the collection of more aspects of the light beam to meet the detection requirements for the laser. Utility Model Content

[0004] The utility model aims to provide a semiconductor laser testing device, aiming to solve the problems raised in the above background technology.

[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0006] A semiconductor laser testing device, comprising:

[0007] A support assembly, the support assembly comprising a base, the bottom of the base is fixedly connected with a leg, and the top of the base is provided with a positioning assembly;

[0008] A test component is arranged on the side of the positioning component, and the test component includes a support platform fixedly connected to the top of the base, a light-transmitting component is movably inserted on the top of the support platform, the side of the light-transmitting component is electrically connected to an optical fiber, the bottom of the optical fiber is electrically connected to a display unit, and the outer surface of the display unit is fixedly connected to the bottom of the base.

[0009] As a preferred solution of the utility model, the positioning assembly includes a sheet metal seat fixedly connected to the top of the base, the inner wall of the sheet metal seat is elastically connected with a telescopic spring, and the upper surface of the sheet metal seat is rotatably connected with a straight shaft through a bearing, the outer wall of the straight shaft is fixedly sleeved with a wedge-shaped sheet metal part, the top wedge-shaped surface of the wedge-shaped sheet metal part is movably clamped with an approach block, the surface of the sheet metal seat is threadedly connected with a tightening bolt, and the end face of the tightening bolt is in close contact with the approach block.

[0010] As a preferred solution of the utility model, the outer side of the straight shaft is rotatably connected to a positioning ring, a spring pin movably penetrates the surface of the positioning ring, and the outer side of the positioning ring is fixedly connected to a flange, the inner cavity of the flange is provided with a straight groove, the straight groove is slidably connected to a side plate, the side surface of the side plate is fixedly connected to the outer side of the spring pin, and the outer wall of the straight shaft is fixedly connected to a retaining ring.

[0011] As a preferred solution of the utility model, the end face of the spring pin is elastically connected with an approach plate, the inner side surface of the approach plate is movably approached with a test rod, the surface of the test rod is fixedly connected with a high-reflection mold group, the bottom of the high-reflection mold group is fixedly connected with a base, and the bottom of the base is fixedly connected to the base.

[0012] As a preferred solution of the utility model, the high-reflection mold set is composed of two plates with a forty-five-degree oblique cross-section, and the center of the high-reflection mold set is kept coincident with the center of the test rod.

[0013] As a preferred solution of the utility model, the number of the approach plates is two, and the two approach plates are circular steel plates that are symmetrical in top and bottom.

[0014] As a preferred solution of the utility model, the number of the supporting legs is four, and the four supporting legs are distributed at the four corners of the base.

[0015] Compared with the prior art, the beneficial effects of the utility model are: the elastic connection between the sheet metal seat and the telescopic spring can absorb the instantaneous centrifugal force of the straight shaft during rotation, so that the straight shaft will not swing left and right during rotation; the active clamping connection between the wedge-shaped sheet metal part and the approach block can help the straight shaft to be flexibly locked, which is convenient for different testing requirements of the test rod; the tightening bolt can lock the sheet metal seat tightly in appropriate occasions. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the following briefly introduces the drawings required for the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative labor. Among them:

[0017] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0018] Figure 2 This is a structural schematic diagram of a component for realizing a rotation adjustment effect in the utility model;

[0019] Figure 3 This is a schematic diagram of the structure of the assembly for achieving the ring stabilizing clamping effect in the utility model;

[0020] Figure 4 For this utility model Figure 2 A local enlarged schematic diagram of point A in the middle.

[0021] In the figure: 100, support assembly; 101, base; 102, support leg; 200, positioning assembly; 201, positioning ring; 202, flange; 203, spring pin; 204, side plate; 205, approach plate; 206, straight shaft; 207, retaining ring; 208, wedge-shaped sheet metal; 209, approach block; 210, tightening bolt; 211, telescopic spring; 212, sheet metal seat; 213, test rod; 214, base; 215, high reflection module; 300, test assembly; 301, support platform; 302, light-transmitting component; 303, optical fiber; 304, display unit. DETAILED DESCRIPTION

[0022] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the accompanying drawings.

[0023] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0024] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure or characteristic that may be included in at least one implementation of the present invention. The term "in one embodiment" that appears in different places in this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive with other embodiments.

[0025] Example 1

[0026] Reference Figure 1-2 , is the first embodiment of the utility model, which provides a semiconductor laser testing device, including,

[0027] The support assembly 100 includes a base 101, a leg 102 is fixedly connected to the bottom of the base 101, and a positioning assembly 200 is arranged on the top of the base 101;

[0028] A test component 300 is arranged on the side of the positioning component 200. The test component 300 includes a support platform 301 fixedly connected to the top of the base 101, a light-transmitting component 302 is movably inserted on the top of the support platform 301, the side of the light-transmitting component 302 is electrically connected to an optical fiber 303, the bottom of the optical fiber 303 is electrically connected to a display unit 304, and the outer surface of the display unit 304 is fixedly connected to the bottom of the base 101.

[0029] Specifically, the coordinated arrangement of the base 101 and the legs 102 makes the bottom of the test rod 213 more stable when it rotates. At the same time, the movable connection between the support platform 301 and the light-transmitting component 302 can further help the light-transmitting component 302 to adjust its own position when collecting light beams. The fixed connection between the display unit 304 and the base 101 allows the display unit 304 to remain relatively still when collecting data, thereby facilitating the stable analysis of the detection data of the test rod 213.

[0030] Furthermore, the positioning assembly 200 includes a sheet metal seat 212 fixedly connected to the top of the base 101, the inner wall of the sheet metal seat 212 is elastically connected with a telescopic spring 211, and the upper surface of the sheet metal seat 212 is rotatably connected with a straight shaft 206 through a bearing, the outer wall of the straight shaft 206 is fixedly sleeved with a wedge-shaped sheet metal part 208, the top wedge-shaped surface of the wedge-shaped sheet metal part 208 is movably clamped with an approach block 209, and the surface of the sheet metal seat 212 is threadedly connected with a tightening bolt 210, and the end face of the tightening bolt 210 is in close contact with the approach block 209.

[0031] Preferably, the elastic connection between the sheet metal seat 212 and the telescopic spring 211 can absorb the instantaneous centrifugal force of the straight shaft 206 during rotation, so that the straight shaft 206 will not swing left and right during rotation. The movable clamping connection between the wedge-shaped sheet metal 208 and the approach block 209 can help the straight shaft 206 to be flexibly locked, which is convenient for different testing requirements of the test rod 213. The tightening bolt 210 can lock and tighten the sheet metal seat 212 in appropriate occasions.

[0032] In summary, the test rod 213 is fixed inside the positioning component 200, and then the light-transmitting component 302 and the display unit 304 are installed in appropriate positions. Then the telescopic spring 211 in the positioning component 200 is elastically connected to the sheet metal seat 212, the wedge-shaped sheet metal part 208 is fixedly mounted on the straight shaft 206, and the tightening bolt 210 helps the approach block 209 to approach flexibly in appropriate occasions.

[0033] Example 2

[0034] Reference Figure 2-3 , which is the second embodiment of the utility model. Different from the previous embodiment, this embodiment provides relevant components for the flexible supporting effect of the test rod.

[0035] Specifically, the outer side of the straight shaft 206 is rotatably connected to the positioning ring 201, and the surface of the positioning ring 201 is movably penetrated by a spring pin 203, and the outer side of the positioning ring 201 is fixedly connected to a flange 202, the inner cavity of the flange 202 is provided with a straight groove, and the straight groove is slidably connected to a side plate 204, the side of the side plate 204 is fixedly connected to the outer side of the spring pin 203, and the outer wall of the straight shaft 206 is fixedly connected to a retaining ring 207.

[0036] Furthermore, the spring pin 203 and the positioning ring 201 are movable and penetrated, so that the side plate 204 can be stably pressed against and fixed to the test rod 213. Through the expansion and contraction characteristics of the spring, the test rod 213 is prevented from being bumped and damaged during the clamping process.

[0037] Preferably, the end face of the spring pin 203 is elastically connected to the approach plate 205, the inner side face of the approach plate 205 is movably approached with a test rod 213, the surface of the test rod 213 is fixedly connected to a high-reflection mold group 215, the bottom of the high-reflection mold group 215 is fixedly connected to a base 214, and the bottom of the base 214 is fixedly connected to the base 101.

[0038] In summary, the proximity of the approach plate 205 and the test rod 213 can enable the test rod 213 to be fully and stably clamped, and the fixed connection between the high reflection module 215 and the base 214 further ensures that the high reflection module 215 remains stable when diffracting the light beam, ensuring that more light beams can be collected by the light-transmitting component 302, and is conducive to the efficient collection of laser test data.

[0039] Example 3

[0040] Reference Figure 3-4 , which is the third embodiment of the utility model. Different from the previous embodiment, this embodiment provides relevant components for achieving stable propagation effect and stable support effect of the diffraction light beam.

[0041] Specifically, the high-reflection mold set 215 is composed of two plates with a 45-degree oblique cross-section, and the center of the high-reflection mold set 215 coincides with the center of the test rod 213 .

[0042] Furthermore, the adaptation of the high reflection module 215 and the diode light beam reduces the obstruction encountered during the propagation of the light beam, which is beneficial to ensuring the quality of the light beam during collection. At the same time, the concentric arrangement of the high reflection module 215 and the test rod 213 allows the light beam to be transmitted to the greatest extent.

[0043] Next, there are two abutment plates 205 , and the two abutment plates 205 are circular steel plates that are symmetrical in both directions. There are four supporting legs 102 , and the four supporting legs 102 are distributed at the corners of the base 101 .

[0044] In summary, the upper and lower symmetry of the approach block 205 makes the test rod 213 more stable when clamped, avoiding shaking and deviation, and the distribution of the four legs 102 further enhances the stability of the overall device.

[0045] Importantly, it should be noted that the construction and arrangement of the present application shown in a plurality of different exemplary embodiments are only exemplary. Although only a few embodiments are described in detail in this disclosure, it should be readily understood by those who refer to this disclosure that many modifications are possible (e.g., the size, scale, structure, shape and ratio of various elements, and parameter values ​​(e.g., temperature, pressure, etc.), installation arrangements, use of materials, color, directional changes, etc.) without substantially departing from the novel teachings and advantages of the subject matter described in the application. For example, the element shown as integrally formed can be composed of multiple parts or elements, the position of the element can be inverted or otherwise changed, and the nature or number or position of the discrete element can be changed or changed. Therefore, all such modifications are intended to be included in the scope of the present utility model. The order or sequence of any process or method steps can be changed or reordered according to alternative embodiments. In the claims, any "device plus function" clause is intended to cover the structure of performing the function described herein, and is not only structurally equivalent but also equivalent structure. Without departing from the scope of the present invention, other substitutions, modifications, changes and omissions may be made in the design, operating conditions and arrangement of the exemplary embodiments. Therefore, the present invention is not limited to a specific embodiment, but extends to various modifications that still fall within the scope of the appended claims.

[0046] Additionally, in order to provide a concise description of example embodiments, all features of an actual embodiment (ie, those features that are not relevant to the best mode presently contemplated for carrying out the invention or those that are not relevant to implementing the invention) may not be described.

[0047] It will be appreciated that in the development of any actual implementation, as in any engineering or design project, numerous implementation-specific decisions may be made. Such a development effort may be complex and time-consuming, but will be a routine task of design, fabrication, and production for those of ordinary skill having the benefit of this disclosure without undue experimentation.

[0048] It should be noted that the above embodiments are only used to illustrate the technical solution of the utility model rather than to limit it. Although the utility model has been described in detail with reference to the preferred embodiments, ordinary technicians in the field should understand that the technical solution of the utility model can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the utility model, which should be included in the scope of the claims of the utility model.

Claims

1. A semiconductor laser testing device, characterized in that: include, A support assembly (100), the support assembly (100) comprising a base (101), the bottom of the base (101) being fixedly connected to a support leg (102), and the top of the base (101) being provided with a positioning assembly (200); A test component (300) is provided on the side of the positioning component (200), and the test component (300) comprises a support platform (301) fixedly connected to the top of the base platform (101), a light-transmitting component (302) is movably inserted into the top of the support platform (301), the side of the light-transmitting component (302) is electrically connected to an optical fiber (303), the bottom of the optical fiber (303) is electrically connected to a display unit (304), and the outer surface of the display unit (304) is fixedly connected to the bottom of the base platform (101).

2. A semiconductor laser testing device according to claim 1, characterized in that: The positioning assembly (200) includes a sheet metal seat (212) fixedly connected to the top of the base (101), the inner wall of the sheet metal seat (212) is fixedly connected with a telescopic spring (211), and the center of the inner wall of the sheet metal seat (212) is rotatably connected with a straight shaft (206) through a bearing, the outer wall of the straight shaft (206) is fixedly sleeved with a wedge-shaped sheet metal part (208), the top of the wedge-shaped sheet metal part (208) is snap-connected with an approach block (209), the surface of the sheet metal seat (212) is threadedly connected with a tightening bolt (210), and the end face of the tightening bolt (210) is in close contact with the approach block (209).

3. The semiconductor laser testing device according to claim 2, characterized in that: The outer side of the straight shaft (206) is rotatably connected to a positioning ring (201), a spring pin (203) is fixedly passed through the surface of the positioning ring (201), and the outer side of the positioning ring (201) is fixedly connected to a flange (202), the inner cavity of the flange (202) is slidably connected to a side plate (204), the side surface of the side plate (204) is fixedly connected to the outer side of the spring pin (203), and the outer wall of the straight shaft (206) is fixedly connected to a retaining ring (207).

4. A semiconductor laser testing device according to claim 3, characterized in that: The end surface of the spring pin (203) is elastically connected to an abutment plate (205), the inner side surface of the abutment plate (205) is matched with a test rod (213), the surface of the test rod (213) is fixedly connected to a high-reflection mold group (215), the bottom of the high-reflection mold group (215) is fixedly connected to a base (214), and the bottom of the base (214) is fixedly connected to the base (101).

5. The semiconductor laser testing device according to claim 4, characterized in that: The high-reflection mold set (215) is composed of two plates with a 45-degree oblique cross-section, and the center of the high-reflection mold set (215) is kept coincident with the center of the circle of the test rod (213).

6. The semiconductor laser testing device according to claim 5, characterized in that: The number of the approach plates (205) is two, and the two approach plates (205) are circular steel plates that are symmetrical in both directions.

7. A semiconductor laser testing device according to claim 6, characterized in that: The number of the supporting legs (102) is four, and the four supporting legs (102) are distributed at the corners of the base (101).

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