Triode pin detection device
By designing a transistor pin detection device including a test box, placement slot, reset slot and adjustment structure, the problem of inconvenience in transistor detection in the prior art is solved, and stable detection and efficient testing of transistor pins are realized.
Patent Information
- Application Number
- CN202420956641.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-06
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2034-05-06
AI Technical Summary
In the prior art, it is difficult to effectively clamp the transistor when detecting the transistor pins, resulting in easy shaking when hand shaking or collision, which may cause transistor drop and pin bending, making measurement efficiency in low and difficult.
A transistor pin detection device is designed, including a test box, placement slot, reset slot and adjustment structure. Through the cooperation of the metal connecting block and the test board, stable detection of the transistor pin is achieved, and the design of the spring and sliding plate is ensured that the transistor does not move during the test.
The device can effectively protect the transistor, ensuring that it does not move during testing, improves testing efficiency, simplifies operation, and reduces the risk of damage to the transistor.
Smart Images
Figure CN222671907U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of triode detection, in particular to a triode pin detection device. Background Art
[0002] The pin is one of the important components of the triode, which can effectively transmit current to the triode. The triode, whose full name should be semiconductor triode, also known as bipolar transistor and crystal triode, is a semiconductor device that controls current. Its function is to amplify weak signals into electrical signals with larger amplitude values. It is also used as a contactless switch.
[0003] At present, when testing the pins of transistors, a multimeter is usually used to measure between the three pins. However, this measurement method is easy to cause shaking when the hand shakes or is bumped because the transistor is not clamped. The shaking may cause the transistor to fall, and then the pins of the transistor may be bent. The measurement efficiency is relatively low, and the measurement difficulty is also large. The practicality is insufficient. The transistor cannot be clamped and positioned during the test, which easily causes the transistor to deviate, further reducing the measurement efficiency. In view of this, we propose a transistor pin detection device. Utility Model Content
[0004] The purpose of the utility model is to solve at least one of the technical problems existing in the prior art and to provide a transistor pin detection device, which can solve the problem of inconvenience in testing transistor pins.
[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a transistor pin detection device, comprising a test box, a transistor placement groove is provided on the upper surface of the test box, a pin placement groove is provided on the upper surface of the test box, the pin placement groove is communicated with the transistor placement groove, the front side of the pin placement groove extends out of the front side surface of the test box, a reset groove is provided on the bottom wall of the pin placement groove, the interior of the test box is set to be hollow, a sliding groove is provided on the bottom wall of the reset groove which is communicated with the interior of the test box, a metal connection block is slidably connected to the interior of the reset groove, and a metal plate is fixedly connected to the lower surface of the metal connection block;
[0006] A test device is arranged inside the test box, a second sliding groove communicating with the interior of the test box is opened on the front surface, a sliding plate is slidably connected inside the second sliding groove, a rear surface of the sliding plate extends into the interior of the test box, a test board is fixedly connected to the rear surface of the sliding plate, the test board is electrically connected to the test device, and an adjustment structure is arranged on the sliding plate.
[0007] Preferably, the adjustment structure includes a second sliding plate, the second sliding plate is fixedly connected to the front surface of the sliding plate, the second sliding plate is slidably connected to the front surface of the test box, the front surface of the second sliding plate is fixedly connected to a spring, the front end of the spring is fixedly connected to a control plate, the rear surface of the control plate is fixedly connected to a limiting rod, and the rear end of the limiting rod slides through the rear surface of the second sliding plate and contacts the front surface of the test box.
[0008] Preferably, a reset spring is fixedly connected to the bottom wall of the reset groove, the upper end of the reset spring is fixedly connected to the lower surface of the metal connecting block, and a protection plate is slidably connected to the inside of the transistor placement groove.
[0009] Preferably, a spring groove is formed on the bottom wall of the transistor placement groove, a movement groove is formed on the bottom wall of the spring groove, a sliding rod is fixedly connected to the lower surface of the protection plate, and the sliding rod is slidably connected to the movement groove.
[0010] Preferably, a second spring is fixedly connected to the lower surface of the protection plate, the lower end of the second spring is fixedly connected to the bottom wall of the spring slot, a cavity is opened inside the test box, and a ejector pin is fixedly connected to the lower surface of the protection plate.
[0011] Preferably, the lower end of the ejector pin slides through the interior of the cavity, the interior of the cavity is slidably connected with a triangular block, the right side surface of the triangular block slides through the right side surface of the test box, the outer surface of the triangular block is sleeved with a reset plate, the right side surface of the reset plate is fixedly connected with a second reset spring, and the left end of the second reset spring is fixedly connected to the test box.
[0012] Compared with the prior art, the beneficial effects of the utility model are:
[0013] (1) When testing the transistor pin detection device, the transistor is placed inside the transistor placement groove, and the pin is inserted into the pin placement groove. When the pin enters, the metal connection block is squeezed, so that the metal connection block moves. After the metal connection block moves, it drives the metal plate to move. When the placement is completed and the test is carried out, the sliding plate is unlocked by pulling the adjustment structure, and then the sliding plate drives the test plate to move. After the test plate moves, it contacts the metal plate, and then the pin is tested by the test device. Through the above structure, when testing, the transistor can be placed in the groove for testing, which protects the transistor and prevents the transistor from moving during the test. At the same time, the pin can be indirectly tested through the built-in test device and the test board, without the need to carry a multimeter separately, which indirectly improves the test efficiency.
[0014] (2) The transistor pin detection device uses the protection plate to compress the second spring when placing the transistor, giving the transistor a certain range of movement to prevent the transistor from being damaged by force. After the test is completed, the reset plate can be pulled, and the reset plate will simultaneously stretch the second reset spring. At the same time, the reset plate will also pull the triangular block synchronously. After the triangular block moves, the inclined surface contacts the ejector pin, and the ejector pin moves upward, thereby driving the protection plate to rise, thereby ejecting the transistor. The reset plate is then released and the second reset spring can be used to complete the reset. Through the above structure, not only can the staff complete the test of the transistor pins more easily and conveniently, but also when taking out the transistor, they can just pull the reset plate, which is convenient and will not cause damage to the transistor itself. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The utility model is further described below in conjunction with the accompanying drawings and embodiments:
[0016] Figure 1 This is a structural schematic diagram of a triode pin detection device of the utility model;
[0017] Figure 2 This is a cross-sectional schematic diagram of the reset groove of the utility model;
[0018] Figure 3 This is a schematic diagram of the adjustment structure of the utility model;
[0019] Figure 4 It is a cross-sectional schematic diagram of the spring groove of the utility model.
[0020] Figure numerals: 1. test box; 2. transistor placement slot; 3. pin placement slot; 4. reset slot; 5. sliding slot; 6. metal connecting block; 7. metal plate; 8. test device; 9. second sliding slot; 10. sliding plate; 11. test plate; 12. second sliding plate; 13. spring; 14. control plate; 15. limit rod; 16. reset spring; 17. protection plate; 18. spring slot; 19. motion slot; 20. sliding rod; 21. second spring; 22. cavity; 23. ejector pin; 24. triangle block; 25. reset plate; 26. second reset spring. DETAILED DESCRIPTION
[0021] This section will describe in detail the specific embodiments of the utility model. The preferred embodiments of the utility model are shown in the accompanying drawings. The purpose of the accompanying drawings is to supplement the description of the text part of the specification with graphics, so that people can intuitively and vividly understand each technical feature and the overall technical solution of the utility model, but it cannot be understood as a limitation on the protection scope of the utility model.
[0022] In the description of the present invention, it should be understood that descriptions involving orientation, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.
[0023] In the description of the present utility model, "greater than", "less than", "exceed" etc. are understood as not including the number itself, and "above", "below", "within" etc. are understood as including the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.
[0024] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.
[0025] See also Figure 1-4 The utility model provides a technical solution: a transistor pin detection device, comprising a test box 1, a transistor placement groove 2 is provided on the upper surface of the test box 1, a pin placement groove 3 is provided on the upper surface of the test box 1, the pin placement groove 3 is communicated with the transistor placement groove 2, the front side of the pin placement groove 3 extends out of the front side surface of the test box 1, a reset groove 4 is provided on the bottom wall of the pin placement groove 3, the interior of the test box 1 is set to be hollow, the bottom wall of the reset groove 4 is provided with a sliding groove 5 communicated with the interior of the test box 1, the interior of the reset groove 4 is slidably connected with a metal connection block 6, and the lower surface of the metal connection block 6 is fixedly connected with a metal plate 7;
[0026] A test device 8 is arranged inside the test box 1. A second sliding groove 9 communicating with the interior of the test box 1 is provided on the front side surface. A sliding plate 10 is slidably connected inside the second sliding groove 9. The rear side surface of the sliding plate 10 extends into the interior of the test box 1. A test board 11 is fixedly connected to the rear side surface of the sliding plate 10. The test board 11 is electrically connected to the test device. An adjustment structure is arranged on the sliding plate 10. When testing, the transistor is placed inside the transistor placement groove 2, and the pin is allowed to enter the pin placement groove 3. When the pin enters, the metal connection block 6 is squeezed, thereby causing the metal connection block 6 to move, and the metal connection After the connecting block 6 moves, it drives the metal plate 7 to move. When the placement is completed for testing, the sliding plate 10 is unlocked by pulling the adjusting structure, and then the sliding plate 10 drives the test plate 11 to move. After the test plate 11 moves, it contacts the metal plate 7, and then the pins are tested by the test device 8. Through the above structure, when testing, the transistor can be placed in the groove for testing. While protecting the transistor, the transistor will not move during the test. At the same time, the pins can be indirectly tested through the built-in test device 8 and the test board 11, and there is no need to carry a multimeter separately, which indirectly improves the test efficiency.
[0027] Further, the adjustment structure includes a second sliding plate 12, the second sliding plate 12 is fixedly connected to the front surface of the sliding plate 10, the second sliding plate 12 is slidably connected to the front surface of the test box 1, the front surface of the second sliding plate 12 is fixedly connected to a spring 13, the front end of the spring 13 is fixedly connected to a control plate 14, the rear surface of the control plate 14 is fixedly connected to a limiting rod 15, the rear end of the limiting rod 15 slides through the rear surface of the second sliding plate 12 and contacts the front surface of the test box 1, the bottom wall of the reset groove 4 is fixedly connected to a reset spring 16, the upper end of the reset spring 16 is fixedly connected to the lower surface of the metal connecting block 6, and the internal sliding connection of the transistor placement groove 2 A protective plate 17 is provided, a spring groove 18 is provided on the bottom wall of the transistor placement groove 2, a movement groove 19 is provided on the bottom wall of the spring groove 18, a sliding rod 20 is fixedly connected to the lower surface of the protective plate 17, the sliding rod 20 is slidably connected to the movement groove 19, a second spring 21 is fixedly connected to the lower surface of the protective plate 17, the lower end of the second spring 21 is fixedly connected to the bottom wall of the spring groove 18, a cavity 22 is provided inside the test box 1, a ejector pin 23 is fixedly connected to the lower surface of the protective plate 17, the lower end of the ejector pin 23 slides through the inside of the cavity 22, a triangular block 24 is slidably connected to the inside of the cavity 22, the right side surface of the triangular block 24 slides through the right side surface of the test box 1, and the triangular block 24 is connected to the inside of the cavity 22. The outer surface of the block 24 is sleeved with a reset plate 25, and the right side surface of the reset plate 25 is fixedly connected with a second reset spring 26. The left end of the second reset spring 26 is fixedly connected to the test box 1. When the pin squeezes the metal connection block 6, the reset spring 16 will be compressed. During the test, by pulling the control plate 14, the control plate 14 will stretch the spring 13 after moving, and drive the limit rod 15 to move. After the limit rod 15 moves, it stops contacting with the test box 1, thereby completing the unlocking. After the movement is completed, the reset can be completed by loosening the control plate 14 under the action of the spring 13. At the same time, when placing the transistor, the protection plate 17 will be used to compress the second spring 21 to give the transistor a certain range of motion to avoid The transistor is damaged by the force. After the test is completed, the reset plate 25 can be pulled, and the reset plate 25 will synchronously stretch the second reset spring 26. At the same time, the reset plate 25 will also synchronously pull the triangular block 24. After the triangular block 24 moves, the inclined surface contacts the ejector pin 23, and the ejector pin 23 moves upward, thereby driving the protection plate 17 to rise, thereby ejecting the transistor. Then, the reset plate 25 is released and the second reset spring 26 can be used to complete the reset. Through the above structure, not only can the staff complete the test of the transistor pins more easily and conveniently, but also can pull the reset plate 25 when taking out the transistor, which is convenient and will not cause damage to the transistor itself.
[0028] Working principle: When testing, the transistor is placed inside the transistor placement slot 2, and the pin is allowed to enter the pin placement slot 3. When the pin enters, the metal connection block 6 is squeezed, so that the metal connection block 6 moves. After the metal connection block 6 moves, it drives the metal plate 7 to move. When the placement is completed and the test is carried out, the sliding plate 10 is unlocked by pulling the adjustment structure, and then the sliding plate 10 drives the test plate 11 to move. After the test plate 11 moves, it contacts the metal plate 7, and then the test device 8 is used to test the pin. When the pin squeezes the metal connection block 6, the reset spring 16 is compressed. During the test, by pulling the control plate 14, the control plate 14 will stretch the spring 13 after moving, and drive the limit rod 1 5 moves, and the limit rod 15 stops contacting with the test box 1 after moving, thereby completing unlocking. After the movement is completed, the control plate 14 can be released to complete the reset under the action of the spring 13. At the same time, when placing the transistor, the protection plate 17 will be used to compress the second spring 21 to give the transistor a certain range of movement to avoid damage to the transistor caused by force. After the test is completed, the reset plate 25 can be pulled, and the reset plate 25 will synchronously stretch the second reset spring 26. At the same time, the reset plate 25 will also synchronously pull the triangular block 24. After the triangular block 24 moves, the inclined surface contacts the ejector pin 23, and the ejector pin 23 moves upward, thereby driving the protection plate 17 to rise, thereby ejecting the transistor, and then releasing the reset plate 25 to complete the reset using the second reset spring 26.
[0029] The embodiments of the present invention are described in detail above in conjunction with the accompanying drawings, but the present invention is not limited to the above embodiments. Various changes can be made within the knowledge scope of ordinary technicians in the technical field without departing from the purpose of the present invention.
Claims
1. A transistor pin detection device, comprising a test box (1), characterized in that: The upper surface of the test box (1) is provided with a transistor placement groove (2), the upper surface of the test box (1) is provided with a pin placement groove (3), the pin placement groove (3) is communicated with the transistor placement groove (2), the front side of the pin placement groove (3) extends out of the front side surface of the test box (1), the bottom wall of the pin placement groove (3) is provided with a reset groove (4), the interior of the test box (1) is arranged to be hollow, the bottom wall of the reset groove (4) is provided with a sliding groove (5) communicated with the interior of the test box (1), the interior of the reset groove (4) is slidably connected with a metal connection block (6), and the lower surface of the metal connection block (6) is fixedly connected with a metal plate (7); A test device (8) is arranged inside the test box (1); a second sliding groove (9) communicating with the interior of the test box (1) is provided on the front side surface; a sliding plate (10) is slidably connected inside the second sliding groove (9); a rear side surface of the sliding plate (10) extends into the interior of the test box (1); a test board (11) is fixedly connected to the rear side surface of the sliding plate (10); the test board (11) is electrically connected to the test device; and an adjustment structure is arranged on the sliding plate (10).
2. A transistor pin detection device according to claim 1, characterized in that: The adjustment structure comprises a second sliding plate (12), the second sliding plate (12) is fixedly connected to the front surface of the sliding plate (10), the second sliding plate (12) is slidably connected to the front surface of the test box (1), the front surface of the second sliding plate (12) is fixedly connected to a spring (13), the front end of the spring (13) is fixedly connected to a control plate (14), the rear surface of the control plate (14) is fixedly connected to a limiting rod (15), the rear end of the limiting rod (15) slides through the rear surface of the second sliding plate (12) and contacts the front surface of the test box (1).
3. A transistor pin detection device according to claim 1, characterized in that: A reset spring (16) is fixedly connected to the bottom wall of the reset groove (4), the upper end of the reset spring (16) is fixedly connected to the lower surface of the metal connection block (6), and a protection plate (17) is slidably connected inside the transistor placement groove (2).
4. A transistor pin detection device according to claim 3, characterized in that: The bottom wall of the transistor placement slot (2) is provided with a spring slot (18), the bottom wall of the spring slot (18) is provided with a motion slot (19), the lower surface of the protection plate (17) is fixedly connected with a sliding rod (20), and the sliding rod (20) is slidably connected to the motion slot (19).
5. A transistor pin detection device according to claim 4, characterized in that: A second spring (21) is fixedly connected to the lower surface of the protection plate (17), and the lower end of the second spring (21) is fixedly connected to the bottom wall of the spring groove (18). A cavity (22) is provided inside the test box (1), and a ejector pin (23) is fixedly connected to the lower surface of the protection plate (17).
6. A transistor pin detection device according to claim 5, characterized in that: The lower end of the ejector pin (23) slides through the interior of the cavity (22), the interior of the cavity (22) is slidably connected to a triangular block (24), the right side surface of the triangular block (24) slides through the right side surface of the test box (1), the outer surface of the triangular block (24) is sleeved with a reset plate (25), the right side surface of the reset plate (25) is fixedly connected to a second reset spring (26), and the left end of the second reset spring (26) is fixedly connected to the test box (1).