Incubator internal exchange device for temperature cycle test

Abstract

The utility model relates to the technical field of temperature cycle test equipment, and discloses an incubator internal exchange device for a temperature cycle test, which comprises a double-bin incubator, and a fixed partition plate is arranged in the double-bin incubator and is used for dividing the inner part of the double-bin incubator into a high-temperature bin and a low-temperature bin; a fixed partition plate is arranged in the high-temperature bin or the low-temperature bin, a through hole is formed in the fixed partition plate, a movable rod is movably installed on the inner wall of one side of the double-bin type incubator, and a movable partition plate is fixed to the outer portion of the movable rod. The movable partition plate is driven to turn over in the through hole, so that the effect that a sample is regularly and continuously placed in a high-temperature and low-temperature environment is achieved, the test is carried out, the test purpose is finally achieved, the sample does not need to be manually adjusted, the test efficiency and accuracy are guaranteed, and the safety of testers is guaranteed.

Description

Technical Field

[0001] The utility model relates to the technical field of temperature cycle test equipment, in particular to an internal replacement device of a temperature box used for temperature cycle test. Background Art

[0002] The double chamber temperature chamber is suitable for high temperature and low temperature reliability tests of industrial products. It can be used to test the performance indicators of parts and materials of related products such as electronics and electrical engineering, automobiles and motorcycles, aerospace, ships and weapons, colleges and universities, scientific research institutions, etc. under high temperature and low temperature (alternating) cycle changes.

[0003] At present, based on the temperature cycle test in the standard ISO_16750-4:2023, there are generally two test methods: one is to set the upper and lower chambers to high and low temperatures respectively, and manually adjust the samples to different temperatures; the other is to place the samples in one chamber and set high and low temperatures to change alternately. The disadvantages of the first test method are: the untimely time interval between high and low temperatures leads to inaccurate tests, and there are safety risks in manual operation of direct contact with high and low temperatures; the disadvantage of the second test method is: the temperature change rate of the incubator is too high, which makes important parts in the incubator easy to be damaged. For this reason, an internal replacement device for the incubator for temperature cycle testing is proposed, which is placed inside a double-chamber incubator. Utility Model Content

[0004] The utility model aims to solve the shortcomings in the prior art and proposes an internal replacement device for a temperature box used for a temperature cycle test.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A device for replacing an incubator internally for a temperature cycle test comprises a double-chamber incubator, wherein a fixed partition is arranged inside the double-chamber incubator for dividing the interior of the double-chamber incubator into a high-temperature chamber and a low-temperature chamber; a through hole is opened on the fixed partition, a movable rod is movably mounted on an inner wall of one side of the double-chamber incubator, a movable partition is fixed to the outside of the movable rod, and the outer diameter of the movable partition is matched with the opening inner diameter of the through hole; an electric control box is installed on the outer wall of the double-chamber incubator, and a driving motor and a timer are installed inside the electric control box; sample fixing mechanisms are arranged on both sides of the movable partition.

[0007] As a further solution of the utility model: a movable door is movably provided on one side of the double-chamber incubator.

[0008] As a further solution of the utility model: the fixed partition and the movable partition are located in the middle position inside the double-chamber incubator.

[0009] As a further solution of the utility model: the movable rod is arranged through the middle position of the movable partition.

[0010] As a further solution of the utility model: the inner wall of the through hole and the side of the movable partition are both provided with grooves, and the inner wall of the groove is provided with a resistance surface.

[0011] As a further solution of the utility model: the sample fixing mechanism includes a sample placement groove installed on the side of the movable partition, the inner wall of the sample placement groove is installed with a telescopic component, and one end of the piston rod of the telescopic component is installed with a clamping component.

[0012] As a further solution of the present invention: the driving motor and the timer are electrically connected.

[0013] The beneficial effects of the utility model are as follows: when in use, the timer monitors the length of time the sample is placed in the high-temperature chamber or the low-temperature chamber, and can drive the movable rod to rotate regularly by driving the motor, driving the movable partition to flip in the through hole, thereby achieving the effect of timing the sample and continuously placing it in a high and low temperature environment, and then conducting tests, and finally achieving the test purpose, without the need to manually adjust the sample, thereby ensuring the test efficiency and accuracy, and protecting the safety of the test personnel. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a front structural cross-sectional view of a temperature chamber internal replacement device for temperature cycle testing proposed by the utility model;

[0015] Figure 2 This is a three-dimensional structural schematic diagram of a temperature chamber internal replacement device for temperature cycle testing proposed by the utility model;

[0016] Figure 3 This is a top view of the structure of a fixed partition and a movable partition of an internal exchange device of a temperature box for a temperature cycle test proposed by the utility model;

[0017] Figure 4 This is a side structural cross-sectional view of a fixed partition and a movable partition of an internal exchange device of a temperature chamber for a temperature cycle test proposed by the utility model;

[0018] Figure 5 The utility model is a cross-sectional view of the sample fixing mechanism structure of the internal exchange device of the temperature box for temperature cycle test.

[0019] In the figure: 1-double-chamber incubator, 2-sample fixing mechanism, 21-sample placement slot, 22-telescopic component, 23-clamping component, 3-movable rod, 4-movable partition, 5-drive motor, 6-electric control box, 7-timer, 8-fixed partition, 9-groove, 10-movable door, 11-high temperature chamber, 12-low temperature chamber, 13-through hole. DETAILED DESCRIPTION

[0020] The technical solution of this patent is further described in detail below in conjunction with specific implementation methods.

[0021] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0022] Reference Figure 1-5 , a temperature chamber internal replacement device for temperature cycle test, comprising a double-chamber incubator 1, wherein the double-chamber incubator 1 is provided with a fixed partition 8 inside, for dividing the inside of the double-chamber incubator 1 into a high-temperature chamber 11 and a low-temperature chamber 12; a through hole 13 is opened on the fixed partition 8, a movable rod 3 is movably installed on the inner wall of one side of the double-chamber incubator 1, and a movable partition 4 is fixed to the outside of the movable rod 3, and the outer diameter of the movable partition 4 is adapted to the opening inner diameter of the through hole 13; an electric control box 6 is installed on the outer wall of the double-chamber incubator 1, and a driving motor 5 and a timer 7 are installed inside the electric control box 6; sample fixing mechanisms 2 are arranged on both sides of the movable partition 4.

[0023] When in use, the fixed partition 8 and the movable partition 4 separate the space between the high-temperature chamber 11 and the low-temperature chamber 12. The sample to be tested is fixed on the movable partition 4 through the sample fixing mechanism 2. The timer 7 monitors the length of time the sample is placed in the high-temperature chamber 11 or the low-temperature chamber 12. The movable rod 3 can be driven by the driving motor 5 to rotate regularly, driving the movable partition 4 to flip in the through hole 13, thereby achieving the effect of timing the sample and continuously placing it in a high and low temperature environment, and then conducting tests, and finally achieving the test purpose.

[0024] As a preferred embodiment of the present utility model, the high temperature chamber 11 is located on the top of the fixed partition 8 , and the low temperature chamber 12 is located on the bottom of the fixed partition 8 .

[0025] As a preferred embodiment of the present utility model, the through hole 13 and the movable partition plate 4 are both circular structures, rectangular structures, etc. In this embodiment, the preferred through hole 13 and the movable partition plate 4 are both circular structures.

[0026] As a preferred embodiment of the utility model, a movable door 10 is movably provided on one side of the double-chamber incubator 1, and the movable door 10 can be opened to take out the sample.

[0027] As a preferred embodiment of the present invention, the fixed partition 8 and the movable partition 4 are located in the middle of the double-chamber incubator 1 .

[0028] As a preferred embodiment of the utility model, the movable rod 3 is arranged through the middle position of the movable partition 4 to ensure that when the movable partition 4 is flipped with the movable rod 3, the side of the movable partition 4 can always fit with the opening of the through hole 13.

[0029] As a preferred embodiment of the utility model, the inner wall of the through hole 13 and the side of the movable partition 4 are both provided with a groove 9, and the inner wall of the groove 9 is provided with a resistance surface to ensure that the side of the movable partition 4 can be effectively closed with the inner wall of the through hole 13, avoiding the mutual flow of air between the high-temperature chamber 11 and the low-temperature chamber 12 during the test, thereby ensuring the effect of the high and low temperature test.

[0030] As a preferred embodiment of the present utility model, the vertical cross-section of the groove 9 is a V-shaped structure.

[0031] As a preferred embodiment of the present invention, the resistance surface is made of flexible material.

[0032] As a preferred embodiment of the present invention, the resistance surface is made of rubber, silicone or other materials. In this embodiment, the preferred resistance surface is made of rubber.

[0033] As a preferred embodiment of the utility model, the sample fixing mechanism 2 includes a sample placement groove 21 installed on the side of the movable partition 4, and a telescopic component 22 is installed on the inner wall of the sample placement groove 21. A clamping component 23 is installed at one end of the piston rod of the telescopic component 22. When the sample is placed in the sample placement groove 21, the clamping component 23 can be pushed to move horizontally by the telescopic component 22, and the sample is clamped and fixed by the clamping component 23 to ensure that the sample is always fixed on the side of the movable partition 4 during the flipping process of the movable partition 4.

[0034] As a preferred embodiment of the present utility model, the telescopic component 22 is an electric telescopic rod, a hydraulic cylinder, etc. In this embodiment, the preferred telescopic component 22 is an electric telescopic rod.

[0035] As a preferred embodiment of the present utility model, the driving motor 5 and the timer 7 are electrically connected.

[0036] When in use, the fixed partition 8 and the movable partition 4 separate the space between the high-temperature chamber 11 and the low-temperature chamber 12, and the sample is placed in the sample placement groove 21. The clamping component 23 can be pushed to move horizontally by the telescopic component 22, and the sample is clamped and fixed by the clamping component 23. The timer 7 monitors the length of time the sample is placed in the high-temperature chamber 11 or the low-temperature chamber 12. The movable rod 3 can be driven to rotate regularly by the driving motor 5, driving the movable partition 4 to flip in the through hole 13, thereby achieving the effect of timing the sample and continuously placing it in a high and low temperature environment, and then conducting experiments. Finally, the test purpose is achieved without manually adjusting the sample, ensuring the test efficiency and accuracy, and ensuring the safety of the test personnel.

[0037] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A temperature chamber internal replacement device for temperature cycle testing, comprising a double chamber temperature chamber (1), characterized in that: The interior of the double-chamber incubator (1) is provided with a fixed partition (8) for dividing the interior of the double-chamber incubator (1) into a high-temperature chamber (11) and a low-temperature chamber (12); The fixed partition (8) is provided with a through hole (13); a movable rod (3) is movably mounted on the inner wall of one side of the double-chamber type incubator (1); a movable partition (4) is fixed to the outside of the movable rod (3); and the outer diameter of the movable partition (4) is matched to the inner diameter of the opening of the through hole (13); An electric control box (6) is installed on the outer wall of the double-chamber temperature box (1), and a driving motor (5) and a timer (7) are installed inside the electric control box (6); Sample fixing mechanisms (2) are provided on both sides of the movable partition (4).

2. The incubator internal replacement device for temperature cycle test according to claim 1, characterized in that: A movable door (10) is movably provided on one side of the double-chamber incubator (1).

3. The incubator internal replacement device for temperature cycle test according to claim 1, characterized in that: The fixed partition (8) and the movable partition (4) are located in the middle of the double-chamber incubator (1).

4. The incubator internal replacement device for temperature cycle test according to claim 1, characterized in that: The movable rod (3) is arranged through the middle position of the movable partition plate (4).

5. The incubator internal replacement device for temperature cycle test according to claim 1, characterized in that: The inner wall of the through hole (13) and the side edge of the movable partition (4) are both provided with a groove (9), and the inner wall of the groove (9) is provided with a resistance surface.

6. A temperature chamber internal replacement device for temperature cycle test according to any one of claims 1 to 5, characterized in that: The sample fixing mechanism (2) comprises a sample placement groove (21) installed on the side of the movable partition (4), a telescopic component (22) is installed on the inner wall of the sample placement groove (21), and a clamping component (23) is installed on one end of the piston rod of the telescopic component (22).

7. The incubator internal replacement device for temperature cycle test according to claim 1, characterized in that: The driving motor (5) and the timer (7) are electrically connected.

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