A micrometer spiral phase precision calibration device

By designing a micrometer spiral phase precision calibration device, using modular design and separate assembly and adjustment methods, the problem of difficult phase pre-accuracy in three-dimensional measurement systems is solved, and high-precision phase registration is achieved at micron level, improving efficiency and consistency.

CN222718905UActive Publication Date: 2025-04-04WISESOFT CO LTD
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Patent Information

Application Number
CN202421406220.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-06-19
Publication Date
2025-04-04
Estimated Expiration
2034-06-19

AI Technical Summary

Technical Problem

In the existing three-dimensional measurement system, it is difficult to achieve accurate quantization debugging between N projection lenses, resulting in a long phase registration time and requires professional operation.

Method used

A micro-measuring screw phase precision calibration device is designed, adopting modular design and separate assembly and adjustment methods to achieve quantitative, high-precision and efficient phase pre-registration through clamping structure, micro-measuring screw and locking mechanism.

Benefits of technology

It realizes micron-level high-precision quantization adjustment capabilities, significantly shortens phase registration time, reduces dependence on professionals, and improves product consistency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the field of three-dimensional measurement, in particular to a micrometer spiral phase precision calibration device. The utility model designs a micrometer spiral phase precision calibration device by adopting modular design and separate adjustment method. The utility model installs the lighting lamp through the clamping structure and locks the debugged object; then the micrometer screw is rotated to control the ejector pin to push the lens sliding seat in the debugged object to slide forward, and when it reaches the preset phase shift position 2π / N, the locking piece on the locking mechanism is used to lock the lens seat through the internal ejection ejection spring to complete the debugging work and realize quantitative, high-precision and efficient phase pre-alignment.
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Description

Technical Field

[0001] The utility model relates to the field of three-dimensional measurement, in particular to a micrometer spiral phase precision calibration device. Background Art

[0002] Due to its high recognition rate and high anti-counterfeiting performance, 3D face recognition has very broad application prospects in public security, smart campuses, scientific research and teaching, and is one of the important core technologies for building intelligent public service platforms, smart cities and safe cities. The premise for the rapid development of 3D face recognition is to have a high-precision 3D face database or to be able to quickly collect three-dimensional face data on site. Therefore, the development of high-speed and high-precision 3D face acquisition systems has become a hot research direction. In the field of three-dimensional measurement, mechanical phase-shift fringe projection technology, which is different from DLP projection, came into being.

[0003] At present, the Chinese patent application with application number CN202311533535.0 discloses a three-dimensional measurement system and a three-dimensional measurement method based on translational and online switchable phase-shift fringe projection. The most critical problem in this method is to solve the phase pre-alignment problem between N projection lenses. The phase pre-alignment method used in this patent is to "adjust the lateral position of the projection lens and the integrated grating sheet, and adjust the phase difference between different sinusoidal phase-shift fringe images to 2π / N". This manual adjustment of the lens is random, and precise quantitative debugging is impossible, and it is difficult to achieve product consistency. In addition, since there is no tooling or fixture specifically for installation and adjustment, manual alignment is difficult, resulting in a long phase alignment time (50 minutes), and professional operation is required.

[0004] Therefore, a micrometer spiral phase precision calibration technology is needed today, which can achieve micron-level high-precision quantitative adjustment capability, and effectively solve the above-mentioned problem of manual alignment difficulties, thereby realizing rapid phase alignment. Utility Model Content

[0005] The purpose of the utility model is to overcome the above-mentioned deficiencies in the prior art and to provide a micrometer screw type phase precision calibration device.

[0006] In order to achieve the above-mentioned utility model purpose, the utility model provides the following technical solutions:

[0007] A micrometer screw type phase precision calibration device is used to calibrate an object to be debugged, wherein the object to be debugged is a phase shift fringe projector with n lenses, where n≥3, and comprises a clamping structure, a micrometer screw and a locking mechanism; specifically:

[0008] The clamping structure comprises a groove for mounting the lighting lamp and a clamping part that is clamped to each other, and the clamping part is used to lock the debugged object;

[0009] The locking mechanism is provided with n groups of locking units arranged side by side; the locking units are used to fasten the debugged object;

[0010] The micrometer screw includes n top-cut micrometers arranged side by side, and the top-cut micrometers are arranged corresponding to the locking unit.

[0011] As a preferred solution of the utility model, the locking unit includes a locking piece and an ejection mechanism;

[0012] The locking piece is hinged to the ejection mechanism; the ejection mechanism and the corresponding micrometer screw are respectively located at the front and rear ends of the debugged object and are coaxial.

[0013] As a preferred solution of the utility model, the ejection mechanism includes an ejector pin and an ejector spring;

[0014] The ejector pin is hinged to the locking plate, and the ejector spring is used to feed back elastic force to the ejector pin.

[0015] As a preferred solution of the utility model, the lens of the debugged object is installed in a card slot.

[0016] As a preferred solution of the utility model, the resolution of the micrometer screw is not less than 10um.

[0017] As a preferred solution of the present invention, the calibration device is made of aluminum alloy material.

[0018] Compared with the prior art, the utility model has the following beneficial effects:

[0019] The utility model designs a micrometer screw type phase precision calibration device by adopting modular design and separate adjustment mode. The utility model installs the lighting lamp through the clamping structure and locks the debugged object; then controls the ejector pin by rotating the micrometer screw to push the lens sliding seat in the debugged object to slide forward, and when it reaches the preset phase shift position 2π / N, the locking piece on the locking mechanism is used to lock the lens seat through the ejected ejector spring inside to complete the debugging work and realize quantitative, high-precision and efficient phase pre-alignment. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic diagram of the structure separation of a micrometer screw type phase precision calibration device according to an embodiment of the utility model;

[0021] Figure 2 It is a schematic diagram of a micrometer screw type phase precision calibration device according to an embodiment of the utility model;

[0022] Figure 3It is a schematic diagram of the phase calibration principle (in the AB direction) in a micrometer screw type phase precision calibration device according to an embodiment of the utility model;

[0023] Figure numerals: 100 - clamping structure, 101 - lighting lamp; 200 - micrometer screw; 300 - locking mechanism, 301 - locking plate, 302 - ejector pin, 303 - ejector spring, 304 - ejector mechanism; 400 - object to be debugged, 401 - lens base. DETAILED DESCRIPTION

[0024] The present invention is further described in detail below in combination with test examples and specific implementation methods. However, this should not be understood as the scope of the above subject matter of the present invention being limited to the following embodiments, and all technologies realized based on the content of the present invention belong to the scope of the present invention.

[0025] Example

[0026] A micrometer spiral phase precision calibration device is used to calibrate an object 400 to be debugged. The object 400 to be debugged is a phase-shift fringe projector with n lenses, n≥2. In this embodiment, the number of lenses n=3 is taken as an example.

[0027] like Figure 1 As shown, the calibration device includes a clamping structure 100, a micrometer screw 200 and a locking mechanism 300; specifically:

[0028] The clamping structure 100 includes a groove for mounting the lighting lamp 101 and clamping parts that are mutually clamped, and the clamping parts are used to lock the debugged object 400 (the lens is installed in a slot, and the slot includes but is not limited to a dovetail slot or a T-slot).

[0029] The locking mechanism 300 is provided with n groups of locking units arranged side by side.

[0030] The locking unit includes a locking piece 301 and an ejection mechanism 304. The locking piece 301 is hinged to the ejection mechanism 304; the ejection mechanism 304 and the corresponding micrometer screw 200 are respectively located at the front and rear ends of the debugged object 400 and are coaxial.

[0031] The ejection mechanism 304 includes an ejection pin 302 and an ejection spring 303. The ejection pin 302 is hinged to the locking piece 301, and the ejection spring 303 is used to give elastic feedback to the ejection pin 302.

[0032] The micrometer screw 200 includes n top-cut micrometers arranged side by side. The top-cut micrometers are arranged corresponding to the locking units and are connected through the top pin 302.

[0033] Preferably, the calibration device is made of aluminum alloy, which is light and easy to process.

[0034] The assembled calibration device is as follows Figure 2 As shown, the cross-sectional diagram is Figure 3 As shown, phase alignment is performed bidirectionally in the AB direction. In the A->B direction, by rotating the micrometer screw 200 at the A end, the lens base 401 is pushed to move in the A->B direction. The locking mechanism 300 at the B end is equipped with a top spring 303 for feeding back elastic force to the ejector pin 302 to automatically lock the position reached by the lens. The top spring 303 and the ejector pin 302 together constitute an ejection mechanism 304. The ejection mechanism 304 and the micrometer screw 200 are respectively located on the front and rear end surfaces of the lens base 401 and are collinear. When the micrometer screw 200 rotates forward, the ejection mechanism 304 gives the lens base 401 elastic positioning. Conversely, the principle along B->A is the same. During the adjustment process, the forces at both ends are kept balanced and the movement is stable.

[0035] Based on the debugging fixture and fixture of the top-cut micrometer, the minimum resolution of the micrometer screw 200 used in the design is 10um. Therefore, during the debugging process, the design can realize micron-level quantitative debugging during the phase pre-alignment process, and with effective visualization software, quantitative, high-precision and efficient phase pre-alignment can be achieved.

[0036] After the phase pre-alignment is completed, the debugging device is separated, the object to be debugged 400 and the illuminating lamp 101 are removed and the two are installed correspondingly, and then the device can be installed in the three-dimensional imaging system as a phase-shifted structured light projection device.

[0037] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A micrometer spiral phase precision calibration device, used for calibrating an object to be calibrated (400), wherein the object to be calibrated (400) is a phase-shift fringe projector with n lenses, n≥3, characterized in that: It comprises a clamping structure (100), a micrometer screw (200) and a locking mechanism (300); specifically: The clamping structure (100) comprises a groove for mounting a lighting lamp (101) and clamping parts that are clamped to each other, and the clamping parts are used to lock the debugged object (400); The locking mechanism (300) is provided with n groups of locking units arranged side by side; the locking units are used to fasten the debugged object (400); The micrometer screw (200) comprises n top-cut micrometers arranged side by side, and the top-cut micrometers are arranged corresponding to the locking units.

2. The micrometer screw type phase precision calibration device according to claim 1, characterized in that: The locking unit comprises a locking sheet (301) and an ejection mechanism (304); The locking piece (301) is hinged to the ejection mechanism (304); the ejection mechanism (304) and the corresponding micrometer screw (200) are respectively located at the front and rear ends of the debugged object (400) and are coaxial.

3. The micrometer screw type phase precision calibration device according to claim 2, characterized in that: The ejection mechanism (304) comprises an ejection pin (302) and an ejection spring (303); The ejector pin (302) is hinged to the locking plate (301), and the ejector spring (303) is used to feed back elastic force to the ejector pin (302).

4. The micrometer screw type phase precision calibration device according to claim 1, characterized in that: The lens of the debugged object (400) is installed in a card slot.

5. The micrometer screw type phase precision calibration device according to claim 1, characterized in that: The resolution of the micrometer screw (200) is not less than 10 um.

6. The micrometer screw type phase precision calibration device according to claim 1, characterized in that: The calibration device is made of aluminum alloy.

Citation Information

Patent Citations

  • Three-dimensional reconstruction system, phase calculation method and three-dimensional reconstruction method

    CN117274352A