Image acquisition system

Abstract

The present disclosure provides an image acquisition system, comprising: a first module and a second module; the first module comprises: a first laser, the first laser can emit laser; a first galvanometer, the first galvanometer can deflect around a first axis, and the first galvanometer can project the laser emitted by the first laser onto the surface of a target object; a first camera, the first camera can capture the reflected light of the laser projected by the first galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image; the second module comprises: a second laser, the second laser can emit laser; a second galvanometer, the second galvanometer can deflect around a second axis, and the second galvanometer can project the laser emitted by the second laser onto the surface of the target object; and a second camera, the second camera can capture the reflected light of the laser projected by the second galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image.

Description

Technical Field

[0001] The present disclosure relates to the technical field of laser cameras, and in particular to an image acquisition system. Background Art

[0002] The principle of existing 3D structured light cameras is basically to project structured light stripes onto the surface of the scene to modulate the spatial height information, and then reconstruct the spatial surface through the principles of stripe decoding and triangulation.

[0003] The projection equipment is generally a DLP projector or a laser galvanometer. DLP projectors are generally wide-spectrum light sources and are seriously affected by ambient light. Although DLP projectors can solve the problem to a certain extent by adding stripe projections in multiple directions, they inevitably increase the image acquisition time by at least twice, and the serial image acquisition time is long.

[0004] 3D cameras that use laser galvanometers as projection devices can filter ambient light by adding a bandpass filter on the sensor to achieve an anti-interference effect. However, a single laser galvanometer can only project stripes in a single direction. When a curved surface appears in a specific direction in the scene, mirror reflection will inevitably occur, resulting in loss of details at the reflected part. For example, a smooth curved surface that is curved along the laser projection direction is prone to glare under the illumination of light from a single direction, and image details are lost at the glare. Summary of the invention

[0005] The present disclosure provides an image acquisition system, comprising: a first module and a second module;

[0006] The first module includes:

[0007] a first laser capable of emitting laser light;

[0008] a first galvanometer, wherein the first galvanometer can deflect around a first axis, and the first galvanometer can project the laser light emitted by the first laser onto a surface of a target object;

[0009] a first camera, wherein the first camera can collect reflected light of the laser projected by the first galvanometer onto the surface of the target object and modulated by the surface of the target object to obtain a modulated image;

[0010] The second module comprises:

[0011] a second laser capable of emitting laser light;

[0012] a second galvanometer, wherein the second galvanometer can deflect about a second axis, and the second galvanometer can project the laser light emitted by the second laser onto the surface of the target object;

[0013] a second camera, wherein the second camera can collect reflected light of the laser projected by the second galvanometer onto the surface of the target object and modulated by the surface of the target object to obtain a modulated image;

[0014] The first axis and the second axis are perpendicular to each other, the optical axis of the first laser is perpendicular to the first axis, and the optical axis of the second laser is perpendicular to the second axis.

[0015] According to the image acquisition system of at least one embodiment of the present disclosure, the lasers projected onto the surface of the target object by the first galvanometer and the second galvanometer both form structured light stripes.

[0016] According to the image acquisition system of at least one embodiment of the present disclosure, the first module further includes:

[0017] a third camera, wherein the third camera and the first camera are arranged on both sides of the first galvanometer, so that the first camera and the third camera can jointly collect the reflected light of the laser projected by the first galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image;

[0018] The second module also includes:

[0019] A fourth camera, wherein the fourth camera and the second camera are arranged on both sides of the second galvanometer, so that the second camera and the fourth camera can jointly collect the reflected light of the laser projected by the second galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image.

[0020] According to the image acquisition system of at least one embodiment of the present disclosure, a first bandpass filter is disposed in front of the lens of the first camera, the first bandpass filter allows light in a first wavelength range to pass through, a second bandpass filter is disposed in front of the lens of the second camera, the second bandpass filter allows light in a second wavelength range to pass through, and the first wavelength range and the second wavelength range do not have an overlapping range;

[0021] The wavelength of the laser light emitted by the first laser is within the first wavelength range, and the wavelength of the laser light emitted by the second laser is within the second wavelength range.

[0022] According to the image acquisition system of at least one embodiment of the present disclosure, a first bandpass filter is disposed in front of the lens of the first camera and the lens of the third camera, the first bandpass filter allows light in a first wavelength range to pass through, a second bandpass filter is disposed in front of the lens of the second camera and the lens of the fourth camera, the second bandpass filter allows light in a second wavelength range to pass through, and the first wavelength range and the second wavelength range do not have an overlapping range;

[0023] The wavelength of the laser light emitted by the first laser is within the first wavelength range, and the wavelength of the laser light emitted by the second laser is within the second wavelength range.

[0024] According to the image acquisition system of at least one embodiment of the present disclosure, the first axis and the second axis are located in the same plane, and the first galvanometer mirror and the second galvanometer mirror have a spacing in the extension direction of the first axis or the second axis.

[0025] According to the image acquisition system of at least one embodiment of the present disclosure, the first axis and the second axis are not located in the same plane, and the first galvanometer mirror and the second galvanometer mirror are staggered in space.

[0026] According to the image acquisition system of at least one embodiment of the present disclosure, the first laser is fixedly connected to the first galvanometer, and the second laser is fixedly connected to the second galvanometer.

[0027] In the image acquisition system according to at least one embodiment of the present disclosure, the optical axis of the first laser is perpendicular to the optical axis of the second laser.

[0028] The image acquisition system according to at least one embodiment of the present disclosure further includes:

[0029] The first laser, the first galvanometer, the second laser and the second galvanometer are controlled by the control device, so that the first laser and the second laser emit laser synchronously, and the first galvanometer and the second galvanometer are deflected synchronously.

[0030] In the image acquisition system according to at least one embodiment of the present disclosure, the control device includes a programmable logic controller.

[0031] According to the image acquisition system of at least one embodiment of the present disclosure, the first laser and the second laser are the same laser, and the first galvanometer and the second galvanometer are the same galvanometer. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The accompanying drawings illustrate exemplary embodiments of the present disclosure and together with the description serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0033] Figures 1 to 4 It is a schematic diagram of the structure of the image acquisition system of some embodiments of the present disclosure.

[0034] Figures 5 to 8It is a schematic diagram of the structure of the image acquisition system of other embodiments of the present invention.

[0035] Fig. 9 The deflection angle range of a single galvanometer is shown as an example.

[0036] Fig.10 For Fig. 9 Schematic diagram of the laser scanning area shown from a vertical viewing angle.

[0037] Fig.11 A schematic diagram of the effective area S is shown.

[0038] Fig.12 It is a schematic diagram of the coordination of a single camera and a single galvanometer disclosed in the present invention.

[0039] Fig.13 is with Fig.12 The vertical viewing angle shows the camera FOV.

[0040] Fig.14 A three-dimensional schematic diagram of the field of view of four cameras and the scanning range of two galvanometers.

[0041] Fig.15 Schematic diagram of the overlap of the field of view of the four cameras and the scanning range of the two galvanometers. DETAILED DESCRIPTION

[0042] The present disclosure is further described in detail below in conjunction with the accompanying drawings and implementations. It is understood that the specific implementations described herein are only used to explain the relevant content, rather than to limit the present disclosure. It should also be noted that, for ease of description, only the parts related to the present disclosure are shown in the accompanying drawings.

[0043] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in the present disclosure can be combined with each other. The technical solution of the present disclosure will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0044] Unless otherwise specified, the exemplary embodiments / embodiments shown will be understood as providing exemplary features of various details of some ways in which the technical concept of the present disclosure can be implemented in practice. Therefore, unless otherwise specified, the features of the various embodiments / embodiments can be combined, separated, interchanged and / or rearranged without departing from the technical concept of the present disclosure.

[0045] The use of cross-hatching and / or shading in the accompanying drawings is generally used to make the boundaries between adjacent components clear. As such, unless otherwise specified, the presence or absence of cross-hatching or shading does not convey or indicate any preference or requirement for the specific materials, material properties, dimensions, proportions, commonalities between the components shown, and / or any other characteristics, attributes, properties, etc. of the components. In addition, in the accompanying drawings, the sizes and relative sizes of the components may be exaggerated for clarity and / or descriptive purposes. When the exemplary embodiments can be implemented differently, the specific process sequence can be performed in a different order than described. For example, two successively described processes can be performed substantially simultaneously or in an order opposite to the described order. In addition, the same figure numbers represent the same components.

[0046] When a component is referred to as being "on" or "over," "connected to," or "coupled to" another component, the component may be directly on, directly connected to, or directly coupled to the other component, or intervening components may be present. However, when a component is referred to as being "directly on," "directly connected to," or "directly coupled to" another component, there are no intervening components. For this purpose, the term "connected" may refer to a physical connection, an electrical connection, etc., with or without intervening components.

[0047] The terms used herein are for the purpose of describing specific embodiments, and are not intended to be restrictive. As used herein, unless the context clearly indicates otherwise, the singular forms "one (kind, person)" and "said (the)" are also intended to include plural forms. In addition, when the terms "comprise" and / or "include" and their variations are used in this specification, it is explained that there are stated features, integral bodies, steps, operations, parts, assemblies and / or their groups, but it is not excluded that there are or add one or more other features, integral bodies, steps, operations, parts, assemblies and / or their groups. It should also be noted that, as used herein, the terms "substantially", "approximately" and other similar terms are used as approximate terms and not as degree terms, so that they are used to explain the inherent deviations of the measured values, calculated values ​​and / or the values ​​provided that will be recognized by those of ordinary skill in the art.

[0048] The present invention provides a new image acquisition system. Figures 1 to 4 is a schematic diagram of the structure of an image acquisition system in some embodiments of the present disclosure, Figures 5 to 8 It is a schematic diagram of the structure of the image acquisition system of other embodiments of the present invention.

[0049] It should be noted that Figures 1 to 8The image acquisition system shown is used to explain in detail the structural configuration of a specific implementation mode of the image acquisition system of the present disclosure, and is not intended to limit the specific structural configuration of the image acquisition system of the present disclosure.

[0050] refer to Figures 1 to 8 , an image acquisition system 10 of an embodiment of the present disclosure includes: a first module and a second module;

[0051] The first module includes:

[0052] A first laser 101, the first laser 101 can emit laser light;

[0053] A first galvanometer 201, which can deflect around a first axis and project the laser light emitted by the first laser 101 onto a surface of a target object (a surface of an object to be imaged, not shown);

[0054] The first camera 301 can collect the reflected light of the laser projected by the first galvanometer 201 onto the surface of the target object and modulated by the surface of the target object to obtain a modulated image.

[0055] The second module includes:

[0056] A second laser 102, the second laser 102 is capable of emitting laser light;

[0057] A second galvanometer 202, the second galvanometer 202 can deflect around a second axis, and the second galvanometer can project the laser light emitted by the second laser 102 onto the surface of the target object (the surface of the object to be imaged);

[0058] The second camera 302 can collect the reflected light of the laser projected by the second galvanometer 202 onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image.

[0059] The first axis and the second axis are perpendicular to each other, the optical axis of the first laser 101 is perpendicular to the first axis, and the optical axis of the second laser 102 is perpendicular to the second axis.

[0060] In some embodiments of the present disclosure, the first camera 301 may be configured along a direction perpendicular to the first axis, and the second camera 302 may be configured along a direction perpendicular to the second axis.

[0061] Through the configuration of the above-mentioned dual modules, the present invention can simultaneously project lasers (structured light) in different laser scanning directions onto the surface of an object to be imaged (which may be various workpieces, boxes, etc. with surfaces). Different structured lights can be projected onto the surface of the target object via the first galvanometer 201 and the second galvanometer 202 to form structured light stripes (i.e., coded structured light stripes), thereby realizing the projection of structured light stripes in two directions, and then imaging the surface of the object to be imaged based on the structured light stripes in two directions, thereby shortening the projection time.

[0062] The present disclosure does not specifically limit the type and specific coding of structured light, all of which fall within the protection scope of the present disclosure.

[0063] The laser and galvanometer described in the present disclosure may adopt existing lasers and galvanometers.

[0064] In some embodiments of the present disclosure, the image acquisition system 10 of the present disclosure forms an image acquisition system with dual cameras, dual lasers and dual galvanometers.

[0065] In some other embodiments of the present disclosure, the first module of the image acquisition system 10 of the present disclosure further includes:

[0066] The third camera 303 and the first camera 301 are arranged on both sides of the first galvanometer 201, so that the first camera 301 and the third camera 303 can jointly collect the reflected light of the laser projected by the first galvanometer 201 to the surface of the target object after being modulated by the surface of the target object to obtain the modulated image.

[0067] The second module also includes:

[0068] The fourth camera 304 and the second camera 302 are arranged on both sides of the second galvanometer 202, so that the second camera 302 and the fourth camera 304 can jointly collect the reflected light of the laser projected by the second galvanometer 202 to the surface of the target object after being modulated by the surface of the target object to obtain a modulated image.

[0069] In some embodiments of the present disclosure, reference Figure 3 , Figure 5 and Figure 7 The first camera 301 and the third camera 303 can be arranged in a direction perpendicular to the first axis (i.e., the axis around which the first galvanometer 201 swings), and the second camera 302 and the fourth camera 304 can be arranged in a direction perpendicular to the second axis (i.e., the axis around which the second galvanometer 202 swings).

[0070] Depend on Figures 1 to 8 It can be seen that in some embodiments of the present disclosure, the image acquisition system 10 of the present disclosure forms an image acquisition system with four cameras, two lasers and two galvanometers.

[0071] Preferably, the rotation direction of the first galvanometer 201 and the rotation direction of the second galvanometer 202 of the present disclosure are arranged to be orthogonal.

[0072] In the present disclosure, preferably, the projection centers of the two modules are brought closer, so that the first galvanometer and the second galvanometer are closer while ensuring that the laser projection is not blocked.

[0073] According to some embodiments of the present disclosure, Figures 5 to 8 The first axis and the second axis described above are located in the same plane, and the first galvanometer 201 and the second galvanometer 202 have a spacing in the extension direction of the first axis or the second axis, which is equal to or substantially equal to the distance between the housings of the two lasers, so that the galvanometers of the two modules are closer. Figure 7 In the embodiment, the first galvanometer mirror 201 and the second galvanometer mirror 202 have a spacing in the extension direction of the first axis.

[0074] In other embodiments of the present disclosure, reference Figures 1 to 4 , the first axis and the second axis described above in the present disclosure are not located in the same plane, and the first galvanometer 201 and the second galvanometer 202 are staggered in space. Figure 3 and Figure 4 The first galvanometer 201 is located above the second galvanometer 202, and there is a spacing between the first galvanometer 201 and the second galvanometer 202 in the extension direction of the second axis and in the direction perpendicular to the second axis, so as to sacrifice a small part of the field of view height in exchange for a closer projection center.

[0075] Depend on Figure 4 and Figure 6 It can be seen that the first laser 101 is fixedly connected to the first galvanometer 201, the second laser 102 is fixedly connected to the second galvanometer 202, and the optical axis of the first laser 201 is perpendicular to the optical axis of the second laser 202, the optical axis of the first laser 201 is perpendicular to the first axis, and the optical axis of the second laser 202 is perpendicular to the second axis.

[0076] The first camera, the second camera, the third camera and the fourth camera used in the image acquisition system 10 of the present disclosure may all be 2D sensors.

[0077] In some embodiments of the present disclosure, the image acquisition system 10 is an image acquisition system with two cameras, two lasers and two galvanometers. Preferably, a first bandpass filter (not shown) is arranged in front of the lens of the first camera 301, and the first bandpass filter allows light in a first wavelength range to pass through. A second bandpass filter (not shown) is arranged in front of the lens of the second camera 302, and the second bandpass filter allows light in a second wavelength range to pass through. The first wavelength range and the second wavelength range do not have an overlapping range.

[0078] The wavelength of the laser light emitted by the first laser 101 is within a first wavelength range, and the wavelength of the laser light emitted by the second laser 102 is within a second wavelength range.

[0079] The first wavelength range may be red light wavelength, and the second wavelength range may be blue light wavelength.

[0080] The present disclosure configures the first band-pass filter and the second band-pass filter to enable one group of laser galvanometer modules to emit light of a first wavelength, such as red light, and a band-pass filter corresponding to the corresponding light wavelength is used in front of the lens of a 2D sensor (such as a first camera) placed along the optical axis of the red light laser to filter out interference from other light sources; another group of laser galvanometer modules to emit light of a second wavelength (different from the first wavelength), such as blue light, and similarly, a band-pass filter corresponding to the corresponding light wavelength is used in front of the lens of a 2D sensor (such as a second camera) placed along the optical axis of the blue light laser to filter out interference from other light sources.

[0081] In some other embodiments of the present disclosure, the image acquisition system 10 is a four-camera, dual-laser, dual-galvanometer image acquisition system. Preferably, a first bandpass filter is disposed in front of the lens of the first camera 301 and in front of the lens of the third camera 303, and the first bandpass filter allows light in a first wavelength range to pass through. A second bandpass filter is disposed in front of the lens of the second camera 302 and in front of the lens of the fourth camera 304, and the second bandpass filter allows light in a second wavelength range to pass through. The first wavelength range and the second wavelength range do not have an overlapping range.

[0082] The wavelength of the laser light emitted by the first laser 101 is within a first wavelength range, and the wavelength of the laser light emitted by the second laser 102 is within a second wavelength range.

[0083] Before capturing images of the surface of a target object, the image acquisition system of the present invention first performs field of view alignment, uses two laser galvanometer modules for simultaneous projection, and adjusts the galvanometer angle to align the galvanometer projection range with the field of view of one or two adapted cameras.

[0084] When the image acquisition system of the present invention acquires images of the surface of a target object, two laser galvanometer modules can be controlled using a set of control equipment when triggering projection. Due to the filtering effect of the bandpass filter, the two wavelengths of light will not interfere with each other when projected simultaneously.

[0085] Therefore, in some embodiments of the present disclosure, the image acquisition system of the present disclosure further includes: a control device (not shown), the first laser 101, the first galvanometer 201, the second laser 102 and the second galvanometer 202 are controlled by the control device, so that the first laser 101 and the second laser 102 emit lasers synchronously, and the first galvanometer 201 and the second galvanometer 202 are deflected synchronously.

[0086] Among them, the control device may include a programmable logic controller (PLC, Programmable Logic Controller), and the present disclosure does not specifically limit the specific type of the control device.

[0087] In a preferred embodiment of the present disclosure, the first laser and the second laser described above in the present disclosure are lasers with the same physical structure, and the first galvanometer and the second galvanometer are galvanometers with the same physical structure.

[0088] In some embodiments of the present disclosure, the first laser and the second laser have the same parameters such as laser power, laser pulse width, beam diameter, etc., and the first galvanometer and the second galvanometer have the same parameters such as size and amplitude.

[0089] In some embodiments of the present disclosure, the bandpass filter described above is not configured in front of the camera lens, and the two laser galvanometer modules can be asynchronously controlled by a control device, so that the cameras in the first module and the second module asynchronously capture images of the surface of the target object.

[0090] In some embodiments of the present disclosure, a shockproof module (such as shockproof cotton) may be added at the junction of the laser and the galvanometer to optimize the projection quality and thereby improve the image acquisition quality.

[0091] Based on the image acquisition system provided by the present disclosure, the present disclosure further provides a configuration method of the image acquisition system, and the configuration method of the present disclosure is at least used to configure the first galvanometer and the second galvanometer of the image acquisition system.

[0092] Fig. 9 The deflection angle range of a single galvanometer is shown as an example.

[0093] refer to Fig. 9 , the configuration method disclosed herein includes:

[0094] The deflection angle range of the first galvanometer 201 and the second galvanometer 202 is set so that the scanning range of the first galvanometer 201 on the horizontal working plane is symmetrical about the vertical plane from the first axis to the horizontal working plane, and the scanning range of the second galvanometer 202 on the horizontal working plane is symmetrical about the vertical plane from the second axis to the horizontal working plane.

[0095] The deflection angle range of the first galvanometer and the second galvanometer is set to (i.e., constraint condition):

[0096] α+β=90°, and β>α;

[0097] Wherein, α is the minimum angle between the first galvanometer surface and the second galvanometer surface and the corresponding incident laser, and β is the maximum angle between the first galvanometer surface and the second galvanometer surface and the corresponding incident laser.

[0098] The horizontal working plane (ie, horizontal projection plane) described in the present disclosure may be the surface of a workbench on which the target object is placed, or a horizontal ground surface, etc. Fig. 9 In the figure, the axes about which the galvanometer mirror is deflected (i.e., the first axis and the second axis) are perpendicular to the paper surface.

[0099] refer to Fig. 9 , the galvanometer deflects from angle α to angle β, rotating: (β-α)°.

[0100] Draw a line between the center line of the galvanometer (the axis around which it deflects) and the horizontal working surface. This line is a straight line perpendicular to the working surface (the dotted line in the figure). To ensure that the area scanned by the laser is symmetrical along this line, the above constraints must be met.

[0101] Fig.10 For Fig. 9 Schematic diagram of the laser scanning area shown at a vertical viewing angle. Fig.10 The horizontal direction in is parallel to the axis about which the galvanometer deflects.

[0102] refer to Fig. 9 and Fig.10 , initially, the horizontal working surface is at a distance x from the center of the galvanometer, then the width of the bottom edge of the cone at x is:

[0103] A1j=2x·tan(β-α)

[0104] The length of the laser band on the galvanometer is Dj, and the bandwidth angle is γ, then the length of the lower edge of the cone at x is:

[0105] B1j=2[x·tan(γ / 2)+Dj / 2]

[0106] Based on the above description, the configuration method of the present disclosure further includes:

[0107] Constraints are set for the deflection angle range of the first galvanometer 201, the deflection angle range of the second galvanometer 202, the length of the laser band extending along the first axis on the first galvanometer 201, and the length of the laser band extending along the second axis on the second galvanometer 202:

[0108] A first viewing cone width A1j corresponding to the deflection angle range of the first galvanometer 201 is obtained based on the deflection angle range of the first galvanometer 201 and the distance between the first axis (i.e., the deflection center line of the first galvanometer 201) and the horizontal working plane;

[0109] Based on the laser band length extending along the first axis on the first galvanometer 201, the laser band length angle and the distance between the first axis (i.e. the deflection center line of the first galvanometer 201) and the horizontal working plane, the first viewing cone length B1j corresponding to the laser band length is obtained;

[0110] Based on the deflection angle range of the second galvanometer 202 and the distance between the second axis (i.e., the deflection center line of the second galvanometer 202) and the horizontal working plane, a second viewing cone width A2j corresponding to the deflection angle range of the second galvanometer 202 is obtained;

[0111] The second viewing cone length B2j corresponding to the laser band length is obtained based on the laser band length extending along the second axis on the second galvanometer 202, the laser band length angle, and the distance between the second axis (i.e., the deflection center line of the second galvanometer 202) and the horizontal working plane;

[0112] The smaller of the first viewing cone width A1j and the first viewing cone length B1j is set to be completely covered by the larger of the second viewing cone width A2j and the second viewing cone length B2j;

[0113] The smaller of the second viewing cone width A2j and the second viewing cone length B2j is set to be completely covered by the larger of the first viewing cone width A1j and the first viewing cone length B1j.

[0114] The above-mentioned constraint setting can ensure that the scanning area (i.e., scanning range) of the first galvanometer 201 on the horizontal working plane and the scanning area (i.e., scanning range) of the second galvanometer 202 on the horizontal working plane have a maximum overlapping area, and the maximum overlapping area is the effective area S obtained by multiplying the smaller of the first cone length and the second cone length by the smaller of the first cone width and the second cone width. Fig.11 A schematic diagram of the effective area S is shown.

[0115] refer to Figure 6 The image acquisition system shown, in a preferred embodiment of the present disclosure, the configuration method of the present disclosure sets constraints on the first spacing between the center point of the first galvanometer 201 and the center point of the second galvanometer 202 in the first axis direction and the second spacing between the center point of the first galvanometer 201 and the center point of the second galvanometer 202 in the second axis direction:

[0116] The first spacing is configured to be 0, and the second spacing is configured to be less than or equal to 1 / 2 of the difference between the first viewing cone width A1j and the first viewing cone length B1j;

[0117] Alternatively, the second spacing is configured to be 0, and the first spacing is configured to be less than or equal to 1 / 2 of the difference between the second viewing cone width A2j and the second viewing cone length B2j.

[0118] The above constraint setting can ensure that the above overlapping area is maximized.

[0119] refer to Figure 7 and Fig.12 , Fig.12 It is a schematic diagram of the coordination of a single camera and a single galvanometer of the present disclosure. According to the preferred embodiment of the present disclosure, the configuration method of the present disclosure configures the distance between the lens center of the first camera 301 and the horizontal working plane to be the same as the distance between the center point of the first galvanometer 201 and the horizontal working plane, and configures the vertical line from the lens center of the first camera 301 to the horizontal working plane and the vertical line from the center point of the first galvanometer 201 to the horizontal working plane to be located in a common plane, and the first axis is perpendicular to the common plane.

[0120] According to a preferred embodiment of the present disclosure, the configuration method of the present disclosure configures the field of view of the first camera 301 on the horizontal working plane to completely cover the maximum overlapping area described above.

[0121] Fig.13 is with Fig.12 The vertical viewing angle shows the camera FOV.

[0122] refer to Fig.12 and Fig.13 , the angle between the camera axis and the perpendicular line from the center of the galvanometer to the horizontal working plane is ε, the angle of the "long" side of the camera FOV is φ, the angle of the "short" side is θ, the distance between the perpendicular line from the center point of the camera to the horizontal working plane and the perpendicular line from the center of the galvanometer to the horizontal working plane is L1, and FOV is the field of view angle.

[0123] For the first and third cameras:

[0124] Long side: The intersection of the camera's viewing cone perpendicular to the first axis and the horizontal working plane.

[0125] Short side: The intersection of the camera's viewing cone perpendicular to the second axis and the horizontal working plane.

[0126] For the second and fourth cameras:

[0127] Long side: The intersection of the camera's viewing cone perpendicular to the second axis and the horizontal working plane.

[0128] Short side: The intersection of the camera's viewing cone perpendicular to the first axis and the horizontal working plane.

[0129] In some embodiments of the present disclosure, if the first cone length B1j is greater than or equal to the first cone width A1j, the spacing L1 between the perpendicular line from the lens center of the first camera (single camera) to the horizontal working plane and the perpendicular plane from the first axis to the horizontal working plane is configured based on the following constraints, so that the field of view of the first camera on the horizontal working plane is configured to completely cover the scanning range of the first galvanometer on the horizontal working plane.

[0130] refer to Fig.12 , the "long" side of the camera:

[0131] B1x=B1xleft+B1xright;

[0132] B1x=x·tan(φ / 2-ε)+L1+x·tan(φ / 2+ε)-L1;

[0133] B1x=2x·[tan(φ / 2-ε)+tan(φ / 2+ε)].

[0134] refer to Fig.13 , looking from the "short" side of the camera, the camera axis overlaps with the vertical line from the center of the galvanometer to the horizontal working surface, so:

[0135] A1x=2x·tan(θ / 2);

[0136] Therefore, in order to enable a single camera to cover the maximum overlapping area described above, if the first cone length (B1j) is greater than or equal to the first cone width (A1j), the spacing between the perpendicular line from the lens center of the first camera to the horizontal working plane and the perpendicular plane from the first axis to the horizontal working plane is configured based on the following constraints;

[0137] The constraints are:

[0138] The distance between the vertical plane from the first axis to the horizontal working plane and the left edge line of the field of view of the first camera is configured to be greater than or equal to 1 / 2 of the width of the first viewing cone;

[0139] The distance between the vertical plane from the first axis to the horizontal working plane and the right edge line of the field of view of the first camera is configured to be greater than or equal to 1 / 2 of the width of the first viewing cone;

[0140] The width of the field of view of the first camera on the horizontal working plane in the direction parallel to the first axis is configured to be greater than or equal to the first viewing cone width;

[0141] The left edge line and the right edge line are both parallel to the first axis and are respectively located on the left and right sides of the projection line of the first axis on the horizontal working plane.

[0142] That is, B1x=B1xleft+B1xright, B1xleft≥A1j / 2, B1xright≥A1j / 2, A1x≥A1j; wherein, B1x is the length of the field of view of the first camera on the horizontal working plane in a direction perpendicular to the first axis, and A1x is the width of the field of view of the first camera on the horizontal working plane in a direction parallel to the first axis; "B1xleft" is the distance between the vertical plane from the first axis to the horizontal working plane and the left edge line of the field of view of the first camera; "B1xright" is the distance between the vertical plane from the first axis to the horizontal working plane and the right edge line of the field of view of the first camera; A1j is the width of the first visual cone.

[0143] If the first cone length (B1j) is less than or equal to the first cone width (A1j), the spacing between the perpendicular line from the lens center of the first camera to the horizontal working plane and the perpendicular plane from the first axis to the horizontal working plane is configured based on the following constraints;

[0144] The constraints are:

[0145] The distance between the vertical plane from the first axis to the horizontal working plane and the left edge line of the field of view of the first camera is configured to be greater than or equal to 1 / 2 of the length of the first viewing cone;

[0146] The distance between the vertical plane from the first axis to the horizontal working plane and the right edge line of the field of view of the first camera is configured to be greater than or equal to 1 / 2 of the length of the first viewing cone;

[0147] The width of the field of view of the first camera on the horizontal working plane in the direction parallel to the first axis is configured to be greater than or equal to the first viewing cone length;

[0148] The left edge line and the right edge line are both parallel to the first axis and are respectively located on the left and right sides of the projection line of the first axis on the horizontal working plane.

[0149] That is, B1x=B1xleft+B1xright, B1xleft≥B1j / 2, B1xright≥B1j / 2, A1x≥B1j; wherein, B1x is the length of the field of view of the first camera on the horizontal working plane in a direction perpendicular to the first axis, and A1x is the width of the field of view of the first camera on the horizontal working plane in a direction parallel to the first axis; "B1xleft" is the distance between the vertical plane from the first axis to the horizontal working plane and the left edge line of the field of view of the first camera; "B1xright" is the distance between the vertical plane from the first axis to the horizontal working plane and the right edge line of the field of view of the first camera; the left edge line and the right edge line are both parallel to the first axis and are respectively located on the left and right sides of the projection line of the first axis on the horizontal working plane; B1j is the length of the first visual cone.

[0150] The configuration of the second camera (ie, a single camera) is described in detail below, and the configuration method is the same as the configuration method of the first camera.

[0151] In some embodiments of the present disclosure, the distance between the lens center of the second camera 302 and the horizontal working plane is configured to be the same as the distance between the center point of the second galvanometer 202 and the horizontal working plane, and the perpendicular line from the lens center of the second camera 302 to the horizontal working plane and the perpendicular line from the center point of the second galvanometer 202 to the horizontal working plane are configured to be located in a common plane, and the second axis is perpendicular to the common plane.

[0152] According to a preferred embodiment of the present disclosure, the configuration method of the present disclosure configures the field of view of the second camera 302 on the horizontal working plane to completely cover the maximum overlapping area described above.

[0153] If the second cone length (B2j) is greater than or equal to the second cone width (A2j), the spacing between the perpendicular line from the lens center of the second camera to the horizontal working plane and the perpendicular plane from the second axis to the horizontal working plane is configured based on the following constraints;

[0154] The constraints are:

[0155] The distance between the vertical plane from the second axis to the horizontal working plane and the left edge line of the field of view of the second camera is configured to be greater than or equal to 1 / 2 of the width of the second viewing cone;

[0156] The distance between the vertical plane from the second axis to the horizontal working plane and the right edge line of the field of view of the second camera is configured to be greater than or equal to 1 / 2 of the width of the second viewing cone;

[0157] The width of the field of view of the second camera on the horizontal working plane in the direction parallel to the second axis is configured to be greater than or equal to the second viewing cone width;

[0158] The left edge line and the right edge line are both parallel to the second axis and are respectively located on the left and right sides of the projection line of the second axis on the horizontal working plane.

[0159] That is, B2x=B2xleft+B2xright, B2xleft≥A2j / 2, B2xright≥A2j / 2, A2x≥A2j; wherein, B2x is the length of the field of view of the second camera on the horizontal working plane in a direction perpendicular to the second axis, and A2x is the width of the field of view of the second camera on the horizontal working plane in a direction parallel to the second axis; "B2xleft" is the distance between the vertical plane from the second axis to the horizontal working plane and the left edge line of the field of view of the second camera; "B2xright" is the distance between the vertical plane from the second axis to the horizontal working plane and the right edge line of the field of view of the second camera; A2j is the width of the second visual cone.

[0160] If the second cone length (B2j) is less than or equal to the second cone width (A2j), the spacing between the perpendicular line from the lens center of the second camera to the horizontal working plane and the perpendicular plane from the second axis to the horizontal working plane is configured based on the following constraints;

[0161] The constraints are:

[0162] The distance between the vertical plane from the second axis to the horizontal working plane and the left edge line of the field of view of the second camera is configured to be greater than or equal to 1 / 2 of the length of the second viewing cone;

[0163] The distance between the vertical plane from the second axis to the horizontal working plane and the right edge line of the field of view of the second camera is configured to be greater than or equal to 1 / 2 of the length of the second viewing cone;

[0164] The width of the field of view of the second camera on the horizontal working plane in the direction parallel to the second axis is configured to be greater than or equal to the second viewing cone length;

[0165] The left edge line and the right edge line are both parallel to the second axis and are respectively located on the left and right sides of the projection line of the second axis on the horizontal working plane.

[0166] That is, B2x=B2xleft+B2xright, B2xleft≥B2j / 2, B2xright≥B2j / 2, A2x≥B2j; wherein, B2x is the length of the field of view of the second camera on the horizontal working plane in a direction perpendicular to the second axis, and A2x is the width of the field of view of the second camera on the horizontal working plane in a direction parallel to the second axis; "B2xleft" is the distance between the vertical plane from the second axis to the horizontal working plane and the left edge line of the field of view of the second camera; "B2xright" is the distance between the vertical plane from the second axis to the horizontal working plane and the right edge line of the field of view of the second camera; B2j is the length of the second visual cone.

[0167] For the dual-camera, dual-laser, dual-galvanometer image acquisition system provided in the present disclosure, the configuration of the dual-galvanometer and dual-camera can be achieved through the above configuration method.

[0168] For the four-camera, dual-laser, and dual-galvanometer image acquisition system provided by the present invention, the third camera is configured in the same way as the first camera, and the fourth camera is configured in the same way as the second camera, thereby realizing the configuration of four cameras and dual galvanometers.

[0169] Fig.14 A three-dimensional schematic diagram of the field of view of four cameras and the scanning range of two galvanometers.

[0170] Fig.15 Schematic diagram of the overlap of the field of view of the four cameras and the scanning range of the two galvanometers.

[0171] The present disclosure, through the above configuration method, can achieve the best match between the camera field of view and the scanning range of the galvanometer of the image acquisition system of the present disclosure.

[0172] Based on the above configuration method, the present disclosure further provides a readable storage medium, in which execution instructions are stored. When the execution instructions are executed by a processor, they are used to implement the configuration method of any embodiment of the present disclosure.

[0173] Based on the above configuration method, the present disclosure further provides a computer program product, including a computer program, and when the computer program is executed by a processor, the configuration method of any embodiment of the present disclosure is implemented.

[0174] For the purposes of this specification, a "readable storage medium" may be any device that can contain, store, communicate, propagate or transmit a program for use with or in conjunction with an instruction execution system, device or apparatus. More specific examples of readable storage media (a non-exhaustive list) include the following: an electrical connection with one or more wirings (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and editable read-only memory (EPROM or flash memory), a fiber optic device, and a portable read-only memory (CDROM). In addition, the readable storage medium may even be paper or other suitable medium on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering or, if necessary, processing in another suitable manner, and then stored in a memory.

[0175] It should be understood that the various parts of the present disclosure can be implemented in hardware, software, or a combination thereof. In the above-mentioned embodiments, multiple steps or methods can be implemented in software stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0176] A person skilled in the art may understand that all or part of the steps of implementing the above-mentioned implementation method may be completed by instructing related hardware through a program, and the program may be stored in a readable storage medium, which, when executed, includes one or a combination of the steps of the implementation method.

[0177] In addition, each functional unit in each embodiment of the present disclosure may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a readable storage medium. The storage medium may be a read-only memory, a disk or an optical disk, etc.

[0178] Those skilled in the art should understand that the above embodiments are only for the purpose of clearly illustrating the present disclosure, and are not intended to limit the scope of the present disclosure. For those skilled in the art, other changes or modifications may be made based on the above disclosure, and these changes or modifications are still within the scope of the present disclosure.

Claims

1. An image acquisition system, characterized in that: include: A first module and a second module; The first module includes: a first laser capable of emitting laser light; a first galvanometer, wherein the first galvanometer can deflect around a first axis, and the first galvanometer can project the laser light emitted by the first laser onto a surface of a target object; and a first camera, wherein the first camera can collect reflected light of the laser projected by the first galvanometer onto the surface of the target object and modulated by the surface of the target object to obtain a modulated image; The second module comprises: a second laser capable of emitting laser light; a second galvanometer, wherein the second galvanometer is capable of deflecting about a second axis, and the second galvanometer is capable of projecting the laser light emitted by the second laser onto the surface of the target object; and a second camera, wherein the second camera can collect reflected light of the laser projected by the second galvanometer onto the surface of the target object and modulated by the surface of the target object to obtain a modulated image; The first axis and the second axis are perpendicular to each other, the optical axis of the first laser is perpendicular to the first axis, and the optical axis of the second laser is perpendicular to the second axis.

2. The image acquisition system according to claim 1, characterized in that: The lasers projected onto the surface of the target object by the first galvanometer and the second galvanometer both form structured light stripes.

3. The image acquisition system according to claim 1, characterized in that: The first module also includes: a third camera, wherein the third camera and the first camera are arranged on both sides of the first galvanometer, so that the first camera and the third camera can jointly collect the reflected light of the laser projected by the first galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image; The second module also includes: A fourth camera, wherein the fourth camera and the second camera are arranged on both sides of the second galvanometer, so that the second camera and the fourth camera can jointly collect the reflected light of the laser projected by the second galvanometer onto the surface of the target object after being modulated by the surface of the target object to obtain a modulated image.

4. The image acquisition system according to claim 1, characterized in that: A first bandpass filter is disposed in front of the lens of the first camera, the first bandpass filter allows light in a first wavelength range to pass through, and a second bandpass filter is disposed in front of the lens of the second camera, the second bandpass filter allows light in a second wavelength range to pass through, and the first wavelength range and the second wavelength range do not have an overlapping range; The wavelength of the laser light emitted by the first laser is within the first wavelength range, and the wavelength of the laser light emitted by the second laser is within the second wavelength range.

5. The image acquisition system according to claim 3, characterized in that: A first bandpass filter is disposed in front of the lens of the first camera and the lens of the third camera, and the first bandpass filter allows light in a first wavelength range to pass through; a second bandpass filter is disposed in front of the lens of the second camera and the lens of the fourth camera, and the second bandpass filter allows light in a second wavelength range to pass through, and the first wavelength range and the second wavelength range do not have an overlapping range; The wavelength of the laser light emitted by the first laser is within the first wavelength range, and the wavelength of the laser light emitted by the second laser is within the second wavelength range.

6. The image acquisition system according to claim 1 or 3, characterized in that: The first axis and the second axis are located in the same plane, and the first galvanometer mirror and the second galvanometer mirror have a distance in the extension direction of the first axis or the second axis.

7. The image acquisition system according to claim 1 or 3, characterized in that: The first axis and the second axis are not located in the same plane, and the first galvanometer mirror and the second galvanometer mirror are staggered in space.

8. The image acquisition system according to claim 1, characterized in that: The first laser is fixedly connected to the first galvanometer, and the second laser is fixedly connected to the second galvanometer.

9. The image acquisition system according to claim 1, characterized in that: Also includes: The first laser, the first galvanometer, the second laser and the second galvanometer are controlled by the control device, so that the first laser and the second laser emit laser synchronously, and the first galvanometer and the second galvanometer are deflected synchronously.

10. The image acquisition system according to claim 9, characterized in that: The control device includes a programmable logic controller.

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