A test device for chip production

Abstract

The utility model relates to the technical field of chip production, and discloses a test device for chip production, including a machine platform, an electric sliding arm is arranged inside the machine platform, a moving head is slidably connected to the outer surface of the electric sliding arm, two small cylinders are fixedly installed on the upper surface of the front end of the moving head, a pneumatic suction nozzle is fixedly installed on the telescopic end of each small cylinder, two groups of touch heads are fixedly installed on the front of the moving head, three mounting plates are fixedly installed on the inner side wall of the machine platform, two contact sensors are fixedly installed on the back of each mounting plate, and three lifting push rods are fixedly installed on the inner bottom wall of the machine platform. The test device for chip production is provided with a machine platform, an electric sliding arm, a moving head, a small cylinder and a pneumatic suction nozzle, and the pneumatic suction nozzle can be used to absorb the chip to replace the traditional grasping of the robot, which can effectively prevent the chip from being damaged by excessive force caused by the grasping of the robot.

Description

Technical Field

[0001] The utility model relates to the technical field of chip production, in particular to a testing device for chip production. Background Art

[0002] Chips, also known as microcircuits or integrated circuits, are generally small in size and integrate a large number of circuit structures to achieve logical computing capabilities. With the development of mobile Internet, cloud computing, and Internet of Things technologies, the demand for chips has become increasingly greater. After production, due to their tiny internal structure, their quality cannot be observed by the naked eye. At this time, a detection device is needed to energize the chip pins to detect the quality of the chip.

[0003] However, the chip detection devices on the market still have the following problems:

[0004] 1. When testing the chip, it is necessary to place the chip on a special testing table and energize its pins to detect the quality of the chip. During the movement of the chip, the existing testing device uses a manipulator to clamp the chip and move it. The chip itself is small and made of silicon material, and its strength is not high. Using a manipulator can easily damage the chip, resulting in a decrease in the yield rate.

[0005] 2. Since the pins of the chip are small and densely packed, the accuracy of the chip must be ensured when it is placed on the test bench. When the existing test device is used for testing, the chip is mainly positioned by setting an inclined structure on the test bench, and the chip is positioned by using its gravity to slide into the test slot. Sometimes, when the robot is placed crookedly, the chip is easily positioned inaccurately, resulting in failure to contact the test contacts, leading to misjudgment.

[0006] Therefore, those skilled in the art provide a chip production testing device to solve the problems raised in the above background technology. Utility Model Content

[0007] The purpose of the utility model is to provide a chip production testing device to solve the problems raised in the above background technology.

[0008] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0009] A testing device for chip production includes a machine platform, an electric slide arm is arranged inside the machine platform, a moving head is slidably connected to the outer surface of the electric slide arm, two small cylinders are fixedly installed on the upper surface of the front end of the moving head, a pneumatic suction nozzle is fixedly installed on the telescopic end of each of the small cylinders, two groups of touch heads are fixedly installed on the front of the moving head, three mounting plates are fixedly installed on the inner side wall of the machine platform, two contact sensors are fixedly installed on the back of each of the mounting plates, three lifting push rods are fixedly installed on the inner bottom wall of the machine platform, a positioning shell is fixedly installed on the telescopic end of each of the lifting push rods, a decompression spring is fixedly installed on the inner bottom wall of each of the positioning shells, and a chip support plate is fixedly installed on the top of each of the decompression springs.

[0010] As a further solution of the utility model: three detectors are arranged inside the machine, and two adjustment rods are fixedly installed on the bottom surface of the electric sliding arm.

[0011] As a further solution of the utility model: two support plates are fixedly mounted on the bottom surface of each of the detectors, and the bottom surface of each of the support plates is fixedly connected to the inner bottom wall of the machine platform.

[0012] As a further solution of the utility model: a slider is fixedly mounted on the bottom surface of each adjusting rod, and the bottom surface of each slider is in contact with the inner bottom wall of the machine platform.

[0013] As a further solution of the utility model: the interior of each of the sliding blocks is slidably connected to an electric slide rail, and the bottom surface of each of the electric slide rails is fixedly connected to the inner bottom wall of the machine platform.

[0014] As a further solution of the utility model: a display is fixedly mounted on the upper surface of the machine, and a plurality of identical chip containers are fixedly mounted on the inner bottom wall of the machine.

[0015] As a further solution of the utility model: the inner wall of each detector is threadedly connected with two groups of fixing bolts, and the outer surface of each group of fixing bolts is threadedly connected to the inner wall of the support plate.

[0016] As a further solution of the utility model: a control console is fixedly installed on the front upper surface of the machine platform, and the control console is electrically connected to the electric slide rail, the electric slide arm and the contact sensor through wires.

[0017] Compared with the prior art, the beneficial effects of the utility model are:

[0018] The utility model is provided with a machine table, an electric sliding arm, a moving machine head, a small air cylinder and a pneumatic suction nozzle. The pneumatic suction nozzle can absorb the chip to replace the traditional grasping of the robot arm, which can effectively prevent the chip from being damaged by excessive force caused by the grasping of the robot arm, thereby ensuring the integrity of the chip and improving the yield rate. Then, through the touch head, the mounting plate, the contact sensor, the lifting push rod, the positioning shell, the pressure relief spring and the chip support plate, the contact sensor and the touch head are used to cooperate to realize the positioning of the pneumatic suction nozzle, ensure that it is above the chip support plate every time, and through the provided pressure relief spring, the chip can be pressed into the positioning shell by the small air cylinder to ensure contact with the detection contact point, and the pressure relief spring ensures that the chip will not be broken due to excessive pressure. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the overall structure of a chip production test device;

[0020] Figure 2 It is a schematic diagram of the three-dimensional structure of an electric sliding arm in a chip production test device;

[0021] Figure 3 It is a three-dimensional structural diagram of a small-sized cylinder in a chip production test device;

[0022] Figure 4 It is a three-dimensional structural schematic diagram of a support plate in a chip production test device;

[0023] Figure 5 The present invention is a three-dimensional cross-sectional view of a positioning shell in a test device for chip production.

[0024] In the figure: 1. Machine; 2. Display; 3. Chip container; 4. Control console; 5. Electric slide arm; 6. Moving head; 7. Slider; 8. Electric slide rail; 9. Small cylinder; 10. Pneumatic nozzle; 11. Touch head; 12. Mounting plate; 13. Contact sensor; 14. Detector; 15. Fixing bolt; 16. Lifting push rod; 17. Support plate; 18. Decompression spring; 19. Chip support plate; 20. Positioning shell; 21. Adjustment rod. DETAILED DESCRIPTION

[0025] See also Figure 1-5A chip production testing device includes a machine platform 1, an electric slide arm 5 is arranged inside the machine platform 1, a moving head 6 is slidably connected to the outer surface of the electric slide arm 5, two small cylinders 9 are fixedly installed on the upper surface of the front end of the moving head 6, a pneumatic suction nozzle 10 is fixedly installed at the telescopic end of each small cylinder 9, two groups of touch heads 11 are fixedly installed on the front of the moving head 6, three mounting plates 12 are fixedly installed on the inner side wall of the machine platform 1, two contact sensors 13 are fixedly installed on the back of each mounting plate 12, three lifting push rods 16 are fixedly installed on the inner bottom wall of the machine platform 1, a positioning shell 20 is fixedly installed on the telescopic end of each lifting push rod 16, a decompression spring 18 is fixedly installed on the inner bottom wall of each positioning shell 20, and a chip support plate 19 is fixedly installed on the top of each decompression spring 18.

[0026] Three detectors 14 are arranged inside the machine 1. Two adjusting rods 21 are fixedly installed on the bottom surface of the electric slide arm 5. The adjusting rods 21 are arranged to adjust the height of the mobile head 6. The electric type is adopted and the whole is automatically controlled. Two supporting plates 17 are fixedly installed on the bottom surface of each detector 14. The bottom surface of each supporting plate 17 is fixedly connected to the inner bottom wall of the machine 1. The supporting plates 17 are used to install and fix the detectors 14 through the detectors 14 and the supporting plates 17, and the chips and the like need to be detected in the detectors 14. A slider 7 is fixedly installed on the bottom surface of each adjusting rod 21. The bottom surface of each slider 7 is in contact with the inner bottom wall of the machine 1. An electric slide rail 8 is slidably connected to the inside of each slider 7. The bottom surface of each electric slide rail 8 is fixedly connected to the inner bottom wall of the machine 1. The slider 7 and the electric slide rail 8 are arranged, and the slider 7 and the electric slide rail 8 can move forward and backward in cooperation for overall forward and backward position adjustment.

[0027] A display 2 is fixedly mounted on the upper surface of the machine 1. The display 2 is used as the display part of the detection device to display the detection data. A number of identical chip containers 3 are fixedly mounted on the inner bottom wall of the machine 1. The inner wall of each detector 14 is threadedly connected with two groups of fixing bolts 15. The outer surface of each group of fixing bolts 15 is threadedly connected to the inner wall of the support plate 17. The fixing bolts 15 are used to connect the detector 14 and the support plate 17 to achieve the purpose of fixing the detector 14. A control console 4 is fixedly mounted on the upper surface of the front end of the machine 1. The control console 4 is electrically connected to the electric slide rail 8, the electric slide arm 5 and the contact sensor 13 through wires. The control console 4 is used to control various electric devices, which is conducive to automatic control.

[0028] The working principle of the utility model is as follows: when in use, the electric slide arm 5, the electric slide rail 8 and the small air cylinder 9 are powered on. When the chip needs to be tested, the chip will be placed in the chip container 3. The cooperation between the electric slide rail 8, the electric slide arm 5, the mobile head 6 and the slider 7 can adjust the front, back, left, right and height of the chip, and automatically load the chip. In order to avoid damage caused by the chip being clamped by the robot, the small air cylinder 9 can be started when the chip is clamped, and the small air cylinder 9 drives the pneumatic suction nozzle 10 to rise and fall, and the pneumatic suction nozzle 10 is used. 0 holds the chip, the small cylinder 9 and the pneumatic suction nozzle 10 are automatically controlled by the control console 4. When the pneumatic suction nozzle 10 moves the chip to the top of the detector 14, when the touch head 11 contacts the contact sensor 13, the contact sensor 13 needs to be double-triggered to complete the positioning. After the positioning of the chip is completed, the small cylinder 9 and the pneumatic suction nozzle 10 place the chip on the chip support plate 19. In the process of placing the chip, the decompression spring 18 ensures that the chip will not be broken due to excessive pressure. Then the control console 4 controls each structure to repeat the detection.

[0029] What is described above is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip production testing device, comprising a machine (1), characterized in that: An electric slide arm (5) is arranged inside the machine (1), and a moving head (6) is slidably connected to the outer surface of the electric slide arm (5). Two small cylinders (9) are fixedly mounted on the upper surface of the front end of the moving head (6), and a pneumatic suction nozzle (10) is fixedly mounted on the telescopic end of each of the small cylinders (9). Two groups of touch heads (11) are fixedly mounted on the front of the moving head (6). Three mounting plates (12) are fixedly mounted on the inner side wall of the machine (1), and two contact sensors (13) are fixedly mounted on the back of each of the mounting plates (12). Three lifting push rods (16) are fixedly mounted on the inner bottom wall of the machine (1), and a positioning shell (20) is fixedly mounted on the telescopic end of each of the lifting push rods (16). A pressure relief spring (18) is fixedly mounted on the inner bottom wall of each of the positioning shells (20), and a chip support plate (19) is fixedly mounted on the top of each of the pressure relief springs (18).

2. A chip production testing device according to claim 1, characterized in that: Three detectors (14) are arranged inside the machine platform (1), and two adjustment rods (21) are fixedly mounted on the bottom surface of the electric sliding arm (5).

3. A chip production testing device according to claim 2, characterized in that: Two support plates (17) are fixedly mounted on the bottom surface of each detector (14), and the bottom surface of each support plate (17) is fixedly connected to the inner bottom wall of the machine platform (1).

4. A chip production testing device according to claim 2, characterized in that: A slider (7) is fixedly mounted on the bottom surface of each adjusting rod (21), and the bottom surface of each slider (7) is in contact with the inner bottom wall of the machine platform (1).

5. A chip production testing device according to claim 4, characterized in that: The interior of each of the sliding blocks (7) is slidably connected to an electric slide rail (8), and the bottom surface of each of the electric slide rails (8) is fixedly connected to the inner bottom wall of the machine platform (1).

6. A chip production testing device according to claim 1, characterized in that: A display (2) is fixedly mounted on the upper surface of the machine platform (1), and a plurality of identical chip containers (3) are fixedly mounted on the inner bottom wall of the machine platform (1).

7. A chip production testing device according to claim 2, characterized in that: The inner wall of each detector (14) is threadedly connected to two groups of fixing bolts (15), and the outer surface of each group of fixing bolts (15) is threadedly connected to the inner wall of the support plate (17).

8. A chip production testing device according to claim 1, characterized in that: A control console (4) is fixedly mounted on the front upper surface of the machine platform (1), and the control console (4) is electrically connected to the electric slide rail (8), the electric slide arm (5) and the contact sensor (13) respectively through wires.

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