Flash memory chip testing machine

Abstract

The utility model proposes a flash memory chip tester, which belongs to the field of chip detection technology. The flash memory chip tester includes a device body, a test stylus, a push plate, an infrared transmitting end and a pressing belt, wherein the device body is fixedly connected to a left bin on the outside, the device body is fixedly connected to a right bin on the outside, the device body is fixedly connected to a bottom guide rail on the outside, the bottom guide rail is fixedly connected to an infrared receiving end on the outside, a movable groove is provided on the outside of the right bin, the push plate is movably connected inside the movable groove, the device body is fixedly connected to a collecting bucket on the outside, the left bin and the right bin are fixedly connected to the device body on the outside, the left bin and the right bin are fixedly connected to a hydraulic pump on the outside, the hydraulic pump is fixedly connected to a hydraulic rod on the outside, and the hydraulic rod is fixedly connected to an L-shaped plate on the outside. The utility model has the advantages of being able to correct pin extrusion, perform integrity detection on chips and collect defective products.

Description

Technical Field

[0001] The utility model relates to the technical field of chip detection, in particular to a flash memory chip testing machine. Background Art

[0002] Flash memory chips, also known as flash memory, are a type of non-volatile storage technology that can retain data after power failure. It is a key component in modern electronic devices and is widely used in USB flash drives, solid-state drives, mobile phones, digital cameras, and various embedded systems. Compared to traditional disks, flash memory has no mechanical structure, so it is more durable, has low power consumption, and has fast read and write speeds. Flash memory chips are mainly divided into two types: NAND and NOR. The NAND type is suitable for large-scale data storage, such as SSDs; the NOR type supports random access and is suitable for storing code. With its large capacity, high speed and reliability, flash memory chips have become one of the core technologies in the field of data storage. During the inspection of flash memory chips, when the chips are stacked, the chip pins are easily twisted and damaged, and the pins are difficult to distinguish directly with the naked eye, and manual selection is time-consuming and labor-intensive. Therefore, the present application provides a flash memory chip testing machine. Utility Model Content

[0003] In order to solve the above technical problems, the utility model proposes a flash memory chip testing machine which can correct pin extrusion, perform chip integrity detection and collect defective products.

[0004] The technical solution of the present utility model is achieved as follows:

[0005] A flash memory chip testing machine includes a device body, a test stylus, a push plate, an infrared emitting end, and a pressing belt, wherein the device body is fixedly connected to a left bin on the outside, the device body is fixedly connected to a right bin on the outside, the device body is fixedly connected to a bottom guide rail on the outside, the bottom guide rail is fixedly connected to an infrared receiving end on the outside, a movable groove is provided on the outside of the right bin, the push plate is movably connected inside the movable groove, a collecting hopper is fixedly connected to the outside of the device body, the left and right bins are fixedly connected to the device body on the outside, the left and right bins are fixedly connected to a hydraulic pump on the outside, the hydraulic pump is fixedly connected to a hydraulic rod on the outside, the hydraulic rod is fixedly connected to an L-shaped plate on the outside, the test stylus is fixedly connected to the outside of the L-shaped plate, the infrared emitting end is fixedly connected to the inside of the left and right bins, the left and right bins are fixedly connected to a correction motor on the inside, the correction motor transmission shaft end is fixedly connected to a pressing gear, the pressing gear is movably connected to a pressing belt on the outside, and the device body is movably connected to the chip body on the outside.

[0006] Furthermore, a transmission motor is fixedly connected to the inside of the equipment body, a driving gear is fixedly connected to the end of the transmission shaft of the transmission motor, a driven gear is movably connected to the outside of the equipment body, a driven roller is movably connected to the inside of the equipment body, a conveyor belt is movably connected to the outside of the driven gear and the driven roller, a transmission belt is movably connected to the outside of the driven gear and the driving gear, and a guide bar is fixedly connected to the outside of the equipment body.

[0007] Furthermore, a waste discharge motor is fixedly connected inside the main body of the equipment, an extension bracket is fixedly connected to the end of the waste discharge motor drive shaft, a movable bracket is fixedly connected to the outside of the extension bracket, an end of the movable bracket away from the extension bracket is movably connected to a connecting base outside, and the push plate is fixedly connected to the outside of the connecting base.

[0008] Furthermore, contact grooves are provided on the outside of the left and right bins, movable grooves are provided on the outside of the left and right bins, there are two groups of bottom guide rails and they are symmetrically distributed outside the equipment body, and the collecting bucket is connected to the movable groove in opposite directions.

[0009] Furthermore, the infrared receiving end is vertically aligned with the infrared transmitting end, and a stable rotating shaft is fixedly connected to the outside of the device body.

[0010] Furthermore, there are two groups of guide bars which are symmetrically distributed outside the device body, and the guide bars are fixedly connected to the left bin and the right bin.

[0011] Furthermore, the hydraulic rods are provided in two groups and are symmetrically distributed outside the hydraulic pump, and the test styluses are provided in multiple groups and are evenly distributed outside the L-shaped plate.

[0012] Furthermore, the pressing gears are movably connected to the left bin and the right bin, and there are two groups of pressing gears which are symmetrically distributed inside the left bin and the right bin.

[0013] The utility model has the following beneficial effects:

[0014] 1. Through the setting, after the chip body is placed outside the conveyor belt, it enters the bottom of the left and right bins under the conveyor belt. The pins of the chip body contact with each other and the bottom guide rails. Under the action of the pressing belt and the bottom guide rails, the pins of the chip body are squeezed and corrected to ensure that the pins of the chip body are neat, which is convenient for subsequent testing with the test stylus and greatly improves the accuracy of the device test.

[0015] 2. Through the setting, when the chip body passes through the infrared transmitting end and the infrared receiving end, the chip body pins scan the infrared rays of the infrared receiving end and the infrared transmitting end. By calculating the infrared interval, the integrity of the chip body pins is determined. When the chip body is determined to be defective, the push plate pushes the defective product through the movable slot to the collection bucket for collection, which greatly improves the detection efficiency of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0017] Figure 2 This utility model Figure 1 Schematic diagram of some structures in ;

[0018] Figure 3 This utility model Figure 1 Schematic diagram of some structures in ;

[0019] Figure 4 It is a partial structural diagram of the utility model;

[0020] Figure 5 This utility model Figure 3 Internal structure anatomy diagram in;

[0021] Figure 6 This utility model Figure 3 Schematic diagram of some structures in ;

[0022] Figure 7 This utility model Figure 2 A magnified view of the structure at point A

[0023] Figure 8 This utility model Figure 5 A magnified view of the structure at point B

[0024] Among them: 1. Equipment body; 2. Left side bin; 3. Right side bin; 4. Conveyor belt; 5. Chip body; 6. Collection bucket; 7. Infrared receiving end; 8. Stable shaft; 9. Driven roller; 10. Hydraulic pump; 11. Hydraulic rod; 12. L-shaped plate; 13. Test stylus; 14. Movable slot; 15. Guide bar; 16. Waste discharge motor; 17. Extension bracket; 18. Movable bracket; 19. Connecting base; 20. Push plate; 21. Contact slot; 22. Transmission motor; 23. Driving gear; 24. Transmission belt; 25. Driven gear; 26. Infrared transmitting end; 27. Correction motor; 28. Pressing gear; 29. ​​Pressing belt; 30. Bottom guide rail. DETAILED DESCRIPTION

[0025] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0026] See Figures 1 to 8 As shown, the present invention provides a flash memory chip tester, including a device body 1, a test stylus 13, a push plate 20, an infrared transmitter 26 and a pressing belt 29, wherein the device body 1 is fixedly connected to the left bin 2 on the outside, the device body 1 is fixedly connected to the right bin 3 on the outside, the device body 1 is fixedly connected to the bottom guide rail 30 on the outside, the bottom guide rail 30 is fixedly connected to the infrared receiver 7 on the outside, a movable groove 14 is opened on the outside of the right bin 3, the push plate 20 is movably connected to the inside of the movable groove 14, the device body 1 is fixedly connected to the outside of the collecting hopper 6, the left bin 2 and the right bin 3 are fixedly connected on the outside The device body 1 is fixedly connected, the outside of the left and right compartments 2 and 3 are fixedly connected to the hydraulic pump 10, the outside of the hydraulic pump 10 is fixedly connected to the hydraulic rod 11, the outside of the hydraulic rod 11 is fixedly connected to the L-shaped plate 12, the test stylus 13 is fixedly connected to the outside of the L-shaped plate 12, the infrared transmitting end 26 is fixedly connected to the inside of the left and right compartments 2 and 3, and the inside of the left and right compartments 2 and 3 are fixedly connected to the correction motor 27, the end of the transmission shaft of the correction motor 27 is fixedly connected to the pressing gear 28, and the pressing gear 28 is movably connected to the outside of the pressing belt 29. The chip body 5 is movably connected to the outside of the device body 1;

[0027] The infrared receiving end 7 is vertically aligned with the infrared transmitting end 26. A stabilizing shaft 8 is fixedly connected to the outside of the device body 1. There are two sets of guide bars 15 and they are symmetrically distributed outside the device body 1. The guide bars 15 are fixedly connected to the left compartment 2 and the right compartment 3. There are two sets of hydraulic rods 11 and they are symmetrically distributed outside the hydraulic pump 10. There are multiple sets of test styluses 13 and they are evenly distributed outside the L-shaped plate 12.

[0028] Specifically, the chip body 5 is placed outside the conveyor belt 4, and is transported into the bottom guide rail 30 and the left and right bins 2 and 3 through the conveyor belt 4 under the guidance of the guide bar 15. During this process, the pins of the chip body 5 pass through the infrared rays of the infrared receiving end 7 and the infrared transmitting end 26, and the integrity of the chip body 5 is detected by calculating the infrared ray interval. If the chip body 5 is intact, it continues to be transported to the bottom of the hydraulic pump 10 through the conveyor belt 4, and the operation of the chip body 5 is stopped under the obstruction of the L-shaped plate 12, and the path detection is performed through the test stylus 13. After the detection is completed, the hydraulic pump 10 retracts the hydraulic rod 11 to release the chip body 5 for continued transportation, which greatly improves the accuracy of the device.

[0029] Furthermore, a transmission motor 22 is fixedly connected to the inside of the equipment body 1, a driving gear 23 is fixedly connected to the end of the transmission shaft of the transmission motor 22, a driven gear 25 is movably connected to the outside of the equipment body 1, a driven roller 9 is movably connected to the inside of the equipment body 1, the driven gear 25 and the driven roller 9 are externally movably connected to the conveyor belt 4, the driven gear 25 and the driving gear 23 are externally movably connected to the transmission belt 24, the outside of the equipment body 1 is fixedly connected to the guide bar 15, the inside of the equipment body 1 is fixedly connected to the waste discharge motor 16, the end of the transmission shaft of the waste discharge motor 16 is fixedly connected to the extension bracket 17, the extension bracket 1 7 is fixedly connected to the outside of the movable bracket 18, and the end of the movable bracket 18 away from the extension bracket 17 is movably connected to the outside of the connecting base 19. The pushing plate 20 is fixedly connected to the outside of the connecting base 19. The left bin 2 and the right bin 3 are both provided with contact grooves 21 on the outside. The left bin 2 and the right bin 3 are both provided with movable grooves 14 on the outside. There are two groups of bottom guide rails 30 and they are symmetrically distributed on the outside of the equipment body 1. The collecting bucket 6 is connected to the movable groove 14 in opposite directions. The pressing gear 28 is movably connected to the left bin 2 and the right bin 3. There are two groups of pressing gears 28 and they are symmetrically distributed inside the left bin 2 and the right bin 3.

[0030] By making the above settings, during the above operation process, if the chip body 5 is detected as a defective product, after the chip body 5 reaches the horizontal position of the movable groove 14, the waste discharge motor 16 is turned on to drive the extension bracket 17 to rotate, and the movable bracket 18 is driven to move through the circular motion of the distal and proximal ends of the extension bracket 17, thereby driving the push plate 20 to push the chip body 5 to the movable groove 14 inside the left bin 2, and then collected inside the collecting bucket 6, thereby preventing defective products from entering the detection process, thereby greatly improving the detection efficiency of the device.

[0031] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A flash memory chip testing machine, characterized in that: The device comprises a device body (1), a test stylus (13), a push plate (20), an infrared transmitting end (26) and a pressing belt (29), wherein the device body (1) is externally fixedly connected to a left bin (2), the device body (1) is externally fixedly connected to a right bin (3), the device body (1) is externally fixedly connected to a bottom guide rail (30), the bottom guide rail (30) is externally fixedly connected to an infrared receiving end (7), a movable groove (14) is provided on the outside of the right bin (3), the push plate (20) is movably connected inside the movable groove (14), the device body (1) is externally fixedly connected to a collecting bucket (6), and the left bin (2) and the right bin (3) are externally fixedly connected to the device body (1); The left side warehouse (2) and the right side warehouse (3) are fixedly connected to a hydraulic pump (10) on the outside, the hydraulic pump (10) is fixedly connected to a hydraulic rod (11) on the outside, the hydraulic rod (11) is fixedly connected to an L-shaped plate (12) on the outside, the test stylus (13) is fixedly connected to the outside of the L-shaped plate (12), the infrared transmitting end (26) is fixedly connected to the inside of the left side warehouse (2) and the right side warehouse (3), the left side warehouse (2) and the right side warehouse (3) are both fixedly connected to a correction motor (27), the end of the transmission shaft of the correction motor (27) is fixedly connected to a pressing gear (28), the pressing gear (28) is externally movably connected to a pressing belt (29), and the device body (1) is externally movably connected to a chip body (5).

2. A flash memory chip tester according to claim 1, characterized in that: The device body (1) is fixedly connected to a transmission motor (22) inside, the transmission shaft end of the transmission motor (22) is fixedly connected to a driving gear (23), the device body (1) is movably connected to a driven gear (25) outside, the device body (1) is movably connected to a driven roller (9) inside, the driven gear (25) and the driven roller (9) are movably connected to a conveyor belt (4) outside, the driven gear (25) and the driving gear (23) are movably connected to a transmission belt (24), and the device body (1) is fixedly connected to a guide bar (15) outside.

3. A flash memory chip testing machine according to claim 1, characterized in that: The equipment body (1) is fixedly connected to a waste discharge motor (16) inside, the end of the drive shaft of the waste discharge motor (16) is fixedly connected to an extension bracket (17), the extension bracket (17) is fixedly connected to a movable bracket (18) outside, the movable bracket (18) is movably connected to a connection base (19) outside one end away from the extension bracket (17), and the push plate (20) is fixedly connected to the outside of the connection base (19).

4. A flash memory chip testing machine according to claim 3, characterized in that: The left side bin (2) and the right side bin (3) are both provided with contact grooves (21) on the outside, the left side bin (2) and the right side bin (3) are both provided with movable grooves (14) on the outside, the bottom guide rails (30) are provided in two groups and are symmetrically distributed outside the equipment body (1), and the collecting bucket (6) is connected to the movable groove (14) in opposite directions.

5. A flash memory chip testing machine according to claim 1, characterized in that: The infrared receiving end (7) is vertically aligned with the infrared transmitting end (26), and a stable rotating shaft (8) is fixedly connected to the outside of the device body (1).

6. A flash memory chip testing machine according to claim 2, characterized in that: The guide bars (15) are in two groups and are symmetrically distributed outside the device body (1). The guide bars (15) are fixedly connected to the left bin (2) and the right bin (3).

7. A flash memory chip tester according to claim 5, characterized in that: The hydraulic rods (11) are in two groups and are symmetrically distributed outside the hydraulic pump (10); the test styluses (13) are in multiple groups and are evenly distributed outside the L-shaped plate (12).

8. A flash memory chip testing machine according to claim 1, characterized in that: The pressing gear (28) is movably connected to the left side bin (2) and the right side bin (3). There are two groups of the pressing gears (28) which are symmetrically distributed inside the left side bin (2) and the right side bin (3).

Images