A charging facility detector

Abstract

This application provides a charging facility tester, relating to the field of charging facility testing technology. The tester includes a communication interface, a communication device, an embedded microcontroller, and a human-machine interface. When testing a charging pile under test, the testing personnel can carry the tester to the location of the charging pile and establish a communication connection between the tester and the charging pile using the communication interface. The tester will then automatically perform the testing. Compared to traditional solutions, this application eliminates the need to transport the charging pile to a specific testing station, and testing personnel do not need to carry heavy objects such as laptops; they only need to carry the tester. This truly enables anytime, anywhere testing of charging piles, improving the convenience and flexibility of charging pile testing and reducing labor costs.

Description

[Technical field]

[0001] The present application relates to the technical field of charging facility detection, and in particular to a charging facility detector. [Background technology]

[0002] Compared with traditional cars, electric vehicles (battery electric vehicles, BEVs) have a relatively small impact on the environment, so their application prospects are widely optimistic. Usually, charging stations are set up in public places such as residential areas, shopping malls, and parking lots. The charging stations are equipped with several charging facilities (the most common form is charging piles). Each charging pile is used to charge electric vehicles to provide them with power. In this way, a single charging station can charge several electric vehicles at the same time.

[0003] In the related technologies, the operation and maintenance of charging piles is extremely important. The operation and maintenance mainly includes on-site acceptance and regular inspection of charging piles, which mainly inspect the communication quality of the charging piles and whether there are any faults, so as to ensure that the charging piles can be used normally. When operating and maintaining charging piles, the operation and maintenance personnel are usually required to carry detection equipment and laptops to the location of the charging piles for inspection. The convenience and flexibility of the inspection are both lacking, which not only prolongs the inspection time of a single charging pile, but also increases the labor cost. [Utility Model Content]

[0004] The present application provides a charging facility detector, which aims to solve the problem of lack of convenience and flexibility in operation and maintenance of charging piles in related technologies.

[0005] In order to solve the above technical problems existing in the related art, the present application provides a charging facility detector, which includes a communication interface, a communication device, an Internet of Things data acquisition device and a human-computer interaction device. The Internet of Things data acquisition device includes an embedded single-chip microcomputer based on an embedded operating system. The communication interface, the communication device, the embedded single-chip microcomputer and the human-computer interaction device are sequentially connected in communication. The communication interface is used to communicate with an external charging pile to be tested, and the human-computer interaction device is used to display the detection results of the charging pile to be tested. Specifically, the embedded single-chip microcomputer includes a power supply, a main chip, a power supply circuit, a reset circuit and a clock circuit. The main chip is electrically connected to the communication device and the human-computer interaction device, the power supply is electrically connected to the power supply circuit, the power supply circuit is electrically connected to the main chip, and the reset circuit and the clock circuit are electrically connected to the main chip respectively.

[0006] Through the implementation of the above technical solutions of the present application, a charging facility tester is jointly constituted by a communication interface, a communication device, an embedded single-chip microcomputer and a human-computer interaction device. Since the volume and weight of the communication interface, the communication device, the embedded single-chip microcomputer and the human-computer interaction device are relatively small, the volume and weight of the charging facility tester are also relatively small, which makes it convenient for testers to carry it with them. That is to say, when it is necessary to test the charging pile to be tested, the tester can carry the charging facility tester to the location of the charging pile to be tested, and use the communication interface to establish a communication connection between the charging facility tester and the charging pile to be tested, and then the charging facility tester will automatically test the charging pile to be tested. It can be seen that compared with the traditional solution, when testing the charging pile to be tested, the present application does not need to transport the charging pile to be tested to a specific testing station for testing, and the testers do not need to carry heavy objects such as laptops. They only need to carry a charging facility tester, which truly realizes the anytime and anywhere testing of the charging pile. It not only improves the convenience and flexibility of charging pile testing, but also shortens the testing time of a single charging pile, reduces the labor cost of charging pile testing, and also improves the maintainability of the charging pile in the later stage.

Brief Description of the Drawings

[0007] In order to more clearly illustrate the technical solutions in the related technologies or the embodiments of the present application, the drawings required for use in the description of the related technologies or the embodiments of the present application will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, not all embodiments. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0008] Figure 1 A schematic diagram of an application scenario of a charging facility detector provided in an embodiment of the present application;

[0009] Figure 2 A module block diagram of a charging facility detector provided in an embodiment of the present application;

[0010] Figure 3 A circuit schematic diagram of an embedded single-chip microcomputer provided in an embodiment of the present application;

[0011] Figure 4 Another module block diagram of the charging facility detector provided in an embodiment of the present application;

[0012] Figure 5 A schematic diagram of the circuit structure of the voice device provided in an embodiment of the present application. [Specific implementation method]

[0013] In order to make the purpose, technical solutions and advantages of the present application more obvious and easy to understand, the present application will be clearly and completely described below in conjunction with the embodiments of the present application and the corresponding drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. It should be understood that the various embodiments of the present application described below are only used to explain the present application and are not used to limit the present application, that is, based on the various embodiments of the present application, all other embodiments obtained by ordinary technicians in this field without making creative work belong to the scope of protection of the present application. In addition, the technical features involved in the various embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0014] In the related technologies, when operating and maintaining charging piles, the operators are usually required to carry detection equipment and laptop computers to the location of the charging piles for detection. The detection is not convenient and flexible, which not only prolongs the detection time of a single charging pile, but also increases the labor cost. For this reason, please refer to Figure 1 In the following embodiments, the present application proposes a charging facility detector 100. The application scenario of the charging facility detector 100 is as follows. Figure 1 As shown, the charging facility detector 100 can be carried by the inspector. When inspecting the charging pile, it is only necessary to electrically connect the charging facility detector 100 to the charging pile, thus truly realizing the detection of the charging pile anytime and anywhere, which not only improves the convenience and flexibility of the charging pile detection, but also reduces the labor cost of the charging pile detection.

[0015] Figure 2It is a module block diagram of a charging facility detector. In some embodiments, the charging facility detector 100 includes a communication interface 110, a communication device 120, an Internet of Things data acquisition device 130 and a human-computer interaction device 140. The Internet of Things data acquisition device 130 includes an embedded single-chip microcomputer 131 based on an embedded operating system, wherein the communication interface 110, the communication device 120, the embedded single-chip microcomputer 131 and the human-computer interaction device 140 are communicatively connected in sequence. In the actual detection process of the charging pile 200 to be tested, the communication interface 110 is used to communicate with the charging pile 200 to be tested; the communication device 120 is used to receive the test signal sent by the embedded single-chip microcomputer 131, and transmit the test signal to the charging pile 200 to be tested via the communication interface 110, and then receive the response signal fed back by the charging pile 200 to be tested for the test signal via the communication interface 110, and transmit the response signal to the embedded single-chip microcomputer 131; the embedded single-chip microcomputer 131 is used to determine whether the response signal is consistent with the preset communication protocol (such as 104 communication protocol), and obtain the communication detection result of whether the communication of the charging pile 200 to be tested is normal according to the judgment result; the human-computer interaction device 140 is used to display the communication detection result. For example, when the response signal is consistent with the preset communication protocol, the embedded single-chip microcomputer 131 can determine that the communication of the charging pile 200 to be tested is normal; on the contrary, when the response signal is inconsistent with the preset communication protocol, the embedded single-chip microcomputer 131 can determine that the communication of the charging pile 200 to be tested is abnormal.

[0016] Specifically, Figure 3 What is shown is a circuit schematic diagram of an embedded single-chip microcomputer. The embedded single-chip microcomputer 131 includes a power supply VDD, a main chip 1311, a power supply circuit 1312, a reset circuit 1313 and a clock circuit 1314. The power supply VDD is electrically connected to the power supply circuit 1312, the power supply circuit 1312 is electrically connected to the main chip 1311, the reset circuit 1313 and the clock circuit 1314 are electrically connected to the main chip 1311 respectively, and the communication interface 110, the communication device 120, the main chip 1311 and the human-computer interaction device 140 are communicatively connected in sequence. In practical applications, the power supply circuit 1312 can convert the power supply voltage provided by the power supply VDD into the voltage required for the operation of the main chip 1311, and then provide it to the main chip 1311; the reset circuit 1313 can realize the reset function of the main chip 1311, that is, automatic reset at power-on or manual reset by key; the clock circuit 1314 can generate a stable clock signal and provide it to the main chip 1311, and the main chip 1311 will use the clock signal provided by the clock circuit 1314 as a reference clock. Preferably, the main chip 1311 adopts an STM32 series chip.

[0017] Specifically, the communication device 120 is used to provide communication services for the charging facility detector 100, and the communication device 120 can meet the needs of communication testing and fault diagnosis. The communication mode of the communication device 120 includes wired communication (such as USB1.0 / 2.0 / 3.x, RJ45, RS232, RS48, etc.) and wireless communication (such as WiFi, Bluetooth and 2G / 3G / 4G / 5G communication, etc.), that is, the communication mode of the communication device 120 includes at least one of WiFi, Bluetooth, 2G communication, 3G communication, 4G communication and 5G communication, and the communication interface 110 includes at least one of a USB interface, an RJ45 interface, an RS232 interface, and an RS485 interface, in order to adapt to the communication standards of different charging piles 200 to be tested. The test personnel only need to connect the communication interface 110 of the charging facility detector 100 to the charging pile 200 to be tested, and can start working immediately without complicated settings, so that the charging facility detector 100 has high flexibility and versatility.

[0018] Furthermore, the IoT data acquisition device 130 includes an embedded single-chip microcomputer 131, which is based on an embedded operating system and has the ability to receive and send the power industry 104 communication protocol (i.e., the preset communication protocol mentioned above), and determines whether the charging pile 200 to be tested, which is connected to the charging facility detector 100, can communicate normally through the 104 communication protocol. The embedded single-chip microcomputer 131 based on the embedded operating system supports data analysis functions, which collects various communication data of the charging pile 200 to be tested from various communication interfaces 110, and analyzes these communication data through built-in algorithms to detect the integrity and accuracy of the 104 communication protocol, thereby completing the communication detection work of the charging pile 200 to be tested, and finally displays the communication detection results through the human-computer interaction device 140. Of course, the detection personnel can also export the communication detection results through the human-computer interaction device 140, or generate a QR code containing the communication detection results, so that other people can view the communication detection results by scanning the QR code.

[0019] It can be understood that the present application uses the communication interface 110, the communication device 120, the embedded single-chip computer 131 and the human-computer interaction device 140 to jointly constitute the charging facility detector 100. Since the volume and weight of the communication interface 110, the communication device 120, the embedded single-chip computer 131 and the human-computer interaction device 140 are relatively small, the volume and weight of the charging facility detector 100 are also relatively small, which makes it convenient for the detection personnel to carry it with them. That is to say, when it is necessary to test the charging pile 200 to be tested, the tester can carry the charging facility tester 100 to the location of the charging pile 200 to be tested, and use the communication interface 110 to establish a communication connection between the charging facility tester 100 and the charging pile 200 to be tested. After that, the charging facility tester 100 will automatically perform communication detection on the charging pile 200 to be tested, that is: the embedded single-chip computer 131 transmits the test signal to the charging pile 200 to be tested via the communication device 120 and the communication interface 110 in sequence, and receives the response signal fed back by the charging pile 200 to the test signal via the communication interface 110 and the communication device 120 in sequence. By judging whether the response signal is consistent with the preset communication protocol, the communication detection result of whether the communication of the charging pile 200 to be tested is normal can be obtained according to the judgment result, and finally the human-computer interaction device 140 displays the communication detection result to the tester. It can be seen that compared with the traditional solution, when testing the charging pile 200 to be tested, the present application does not need to transport the charging pile 200 to be tested to a specific testing station for testing, and the testers do not need to carry heavy objects such as laptops, but only need to carry a charging facility tester 100. In a true sense, it realizes the anytime and anywhere testing of the charging pile, which not only improves the convenience and flexibility of the charging pile testing, but also shortens the testing time of a single charging pile, reduces the labor cost of charging pile testing, and also improves the maintainability of the charging pile in the later stage.

[0020] As an example, see Figure 3The power supply circuit 1312 includes a fuse F1, a Zener diode D1, a linear regulator U1, a first capacitor C1, a second capacitor C2, a third capacitor C3 and a fourth capacitor C4. One end of the fuse F1 is electrically connected to the power supply VDD, and the other end of the fuse F1 is electrically connected to the anode of the Zener diode D1. The cathode of the Zener diode D1 is electrically connected to the input end of the linear regulator U1. The output end of the linear regulator U1 is electrically connected to the main chip 1311. The first capacitor C1 and the second capacitor C2 connected in parallel are electrically connected between the output end of the linear regulator U1 and the main chip 1311. The third capacitor C3 and the fourth capacitor C4 connected in parallel are electrically connected between the input end of the linear regulator U1 and the cathode of the Zener diode D1. The first capacitor C1, the second capacitor C2, the third capacitor C3 and the fourth capacitor C4 are all grounded GND. In this embodiment, the power supply VDD adopts 12V, and the 3.3V required for the operation of the main chip 1311 can be output through the linear regulator U1; the function of the fuse F1 and the voltage regulator diode D1 is to prevent certain chips on the embedded single-chip computer 131 from being damaged when mistakenly connected to an over-high power supply. Preferably, the fuse F1 uses a 16V 1A self-recovery fuse, and the voltage regulator diode D1 uses a Schottky diode with a withstand voltage of 14V (instantaneous maximum 20V); the first capacitor C1, the second capacitor C2, the third capacitor C3 and the fourth capacitor C4 are all filter capacitors, large capacitors filter low frequencies, and small capacitors filter high frequencies. The input filtering is to convert the input DC power with large fluctuations into DC power with small fluctuations for use by the linear regulator U1. The output filtering is because the linear regulator U1 needs to sample from the output and then perform feedback adjustment to achieve voltage stabilization, but the load such as the chip will change during use, and the voltage frequency fed back may conflict with the linear regulator U1, so the voltage stabilization output must also add a filter capacitor.

[0021] Further, the reset circuit 1313 includes a button K1, a first resistor R1, a second resistor R2 and a fifth capacitor C5, one end of the first resistor R1 is grounded GND, the other end of the first resistor R1 is electrically connected to the main chip 1311, one end of the second resistor R2 and one end of the fifth capacitor C5, the other end of the second resistor R2 and the other end of the fifth capacitor C5 are electrically connected to the two ends of the button K1, respectively, and the power supply VDD is electrically connected between the button K1 and the fifth capacitor C5. It should be noted that the reset signal of the main chip 1311 can be high level effective or low level effective, which can be specifically designed according to actual needs. The application will take high level effective as an example to illustrate the reset circuit 1313 below. It should also be noted that the reset circuit 1313 includes an automatic reset branch and a manual reset branch. The automatic reset branch is used to realize the automatic reset of the main chip 1311 when it is powered on, and the manual reset branch is used to realize the manual reset of the button of the main chip 1311.

[0022] In this embodiment, the automatic reset branch includes a first resistor R1 and a fifth capacitor C5. The fifth capacitor C5 is charged (equivalent to a short circuit) at the moment of power-on, which is equivalent to connecting the voltage of the power supply VDD to the main chip 1311, and the main chip 1311 is in a reset state; when the fifth capacitor C5 is fully charged, the voltage of the power supply VDD is disconnected from the main chip 1311 (the DC resistance characteristic of the capacitor), and the main chip 1311 is grounded to GND through the first resistor R1 to release the reset signal, and the main chip 1311 immediately enters the working state. The manual reset branch includes a button K1, a first resistor R1, and a second resistor R2. When the button K1 is pressed, the reset pin on the main chip 1311 electrically connected to the reset circuit 1313 is at a high level, so that the main chip 1311 enters the reset state; after releasing the button K1, the reset pin is grounded to GND through the first resistor R1 to release the reset signal, and the main chip 1311 immediately enters the working state.

[0023] Further, the clock circuit 1314 includes a crystal oscillator X1, a third resistor R3, a sixth capacitor C6 and a seventh capacitor C7, one end of the crystal oscillator X1 is electrically connected to one end of the sixth capacitor C6 and one end of the third resistor R3, the other end of the crystal oscillator X1 is electrically connected to one end of the seventh capacitor C7 and the other end of the third resistor R3, the other end of the sixth capacitor C6 and the other end of the seventh capacitor C7 are both grounded GND, and the two ends of the third resistor R3 are electrically connected to the main chip 1311. In this embodiment, the sixth capacitor C6 and the seventh capacitor C7 are both load capacitors, which will affect the resonant frequency and output amplitude of the crystal oscillator X1, and the capacity of the sixth capacitor C6 and the seventh capacitor C7 can be selected between 10 and 30 pF, which are mainly used to filter out the high-frequency signal of the crystal oscillator X1, so that the crystal oscillator X1 is more stable when working. It can be understood that the clock circuit 1314 is equivalent to the heart of the main chip 1311. Without the clock circuit 1314 to provide a reference clock for the main chip 1311, the main chip 1311 cannot work. The faster the clock frequency of the clock circuit 1314, that is, the larger the crystal value of the crystal oscillator X1, the faster the main chip 1311 runs. However, the faster the main chip 1311 runs, the more susceptible it is to interference, and its reliability will also decrease accordingly. Therefore, the clock circuit 1314 should be configured with a suitable clock frequency based on actual needs.

[0024] As an example, see Figure 3In addition to the circuits listed above, the embedded single-chip computer 131 also includes a decoupling circuit 1315, a filter circuit 1316 and a debugging circuit 1317, and the decoupling circuit 1315, the filter circuit 1316 and the debugging circuit 1317 are electrically connected to the main chip 1311. In some implementations of this embodiment, the decoupling circuit 1315 includes four capacitors, which are an eighth capacitor C8, a ninth capacitor C9, a tenth capacitor C10 and an eleventh capacitor C11, and the eighth capacitor C8, the ninth capacitor C9, the tenth capacitor C10 and the eleventh capacitor C11 are electrically connected to the main chip 1311 after being connected in parallel, and one end of the eighth capacitor C8, the ninth capacitor C9, the tenth capacitor C10 and the eleventh capacitor C11 are electrically connected to the power supply VDD, and the other ends of the eighth capacitor C8, the ninth capacitor C9, the tenth capacitor C10 and the eleventh capacitor C11 are grounded GND. It should be noted that the eighth capacitor C8 , the ninth capacitor C9 , the tenth capacitor C10 and the eleventh capacitor C11 are all decoupling capacitors, which are mainly used to filter out noise, thereby maintaining the stability of the voltage of each pin on the main chip 1311 .

[0025] In some implementations of this embodiment, the filter circuit 1316 includes a fourth resistor R4, a twelfth capacitor C12 and a thirteenth capacitor C13, the twelfth capacitor C12 and the thirteenth capacitor C13 are connected in parallel, the two ends of the twelfth capacitor C12 and the thirteenth capacitor C13 are electrically connected to the main chip 1311, one end of the twelfth capacitor C12 and the thirteenth capacitor C13 are both grounded GND, and the other end is electrically connected to one end of the fourth resistor R4, and the other end of the fourth resistor R4 is electrically connected to the power supply VDD. It should be noted that the twelfth capacitor C12 and the thirteenth capacitor C13 are both filter capacitors, mainly to obtain a more stable direct current, so as to power the analog parts such as the reset circuit 1313 and the clock circuit 1314.

[0026] In some implementations of the present embodiment, the debugging circuit 1317 includes a connector J1, a fifth resistor R5, and a sixth resistor R6. The connector J1 has a first pin, a second pin, a third pin, and a fourth pin. The fourth pin and the third pin are electrically connected to the main chip 1311, respectively. The second pin is grounded GND, one end of the fifth resistor R5 is electrically connected between the third pin and the main chip 1311, one end of the sixth resistor R6 is electrically connected between the fourth pin and the main chip 1311, the other ends of the fifth resistor R5 and the sixth resistor R6 are both electrically connected to the first pin, and the sixth resistor R6 is electrically connected to the first pin. The power supply VDD is electrically connected. In actual applications, the emulator can be electrically connected to the main chip 1311 through the connector J1, and then the relevant debugging program can be downloaded and the main chip 1311 can be debugged.

[0027] As one example, Figure 4 It is another module block diagram of a charging facility detector. In addition to a communication interface 110, a communication device 120, an embedded single-chip computer 131 and a human-computer interaction device 140, the charging facility detector 100 also includes a storage device 150 communicatively connected to the embedded single-chip computer 131. The storage device 150 pre-stores a first mapping table and a second mapping table. The first mapping table is used to indicate the mapping relationship between the type information of the charging pile 200 to be tested and the test signal. The second mapping table is established based on a preset communication protocol and is used to indicate the mapping relationship between the test signal and the response signal.

[0028] In the actual detection process of the charging pile 200 to be tested, the embedded single-chip microcomputer 131 is specifically used to: obtain the target type information of the charging pile 200 to be tested; based on the first mapping table and the target type information, obtain the target test signal corresponding to the target type information; based on the second mapping table and the target test signal, obtain the target response signal corresponding to the target test signal; transmit the target test signal to the charging pile 200 to be tested via the communication device 120 and the communication interface 110 in sequence; receive the response signal to be tested fed back by the charging pile 200 to the target test signal via the communication interface 110 and the communication device 120 in sequence; judge whether the response signal to be tested is consistent with the target response signal, and obtain the communication detection result of whether the communication of the charging pile 200 to be tested is normal according to the judgment result. Exemplarily, when the response signal to be tested is consistent with the target response signal, the embedded single-chip microcomputer 131 can determine that the communication of the charging pile 200 to be tested is normal; on the contrary, when the response signal to be tested is inconsistent with the target response signal, the embedded single-chip microcomputer 131 can determine that the communication of the charging pile 200 to be tested is abnormal.

[0029] Normally, the internal configuration of the charging pile 200 to be tested is a communication module similar to the communication device 120, and an interface module similar to the communication interface 110. The communication interface 110 of the charging facility detector 100 is actually connected to the interface module of the charging pile 200 to be tested, and the interface module of the charging pile 200 to be tested is connected to its own communication module. In this way, the communication between the charging pile 200 to be tested and the charging facility detector 100 is realized, and the communication detection performed on the charging pile 200 to be tested is essentially to detect whether the communication module in the charging pile 200 to be tested has normal communication function. However, for different types of charging piles 200 to be tested, different types of communication modules will be configured, and for different types of communication modules, their communication functions require different test signals to detect. Therefore, this embodiment establishes a first mapping table indicating the mapping relationship between the type information of the charging pile 200 to be tested and the test signal. Based on the first mapping table, it can be clear what the correct test signal is for each type of charging pile 200 (or communication module) to be tested. Correspondingly, for different test signals, the response signals fed back by the charging pile 200 to be tested will also be different. The present embodiment thus establishes a second mapping table indicating the mapping relationship between the test signal and the response signal based on the preset communication protocol. Based on the second mapping table, it can be clearly determined what the correct response signal is for each test signal, which facilitates the subsequent determination of whether the communication of the charging pile 200 to be tested is normal.

[0030] In addition, it should be noted that the target type information of the charging pile 200 to be tested can be input into the charging facility detector 100 by the test personnel, or read from the charging pile 200 to be tested in a "request-response" manner. It should also be noted that the storage device 150 is not only used to store the first mapping table and the second mapping table, but also to store the communication detection results and the fault detection results below, and can even be used to store various data in the communication detection process (such as target test data, target response data, response data to be tested, type information of the charging pile 200 to be tested, etc.) and various data in the fault detection process below (such as the sensor data of each sensor, the sensor data threshold value corresponding to each sensor data, etc.), and the storage device 150 supports the functions of local data storage and uploading to the cloud to facilitate future analysis and reporting.

[0031] As one of the embodiments, the charging pile 200 to be tested is internally configured with several sensors distributed at different positions. These sensors are usually used to implement various protection functions of the charging pile 200 to be tested, such as over-temperature protection, low-temperature protection, leakage current protection, overcurrent protection, overvoltage protection, undervoltage protection, etc. Taking over-temperature protection as an example, it is necessary to configure a temperature sensor in the charging pile 200 to be tested, and judge whether the charging pile 200 to be tested is over-temperature according to the temperature data detected by the temperature sensor. For example, the temperature data detected by the temperature sensor is compared with the preset temperature range. When the temperature data detected by the temperature sensor is higher than the preset temperature range, it can be determined that the charging pile 200 to be tested is in an over-temperature state, and then the over-temperature protection can be performed; of course, for low-temperature protection, when the temperature data detected by the temperature sensor is lower than the preset temperature range, it can be determined that the charging pile 200 to be tested is in a low-temperature state, and then the low-temperature protection can be performed. Similarly, leakage current protection and over-current protection both require the use of current sensors, and over-voltage protection and under-voltage protection both require the use of voltage sensors.

[0032] Based on this, in the actual detection process of the charging pile 200 to be tested, the embedded single chip computer 131 is also used to: send a data acquisition request to the charging pile 200 to be tested via the communication device 120 and the communication interface 110 in turn; receive the sensor data of each sensor fed back by the charging pile 200 to be tested in response to the data acquisition request via the communication interface 110 and the communication device 120 in turn; compare the sensor data with the corresponding sensor data threshold; obtain the fault detection result of the charging pile 200 to be tested according to the comparison result; wherein the fault detection result is used to indicate whether the charging pile 200 to be tested has a fault, and the fault point information when a fault exists. The human-computer interaction device 140 is also used to display the fault detection result.

[0033] For example, sensor a is provided at position A in the charging pile 200 to be tested, sensor b is provided at position B, sensor c is provided at position C, sensor d is provided at position D, and sensor e is provided at position E. The embedded single-chip computer 131 will compare the sensing data of the five sensors with their respective sensing data thresholds. Assuming that the comparison result of the sensing data of sensor b and the corresponding sensing data threshold indicates that the charging pile 200 to be tested has a fault (taking sensor b as a temperature sensor as an example, when its temperature data is higher than the preset temperature threshold, it indicates that the charging pile 200 to be tested has a fault), then the embedded single-chip computer 131 will obtain a fault detection result that the charging pile 200 to be tested has a fault, and the fault detection result also includes fault point information, that is, the fault point is located at position B in the charging pile 200 to be tested. It can be understood that this embodiment can quickly locate the fault point when the charging pile 200 to be tested has a fault, which helps to reduce the downtime of the charging pile 200 to be tested, realize rapid maintenance, reduce business interruption, and improve economic benefits.

[0034] As an example, see Figure 4 In addition to the communication interface 110, the communication device 120, the embedded single-chip microcomputer 131, the human-computer interaction device 140 and the storage device 150, the charging facility detector 100 also includes a voice device 160 that is communicatively connected to the embedded single-chip microcomputer 131. In this embodiment, after the embedded single-chip microcomputer 131 obtains the communication detection result of the charging pile 200 to be tested, in addition to displaying the communication detection result to the detection personnel through the human-computer interaction device 140, the communication detection result can also be broadcasted through the voice device 160. Exemplarily, when the communication detection result obtained by the embedded single-chip microcomputer 131 indicates that the communication of the charging pile 200 to be tested is normal, the embedded single-chip microcomputer 131 can control the voice device 160 to make a voice prompt such as "communication is normal"; conversely, when the communication detection result obtained by the embedded single-chip microcomputer 131 indicates that the communication of the charging pile 200 to be tested is abnormal, the embedded single-chip microcomputer 131 can control the voice device 160 to make a voice prompt such as "communication is abnormal". Similarly, the embedded single-chip computer 131 can also control the voice device 160 to broadcast the fault detection results. When the fault detection results obtained by the embedded single-chip computer 131 indicate that the charging pile 200 to be tested has no faults, the embedded single-chip computer 131 can control the voice device 160 to give voice prompts such as "no fault"; conversely, when the fault detection results obtained by the embedded single-chip computer 131 indicate that the charging pile 200 to be tested has a fault, the embedded single-chip computer 131 can control the voice device 160 to give voice prompts such as "there is a fault" and "fault point information".

[0035] In some implementations of this embodiment, Figure 51 is a circuit structure diagram of a voice device, wherein the voice device 160 includes a voice chip U2, a memory U3, a power amplifier, a fourteenth capacitor C14, a fifteenth capacitor C15, and a seventh resistor R7. A first terminal 16 of the voice chip U2 is electrically connected to the embedded single-chip computer 131 (i.e., the main chip 1311). A second terminal 1, a third terminal 2, and a fourth terminal 3 of the voice chip U2 are all electrically connected to the memory U3. A fifth terminal 4 of the voice chip U2 is grounded GND through the seventh resistor R7. A sixth terminal 12 of the voice chip U2 is electrically connected to the embedded single-chip computer 131 (i.e., the main chip 1311). The seventh terminal 11 is electrically connected to a power source (which may be the power supply VDD mentioned above, or other additional power sources), the eighth terminal 7, the ninth terminal 8 and the tenth terminal 13 of the voice chip U2 are all grounded GND, the eleventh terminal 10 of the voice chip U2 is electrically connected to the power amplifier device, one end of the fourteenth capacitor C14 and the fifteenth capacitor C15 are electrically connected to the sixth terminal 12 and the seventh terminal 11 of the voice chip U2 respectively, and the other ends of the fourteenth capacitor C14 and the fifteenth capacitor C15 are all grounded GND. It should be noted that the memory U3 is used to store predetermined voice contents such as "communication is normal" and "communication is abnormal"; when broadcasting through the voice device 160, the voice information to be broadcast can be input into the power amplifier device, and then broadcast after being amplified by the power amplifier device.

[0036] Furthermore, the power amplifier device includes an audio power amplifier chip U4 and a speaker LS1, the first end 4 and the second end 5 of the audio power amplifier chip U4 are electrically connected to the voice chip U2, the first end and the second end of the speaker LS1 are electrically connected to the third end 8 and the second end 5 of the audio power amplifier chip U4 respectively, the fourth end 6 of the audio power amplifier chip U4 is electrically connected to the power supply, and the fifth end 1, the sixth end 2, the seventh end 3 and the eighth end 7 of the audio power amplifier chip U4 are all grounded GND. In addition, the power amplifier device also includes an eighth resistor R8 and a ninth resistor R9, the eighth resistor R8 is electrically connected between the first end 4 of the audio power amplifier chip U4 and the voice chip U2, and the ninth resistor R9 is electrically connected between the second end 5 of the audio power amplifier chip U4 and the voice chip U2.

[0037] As an example, see Figure 4, the embedded single-chip computer 131 is provided with a power management unit 1318. In addition to the communication interface 110, the communication device 120, the embedded single-chip computer 131, the human-computer interaction device 140, the storage device 150 and the voice device 160, the charging facility detector 100 also includes a power interface 170. One end of the power interface 170 is electrically connected to the power management unit 1318, and the other end is used to be electrically connected to the external charging socket 300. In this embodiment, the power management unit 1318 can support a variety of power interfaces 170, such as a charging interface and a battery power supply interface, etc., to ensure that the charging facility detector 100 can operate independently in various situations. In view of this, the charging facility detector 100 will not rely on external equipment or a specific workstation, and has an independent power supply. The maintenance personnel only need to carry the small and portable charging facility detector 100 to test and repair the charging pile 200 to be tested on site, which improves the convenience and efficiency of the maintenance personnel's operation and reduces unnecessary labor costs.

[0038] As an example, see Figure 4 In addition to the power management unit 1318, the embedded single-chip computer 131 is also provided with an OTA unit 1319 for OTA upgrade, which enables the charging facility detector 100 to support remote firmware upgrades, and can ensure the latest and security of the system to adapt to new communication standards and functional requirements. In the actual OTA upgrade process, the OTA server can be connected through the communication interface 110, and the storage device 150 with storage function obtains the firmware upgrade package, and the OTA unit 1319 obtains the firmware upgrade package from the storage device 150 to perform OTA upgrade based on the firmware upgrade package, so that the OTA upgrade of the charging facility detector 100 is realized. Further, considering that the charging facility detector 100 is usually used on site, in order to ensure the reliability and durability of the charging facility detector 100 in harsh environments, the charging facility detector 100 can be designed to be dustproof and waterproof, so that the charging facility detector 100 can be used for a long time in outdoor and industrial environments without being easily disturbed by the external environment.

[0039] As one embodiment thereof, the human-computer interaction device 140 includes a touch display, such as a small LCD display, which is mainly used to display communication detection results and fault detection results. The detection personnel can easily view the detection results through the small LCD display and derive the corresponding QR code information when necessary. In addition, the detection personnel can also issue instructions through the small LCD display, such as issuing instructions such as the start of detection, the end of detection, and the switching of detection items (communication detection, fault detection, etc.). It is understandable that the small LCD display has good display capabilities, making the detection operation of the detection personnel more intuitive and more friendly to the detection personnel.

[0040] The above embodiments are only preferred implementations of the present application, and they are not the only limitations on the charging facility detector 100; in this regard, those skilled in the art can flexibly set them according to the actual application scenarios based on the above embodiments. It can be understood that, through the implementation of the above embodiments of the present application, the charging facility detector 100 is composed of the communication interface 110, the communication device 120, the embedded single-chip microcomputer 131 and the human-computer interaction device 140. Since the volume and weight of the communication interface 110, the communication device 120, the embedded single-chip microcomputer 131 and the human-computer interaction device 140 are relatively small, the volume and weight of the charging facility detector 100 are also relatively small, so that it is convenient for the detection personnel to carry it with them. That is to say, when it is necessary to perform communication detection on the charging pile 200 to be tested, the detection personnel can carry the charging facility detector 100 to the location of the charging pile 200 to be tested, and use the communication interface 110 to establish a communication connection between the charging facility detector 100 and the charging pile 200 to be tested, and then the charging facility detector 100 will automatically perform communication detection on the charging pile 200 to be tested. It can be seen that compared with the traditional solution, when the present application performs communication detection on the charging pile 200 to be tested, there is no need to transport the charging pile 200 to be tested to a specific testing station for communication detection, and the test personnel do not need to carry heavy objects such as laptops, but only need to carry a charging facility tester 100, which truly realizes the detection of charging piles at any time and anywhere, not only improves the convenience and flexibility of charging pile detection, but also shortens the detection time of a single charging pile, reduces the labor cost of charging pile detection, and also improves the maintainability of the charging pile in the later stage.

[0041] It should be noted that the several embodiments shown in the present application are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can refer to each other. It should also be noted that in the text description of the present application, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is such an actual relationship or order between these entities or operations. Further, the terms "include", "comprise" or any other corresponding variants are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements includes not only these elements, but also other elements that are not explicitly listed, or may also include elements inherent to such process, method, article or equipment; and, in the absence of more restrictions, the elements defined by the sentence "including one..." do not exclude the existence of other identical elements in the process, method, article or equipment including the elements.

[0042] In addition, by implementing the several embodiments shown above in the present application, professionals and technicians in this field can implement or use the present application. For the several embodiments shown above in the present application, various modifications will be obvious to professionals and technicians in this field, and the general principles defined in the present application can be implemented in other embodiments not shown without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the several embodiments shown above, but will comply with the widest range consistent with the principles and novel features disclosed in the present application.

Claims

1. A charging facility detector, characterized in that: It includes a communication interface, a communication device, an Internet of Things data acquisition device and a human-computer interaction device. The Internet of Things data acquisition device includes an embedded single-chip microcomputer based on an embedded operating system. The communication interface, the communication device, the embedded single-chip microcomputer and the human-computer interaction device are sequentially connected in communication. The communication interface is used to communicate with an external charging pile to be tested, and the human-computer interaction device is used to display the detection result of the charging pile to be tested. The embedded single-chip computer includes a power supply, a main chip, a power supply circuit, a reset circuit and a clock circuit. The main chip is electrically connected to the communication device and the human-computer interaction device, the power supply is electrically connected to the power supply circuit, the power supply circuit is electrically connected to the main chip, and the reset circuit and the clock circuit are electrically connected to the main chip respectively.

2. The charging facility detector according to claim 1, characterized in that: The power supply circuit includes a fuse, a voltage regulator diode, a linear voltage regulator, a first capacitor, a second capacitor, a third capacitor and a fourth capacitor. One end of the fuse is electrically connected to the power supply, and the other end of the fuse is electrically connected to the anode of the voltage regulator diode. The cathode of the voltage regulator diode is electrically connected to the input end of the linear voltage regulator. The output end of the linear voltage regulator is electrically connected to the main chip. The first capacitor and the second capacitor are electrically connected in parallel between the output end of the linear voltage regulator and the main chip. The third capacitor and the fourth capacitor are electrically connected in parallel between the input end of the linear voltage regulator and the cathode of the voltage regulator diode. The first capacitor, the second capacitor, the third capacitor and the fourth capacitor are all grounded.

3. The charging facility detector according to claim 1, characterized in that: The reset circuit includes a button, a first resistor, a second resistor and a fifth capacitor, one end of the first resistor is grounded, the other end of the first resistor is electrically connected to the main chip, one end of the second resistor and one end of the fifth capacitor, the other end of the second resistor and the other end of the fifth capacitor are electrically connected to the two ends of the button respectively, and the power supply is electrically connected between the button and the fifth capacitor.

4. The charging facility detector according to claim 1, characterized in that: The clock circuit includes a crystal oscillator, a third resistor, a sixth capacitor and a seventh capacitor. One end of the crystal oscillator is electrically connected to one end of the sixth capacitor and one end of the third resistor, the other end of the crystal oscillator is electrically connected to one end of the seventh capacitor and the other end of the third resistor, the other end of the sixth capacitor and the other end of the seventh capacitor are both grounded, and the two ends of the third resistor are respectively electrically connected to the main chip.

5. The charging facility detector according to claim 1, characterized in that: The embedded single-chip computer also includes a decoupling circuit electrically connected to the main chip, the decoupling circuit includes an eighth capacitor, a ninth capacitor, a tenth capacitor and an eleventh capacitor, the eighth capacitor, the ninth capacitor, the tenth capacitor and the eleventh capacitor are electrically connected to the main chip after being connected in parallel, one end of the eighth capacitor, the ninth capacitor, the tenth capacitor and the eleventh capacitor are all electrically connected to the power supply, and the other ends of the eighth capacitor, the ninth capacitor, the tenth capacitor and the eleventh capacitor are all grounded.

6. The charging facility detector according to claim 1, characterized in that: The embedded single-chip computer also includes a filtering circuit electrically connected to the main chip, the filtering circuit includes a fourth resistor, a twelfth capacitor and a thirteenth capacitor, the twelfth capacitor is connected in parallel with the thirteenth capacitor, both ends of the twelfth capacitor and the thirteenth capacitor are electrically connected to the main chip, one end of the twelfth capacitor and the thirteenth capacitor are grounded, and the other end is electrically connected to one end of the fourth resistor, and the other end of the fourth resistor is electrically connected to the power supply.

7. The charging facility detector according to claim 1, characterized in that: The embedded single-chip computer also includes a debugging circuit electrically connected to the main chip, the debugging circuit includes a connector, a fifth resistor and a sixth resistor, the connector has a first pin, a second pin, a third pin and a fourth pin, the fourth pin and the third pin are electrically connected to the main chip respectively, the second pin is grounded, one end of the fifth resistor is electrically connected between the third pin and the main chip, one end of the sixth resistor is electrically connected between the fourth pin and the main chip, the other ends of the fifth resistor and the sixth resistor are both electrically connected to the first pin, and the sixth resistor is electrically connected to the first pin. The power supply is electrically connected between the sixth resistor and the first pin.

8. The charging facility detector according to claim 1, characterized in that: It also includes a voice device communicatively connected to the embedded single-chip microcomputer, the voice device includes a voice chip, a memory, a power amplifier device, a fourteenth capacitor, a fifteenth capacitor and a seventh resistor, the first end of the voice chip is electrically connected to the embedded single-chip microcomputer, the second end, the third end and the fourth end of the voice chip are electrically connected to the memory, the fifth end of the voice chip is grounded through the seventh resistor, the sixth end and the seventh end of the voice chip are electrically connected to the power supply, the eighth end, the ninth end and the tenth end of the voice chip are grounded, the eleventh end of the voice chip is electrically connected to the power amplifier device, one end of the fourteenth capacitor and the fifteenth capacitor are electrically connected to the sixth end and the seventh end of the voice chip respectively, and the other ends of the fourteenth capacitor and the fifteenth capacitor are grounded.

9. The charging facility detector according to claim 8, characterized in that: The power amplifier device includes an audio power amplifier chip and a speaker, the first end and the second end of the audio power amplifier chip are electrically connected to the voice chip, the first end and the second end of the speaker are electrically connected to the third end and the second end of the audio power amplifier chip respectively, the fourth end of the audio power amplifier chip is electrically connected to the power supply, and the fifth end, the sixth end, the seventh end and the eighth end of the audio power amplifier chip are all grounded.

10. The charging facility detector according to claim 9, characterized in that: The power amplifier device also includes an eighth resistor and a ninth resistor, wherein the eighth resistor is electrically connected between the first end of the audio power amplifier chip and the voice chip, and the ninth resistor is electrically connected between the second end of the audio power amplifier chip and the voice chip.

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