Test auxiliary workpiece and resistance test probe
By designing test auxiliary workpieces for resistance testing, including fixed and support components, the problem of traditional resistance test meter pens being susceptible to human factors is solved, achieving higher test accuracy and safety.
Patent Information
- Application Number
- CN202420485411.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-13
- Publication Date
- 2025-04-11
- Estimated Expiration
- 2034-03-13
AI Technical Summary
Traditional resistance test pens require manual handheld, which makes the test results susceptible to human factors, have low accuracy, and may cause damage to the test points.
A test auxiliary workpiece is designed, including a connecting part, a supporting part and a fixing part. The test meter pen is fixed to the connecting part through the fixing part, and the support part supports the auxiliary workpiece on the object to be tested to ensure stable contact of the test meter pen.
Through the design of fixing and supporting components, the instability of applying pressure to the measured point when holding the test pen is reduced, the impact of human factors on the test results is reduced, and the accuracy and safety of the test are improved.
Smart Images
Figure CN222748626U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of testing instruments, and in particular to a test auxiliary workpiece and a resistance test probe. Background Art
[0002] Traditional resistance test probes need to be held manually and pierced into the test point for resistance testing. The test results are easily affected by human factors. Specifically, different pressures applied to the test point when holding the test probe will affect the test results, resulting in low accuracy of the test results. At the same time, it may also cause varying degrees of damage to the test point. Utility Model Content
[0003] Based on this, it is necessary to provide a test auxiliary workpiece and a resistance test probe. The test auxiliary workpiece of the present application can reduce the influence of human factors on the test results when the test probe is held in hand for testing.
[0004] In a first aspect, the present application provides a test auxiliary workpiece, comprising a connecting portion, a supporting portion and a fixing portion;
[0005] The fixing part is arranged on the connecting part, and the fixing part is used to fix the test probe on the connecting part;
[0006] The supporting portion is arranged on the surface of the connecting portion, and the surface of the supporting portion away from the connecting portion is a supporting surface, and the supporting surface is used to support the test auxiliary workpiece on the object to be tested.
[0007] In some embodiments, the fixing portion includes a clamping member, which is disposed on a surface of the connecting portion and can clamp the test probe.
[0008] In some embodiments, the fixing portion has a through hole, the through hole is opened on the connecting portion and penetrates the connecting portion along the thickness direction of the connecting portion, and the through hole is used for nesting the test probe;
[0009] The support portion is disposed on a surface of the connection portion that is perpendicular to a thickness direction of the connection portion and extends along the thickness direction of the connection portion.
[0010] In some embodiments, the test auxiliary workpiece further includes an elastic layer, and the elastic layer is disposed on a hole wall of the through hole.
[0011] In some embodiments, the through hole is a cylindrical hole.
[0012] In some embodiments, the support portion is in a rectangular parallelepiped structure, and there are multiple support portions, which are arranged at intervals.
[0013] In some embodiments, the support portion is transparent.
[0014] In some embodiments, the test auxiliary workpiece further includes an insulating layer, and the insulating layer is disposed on the supporting surface.
[0015] In a second aspect, the present application provides a resistance test lead, comprising the test auxiliary workpiece and the test lead as described in any one of the above items, wherein the test lead is connected to the connecting part through the fixing part.
[0016] In some embodiments, the test probe comprises a pen cover, a pen tip and a connecting wire;
[0017] The pen tip is used to contact the sample to be tested;
[0018] The pen cover is arranged on the periphery of the pen tip, and the pen cover can be nested with the fixing part;
[0019] The connecting wire is electrically connected to the pen tip.
[0020] The above-mentioned test auxiliary workpiece includes a connecting part, a supporting part and a fixing part. In actual use, the test probe can be first connected to the fixing part and fixed on the connecting part. After the test probe is adjusted to a suitable position in the fixing part, the supporting surface of the supporting part is placed on the object to be tested so that the tip of the test probe contacts the test point of the object to be tested. Through the fixation of the fixing part and the support of the supporting part, the test probe can stably test the test object, reducing the instability of the pressure applied to the test point when the test probe is held in hand for measurement, and can reduce the influence of human factors on the test result when the test probe is held in hand for testing. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 A schematic diagram of the structure of a test auxiliary workpiece provided in an embodiment of the present application;
[0022] Figure 2 A schematic diagram of the structure of a test auxiliary workpiece provided in yet another embodiment of the present application;
[0023] Figure 3 A schematic diagram of the structure of a resistance test probe provided in an embodiment of the present application;
[0024] Figure 4 This is a schematic diagram of using the resistance test probe of the present application to test a sample.
[0025] Description of Reference Numerals
[0026] 1. Test auxiliary workpiece; 11. Connecting part; 12. Supporting part; 13. Fixing part; 13a. Through hole; 13b. Clamping piece; 2. Test lead; 21. Pen cover; 22. Pen tip; 23. Connecting wire. DETAILED DESCRIPTION
[0027] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.
[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.
[0029] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0030] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, "plurality" means at least two, such as two, three, etc., unless otherwise clearly and specifically defined.
[0031] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0032] Reference Figure 1 and Figure 2 As shown, the present application provides a test auxiliary workpiece 1, comprising a connecting portion 11, a supporting portion 12 and a fixing portion 13. The fixing portion 13 is arranged on the connecting portion 11, and the fixing portion 13 is used to fix the test probe on the connecting portion 11. The supporting portion 12 is arranged on the surface of the connecting portion 11, and the surface of the supporting portion 12 away from the connecting portion 11 is a supporting surface, and the supporting surface is used to support the test auxiliary workpiece 1 on the object to be tested.
[0033] The above-mentioned test auxiliary workpiece 1 includes a connecting portion 11, a supporting portion 12 and a fixing portion 13. In actual use, the fixing portion 13 can be used to connect the test probe to fix the test probe on the connecting portion 11. After the test probe is adjusted to a suitable position in the fixing portion 13, the supporting surface of the supporting portion 12 is placed on the object to be tested so that the tip of the test probe contacts the test point of the object to be tested. Through the fixation of the fixing portion 13 and the support of the supporting portion 12, the test probe can stably test the test object, reducing the instability of the pressure applied to the test point when the test probe is held in hand for measurement, and reducing the influence of human factors on the test result when the test probe is held in hand for testing.
[0034] Reference Figure 2 As shown, in some embodiments, the fixing portion 13 includes a clamping member 13 b, which is disposed on the surface of the connecting portion 11 and can clamp the test lead.
[0035] In some embodiments, the clamping member 13b is an elastic clamping member 13b. In actual use, the position of the test probe in the clamping member 13b can be adjusted so that the test probe and the test point have a better contact effect during the test. At the same time, the clamping member 13b can also have a better fixing effect on the test probe.
[0036] Figure 2One of the possible implementation methods of the test auxiliary workpiece 1 of the present application is shown. In this implementation method, the fixing portion 13 includes a clamping member 13b, and the clamping member 13b is arranged on the surface of the connecting portion 11. In actual use, the test probe can be clamped in the clamping member 13b, and the test probe can be adjusted to a suitable position. For example, the test probe can be adjusted to the point where the pen tip of the test probe and the support surface are in the same plane. After adjusting the appropriate position of the test probe, the support surface of the support portion 12 is placed on the object to be tested, so that the pen tip of the test probe is in contact with the test point of the object to be tested, and a stable test is achieved.
[0037] Reference Figure 1 As shown, in some embodiments, the fixing portion 13 has a through hole 13a, which is opened on the connecting portion 11 and penetrates the connecting portion 11 along the thickness direction of the connecting portion 11, and the through hole 13a is used for the test probe to be nested. The supporting portion 12 is arranged on the surface of the connecting portion 11 perpendicular to the thickness direction of the connecting portion 11 and extends along the thickness direction of the connecting portion 11.
[0038] Figure 1 Another possible implementation method of the test auxiliary workpiece 1 of the present application is shown. In this implementation method, the fixing portion 13 has a through hole 13a that penetrates the connecting portion 11 along the thickness direction of the connecting portion 11, and the supporting portion 12 is arranged on the surface of the connecting portion 11 perpendicular to the thickness direction of the connecting portion 11 and extends along the thickness direction of the connecting portion 11. In actual use, the test probe can be inserted into the through hole 13a, and the test probe can be adjusted to a suitable position. After adjusting the suitable position of the test probe, the supporting surface of the supporting portion 12 is placed on the object to be tested, so that the tip of the test probe can contact the test point of the object to be tested, thereby achieving stable testing.
[0039] In some embodiments, the test auxiliary workpiece 1 further includes an elastic layer, and the elastic layer is disposed on the hole wall of the through hole 13 a.
[0040] An elastic layer is arranged on the hole wall of the through hole 13a. When in use, the elastic layer facilitates fixing the test probe inserted into the through hole 13a, and also facilitates adjusting the position of the test probe in the through hole 13a. Meanwhile, the elastic layer can also protect the test probe.
[0041] In some embodiments, the through hole 13a is a cylindrical hole.
[0042] The cylindrical through hole 13a is convenient for fixing commonly used test leads.
[0043] In some embodiments, the support portion 12 is a rectangular parallelepiped structure, and there are multiple support portions 12, which are arranged at intervals. Optionally, there are 2, 3, 4 or 5 support portions 12.
[0044] Reference Figure 1 and Figure 2 As shown, in some embodiments, the number of the support parts 12 is two, and the two rectangular support parts 12 are arranged in parallel and spaced apart, and the space between the two rectangular support parts 12 is for the test probe to pass through. The surface of the rectangular support part 12 away from the connecting part 11 is the support surface. The two parallel rectangular support parts 12 arranged in spaced apart manner facilitate the setting of the test auxiliary workpiece 1 on the object to be tested, and the support is relatively stable, so that the tip of the test probe can be in contact with the test point of the object to be tested, thereby achieving stable testing.
[0045] In some embodiments, the support portion 12 is transparent.
[0046] The transparent support portion 12 facilitates observation of the position of the test probe after it is installed on the test auxiliary workpiece 1, and facilitates adjustment of the position of the test probe.
[0047] In some embodiments, the connecting portion 11 is transparent.
[0048] In some embodiments, the test auxiliary workpiece 1 further includes an insulating layer, and the insulating layer is disposed on the supporting surface.
[0049] Refer again Figure 2 As shown, in a specific embodiment, the test auxiliary workpiece 1 includes a connecting portion 11, a supporting portion 12 and a fixing portion 13. The fixing portion 13 is arranged on the connecting portion 11, and the fixing portion 13 is used to fix the test probe on the connecting portion 11. The supporting portion 12 is arranged on the surface of the connecting portion 11, and the surface of the supporting portion 12 away from the connecting portion 11 is the supporting surface, and the supporting surface is used to support the test auxiliary workpiece 1 on the object to be tested. The fixing portion 13 includes a clamping member 13b, and the clamping member 13b is arranged on the surface of the connecting portion 11 parallel to the thickness direction of the connecting portion 11, and the clamping member 13b can clamp the test probe. In this embodiment, the clamping member 13b has a first elastic clamping portion and a second elastic clamping portion that can be opened and closed, and the first elastic clamping portion and the second elastic clamping portion can cooperate to clamp and fix the test probe. The supporting portion 12 is a rectangular parallelepiped structure, and the number of the supporting portions 12 is two, and the two rectangular parallelepiped supporting portions 12 are arranged in parallel and spaced apart. The supporting portion 12 is transparent. The test auxiliary workpiece 1 further comprises an insulating layer, which is arranged on the supporting surface.
[0050] Refer again Figure 1As shown, in a specific embodiment, the test auxiliary workpiece 1 includes a connecting portion 11, a supporting portion 12 and a fixing portion 13. The fixing portion 13 is arranged on the connecting portion 11, and the fixing portion 13 is used to fix the test probe on the connecting portion 11. The surface of the supporting portion 12 away from the connecting portion 11 is a supporting surface, and the supporting surface is used to support the test auxiliary workpiece 1 on the object to be tested. The fixing portion 13 has a through hole 13a, and the through hole 13a is opened on the connecting portion 11 and penetrates the connecting portion 11 along the thickness direction of the connecting portion 11. The through hole 13a is used for the nesting arrangement of the test probe. The supporting portion 12 is arranged on the surface of the connecting portion 11 perpendicular to the thickness direction of the connecting portion 11 and extends along the thickness direction of the connecting portion 11. The supporting portion 12 is a rectangular parallelepiped structure, the number of the supporting portions 12 is two, and the two rectangular parallelepiped supporting portions 12 are arranged in parallel and spaced apart. The supporting portion 12 is transparent. The test auxiliary workpiece 1 also includes an insulating layer, and the insulating layer is arranged on the supporting surface.
[0051] Reference Figure 3 As shown, another embodiment of the present application provides a resistance test probe, comprising any of the above-mentioned test auxiliary workpieces 1 and a test probe 2, wherein the test probe 2 is connected to the connecting portion 11 via a fixing portion 13.
[0052] Reference Figure 3 As shown, in some embodiments, the test probe 2 includes a pen cover 21, a pen tip 22 and a connecting line 23. The pen tip 22 is used to contact the sample to be tested. The pen cover 21 is sleeved on the periphery of the pen tip 22, and the pen cover 21 can be nested with the fixing part 13. The connecting line 23 is electrically connected to the pen tip 22.
[0053] Reference Figure 4 As shown, Figure 4 The present invention is a schematic diagram of using the resistance test pen of the present application to test a sample to be tested. When using the resistance test pen of the present application to test a sample to be tested, the position of the test pen 2 can be adjusted according to the specific conditions of the surface of the sample to be tested. For example, when the surface of the sample to be tested is flat, the top of the pen tip 22 can be adjusted to be on the same horizontal plane as the support surface, and then the support surface is brought into contact with the surface of the sample to be tested, and the test auxiliary workpiece 1 is placed on the surface of the sample to be tested. The pen tip 22 is brought into contact with the test point of the sample to be tested, and a stable test is performed.
[0054] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0055] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims, and the description and drawings may be used to interpret the contents of the claims.
Claims
1. A test auxiliary workpiece (1), characterized in that: It comprises a connecting portion (11), a supporting portion (12) and a fixing portion (13); The fixing portion (13) is arranged on the connecting portion (11), and the fixing portion (13) is used to fix the test probe on the connecting portion (11); The support portion (12) is arranged on the surface of the connecting portion (11), and the surface of the support portion (12) away from the connecting portion (11) is a support surface, and the support surface is used to support the test auxiliary workpiece (1) on the object to be tested.
2. The test auxiliary workpiece (1) according to claim 1, characterized in that: The fixing portion (13) comprises a clamping piece (13b), the clamping piece (13b) being arranged on the surface of the connecting portion (11), and the clamping piece (13b) being capable of clamping a test probe.
3. The test auxiliary workpiece (1) according to claim 1, characterized in that: The fixing portion (13) has a through hole (13a), the through hole (13a) is formed on the connecting portion (11) and penetrates the connecting portion (11) along the thickness direction of the connecting portion (11), and the through hole (13a) is used for nesting the test probe; The support portion (12) is arranged on a surface of the connection portion (11) perpendicular to the thickness direction of the connection portion (11) and extends along the thickness direction of the connection portion (11).
4. The test auxiliary workpiece (1) according to claim 3, characterized in that: The test auxiliary workpiece (1) further comprises an elastic layer, wherein the elastic layer is arranged on the hole wall of the through hole (13a).
5. The test auxiliary workpiece (1) according to claim 3, characterized in that: The through hole (13a) is a cylindrical hole.
6. The test auxiliary workpiece (1) according to any one of claims 1 to 5, characterized in that: The support portion (12) is in a rectangular parallelepiped structure, there are a plurality of the support portions (12), and the plurality of the support portions (12) are arranged at intervals.
7. The test auxiliary workpiece (1) according to any one of claims 1 to 5, characterized in that: The supporting portion (12) is transparent.
8. The test auxiliary workpiece (1) according to any one of claims 1 to 5, characterized in that: The test auxiliary workpiece (1) further comprises an insulating layer, wherein the insulating layer is arranged on the supporting surface.
9. A resistance test lead, characterized in that: It comprises the test auxiliary workpiece (1) and a test probe (2) as claimed in any one of claims 1 to 8, wherein the test probe (2) is connected to the connecting portion (11) via the fixing portion (13).
10. The resistance test probe according to claim 9, characterized in that: The test probe (2) comprises a pen cover (21), a pen tip (22) and a connecting line (23); The pen tip (22) is used to contact the sample to be tested; The pen cover (21) is sleeved on the periphery of the pen tip (22), and the pen cover (21) can be nested with the fixing portion (13); The connecting wire (23) is electrically connected to the pen tip (22).