A New DUT Test Board

Abstract

The utility model discloses a novel DUT test board, including a test board and a baffle, wherein the test board is installed with pins, and the outer side of the pins is provided with a signal selection unit, and the inner side of the pins is provided with an automatic switching unit, and the baffle is provided on the outer side of the test board, and the baffle is connected with an anti-slip mechanism, and the baffle is symmetrically distributed on the opposite sides of the test board. The novel DUT test board, the telescopic columns and telescopic springs arranged on both sides can push the moving plate to clamp and limit the opposite side walls of the to-be-tested products of different sizes, and thereby prevent the to-be-tested products from accidentally separating from the pins during the testing process, and the rubber pads prevent the moving plate from directly contacting the to-be-tested products, and thereby prevent the outer surface of the to-be-tested products from being worn during the clamping process, and when in use, the staff can manually slide the test board into the inner side of the slide groove, thereby realizing the connection between the test board and the anti-slip mechanism, and the disassembly and assembly process are simple and convenient.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit detection, in particular to a novel DUT test board. Background Art

[0002] DUT is the abbreviation of Device Under Test, which refers to the device being tested in the communication system. It is an effective device for testing and evaluating the performance of communication systems. DUT is widely used in communications. It can be used to test and evaluate the performance of communication systems, including transmission rate, delay, signal strength, signal-to-noise ratio, channel capacity, etc. It can also be used to test and evaluate the performance of new technologies, such as radio, optical fiber, Bluetooth, Wi-Fi, 4G / 5G, etc. DUT can also be used to test and evaluate the performance of network equipment, such as routers, switches, gateways, access points, etc. It can also be used to test and evaluate the performance of the network, such as network security, network traffic, network delay, etc. DUT can also be used to test and evaluate the reliability of network equipment, such as checking the stability, fault tolerance, scalability, etc. of the equipment.

[0003] At present, FT testing and VT testing usually require the use of different DUT test boards. After searching, it is found that the DUT test board in the prior art is typically such as the DUT test board with publication number CN107490755B and its use method. The DUT test board includes a power signal selection unit, a DUT signal selection unit and an automatic switching unit. The two selection ports of the DUT signal selection unit are used to output the required power signal, and then the Vpp signal is connected to any pin of the sample DUT to be tested, and the automatic switching unit is used to realize the automatic connection and disconnection of the Vpp signal. Therefore, it can meet the hardware requirements of FT testing and VT testing at the same time, and take into account the existing hardware settings and test procedures. Its main characteristics are simple structure, easy use and low detection cost.

[0004] In summary, the existing DUT test board is prone to accidental separation of the detection pins from the product to be tested due to external force during testing, which in turn affects the normal progress of the testing work. In view of the above problems, the existing equipment needs to be improved. Utility Model Content

[0005] The purpose of the utility model is to provide a novel DUT test board to solve the problem that the existing DUT test board proposed in the above background technology is prone to accidental separation of the detection pins and the product to be detected due to external force during testing, thereby affecting the normal progress of the detection work.

[0006] To achieve the above purpose, the utility model provides the following technical solutions: a new type of DUT test board, including a test board and a baffle,

[0007] Pins are installed on the test board, and a signal selection unit is arranged on the outside of the pins, and an automatic switching unit is arranged on the inside of the pins. The baffle is arranged on the outside of the test board, and the baffle is connected to the anti-slip mechanism, and the baffle is symmetrically distributed on two opposite sides of the test board.

[0008] Preferably, the test plate is slidably connected inside the slide groove, and the slide groove is opened on the inner wall of the baffle.

[0009] Preferably, the pins are arranged in four groups, and the pins are distributed on the test board in a rectangular array.

[0010] Preferably, the signal selection unit is arranged on one side of the test board, and the signal selection unit is arranged below the anti-dropping mechanism.

[0011] Preferably, the anti-slip mechanism comprises a telescopic column, a telescopic spring, a movable plate and a rubber pad, and the telescopic column is connected to the movable plate, and the movable plate is connected to the rubber pad.

[0012] Preferably, one end of the telescopic column away from the movable plate is connected to the inner wall of the baffle, and the movable plate is bonded to the rubber pad.

[0013] Preferably, a telescopic spring is arranged on the outer side of the telescopic column, and the telescopic spring and the telescopic column are symmetrically arranged between the moving plate and the baffle.

[0014] Preferably, the movable plate is arranged above the pins, and the movable plates are arranged opposite to each other.

[0015] Compared with the prior art, the utility model has the following beneficial effects: the new DUT test board,

[0016] (1) The utility model can effectively solve the problem that the detection pins of the existing DUT test board are easily separated from the test object due to external force during testing, thereby affecting the normal progress of the test work. The telescopic columns and telescopic springs arranged on both sides can push the movable plate to clamp and limit the two side walls of the test object of different sizes, thereby preventing the test object from accidentally separating from the pins during the test process. At the same time, the rubber pad prevents the movable plate from directly contacting the test object, thereby preventing the outer surface of the test object from being worn during the clamping process.

[0017] (2) The utility model can effectively solve the problem that the existing anti-slip structure is difficult to assemble by using the baffle and the slide groove in combination. When in use, the staff can manually slide the test plate into the inner slide groove to achieve the connection between the test plate and the anti-slip mechanism, and disassemble in the same way, and the disassembly and assembly process is simple and convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is an axonometric view of the utility model;

[0019] Figure 2 This is an overall schematic diagram of the position distribution of the pins, signal selection unit and automatic switching unit of the utility model on the test board;

[0020] Figure 3 It is a schematic diagram of the overall structure of the connection relationship between the slide groove, the baffle and the anti-slip mechanism of the utility model.

[0021] In the figure: 1. test board; 2. pin; 3. signal selection unit; 4. automatic switching unit; 5. slide slot; 6. baffle; 7. anti-slip mechanism; 701. telescopic column; 702. telescopic spring; 703. moving plate; 704. rubber pad. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0023] See also Figure 1-3 The utility model provides a technical solution: a new type of DUT test board,

[0024] Embodiment 1

[0025] like Figure 1 and Figure 2 As shown, a pin 2 is installed on the test board 1, and a signal selection unit 3 is arranged on the outer side of the pin 2, and an automatic switching unit 4 is arranged on the inner side of the pin 2. A baffle 6 is arranged on the outer side of the test board 1, and the baffle 6 is connected to the anti-slip mechanism 7, and the baffle 6 is symmetrically distributed on the opposite sides of the test board 1.

[0026] In a further embodiment, the test board 1 is slidably connected inside the slide groove 5 , and the slide groove 5 is opened on the inner wall of the baffle 6 .

[0027] In a further embodiment, four groups of pins 2 are provided, and the pins 2 are distributed on the test board 1 in a rectangular array.

[0028] In a further embodiment, the signal selection unit 3 is disposed on one side of the test board 1 , and the signal selection unit 3 is disposed below the anti-slip mechanism 7 .

[0029] Specifically, in the actual working process, the staff can manually slide the test board 1 into the inner slide groove 5. At this time, the anti-slip mechanism 7 is located above the test board 1. Then the staff can push the anti-slip mechanism 7 to move it to clamp and fix the product to be tested. At this time, the product to be tested is set above the automatic switching unit 4 and contacts with the pin 2. Then, the signal selection unit 3 is used to connect to the external power cord. Then, the test board 1 is placed on the external side viewing machine for testing. At this time, the automatic switching unit 4 automatically connects the Vpp signal and automatically disconnects the Vpp signal after the detection is completed.

[0030] Embodiment 2

[0031] This embodiment is a further description of the above embodiment. It should be understood that this embodiment includes all the aforementioned technical features and is further described in detail.

[0032] like Figure 1 and Figure 3 As shown, in a further embodiment, the anti-slip mechanism 7 includes a telescopic column 701, a telescopic spring 702, a movable plate 703 and a rubber pad 704, and the telescopic column 701 is connected to the movable plate 703, and the movable plate 703 is connected to the rubber pad 704.

[0033] In a further embodiment, one end of the telescopic column 701 away from the movable plate 703 is connected to the inner wall of the baffle 6 , and the movable plate 703 is bonded to the rubber pad 704 .

[0034] In a further embodiment, a telescopic spring 702 is disposed on the outer side of the telescopic column 701 , and the telescopic spring 702 and the telescopic column 701 are symmetrically disposed between the moving plate 703 and the baffle 6 .

[0035] In a further embodiment, the movable plate 703 is disposed above the pin 2 , and the movable plates 703 are disposed opposite to each other.

[0036] Specifically, manually squeeze and push the movable plates 703 on both sides to place the object to be detected on the pin 2 therebetween, and then end the squeezing operation. The movable plate 703 will move inward under the extension of the telescopic column 701 and the telescopic spring 702 to make the rubber pad 704 contact and limit the outer wall of the object to be detected, thereby preventing it from accidentally separating from the pin 2 during the detection process.

[0037] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art may still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the protection scope of the present invention.

Claims

1. A novel DUT test board, comprising a test board (1) and a baffle (6), characterized in that: The test board (1) is provided with a pin (2), and a signal selection unit (3) is provided on the outer side of the pin (2), and an automatic switching unit (4) is provided on the inner side of the pin (2); the baffle (6) is provided on the outer side of the test board (1), and the baffle (6) is connected to an anti-slip mechanism (7), and the baffle (6) is symmetrically distributed on two opposite sides of the test board (1); the anti-slip mechanism (7) comprises a telescopic column (701), a telescopic spring (702), a movable plate (703) and a rubber pad (704). ), and the telescopic column (701) is connected to the moving plate (703), and the moving plate (703) is connected to a rubber pad (704), one end of the telescopic column (701) away from the moving plate (703) is connected to the inner wall of the baffle (6), and the moving plate (703) and the rubber pad (704) are bonded, and a telescopic spring (702) is arranged on the outer side of the telescopic column (701), and the telescopic spring (702) and the telescopic column (701) are symmetrically arranged between the moving plate (703) and the baffle (6).

2. A novel DUT test board according to claim 1, characterized in that: The test plate (1) is slidably connected inside the slide groove (5), and the slide groove (5) is opened on the inner wall of the baffle (6).

3. A novel DUT test board according to claim 1, characterized in that: The pins (2) are arranged in four groups, and the pins (2) are distributed on the test board (1) in a rectangular array.

4. A novel DUT test board according to claim 1, characterized in that: The signal selection unit (3) is arranged on one side of the test board (1), and the signal selection unit (3) is arranged below the anti-slip mechanism (7).

5. A novel DUT test board according to claim 1, characterized in that: The movable plate (703) is arranged above the pin (2), and the movable plates (703) are arranged opposite to each other.

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