Chip multi-station testing device

Abstract

The utility model discloses a chip multi-station testing device, which belongs to the technical field of chips, and comprises a bottom plate, a placing plate is fixedly arranged at the top of the bottom plate, a double-station clamping assembly is arranged at the top of the placing plate, the double-station clamping assembly comprises an air cylinder, a sliding block is fixedly arranged at the output end of the air cylinder, and the sliding block is arranged at the output end of the air cylinder. The chips of different specifications and sizes are clamped and fixed through the shell, the adaptability of the device is greatly improved, the chips can keep stable positions and directions in the testing process, testing errors caused by movement or deviation of the chips are avoided, the accuracy of the testing result is ensured, and the testing efficiency is improved. At the moment, the chips can be automatically discharged conveniently, qualified and unqualified chips can be uniformly collected conveniently, and discharging errors caused by manual operation can be avoided, so that the discharging accuracy is improved, and labor force is greatly saved.

Description

Technical Field

[0001] The utility model relates to the technical field of chips, in particular to a chip multi-station testing device. Background Art

[0002] Nowadays, the use of semiconductor chips is relatively common in the field of electronics. Semiconductor chips are semiconductor devices that can realize certain functions by etching and wiring on semiconductor sheets. In the production and processing of semiconductor chips, semiconductor chips need to be inspected and processed, and semiconductor chip positioning and testing devices are usually used. However, there are still certain defects in the prior art. It is not possible to perform fixed inspection on chips on multiple stations at the same time and it is not possible to inspect chips of different sizes. This may cause the chip to shift and move during inspection, resulting in large errors in the test results and reduced adaptability of the device. In addition, the device is not convenient for automatic unloading and unified collection of unqualified and qualified semiconductor chips. Therefore, we propose a chip multi-station testing device to solve this problem. Utility Model Content

[0003] The purpose of the utility model is to provide a chip multi-station testing device to solve the problems raised in the above background technology.

[0004] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0005] A chip multi-station testing device comprises: a base plate, a placement plate is fixedly installed on the top of the base plate, a double-station clamping assembly is arranged on the top of the placement plate, the double-station clamping assembly comprises: a cylinder, a slider is fixedly installed on the output end of the cylinder, two groups of connecting rods are hinged on the top of the slider, one end of the two groups of connecting rods are hinged with a fixing block, the two groups of fixed blocks are fixedly installed with a clamping plate on the side away from each other, the two groups of clamping plates are arranged on the side away from each other, the two groups of fixing plates are fixedly connected to the placement plate, connecting frames are fixedly installed on both sides of the placement plate, and a test assembly is arranged on the side where the two groups of connecting frames are close to each other, the test assembly comprises: a bidirectional screw, the outer side of the bidirectional screw is threadedly connected with two groups of square nuts, and the bottom of the two groups of square nuts are fixedly installed with an all-round detection camera.

[0006] Preferably, two groups of electric push rods are provided on both sides of the placement plate, and rubber plates are fixedly installed on the output ends of the two groups of electric push rods located on the same side. Frames are fixedly installed on both sides of the placement plate, and two groups of transmission rollers are rotatably installed inside the two groups of frames, and conveyor belts are transmission-installed on the outer sides of the two groups of transmission rollers.

[0007] Preferably, the bidirectional screw is rotatably installed inside the two groups of connecting frames, and a motor 1 is fixedly installed on one side of the connecting frame located on the right side, and the output shaft of the motor 1 is fixedly connected to the bidirectional screw, and a motor 2 is fixedly installed on the side of the two groups of frames away from each other, and the two groups of motors 2 are respectively fixedly connected to the two groups of transmission rollers located on the left side.

[0008] Preferably, a limit plate is fixedly installed on the top of the placement plate, the sliding block is slidably installed on the outside of the limit plate, a sliding groove is opened on the top of the placement plate, two groups of limit blocks are slidably installed inside the sliding groove, and the two groups of limit blocks are respectively fixedly connected to the corresponding fixed blocks.

[0009] Preferably, two groups of limit rods are fixedly installed on one side of the two groups of connecting frames close to each other, and the two groups of limit rods are slidably installed inside the two groups of square nuts.

[0010] Preferably, four groups of fixing frames are fixedly installed on the top of the base plate, and the four groups of fixing frames are respectively fixedly connected to the corresponding electric push rods. A bracket is fixedly installed on one side of the placement plate, and the cylinder is fixedly installed on the top of the bracket.

[0011] In the utility model, a chip multi-station test device is provided with a double-station clamping assembly, a test assembly, a motor, a placement plate and a connecting frame. The staff puts the chips to be tested on the side close to the fixed plate respectively. At this time, the cylinder is driven to drive the slider at the output end to slide on the outside of the limit plate. The two groups of connecting rods hinged on the top of the slider and the two groups of fixing blocks hinged at the other ends of the two groups of connecting rods are used to drive the clamping plates on one side to move closer to and away from each other, so that the two groups of clamping plates can clamp and fix two groups of chips of different sizes. The chips of different sizes are clamped and fixed by the shell, which greatly improves the adaptability of the device, and enables the chip to maintain a stable position and direction during the test process, avoiding the test error caused by the movement or offset of the chip, ensuring the accuracy of the test result, and the multi-station test device can test multiple chips at the same time, which greatly improves the test efficiency and saves time cost.

[0012] In the utility model, a chip multi-station testing device is provided with an electric push rod, a rubber plate, a fixing frame, a frame, a second motor, a transmission roller and a conveyor belt, so that the electric push rod pushes the unqualified and qualified chips to the top of the conveyor belts on the front and rear sides respectively, and at this time, by driving the second motor, the second motor drives the transmission wheel and the conveyor belt on its outer side to drive, so that the chips can be automatically unloaded and the qualified and unqualified chips can be uniformly collected, which can avoid the unloading errors caused by manual operation, thereby improving the accuracy of unloading and greatly saving labor. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 This is a schematic diagram of the three-dimensional structure of a chip multi-station testing device proposed by the utility model;

[0014] Figure 2 This is a schematic diagram of the structure of the double-station clamping assembly proposed by the utility model;

[0015] Figure 3 This is a schematic diagram of the test assembly structure proposed by the utility model;

[0016] Figure 4 The utility model provides a schematic diagram of the transmission roller structure of a chip multi-station testing device.

[0017] In the figure: 1. bottom plate; 2. connecting frame; 3. placement plate; 4. double-station clamping assembly; 401. cylinder; 402. slider; 403. connecting rod; 404. fixing block; 405. clamping plate; 406. limit plate; 407. limit block; 408. bracket; 5. fixing plate; 6. test assembly; 601. limit rod; 602. two-way screw rod; 603. square nut; 604. all-round detection camera; 7. frame; 8. conveyor belt; 9. transmission roller; 10. electric push rod; 11. rubber plate; 12. motor one; 13. motor two. DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0019] Reference Figure 1-4 A chip multi-station testing device comprises: a bottom plate 1, a placement plate 3 is fixedly installed on the top of the bottom plate 1, a double-station clamping assembly 4 is arranged on the top of the placement plate 3, the double-station clamping assembly 4 comprises: a cylinder 401, a slider 402 is fixedly installed on the output end of the cylinder 401, two groups of connecting rods 403 are hinged on the top of the slider 402, one end of the two groups of connecting rods 403 are hinged with a fixed block 404, the two groups of fixing blocks 404 are fixedly installed with a clamping plate 405 on the side away from each other, and the two groups of clamping plates 405 are arranged with a fixing plate 5 on the side away from each other. The two groups of fixing plates 5 are fixedly connected to the placement plate 3, and the two sides of the placement plate 3 are fixedly installed with a connecting frame 2, and the side where the two groups of connecting frames 2 are close to each other is provided with a test assembly 6, and the test assembly 6 comprises: a bidirectional screw rod 602, the outer side of the bidirectional screw rod 602 is threadedly connected with two groups of square nuts 603, and the bottom of the two groups of square nuts 603 is fixedly installed with an all-round detection camera 604.

[0020] Preferably, two groups of electric push rods 10 are provided on both sides of the placement plate 3, and the output ends of the two groups of electric push rods 10 on the same side are fixedly installed with rubber plates 11, and frames 7 are fixedly installed on both sides of the placement plate 3. Two groups of transmission rollers 9 are rotatably installed inside the two groups of frames 7, and conveyor belts 8 are transmission-installed on the outer sides of the two groups of transmission rollers 9, so as to facilitate automatic unloading and unified collection of qualified and unqualified chips, and the bidirectional screw rod 602 is rotatably installed inside the two groups of connecting frames 2. A motor 12 is fixedly installed on one side of the connecting frame 2 on the right side, and the output shaft of the motor 12 is fixedly connected to the bidirectional screw rod 602. Motor 2 13 is fixedly installed on the sides of the two groups of frames 7 away from each other, and the two groups of motors 2 13 are respectively fixedly connected to the two groups of transmission rollers 9 on the left side, and the rotation of the bidirectional screw rod 602 is facilitated by the motor 12, so as to facilitate the detection of chips on the double workstations, and the rotation of the transmission roller 9 is facilitated by the motor 2 13, so as to facilitate the unified collection of qualified and unqualified chips.

[0021] Preferably, a limit plate 406 is fixedly installed on the top of the placement plate 3, and a slider 402 is slidably installed on the outer side of the limit plate 406. A slide groove is opened on the top of the placement plate 3, and two groups of limit blocks 407 are slidably installed inside the slide groove. The two groups of limit blocks 407 are respectively fixedly connected with the corresponding fixed blocks 404, which is convenient for clamping and fixing the chip. Two groups of limit rods 601 are fixedly installed on the side where the two groups of connecting frames 2 are close to each other. The two groups of limit rods 601 are slidably installed inside the two groups of square nuts 603 to prevent the square nuts 603 from shifting when moving. Four groups of fixing frames are fixedly installed on the top of the base plate 1, and the four groups of fixing frames are respectively fixedly connected with the corresponding electric push rods 10. A bracket 408 is fixedly installed on one side of the placement plate 3, and the cylinder 401 is fixedly installed on the top of the bracket 408, which is convenient for the stable operation of the cylinder 401 and the electric push rod 10.

[0022] In this embodiment, when in use, the staff puts the chips to be tested on one side close to the fixed plate 5, and at this time, the cylinder 401 is driven to drive the slider 402 at the output end to slide on the outside of the limit plate 406, and the two groups of connecting rods 403 hinged on the top of the slider 402 and the two groups of fixed blocks 404 hinged on the other ends of the two groups of connecting rods 403 make the slider 402 move and drive the limit blocks 407 at the bottom of the two groups of fixed blocks 404 to slide inside the slide groove, so that the two groups of fixed blocks 404 drive the clamping plates 405 on one side to move closer to and away from each other, so that the two groups of clamping plates 405 can clamp and fix two groups of chips of different sizes, and at this time, the motor 12 is driven to drive the bidirectional screw rod 602 to rotate, so that the bidirectional screw rod 602 drives the two groups of square The square nuts 603 move away from and close to each other, so that the omnidirectional detection cameras 604 at the bottom of the two groups of square nuts 603 move relative to each other, and can be moved according to the specific positions of the two groups of chips, so as to facilitate accurate detection of the two groups of chips at the same time. When the omnidirectional detection camera 604 detects unqualified chips, the electric push rod 10 located on the rear side is driven according to the corresponding work station, so that the electric push rod 10 pushes the unqualified chips to the top of the conveyor belt 8 located on the front side. At this time, the motor 2 13 is driven to drive the transmission wheel and the conveyor belt 8 on its outside. Similarly, when the chip is qualified, the electric push rod 10 located at the corresponding work station on the front side is driven to push the qualified chip to the top of the conveyor belt 8 on the rear side, thereby realizing automatic unloading and unified collection of qualified and unqualified chips.

[0023] The above is a detailed introduction to a chip multi-station testing device provided by the utility model. This article uses specific embodiments to explain the principle and implementation method of the utility model. The description of the above embodiments is only used to help understand the method and core idea of ​​the utility model. It should be pointed out that for ordinary technicians in this technical field, without departing from the principle of the utility model, the utility model can also be improved and modified, and these improvements and modifications also fall within the scope of protection of the claims of the utility model.

Claims

1. A chip multi-station testing device, characterized in that: include: A bottom plate (1), a placement plate (3) is fixedly installed on the top of the bottom plate (1), a double-station clamping assembly (4) is arranged on the top of the placement plate (3), and the double-station clamping assembly (4) comprises: a cylinder (401), a slider (402) is fixedly installed on the output end of the cylinder (401), two groups of connecting rods (403) are hinged on the top of the slider (402), one end of the two groups of connecting rods (403) are hinged with a fixed block (404), and the two groups of fixing blocks (404) are fixedly installed with a clamping plate (405) on the side away from each other, and the two groups of A fixing plate (5) is provided on the side away from each other of the clamping plates (405), and the two groups of the fixing plates (5) are fixedly connected to the placement plate (3). A connecting frame (2) is fixedly installed on both sides of the placement plate (3), and a test component (6) is provided on the side close to each other of the two groups of the connecting frames (2). The test component (6) includes: a bidirectional screw rod (602), and the outer side of the bidirectional screw rod (602) is threadedly connected to two groups of square nuts (603), and the bottom of the two groups of square nuts (603) is fixedly installed with an all-round detection camera (604).

2. A chip multi-station testing device according to claim 1, characterized in that: Two groups of electric push rods (10) are arranged on both sides of the placement plate (3), and rubber plates (11) are fixedly installed on the output ends of the two groups of electric push rods (10) located on the same side. Frames (7) are fixedly installed on both sides of the placement plate (3), and two groups of transmission rollers (9) are rotatably installed inside the two groups of frames (7), and conveyor belts (8) are transmission-installed on the outer sides of the two groups of transmission rollers (9).

3. A chip multi-station testing device according to claim 2, characterized in that: The bidirectional screw rod (602) is rotatably mounted inside the two groups of connecting frames (2); a motor one (12) is fixedly mounted on one side of the connecting frame (2) on the right; the output shaft of the motor one (12) is fixedly connected to the bidirectional screw rod (602); motor two (13) is fixedly mounted on the sides of the two groups of frames (7) away from each other; the two groups of motor two (13) are respectively fixedly connected to the two groups of transmission rollers (9) on the left.

4. A chip multi-station testing device according to claim 1, characterized in that: A limiting plate (406) is fixedly installed on the top of the placement plate (3), and the sliding block (402) is slidably installed on the outside of the limiting plate (406). A sliding groove is opened on the top of the placement plate (3), and two groups of limiting blocks (407) are slidably installed inside the sliding groove. The two groups of limiting blocks (407) are respectively fixedly connected to the corresponding fixed blocks (404).

5. A chip multi-station testing device according to claim 1, characterized in that: Two groups of limiting rods (601) are fixedly installed on the side where the two groups of connecting frames (2) are close to each other, and the two groups of limiting rods (601) are slidably installed inside the two groups of square nuts (603).

6. A chip multi-station testing device according to claim 1, characterized in that: Four groups of fixing frames are fixedly installed on the top of the base plate (1), and the four groups of fixing frames are respectively fixedly connected to the corresponding electric push rods (10). A bracket (408) is fixedly installed on one side of the placement plate (3), and the cylinder (401) is fixedly installed on the top of the bracket (408).

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