Type-C interface test fixture and test system

Abstract

The utility model relates to the technical field of communication, and discloses a Type-C interface test fixture and a test system, comprising a first plate body; the first Type-C interface is arranged on the first board body; the plurality of transmission signal lines are respectively connected with the first Type-C interface; and the pair of first Tx test female heads, the pair of second Tx test female heads, the pair of first Rx test female heads, the pair of second Rx test female heads and the pair of USB2.0 test female heads are arranged on the first board body and are connected with the transmission signal lines in a one-to-one correspondence manner. The Type-C interface USB2.0 and USB3.0 signal testing device can be used for signal testing of USB2.0 and USB3.0 of a Type-C interface, signals of a source end and signals of an equipment end can be tested, and testing convenience is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of communications, and in particular to a Type-C interface test fixture and a test system. Background Art

[0002] With the development of electronic devices, the application of USB (Universal Serial Bus) is becoming more and more widespread. In addition to Type-A and Type-B interfaces, Type-C interface has become the "standard configuration" of electronic devices because it can be used in both forward and reverse directions. Moreover, some devices, such as all-in-one computers and mobile phones, can use Type-C interfaces to send signals as a source (host) and receive signals as a device (such as storage, display, etc.). However, the current signal test fixture cannot simultaneously meet the signal testing of the USB2.0 and USB3.0 source and device ends of the Type-C interface. Utility Model Content

[0003] In view of this, the utility model provides a Type-C interface test fixture and a test system to solve the problem that the source and device end signal tests of USB2.0 and USB3.0 of the Type-C interface cannot be satisfied at the same time.

[0004] In a first aspect, the utility model provides a test fixture for a Type-C interface, comprising:

[0005] A first plate body;

[0006] A first Type-C interface, provided on the first board;

[0007] A plurality of transmission signal lines, respectively connected to the first Type-C interface;

[0008] A pair of first Tx test female connectors, a pair of second Tx test female connectors, a pair of first Rx test female connectors, a pair of second Rx test female connectors and a pair of USB2.0 test female connectors are all arranged on the first board and connected to the transmission signal lines in a one-to-one correspondence.

[0009] Beneficial effects: On the first board, transmission signal lines are used to route from the first Type-C interface to a pair of first Tx test female heads, a pair of second Tx test female heads, a pair of first Rx test female heads, a pair of second Rx test female heads and a pair of USB2.0 test female heads respectively; when performing USB signal testing, the first Type-C interface is connected to the device to be tested, and the test tool is connected to the pair of first Tx test female heads to test the USB3.0 signal; or the test tool is connected to the pair of second Tx test female heads to test the USB3.0 signal; the test tool is connected to a pair of USB2.0 test female heads to test the USB2.0 signal; it is used for USB2.0 and USB3.0 signal testing at the same time, and both source-end and device-end signals can be tested, thereby improving the convenience of testing.

[0010] In an optional embodiment, the test fixture further includes:

[0011] The first test pin header and the second test pin header are both arranged on the first board and connected to the pair of USB2.0 test female connectors through the transmission signal line.

[0012] Beneficial effect: By arranging the first test pin row and the second test pin row on the first board, and connecting the first test pin row and the second test pin row with a pair of USB2.0 test female plugs through the transmission line number line on the first board, when testing the USB2.0 signal, not only can a pair of USB2.0 test female plugs be selected, but also the first test pin row and the second test pin row can be selected to test the USB2.0 signal, thereby increasing the adaptability of the USB2.0 signal test.

[0013] In an optional embodiment, the test fixture further includes:

[0014] A first test point is provided on the first board and connected to the first test pin row through the transmission signal line;

[0015] The second test point is arranged on the first board and connected to the second test pin row through the transmission signal line.

[0016] Beneficial effect: By setting the first test point and the second test point on the first board, and connecting the first test point with the first test pin through the transmission line on the first board, and connecting the second test point with the second test pin, when testing the USB2.0 signal, you can further choose to connect the first test point and the second test point to test the USB2.0 signal, so as to further increase the adaptability of the USB2.0 signal test.

[0017] In an optional embodiment, the test fixture further includes:

[0018] A first resistor, disposed on the first board and connected to the first test point through the transmission signal line;

[0019] The second resistor is arranged on the first board and connected to the second test point through the transmission signal line.

[0020] Beneficial effect: By arranging the first resistor and the second resistor on the first board, it is possible to avoid the situation where the impedance is difficult to control and the impedance mismatch occurs due to too many wirings, and the overall impedance is effectively stabilized.

[0021] In an optional implementation, both the first test point and the second test point are pads welded on the first board.

[0022] Beneficial effect: By setting the soldering pad on the first board, when the USB2.0 signal test is performed using the soldering pad, there is no requirement for the probe spacing of the probe rod, making the test more adaptable.

[0023] In an optional embodiment, the test fixture further includes:

[0024] The second Type-C interface is used to connect a power source. The second Type-C interface is arranged on the first board and is connected to the first Type-C interface through the transmission signal line.

[0025] Beneficial effect: By setting a second Type-C interface for connecting a power supply on the USB signal test fixture, when testing the Type-C interface signal of a device used as a device end, the external power supply is connected to the second Type-C interface, that is, the USB signal can be tested on the test fixture without adding additional test tools, thereby improving the convenience of testing.

[0026] In an optional embodiment, the test fixture further includes:

[0027] A ground pin header, disposed on the first board, and connected to the first Type-C interface and the second Type-C interface respectively through the transmission signal line;

[0028] The power pin header is arranged on the first board and is respectively connected to the first Type-C interface and the second Type-C interface through the transmission signal line.

[0029] Beneficial effect: By setting the ground pin and the power pin, when testing the Type-C interface signal of the device used as the device end, the external power supply can also be connected to the ground pin and the power pin, which increases the adaptability of the power supply access and improves the convenience of testing.

[0030] In a second aspect, the utility model further provides a testing system, comprising:

[0031] Type-C to Type-A adapter;

[0032] The Type-C interface test fixture mentioned above, wherein the Type-C to Type-A adapter matches the first Type-C interface;

[0033] In an optional implementation, the Type-C to Type-A adapter includes a second plate body;

[0034] A Type-C plug, disposed on the second board body and matching the first Type-C interface;

[0035] Type-A interface, provided on the second board;

[0036] The Type-A interface and the Type-C plug are connected on the second board through a transmission signal line.

[0037] Beneficial effect: By setting a Type-C plug on the Type-C to Type-A adapter, when testing the USB signal of a device with a Type-A interface, the Type-C plug is connected to the first Type-C interface on the test fixture, and the USB signal of the device with the Type-A interface can be tested on the test fixture without the need for additional test tools, effectively reducing the cost of testing.

[0038] In an optional implementation, the Type-A interface includes a pair of Tx pins, a pair of Rx pins, a pair of second USB2.0 pins, a second ground pin, and a second power pin, which are respectively connected to the transmission signal line;

[0039] The Type-C plug includes a pair of Tx1 pins, a pair of Tx2 pins, a pair of Rx1 pins, a pair of Rx2 pins, a pair of first USB2.0 pins, a first ground pin and a first power pin, which are respectively connected to the transmission signal lines in a one-to-one correspondence;

[0040] The pair of Tx1 pins are connected to the pair of Tx2 pins, and are connected to the pair of Tx pins via a transmission signal line;

[0041] The pair of Rx1 pins are connected to the pair of Rx2 pins, and are connected to the pair of Rx pins through a transmission signal line.

[0042] Beneficial effect: By connecting a pair of Tx1 pins and a pair of Tx2 pins, and connecting them to a pair of Tx pins through a transmission signal line; and connecting a pair of Rx1 pins and a pair of Rx2 pins, and connecting them to a pair of Rx pins through a transmission signal line; when performing USB signal testing on a device with a Type-A interface, any group of signals on the test fixture board can be selected, without first verifying from which group of Type-C signals the USB signal of the Type-A interface is transferred, which saves time and energy and improves test efficiency.

[0043] The first ground pin, the first power pin and a pair of first USB2.0 pins of the Type-C plug are connected one-to-one with the second ground pin, the second power pin and a pair of second USB2.0 pins of the Type-A interface respectively, so as to ensure signal intercommunication and compatibility between the Type-C plug and the Type-A interface, ensure normal transmission of power, and enable the device to work normally. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the specific implementation methods of the utility model or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0045] Figure 1 A schematic diagram of the structure of a test fixture board according to an embodiment of the utility model;

[0046] Figure 2 This is a schematic diagram of the structure of a Type-C to Type-A adapter in a test system according to an embodiment of the present invention.

[0047] Description of reference numerals:

[0048] 11. First board; 12. First Type-C interface; 13. Second Type-C interface; 14a. A pair of first Tx test female connectors; 141. Tx1+ test female connectors; 142. Tx1- test female connectors; 14b. A pair of second Tx test female connectors; 143. Tx2+ test female connectors; 144. Tx2- test female connectors; 15a. A pair of first Rx test female connectors; 151. Rx1+ test female connectors; 152. Rx1- test female connectors; 15b. A pair of second Rx test female connectors; 153. Rx2+ test female connectors; 154. Rx2- test female connectors; 16. A pair of USB2.0 test female connectors; 161. USB2.0+ test female connectors; 162. USB2.0- test female connectors; 163. First test Pin header; 164, second test pin header; 165, first test point; 166, second test point; 171, first resistor; 172, second resistor; 18, power pin header; 19, ground pin header; 20, transmission signal line; 21, second board; 22, Type-C plug; 221, a pair of Tx1 pins; 222, a pair of Tx2 pins; 223, a pair of Rx1 pins; 224, a pair of Rx2 pins; 225, a pair of first USB2.0 pins; 226, a first ground pin; 227, a first power pin; 23, Type-A interface; 231, a pair of Tx pins; 232, a pair of Rx pins; 233, a pair of second USB2.0 pins; 234, a second ground pin; 235, a second power pin. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical solution and advantages of the embodiment of the utility model clearer, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is a part of the embodiment of the utility model, not all the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the utility model.

[0050] According to an embodiment of the present utility model, on the one hand, as Figure 1 As shown, a Type-C interface test fixture is provided, including: a first board body 11; a first Type-C interface 12, which is arranged on the first board body 11; a plurality of transmission signal lines 20, which are respectively connected to the first Type-C interface 12; a pair of first Tx test female connectors 14a, a pair of second Tx test female connectors 14b, a pair of first Rx test female connectors 15a, a pair of second Rx test female connectors 15b and a pair of USB2.0 test female connectors 16, which are all arranged on the first board body 11 and connected to the transmission signal lines 20 one by one.

[0051] In this embodiment, the first board body 11 can be a multi-layer printed circuit board, a pair of first Tx test female connectors 14a include a Tx1+ test female connector 141 and a Tx1- test female connector 142, a pair of second Tx test female connectors 14b include a Tx2+ test female connector 143 and a Tx2- test female connector 144, a pair of first Rx test female connectors 15a include an Rx1+ test female connector 151 and an Rx1- test female connector 152, a pair of second Rx test female connectors 15b include an Rx2+ test female connector 153 and an Rx2- test female connector 154, and a pair of USB2.0 test female connectors 16 include a USB2.0+ test female connector 161 and a USB2.0- test female connector 162.

[0052] On the multi-layer printed circuit board, a transmission signal line 20 is used to route from the first Type-C interface 12 to Tx1+ test female connector 141, Tx1- test female connector 142, Tx2+ test female connector 143, Tx2- test female connector 144, Rx1+ test female connector 151, Rx1- test female connector 152, Rx2+ test female connector 153, Rx2- test female connector 154, USB2.0+ test female connector 161 and USB2.0- test female connector 162; when performing USB2.0 and USB3.0 signal tests, The test fixture is connected to the source end through the first Type-C interface 12, and then the test tool is used to directly connect the corresponding test female head. By connecting the test tool to Tx1+ test female head 141 and Tx1- test female head 142, or connecting Tx2+ test female head 143 and Tx2- test female head 144, the USB3.0 signal of the source end can be tested; when testing the USB2.0 signal of the source end, an oscilloscope with a single-ended probe can be used to connect the USB2.0+ test female head 161 to test the USB2.0 signal of the source end. The test fixture in this embodiment can be used for USB2.0 and USB3.0 signal testing at the same time, making the adaptability of the test fixture more extensive and effectively reducing the testing cost.

[0053] In one embodiment, the test fixture further includes: a first test pin header 163 and a second test pin header 164 are both disposed on the first board 11 , and are connected to a pair of USB 2.0 test female connectors 16 via a transmission signal line 20 .

[0054] In this embodiment, by arranging a first test pin 163 and a second test pin 164 on the first board 11, and connecting the first test pin 163 with the USB2.0+ test female connector 161 and the second test pin 164 with the USB2.0- test female connector 162 on the first board 11 through the transmission signal line 20, when testing the USB2.0 signal, not only the USB2.0+ test female connector 161 and the USB2.0- test female connector 162 can be selected, but also the first test pin 163 and the second test pin 164 can be selected to test the USB2.0 signal; if the probe used by the oscilloscope is a differential probe, the differential probe can be used to connect to the first test pin 163 and the second test pin 164 to test the USB2.0 signal, thereby increasing the adaptability of the USB2.0 signal test.

[0055] In one embodiment, the test fixture further includes: a first test point 165, which is arranged on the first board 11 and connected to the first test pin 163 through the transmission signal line 20; a second test point 166, which is arranged on the first board 11, and the transmission signal line 20 is connected to the second test pin 164. Further, the first test point 165 and the second test point 166 are both solder pads on the first board 11.

[0056] In this embodiment, by setting the first test point 165 and the second test point 166 on the first board 11, and connecting the first test point 165 with the first test pin 163 and the second test point 166 with the second test pin 164 through the transmission signal line 20 on the first board 11, when testing the USB2.0 signal, the first test point 165 and the second test point 166 can be further selected to test the USB2.0 signal, thereby further increasing the adaptability of the USB2.0 signal test. The solder pad is set on the first board 11, so that when testing the signal, the test point can be contacted more directly, thereby improving the measurement accuracy; the solder pad connection is relatively firm, which is suitable for long-term testing and monitoring; when using the solder pad to test the USB2.0 signal, there is no requirement for the probe spacing of the differential probe, thereby making the test more adaptable.

[0057] In one embodiment, the test fixture further includes: a first resistor 171, which is disposed on the first board 11 and connected to the first test point 165 through the transmission signal line 20; a second resistor 172, which is disposed on the first board 11 and connected to the second test point 166 through the transmission signal line 20.

[0058] Since there are many interfaces on the USB2.0± signal routing and the routing length is long, the resistance and impedance increase; when the impedance is too large, the signal may be distorted, thereby affecting the accuracy of the test data. Therefore, in this embodiment, by setting the first resistor 171 and the second resistor 172 on the first plate 11, the impedance matching between different parts of the circuit is improved to avoid the impedance being difficult to control due to too many routings and the impedance mismatch, and effectively stabilize the overall impedance, so that the test results are more accurate. Among them, the resistance value of the first resistor 171 and the second resistor 172 can be 40Ω to 50Ω, for example, 40Ω, 45Ω, 50Ω, etc. The resistance value of the first resistor 171 and the second resistor 172 can be selected according to actual needs, and the resistance value of the first resistor 171 and the second resistor 172 can be the same or different, without specific limitation.

[0059] In one of the embodiments, the test fixture further includes: a second Type-C interface 13 for connecting a power source, the second Type-C interface 13 is disposed on the first board 11 and connected to the first Type-C interface 12 via a transmission signal line 20 .

[0060] In this embodiment, when testing the USB3.0 signal of the Type-C interface of the device used as the device end, the external power supply is connected to the second Type-C interface 13, and then the test tool is used to directly connect the corresponding test female head. By connecting the test tool to the Tx1+ test female head 141 and the Tx1- test female head 142, or connecting the Tx2+ test female head 143 and the Tx2- test female head 144, the USB3.0 signal of the device end can be tested; when testing the USB2.0 signal of the device end, an oscilloscope with a single-ended probe can be used to connect the USB2.0+ test female head 161 to test the USB2.0 signal of the device end; or a differential probe can be used to connect the first test pin row 163 and the second test pin row 164; or a differential probe can be used to connect the first test point 165 and the second test point 166 to complete the test of the USB2.0 signal. When conducting signal testing, there is no need to add additional testing tools, and the Type-C charging interface is widely used in today's society. The power charging design is a Type-C charging interface, which greatly improves the convenience of testing.

[0061] In one embodiment, the test fixture also includes: a ground pin 19, which is arranged on the first board 11 and is respectively connected to the first Type-C interface 12 and the second Type-C interface 13 through the transmission signal line 20; a power pin 18, which is arranged on the first board 11 and is respectively connected to the first Type-C interface 12 and the second Type-C interface 13 through the transmission signal line 20.

[0062] In this embodiment, by setting the ground pin 19 and the power pin 18, when testing the Type-C interface signal of the device used as the device end, the external power supply can also be connected to the ground pin 19 and the power pin 18; the power charging is designed as two modes of Type-C charging interface and pin charging port, which increases the adaptability of power access and improves the convenience of testing.

[0063] Second, as Figure 2 As shown, the utility model also provides a test system, including: a Type-C to Type-A adapter; a Type-C interface test fixture, the Type-C to Type-A adapter matches the first Type-C interface 12. Further, the Type-C to Type-A adapter includes a second board 21; a Type-C plug 22, which is arranged on the second board 21 and matches the first Type-C interface 12; a Type-A interface 23, which is arranged on the second board 21; and the Type-A interface 23 and the Type-C plug 22 are connected on the second board 21 through a transmission signal line.

[0064] In this embodiment, a Type-C plug 22 and a Type-A interface 23 are provided on the Type-C to Type-A adapter, so that the Type-A interface 23 is connected to the Type-C plug 22 on the second board 21 through a transmission signal line. When the USB signal of the device of the Type-A interface 23 is tested, the Type-C plug 22 is connected to the first Type-C interface 12 on the test fixture board, and the USB signal of the device of the Type-A interface can be tested on the test fixture board without adding additional test tools, thereby effectively reducing the test cost.

[0065] In one embodiment, the Type-A interface includes a pair of Tx pins 231, a pair of Rx pins 232, a pair of second USB2.0 pins 233, a second ground pin 234 and a second power pin 235, which are respectively connected to the transmission signal line; the Type-C plug includes a pair of Tx1 pins 221, a pair of Tx2 pins 222, a pair of Rx1 pins 223, a pair of Rx2 pins 224, a pair of first USB2.0 pins 225, a first ground pin 226 and a first power pin 227, which are respectively connected to the transmission signal lines in a one-to-one correspondence; a pair of Tx1 pins 221 are connected to a pair of Tx2 pins 22, and are connected to a pair of Tx pins 231 through the transmission signal line; a pair of Rx1 pins 223 are connected to a pair of Rx2 pins 224, and are connected to a pair of Rx pins 232 through the transmission signal line.

[0066] In this embodiment, by connecting a pair of Tx1 pins 221 and a pair of Tx2 pins 222, and connecting to a pair of Tx pins 231 through a transmission signal line; and connecting a pair of Rx1 pins 223 and a pair of Rx2 pins 224, and connecting to a pair of Rx pins 232 through a transmission signal line; when performing a USB signal test on a device with a Type-A interface, any group of signals on the test fixture board can be selected, without having to first verify from which group of USB signals on the Type-C plug the USB signal of the Type-A interface is transferred, thereby saving time and energy and improving test efficiency.

[0067] On the second board 21, the first ground pin 226 and the first power pin 227 of the Type-C plug 22 are connected one-to-one with the second ground pin 234 and the second power pin 235 of the Type-A interface 23 through the transmission signal line, which can ensure the normal transmission of power and enable the device to work normally. The pair of first USB2.0 pins 225 and the pair of second USB2.0 pins 233 are connected through the transmission signal line, which can ensure that the Type-C plug 22 and the Type-A interface 23 can achieve signal intercommunication and compatibility, ensure the accurate transmission of USB2.0 signals, and ensure the reading, writing and interaction of data.

[0068] Although the embodiments of the present invention are described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A Type-C interface test fixture, characterized in that: include: A first plate (11); A first Type-C interface (12), arranged on the first board (11); A plurality of transmission signal lines (20), respectively connected to the first Type-C interface (12); A pair of first Tx test female connectors (14a), a pair of second Tx test female connectors (14b), a pair of first Rx test female connectors (15a), a pair of second Rx test female connectors (15b) and a pair of USB2.0 test female connectors (16) are all arranged on the first board (11) and are connected to the transmission signal lines (20) in a one-to-one correspondence.

2. The Type-C interface test fixture according to claim 1, characterized in that: The test fixture also includes: The first test pin row (163) and the second test pin row (164) are both arranged on the first board (11) and connected to the pair of USB2.0 test female connectors (16) via the transmission signal line (20).

3. The Type-C interface test fixture according to claim 2, characterized in that: The test fixture also includes: A first test point (165) is arranged on the first board (11) and is connected to the first test pin row (163) via the transmission signal line (20); The second test point (166) is arranged on the first board (11) and is connected to the second test pin row (164) via the transmission signal line (20).

4. The Type-C interface test fixture according to claim 3, characterized in that: The test fixture also includes: A first resistor (171) is arranged on the first board (11) and connected to the first test point (165) via the transmission signal line (20); A second resistor (172) is arranged on the first board (11) and is connected to the second test point (166) via the transmission signal line (20).

5. The Type-C interface test fixture according to claim 3, characterized in that: The first test point (165) and the second test point (166) are both solder pads soldered on the first board (11).

6. The Type-C interface test fixture according to claim 1, characterized in that: The test fixture also includes: A second Type-C interface (13) is used to connect a power source, and the second Type-C interface (13) is arranged on the first board (11) and is connected to the first Type-C interface (12) via the transmission signal line (20).

7. The Type-C interface test fixture according to claim 6, characterized in that: The test fixture also includes: A ground pin header (19), arranged on the first board (11), and connected to the first Type-C interface (12) and the second Type-C interface (13) respectively through the transmission signal line (20); A power pin header (18) is arranged on the first board (11) and is respectively connected to the first Type-C interface (12) and the second Type-C interface (13) via the transmission signal line (20).

8. A testing system, characterized in that: include: Type-C to Type-A adapter; According to the Type-C interface test fixture as described in any one of claims 1 to 7, the Type-C to Type-A adapter matches the first Type-C interface (12).

9. The test system according to claim 8, characterized in that: The Type-C to Type-A adapter comprises a second plate body (21); A Type-C plug (22), arranged on the second board (21) and matching the first Type-C interface (12); A Type-A interface (23), arranged on the second plate body (21); The Type-A interface (23) and the Type-C plug (22) are connected on the second board (21) via a transmission signal line.

10. The test system according to claim 9, characterized in that: The Type-A interface comprises a pair of Tx pins (231), a pair of Rx pins (232), a pair of second USB2.0 pins (233), a second ground pin (234) and a second power pin (235), which are respectively connected to the transmission signal line; The Type-C plug comprises a pair of Tx1 pins (221), a pair of Tx2 pins (222), a pair of Rx1 pins (223), a pair of Rx2 pins (224), a pair of first USB2.0 pins (225), a first ground pin (226) and a first power pin (227), which are respectively connected to the transmission signal lines in a one-to-one correspondence; The pair of Tx1 pins (221) are connected to the pair of Tx2 pins (222), and are connected to the pair of Tx pins (231) via a transmission signal line; The pair of Rx1 pins (223) are connected to the pair of Rx2 pins (224), and are connected to the pair of Rx pins (232) via a transmission signal line.

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