Adjustable double-probe probe

Abstract

The utility model designs an adjustable double-probe probe. The adjustable double-probe probe comprises a probe main body bottom plate, a triangular fixing block, a grounding probe pushing sliding block, a signal probe and a grounding probe, the triangular fixing block is fixedly arranged on a bottom plate of the probe main body; a signal probe is arranged on the triangular fixing block; the grounding probe pushing slide block is arranged on the probe main body bottom plate and is connected with the triangular fixing block through a screw rod; the grounding probe is arranged on one side, close to the signal probe, of the grounding probe pushing sliding block; a spring is arranged between the grounding probe pushing sliding block and the triangular fixing block. In actual use, a TLP test signal line is connected to the signal probe, a grounding housing of the signal line is connected to the grounding probe, and then the distance between the triangular fixing block and the grounding probe pushing slide block is adjusted by using the screw rod, so that the distance between the signal probe and the grounding probe is adjusted. The device is used for matching the distance between pins of a tested device during testing.

Description

Technical Field

[0001] The utility model belongs to the field of adjustable double probes of TLP, and in particular relates to an adjustable double-probe probe. Background Art

[0002] With the advancement of technology, the demand for ESD and TLP testing has exploded. The probes used in traditional TLP testing are all single-probe structures. Because TLP testing requires a loop, the ground wire often needs to be connected to the ground of the device under test from the coaxial cable housing on the basis of the single probe just mentioned. However, the specific disadvantage is that the ground loop is long and the test is unstable, so it is necessary to add another needle holder probe arm, and adding an additional needle holder probe arm will cause more space to be occupied; and each test requires adjusting two needle holders, which reduces the test efficiency. Utility Model Content

[0003] To solve the above problems, the present application designs an adjustable dual-probe probe, so as to adjust the distance between the signal probe and the ground probe by adjusting the position of the dual-probe probe, so as to match the distance between the pins of the device under test during testing.

[0004] An adjustable double-probe probe comprises a probe body bottom plate, a triangular fixing block, a grounding probe pushing slider, a signal probe, and a grounding probe;

[0005] The triangular fixing block is fixedly arranged on the bottom plate of the probe body;

[0006] A signal probe is provided on the triangular fixed block;

[0007] The grounding probe push slider is arranged on the bottom plate of the probe body and is connected to the triangular fixing block through a screw rod;

[0008] The grounding probe is arranged on a side of the grounding probe pushing sliding block close to the signal probe.

[0009] Preferably, a spring is provided between the grounding probe pushing sliding block and the triangular fixing block.

[0010] Preferably, a first spring placement hole is provided at a position of the grounding probe pushing the sliding block corresponding to the spring.

[0011] Preferably, a second spring placement hole is provided on the triangular fixing block at a position corresponding to the spring.

[0012] Preferably, a first probe fixing cylinder is arranged on the triangular grounding probe pushing slide block, and the grounding probe is arranged in the first probe fixing cylinder.

[0013] Preferably, a second probe fixing cylinder is provided on the triangular fixing block, and the signal probe is arranged in the second probe fixing cylinder.

[0014] Preferably, a screw knob is provided at the bottom of the screw.

[0015] Preferably, screw holes are also provided on the bottom plate of the probe body.

[0016] The advantages and effects of this application are as follows:

[0017] The present application designs an adjustable double-probe probe, comprising a probe body bottom plate, a triangular fixed block, a grounding probe pushing slider, a signal probe, and a grounding probe; the triangular fixed block is fixedly arranged on the probe body bottom plate; the signal probe is arranged on the triangular fixed block; the grounding probe pushing slider is arranged on the probe body bottom plate and is connected to the triangular fixed block through a screw rod, and a spring is arranged between the grounding probe pushing slider and the triangular fixed block; through the above design, the distance between the triangular fixed block and the grounding probe pushing slider can be adjusted through the screw rod, and the grounding probe is arranged on the side of the grounding probe pushing slider close to the signal probe; through the above design, the present application is , you only need to connect the signal line of the TLP test to the signal probe, connect the ground shell of the signal line to the ground probe, and then use the screw to adjust the distance between the triangular fixed block and the ground probe push slider, thereby adjusting the spacing between the signal probe and the ground probe, which is used to match the spacing between the pins of the device under test during testing. Moreover, since the spacing between the signal probe and the ground probe is adjustable, the ground loop of the signal line will be directly shortened, and the test stability will be improved. Moreover, since the adjustable dual-probe probe designed in this application integrates the signal probe and the ground probe on the bottom plate of the probe body, no extra needle holders are required to form a loop, and only one needle holder is required for testing, which has high test efficiency.

[0018] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application so that it can be implemented in accordance with the contents of the specification, and to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the following is a detailed description of the preferred embodiments of the present application in conjunction with the accompanying drawings as follows.

[0019] Based on the detailed description of the specific embodiments of the present application in combination with the accompanying drawings below, those skilled in the art will become more aware of the above and other objects, advantages and features of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings without creative work. In all drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, each element or part is not necessarily drawn according to the actual scale.

[0021] Figure 1 A design diagram of an adjustable dual-probe probe designed for this application;

[0022] Figure numerals: 1. probe body bottom plate; 2. triangular fixing block; 3. grounding probe pushing slider; 4. screw knob; 5. screw; 6. first probe fixing tube; 7. second probe fixing tube; 8. signal probe; 9. grounding probe; 10. screw hole; 11. spring. DETAILED DESCRIPTION

[0023] To make the purpose, technical scheme and advantages of the embodiment of the present application clearer, the technical scheme in the embodiment of the present application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the present application. Obviously, the described embodiment is a part of the embodiment of the present application, rather than all of the embodiments. In the following description, specific details such as specific configuration and components are provided only to help fully understand the embodiments of the present application. Therefore, it should be clear to those skilled in the art that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of the present application. In addition, for clarity and brevity, the description of known functions and structures is omitted in the embodiment.

[0024] It should be understood that the references to "one embodiment" or "this embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "one embodiment" or "this embodiment" appearing throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0025] In addition, the present application may repeat reference numerals and / or letters in different examples. This repetition is for the purpose of simplicity and clarity, and does not in itself indicate the relationship between the various embodiments and / or settings discussed.

[0026] The term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, B exists alone, and A and B exist at the same time. The term " / and" in this article describes another type of association object relationship, indicating that there can be two relationships. For example, A / and B can mean: A exists alone, and A and B exist alone. In addition, the character " / " in this article generally indicates that the previous and next associated objects are in an "or" relationship.

[0027] The term "at least one" in this article is merely a description of the association relationship of associated objects, indicating that there may be three relationships. For example, at least one of A and B can mean: A exists alone, A and B exist at the same time, and B exists alone.

[0028] It should also be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusions.

[0029] Example 1

[0030] Please refer to Figure 1 ,This embodiment mainly introduces a basic design of an adjustable dual-probe probe, including a probe body bottom plate 1, a triangular fixing block 2, a grounding probe pushing slider 3, a signal probe 8, and a grounding probe 9;

[0031] The triangular fixing block 2 is fixedly arranged on the bottom plate 1 of the probe body;

[0032] The triangular fixed block 2 is provided with a signal probe 8;

[0033] The grounding probe push slider 3 is arranged on the probe body bottom plate 1 and is connected to the triangular fixing block 2 through a screw rod 5;

[0034] The grounding probe 9 is arranged on a side of the grounding probe pushing slider 3 close to the signal probe 8 .

[0035] Furthermore, a spring 11 is provided between the grounding probe pushing slide block 3 and the triangular fixing block 2 .

[0036] Furthermore, a first spring placement hole is provided at a position of the grounding probe pushing slide block 3 corresponding to the spring 11 .

[0037] Furthermore, a second spring placement hole is provided on the triangular fixing block 2 at a position corresponding to the spring 11 .

[0038] Furthermore, a first probe fixing cylinder 6 is disposed on the grounding probe pushing slide block 3 , and the grounding probe 9 is disposed in the first probe fixing cylinder 6 .

[0039] Furthermore, a second probe fixing tube 7 is disposed on the triangular fixing block 2 , and the signal probe 8 is disposed in the second probe fixing tube 7 .

[0040] Furthermore, a screw knob 4 is provided at the bottom of the screw 5 .

[0041] Furthermore, a screw hole 10 is also provided on the bottom plate 1 of the probe body.

[0042] The present application designs an adjustable double-probe probe, comprising a probe body bottom plate, a triangular fixed block, a grounding probe pushing slider, a signal probe, and a grounding probe; the triangular fixed block is fixedly arranged on the probe body bottom plate; the signal probe is arranged on the triangular fixed block; the grounding probe pushing slider is arranged on the probe body bottom plate and is connected to the triangular fixed block through a screw rod, and a spring is arranged between the grounding probe pushing slider and the triangular fixed block; through the above design, the distance between the triangular fixed block and the grounding probe pushing slider can be adjusted through the screw rod, and the grounding probe is arranged on the side of the grounding probe pushing slider close to the signal probe; through the above design, the present application is , you only need to connect the signal line of the TLP test to the signal probe, connect the ground shell of the signal line to the ground probe, and then use the screw to adjust the distance between the triangular fixed block and the ground probe push slider, thereby adjusting the spacing between the signal probe and the ground probe, which is used to match the spacing between the pins of the device under test during testing. Moreover, since the spacing between the signal probe and the ground probe is adjustable, the ground loop of the signal line will be directly shortened, and the test stability will be improved. Moreover, since the adjustable dual-probe probe designed in this application integrates the signal probe and the ground probe on the bottom plate of the probe body, no extra needle holders are required to form a loop, and only one needle holder is required for testing, which has high test efficiency.

[0043] The above description is only the preferred embodiment of the utility model, which does not limit the protection scope of the utility model. For those skilled in the art, the utility model can be modified and varied in various ways. Any changes, modifications, substitutions, integrations and parameter changes to these embodiments within the spirit and principle of the utility model through conventional substitutions or capable of achieving the same functions without departing from the principles and spirit of the utility model shall fall within the protection scope of the utility model.

Claims

1. An adjustable dual-probe probe, characterized in that: It comprises a probe body bottom plate (1), a triangular fixing block (2), a grounding probe pushing slider (3), a signal probe (8), and a grounding probe (9); The triangular fixing block (2) is fixedly arranged on the bottom plate (1) of the probe body; The triangular fixed block (2) is provided with a signal probe (8); The grounding probe pushing slider (3) is arranged on the probe body bottom plate (1) and is connected to the triangular fixing block (2) via a screw rod (5); The grounding probe (9) is arranged on a side of the grounding probe pushing slide block (3) close to the signal probe (8).

2. The adjustable dual-probe probe according to claim 1, characterized in that: A spring (11) is provided between the grounding probe pushing slide block (3) and the triangular fixing block (2).

3. The adjustable dual-probe probe according to claim 1, characterized in that: The grounding probe pushes the sliding block (3) to be provided with a first spring placement hole at a position corresponding to the spring (11).

4. The adjustable dual-probe probe according to claim 1, characterized in that: The triangular fixing block (2) is provided with a second spring placement hole at a position corresponding to the spring (11).

5. The adjustable dual-probe probe according to claim 1, characterized in that: A first probe fixing cylinder (6) is arranged on the grounding probe pushing slide block (3), and the grounding probe (9) is arranged in the first probe fixing cylinder (6).

6. The adjustable dual-probe probe according to claim 1, characterized in that: A second probe fixing cylinder (7) is arranged on the triangular fixing block (2), and a signal probe (8) is arranged in the second probe fixing cylinder (7).

7. The adjustable dual-probe probe according to claim 1, characterized in that: A screw knob (4) is provided at the bottom of the screw (5).

8. The adjustable dual-probe probe according to claim 1, characterized in that: The probe body bottom plate (1) is also provided with screw holes (10).

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