Differential probe

Abstract

The utility model provides a differential probe, which is used for solving the problem that a needle head is easy to shake and unstable. The differential probe comprises a shell, two probe assemblies, an adjusting assembly, a first elastic piece and a second elastic piece, the two probe assemblies comprise the first probe assembly and the second probe assembly which are movably connected in the shell and arranged oppositely, and the detection ends of the two probe assemblies are exposed out of the shell. The adjusting assembly is connected with the two probe assemblies and used for adjusting the distance between the detection ends of the two probe assemblies. The first elastic piece is arranged between the first probe assembly and the shell, and the first elastic piece is used for applying elastic force to the first probe assembly, so that the first probe assembly abuts against the adjusting assembly under the action of the elastic force; the second elastic piece is arranged between the second probe assembly and the shell, and the second elastic piece is used for applying elastic force to the second probe assembly, so that the second probe assembly abuts against the adjusting assembly under the action of the elastic force, and the problem that the two probe assemblies shake is avoided.

Description

Technical Field

[0001] The present application relates to the technical field of differential signal detection, and in particular to a differential probe. Background Art

[0002] A differential signal is a signal transmitted separately on two wires. In related technologies, a differential probe is usually used to detect the differential signal. However, the spacing between the two wires transmitting the differential signal is not uniform. In order to adapt to the spacing between the two wires, the two needles of the differential probe are usually set to a structure with adjustable spacing. However, in this way, the two needles are prone to shaking and instability during the detection process, affecting the detection efficiency. Utility Model Content

[0003] The present application provides a differential probe, aiming to solve the technical problem that the two needles of the existing differential probe are prone to shaking and instability during the detection process.

[0004] In one embodiment of the present application, a differential probe is provided, comprising:

[0005] case;

[0006] Two probe assemblies, including a first probe assembly and a second probe assembly movably connected in the housing and arranged opposite to each other, and detection ends of the two probe assemblies are exposed outside the housing;

[0007] an adjusting component, connected to the two probe components respectively, and used for adjusting the distance between the detection ends of the two probe components; and

[0008] A first elastic member and a second elastic member, the first elastic member is arranged between the first probe assembly and the shell, the first elastic member is used to apply an elastic force to the first probe assembly so that the first probe assembly is pressed against the adjustment assembly under the action of the elastic force; the second elastic member is arranged between the second probe assembly and the shell, the second elastic member is used to apply an elastic force to the second probe assembly so that the second probe assembly is pressed against the adjustment assembly under the action of the elastic force.

[0009] In one embodiment, the elastic force is positively correlated with the distance between the detection ends of the two probe assemblies.

[0010] In one embodiment, the adjustment assembly includes an adjustment wheel and a rotating shaft;

[0011] The rotating shaft passes through the adjusting wheel from the rotation center of the adjusting wheel and is tightly fitted with the adjusting wheel. Both ends of the rotating shaft have threads and are respectively connected to the two probe assemblies. The distance between the detection ends of the two probe assemblies is adjusted as the rotation of the adjusting wheel is converted into thread drive.

[0012] In one embodiment, the differential probe further includes a hinge;

[0013] The non-detecting ends of the two probe assemblies are hinged to the housing through the hinge, and the non-detecting ends of the two probe assemblies swing synchronously around the hinge under the drive of the rotating shaft.

[0014] In one embodiment, the adjustment assembly further includes two adjustment members;

[0015] The two adjusting members are rotatably arranged on the two probe assemblies respectively, and the rotation center of the adjusting members is perpendicular to the plane determined by the length direction of the probe assembly and the axial direction of the rotating shaft. The two ends of the rotating shaft are respectively threadedly connected to the two adjusting members, and the two adjusting members are driven to move along the axial direction of the rotating shaft by the rotation of the rotating shaft, so as to drive the two probe assemblies to swing synchronously around the hinge.

[0016] In one embodiment, the adjusting member is provided with a circumferential surface, and the probe assembly is provided with a recess or a through hole rotatably matched with the circumferential surface.

[0017] In one embodiment, the probe assembly is provided with a through receiving hole, and the adjusting member has a nut hole arranged along the axial direction of the rotating shaft;

[0018] The adjusting member is rotatably installed in the accommodating hole, and the rotating shaft passes through the probe assembly and is threadedly connected in the nut hole.

[0019] In one embodiment, the rotating shaft or the adjusting member extends in a direction away from the adjusting wheel and forms an extension portion protruding from the probe assembly;

[0020] The elastic member comprises a spring, and the spring is sleeved on the extending portion so that the spring is stretched or compressed along the axial direction of the extending portion.

[0021] In one embodiment, a stopper is provided in the housing;

[0022] One end of the elastic member abuts against the stopper, and the other end of the elastic member abuts against the probe assembly.

[0023] In one embodiment, the probe assembly includes a probe, a wire and a bracket;

[0024] The bracket is movably connected in the shell, the probe is arranged on the bracket and electrically connected to the wire; a part of the wire is arranged on a side of the stopper away from the elastic member.

[0025] According to the differential probe in the above embodiment, when the adjustment component adjusts the detection ends of the two probe components to move, the first elastic member can apply elastic force to the first probe component, and the second elastic member can apply elastic force to the second probe component, so that the two probe components can always keep against the adjustment component under the action of the elastic forces of the two groups of elastic members. Therefore, whether it is the matching gap existing in the differential probe itself, or the increase of the matching gap due to wear of the differential probe after long-term use, the elastic force of the two groups of elastic members can eliminate the matching gap between any probe component and the adjustment component, thereby avoiding the problem of shaking of the two probe components.

[0026] At the same time, the first elastic member and the second elastic member do not interfere with each other, and can independently apply elastic force to the two probe assemblies. This can avoid the problem of uneven force on the two probe assemblies due to the two probe assemblies sharing the same set of elastic members, so that the probe assemblies and the adjustment assembly can be tightly pressed against each other to eliminate the matching gap. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 This is a schematic diagram of the three-dimensional structure of a differential detection device in one embodiment of the present application;

[0028] Figure 2 for Figure 1 A schematic diagram of the top view of the internal structure of the differential probe in the differential detection device;

[0029] Figure 3 for Figure 2 Schematic diagram of the three-dimensional structure of the adjustment component in the differential probe;

[0030] Figure 4 for Figure 2 A schematic diagram of the cross-sectional structure of the probe assembly in the differential probe;

[0031] Figure 5 for Figure 1 Schematic diagram of the three-dimensional structure inside the differential probe in the differential detection device;

[0032] Figure 6 for Figure 5 Schematic diagram of the three-dimensional structure of the bracket in the differential probe.

[0033] in:

[0034] 100-differential probe; 101-probe cover; 10-housing; 11-blocking piece; 20-probe assembly; 21-probe; 22-conducting wire; 23-bracket; 231-accommodating hole; 232-opening; 233-conducting wire lead-out groove; 20a-first probe assembly; 20b-second probe assembly; 30-adjusting assembly; 31-adjusting wheel; 32-rotating shaft; 320-extension part; 33-adjusting piece; 330-nut hole; 40-elastic piece; 40a-first elastic piece; 40b-second elastic piece; 50-hinge piece; 200-oscilloscope. Specific embodiments

[0035] The present application is further described in detail below by specific embodiments in conjunction with the accompanying drawings. Wherein similar elements in different embodiments adopt associated similar element numbers. In the following embodiments, many detailed descriptions are for making the present application better understood. However, those skilled in the art can effortlessly recognize that some features can be omitted in different situations, or can be replaced by other elements, materials, methods. In some cases, some operations related to the present application are not shown or described in the specification, and this is to avoid the core part of the present application being overwhelmed by too much description, and for those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations according to the description in the specification and the general technical knowledge in the art.

[0036] In addition, the features, operations or characteristics described in the specification can be combined in any appropriate manner to form various embodiments, and the operation steps involved in each embodiment can also be replaced or adjusted in order in a manner that is obvious to those skilled in the art. Therefore, the specification and drawings are only for the purpose of clearly describing a certain embodiment, and do not mean that the composition and / or order are necessary.

[0037] The serial numbers of the components in this document, such as "first", "second", etc., are only used to distinguish the objects described and do not have any order or technical meaning. The "connection" and "coupling" mentioned in this application, unless otherwise specified, include direct and indirect connections (couplings).

[0038] The present application provides a differential detection device, such as Figure 1As shown, the differential detection device may include a differential probe 100 and an oscilloscope 200, and the differential probe 100 is electrically connected to the oscilloscope 200. For example, the differential probe 100 may be connected to the interface of the oscilloscope 200 via a communication cable, so that the differential signal detected by the differential probe 100 can be analyzed, displayed, and recorded on the oscilloscope 200. The differential probe 100 may be equipped with a probe cover 101, and when the differential probe 100 is not in use, the probe cover 101 may be covered on the differential probe 100 to protect the needle on the differential probe 100.

[0039] In the related art, in order to make the distance between the two needles of the differential probe 100 adjustable, the differential probe 100 mostly adopts a threaded structure to drive the movement of the two needles. However, there is a certain matching gap between the thread distances in the threaded structure, which causes the two needles of the differential probe 100 to easily shake and become unstable during the detection process. At the same time, after the differential probe 100 is used for a long time, the threaded structure is also prone to aggravate the shaking of the needle due to wear, which has an adverse effect on the detection of differential signals.

[0040] To this end, the present application also provides a differential probe 100, such as Figure 2 As shown, the differential probe 100 may include a housing 10, two probe assemblies 20, an adjustment assembly 30, a first elastic member 40a and a second elastic member 40b. The two probe assemblies 20 may include a first probe assembly 20a and a second probe assembly 20b that are movably connected in the housing 10 and arranged opposite to each other, and the detection ends of the two probe assemblies 20 are exposed outside the housing 10. The adjustment assembly 30 is connected to the two probe assemblies 20 respectively, and the adjustment assembly 30 can be used to adjust the spacing S between the detection ends of the two probe assemblies 20. The first elastic member 40a can be arranged between the first probe assembly 20a and the housing 10, and the first elastic member 40a can be used to apply an elastic force to the first probe assembly 20a, so that the first probe assembly 20a is pressed against the adjustment assembly 30 under the action of the elastic force; the second elastic member 40b can be arranged between the second probe assembly 20b and the housing 10, and the second elastic member 40b can be used to apply an elastic force to the second probe assembly 20b, so that the second probe assembly 20b is pressed against the adjustment assembly 30 under the action of the elastic force.

[0041] In this way, when the adjustment component 30 adjusts the detection ends of the two probe components 20 to move, the first elastic member 40a can apply elastic force to the first probe component 20a, and the second elastic member 40b can apply elastic force to the second probe component 20b, so that the two probe components 20 can always keep against the adjustment component 30 under the action of the elastic forces of the two groups of elastic members 40. Therefore, whether it is the matching gap existing in the differential probe 100 itself, or the increase of the matching gap due to wear after long-term use of the differential probe 100, the elastic force of the two groups of elastic members 40 can eliminate the matching gap between any probe component 20 and the adjustment component 30, thereby avoiding the problem of shaking of the two probe components 20.

[0042] At the same time, the first elastic member 40a and the second elastic member 40b do not interfere with each other, and can independently apply elastic force to the two probe assemblies 20. In this way, the problem of uneven force on the two probe assemblies 20 due to the two probe assemblies 20 sharing the same set of elastic members 40 can be avoided, so that the probe assemblies 20 and the adjustment assembly 30 can be tightly pressed against each other to eliminate the matching gap.

[0043] The elastic member 40 can be arranged between the housing 10 and the probe assembly 20 in a compressed state, so that the probe assembly 20 can be pressed against the adjustment assembly 30 under the pressure of the elastic member 40. The elastic member 40 can also be arranged between the housing 10 and the probe assembly 20 in a stretched state, so that the probe assembly 20 can be tightened between the adjustment assembly 30 under the pulling force of the elastic member 40. Both elastic schemes can eliminate the matching clearance between the probe assembly 20 and the adjustment assembly 30.

[0044] For example, the first elastic member 40a can independently apply pressure or tension to the first probe assembly 20a, and the second elastic member 40b can also independently apply pressure or tension to the second probe assembly 20b. Regardless of whether the elastic member 40 applies pressure or tension to the probe assembly 20, the elastic member 40 can make the probe assembly 20 and the adjustment assembly 30 abut against each other to ensure the stability of the probe assembly 20. In addition, the number of the first elastic members 40a between the first probe assembly 20a and the housing 10 can be one, two or more, and the number of the second elastic members 40b between the second probe assembly 20b and the housing 10 can also be one, two or more. The present application does not impose any special restrictions on the state and specific number of the first elastic member 40a and the second elastic member 40b.

[0045] In one embodiment, the first elastic member 40a can be disposed on a side of the first probe assembly 20a away from the second probe assembly 20b, and the second elastic member 40b can be disposed on a side of the second probe assembly 20b away from the first probe assembly 20a. Alternatively, the first elastic member 40a can also be disposed on a side of the first probe assembly 20a close to the second probe assembly 20b, and the second elastic member 40b can also be disposed on a side of the second probe assembly 20b close to the first probe assembly 20a, and the first elastic member 40a and the second elastic member 40b are respectively abutted against structures such as a raised portion or a limit portion on the housing 10. The present application does not impose any special restrictions on the specific positions of the first elastic member 40a and the second elastic member 40b.

[0046] Furthermore, in one embodiment, if Figure 2 As shown, the elastic force of the first elastic member 40 a and the second elastic member 40 b may be positively correlated with the distance between the detection ends of the two probe assemblies 20 .

[0047] For example, when the first elastic member 40a is arranged on the side of the first probe assembly 20a away from the second probe assembly 20b, and the second elastic member 40b is arranged on the side of the second probe assembly 20b away from the first probe assembly 20a, the first elastic member 40a and the second elastic member 40b can be both arranged in a compressed state. When the spacing S between the detection ends of the first probe assembly 20a and the second probe assembly 20b increases, the first elastic member 40a and the second elastic member 40b are respectively further compressed, and the elastic force continues to increase, so that the probe assembly 20 and the adjustment assembly 30 can be more closely pressed against each other, thereby improving the stability of the probe assembly 20. In other embodiments, the first elastic member 40a and the second elastic member 40b can also be both arranged in a stretched state, but as the spacing S between the first probe assembly 20a and the second probe assembly 20b increases, the elastic force of the first elastic member 40a and the second elastic member 40b will decrease accordingly, which is not conducive to maintaining a close press between the probe assembly 20 and the adjustment assembly 30, and reduces the stability of the probe assembly 20.

[0048] Of course, when the first elastic member 40a is arranged on the side of the first probe assembly 20a close to the second probe assembly 20b, and the second elastic member 40b is arranged on the side of the second probe assembly 20b close to the first probe assembly 20a, if the first elastic member 40a and the second elastic member 40b are both arranged in a stretched state, as the spacing S between the first probe assembly 20a and the second probe assembly 20b increases, the elastic force of the first elastic member 40a and the second elastic member 40b will also increase, which is beneficial to improve the stability of the probe assembly 20. At this time, if the first elastic member 40a and the second elastic member 40b are both arranged in a compressed state, it is not conducive to improving the stability of the probe assembly 20.

[0049] It should be noted that, since the two needles of the differential probe 100 are usually in a state of being close together at the initial position, the compression state or the tension state of the elastic member 40 in the above embodiment is based on the state of the elastic member 40 when the spacing S between the first probe assembly 20a and the second probe assembly 20b increases. That is, when the spacing S between the first probe assembly 20a and the second probe assembly 20b increases, the elastic member 40 is compressed to be in a compression state, and the elastic member 40 is stretched to be in a tension state.

[0050] In some embodiments, Figure 3 and Figure 4 As shown, the adjustment assembly 30 may include an adjustment wheel 31 and a rotating shaft 32. The rotating shaft 32 may pass through the adjustment wheel 31 from the rotation center bb of the adjustment wheel 31 and fit tightly with the adjustment wheel 31. Both ends of the rotating shaft 32 have threads and are respectively connected to the two probe assemblies 20. The spacing between the detection ends of the two probe assemblies 20 is adjusted as the rotation of the adjustment wheel 31 is converted into threaded drive.

[0051] Thus, the spacing S between the two probe assemblies 20 can be adjusted by rotating the adjustment wheel 31, so that the user can operate the differential probe 100. Of course, in other embodiments, the adjustment assembly 30 can also use a push piece, which can be set as a wedge-shaped structure and set between the two probe assemblies 20. The two probe assemblies 20 can move away from or approach each other through the linear sliding of the push piece. The present application does not impose any special restrictions on the specific structure of the adjustment assembly 30.

[0052] In some embodiments, Figure 2 and Figure 5 As shown, the differential probe 100 may further include a hinge 50 , and the non-detecting ends of the two probe assemblies 20 may be hinged to the housing 10 through the hinge 50 . The non-detecting ends of the two probe assemblies 20 may swing synchronously around the hinge 50 under the drive of the rotating shaft 32 .

[0053] When the adjusting wheel 31 rotates, the rotating shaft 32 drives the non-detecting ends of the two probe assemblies 20 to swing synchronously with the hinge 50 as the center through the thread, so that the detecting ends of the two probe assemblies 20 move away from or towards each other. Of course, in other embodiments, the two probe assemblies 20 may not be hinged, but connected to the housing 10 through a guide structure, so that the two probe assemblies 20 move towards or away from each other in a translational manner. The present application does not impose any special restrictions on the way the two probe assemblies 20 move.

[0054] In addition, the differential probe 100 may also include a torsion spring, which may be arranged at the position of the hinge 50, and the two probe assemblies 20 may be connected to the torsion spring. In this way, when the two probe assemblies 20 are close to or away from each other, the torsion spring may also provide elastic force to the two probe assemblies 20, thereby strengthening the abutment between the two probe assemblies 20 and the adjustment assembly 30, so that the two probe assemblies 20 are not easy to shake and are more stable. Among them, the elastic force direction of the torsion spring may be adapted to the elastic force direction of the two groups of elastic members 40. For example, when the two groups of elastic members 40 are in a compressed state during the movement of the two probe assemblies 20, the torsion spring may be set to an elastic force that pulls the two probe assemblies 20 together. When the two groups of elastic members 40 are in a stretched state during the movement of the two probe assemblies 20, the torsion spring may be set to an elastic force that pushes the two probe assemblies 20 apart. The present application does not impose any special restrictions on the elastic force direction of the torsion spring.

[0055] In one embodiment, if Figure 3 and Figure 4 As shown, the adjustment assembly 30 may also include two adjustment members 33, which are rotatably arranged on the two probe assemblies 20 respectively, and the rotation center cc of the adjustment member 33 is perpendicular to the plane determined by the length direction of the probe assembly 20 and the axial direction of the rotating shaft 32. The two ends of the rotating shaft 32 can be threadedly connected to the two adjustment members 33 respectively, and the two adjustment members 33 are driven to move along the axial direction of the rotating shaft 32 by the rotation of the rotating shaft 32, so as to drive the two probe assemblies 20 to swing synchronously around the hinge 50.

[0056] When the adjusting wheel 31 drives the rotating shaft 32 to rotate, the rotating shaft 32 can drive the two adjusting members 33 to move along the axial direction of the rotating shaft 32 through the threaded connection with the adjusting member 33. At the same time, the adjusting member 33 can rotate along the rotation center cc on the probe assembly 20, so that the probe assembly 20 can swing around the hinge 50. Of course, in other embodiments, when the two probe assemblies 20 can translate relative to each other, the two ends of the rotating shaft 32 can also be directly threadedly connected to the two probe assemblies 20, thereby driving the two probe assemblies 20 to translate. The present application does not impose any special restrictions on whether the adjusting assembly 30 is provided with the adjusting member 33.

[0057] For example, Figure 4 and Figure 6 As shown, the adjusting member 33 may be provided with a circumferential surface, and the probe assembly 20 may be provided with a recess or a through hole that rotatably cooperates with the circumferential surface.

[0058] When the adjusting member 33 moves along the axial direction of the rotating shaft 32, the probe assembly 20 can rotate and cooperate with the circumferential surface of the adjusting member 33 through the recess or through hole, so that the probe assembly 20 can deflect and swing around the adjusting member 33. The circumferential surface of the adjusting member 33 can be a cylindrical surface, a spherical surface, a conical surface, a truncated cone surface, etc., and the present application does not impose any special restrictions on the specific shape of the circumferential surface of the adjusting member 33.

[0059] In one embodiment, if Figure 3 and Figure 6 As shown, the probe assembly 20 can be provided with a through receiving hole 231, and the adjusting member 33 can have a nut hole 330 arranged along the axial direction of the rotating shaft 32. The adjusting member 33 can be rotatably installed in the receiving hole 231, and the rotating shaft 32 passes through the probe assembly 20 and is threadedly connected in the nut hole 330.

[0060] For example, Figure 6 As shown, the adjusting member 33 can be set as a cylindrical structure, and the hole wall of the accommodating hole 231 can be set as a circular arc hole wall. When the adjusting member 33 is installed in the accommodating hole 231, the cylindrical structure can rotate and cooperate with the circular arc hole wall. In addition, an opening 232 can also be provided on the probe assembly 20, and the rotating shaft 32 can pass through the opening 232 and be threadedly connected in the nut hole 330. Among them, the opening 232 can be set as a circular hole, and can also be set as a long strip slit along the length direction of the probe assembly 20, so that the rotating shaft 32 can swing slightly in the opening 232. The present application does not impose any special restrictions on the specific shape of the opening 232. When the rotating shaft 32 is threadedly connected to the probe assembly 20, the probe assembly 20 can also support the rotating shaft 32.

[0061] On this basis, if Figure 4 As shown, the rotating shaft 32 or the adjusting member 33 can extend in a direction away from the adjusting wheel 31 and form an extension portion 320 protruding from the probe assembly 20. The elastic member 40 can include a spring, which can be sleeved on the extension portion 320 so that the spring is stretched or compressed along the axial direction of the extension portion 320.

[0062] Thus, the shaft 32 can not only threadably cooperate with the adjusting member 33 and drive the probe assembly 20 to move, but the extension 320 of the shaft 32 can also provide a spring installation position, so that the spring can be directly sleeved on the extension 320 of the shaft 32, without welding, and the installation is simple. In addition, the extension 320 of the shaft 32 can also guide the expansion and contraction of the spring, so as to avoid the problem of uneven force on the probe assembly 20 due to the skewness of the spring during the expansion and contraction process.

[0063] The rotating shaft 32 can penetrate the adjusting member 33 and extend to form the above-mentioned extension portion 320. Of course, the adjusting member 33 can also be set as a sleeve structure with a length direction, and the rotating shaft 32 can be threadedly connected with the sleeve, and the sleeve extends along the axial direction of the rotating shaft 32 to form the above-mentioned extension portion 320, so that the spring is sleeved on the sleeve. The present application does not impose any special restrictions on the specific method of forming the extension portion 320.

[0064] In addition, the elastic member 40 can also be configured as a rubber sleeve, a rubber ring, a foam ring or other elastic structures sleeved on the extension portion 320. Of course, the elastic member 40 can also be configured as a spring sheet, and the present application does not impose any special restrictions on the specific structure of the elastic member 40.

[0065] In more embodiments, Figure 5 As shown, a stopper 11 may be disposed in the housing 10 , one end of the elastic member 40 may abut against the stopper 11 , and the other end of the elastic member 40 may abut against the probe assembly 20 .

[0066] When the elastic member 40 is a spring, the extension portion 320 of the shaft 32 in the above embodiment can extend to the position of the stopper 11, the spring can be sleeved on the extension portion 320 of the shaft 32, and the spring can abut between the stopper 11 and the probe assembly 20. The extension portion 320 of the shaft 32 can be arranged at a position close to the stopper 11, or can be rotatably connected to the stopper 11, so that the stopper 11 supports the shaft 32. The stopper 11 can be a baffle arranged in the housing 10, or a structure such as a limit step arranged in the housing 10. The present application does not impose any special restrictions on the specific structure of the stopper 11.

[0067] On this basis, if Figure 5 As shown, the probe assembly 20 may include a probe 21, a wire 22 and a bracket 23. The bracket 23 may be movably connected to the shell 10. The probe 21 may be arranged on the bracket 23 and electrically connected to the wire 22. A portion of the wire 22 may be arranged on the side of the baffle 11 away from the elastic member 40.

[0068] Thus, the bracket 23 is movably connected in the housing 10, so that the bracket 23 can move in the housing 10, and the probe 21 can move with the bracket 23. Figure 6As shown, in order to avoid the influence of the wire 22 on the expansion and contraction of the elastic member 40, the bracket 23 may be provided with a wire lead-out groove 233, so that a part of the wire 22 can pass through the wire lead-out groove 233 and bypass the elastic member 40, and the part of the wire 22 bypassing the elastic member 40 can be arranged on the side of the stopper 11 away from the elastic member 40. In this way, one side of the stopper 11 can be used to abut the elastic member 40, and the other side of the stopper 11 can be used to limit the wire 22, so that the mutual interference between the wire 22 and the elastic member 40 can be avoided.

[0069] In addition, the stopper 11 can also be formed together with the edge of the housing 10 to form a slot. In this way, when the wire 22 is installed, the wire 22 can be directly connected to the slot, thereby avoiding the problem of interference between the wire 22 and the elastic member 400 due to looseness in the housing 10.

[0070] Among them, Figure 2 As shown, the shell 10, the stopper 11, the probe assembly 20, the rotating shaft 32, the adjusting member 33 and the elastic member 40 in the above embodiment can be symmetrically arranged about the aa axis, and the adjusting wheel 31 and the hinge 50 can be arranged on the aa axis, so that the internal structure of the differential probe 100 is more regular and compact, and it is also convenient for the assembly of the differential probe 100.

[0071] The above specific examples are used to illustrate the present invention, which are only used to help understand the present invention and are not intended to limit the present invention. For those skilled in the art of the present invention, some simple deductions, deformations or substitutions can be made based on the idea of ​​the present invention.

Claims

1. A differential probe, characterized in that: include: case; Two probe assemblies, including a first probe assembly and a second probe assembly movably connected in the housing and arranged opposite to each other, and detection ends of the two probe assemblies are exposed outside the housing; An adjusting component, connected to the two probe components respectively, and used for adjusting the distance between the detection ends of the two probe components; as well as, a first elastic member and a second elastic member, wherein the first elastic member is disposed between the first probe assembly and the housing, and the first elastic member is used to apply an elastic force to the first probe assembly so that the first probe assembly is pressed against the adjusting assembly under the action of the elastic force; The second elastic member is disposed between the second probe assembly and the housing, and is used to apply an elastic force to the second probe assembly so that the second probe assembly is pressed against the adjustment assembly under the action of the elastic force.

2. The differential probe according to claim 1, characterized in that: The elastic force is positively correlated with the distance between the detection ends of the two probe assemblies.

3. The differential probe according to claim 1, characterized in that: The adjustment assembly includes an adjustment wheel and a rotating shaft; The rotating shaft passes through the adjusting wheel from the rotation center of the adjusting wheel and is tightly fitted with the adjusting wheel. Both ends of the rotating shaft have threads and are respectively connected to the two probe assemblies. The distance between the detection ends of the two probe assemblies is adjusted as the rotation of the adjusting wheel is converted into thread drive.

4. The differential probe according to claim 3, characterized in that: The differential probe further comprises a hinge; The non-detecting ends of the two probe assemblies are hinged to the housing through the hinge, and the non-detecting ends of the two probe assemblies swing synchronously around the hinge under the drive of the rotating shaft.

5. The differential probe according to claim 4, characterized in that: The adjustment assembly also includes two adjustment members; The two adjusting members are rotatably arranged on the two probe assemblies respectively, and the rotation center of the adjusting members is perpendicular to the plane determined by the length direction of the probe assembly and the axial direction of the rotating shaft. The two ends of the rotating shaft are respectively threadedly connected to the two adjusting members, and the two adjusting members are driven to move along the axial direction of the rotating shaft by the rotation of the rotating shaft, so as to drive the two probe assemblies to swing synchronously around the hinge.

6. The differential probe according to claim 5, characterized in that: The adjusting member is provided with a circumferential surface, and the probe assembly is provided with a recess or a through hole rotatably matched with the circumferential surface.

7. The differential probe according to claim 6, characterized in that: The probe assembly is provided with a through receiving hole, and the adjusting member has a nut hole arranged along the axial direction of the rotating shaft; The adjusting member is rotatably installed in the accommodating hole, and the rotating shaft passes through the probe assembly and is threadedly connected in the nut hole.

8. The differential probe according to claim 5, characterized in that: The rotating shaft or the adjusting member extends in a direction away from the adjusting wheel and forms an extending portion protruding from the probe assembly; The elastic member comprises a spring, and the spring is sleeved on the extending portion so that the spring is stretched or compressed along the axial direction of the extending portion.

9. The differential probe according to any one of claims 1 to 8, characterized in that: A stopper is provided in the housing; One end of the elastic member abuts against the stopper, and the other end of the elastic member abuts against the probe assembly.

10. The differential probe according to claim 9, characterized in that: The probe assembly includes a probe, a wire and a bracket; The bracket is movably connected in the shell, the probe is arranged on the bracket and electrically connected to the wire; a part of the wire is arranged on a side of the stopper away from the elastic member.

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