Probe expander, probe assembly and test system

Abstract

The utility model provides a probe expander, a probe assembly and a test system, and relates to the technical field of electrics. A probe expander comprises a first connector used for connecting a first test device; the second connector is used for connecting a probe of the first test equipment; the expansion circuit board is provided with a controlled switch, and the first connector and the second connector are electrically connected with the controlled switch through lines on the expansion circuit board respectively; the third connector is used for connecting second test equipment; wherein when the controlled switch is in a first state, the first connector and the second connector are conducted, and when the controlled switch is in a second state, the second connector and the third connector are conducted. Through the probe expander, the test efficiency of the electronic product can be improved.

Description

Technical Field

[0001] The present invention relates to the field of electrical technology, and in particular to a probe extender, a probe assembly and a test system. Background Art

[0002] With the development of electronic technology, users have higher and higher requirements for the reliability of electronic products. Therefore, how to improve the reliability verification of electronic products through testing is one of the important means for technicians.

[0003] Testing of hardware signals in electronic products is one of the aspects that technicians are most concerned about. Among them, the accuracy test of power supply voltage and the ripple test of power supply are the key points of circuit testing. When performing the accuracy test and ripple test of power supply, the ripple test method will introduce more interference when performing the accuracy test of power supply. Therefore, different test equipment needs to be used to operate their respective probes to test the same test point. In this way, when technicians need to test the same power supply test point, they need to manually switch between two test equipment to perform them separately, which reduces the efficiency of electronic product testing. Summary of the invention

[0004] In order to overcome the problems existing in the related art, this specification provides a probe extender, a probe assembly and a test system.

[0005] According to a first aspect of an embodiment of this specification, a probe extender is provided, comprising:

[0006] A first connector, used to connect a first test device;

[0007] A second connector, used to connect a probe of the first test device;

[0008] An extension circuit board, on which a controlled switch is arranged, and the first connector and the second connector are electrically connected to the controlled switch respectively through a circuit on the extension circuit board;

[0009] A third connector, used for connecting a second test device;

[0010] When the controlled switch is placed in a first state, the first connector and the second connector are connected, and when the controlled switch is placed in a second state, the second connector and the third connector are connected.

[0011] Optionally, the first connector includes a test pin and a control pin;

[0012] Wherein, the test pin is connected to the first test end of the controlled switch, and the control pin is connected to the control end of the controlled switch;

[0013] When a first control signal is loaded on the control pin, the controlled switch is placed in a first state, and when a second control signal is loaded on the control pin, the controlled switch is placed in a second state.

[0014] Optionally, the first connector includes a test pin;

[0015] The test pin is connected to the first test end of the controlled switch;

[0016] The controlled switch is provided with a switching element;

[0017] Wherein, when the switching element is placed in the first position, the controlled switch is placed in the first state, and when the switching element is placed in the second position, the controlled switch is placed in the second state.

[0018] Optionally, the third connector comprises a test terminal and a ground terminal, the test terminal is connected to the second test terminal of the controlled switch, and the ground terminal is connected to the third test terminal of the controlled switch;

[0019] The second connector includes a test line and a ground line, the test line is connected to the first input terminal of the controlled switch, and the ground line is connected to the second input terminal of the controlled switch;

[0020] When the controlled switch is placed in a first state, the test line is connected to the first connector through the controlled switch; when the controlled switch is placed in a second state, the test line is connected to the test terminal of the third connector, and the ground line is connected to the ground terminal of the third connector.

[0021] According to a second aspect of an embodiment of this specification, a probe assembly is provided, including:

[0022] probe; and,

[0023] A probe extender as described in any of the above.

[0024] Optionally, the probe comprises a detection head;

[0025] The detection head is electrically connected to the controlled switch of the probe extender through the second connector of the probe extender.

[0026] Optionally, the probe further includes a grounding head isolated from the detection head, and the grounding head is electrically connected to a grounding terminal of a third connector in the probe extender through a controlled switch of the probe extender.

[0027] Optionally, the probe further includes a ground extension needle;

[0028] The ground extension pin is electrically connected to the ground terminal through the ground head.

[0029] According to a third aspect of an embodiment of this specification, a test system is provided, including:

[0030] The probe assembly described in any one of the above items;

[0031] a first test device; and

[0032] Second test equipment;

[0033] The first test device is connected to the first connector in the probe assembly, and the second test device is connected to the third connector in the probe assembly.

[0034] Optionally, the first testing device is an oscilloscope;

[0035] The second testing equipment is a multimeter.

[0036] The technical solutions provided by the embodiments of this specification may have the following beneficial effects:

[0037] In an embodiment of the present specification, a controlled switch is provided on an extension circuit board of the probe extender, and the controlled switch is configured to be switchable between at least a first state and a second state, so that a second connector connected to one side of the probe can be switched between a first connector connected to a first test device and a second connector connected to a second test device, respectively. When a technician performs a test, a voltage accuracy test and a ripple test on the power supply can be completed without moving the probe, thereby improving the testing efficiency of electronic products.

[0038] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present specification. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the specification and, together with the description, serve to explain the principles of the specification.

[0040] Figure 1 is a structural schematic diagram of a probe extender involved in the present application;

[0041] Figure 2 is a schematic diagram of the structure of a probe extender involved in an embodiment of the present application, wherein the controlled switch realizes state switching through a control signal;

[0042] Figure 3 is a schematic diagram of the structure of a probe extender involved in an embodiment of the present application, wherein the controlled switch realizes state switching through a switching element;

[0043] Figure 4 It is a structural schematic diagram of a probe assembly involved in the present application;

[0044] Figure 5 It is a structural schematic diagram of a probe assembly involved in an embodiment of the present application;

[0045] Figure 6 It is a structural schematic diagram of a test system involved in this application. DETAILED DESCRIPTION

[0046] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this specification. Instead, they are merely examples of devices and methods consistent with some aspects of this specification as detailed in the appended claims.

[0047] The terms used in this specification are for the purpose of describing specific embodiments only and are not intended to limit this specification. The singular forms "a", "the" and "the" used in this specification and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0048] It should be understood that although the terms first, second, third, etc. may be used in this specification to describe various information, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of this specification, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0049] The present application provides a probe extender 100, such as Figure 1 As shown, including:

[0050] A first connector 1, used for connecting a first test device;

[0051] The second connector 2 is used to connect the probe of the first test device, which can be understood as the probe extender 100 being installed between the first test device and the probe used by the first test device;

[0052] A third connector 3, used for connecting a second test device, wherein the first test device and the second test device are different test devices, for example, the first test device is an oscilloscope, and the second test device is a multimeter;

[0053] An extension circuit board 4, on which a controlled switch 5 is arranged, the first connector 1 and the second connector 2 are electrically connected to the controlled switch 5 through a line 40 on the extension circuit board 4, respectively. The extension circuit board 4 may be a PCB (Printed Circuit Board) or an FPC (Flexible Printed Circuit) on which components such as the controlled switch 5 and structures such as the deployment line 40 can be arranged. The controlled switch 5 may be a switch chip having at least a control terminal and three signal terminals, or a switch device having at least a control mechanism (such as a switching element) and three signal terminals, which may be selected according to actual needs;

[0054] Among them, when the controlled switch 5 is placed in the first state, the first connector 1 and the second connector 2 are connected, and when the controlled switch 5 is placed in the second state, the second connector 2 and the third connector 3 are connected; for example, when the controlled switch 5 is a switch chip, an external control signal can be received from the control end to switch the conduction state, or when the controlled switch 5 is a switch device, the position of the switching element can be changed manually or by an electromechanical structure to switch the conduction state.

[0055] Through the above-mentioned probe extension, the first test device and the second test device can share the probe of the first test device. During the testing of electronic products, if a test point is touched by the probe, there is no need to replace the probe. By changing the state of the controlled switch, the conduction between the probe and the first test device and the second test device is switched, thereby improving the testing efficiency of the electronic product.

[0056] Optionally, the first connector 1, such as Figure 2 As shown, it includes a test pin 10 and a control pin 11. Of course, other pins may also be provided on the first connector 1, and there is no limitation to this;

[0057] The test pin 10 is connected to the first test end 50 of the controlled switch 5, and the control pin 11 is connected to the control end 51 of the controlled switch 5;

[0058] When the control pin 11 is loaded with a first control signal, the controlled switch 5 is placed in a first state. When the control pin 11 is loaded with a second control signal, the controlled switch 5 is placed in a second state.

[0059] By selecting a controlled switch 5 having a control end 51 and a first test end 50 (i.e., the controlled switch 5 is a switch chip), the probe is installed in combination with a controllable robotic arm. By running a test script on a first test device, the controllable robotic arm can drive the probe to move to a set position for testing.

[0060] In the test script, at a test point, the first test device first outputs a first control signal to the controlled switch 5, so that the controlled switch 5 is placed in the first state, and the probe and the first test device are turned on, thereby implementing the test of the test point by the first test device (for example, the ripple noise test of the power supply is performed through an oscilloscope). Thereafter, the first test device outputs a second control signal to the controlled switch 5, so that the controlled switch is switched to the second state, the probe and the second test device are turned on, and the test of the test point by the second test device is implemented (for example, the voltage accuracy test of the power supply is performed through a multimeter).

[0061] By configuring the probe extender 100 as described above, the automatic testing process of relevant parameters on the electronic product can be realized in combination with the test script, thereby further improving the testing efficiency of the electronic device.

[0062] Optionally, the first connector 1, such as Figure 3 As shown, it includes a test pin 10;

[0063] The test pin 10 is connected to the first test end 50 of the controlled switch 5;

[0064] The controlled switch 5 is provided with a switching element 52;

[0065] When the switching element 52 is placed in the first position P1, the controlled switch 5 is placed in the first state, and when the switching element 52 is placed in the second position P2, the controlled switch 5 is placed in the second state.

[0066] When testing, the technician can operate the probe to move to the test point, turn the switch 52 on the controlled switch 5 to the first position P1 (i.e., the controlled switch 5 is placed in the first state), turn on the probe and the first test device, and thus implement the test of the test point by the first test device (for example, the ripple noise test of the power supply is performed through an oscilloscope). After that, the technician can directly turn the switch 52 to the second position P2 (i.e., the controlled switch 5 is placed in the second state), turn on the probe and the second test device, and implement the test of the test point by the second test device (for example, the voltage accuracy test of the power supply is performed through a multimeter).

[0067] By setting the probe extender 100 , technicians can perform different tests on the same test point without changing the probes during manual testing, thereby improving the testing efficiency of electronic products.

[0068] Optionally, the third connector 3, such as Figure 2 , 3 As shown, it includes a test terminal 30 and a ground terminal 31, the test terminal 30 is connected to the second test terminal 53 of the controlled switch 5, and the ground terminal 31 is connected to the third test terminal 54 of the controlled switch 5;

[0069] The second connector 2 includes a test line 20 and a ground line 21, wherein the test line 20 is connected to the first input terminal 55 of the controlled switch 5, and the ground line 21 is connected to the second input terminal 56 of the controlled switch 5;

[0070] Among them, when the controlled switch 5 is placed in the first state, the test line 20 is connected to the test pin 10 of the first connector 1 through the controlled switch 5; when the controlled switch 5 is placed in the second state, the test line 20 is connected to the test terminal 30 of the third connector 3, and the ground line 21 is connected to the ground terminal 31 of the third connector 3.

[0071] Correspondingly, the present application also provides a probe assembly 200, such as Figure 4 As shown, including:

[0072] Probe 300; and

[0073] The probe extender 100 as described in any one of the above.

[0074] Optionally, the probe 300 includes a detection head 301;

[0075] The detection head 301 is electrically connected to the controlled switch 5 through the second connector 2 of the probe extender 100 .

[0076] Optionally, the probe 300 further includes a grounding head 302 isolated from the detection head 301 , and the grounding head 302 is electrically connected to the grounding terminal 31 of the third connector 3 in the probe extender 100 through the controlled switch 5 of the probe extender 100 .

[0077] In accordance with the different structures of the probe 300, the selection of the controlled switch 5 may also be different. For example, when the probe 300 has a detection head 301 required for a test signal, only the detection head 301 may be connected to the controlled switch 5. When grounding is required, the probe 300 may also include a grounding head 302 connected to the controlled switch 5. In addition, the controlled switch 5 also needs to perform different conduction processes during the switching between the first state and the second state. For example, the second test device requires two parts, a test signal and a grounding part, while the first test device does not require a grounding part, or one test device requires two test signals while the other device requires one test signal, etc. The setting can be based on the different test devices actually selected, and there is no limitation on this.

[0078] Optionally, the probe 300, such as Figure 5 As shown, it also includes a ground extension pin 303;

[0079] The ground extension pin 303 is electrically connected to the ground terminal 31 through the ground head 302 .

[0080] By sleeve-arranging the ground extension pin 303 on the ground head 302 of the probe 300 , the contact between the test point and the probe 300 during the automatic test process can be made more reliable.

[0081] Correspondingly, the present application also provides a test system 400, such as Figure 6 As shown, including:

[0082] The probe assembly 200 as described in any one of the above items;

[0083] A first test device 500; and

[0084] A second test device 600;

[0085] The first test device 500 is connected to the first connector 1 in the probe assembly 200 , and the second test device 600 is connected to the third connector 3 in the probe assembly 200 .

[0086] Optionally, the first testing device 500 is an oscilloscope;

[0087] The second testing device 600 is a multimeter.

[0088] The technical solutions provided by the embodiments of this specification may have the following beneficial effects:

[0089] In an embodiment of the present specification, a controlled switch is provided on an extension circuit board of the probe extender, and the controlled switch is configured to be switchable between at least a first state and a second state, so that a second connector connected to one side of the probe can be switched between a first connector connected to a first test device and a second connector connected to a second test device, respectively. When a technician performs a test, a voltage accuracy test and a ripple test on the power supply can be completed without moving the probe, thereby improving the testing efficiency of electronic products.

[0090] The implementation process of the functions and effects of each module in the above-mentioned device is specifically described in the implementation process of the corresponding steps in the above-mentioned method, which will not be repeated here.

[0091] For the device embodiment, since it basically corresponds to the method embodiment, the relevant parts can refer to the partial description of the method embodiment. The device embodiment described above is only schematic, wherein the modules described as separate components may or may not be physically separated, and the components displayed as modules may or may not be physical modules, that is, they may be located in one place, or they may be distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this specification. A person of ordinary skill in the art can understand and implement it without paying creative labor.

[0092] The above is a description of a specific embodiment of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0093] Those skilled in the art will readily appreciate other embodiments of the specification after considering the specification and practicing the invention claimed herein. The specification is intended to cover any variations, uses or adaptations of the specification that follow the general principles of the specification and include common knowledge or customary techniques in the art that are not claimed in the specification. The specification and examples are to be considered exemplary only, and the true scope and spirit of the specification are indicated by the following claims.

[0094] It should be understood that the present description is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present description is limited only by the appended claims.

[0095] The above description is only a preferred embodiment of this specification and is not intended to limit this specification. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of this specification should be included in the scope of protection of this specification.

Claims

1. A probe extender, characterized in that: include: A first connector, used to connect a first test device; A second connector, used to connect a probe of the first test device; An extension circuit board, on which a controlled switch is arranged, and the first connector and the second connector are electrically connected to the controlled switch respectively through a circuit on the extension circuit board; A third connector, used for connecting a second test device; When the controlled switch is placed in a first state, the first connector and the second connector are connected, and when the controlled switch is placed in a second state, the second connector and the third connector are connected.

2. The probe extender according to claim 1, characterized in that: The first connector includes a test pin and a control pin; Wherein, the test pin is connected to the first test end of the controlled switch, and the control pin is connected to the control end of the controlled switch; When a first control signal is loaded on the control pin, the controlled switch is placed in a first state, and when a second control signal is loaded on the control pin, the controlled switch is placed in a second state.

3. The probe extender according to claim 1, characterized in that: The first connector includes a test pin; The test pin is connected to the first test end of the controlled switch; The controlled switch is provided with a switching element; Wherein, when the switching element is placed in the first position, the controlled switch is placed in the first state, and when the switching element is placed in the second position, the controlled switch is placed in the second state.

4. The probe extender according to claim 1, characterized in that: The third connector comprises a test terminal and a ground terminal, the test terminal is connected to the second test terminal of the controlled switch, and the ground terminal is connected to the third test terminal of the controlled switch; The second connector includes a test line and a ground line, the test line is connected to the first input terminal of the controlled switch, and the ground line is connected to the second input terminal of the controlled switch; When the controlled switch is placed in a first state, the test line is connected to the first connector through the controlled switch; when the controlled switch is placed in a second state, the test line is connected to the test terminal of the third connector, and the ground line is connected to the ground terminal of the third connector.

5. A probe assembly, characterized in that: include: probe; and, The probe extender according to any one of claims 1 to 4 above.

6. The probe assembly according to claim 5, characterized in that: The probe comprises a detection head; The detection head is electrically connected to the controlled switch of the probe extender through the second connector of the probe extender.

7. The probe assembly according to claim 6, characterized in that: The probe also includes a grounding head isolated from the detection head, and the grounding head is connected to a grounding terminal in the probe extender.

8. The probe assembly according to claim 7, characterized in that: The probe further includes a ground extension needle; The ground extension pin is connected to the ground terminal through the ground head.

9. A testing system, characterized in that: include: The probe assembly according to any one of claims 5 to 8; First test equipment; as well as Second test equipment; The first test device is connected to the first connector in the probe assembly, and the second test device is connected to the third connector in the probe assembly.

10. The test system according to claim 9, characterized in that: The first test equipment is an oscilloscope; The second testing equipment is a multimeter.

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