Simple high-precision charge measuring device
By combining spherical offset and laser interference, the problem of insufficient accuracy and high cost of existing charge measurement methods is solved, and high accuracy measurement and cost reduction of small charges are achieved.
Patent Information
- Application Number
- CN202421147265.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-24
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2034-05-24
AI Technical Summary
The existing charge measurement methods are not accurate enough and costly, making it difficult to effectively measure small charges.
A simple high-precision charge measurement device based on sphere offset and laser interference method is adopted. The offset angle and distance of the sphere are measured by the laser interference method to calculate the charge amount by combining metal spheres, insulated thin lines, metal plates and laser measurement devices.
High-precision measurement of small charges is achieved, measuring costs are reduced, and measurement errors are reduced through parameter optimization.
Smart Images
Figure CN222825609U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of charge measurement technology, specifically relating to a simple high-precision charge measurement device, which is a simple high-precision charge measurement device based on ball offset and laser interferometry. Background Technology
[0002] Currently, there are limited methods for accurately measuring electric charge. Some methods lack sufficient accuracy, while others involve excessively expensive measuring devices. For example, the method of directly measuring charge by observing the deflection of a small ball is relatively intuitive but lacks accuracy, especially in measuring the ball's deflection, where errors are significant. More advanced measuring tools include various electrometers, such as vacuum tube electrometers and solid-state electrometers, but these devices are prohibitively expensive. Utility Model Content
[0003] (a) Technical problems to be solved
[0004] The technical problem this invention aims to solve is: how to overcome the inaccuracy of traditional charge measurement methods and the high cost of advanced charge measurement devices.
[0005] (II) Technical Solution
[0006] To solve the above-mentioned technical problems, this utility model provides a simple high-precision charge measuring device, which includes an offset device and a laser measuring device.
[0007] The offset device includes: a metal ball (8), an insulating wire (7), a horizontal rod (6) fixed at both ends, and two metal plates (9); the upper end of the metal ball (8) is connected to the insulating wire (7); the upper end of the insulating wire (7) is connected to the horizontal rod (6) fixed at both ends; two metal plates (9) are fixedly arranged on both sides of the metal ball (8), and the distance from the metal ball (8) to the two metal plates (9) is set to be equal;
[0008] The metal ball (8) is charged in advance and then placed between two metal plates (9). When the two metal plates (9) are also charged, the metal ball (8) is driven by the electric field force to cause the insulating wire (7) to deflect at an angle.
[0009] The two metal plates (9) are the first metal plate on the left and the second metal plate on the right, respectively. When the insulating wire (7) is in a vertical state, the line connecting the geometric centers of the first metal plate, the metal ball (8), and the second metal plate is defined as the first horizontal direction, i.e., the X direction; at this time, the vertical direction of the insulating wire (7) is the Y direction; the direction perpendicular to the XY plane is defined as the Z direction, and the Z direction is the second horizontal direction; wherein, a light-transmitting hole is provided at the geometric center of the first metal plate;
[0010] The laser measurement device includes: a laser (1), a collimating device (2), a semi-transparent mirror (3), a reflector (4), and a screen (5);
[0011] The laser (1), collimating device (2), semi-transparent mirror (3), and metal ball (8) are placed in sequence and at the same height, that is, they are on a straight line in the X direction of the first horizontal direction; and the semi-transparent mirror (3), the reflector (4), and the screen (5) are also at the same height, that is, they are on another straight line in the Z direction of the second horizontal direction, and the two straight lines are perpendicular to each other on the horizontal plane.
[0012] The distance between the semi-transparent mirror (3) and the ball (8) is set to be the same as the distance between the semi-transparent mirror (3) and the mirror (4).
[0013] The laser emitted by the laser (1) is collimated by the collimating device (2) and then reaches the semi-transparent and semi-reflective mirror (3), which splits the laser into two optical paths.
[0014] The first light path continues forward along the X direction, shines through the light-transmitting hole of the first metal plate onto the metal ball (8), and is then reflected back to the semi-transparent mirror (3); the second light path is directed along the Z direction toward the reflector (4), and returns to the semi-transparent mirror (3) after the same optical path.
[0015] At this point, the two light paths converge, and after passing through the semi-transparent mirror (3), they propagate onto the screen (5) to form interference fringes.
[0016] The laser beam emitted by the laser (1) is located in the XY plane where the metal ball (8) is located, ensuring that the measured distance is accurate.
[0017] When the metal ball (8) is charged and the two metal plates (9) are also charged, an electric field is generated between the charged metal plates (9), causing the metal ball (8) to deflect in the XY plane under the action of the electric field force. As a result, the insulating wire (7) forms a deflection angle with the Y direction during the swing process. After obtaining the deflection angle, the charge of the metal ball (8) is calculated according to the relationship between the deflection angle and the charge of the metal ball (8).
[0018] Among them, the two light paths converge, and after passing through the semi-transparent and semi-reflective mirror (3), they propagate to the screen (5). The overlapping light paths interfere with each other, producing alternating bright and dark interference fringes.
[0019] When the metal ball (8) is deflected, the optical path of the first optical path changes, resulting in a change in the interference fringes. By analyzing the change in the interference fringes, the deflection distance of the metal ball (8) is derived. By converting the measurement of the deflection angle of the metal ball (8) into the measurement of the deflection distance, the amount of charge on the metal ball (8) is measured.
[0020] The upper end of the metal ball (8) is connected to the insulating wire (7).
[0021] The laser (1) is a laser generator capable of emitting a stable laser source.
[0022] The collimation device (2) ensures that the direction of the emitted laser does not deviate.
[0023] In this process, the metal ball (8) is energized in advance using a generator.
[0024] The metal sphere (8) is relatively lightweight.
[0025] (III) Beneficial Effects
[0026] Compared with existing technologies, this invention aims to improve the method of charge measurement by using offset measurement and laser interferometry to improve accuracy in measuring the smallest possible amount of charge, while maintaining high accuracy and significantly reducing measurement costs.
[0027] Compared with the prior art, the present invention has the following beneficial effects:
[0028] (1) Compared with traditional offset charge measurement devices, this device can greatly reduce measurement error and improve accuracy through parameter optimization;
[0029] (2) By using the laser interferometry method, this device ingeniously transforms the measurement of the ball offset angle into the measurement of the ball offset distance. The accuracy of the measurement is greatly improved by measuring the offset distance through laser interferometry.
[0030] (3) Compared with current high-precision charge measurement instruments, this device greatly reduces costs while ensuring accuracy, making it more convenient and feasible to measure smaller charges. Attached Figure Description
[0031] Figure 1 This is a schematic diagram of the offset device.
[0032] Figure 2 This is a schematic diagram of the structure of the technical solution of this utility model. Detailed Implementation
[0033] To make the objectives, contents, and advantages of this utility model clearer, the specific embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples.
[0034] To solve the above-mentioned technical problems, this utility model provides a simple high-precision charge measuring device, which includes an offset device and a laser measuring device.
[0035] The offset device includes: a metal ball (8), an insulating wire (7), a horizontal rod (6) fixed at both ends, and two metal plates (9); the upper end of the metal ball (8) is connected to the insulating wire (7); the upper end of the insulating wire (7) is connected to the horizontal rod (6) fixed at both ends; two metal plates (9) are fixedly arranged on both sides of the metal ball (8), and the distance from the metal ball (8) to the two metal plates (9) is set to be equal;
[0036] The metal ball (8) is charged in advance and then placed between two metal plates (9). When the two metal plates (9) are also charged, the metal ball (8) is driven by the electric field force to cause the insulating wire (7) to deflect at an angle.
[0037] The two metal plates (9) are the first metal plate on the left and the second metal plate on the right, respectively. When the insulating wire (7) is in a vertical state, the line connecting the geometric centers of the first metal plate, the metal ball (8), and the second metal plate is defined as the first horizontal direction, i.e., the X direction; at this time, the vertical direction of the insulating wire (7) is the Y direction; the direction perpendicular to the XY plane is defined as the Z direction, and the Z direction is the second horizontal direction; wherein, a light-transmitting hole is provided at the geometric center of the first metal plate;
[0038] The laser measurement device includes: a laser (1), a collimating device (2), a semi-transparent mirror (3), a reflector (4), and a screen (5);
[0039] The laser (1), collimating device (2), semi-transparent mirror (3), and metal ball (8) are placed in sequence and at the same height, that is, they are on a straight line in the X direction of the first horizontal direction; and the semi-transparent mirror (3), the reflector (4), and the screen (5) are also at the same height, that is, they are on another straight line in the Z direction of the second horizontal direction, and the two straight lines are perpendicular to each other on the horizontal plane.
[0040] The distance between the semi-transparent mirror (3) and the ball (8) is set to be the same as the distance between the semi-transparent mirror (3) and the mirror (4).
[0041] The laser emitted by the laser (1) is collimated by the collimating device (2) and then reaches the semi-transparent and semi-reflective mirror (3), which splits the laser into two optical paths.
[0042] The first light path continues forward along the X direction, shines through the light-transmitting hole of the first metal plate onto the metal ball (8), and is then reflected back to the semi-transparent mirror (3); the second light path is directed along the Z direction toward the reflector (4), and returns to the semi-transparent mirror (3) after the same optical path.
[0043] At this point, the two light paths converge, and after passing through the semi-transparent mirror (3), they propagate onto the screen (5) to form interference fringes.
[0044] The laser beam emitted by the laser (1) is located in the XY plane where the metal ball (8) is located, ensuring that the measured distance is accurate.
[0045] When the metal ball (8) is charged and the two metal plates (9) are also charged, an electric field is generated between the charged metal plates (9), causing the metal ball (8) to deflect in the XY plane under the action of the electric field force. As a result, the insulating wire (7) forms a deflection angle with the Y direction during the swing process. After obtaining the deflection angle, the charge of the metal ball (8) is calculated according to the relationship between the deflection angle and the charge of the metal ball (8).
[0046] Among them, the two light paths converge, and after passing through the semi-transparent and semi-reflective mirror (3), they propagate to the screen (5). The overlapping light paths interfere with each other, producing alternating bright and dark interference fringes.
[0047] When the metal ball (8) is deflected, the optical path of the first optical path changes, resulting in a change in the interference fringes. By analyzing the change in the interference fringes, the deflection distance of the metal ball (8) is derived. By converting the measurement of the deflection angle of the metal ball (8) into the measurement of the deflection distance, the amount of charge on the metal ball (8) is measured.
[0048] The upper end of the metal ball (8) is connected to the insulating wire (7).
[0049] The laser (1) is a laser generator capable of emitting a stable laser source.
[0050] The collimation device (2) ensures that the direction of the emitted laser does not deviate.
[0051] In this process, the metal ball (8) is energized in advance using a generator.
[0052] The metal ball (8) is relatively light in mass, which makes it more sensitive to the driving force of the electric field and thus causes a shift angle.
[0053] Principles of the Implementation Example
[0054] The simple, high-precision charge measurement device based on ball offset and laser interferometry provided in this embodiment includes: an offset device and a laser measurement device;
[0055] (1) Offset device
[0056] The theoretical principle of the ball deflection method for measuring charge is relatively intuitive. The device mainly consists of a small metal ball, an insulating thread, two electrode plates, and a horizontal rod fixed at both ends. The metal ball is suspended from the insulating thread and fixed to the horizontal rod, allowing the insulating thread to swing freely, while the metal ball is placed between the two metal electrode plates.
[0057] After charging the metal ball (8), it is placed between two large plates (9), with the plates carrying opposite charges and a light-transmitting hole in the middle of the front plate. Under the high-voltage electric field, the ball will deflect. Since the metal ball is suspended on a fixed insulating wire (7), the insulating wire (7) will deflect at a certain angle. Under the same conditions, the greater the charge on the metal ball (8), the greater the deflection angle of the wire (7). The relationship between the deflection angle of the wire and the charge on the metal ball can be obtained through theoretical calculation. At the same time, in order to measure the smallest possible charge, all parameters need to be optimized to minimize the error and improve the measurement accuracy. It can be found that when the voltage between the electrode plates increases, the error decreases, and the smaller the mass of the ball, the smaller the error; the longer the suspension wire, the greater the deflection distance, and the smaller the error. The specific method will not be described in detail.
[0058] (2) Laser interferometry device
[0059] This device is used to accurately measure the offset distance of a small ball after it has been charged. After the optical system is set up, the offset distance of the metal ball is derived by observing the changes in interference fringes, thus indirectly converting the offset angle measurement into an offset distance measurement.
[0060] The specific steps are as follows: Figure 2 As shown, the devices shown in the figure are sequentially installed on the bracket, ensuring the installation angle; after the laser is emitted from the laser (1), it passes through the beam expander and collimator (2) and arrives at the semi-transparent mirror (3), where it is split into two optical paths. One path continues forward, shines through the light-transmitting hole of the metal plate (9) onto the small ball (8), and is reflected back to the semi-transparent mirror (3); the other optical path is reflected to the side mirror, travels the same optical path, and returns to the semi-transparent mirror. At this time, the two optical paths merge, propagate through the semi-transparent mirror (3) to the screen (5), and form interference fringes.
[0061] Overlapping light paths interfere with each other, producing alternating bright and dark interference fringes;
[0062] When the metal ball moves, it causes a change in the optical path of the first light path, which in turn causes a change in the interference fringes. By analyzing the changes in the interference fringes, the offset distance of the metal ball can be obtained. By converting the measurement of the ball's offset angle into an offset distance, the amount of charge on the metal ball can be measured.
[0063] In summary, this utility model belongs to the field of charge measurement technology, specifically relating to a simple, high-precision charge measurement device. The device comprises: a small metal ball, a horizontal rod fixed at both ends, an insulating wire, metal plates, a laser, a collimating device, a semi-transparent mirror, a reflector, and a screen, suitable for measuring small charges. When neither the ball nor the metal plates are charged, the laser emitted from the laser passes through the collimating device to the semi-transparent mirror, where it is split into two optical paths. One path continues forward, passing through the light-transmitting hole of the metal plates and illuminating the small metal ball before being reflected back to the semi-transparent mirror; the other path is reflected to the side reflector, travels the same optical path, and returns to the semi-transparent mirror. The two paths converge, propagate through the semi-transparent mirror, and reach the screen. When both the small metal ball and the plates are charged (e.g., by a generator), the charged ball will be deflected by the force between the charged plates, resulting in a slight offset, and interference fringes will appear on the screen. The phase difference generated when a charged ball deflects manifests as a change in the interference fringes on the screen. By collecting these changes, the deflection distance of the ball can be deduced. By converting the measurement of the ball's deflection angle into a measurement of its deflection distance, precise measurement of the charge on the metal ball can be achieved.
[0064] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.
Claims
1. A simple high-precision charge measurement device, characterized in that: The charge measurement device comprises: a deviation device and a laser measurement device; The offset device comprises: a metal ball (8), an insulating thin wire (7), a horizontal rod (6) fixed at both ends, and two metal plates (9); the upper end of the metal ball (8) is connected to the insulating thin wire (7); the upper end of the insulating thin wire (7) is connected to the horizontal rod (6) fixed at both ends; two metal plates (9) are fixedly arranged on both sides of the metal ball (8), and the distances from the metal ball (8) to the two metal plates (9) are set to be equal; The metal ball (8) is charged in advance and then placed between two metal plates (9). When the two metal plates (9) are also charged, the metal ball (8) is driven by the electric field force to drive the insulating thin wire (7) to generate a deviation angle; The two metal plates (9) are respectively a first metal plate on the left and a second metal plate on the right. When the insulating thin wire (7) is in a vertical state, the geometric center line of the first metal plate, the metal ball (8) and the second metal plate is defined as a first horizontal direction, i.e., an X direction. At this time, the vertical direction of the insulating thin wire (7) is defined as a Y direction. The direction perpendicular to the XY plane is defined as a Z direction, and the Z direction is defined as a second horizontal direction. A light-transmitting hole is provided at the geometric center of the first metal plate. The laser measuring device comprises: a laser (1), a collimating device (2), a semi-transparent and semi-reflective mirror (3), a reflecting mirror (4), and a light screen (5); The laser (1), the collimating device (2), the semi-transparent and semi-reflective mirror (3), and the metal ball (8) are placed in sequence and at the same height, that is, they are on a straight line in the first horizontal direction X direction; and the semi-transparent and semi-reflective mirror (3) and the reflector (4) and the light screen (5) are also at the same height, that is, they are also on another straight line in the second horizontal direction Z direction, and the two straight lines are perpendicular to each other on the horizontal plane; The distance between the semi-transparent and semi-reflective mirror (3) and the small ball (8) is set to be the same as the distance between the semi-transparent and semi-reflective mirror (3) and the reflecting mirror (4).
2. The simplified high-precision charge measuring device according to claim 1, characterized in that: The laser light emitted by the laser (1) is collimated by the collimating device (2) and then reaches the semi-transparent and semi-reflective mirror (3), and the semi-transparent and semi-reflective mirror (3) divides the laser light into two optical paths; The first light path continues to move forward along the X direction, passes through the light-transmitting hole of the first metal plate, illuminates the metal ball (8), and is then reflected back to the semi-transparent and semi-reflective mirror (3); the second light path is directed toward the reflective mirror (4) along the Z direction, and returns to the semi-transparent and semi-reflective mirror (3) after the same optical path; At this time, the two light paths merge, pass through the semi-transparent and semi-reflective mirror (3), and propagate onto the light screen (5), forming interference fringes.
3. The simplified high-precision charge measuring device according to claim 1, characterized in that: The laser beam emitted by the laser (1) is located in the XY plane where the metal ball (8) is located.
4. The simplified high-precision charge measuring device according to claim 1, characterized in that: The laser (1) adopts a laser generator capable of emitting a stable laser light source.
5. The simplified high-precision charge measuring device according to claim 1, characterized in that: The collimating device (2) ensures that the direction of the emitted laser light does not deviate.
6. The simplified high-precision charge measuring device according to claim 1, characterized in that: The metal ball (8) is charged in advance by using a generator.