6SANA nuclear test system card testing device

Abstract

The utility model relates to the field of nuclear test card testing, and discloses a 6SANA nuclear test system card testing device, which comprises a test base station, a test connection module is detachably arranged on the top surface of the test base station, the test connection module comprises a mounting plate and connection female heads, a plurality of connection female heads are arranged at the top of the mounting plate, and the connection female heads are detachably connected with the test base station. A mounting window and a test connecting window are vertically and sequentially formed in the top surface of the test base table downwards, the mounting window is arranged around the test connecting window, the test connecting window is communicated with an inner cavity of the test base table, the mounting plate is arranged in the mounting window in a matched mode, and quick-release assemblies are arranged at the two ends of the mounting plate and comprise connecting blocks; the connecting blocks have the freedom degree of moving in the length direction of the mounting plate, connecting grooves are formed in the positions, corresponding to the connecting blocks, of the side wall of the mounting window, and one ends of the connecting blocks are matched in the connecting grooves. The test structure is partially replaced according to the size and model of the card, the test device does not need to be integrally customized, and the hardware cost of the card test equipment is reduced.

Description

Technical Field

[0001] The utility model relates to the field of nuclear testing card component testing, in particular to a 6SANA nuclear testing system card component testing device. Background Art

[0002] The RPN electronic card test device of the out-of-core nuclear test system is mainly used for the test of source range chassis cards. Its main function is to output multi-channel analog signals, square wave / triangle wave / pulse / arbitrary waveform signals, and micro-current signals to the system under test, and then collect the output signals of the system under test for analysis, processing and recording. Since the same type of card has a variety of size designs, especially the cards with a large span of multiple sizes in the 6SANA nuclear test system, it is necessary to customize various test devices with different test fixtures according to the size and interface specifications of the card, which increases the cost of customized test devices and increases the cost of equipment testing. Utility Model Content

[0003] The purpose of the utility model is to overcome the shortcomings of the prior art and provide a 6SANA nuclear test system card component testing device, which partially replaces the test structure according to the size and model of the card component, does not require the overall customization of the test device, and reduces the hardware cost of the card component testing equipment.

[0004] The purpose of the utility model is achieved through the following technical solutions: a 6SANA nuclear test system card testing device, including a test base, the top surface of the test base is detachably provided with a test connection module, the test connection module includes a mounting plate and a connecting female head, a plurality of the connecting female heads are arranged on the top of the mounting plate, the connecting female heads correspond one to one with the connecting male heads on the card, an installation window and a test connection window are vertically opened in sequence on the top surface of the test base downward, the installation window is arranged around the test connection window, the test connection window is connected to the inner cavity of the test base, the mounting plate is adapted in the mounting window, quick-release components are arranged at both ends of the mounting plate, the quick-release components include a connecting block, the connecting block has the freedom to move along the length direction of the mounting plate, the side walls of the mounting window are provided with connecting grooves at the positions corresponding to the connecting blocks, and one end of the connecting block is adapted in the connecting groove.

[0005] In some embodiments, mounting grooves are provided at both ends of the mounting plate, springs are provided in the mounting grooves, the connecting block is slidably adapted in the mounting grooves, and both ends of the spring are respectively connected to the connecting block and the mounting plate. When the spring is in a normal state, the connecting block is adapted in the connecting groove.

[0006] In some embodiments, a wedge-shaped surface is provided at the bottom of the connecting block away from one end of the spring, and the thickness of the connecting block at the wedge-shaped surface gradually decreases in a direction approaching the connecting groove.

[0007] In some embodiments, the mounting plate is provided with a strip groove directly above the mounting groove, the strip groove is connected to the mounting groove, a lever is fixed to the top of the connecting block, and one end of the lever away from the connecting block passes through the top of the strip groove.

[0008] In some embodiments, a circuit board is disposed in the mounting plate, the female connector is connected to the circuit board, a pin header is disposed at the bottom of the mounting plate, the pin header is connected to the circuit board, a socket is disposed in the inner cavity of the test base, and the pin header passes through the test connection window and is plugged into the socket.

[0009] In some embodiments, a T-shaped slide rail is fixed to the inner bottom of the test base, a slide plate is slidably adapted on the T-shaped slide rail, a groove is provided on the top of the slide plate, the socket is adapted in the groove, and the socket is connected to the test cable interface of the test base via a long wire.

[0010] In some embodiments, the quick-release assembly a is provided at both ends of the socket, and a connecting groove a is provided on the inner wall of the sink corresponding to the position of the quick-release assembly a, and the structure of the quick-release assembly a is the same as that of the quick-release assembly.

[0011] In some embodiments, a replacement window is provided on the side wall of the test base, and the replacement window is located at one end of the T-shaped slide rail. A frame-shaped step is fixed to the inner wall of the replacement window, and a baffle is provided on the frame-shaped step. A plurality of blocks are rotatably provided on the test base, and the plurality of blocks are provided around the replacement window. The blocks are located on one side of the replacement window or against the outer surface of the baffle through deflection.

[0012] The beneficial effects of the utility model are:

[0013] 1. When testing cards of different sizes, replace the corresponding test connection modules. The mounting plates in the test connection modules have the same size, so that the test connection modules can all be connected to the test base, and the female connectors in the test connection modules are designed accordingly according to the male connectors of different cards. After replacing the corresponding test connection modules, the cards can be smoothly plugged into the corresponding test connection modules to connect the test circuit. There is no need to customize the test device as a whole, which reduces the hardware cost of the card test equipment.

[0014] 2. Since the 6SANA nuclear test system has many types of card parts, when there are many types of tests, the test connection module needs to be replaced frequently. For this reason, the connection between the mounting plate and the test base is designed to be quick-release. The installation and removal of the mounting plate can be completed by moving the connection block, which improves the replacement efficiency of the test connection module. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the internal structure of a 6SANA nuclear test system card test device of the utility model;

[0016] Figure 2 for Figure 1 Enlarged view of point A in the middle;

[0017] Figure 3 This is a front view of a 6SANA nuclear test system card test device of the utility model;

[0018] In the figure, 1-test base, 2-mounting plate, 3-connecting female head, 4-mounting window, 5-test connecting window, 6-connecting block, 7-connecting groove, 8-mounting groove, 9-spring, 10-wedge surface, 11-strip groove, 12-lever, 13-pin header, 14-socket, 15-T-shaped slide rail, 16-slide plate, 17-sink groove, 18-replacement window, 19-baffle, 20-block. DETAILED DESCRIPTION

[0019] like Figures 1 to 3As shown, a 6SANA nuclear test system card test device includes a test base 1, the top surface of the test base 1 is detachably provided with a test connection module, the test connection module includes a mounting plate 2 and a connecting female head 3, a plurality of connecting female heads 3 are arranged on the top of the mounting plate 2, and the connecting female heads 3 correspond to the connecting male heads on the card one by one, and the top surface of the test base 1 is vertically downwardly provided with an installation window 4 and a test connection window 5 in sequence, the installation window 4 is arranged around the test connection window 5, and the test connection window 5 is connected to the inner cavity of the test base 1, and the mounting plate 2 is adapted in the installation window 4, and quick-release components are provided at both ends of the installation plate 2. The quick-release components include a connecting block 6, and the connecting block 6 has the freedom to move along the length direction of the installation plate 2. The side wall of the installation window 4 is provided with a connecting groove 7 at a position corresponding to the connecting block 6. One end of the connecting block 6 is adapted in the connecting groove 7. A test connection module is designed corresponding to the card of different sizes and types. It should be noted that the connecting female head 3 on the test connection module corresponds to the connecting male head on the card. Although some card pieces have different sizes, the design position of the connecting male head Similarly, such cards share a test connection module, and the mounting plates 2 in the test connection modules have the same size, so that the test connection modules can all be connected to the test base 1. When testing cards of different sizes, the corresponding test connection modules are replaced. First, the original test connection module on the test base 1 is removed, and the connection block 6 is moved away from the connection slot 7, so that the connection block 6 moves into the mounting plate 2 and disengages from the connection slot 7, and the mounting plate 2 can be removed, and then the corresponding test connection module is installed. First, the mounting plate 2 is placed in the mounting window 4, so that the mounting plate 2 is supported on the step formed by the mounting window 4 and the test connection window 5. Finally, the connection block 6 is inserted into the connection slot 7 to complete the quick connection of the mounting plate 2, realize the quick replacement of the test connection module, and improve the replacement efficiency of the test connection module. The connecting female head 3 in the test connection module is designed accordingly according to the connecting male heads of different cards, so that after the corresponding test connection module is replaced, the card can be smoothly plugged into the corresponding test connection module to connect the test circuit, and there is no need to customize the test device as a whole, which reduces the hardware cost of the card test equipment.

[0020] In some embodiments, Figure 1 and Figure 3As shown, a circuit board is arranged in the mounting plate 2, the connecting female connector 3 is connected to the circuit board, a pin header 13 is arranged at the bottom of the mounting plate 2, the pin header 13 is connected to the circuit board, a socket 14 is arranged in the inner cavity of the test base 1, the pin header 13 passes through the test connection window 5 and is plugged into the socket 14, a T-shaped slide rail 15 is fixed to the inner bottom of the test base 1, a slide plate 16 is slidably adapted on the T-shaped slide rail 15, a sink groove 17 is provided on the top of the slide plate 16, the socket 14 is adapted in the sink groove 17, and the socket 14 is connected to the test cable connector of the test base 1 through a long wire. Since the test circuits of different types of cards are different, the socket 14 needs to be replaced accordingly, that is, a test connection module and a socket 14 are designed correspondingly for a specific card, so that the pin header 13 on the test connection module can be smoothly inserted into the jack of the socket 14, so as to connect the test circuit. Therefore, when replacing the test connection module, the socket 14 needs to be replaced accordingly; a replacement window 18 is opened on the side wall of the test base 1, and the replacement window 18 is located at one end of the T-shaped slide rail 15. A frame-shaped step is fixed on the inner wall of the replacement window 18, and the frame-shaped step is connected to the A baffle 19 is provided on the test base 1, and a plurality of baffles 20 are rotatably provided on the test base 1. The plurality of baffles 20 are arranged around the replacement window 18, and the baffles 20 are located on one side of the replacement window 18 or against the outer surface of the baffle 19 by deflection; the specific replacement method is: firstly remove the test connection module from the test base 1, and then rotate the baffle 20 to one side of the replacement window 18, so that the baffle 20 loses the limiting effect on the baffle 19, and then remove the baffle 19, move the slide plate 16, and make the slide plate 16 close to the replacement window 18 for easy replacement, After replacing the corresponding socket 14, push the slide plate 16 into the test base 1, and then install the baffle 19. To achieve the limit of the slide plate 16, when the slide plate 16 is accurately reset, the two ends of the slide plate 16 are respectively against the inner wall of the test base 1 and the baffle 19. Therefore, after the baffle 19 is assembled in place, the position of the slide plate 16 is naturally positioned. Finally, rotate the baffle 20 so that one end of the baffle 20 is against the outer surface of the baffle 19 to complete the limit installation of the baffle 19. The original screw installation is also abandoned, and a quick-release structure is adopted to improve the replacement efficiency.

[0021] In some embodiments, Figure 1 and Figure 2As shown, both ends of the mounting plate 2 are provided with mounting grooves 8, and springs 9 are arranged in the mounting grooves 8. The connecting block 6 is slidably adapted in the mounting grooves 8, and the two ends of the spring 9 are respectively connected to the connecting block 6 and the mounting plate 2. When the spring 9 is in normal state, the connecting block 6 is adapted in the connecting groove 7. The bottom of the connecting block 6 away from the end of the spring 9 is provided with a wedge surface 10, and the thickness of the connecting block 6 at the wedge surface 10 gradually decreases along the direction approaching the connecting groove 7. During installation, the mounting plate 2 is pressed downward, and the wedge surface 10 of the connecting block 6 first acts on the edge of the mounting window 4. Under the guiding action of the wedge surface 10, the connecting block 6 squeezes the spring 9 to move into the mounting groove 8, so that the mounting plate 2 can be smoothly assembled into the mounting window 4. After the mounting plate 2 is assembled in place, the connecting groove 7 is located on the moving path of the connecting block 6. Under the reaction force of the spring 9, the connecting block 6 is inserted into the connecting groove 7, completing the quick connection between the mounting plate 2 and the test base 1, and the operation is simple and fast.

[0022] Furthermore, if Figure 2 As shown, the mounting plate 2 is provided with a strip groove 11 just above the mounting groove 8, the strip groove 11 is connected to the mounting groove 8, a lever 12 is fixed to the top of the connecting block 6, and one end of the lever 12 away from the connecting block 6 passes through the top of the strip groove 11. When the mounting plate 2 is removed, the connecting block 6 is moved by moving the lever 12. When the lever 12 abuts against the end of the strip groove 11, the connecting block 6 is completely moved into the mounting groove 8. At this time, the mounting plate 2 can be pulled out upward to disengage the pin header 13 from the socket 14, thereby completing the quick removal of the mounting plate 2.

[0023] In some embodiments, quick-release components a are provided at both ends of the socket 14, and connecting grooves a are provided on the inner wall of the sink 17 at positions corresponding to the quick-release components a. The structure of the quick-release component a is the same as that of the quick-release component, that is, the disassembly component a also includes a connecting block a, a spring a and a lever a. Similarly, a connecting groove 7 is provided on the side wall of the sink 17 for inserting the connecting block a, so that the replacement of the socket 14 adopts the same quick-release structure as the test connection module, thereby achieving a quick replacement effect.

Claims

1. A 6SANA nuclear test system card testing device, characterized in that: The invention comprises a test base (1), wherein a test connection module is detachably provided on the top surface of the test base (1), wherein the test connection module comprises a mounting plate (2) and a connecting female head (3), wherein a plurality of connecting female heads (3) are provided on the top of the mounting plate (2), wherein the connecting female heads (3) correspond one to one with the connecting male heads on the card, and wherein an installation window (4) and a test connection window (5) are sequentially provided on the top surface of the test base (1) vertically downward, wherein the installation window (4) is arranged around the test connection window (5). The test connection window (5) is connected to the inner cavity of the test base (1); the mounting plate (2) is adapted in the mounting window (4); quick-release components are provided at both ends of the mounting plate (2); the quick-release components include a connection block (6); the connection block (6) has the freedom to move along the length direction of the mounting plate (2); the side wall of the mounting window (4) is provided with a connection groove (7) at a position corresponding to the connection block (6); one end of the connection block (6) is adapted in the connection groove (7).

2. A 6SANA nuclear testing system card testing device according to claim 1, characterized in that: Both ends of the mounting plate (2) are provided with mounting grooves (8), a spring (9) is arranged in the mounting groove (8), the connecting block (6) is slidably fitted in the mounting groove (8), the two ends of the spring (9) are respectively connected to the connecting block (6) and the mounting plate (2), and when the spring (9) is in a normal state, the connecting block (6) is fitted in the connecting groove (7).

3. A 6SANA nuclear testing system card testing device according to claim 2, characterized in that: A wedge-shaped surface (10) is provided at the bottom of the connecting block (6) at one end away from the spring (9), and the thickness of the connecting block (6) at the wedge-shaped surface (10) gradually decreases in a direction approaching the connecting groove (7).

4. A 6SANA nuclear testing system card testing device according to claim 3, characterized in that: The mounting plate (2) is provided with a strip groove (11) directly above the mounting groove (8), the strip groove (11) being connected to the mounting groove (8), a lever (12) being fixed on the top of the connecting block (6), an end of the lever (12) away from the connecting block (6) passing through the top of the strip groove (11).

5. A 6SANA nuclear testing system card testing device according to claim 1, characterized in that: A circuit board is arranged inside the mounting plate (2), the female connector (3) is connected to the circuit board, a pin header (13) is arranged at the bottom of the mounting plate (2), the pin header (13) is connected to the circuit board, and a socket (14) is arranged in the inner cavity of the test base (1), the pin header (13) passes through the test connection window (5) and is plugged into the socket (14).

6. A 6SANA nuclear testing system card testing device according to claim 5, characterized in that: A T-shaped slide rail (15) is fixed to the inner bottom of the test base (1), a slide plate (16) is slidably adapted on the T-shaped slide rail (15), a sink groove (17) is provided on the top of the slide plate (16), the socket (14) is adapted in the sink groove (17), and the socket (14) is connected to a test cable interface of the test base (1) via a long wire.

7. A 6SANA nuclear testing system card testing device according to claim 6, characterized in that: The quick-release components a are provided at both ends of the socket (14), and the inner wall of the sink (17) is provided with a connecting groove a at a position corresponding to the quick-release component a, and the structure of the quick-release component a is the same as that of the quick-release component.

8. A 6SANA nuclear testing system card testing device according to claim 7, characterized in that: A replacement window (18) is provided on the side wall of the test base (1), the replacement window (18) being located at one end of the T-shaped slide rail (15), a frame-shaped step being fixed to the inner wall of the replacement window (18), a baffle (19) being provided on the frame-shaped step in contact therewith, a plurality of baffles (20) being rotatably provided on the test base (1), the plurality of baffles (20) being provided around the replacement window (18), the baffles (20) being located on one side of the replacement window (18) or abutting against the outer surface of the baffle (19) by deflection.

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