Integrated circuit chip test tool

Abstract

The utility model discloses an integrated circuit chip testing tool, which relates to the technical field of chips and comprises a detection placing plate with a cavity inside, a rotating motor is fixedly mounted on the inner wall of one side of the cavity, a gear is fixedly sleeved on an output shaft of the rotating motor, a fixing rod is fixedly mounted in the cavity, and the gear is fixedly sleeved on the fixing rod. Two connecting plates are slidably mounted on the fixing rod, the tops of the two connecting plates extend out of the detection placement plate, the two connecting plates are movably connected with the detection placement plate, toothed plates are fixedly mounted at the bottoms of the two connecting plates respectively, and the two toothed plates are meshed with the gears. The integrated circuit chip test tool provided by the utility model has the advantage of preventing the detected integrated circuit chip from deviating and affecting the accuracy of the detection result.

Description

Technical Field

[0001] The utility model relates to the technical field of chips, in particular to an integrated circuit chip testing tool. Background Art

[0002] An integrated circuit chip is a tiny circuit composed of multiple electronic devices (such as transistors, resistors, capacitors, etc.) and circuit elements (such as capacitors, resistors, inductors, etc.). Electronic functions are achieved by integrating these devices and elements on a single chip. Integrated circuit chips are the most basic and important components of modern electronic products and are widely used in computers, communication equipment, electronic devices, home appliances, automobiles, medical equipment and other fields. Integrated circuit chips need to be tested after they are produced.

[0003] Currently, integrated circuit chips are usually placed on a test bench or held by workers during testing, which may cause deviation during testing, affecting the accuracy of integrated circuit chip testing. Utility Model Content

[0004] The purpose of the utility model is to provide an integrated circuit chip testing tool to solve at least any problem raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: an integrated circuit chip testing tool, comprising a detection placement plate with a cavity opened inside, a rotating motor is fixedly installed on an inner wall of one side of the cavity, a gear is fixedly sleeved on the output shaft of the rotating motor, a fixing rod is fixedly installed in the cavity, two connecting plates are slidably installed on the fixing rod, and the tops of the two connecting plates extend outside the detection placement plate, the two connecting plates are movably connected to the detection placement plate, the bottoms of the two connecting plates are respectively fixedly installed with toothed plates, and the two toothed plates are meshed with the gears, and the top parts of the two connecting plates A mounting plate is fixedly installed on each of the two mounting plates, and compression springs are fixedly installed on the outer walls on the sides where the two mounting plates are close to each other, and clamps are fixedly installed on the ends of the two compression springs close to each other, and two guide rods are fixedly installed on the outer walls on the sides where the two clamps are away from each other, and the four guide rods are slidably connected to the corresponding mounting plates, two supporting rods are fixedly installed on the top of the detection placement plate, top plates are fixedly installed on the top ends of the two supporting rods, two electric push rods are fixedly installed on the bottom of the top plate, a cross plate is fixedly installed on the output shafts of the two electric push rods, and a test assembly is fixedly installed on the bottom of the cross plate.

[0006] Preferably, the two connecting plates are respectively provided with through holes, and linear bearings are respectively fixedly installed in the two through holes, and the fixing rod passes through the two linear bearings and is slidably connected to the inner walls of the two linear bearings.

[0007] Preferably, two trapezoidal vertical plates are slidably installed on the horizontal plate, and the bottoms of the two trapezoidal vertical plates extend to the bottom of the horizontal plate, and card slots are respectively opened on the outer walls on the side where the two trapezoidal vertical plates are close to each other, and protective covers are fixedly installed on the bottoms of the two trapezoidal vertical plates, and the test assembly is located in the protective cover, and two fixed plates are fixedly installed on the top of the horizontal plate, and trapezoidal card plates are respectively slidably installed on the two fixed plates, and the sides of the two trapezoidal card plates away from each other extend into the two card slots respectively.

[0008] Preferably, an adjustment plate is fixedly mounted on the outer walls of the two trapezoidal clamping plates on the side away from each other, and a force spring is fixedly mounted on the outer walls of the two adjustment plates on the side close to each other.

[0009] Preferably, the compression spring and the force-bearing spring are both tin-plated springs.

[0010] Preferably, two limit baffles are fixedly mounted on the top of the transverse plate.

[0011] The beneficial effects of the utility model are as follows:

[0012] In the utility model, the test component is protected by a protective cover. When the device needs to be used, the two adjustment plates are first moved closer to each other to drive the two trapezoidal clamping plates closer to each other, and then withdrawn from the card slot, the protective cover is removed from the device to reveal the test component, and the staff places the integrated circuit chip to be tested on the detection placement plate, and drives the two clamping plates closer to each other by rotating the motor in the opposite direction to detect and clamp the integrated circuit chip, so that the integrated circuit chip is stably maintained in the current state, preventing the integrated circuit chip from easily deviating during the test, which affects the accuracy of the test result, and the output shaft of the electric push rod moves downward to drive the test component to move downward to detect the integrated circuit chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 A structural schematic diagram of a preferred embodiment of the integrated circuit chip testing tool provided by the utility model;

[0014] Figure 2 for Figure 1 An enlarged schematic diagram of part A is shown;

[0015] Figure 3 for Figure 1 An enlarged schematic diagram of part B is shown;

[0016] Figure 4 for Figure 1 The assembly diagram of the rotating motor, gear and toothed plate shown;

[0017] Figure 5 A three-dimensional diagram of the integrated circuit chip testing tool provided by the utility model.

[0018] In the figure: 1. detection placement plate; 2. rotating motor; 3. gear; 4. tooth plate; 5. connecting plate; 6. fixing rod; 8. support rod; 9. top plate; 10. electric push rod; 11. horizontal plate; 12. protective cover; 13. test assembly; 14. mounting plate; 15. guide rod; 16. clamping plate; 17. compression spring; 18. trapezoidal vertical plate; 19. slot; 20. trapezoidal clamping plate; 21. fixing plate; 22. force spring; 23. adjustment plate; 24. limit baffle. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0020] The utility model provides Figure 1-5The integrated circuit chip testing tool shown in the figure comprises a detection placement plate 1 with a cavity opened inside, a rotating motor 2 is fixedly installed on the inner wall of one side of the cavity, a gear 3 is fixedly sleeved on the output shaft of the rotating motor 2, a fixing rod 6 is fixedly installed in the cavity, and two connecting plates 5 are slidably installed on the fixing rod 6. In order to reduce the friction between the fixing rod 6 and the connecting plate 5, thereby reducing the wear of the fixing rod 6 and increasing the service life of the fixing rod 6, through holes are respectively opened on the two connecting plates 5, and linear bearings are respectively fixedly installed in the two through holes. The fixing rod 6 passes through the two linear bearings and is in contact with the fixing rod 6. The inner walls of the two linear bearings are slidably connected, and the tops of the two connecting plates 5 are extended to the outside of the detection placement plate 1. The top of the detection placement plate 1 is provided with a long strip opening, and the two connecting plates 5 respectively penetrate the two long strip openings and are respectively slidably connected to the inner walls of the two long strip openings. The two connecting plates 5 are movably connected to the detection placement plate 1. The bottoms of the two connecting plates 5 are respectively fixedly installed with toothed plates 4, and the two toothed plates 4 are meshed with gears 3. The tops of the two connecting plates 5 are respectively fixedly installed with mounting plates 14, and the outer walls of the two mounting plates 14 on one side close to each other are respectively fixedly installed with compression springs 17. By compressing the springs The spring 17 can effectively prevent the clamping force of the clamping plate 16 from being too large, causing damage to the integrated circuit chip. The clamping plates 16 are fixedly installed at the ends of the two compression springs 17 that are close to each other. The rotating motor 2 drives the gear 3 to rotate counterclockwise. The rotation of the gear 3 drives the two tooth plates 4 to move relatively. The movement of the two tooth plates 4 drives the two connecting plates 5 and the mounting plates 14 to move close to each other, and finally drives the two clamping plates 16 to move close to each other and contact the integrated circuit chip, and finally detects and clamps the integrated circuit chip, so that the integrated circuit chip is stably maintained in the current state. The two clamping plates 16 are close to each other. Two guide rods 15 are fixedly installed on the outer wall on the side away from the detection plate 1, and the four guide rods 15 are slidably connected to the corresponding mounting plates 14. Two support rods 8 are fixedly installed on the top of the detection placement plate 1, and a top plate 9 is fixedly installed on the top of the two support rods 8. Two electric push rods 10 are fixedly installed on the bottom of the top plate 9. A cross plate 11 is fixedly installed on the output shafts of the two electric push rods 10, and a test component 13 is fixedly installed on the bottom of the cross plate 11. Through the electric push rod 10, the output shaft of the electric push rod 10 moves downward, driving the test component 13 to move downward to detect the integrated circuit chip.

[0021] In order to protect the test assembly 13 and prevent external dust from adhering to the test assembly 13 when people are not using the device, thereby affecting the service life of the test assembly 13, two trapezoidal vertical plates 18 are slidably installed on the horizontal plate 11, and two through holes are opened on the horizontal plate 11. The two trapezoidal vertical plates 18 respectively penetrate the two through holes and are movably connected to the inner walls of the two through holes, and the bottoms of the two trapezoidal vertical plates 18 extend to the bottom of the horizontal plate 11, and the outer walls of the two trapezoidal vertical plates 18 on one side close to each other are respectively provided with card grooves 19, and the bottoms of the two trapezoidal vertical plates 18 are fixedly installed with protective covers 12, and the test assembly 13 is located in the protective cover 12, and two fixed plates 21 are fixedly installed on the top of the horizontal plate 11, and trapezoidal card plates 20 are respectively slidably installed on the two fixed plates 21. , and the sides of the two trapezoidal clamping plates 20 that are away from each other extend into the two clamping grooves 19 respectively. Since the side surfaces of the trapezoidal clamping plates 20 and the trapezoidal vertical plates 18 are both inclined surfaces, when people install the protective cover 12 on the device again, they only need to move the trapezoidal vertical plates 18 upward so that the inclined surfaces of the trapezoidal vertical plates 18 contact the inclined surfaces of the trapezoidal clamping plates 20. As the two trapezoidal vertical plates 18 move upward, the two trapezoidal clamping plates 20 will be pushed closer to each other, thereby compressing the force springs 22 more severely. When the trapezoidal vertical plates 18 drive the clamping grooves 19 to move to the same height as the trapezoidal clamping plates 20, the trapezoidal clamping plates 20 will be automatically pushed into the clamping grooves 19 under the push of the force springs 22 to clamp the trapezoidal vertical plates 18, thereby quickly installing the protective cover 12.

[0022] In order to ensure that one side of the trapezoidal clamping plate 20 is always located in the clamping groove 19 to clamp the trapezoidal vertical plate 18 without being affected by other external forces, adjustment plates 23 are fixedly installed on the outer walls of the two trapezoidal clamping plates 20 on the sides away from each other, and force springs 22 are fixedly installed on the outer walls of the two adjustment plates 23 on the sides close to each other. In order to increase the service life of the compression spring 17 and the force spring 22, the compression spring 17 and the force spring 22 are tin-plated springs.

[0023] In order to limit the trapezoidal clamping plate 20, the pressure spring 22 is always kept in a compressed state when the protective cover 12 is removed from the device, so that the inclined surface on the trapezoidal clamping plate 20 is always directly above the opening. When the protective cover 12 is installed on the device, the inclined surface on the trapezoidal vertical plate 18 can be quickly aligned with the inclined surface on the trapezoidal clamping plate 20, and two limit baffles 24 are fixedly installed on the top of the horizontal plate 11.

[0024] The working principle of the integrated circuit chip testing tool provided by the utility model is as follows: in the initial state, the force spring 22 is in a compressed state, and the force spring 22 makes the two sides of the trapezoidal clamping plate 20 always located in the clamping groove 19 on one side without being affected by other external forces to clamp the trapezoidal vertical plate 18, and then the protective cover 12 is fixedly installed on the horizontal plate 11 to protect the test component 13. When it is necessary to use this device, the two adjustment plates 23 are first moved closer to each other to drive the two trapezoidal clamping plates 20 closer to each other, so that one side of the two trapezoidal clamping plates 20 is respectively withdrawn from the clamping groove 19 and no longer clamps the trapezoidal vertical plate 18, and then the protective cover 12 is removed from the device to reveal the test component 13, and the staff will need to test The integrated circuit chip to be tested is placed on the detection placement plate 1, and the rotating motor 2 is started to rotate in the opposite direction. The rotating motor 2 rotates to drive the gear 3 to rotate counterclockwise, and the rotation of the gear 3 drives the two tooth plates 4 to move relative to each other. The movement of the two tooth plates 4 drives the two connecting plates 5 and the mounting plates 14 to approach each other, and finally drives the two clamping plates 16 to approach each other and contact the integrated circuit chip, and finally the integrated circuit chip is tested and clamped and fixed, so that the integrated circuit chip is stably maintained in the current state, and the electric push rod 10 is started. The output shaft of the electric push rod 10 moves downward to drive the test component 13 to move downward to detect the integrated circuit chip. The compression spring 17 can effectively prevent the clamping force of the clamping plate 16 from being too large, causing damage to the integrated circuit chip.

[0025] Compared with the related art, the integrated circuit chip testing tool provided by the utility model has the following advantages:

[0026] Beneficial effects:

[0027] The utility model provides an integrated circuit chip testing tool. A protective cover 12 is used to protect a test component 13. When the device needs to be used, two adjustment plates 23 are first moved closer to each other to drive two trapezoidal card plates 20 closer to each other, and then withdrawn from a card slot 19. The protective cover 12 is removed from the device to reveal the test component 13. A staff member places the integrated circuit chip to be tested on a detection placement plate 1, and drives two clamping plates 16 to move closer to each other to detect and clamp the integrated circuit chip by rotating a motor 2 in the opposite direction, so that the integrated circuit chip is stably maintained in the current state, and the integrated circuit chip is prevented from being easily offset during testing, which affects the accuracy of the detection result. The output shaft of the electric push rod 10 is moved downward to drive the test component 13 to move downward to detect the integrated circuit chip.

[0028] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An integrated circuit chip testing tool, comprising a detection placement plate with a cavity formed therein, characterized in that: A rotating motor is fixedly installed on an inner wall of one side of the cavity, a gear is fixedly sleeved on the output shaft of the rotating motor, a fixing rod is fixedly installed in the cavity, two connecting plates are slidably installed on the fixing rod, and the tops of the two connecting plates extend outside the detection placement plate, the two connecting plates are movably connected to the detection placement plate, the bottoms of the two connecting plates are respectively fixedly installed with toothed plates, and the two toothed plates are meshed with the gears, the tops of the two connecting plates are respectively fixedly installed with mounting plates, compression springs are respectively fixedly installed on the outer walls of the two mounting plates on one side close to each other, and clamps are respectively fixedly installed on the ends of the two compression springs close to each other, two guide rods are respectively fixedly installed on the outer walls of the two clamps on one side away from each other, and the four guide rods are slidably connected to the corresponding mounting plates, two supporting rods are fixedly installed on the top of the detection placement plate, top plates are fixedly installed on the tops of the two supporting rods, two electric push rods are fixedly installed on the bottom of the top plate, a cross plate is fixedly installed on the output shafts of the two electric push rods, and a test assembly is fixedly installed on the bottom of the cross plate.

2. The integrated circuit chip testing tool according to claim 1, characterized in that: The two connecting plates are respectively provided with through holes, and linear bearings are respectively fixedly installed in the two through holes. The fixing rod passes through the two linear bearings and is slidably connected with the inner walls of the two linear bearings.

3. The integrated circuit chip testing tool according to claim 1, characterized in that: Two trapezoidal vertical plates are slidably installed on the horizontal plate, and the bottoms of the two trapezoidal vertical plates extend to the bottom of the horizontal plate, and the outer walls of the two trapezoidal vertical plates on the side close to each other are respectively provided with card slots, and protective covers are fixedly installed on the bottoms of the two trapezoidal vertical plates, and the test assembly is located in the protective cover, and two fixed plates are fixedly installed on the top of the horizontal plate, and trapezoidal card plates are slidably installed on the two fixed plates, and the sides of the two trapezoidal card plates away from each other extend into the two card slots respectively.

4. The integrated circuit chip testing tool according to claim 3, characterized in that: An adjusting plate is fixedly mounted on the outer walls of the two trapezoidal clamping plates which are away from each other, and a force spring is fixedly mounted on the outer walls of the two adjusting plates which are close to each other.

5. The integrated circuit chip testing tool according to claim 4, characterized in that: The compression spring and the force spring are both tin-plated springs.

6. The integrated circuit chip testing tool according to claim 1, characterized in that: Two limit baffles are fixedly installed on the top of the transverse plate.

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