SESAM mode locking performance test system
By providing a SESAM mode lock performance test system including SESAM clamping tooling, coupled optical paths, device optical paths, pump lasers and laser parameter measurement equipment, the complex and time-consuming problem of SESAM device testing in the prior art is solved, and the effect of simplifying the test process, saving costs and improving efficiency is achieved.
Patent Information
- Application Number
- CN202421672932.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-16
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2034-07-16
AI Technical Summary
The prior art When testing the mode locking performance of SESAM devices, the method is complex, time-consuming, and easy to damage the SESAM surface, increasing production costs and working hours.
A SESAM mode lock performance testing system is provided, including SESAM clamping tooling, coupled optical paths, device optical paths, pump lasers and laser parameter measurement equipment. The test process is simplified by the SESAM clamping tooling.
It effectively saves experimental time and cost, simplifies the testing process of SESAM mode locking performance, improves R&D and production efficiency, and reduces the damage risk of SESAM surface.
Smart Images
Figure CN222882270U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of laser mode locking, in particular to a SESAM mode locking performance testing system. Background Art
[0002] Semiconductor Saturable Absorber Mirror (SESAM) is the core device in ultrashort pulse mode-locked lasers. By modulating the optical pulses with its saturable absorption characteristics, it can achieve mode-locked ultrafast laser output with a pulse width of picoseconds or femtoseconds in the laser resonator of ultrashort pulse mode-locked lasers. In the process of research and development and mass production of ultrashort pulse mode-locked lasers, it is necessary to quickly detect the working indicators of SESAM devices in the mode-locked resonator, so as to facilitate the selection of SESAM devices in the development of ultrashort pulse mode-locked laser prototypes, or to check the performance of multiple SESAM devices of the same model in mass production, to screen out defective products and improve the product pass rate.
[0003] Taking the fiber mode-locked laser as an example, according to different coupling methods, there are two ways to test SESAM: the coupling method in which the fiber end face directly contacts the SESAM surface, which requires the SESAM device to be fixed on the surface of the ceramic ferrule through mechanical stress and installed in the resonant cavity in contact with the fiber end face. This method is easy to damage the SESAM surface and is troublesome to change points. When replacing the SESAM to be tested, the installation operation needs to be repeated; the coupling method in which the laser is focused on the SESAM surface by a lens, the coupling optical path and SESAM can be packaged into a device with a pigtail, which is fused into the resonant cavity optical path during testing. This test method can only test a single working point on the sample at a time, and the fusion operation needs to be repeated when replaced, and the SESAM packaging requires additional costs and more working hours. Utility Model Content
[0004] In order to solve the technical problems of the prior art, the utility model provides a SESAM locking performance test system, and the specific technical solution is as follows:
[0005] In the first aspect, a SESAM mode-locking performance test system is provided in an embodiment of the present application. The SESAM mode-locking performance test system includes a SESAM clamping fixture, a coupling optical path, a device optical path, a pump laser and a laser parameter measurement device. The SESAM sample to be tested, the coupling optical path and the device optical path constitute a mode-locked laser resonant cavity. The SESAM clamping fixture is used to fix the SESAM sample group to be tested and adjust the position and angle of any SESAM sample to be tested in the SESAM sample group to be tested in the mode-locked laser resonant cavity; the device optical path is respectively connected to the laser parameter measurement device, the coupling optical path and the pump laser.
[0006] Preferably, the SESAM clamping tool comprises an adjustable optical frame and a three-dimensional linear translation stage, and the adjustable optical frame is mounted on the three-dimensional linear translation stage; the adjustable optical frame is used to fix the SESAM sample to be tested and adjust the pitch angle and yaw angle of the SESAM sample to be tested.
[0007] Preferably, the coupling optical path includes a collimator and a focusing lens, the collimator includes a fourth port and a fifth port, the device optical path is connected to the fourth port, and the fifth port is aligned with the focusing lens; the collimator, the focusing lens and the adjustable optical frame are arranged opposite to each other in sequence.
[0008] Preferably, the focusing lens is also used to transmit the reflected light of the SESAM sample to be measured to the fifth port.
[0009] Preferably, the SESAM mode locking performance test system also includes an auxiliary debugging optical path, which includes a circulator, a debugging light source and a first power meter. The circulator is connected to the debugging light source and the first power meter respectively, and the circulator is connected to the fourth port. The debugging light source outputs stable debugging light, and the first power meter is used to measure the power of the reflected light transmitted through the coupling optical path.
[0010] Preferably, the circulator comprises a first port, a second port and a third port, the second port is connected to the fourth port; the first port is connected to the debugging light source; and the third port is connected to the first power meter.
[0011] Preferably, the laser parameter measurement device comprises a second power meter, and the second power meter is connected to the output end of the mode-locked laser resonant cavity.
[0012] Preferably, the laser parameter measurement device further comprises an oscilloscope, which is connected to the output end of the mode-locked laser resonant cavity.
[0013] Preferably, the laser parameter measurement device further comprises a spectrometer, which is connected to the output end of the mode-locked laser resonant cavity.
[0014] Preferably, the pump laser is used to provide pump laser for the mode-locked laser resonant cavity.
[0015] The embodiments of the present utility model have the following advantages:
[0016] The SESAM mode-locking performance test system provided in the embodiment of the present application includes a SESAM clamping fixture, a coupling optical path, a device optical path, a pump laser and a laser parameter measurement device. The SESAM sample to be tested, the coupling optical path and the device optical path constitute a mode-locking laser resonant cavity. The SESAM clamping fixture is used to fix the SESAM sample group to be tested, and adjust the position and angle of any one of the SESAM samples to be tested in the SESAM sample group to be tested in the mode-locking laser resonant cavity; the device optical path is respectively connected to the laser parameter measurement device, the coupling optical path and the pump laser. The present application effectively saves experimental time and cost, simplifies the test process of SESAM mode-locking performance, and improves R&D and production efficiency.
[0017] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present application and should not be regarded as limiting the scope of protection of the present application. For those of ordinary skill in the art, other related drawings can also be obtained based on these drawings without creative work. In each of the drawings, similar components are numbered similarly.
[0019] Figure 1 A structural schematic diagram of a SESAM mode locking performance test system provided in an embodiment of the present application is shown;
[0020] Figure 2 A schematic diagram of the installation of a SESAM sample to be tested provided in an embodiment of the present application is shown;
[0021] Figure 3 A schematic diagram of the structure of a heat sink for placing a SESAM sample to be tested provided in an embodiment of the present application is shown;
[0022] Figure 4 A structural principle diagram of a coupling optical path provided in an embodiment of the present application is shown;
[0023] Figure 5 A structural principle diagram of a coupling optical circuit and an auxiliary debugging optical circuit provided in an embodiment of the present application is shown.
[0024] Description of main component symbols:
[0025] 100-SESAM mode-locking performance test system; 110-SESAM clamping fixture; 120-mode-locked laser resonant cavity; 121-coupling optical path; 1211-collimator; 1212-focusing lens; 122-device optical path; 130-pump laser; 140-laser parameter measurement equipment; 141-second power meter; 142-oscilloscope; 143-spectrometer; 150-auxiliary debugging optical path; 151-circulator; 152-first power meter. DETAILED DESCRIPTION
[0026] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.
[0027] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.
[0028] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0029] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.
[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of the template herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.
[0031] Example
[0032] In order to solve the technical problem that the SESAM mode locking performance test in the prior art is time-consuming and labor-intensive, an embodiment of the present application provides a SESAM mode locking performance test system 100.
[0033] like Figure 1 , a schematic diagram of the structure of a SESAM mode-locking performance test system 100 provided in an embodiment of the present application is shown. The SESAM mode-locking performance test system 100 comprises a SESAM clamping fixture 110, a coupling optical path 121, a device optical path 122, a pump laser 130 and a laser parameter measurement device 140, and the SESAM sample to be tested, the coupling optical path 121 and the device optical path 122 constitute a mode-locked laser resonant cavity 120.
[0034] The SESAM clamping fixture is used to fix the SESAM sample group to be tested and adjust the position and angle of any SESAM sample to be tested in the SESAM sample group to be tested in the mode-locked laser resonant cavity 120; the device optical path 122 is respectively connected to the laser parameter measurement device 140, the coupling optical path 121 and the pump laser 130.
[0035] In an optional embodiment, the SESAM clamping tool 110 includes an adjustable optical frame and a three-dimensional linear translation table, the adjustable optical frame is installed on the three-dimensional linear translation table; the adjustable optical frame is used to fix the SESAM sample to be tested and adjust the pitch angle and yaw angle of the SESAM sample to be tested; the three-dimensional linear translation table is used to adjust the position of the SESAM sample to be tested in the x-axis, y-axis, and z-axis directions.
[0036] It should be noted that the SESAM clamping fixture 110 can also be composed of a three-dimensional linear translation stage, a pitch rotation stage and a fixture, the fixture is used to fix the SESAM sample to be tested, and the pitch rotation stage is used to adjust the pitch angle and yaw angle of the SESAM sample to be tested. The specific structural composition is not limited in this embodiment.
[0037] like Figure 2 As shown in FIG. 1 , the SESAM sample group to be tested is reliably fixed on the heat sink (or clamping base) by an adhesive. Figure 3 As shown, the heat sink (or clamping base) is then mounted on the adjustable optical frame of the SESAM clamping fixture 110.
[0038] After the heat sink (or clamping base) of the SESAM sample to be tested is fixed on the adjustable optical frame, the pitch angle and yaw angle of the surface of the SESAM sample to be tested can be flexibly adjusted by the adjustable optical frame, and the position of the surface of the SESAM sample to be tested in the x-axis, y-axis and z-axis directions can be flexibly adjusted by using a three-dimensional linear translation stage.
[0039] In an optional embodiment, if Figure 4 As shown, the coupling optical path 121 includes a collimator 1211 and a focusing lens 1212, the collimator 1211 includes a fourth port "4" and a fifth port "5", the device optical path 122 is connected to the fourth port "4" of the collimator 1211, and the fifth port of the collimator 1211 is aligned with the focusing lens 1212; the collimator 1211, the focusing lens 1212 and the adjustable optical frame are arranged opposite to each other in sequence.
[0040] In an optional embodiment, the focusing lens 1212 is also used to transmit the reflected light of the SESAM sample to be measured to the fifth port "5".
[0041] It can be understood that, in this embodiment, the fourth port "4" of the collimator 1211 receives a debugging light source through the optical fiber. At this time, the position and direction of the focusing lens 1212 and the collimator 1211 are adjusted to make the optical axes of the collimator 1211 and the focusing lens 1212 coincide with each other, and the light output from the core of the optical fiber is aligned with the focusing lens 1212 through the fifth port "5" of the collimator 1211. The light is focused on the surface of the SESAM sample to be tested through the focusing lens 1212 to form a tiny light spot. At the same time, the reflected light reflected by the SESAM sample to be tested is transmitted to the fifth port "5" of the collimator 1211 through the focusing lens 1212.
[0042] In an optional embodiment, the SESAM mode locking performance test system 100 of this embodiment also includes an auxiliary debugging optical path 150, the auxiliary debugging optical path 150 includes a circulator 151, a debugging light source and a first power meter 152, the circulator 151 is respectively connected to the debugging light source and the first power meter 152, the circulator 151 is connected to the fourth port "4" of the collimator 1211, the debugging light source outputs stable debugging light, and the first power meter 152 is used to measure the power of the reflected light transmitted through the coupling optical path.
[0043] In an optional embodiment, the circulator 151 includes a first port "1", a second port "2" and a third port "3", the second port "2" is connected to the fourth port "4"; the first port "1" is connected to the debugging light source; and the third port "3" is connected to the first power meter 152.
[0044] It is understandable that if Figure 5 As shown, the auxiliary debugging optical circuit 150 of this embodiment provides a debugging light source capable of outputting stable debugging light, and the debugging light source is transmitted to the circulator 151 through the first port "1". Since the light in the circulator 151 is transmitted in a specified direction, the debugging light source is output from the second port "2" to the fourth port "4" of the collimator 1211. When the reflected light reflected by the SESAM sample to be tested is transmitted to the collimator 1211, it is then transmitted to the second port "2" of the circulator 151 through the fourth port "4" of the collimator 1211. At this time, according to the transmission direction of the light in the circulator 151, the reflected light is output from the third port "3" to the probe of the first power meter 152, and then the power of the reflected light is measured by the first power meter 152, so that the tester can debug the coupling optical circuit 121 and the position and angle of the SESAM sample to be tested by observing the change of the power value.
[0045] It should be noted that in the circulator 151 , light can only be transmitted in a specified direction, for example, light input from the first port is output from the second port, and light input from the second port is output from the third port, and the direction cannot be reversed.
[0046] By observing the change of the power value measured by the first power meter 152, the position and angle of the SESAM sample to be measured are adjusted to maximize the power value. At this time, the coupling efficiency of the coupling optical path 121 reaches the best.
[0047] The above setting installs multiple SESAM samples to be tested on a three-dimensional linear translation stage. All samples can be tested by only debugging the coupling optical path 121 once. At the same time, the precise translation stage ensures the coupling efficiency of the optical path and the reliability of the parameters obtained by the test.
[0048] Preferably, when the coupling efficiency of the coupling optical path 121 reaches the best, the optical fiber at the second port of the circulator 151 is disconnected, and the pigtail of the collimator 1211 is fused (or flange-jointed) to the mode-locked laser resonant cavity 120, and the mode-locked laser resonant cavity 120 is preliminarily installed. The mode-locked laser resonant cavity 120 generates a mode-locked laser under the excitation of the pump laser 130, and the output end of the mode-locked laser resonant cavity 120 is connected to a variety of laser parameter measurement devices 140, and the mode-locked laser is output to various laser parameter measurement devices 140 to test the mode-locked performance of the SESAM sample to be tested.
[0049] Preferably, the laser parameter measuring device 140 may be used to measure laser parameters of the mode-locked laser output by the mode-locked laser resonant cavity 120 .
[0050] In an optional embodiment, the laser parameters include power values, and the laser parameter measuring device 140 includes a second power meter 141, which is connected to the output end of the mode-locked laser resonant cavity 120; the mode-locked laser output by the mode-locked laser resonant cavity 120 is received through the probe of the second power meter 141, and multiple power values of the mode-locked laser within a preset time period are measured.
[0051] Preferably, the second power meter 141 measures multiple power values of the mode-locked laser within a certain preset time period to determine the range, mean, standard deviation and other statistical parameters of the fluctuations of these power values over time, and the stability of the operation of the SESAM sample to be tested can be determined based on the statistical parameters. For example, the smaller the fluctuation and the lower the standard deviation, the better the stability.
[0052] In an optional embodiment, the laser parameters also include characteristic parameters of the pulse sequence, and the laser parameter measurement device 140 also includes an oscilloscope 142, which is connected to the output end of the mode-locked laser resonant cavity 120; the mode-locked laser output by the mode-locked laser resonant cavity 120 is received by the photoelectric probe of the oscilloscope 142, and the characteristic parameters of the pulse sequence of the mode-locked laser are measured.
[0053] Preferably, the characteristic parameters of the pulse sequence of the mode-locked laser are measured by the oscilloscope 142. When the pulse sequence is stable, it is proved that a stable mode-locked laser output is obtained, which means that the stability of the SESAM sample to be measured is better.
[0054] In an optional embodiment, the laser parameters also include a spectrum, and the laser parameter measurement device 140 also includes a spectrometer 143, which is connected to the output end of the mode-locked laser resonant cavity 120; the mode-locked laser output by the mode-locked laser resonant cavity 120 is received by a probe of the spectrometer 143, and the spectrum of the mode-locked laser is measured.
[0055] In an optional implementation, the pump laser 130 is used to provide pump laser for the mode-locked laser resonant cavity 120 .
[0056] Preferably, the single pulse mode-locking interval of the mode-locked laser resonant cavity 120 can be determined by repeatedly turning on the pump laser 130 to detect whether the output spectrum and pulse sequence remain consistent, and then adjusting the pump laser.
[0057] Preferably, the self-starting reliability of the SESAM sample to be measured can also be determined based on the power value, characteristic parameters of the pulse sequence, spectrum and other parameters collected by the laser parameter measurement device 140 .
[0058] Therefore, a series of indicators such as stability, reliability and characteristic parameters of the SESAM sample to be tested can be tested more comprehensively through various laser parameter measurement devices 140 .
[0059] It should be noted that, in this embodiment, the first power meter 152 and the second power meter 141 may be the same power meter for measuring at different times, or may be different power meters, and this embodiment of the present application does not limit this.
[0060] Through the above settings, as long as the adjustable optical mirror frame and the three-dimensional linear displacement stage of the SESAM clamping fixture 110 are adjusted, the performance of points at different positions on the SESAM sample to be tested can be tested while maintaining the coupling efficiency, and different SESAM samples to be tested that are pre-fixed on the heat sink (or clamping base) can be easily replaced and tested. After replacement, only the three-dimensional linear displacement stage in the z-axis direction needs to be fine-tuned, and the spacing between the SESAM sample to be tested and the focusing lens 1212 needs to be adjusted and optimized to complete the coupling debugging and measure the laser parameters. There is no need to waste time and repeatedly debug the coupling optical path 121, which can effectively save experimental time and cost, simplify the process of SESAM sample selection in R&D experiments, or batch SESAM sample consistency detection in production, and can also be applied to the R&D of SESAM preparation technology and product quality detection, improving R&D and production efficiency.
[0061] The SESAM mode-locking performance test system 100 provided in the embodiment of the present application includes a SESAM clamping fixture 110, a coupling optical path 121, a device optical path 122, a pump laser 130 and a laser parameter measurement device 140. The SESAM sample to be tested, the coupling optical path 121 and the device optical path 122 form a mode-locking laser resonant cavity 120. The SESAM clamping fixture 110 is used to fix the SESAM sample group to be tested, and adjust the position and angle of any SESAM sample to be tested in the SESAM sample group to be tested in the mode-locking laser resonant cavity; the device optical path 122 is respectively connected to the laser parameter measurement device 140, the coupling optical path 121 and the pump laser 130. The present application effectively saves experimental time and cost, simplifies the test process of SESAM mode-locking performance, and improves R&D and production efficiency.
[0062] In all examples shown and described herein, any specific values should be interpreted as merely exemplary and not as limiting, and thus other examples of the exemplary embodiments may have different values.
[0063] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.
[0064] The above-mentioned embodiments only express several implementation methods of the present invention, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.
Claims
1. A SESAM locking performance test system, characterized in that: The SESAM mode-locking performance test system comprises a SESAM clamping fixture, a coupling optical path, a device optical path, a pump laser and a laser parameter measurement device. The SESAM sample to be tested, the coupling optical path and the device optical path constitute a mode-locking laser resonant cavity. The SESAM clamping fixture is used to fix the SESAM sample group to be tested and adjust the position and angle of any one of the SESAM samples to be tested in the SESAM sample group to be tested in the mode-locking laser resonant cavity; the device optical path is respectively connected to the laser parameter measurement device, the coupling optical path and the pump laser.
2. The SESAM locking performance test system according to claim 1, characterized in that: The SESAM clamping tool comprises an adjustable optical frame and a three-dimensional linear displacement platform, wherein the adjustable optical frame is mounted on the three-dimensional linear displacement platform; the adjustable optical frame is used to fix the SESAM sample to be tested and adjust the pitch angle and yaw angle of the SESAM sample to be tested.
3. The SESAM locking performance test system according to claim 2, characterized in that: The coupling optical path includes a collimator and a focusing lens, the collimator includes a fourth port and a fifth port, the device optical path is connected to the fourth port, and the fifth port is aligned with the focusing lens; the collimator, the focusing lens and the adjustable optical frame are arranged opposite to each other in sequence.
4. The SESAM locking performance test system according to claim 3, characterized in that: The focusing lens is also used to transmit the reflected light of the SESAM sample to be measured to the fifth port.
5. The SESAM locking performance test system according to claim 3, characterized in that: It also includes an auxiliary debugging optical path, which includes a circulator, a debugging light source and a first power meter. The circulator is connected to the debugging light source and the first power meter respectively, the circulator is connected to the fourth port, the debugging light source outputs stable debugging light, and the first power meter is used to measure the power of the reflected light transmitted through the coupling optical path.
6. The SESAM locking performance test system according to claim 5, characterized in that: The circulator comprises a first port, a second port and a third port, wherein the second port is connected to the fourth port; the first port is connected to the debugging light source; and the third port is connected to the first power meter.
7. The SESAM locking performance test system according to claim 1, characterized in that: The laser parameter measurement device comprises a second power meter, and the second power meter is connected to the output end of the mode-locked laser resonant cavity.
8. The SESAM locking performance test system according to claim 1, characterized in that: The laser parameter measurement device also includes an oscilloscope, which is connected to the output end of the mode-locked laser resonant cavity.
9. The SESAM locking performance test system according to claim 1, characterized in that: The laser parameter measurement device further comprises a spectrometer, which is connected to the output end of the mode-locked laser resonant cavity.
10. The SESAM mode locking performance test system according to claim 9, characterized in that: The pump laser is used to provide pump laser for the mode-locked laser resonant cavity.