Elastic sheet needle and connection test module

Abstract

The utility model relates to the field of electronic device detection, in particular to an elastic sheet needle and a connection test module. The elastic sheet needle comprises a needle head contact part, a needle tail contact part and a probe main body connected between the needle head contact part and the needle tail contact part; the needle head contact part is located at the first end of the elastic sheet needle and used for being connected with a contact terminal of a connector, the needle head contact part is provided with a connecting groove, and the connecting groove comprises a first inclined plane and a second inclined plane which are arranged at a preset angle; the needle tail contact part is arranged at the second end of the elastic sheet needle; the probe main body is also provided with an elastic bending part, and the elastic bending part is configured to be capable of elastically stretching out and drawing back in the direction from the first end to the second end of the elastic sheet needle. The elastic sheet needle provided by the utility model can improve the contact stability with the contact terminal of the connector and improve the detection reliability of an electronic device.

Description

Technical Field

[0001] The present application relates to the field of electronic device detection, and in particular to a spring pin and a connection test module. Background Art

[0002] Shrapnel needles are often used to install in the test socket and precisely contact the contact terminals of the special connector of the object under test to achieve stable signal transmission. They are usually used in electronic products such as camera modules, LCD modules, under-screen fingerprint modules and PCB connectors. However, the spacing between the two rows of contact terminals of the connector of electronic products is very small, usually only a few tenths of a millimeter, which can easily cause short circuits due to the bending and deviation of the shrapnel needles; the contact plane of each contact terminal is very narrow, only a few tenths of a millimeter, which makes the contact stability between the contact terminal of the connector and the shrapnel needle poor, affecting the reliability of the detection of the object under test. Utility Model Content

[0003] The present application provides a spring-clip needle and a connection test module, wherein the spring-clip needle can improve the contact stability with the contact terminal of the connector, thereby improving the reliability of electronic device detection.

[0004] In a first aspect, the present application provides a spring-loaded needle, comprising:

[0005] A needle contact portion, provided at the first end of the spring needle and used to connect with the contact terminal of the connector, wherein the needle contact portion is provided with a connecting groove, and the connecting groove includes a first inclined surface and a second inclined surface arranged at a preset angle;

[0006] A needle tail contact portion, provided at the second end of the spring needle;

[0007] The probe body is connected between the needle head contact portion and the needle tail contact portion, and the probe body is provided with an elastic bending portion, and the elastic bending portion is configured to elastically expand and contract along the direction from the first end to the second end of the spring needle.

[0008] In some embodiments, a groove bottom of the connecting groove is provided with an abutment plane, the abutment plane connects the first inclined surface and the second inclined surface, and the abutment plane is used to abut against a contact plane of a contact terminal of the connector.

[0009] In some embodiments, the included angle between the first inclined plane and the second inclined plane is 90°±30°. Preferably, the included angle between the first inclined plane and the second inclined plane is 90°±10°.

[0010] In some embodiments, the elastic bending portion is a curved structure protruding toward the outer sides of the spring pins arranged side by side. Preferably, the curved structure is a serpentine curved structure.

[0011] In some embodiments, the needle contact portion is provided with an avoidance inclined surface. Preferably, the avoidance inclined surface is located outside the spring needles arranged side by side.

[0012] In some embodiments, the angle between the avoidance slope and the first end to the second end of the spring needle is 25°±15°. Preferably, the angle between the avoidance slope and the first end to the second end of the spring needle is 25°±5°.

[0013] In some embodiments, the first inclined surface is farther away from the inner side of the spring needles arranged side by side than the second inclined surface, and the first inclined surface is more protruding toward the first end of the spring needle than the second inclined surface.

[0014] In some embodiments, the spring pin is an integrally electroformed nickel alloy spring pin.

[0015] In some embodiments, the elastic bending portion is disposed at one end of the probe body close to the needle tail contact portion.

[0016] In a second aspect, the present application provides a connection test module, comprising a test socket and a spring pin as described in any one of the above items and arranged in the test socket.

[0017] The above-mentioned technical scheme provided by the embodiment of the present application has the following advantages compared with the prior art: during the test process, the needle contact portion is used to contact the contact terminal of the electronic device connector to achieve electrical connection, by providing a connecting groove on the needle contact portion, utilizing the connecting groove and the contact terminal for docking, and using the first bevel and the second bevel to dock with the contact bevels on both sides of the contact plane of the contact terminal, thereby achieving face-to-face docking between the contact terminals and the contact terminals, thereby improving the contact stability; the needle tail contact portion is used to connect the test circuit board, and the elastic bending portion of the probe body can buffer the pressure of the needle contact portion and elastically shrink, thereby avoiding deformation caused by rigid abutment between the spring clip needle and the contact terminal, resulting in poor contact between the spring clip needle and the connector, and the elastic bending portion can provide a clamping force between the contact terminal and the needle contact portion, thereby further improving the stability of the connection between the spring clip needle and the contact terminal of the connector. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0019] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0020] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0021] Figure 1 is a schematic diagram of the connector;

[0022] Figure 2 for Figure 1 A schematic diagram of contact terminals of the connector;

[0023] Figure 3 A structural diagram of a spring-type needle provided in an embodiment of the present application;

[0024] Figure 4 for Figure 3 A partial enlarged view of the middle A part;

[0025] Figure 5 A schematic diagram of the docking between the spring pin and the contact terminal of the connector provided in an embodiment of the present application.

[0026] Description of reference numerals:

[0027] 10-contact terminal; 11-contact plane; 12-contact inclined surface;

[0028] 20-spring needle; 21-needle head contact portion; 211-first inclined plane; 212-second inclined plane; 213-abutment plane; 214-avoidance inclined plane; 22-probe body; 221-elastic bending portion; 222-hollow groove; 23-needle tail contact portion;

[0029] 30-connector; 31-ground terminal. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0031] The disclosure below provides many different embodiments or examples to realize the different structures of the present application. In order to simplify the disclosure of the present application, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present application. In addition, the present application can repeat reference numbers and / or letters in different examples. This repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed.

[0032] For ease of description, spatial relative terms may be used herein to describe the relative positional relationship or movement of one element or feature relative to another element or feature as shown in the figure, such as "inside", "outside", "inner side", "outer side", "below", "below", "above", "above", "front", "back", etc. Such spatial relative terms are intended to include different orientations of the device in use or operation in addition to the orientation depicted in the figure. For example, if the device in the figure undergoes a position flip or a posture change or a motion state change, then these directional indications also change accordingly, for example: an element described as "below other elements or features" or "below other elements or features" will subsequently be oriented as "above other elements or features" or "above other elements or features". Therefore, the example term "below..." may include both upper and lower orientations. The device may be otherwise oriented (rotated 90 degrees or in other directions) and the spatial relative descriptors used herein are interpreted accordingly.

[0033] In order to solve the technical problem in the prior art that the contact stability between the contact terminal 10 and the spring needle 20 in the connector of the electronic device is poor, which affects the accuracy of the detection result, the present application provides a spring needle 20, which can improve the contact stability with the contact terminal 10, thereby improving the reliability of electronic device detection.

[0034] At present, a new type of connector 30 and its contact terminal 10 are as follows Figure 1 and Figure 2 As shown, the connector 30 adopts contact terminals 10 arranged side by side, and the gap between two rows of contact terminals 10 is only 0.52mm, a contact plane 11 is provided at the bottom of the contact terminal 10, and contact inclined surfaces 12 are provided on both sides of the contact plane 11; wherein, the contact plane 11 is very narrow, only 0.04mm, approximately a point; a ground terminal 31 is also provided on the outside of the contact terminal 10.

[0035] like Figures 2 to 5As shown, in order to improve the adaptability with the above-mentioned contact terminal 10 and improve the contact stability with the contact terminal 10, an embodiment of the present application provides a spring needle 20, which mainly includes a needle head contact portion 21, a needle tail contact portion 23, and a probe body 22 connected between the needle head contact portion 21 and the needle tail contact portion 23; the needle head contact portion 21 is located at the first end of the spring needle 20 and is used to connect with the contact terminal 10, and the needle head contact portion 21 is provided with a connecting groove, and the connecting groove includes a first inclined surface 211 and a second inclined surface 212 set at a preset angle; the needle tail contact portion 23 is arranged at the second end of the spring needle 20; the probe body 22 is also provided with an elastic bending portion 221, and the elastic bending portion 221 is configured to be able to elastically expand and contract along the direction from the first end to the second end of the spring needle 20, so as to avoid deformation caused by the rigid abutment between the needle head contact portion 21 and the contact terminal 10, resulting in poor contact between the spring needle and the connector 30.

[0036] The spring needle 20 can be installed in the test socket, connected to the electronic device through the connector 30, and the test circuit board is electrically connected and the signal is connected to the electronic device being tested. During the test process, the needle contact part 21 is used to contact the contact terminal 10 of the electronic device connector 30 to achieve electrical connection and signal connection. By setting a connection groove on the needle contact part 21, the connection groove and the contact terminal 10 are connected, and the first inclined surface 211 and the second inclined surface 212 are connected with the contact inclined surfaces 12 on both sides of the contact plane 11 of the contact terminal 10, the contact terminals 10 are connected face to face, and the contact stability is improved.

[0037] The needle tail contact portion 23 is used to connect the test circuit board. The elastic bending portion 221 of the probe body 22 can buffer the pressure of the needle head contact portion 21 and elastically shrink, thereby preventing the spring clip needle 20 and the contact terminal 10 from rigidly abutting and deforming, resulting in poor contact between the spring clip needle 20 and the connector 30. The elastic bending portion 221 can provide a tightening force between the contact terminal 10 and the needle head contact portion 21, further improving the stability of the connection between the spring clip needle 20 and the contact terminal 10 of the connector 30.

[0038] In the above embodiment, the connecting groove at least includes a first bevel 211 and a second bevel 212 set at a preset angle. When the connecting groove only includes the first bevel 211 and the second bevel 212, that is, when the connecting groove is a V-shaped groove, when the contact terminal 10 is docked with the needle contact portion 21, the contact bevels 12 on both sides of the contact plane 11 are respectively docked with the first bevel 211 and the second bevel 212 of the connecting groove to achieve surface-to-surface contact, thereby improving contact stability, and the connecting groove plays a certain limiting role on the contact terminal 10.

[0039] The second inclined surface 212 is disposed close to the inner side of the spring pins 20 disposed side by side, and the first inclined surface 211 is disposed away from the inner side of the spring pins 20 disposed side by side. Figure 4 As described, the top of the first bevel 211 protrudes toward the first end of the spring pin 20 relative to the second bevel 212, that is, the first bevel 211 is higher than the second bevel 212 by a preset dimension H1, ensuring that the contact bevels 12 on both sides of the contact terminal 10 are respectively adapted and fitted, while better limiting the contact terminal 10; the preset dimension H1 can be 0.03mm, and can also be adjusted according to actual needs. The first bevel 211 and the second bevel 212 are substantially perpendicular to each other. In specific implementation, the angle α between the first bevel 211 and the second bevel 212 of the connecting groove can be adjusted according to the angle between the contact bevels 12 on both sides of the contact terminal 10. Generally speaking, the angle α between the first bevel 211 and the second bevel 212 is usually 90°±30°, preferably set in the range of 90°±10°, and the overall depth of the connecting groove is about 0.1mm.

[0040] Furthermore, if Figure 3 and Figure 4 As shown, in a spring needle 20 provided by an embodiment of the present application, the connecting groove of the needle contact part 21 also includes a contact plane 213 located at the bottom of the groove, and the contact plane 213 is connected between the first inclined surface 211 and the second inclined surface 212, so that the connecting groove generally constitutes an inverted trapezoidal structure, and the contact plane 213 is used to abut against the contact plane 11 of the contact terminal 10. The size of the abutment plane 213 matches that of the contact terminal 10, that is, the width of the abutment plane 213 is about 0.04 mm, ensuring a good fit between the abutment plane 213 and the contact plane 11.

[0041] The elastic bending portion 221 is arranged at one end of the probe body 22 near the needle tail contact portion 23. Specifically, a serpentine bending structure can be adopted, and the serpentine bending structure is convex toward the outside of the spring needles 20 arranged side by side, so that one side edge of the serpentine bending structure is roughly in the same straight line with the probe body 22, the needle head contact portion 21 and the needle tail contact portion 23, ensuring that two rows of spring needles 20 can be arranged side by side with a small gap. The serpentine bending structure is also provided with a hollow groove 222, and the extension direction of the hollow groove 222 is consistent with the serpentine bending structure. With the provision of the hollow groove 222, the deformation amount and deformation direction of the elastic bending portion 221 are more stable, avoiding deformation of the spring needle 20 and the contact terminal 10 due to rigid contact, resulting in poor contact between the spring needle 20 and the connector 30.

[0042] Combined with reference Figures 3 to 5In some embodiments, the outer side of the needle contact portion 21 is further provided with an avoidance slope 214. The outer side here refers to the side of the two spring needles 20 arranged side by side that are away from each other. By setting the avoidance slope 214, the needle contact portion 21 is avoided when docking with the contact terminal 10 stack of the connector 30, avoiding the connection with the ground terminal 31 in the connector 30 to cause a short circuit. The angle between the avoidance slope 214 and the direction from the first end to the second end of the spring needle 20, that is, the length direction of the spring needle 20, is β, which can usually be set within the range of 25°±15°, preferably within the range of 25°±5°. The projection size of the avoidance slope 214 in the direction from the first end to the second end of the spring needle 20, that is, the projection size in the length direction of the spring needle 20, is about 0.44 mm.

[0043] The above-mentioned spring needle 20 including the needle head contact part 21, the probe body 22 and its elastic bending part 221, and the needle tail contact part 23 is a sheet structure integrally formed by the electroforming process. The whole is made of nickel alloy material to ensure stable contact with the contact terminal 10 of the connector 30 while having good corrosion resistance.

[0044] The embodiment of the present application also provides a connection test module suitable for connection testing of electronic devices, and the connection test module includes a test socket and a spring needle 20 provided in the test socket as provided in the above embodiment. The structure of the test socket refers to the prior art. After the spring needle 20 is installed in the test socket, the electronic device is plugged into the test socket through the connector 30. The contact terminal 10 of the connector 30 matches the connection groove of the needle contact part 21 of the spring needle 20 to achieve surface-to-surface contact. The setting of the elastic bending area avoids the rigid abutment between the contact terminal 10 and the spring needle 20 on the one hand, and provides a tightening force between the connection groove and the contact terminal 10 on the other hand, thereby improving the connection stability between the spring needle 20 and the contact terminal 10, and thus improving the accuracy of the electronic device test.

[0045] It should be understood that the terms used in the text are only for the purpose of describing specific example embodiments, and are not intended to be limiting. Unless the context clearly indicates otherwise, the singular forms "one", "an" and "said" as used in the text may also be meant to include plural forms. The terms "include", "comprise", "contain", and "have" are inclusive, and therefore specify the existence of stated features, steps, operations, elements and / or parts, but do not exclude the existence or addition of one or more other features, steps, operations, elements, parts, and / or combinations thereof. The method steps, processes, and operations described herein are not interpreted as necessarily requiring them to be performed in the specific order described or illustrated, unless the execution order is clearly indicated. It should also be understood that additional or alternative steps may be used.

[0046] Although the terms first, second, third, etc. can be used in the text to describe multiple elements, components, regions, layers and / or sections, these elements, components, regions, layers and / or sections should not be limited by these terms. These terms can only be used to distinguish an element, component, region, layer or section from another region, layer or section. Unless the context clearly indicates, terms such as "first", "second" and other numerical terms do not imply order or sequence when used in the text. Therefore, the first element, component, region, layer or section discussed below can be referred to as the second element, component, region, layer or section without departing from the teaching of the example embodiments.

[0047] The above description is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest range consistent with the principles and novel features applied for herein.

Claims

1. A spring needle, characterized in that: include: A needle contact portion, provided at the first end of the spring needle and used to connect with the contact terminal of the connector, wherein the needle contact portion is provided with a connecting groove, and the connecting groove includes a first inclined surface and a second inclined surface arranged at a preset angle; A needle tail contact portion, provided at the second end of the spring needle; The probe body is connected between the needle head contact portion and the needle tail contact portion, and the probe body is provided with an elastic bending portion, and the elastic bending portion is configured to elastically expand and contract along the direction from the first end to the second end of the spring needle.

2. The spring needle according to claim 1, characterized in that: A contact plane is provided at the bottom of the connecting groove, the contact plane connects the first inclined surface and the second inclined surface, and the contact plane is used to abut against a contact plane of a contact terminal of the connector.

3. The spring needle according to claim 1, characterized in that: The included angle between the first inclined surface and the second inclined surface is 90°±30°.

4. The spring needle according to claim 1, characterized in that: The elastic bending portion is a curved structure protruding toward the outer sides of the spring pins arranged side by side.

5. The spring needle according to any one of claims 1 to 4, characterized in that: The needle contact portion is provided with an avoidance inclined surface.

6. The spring needle according to claim 5, characterized in that: The included angle between the avoidance slope and the direction from the first end to the second end of the spring needle is 25°±15°.

7. The spring needle according to claim 5, characterized in that: The first inclined surface is farther away from the inner side of the spring needles arranged side by side than the second inclined surface, and the first inclined surface is more protruding toward the first end of the spring needle than the second inclined surface.

8. The spring needle according to claim 1, characterized in that: The shrapnel needle is an integrally electroformed nickel alloy shrapnel needle.

9. The spring needle according to claim 1, characterized in that: The elastic bending portion is arranged at one end of the probe body close to the needle tail contact portion.

10. A connection test module, characterized in that: It comprises a test socket and a spring needle as claimed in any one of claims 1 to 9 and arranged in the test socket.

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