Test pin and test device

Abstract

The utility model discloses a test needle and a test device. The test needle comprises a needle core, a shell, a first limiting part and a second limiting part. The shell is sleeved outside the needle core; the first limiting part and the second limiting part are annularly arranged on the outer surface of the shell in the circumferential direction of the shell, and an included angle is formed between the first limiting part and the second limiting part. The test pin is provided with a limiting part structure, and can be combined and installed by using a plurality of test pins with different included angles. During installation, the first limiting part and the second limiting part do not occupy too much layout area, and the device is suitable for a high-density layout test scene. And the first limiting part and the second limiting part of each test pin are not contacted, so that interference is avoided, and the installation of the test pins can still be ensured.

Description

Technical Field

[0001] The present application relates to the technical field of testing equipment, and in particular to a testing needle and a testing device. Background Art

[0002] Electronic equipment needs to be tested for radio frequency indicators to ensure the communication performance of the electronic equipment. To this end, multiple radio frequency test sockets are provided on the circuit board of the electronic equipment, and the radio frequency test sockets are electrically connected using a radio frequency test device, which includes a test fixture and multiple test pins. During the test, multiple test pins are fixed to the test fixture through corresponding flanges, and the test pins are electrically connected to the radio frequency test sockets one by one to perform the test.

[0003] As electronic devices become thinner and lighter, the size of the circuit boards in electronic devices becomes smaller, which makes the distance between the RF test sockets on the circuit boards smaller. Therefore, the distance between the test pins on the corresponding test fixtures also becomes smaller. However, the smaller distance between the test pins may cause interference between the flanges used to fix the test pins, making it impossible to install the test pins. Utility Model Content

[0004] The present application provides a test needle and a test device to solve the problem of being unable to install due to the increase in the integration density of the test needle and the interference of the corresponding flange.

[0005] In a first aspect, the present application provides a test needle, comprising: a needle core, a shell, a first limiting portion and a second limiting portion. The shell is sleeved on the outside of the needle core; along the circumference of the shell, the first limiting portion and the second limiting portion are arranged on the outer surface of the shell, and an angle is formed between the first limiting portion and the second limiting portion.

[0006] The test needle provided in the embodiment of the present application has a self-contained limit structure, and can be installed by combining multiple test needles with different angles. During installation, the first limit and the second limit can not occupy too much layout area, which is suitable for high-density layout test scenarios. The first limit and the second limit of each test needle will not contact each other, and thus no interference will occur, and the installation of the test needle can still be guaranteed.

[0007] In some implementations, the extension direction of the first limiting portion is parallel to the radial direction of the housing, and the extension direction of the second limiting portion is parallel to the radial direction of the housing; the surface of the first limiting portion facing the needle tip of the needle core is coplanar with the surface of the second limiting portion facing the needle tip. In this way, the housing can be fixed to the fixture needle plate by using the first limiting portion and the second limiting portion, and the balance of the test needle can be maintained so that the test needle can move along the z-axis direction to ensure the performance of the RF test.

[0008] In some implementations, the first limiting portion and the second limiting portion are an integrated structure and are fixed to the outer surface of the housing, so that the bonding strength of the first limiting portion, the second limiting portion and the housing can be improved, thereby improving reliability.

[0009] In some implementations, the first limit portion and the second limit portion are rotatably connected to the housing; the first limit portion and the second limit portion are configured to generate relative movement along the circumference of the housing to adjust the angle of the included angle. In this way, the first limit portion and the second limit portion can fix the test needle at different angles, so that the test needle can be installed in scenes with different layout areas, which can not only further improve the versatility of the test needle, but also ensure the installation of the test needle and realize a high-density layout of the test needle.

[0010] In some implementations, the first end of the first limiting portion includes a first interlocking groove and a first through hole, the first interlocking groove is located on the surface of the first end facing the needle, and the axial direction of the first through hole is parallel to the length direction of the shell; the second end of the second limiting portion includes a second interlocking groove and a second through hole, the second interlocking groove is located on the surface of the second end facing away from the needle, and the axial direction of the second through hole is parallel to the length direction of the shell; the first limiting portion is rotatably connected to the shell through the first through hole, and the second limiting portion is rotatably connected to the shell through the second through hole, the opening side of the first interlocking groove is opposite to the opening side of the second interlocking groove, and the first end is interlocked with the second end; the first end of the first limiting portion is configured to rotate in the second interlocking groove, and the second end of the second limiting portion is configured to rotate in the first interlocking groove. In this way, the first limiting portion and the second limiting portion can rotate independently and respectively relative to the annular groove to adjust the angle of the included angle according to the usage scenario.

[0011] In some implementations, the housing includes: an annular groove, which is located on the outer surface of the housing and is arranged along the circumference of the housing; the first limiting portion is sleeved in the annular groove through the first through hole, and the second limiting portion is sleeved in the annular groove through the second through hole. In this way, by providing the first limiting portion and the second limiting portion in the form of an annular groove on the housing, the first limiting portion and the second limiting portion can be independently and respectively rotated relative to the annular groove to adjust the angle of the included angle according to the usage scenario.

[0012] In some implementations, it further includes: a rotating part, the rotating part includes a rotating shaft and a fixed part connected to each other, the fixed part is fixed to one end of the housing through the rotating shaft, and the needle core passes through the rotating shaft and the fixed part; the first limiting part is sleeved on the rotating shaft through the first through hole and rotates relative to the rotating shaft; the second limiting part is sleeved on the rotating shaft through the second through hole and rotates relative to the rotating shaft. In this way, the first limiting part and the second limiting part can be installed and rotated by using the rotating part arranged at one end of the housing.

[0013] In some implementations, the diameter of the rotating shaft is smaller than the diameter of the fixing portion, and the diameter of the rotating shaft is smaller than the diameter of the housing. In this way, the fixing portion and the housing can be used to limit the first end and the second end, so as to prevent the first limiting portion and the second limiting portion from moving up and down along the z-axis when rotating along the circumferential direction of the housing, thereby affecting the fixing effect of the test needle and further affecting the accuracy of the RF test.

[0014] In some implementations, the invention further includes: a floating spring; the floating spring is sleeved outside the needle core and is located between the housing and the first limiting portion and the second limiting portion. In this way, during testing, the floating spring can be used to make the test needle adapt to the alignment tolerance of the RF test socket, thereby preventing the needle core from excessively contacting the RF test socket and damaging the circuit board.

[0015] In the second aspect, the present application provides a testing device, comprising: a test fixture, a test base plate, and a test needle as provided in the first aspect; the test fixture and the test base plate are arranged opposite to each other, the test base plate is configured as a circuit board carrying an electronic device, and the circuit board includes a radio frequency test socket; the test needle is fixed to the test fixture by a first limiting portion and a second limiting portion, and the needle tip of the needle core faces the test base plate and corresponds to the radio frequency test socket.

[0016] The test device provided in the embodiment of the present application adopts a test needle with a self-contained limiter structure, and is installed by using a first limiter and a second limiter to facilitate installation, disassembly, and alignment adjustment; and the test needle with a limiter structure does not need to be customized, has low cost, and good versatility. There is an angle between the first limiter and the second limiter, so that the first limiter and the second limiter do not occupy too much of the area of ​​the angled needle plate, which is suitable for high-density layout test scenarios. Test needles with different angles can be installed in combination, and the first limiter and the second limiter of each test needle will not contact each other, and thus no interference will occur, and the installation of the test needle can still be guaranteed to ensure the implementation of the radio frequency test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solution of the present application, the drawings required for use in the embodiments are briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application;

[0019] Figure 2A is a first structural schematic diagram of a radio frequency test fixture 40;

[0020] Figure 2B is a second structural schematic diagram of a radio frequency test fixture 40;

[0021] Figure 3 It is a schematic diagram of the structure of a radio frequency test needle;

[0022] Figure 4 It is a schematic diagram of the structure of a radio frequency test system;

[0023] Figure 5 It is a first structural schematic diagram of a plurality of radio frequency test needles 43 arranged on a fixture needle plate 41;

[0024] Figure 6 is a second structural schematic diagram of a plurality of radio frequency test needles 43 arranged on a fixture needle plate 41;

[0025] Figure 7 This is a first structural schematic diagram of the test needle 60 provided in an embodiment of the present application;

[0026] Figure 8 is a schematic diagram of the angle formed by the first limiting portion 103 and the second limiting portion 104 provided in an embodiment of the present application;

[0027] Fig. 9 It is a structural schematic diagram of a high-density layout of multiple test pins 60 provided in an embodiment of the present application;

[0028] Fig.10 is a second structural schematic diagram of the test needle 60 provided in an embodiment of the present application;

[0029] Fig.11 is a top view of a test needle 60 provided in an embodiment of the present application;

[0030] Fig.12 is an exploded schematic diagram of a test needle 60 provided in an embodiment of the present application;

[0031] Fig.13 is a schematic structural diagram of the rotating part 105 and the housing 102 provided in an embodiment of the present application;

[0032] Fig.14 is a third structural schematic diagram of the test needle 60 provided in the embodiment of the present application;

[0033] Fig.15 It is a schematic diagram of the structure of the testing device provided in the embodiment of the present application.

[0034] Illustration Description:

[0035] 10-display screen, 20-middle frame, 30-circuit board, 31-RF test socket, 40-RF test fixture, 41-fixture needle plate, 42-fixture bottom plate, 43-RF test needle, 431-needle sleeve, 432-needle core, 44-flange, 45-needle pressure assembly, 46-installation cover, 51-RF test instrument, 52-RF line, 60-test needle, 101-needle core, 1011-connector, 1012-needle head, 102-housing, 1021-annular groove, 1022 -First shell, 1023-second shell, 103-first limiting part, 103a-first end, 1031-first fitting groove, 1032-first through hole, 1033-first limiting hole, 104-second limiting part, 104a-second end, 1041-second fitting groove, 1042-second through hole, 1043-second limiting hole, 105-rotating part, 1051-rotating axis, 1052-fixing part, 106-floating spring, 71-test fixture, 72-test base plate. DETAILED DESCRIPTION

[0036] The technical solutions in the embodiments of the present application will be described clearly below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments of the present application, other embodiments obtained by ordinary technicians in this field without making creative work all belong to the protection scope of the present application.

[0037] In the following, the terms "first", "second", etc. are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more.

[0038] In addition, in the present application, directional terms such as "up", "down", "left" and "right" are defined relative to the orientation of the components in the drawings. It should be understood that these directional terms are relative concepts. They are used for relative description and clarification, and they may change accordingly according to the changes in the orientation of the components in the drawings.

[0039] The electronic device described in the embodiments of the present application includes but is not limited to a mobile phone, a notebook computer, a tablet computer, a laptop computer, a personal digital assistant or a wearable device, etc. The following description is made by taking the electronic device as a mobile phone.

[0040] Figure 1 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0041] like Figure 1As shown, the electronic device may include a display screen 10, a middle frame 20 and a rear shell, wherein the display screen 10 and the rear shell are located on opposite sides of the middle frame 20, and the display screen 10, the middle frame 20 and the rear shell are buckled together in sequence to form a whole machine cavity. Among them, the whole machine cavity includes components such as a communication module, a circuit board, a battery, a speaker assembly and a camera assembly, which are not listed here one by one.

[0042] Electronic equipment needs to be tested for RF indicators to ensure the communication performance of the electronic equipment. To this end, a plurality of RF test sockets are provided on the circuit board of the electronic equipment, and the plurality of RF test sockets are arranged at intervals. The RF test socket is electrically connected to the circuit board, and the RF test socket serves as a test connector to test the circuit board of the electronic equipment. When performing RF testing, an RF test system is electrically connected to the RF test socket to complete the test of RF indicators (such as power, etc.).

[0043] To facilitate the description of the positions of various components in the device, the embodiment of the present application exemplarily establishes a three-dimensional coordinate system based on the device, wherein the x-axis direction is the width direction of the device, the y-axis direction is the length direction of the device, and the z-axis direction is the thickness direction of the device. The device includes electronic equipment, RF test fixture or test device, etc.

[0044] Figure 2A is a first structural schematic diagram of a radio frequency test fixture 40; Figure 2B It is a second structural schematic diagram of a radio frequency test fixture 40 .

[0045] like Figure 2A and Figure 2B As shown, the RF test system includes an RF test fixture 40, which includes a fixture pin plate 41, a fixture bottom plate 42 and a plurality of RF test pins 43. The fixture pin plate 41 and the fixture bottom plate 42 are arranged relative to each other along the z-axis direction, and the fixture pin plate 41 can move relative to the fixture bottom plate 42 along the z-axis direction.

[0046] Figure 3 The present invention is a structural schematic diagram of a radio frequency test needle.

[0047] like Figure 3 As shown, the RF test needle 43 includes a needle sleeve 431 and a needle core 432 . The needle sleeve 431 is sleeved on the outside of the needle core 432 , and part of the needle core 432 is exposed from the end of the needle sleeve 431 , so that the needle core 432 can contact the device.

[0048] A set of flanges 44 are provided on the outer surface of the needle sleeve 431 . The set of flanges 44 are fixed on the needle sleeve 431 in a right angle state. That is, the set of flanges 44 and the needle sleeve 431 are in a vertical state.

[0049] Combination Figure 2A and Figure 3As shown, a plurality of RF test pins 43 are spaced apart on the fixture pin plate 41 through corresponding flanges 44. The fixture bottom plate 42 is used to carry the circuit board 30. The plurality of RF test sockets 31 on the circuit board 30 correspond to the plurality of RF test pins 43 one by one, and the interval between two adjacent RF test sockets 31 is equal to the interval between two adjacent RF test pins 43.

[0050] The RF test pin 43 is used to electrically connect the RF test socket 31 on the circuit board 30 to a RF test instrument, so as to calibrate and test the relevant indicators of the RF signal, such as power.

[0051] When not testing, there is a certain distance between the fixture needle plate 41 and the fixture bottom plate 42, so that the needle tip of the RF test needle 43 is at a distance L from the RF test socket 31. 0 , the RF test pin 43 is not electrically connected to the RF test socket 31 .

[0052] like Figure 2B As shown, during the test, the clamp needle plate 41 is along D 2 The RF test pin 43 moves toward the fixture bottom plate 42 so that the RF test pin 43 contacts the RF test socket 31 opposite to it to achieve electrical connection. Figure 2A When the test is completed, the fixture needle plate 41 is along D 1 The direction moves away from the fixture bottom plate 42, so that the needle tip of the RF test needle 43 is at a distance L from the RF test socket 31. 0 , disconnect the electrical connection.

[0053] Figure 4 The schematic diagram of the structure of a radio frequency test system is shown in FIG.

[0054] like Figure 4 As shown, the RF test system also includes a RF test instrument 51 . Taking a RF test socket 31 of the circuit board 30 and a corresponding RF test needle 43 as an example, the RF test instrument 51 is connected to the RF test needle 43 via a RF line 52 .

[0055] During the test, the RF test needle 43 contacts the RF test socket 31 to achieve electrical connection. In this way, the circuit board 30, the RF test socket 31, the RF test needle 43, the RF line 52 and the RF test instrument 51 form a test path, and the signal detected by the RF test needle 43 is sent to the RF test instrument 51 through the RF line 52 to achieve the test of the RF index.

[0056] As electronic devices become thinner and lighter, the size of the circuit board 30 in the electronic device becomes smaller. As the design of the circuit board 30 becomes smaller and smaller, and the degree of integration is high, in order to save the layout space of the circuit board 30, the RF test sockets 31 on the circuit board 30 become smaller, and the layout spacing of the RF test sockets 31 also becomes smaller, so the spacing between the RF test pins 43 on the fixture pin board 41 also needs to be reduced accordingly.

[0057] Figure 5 The first structural schematic diagram is a schematic diagram of a plurality of radio frequency test needles 43 arranged on a fixture needle plate 41 .

[0058] like Figure 5 As shown, from the top view of the fixture pin board 41, according to the layout position of the RF test socket 31 on the circuit board 30, a plurality of RF test pins 43 are arranged on the fixture pin board 41. As the integration density of the plurality of RF test sockets 31 increases, the integration density of the plurality of RF test pins 43 increases accordingly.

[0059] Exemplarily, the fixture needle plate 41 includes at least areas A1, A2, and A3. Areas A1, A2, and A3 need to be arranged with seven RF test needles 43. The seven RF test needles 43 correspond one-to-one to the seven RF test sockets 31 arranged on the circuit board 30.

[0060] The two RF test needles 43 in area A1 can be fixed by corresponding flanges 44, and the two RF test needles 43 in area A2 can also be fixed by corresponding flanges 44. The two ends of each flange 44 are fixed by a pressure needle assembly 45 to keep the flange 44 balanced, thereby ensuring the balance of the RF test needle 43 moving up and down along the z-axis. The other end of the pressure needle assembly 45 is fixed on the fixture needle plate 41. Among them, the pressure needle assembly 45 includes a pressure needle block and a pressure needle spring. In this way, the layout area left for area A3 is reduced.

[0061] However, three RF test pins 43 need to be arranged in area A3, and the spacing between the three RF test pins 43 is reduced. If the three RF test pins 43 are still fixed by their respective flanges 44, it is easy to cause interference between the three sets of flanges 44, and also interfere with the flanges 44 or pressure pin assemblies 45 in the adjacent areas A1 and A2, which will cause the three RF test pins 43 in area A3 to be unable to be installed, and the corresponding pressure pin assemblies 45 cannot be installed.

[0062] Figure 6 The second structural schematic diagram is a diagram showing a plurality of radio frequency test needles 43 arranged on a fixture needle plate 41 .

[0063] like Figure 6As shown, the RF test system also includes a mounting cover 46, which is suitable for high-density layout test scenarios and is set in an area where the layout area of ​​the fixture needle plate 41 is small or the integration density is high, such as in area A3. The three RF test needles 43 in area A3 are fixed by the mounting cover 46, and there is no need to use their respective flanges 44 for installation, and the pressure needle assembly 45 cannot be installed, so as to avoid interference between the flanges 44 and the inability to install in high-density layout scenarios.

[0064] However, since the RF test needle 43 has high-precision alignment requirements to accurately correspond to the RF test socket 31, this places high demands on the processing accuracy of the mounting cover 46, and needs to be customized for different scenarios, which is not universal and has high costs. Multiple RF test needles 43 share a mounting cover 46, and there is mutual coupling, which makes installation, disassembly and alignment adjustment inconvenient. For example, if there is a RF test needle 43 that is not aligned, and cannot be installed, disassembled and aligned due to the shared mounting cover 46, then all RF test needles 43 cannot be used, affecting the RF test.

[0065] In order to solve the above technical problems, an embodiment of the present application provides a test pin 60 suitable for high-density layout test scenarios. When the integration density of the test pin 60 increases, the corresponding flange will not interfere and can still be installed to ensure the implementation of RF testing.

[0066] Figure 7 This is the first structural schematic diagram of the test needle 60 provided in the embodiment of the present application.

[0067] like Figure 7 As shown, in some embodiments, the test needle 60 may include: a needle core 101 , a housing 102 , a first limiting portion 103 and a second limiting portion 104 .

[0068] The needle core 101 may include a connector 1011 and a needle head 1012, and the connector 1011 and the needle head 1012 are located at opposite ends of the needle core 101 body. Figure 4 The connector 1011 is configured to be electrically connected to the RF test instrument 51 through the RF line 52 , and the needle 1012 is configured to be electrically connected to the RF test socket 31 on the circuit board 30 .

[0069] The housing 102 is sleeved on the outside of the needle core 101 to protect the needle core 101. The needle core 101 and the housing 102 can both be cylindrical, and the needle core 101 and the housing 102 are coaxially arranged. The connector 1011 and the needle head 1012 are exposed from two opposite ends of the housing 102 to facilitate electrical connection of the connector 1011 and the needle head 1012 with other devices.

[0070] Along the circumference of the housing 102, the first limiting portion 103 and the second limiting portion 104 are disposed around the outer surface of the housing 102. For example, the first limiting portion 103 and the second limiting portion 104 may be located at a position adjacent to the joint 1011 of the housing 102. Figure 2A The first limiting portion 103 and the second limiting portion 104 are used to fix the housing 102 on the clamp needle plate 41.

[0071] The end of the first limiting portion 103 facing away from the housing 102 includes a first limiting hole 1033, and the end of the second limiting portion 104 facing away from the housing 102 includes a second limiting hole 1043. Correspondingly, the clamp needle plate 41 includes an assembly hole (not shown in the figure) opposite to the two limiting holes, and a positioning pin (not shown in the figure) is passed through the first limiting hole 1033 and one assembly hole of the clamp needle plate 41, and another positioning pin is passed through the second limiting hole 1043 and another assembly hole of the clamp needle plate 41 to achieve the first limiting portion 103 and the second limiting portion 104 and the clamp needle plate 41. Fixation.

[0072] In some embodiments, the first limiting portion 103 and the second limiting portion 104 are an integrated structure and fixed to the outer surface of the housing 102. In this way, the bonding strength of the first limiting portion 103, the second limiting portion 104 and the housing 102 can be improved, thereby improving reliability.

[0073] The surface of the first limiting portion 103 facing the needle head 1012 of the needle core 101 and the surface of the second limiting portion 104 facing the needle head 1012 are both used to contact the fixture needle plate 41, so the surface of the first limiting portion 103 facing the needle head 1012 of the needle core 101 is coplanar with the surface of the second limiting portion 104 facing the needle head 1012. In this way, the housing 102 can be conveniently fixed to the fixture needle plate 41 by using the first limiting portion 103 and the second limiting portion 104, and the balance of the test needle 60 can be maintained, so that the test needle 60 can move up and down along the z-axis direction to ensure the performance of the RF test.

[0074] Figure 8 It is a schematic diagram of the angle formed by the first limiting portion 103 and the second limiting portion 104 provided in the embodiment of the present application.

[0075] like Figure 8 As shown, in some embodiments, the first limiting portion 103 and the second limiting portion 104 have an included angle α 1 .

[0076] The extending direction of the first limiting portion 103 is parallel to the radial direction of the housing 102, and the extending direction of the second limiting portion 104 is parallel to the radial direction of the housing 102, so that the angle α 1 It is formed by the extension direction of the first limiting portion 103 and the extension direction of the second limiting portion 104 .

[0077] Since the first limiting portion 103 and the second limiting portion 104 are an integrated structure, the angle α 1 However, in order to be applicable to different high-density layout test scenarios, the first limiting portion 103 and the second limiting portion 104 can have different angles α. 1 The state forms an integrated structure.

[0078] like Figure 8 As shown in (a), the angle α 1 The first limit portion 103 extends in a direction parallel to the x-axis, the second limit portion 104 extends in a direction parallel to the y-axis, and the first limit portion 103 is perpendicular to the second limit portion 104. 1 is 90°.

[0079] like Figure 8 As shown in (b), the angle α 1 The extension direction of the first limiting portion 103 is parallel to the x-axis direction, and the extension direction of the second limiting portion 104 is inclined toward the first limiting portion 103 relative to the y-axis direction. For example, the angle α 1 30°, 45°, 60°, etc.

[0080] like Figure 8 As shown in (c), the angle α 1 The extension direction of the first limiting portion 103 is parallel to the x-axis direction, and the extension direction of the second limiting portion 104 is inclined relative to the y-axis direction in a direction away from the first limiting portion 103. For example, the angle α 1 It is 120°, 135°, 150°, etc.

[0081] Angle α 1 It can be a right angle, an acute angle or an obtuse angle, that is, the angle α 1 is a non-straight angle, that is, the angle α 1 In this way, the extension directions of the first limiting portion 103 and the second limiting portion 104 are not parallel, and are not located on opposite sides of the housing 102, but are relatively located on the same side of the housing 102, so that when the test needle 60 is installed, the first limiting portion 103 and the second limiting portion 104 will not occupy too much layout area of ​​the angle needle plate 41.

[0082] In some embodiments, in order to further reduce the layout area of ​​the angle needle plate 41 occupied excessively by the first limiting portion 103 and the second limiting portion 104 , the lengths of the first limiting portion 103 and the second limiting portion 104 may be reduced accordingly while ensuring reliability.

[0083] For example, Figure 8The first limit portion 103 shown in (a) has a first length L 1 , Figure 8 The first limiting portion 103 shown in (b) has a second length L 2 , Figure 8 The first limiting portion 103 shown in (c) has a third length L 3 The first length L 1 , the second length L 2 , the third length L 3 They can be the same or different. For example, the first length L 1 Less than the second length L 2 , the second length L 2 Equal to the third length L 3 .

[0084] Fig. 9 It is a schematic structural diagram of a high-density layout of multiple test pins 60 provided in an embodiment of the present application.

[0085] like Fig. 9 As shown, in some embodiments, to adapt to high-density layout test scenarios, a plurality of test needles 60 with different angles may be used in combination to avoid interference between the limiting parts.

[0086] like Fig. 9 As shown in (a), in a high-density layout test scenario where three test pins 60 need to be installed, for example, Figure 5 The layout scenario of the area A3 shown in the figure can adopt the angle α formed by the two limiting parts. 1 is 90° (hereinafter referred to as "the angle α of the limiting portion" 1 is 90°" is referred to as "angle α 1 The test pin 60 with a width of 90°”) and the RF test pin 43 with a conventional flange 44 in a flat angle state are installed in combination. For example, if the three RF test sockets 31 are distributed in a triangle, the corresponding three pin cores 101 are also distributed in a triangle. In this scenario, the two angles α 1 The test pins 60 with an angle of 90° are distributed in a mirror image, the second limit portion 104 of the left test pin 60 is opposite to the first limit portion 103 of the right test pin 60, and the side surfaces of the first limit portion 103 of the left test pin 60 and the second limit portion 104 of the right test pin 60 are coplanar; the RF test pin 43 with the flange 44 in a flat angle state is located on the coplanar side of the limit portions of the two test pins 60. In this way, the first limit portions 103 and the second limit portions 104 of the three test pins 60 are not in contact with each other, and no interference will occur; and the lengths of the first limit portion 103 and the second limit portion 104 are both less than the length of the flange 44, and the three test pins 60 installed in combination can reduce the layout area occupied by the angle pin plate 41.

[0087] It should be noted that in the scenario where three test pins 60 need to be arranged in a high density, three angles α can also be used. 1 The test needles 60 are installed in a 120° combination, and three test needles 60 are distributed in a circular array, and their respective needle cores 101 are opposite to each other. Other combinations can also be used, which are not limited here.

[0088] like Fig. 9 As shown in (b), in a high-density layout test scenario where four test pins 60 need to be installed, for example, Figure 5 The layout scenario of area A3 shown in the figure can adopt four angles α 1 The test pins 60 with an angle of 90° are installed in combination. Exemplarily, the four test pins 60 are distributed in a circular array, and the respective needle cores 101 are opposite to each other; any two adjacent test pins 60 are in a mirror image state, and the first limiting portion 103 of one of the test pins 60 is opposite to the second limiting portion 104 of the adjacent test pin 60, and the second limiting portion 104 of one of the test pins 60 is coplanar with the side surface of the first limiting portion 103 of the adjacent test pin 60. In this way, there is no contact between the first limiting portion 103 and the second limiting portion 104 of the four test pins 60, and therefore, no interference occurs. In addition, since the length of the first limiting portion 103 and the second limiting portion 104 are relatively short, the four test pins 60 installed in combination can reduce the layout area occupied by the angled pin plate 41.

[0089] It should be noted that, according to the layout area and integration density of the fixture needle plate 41, a corresponding number of clamps with different angles α can be combined. 1 The first limiting portion 103 and the second limiting portion 104 of each test pin 60 will not contact each other, and thus no interference will occur, thereby ensuring the installation of each test pin 60 and the installation of the pin pressing assembly 45 thereof.

[0090] The test needle 60 provided in the embodiment of the present application has a self-contained limiter structure, and is installed by using the first limiter 103 and the second limiter 104, so as to facilitate installation, disassembly and alignment adjustment; and the test needle 60 with the limiter structure does not need to be customized, has low cost and good versatility. There is an angle α between the first limiter 103 and the second limiter 104. 1 , so that the first limiting portion 103 and the second limiting portion 104 will not occupy too much area of ​​the angle pin plate 41, which is suitable for high-density layout test scenarios. 1 The test pins 60 can be installed in combination, and the first limiting parts 103 and the second limiting parts 104 of each test pin 60 will not contact each other, so no interference will occur, and the installation of the test pins 60 can still be guaranteed to ensure the implementation of the radio frequency test.

[0091] Fig.10This is a second structural schematic diagram of the test needle 60 provided in the embodiment of the present application.

[0092] like Fig.10 As shown, in some embodiments, the test needle 60 provided in the embodiment of the present application is Figure 7 The difference between the test needle 60 shown in the figure is that the first limit portion 103 and the second limit portion 104 are rotatably connected to the housing 102. Other structural features can refer to Figure 7 The contents of the test needle 60 shown are not described in detail here.

[0093] One of the first limiting portion 103 and the second limiting portion 104 is fixedly connected to the housing 102, and the other is rotatably connected to the housing 102; or, both the first limiting portion 103 and the second limiting portion 104 are rotatably connected to the housing 102. The embodiment of the present application is described by taking the example that both the first limiting portion 103 and the second limiting portion 104 are rotatably connected to the housing 102.

[0094] Fig.11 is a top view of the test needle 60 provided in the embodiment of the present application. Fig.11 Show Fig.10 A top view of the test needle 60 is shown.

[0095] like Fig.11 As shown, in some embodiments, the first limiting portion 103 and the second limiting portion 104 are configured to generate relative movement along the circumference of the housing 102 to adjust the angle α 1 angle.

[0096] The first limiting portion 103 and the second limiting portion 104 can move toward each other. The opening and closing angles of the first limiting portion 103 and the second limiting portion 104 can be adjusted according to the usage scenario so that the angle α 1 The angle can be any angle. For example, the angle α 1 It can be a right angle, acute angle, obtuse angle or straight angle.

[0097] In this way, the first limiting portion 103 and the second limiting portion 104 can fix the test needle 60 at different angles, so that the test needle 60 can be installed in scenarios with different layout areas, which can not only further improve the versatility of the test needle 60, but also ensure the installation of the test needle 60 and realize a high-density layout of the test needle 60.

[0098] Fig.12 Schematic diagram of the exploded view of the test needle 60 provided in the embodiment of the present application.

[0099] like Fig.12As shown in (a), in some embodiments, the first limiting portion 103 includes a first end 103a, and the second limiting portion 104 includes a second end 104a. The first end 103a and the second end 104a are opposite to each other and are both used to be rotatably connected to the housing 102.

[0100] The first end 103a includes a first interlocking groove 1031 and a first through hole 1032. The first interlocking groove 1031 is located on the surface of the first end 103a facing the needle 1012, and is continuously formed from the end of the first end 103a to the body of the first limiting portion 103, that is, the opening side of the first interlocking groove 1031 faces the needle 1012; the axial direction of the first through hole 1032 is parallel to the length direction (z-axis direction) of the housing 102.

[0101] The second end 104a includes a second interlocking groove 1041 and a second through hole 1042. The second interlocking groove 1041 is located on the surface of the second end 104a away from the needle 1012, and is continuously formed from the end of the second end 104a to the body of the second limiting portion 104, that is, the opening side of the second interlocking groove 1041 faces the connector 1011; the axial direction of the second through hole 1042 is parallel to the length direction (z-axis direction) of the housing 102.

[0102] like Fig.12 As shown in (b), in some embodiments, the housing 102 includes an annular groove 1021. The annular groove 1021 is located on the outer surface of the housing 102 and is arranged along the circumference of the housing 102.

[0103] The annular groove 1021 is located at a position of the housing 102 adjacent to the joint 1011, and divides the housing 102 into a first housing 1022 and a second housing 1023. The height of the annular groove 1021 is greater than or equal to the sum of the heights of the first end 103a and the second end 104a, so that the first end 103a and the second end 104a can be installed in the annular groove 1021 and rotate in the annular groove 1021.

[0104] Combination Fig.12 Middle (a), Fig.12 (b) and Fig.12 As shown in (c), in some embodiments, the first position-limiting portion 103 is sleeved in the annular groove 1021 through the first through hole 1032, and the first position-limiting portion 103 is rotatably connected to the housing 102 through the first through hole 1032. The second position-limiting portion 104 is sleeved in the annular groove 1021 through the second through hole 1042, and the second position-limiting portion 104 is rotatably connected to the housing 102 through the second through hole 1042.

[0105] The opening side of the first interlocking groove 1031 is opposite to the opening side of the second interlocking groove 1041, and the first end 103a is interlocked with the second end 104a, that is, the first end 103a is located above the second end 104a, so that the first end 103a of the first limiting portion 103 rotates in the second interlocking groove 1041, and the second end 104a of the second limiting portion 104 rotates in the first interlocking groove 1031.

[0106] The first shell 1022 and the second shell 1023 limit the first end 103a and the second end 104a to prevent the first limiting portion 103 and the second limiting portion 104 from moving up and down along the z-axis when rotating along the circumferential direction of the shell 102, thereby affecting the fixing effect of the test needle 60 and further affecting the accuracy of the RF test.

[0107] like Fig.12 As shown in (d), in some embodiments, the first limiting portion 103 and the second limiting portion 104 generate relative movement along the circumference of the housing 102. According to the usage scenario, the opening and closing angles of the first limiting portion 103 and the second limiting portion 104 can be adjusted. For example, the angle α 1 The angle may be 180°, that is, the first limiting portion 103 and the second limiting portion 104 are in a right angle state.

[0108] Combined with Fig. 9 As shown in (a), in a high-density layout test scenario where three test pins 60 need to be installed, the first limiter 103 and the second limiter 104 of two of the test pins 60 are adjusted to a 90° angle and fixed, and the first limiter 103 and the second limiter 104 of the other test pin 60 are adjusted to a 180° angle and fixed. In this way, the first limiter 103 and the second limiter 104 of the three test pins 60 are not in contact with each other, and no interference occurs.

[0109] Combined with Fig. 9 As shown in (b), in a high-density layout test scenario where four test pins 60 need to be installed, the first limiter 103 and the second limiter 104 of the four test pins 60 are adjusted to a 90° angle and fixed. In this way, the first limiter 103 and the second limiter 104 of the four test pins 60 are not in contact with each other, and no interference occurs.

[0110] The test needle 60 provided in the embodiment of the present application is provided with a first limit portion 103 and a second limit portion 104 by providing an annular groove 1021 on the housing 102, so that the first limit portion 103 and the second limit portion 104 can be independently and respectively rotated relative to the annular groove 1021. In this way, the opening and closing angles of the first limit portion 103 and the second limit portion 104 can be adjusted according to the usage scenario, and the first limit portion 103 and the second limit portion 104 can fix the test needle 60 at different angles, so that the test needle 60 can be installed in scenarios with different layout areas, which can not only further improve the versatility of the test needle 60, but also ensure the installation of the test needle 60, and realize a high-density layout of the test needle 60.

[0111] Fig.13 It is a schematic structural diagram of the rotating part 105 and the housing 102 provided in an embodiment of the present application.

[0112] like Fig.13 As shown, in some embodiments, the test needle 60 provided in the embodiment of the present application is Fig.10 The difference between the test needle 60 shown in the figure is that the first limit portion 103 and the second limit portion 104 are rotatably connected to the housing 102 in different ways. Other structural characteristics can refer to Fig.10 The contents of the test needle 60 shown are not described in detail here.

[0113] The test needle 60 may further include a rotating portion 105, the rotating portion 105 including a rotating shaft 1051 and a fixed portion 1052 connected to each other. The rotating portion 105 is fixed to one end of the housing 102, that is, the fixed portion 1052 is fixed to one end of the housing 102 through the rotating shaft 1051, and the needle core 101 passes through the rotating shaft 1051 and the fixed portion 1052.

[0114] The diameter of the rotating shaft 1051 is smaller than the diameter of the fixing portion 1052, and the diameter of the rotating shaft 1051 is smaller than the diameter of the housing 102. In this way, an annular area (such as an annular groove 1021) can be surrounded by the fixing portion 1052, the rotating shaft 1051 and the housing 102 to facilitate the installation and rotation of the first limiting portion 103 and the second limiting portion 104.

[0115] Combination Fig.12 (a) and Fig.12 As shown in (c), the first end 103a of the first position-limiting portion 103 is sleeved on the rotating shaft 1051 through the first through hole 1032 and rotates relative to the rotating shaft 1051. The second end 104a of the second position-limiting portion 104 is sleeved on the rotating shaft 1051 through the second through hole 1042 and rotates relative to the rotating shaft 1051.

[0116] The rotating shaft 1051 is used for the rotation of the first end 103a and the second end 104a, and the fixing portion 1052 and the shell 102 are used to limit the first end 103a and the second end 104a to prevent the first limiting portion 103 and the second limiting portion 104 from moving up and down along the z-axis when rotating along the circumferential direction of the shell 102, thereby affecting the fixing effect of the test needle 60 and further affecting the accuracy of the RF test.

[0117] The test needle 60 provided in the embodiment of the present application utilizes the rotating portion 105 provided at one end of the housing 102 to realize the installation and rotation of the first limiting portion 103 and the second limiting portion 104. In this way, the opening and closing angles of the first limiting portion 103 and the second limiting portion 104 can be adjusted according to the usage scenario, and the first limiting portion 103 and the second limiting portion 104 can fix the test needle 60 at different angles, so that the test needle 60 can be installed in scenarios with different layout areas, which can not only further improve the versatility of the test needle 60, but also ensure the installation of the test needle 60 and realize a high-density layout of the test needle 60.

[0118] Fig.14 This is the third structural schematic diagram of the test needle 60 provided in the embodiment of the present application.

[0119] like Fig.14 In some embodiments, the test needle 60 may further include a floating spring 106. The floating spring 106 may be provided in the test needle 60 provided in any of the aforementioned embodiments. Fig.12 The test needle 60 shown is provided with a floating spring 106 for illustration.

[0120] The floating spring 106 is sleeved on the outside of the needle core 101 and is located between the housing 102 and the first limiting portion 103 and the second limiting portion 104. Exemplarily, the floating spring 106 is located between the second housing 1023 and the first limiting portion 103 and the second limiting portion 104. The end of the floating spring 106 and the first housing 1022 limit the first end 103a and the second end 104a to prevent the first limiting portion 103 and the second limiting portion 104 from moving up and down along the z-axis when rotating along the circumferential direction of the housing 102, thereby affecting the fixing effect of the test needle 60 and further affecting the accuracy of the RF test.

[0121] The floating spring 106 allows the test needle 60 to float upward along the z-axis direction by a preset distance after being fixed on the fixture needle plate 41. In this way, during the test process, when the test needle 60 is subjected to an upward force, the test needle 60 floats upward along the z-axis direction by a certain distance, so that the test needle 60 can adapt to the alignment tolerance of the device under test (such as the RF test socket 31), and avoid excessive contact between the needle core 101 and the RF test socket 31 and damage to the circuit board 30.

[0122] Fig.15 It is a schematic diagram of the structure of the testing device provided in the embodiment of the present application.

[0123] like Fig.15 As shown, in some embodiments, the test device may include: a test fixture 71, a test base plate 72, and the test needle 60 provided in any of the aforementioned embodiments.

[0124] The test fixture 71 and the test base plate 72 are arranged relative to each other along the z-axis direction, and the test fixture 71 can move relative to the test base plate 72 along the z-axis direction. Figure 2A and Figure 2B The fixture needle plate 41 and the test base plate 72 are equivalent to Figure 2A and Figure 2B The corresponding structural characteristics of the fixture bottom plate 42 can be referred to Figure 2A and Figure 2B The content is not repeated here.

[0125] The test base plate 72 is configured to carry a circuit board 30 of an electronic device, and the circuit board 30 includes a plurality of RF test sockets 31. When the size of the circuit board 30 becomes smaller and smaller, the size of each RF test socket 31 itself becomes smaller, and the layout spacing of the RF test sockets 31 also becomes smaller. For example, two RF test sockets 31 are arranged on the circuit board 30, and the spacing between the two RF test sockets 31 is small.

[0126] Two test pins 60 are fixed on the test fixture 71, and the two test pins 60 are opposite to the two RF test sockets 31. Since the distance between the two RF test sockets 31 is small, in order to avoid interference between the limiting parts of the two test pins 60, two test pins 60 with an angle of 90° can be used for combination installation. Figure 7 The test pin 60 shown has a fixed 90° angle, and can also be selected Fig.10 The test needle 60 shown has an angle of 90° after angle adjustment, which is not limited here.

[0127] Two test needles 60 with an angle of 90° are fixed on the test fixture 71 through their respective first limiting parts 103 and second limiting parts 104. The length direction of the needle core 101 is parallel to the z-axis direction, and the needle head 1012 of the needle core 101 faces the test base plate 72. The needle core 101 corresponds one-to-one with the RF test socket 31.

[0128] It should be noted that the structure for assisting in fixing the test needle 60 on the test fixture 71 may also include components such as a needle pressing assembly, a positioning pin, a mounting block and a floating spring, or a test needle 60 with a floating spring 106 may be used, which will not be described in detail here.

[0129] Combination Figure 4 As shown in the figure, when performing RF test, the RF test instrument 51 is electrically connected to the connector 1011 of the needle core 101 in the test needle 60 through the RF line 52. The test fixture 71 and the test base plate 72 move relative to each other to drive the needle head 1012 of the test needle 60 to abut against the RF test socket 31 to achieve electrical connection. In this way, the circuit board 30, the RF test socket 31, the test needle 60, the RF line 52 and the RF test instrument 51 form a test path, and the signal detected by the test needle 60 is sent to the RF test instrument 51 through the RF line 52 to achieve the test of the RF index.

[0130] The test device provided in the embodiment of the present application adopts a test needle 60 with a self-contained limiter structure, which is installed by using the first limiter 103 and the second limiter 104 to facilitate installation, disassembly and alignment adjustment; and the test needle 60 with the limiter structure does not need to be customized, has low cost and good versatility. There is an angle α between the first limiter 103 and the second limiter 104 1 , so that the first limiting portion 103 and the second limiting portion 104 will not occupy too much area of ​​the angle pin plate 41, which is suitable for high-density layout test scenarios. 1 The test pins 60 can be installed in combination, and the first limiting parts 103 and the second limiting parts 104 of each test pin 60 will not contact each other, so no interference will occur, and the installation of the test pins 60 can still be guaranteed to ensure the implementation of the radio frequency test.

[0131] It should be noted that those skilled in the art will readily come up with other embodiments of the present application after considering the specification and practicing the application disclosed herein. The present application is intended to cover any variations, uses or adaptations of the present application, which follow the general principles of the present application and include common knowledge or customary technical means in the art that are not disclosed in the present application. The specification and examples are intended to be exemplary only, and the true scope of the present application is indicated by the following claims.

[0132] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A test needle, characterized in that: include: Needle core (101); A housing (102) is sleeved on the outside of the needle core (101); A first limiting portion (103) and a second limiting portion (104) are arranged along the circumference of the outer shell (102), the first limiting portion (103) and the second limiting portion (104) are arranged on the outer surface of the outer shell (102), and an angle is formed between the first limiting portion (103) and the second limiting portion (104).

2. The test needle according to claim 1, characterized in that: The extension direction of the first limiting portion (103) is parallel to the radial direction of the housing (102), and the extension direction of the second limiting portion (104) is parallel to the radial direction of the housing (102); The surface of the first limiting portion (103) facing the needle head (1012) of the needle core (101) is coplanar with the surface of the second limiting portion (104) facing the needle head (1012).

3. The test needle according to claim 2, characterized in that: The first limiting portion (103) and the second limiting portion (104) are an integrated structure and are fixed to the outer surface of the housing (102).

4. The test needle according to claim 2, characterized in that: The first limiting portion (103) and the second limiting portion (104) are rotatably connected to the housing (102); The first limiting portion (103) and the second limiting portion (104) are configured to generate relative movement along the circumference of the housing (102) to adjust the angle of the included angle.

5. The test needle according to claim 4, characterized in that: The first end (103a) of the first limiting portion (103) comprises a first engaging groove (1031) and a first through hole (1032) which are connected to each other, the first engaging groove (1031) being located on a surface of the first end (103a) facing the needle head (1012), and the axial direction of the first through hole (1032) being parallel to the length direction of the housing (102); The second end (104a) of the second limiting portion (104) comprises a second engaging groove (1041) and a second through hole (1042) which are connected to each other, the second engaging groove (1041) is located on a surface of the second end (104a) which faces away from the needle head (1012), and the axial direction of the second through hole (1042) is parallel to the length direction of the housing (102); The first limiting portion (103) is rotatably connected to the housing (102) via the first through hole (1032), the second limiting portion (104) is rotatably connected to the housing (102) via the second through hole (1042), the opening side of the first engaging groove (1031) is opposite to the opening side of the second engaging groove (1041), and the first end (103a) is engaged with the second end (104a); The first end (103a) of the first limiting portion (103) is configured to rotate in the second fitting groove (1041), and the second end (104a) of the second limiting portion (104) is configured to rotate in the first fitting groove (1031).

6. The test needle according to claim 5, characterized in that: The housing (102) comprises: an annular groove (1021), the annular groove (1021) being located on the outer surface of the housing (102) and being arranged along the circumference of the housing (102); The first limiting portion (103) is sleeved in the annular groove (1021) through the first through hole (1032), and the second limiting portion (104) is sleeved in the annular groove (1021) through the second through hole (1042).

7. The test needle according to claim 5, characterized in that: It also comprises: a rotating part (105), the rotating part (105) comprising a rotating shaft (1051) and a fixing part (1052) connected to each other, the fixing part (1052) being fixed to one end of the housing (102) via the rotating shaft (1051), and the needle core (101) passing through the rotating shaft (1051) and the fixing part (1052); The first limiting portion (103) is sleeved on the rotating shaft (1051) through the first through hole (1032) and rotates relative to the rotating shaft (1051); The second limiting portion (104) is sleeved on the rotating shaft (1051) through the second through hole (1042) and rotates relative to the rotating shaft (1051).

8. The test needle according to claim 7, characterized in that: The diameter of the rotating shaft (1051) is smaller than the diameter of the fixing portion (1052), and the diameter of the rotating shaft (1051) is smaller than the diameter of the housing (102).

9. The test needle according to claim 5, characterized in that: Also included: a floating spring (106); The floating spring (106) is sleeved on the outside of the needle core (101) and is located between the housing (102) and the first limiting portion (103) and the second limiting portion (104).

10. A testing device, characterized in that: include: A test fixture (71), a test base plate (72), and a test needle as described in any one of claims 1 to 9; The test fixture (71) is arranged opposite to the test base plate (72), the test base plate (72) is configured as a circuit board carrying an electronic device, and the circuit board includes a radio frequency test socket; The test needle is fixed on the test fixture (71) via the first limiting portion (103) and the second limiting portion (104); the needle head (1012) of the needle core (101) faces the test base plate (72) and corresponds to the radio frequency test socket.

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